Thermistor aging test box

Abstract

The utility model discloses a thermistor aging test box which comprises a test box body used for conducting an aging test on a thermistor, an inner cavity of the test box body is fixedly connected with a supporting plate, the surface of the supporting plate is provided with a plurality of sets of containing grooves, and inner cavities of the containing grooves are connected with fixing plates in a sliding mode. A first spring is arranged between the fixing plate and the inner wall of one side of the containing groove, the two ends of the first spring are fixedly connected to the surface of the fixing plate and the inner wall of the containing groove correspondingly, an arc-shaped block is fixedly installed on the surface of one side of the fixing plate, and an arc-shaped groove corresponding to the arc-shaped block is formed in the surface of the containing groove. According to the utility model, through the cooperation of the springs and the fixing plate, the fixing plate is firstly pushed towards one side, then two groups of pins of the thermistor are respectively inserted into the inner cavities of the arc-shaped grooves, then the fixing plate is loosened, the fixing plate moves towards the thermistor under the pushing of the first springs, so that the pins of the thermistor are propped against the inner cavities of the arc-shaped grooves by the arc-shaped blocks; and the thermistor is effectively fixed.

Description

TECHNICAL FIELD

[0001] The utility model relates to thermal resistance test equipment technical field, concretely is a thermal resistance aging test box. BACKGROUND

[0002] Thermal resistance aging test is to apply heat, cold or various combined external stress to thermal resistance, simulate harsh working environment, accelerate the exposure of potential internal faults, screen out failed or parameter changed thermal resistance and eliminate early failure before normal use.

[0003] A module for electronic component detection and a high-low temperature test chamber using the module are disclosed in Chinese patent No. CN209496084U. The module has a small footprint and does not cause clutter due to long and multiple wires. The technical solution is as follows: the module for electronic component detection includes a mounting area and a test area, a switching area is connected between the mounting area and the test area, the switching area is separated from the mounting area and the test area by a first fixed plate and a second fixed plate, respectively, the connector of the mounting area and the connector of the test area are connected by a switching plate, the switching plate is installed in the switching area and passes through the first fixed plate and the second fixed plate, respectively. The high-low temperature test chamber using the module is provided with a test area, the test area is provided with a mounting port, the mounting port is provided with the module, and the mounting area of the module is located inside the test area.

[0004] The module for electronic component detection and the high-low temperature test chamber using the module have some problems in use, but when testing thermal resistance, the module may be broken due to the large temperature difference of the test temperature of thermal resistance and the cold and hot alternation, and water droplets may be generated by the cold and hot alternation, which may cause damage to the module. UTILITY MODEL CONTENTS

[0005] The utility model aims at providing a thermal resistance aging test chamber to solve the problem of the above background technology.

[0006] To achieve the above object, the utility model provides the following technical scheme:

[0007] The utility model provides a kind of thermistor aging test box, including the test box for thermistor to carry out aging test, the top of the test box is rotatably connected with lid, the inner cavity of the test box is fixedly connected with support plate, the surface of the support plate is equipped with several groups of placing grooves, the inner cavity of the placing groove is slidably connected with fixed plate, first spring is arranged between the fixed plate and the inner wall of one side of placing groove, the both ends of the first spring are fixedly connected on the surface of fixed plate and the inner wall of placing groove, the side surface of the fixed plate is fixedly installed with arc block, the surface of the placing groove is equipped with arc slot corresponding with arc block, the inner cavity of the arc slot is provided with monitoring assembly for monitoring thermistor, the surface of the support plate is inserted with several groups of temperature rising pipe and air pipe, the side of the test box is provided with air heater and liquid nitrogen tank respectively, the output end of the air heater is communicated with the inner cavity of temperature rising pipe, the gas outlet of the liquid nitrogen tank is communicated with the inner cavity of air pipe.

[0008] Preferably, the monitoring assembly includes a metal contact fixedly installed in the inner cavity of the arc slot, an electric cable is connected to the bottom of the metal contact, a power supply and a single-chip microcomputer are respectively fixedly installed on the inner wall of the bottom of the test box, one end of the electric cable is electrically connected to the power supply, a Hall effect current sensor is sleeved on the surface of the electric cable, the signal output end of the Hall effect current sensor is connected to the signal input end of the single-chip microcomputer through a wire, a display screen is fixedly installed on the surface of the test box, the signal input end of the display screen and the signal output end of the single-chip microcomputer are electrically connected together through a wire, a temperature sensor is arranged on the surface of the support plate, the signal output end of the temperature sensor is electrically connected to the signal input end of the single-chip microcomputer through a wire.

[0009] Preferably, a limiting groove is formed in the inside of the support plate and on one side of the placing groove, a fixed column is slidably connected in the inner cavity of the limiting groove, a push rod is fixedly connected to one end of the fixed column, one end of the push rod is fixedly connected to the surface of the fixed plate, a connecting plate is fixedly installed on the top of the fixed column, a plurality of connecting blocks are fixedly connected to the top of a plurality of connecting plates.

[0010] Preferably, a guide rod is slidably inserted into the surface of the connecting block, the both ends of the guide rod are fixedly connected to the surface of the support plate, the connecting block is provided with a guide groove, a guide column is slidably connected in the inner cavity of the guide groove, a plug-in column is fixedly inserted into the inner cavity of the guide column, a second spring is sleeved on the surface of the plug-in column and above the guide column, the both ends of the plug-in column respectively penetrate the inner cavities of corresponding side limiting grooves, the surface of the guide rod is equipped with plug-in hole corresponding with the plug-in column.

[0011] Preferably, the bottom inner wall of the placing groove is inserted with a collecting pipe, the inner cavity of the test box is fixedly installed with a flow guide groove, one end of the flow guide groove penetrates the surface of the test box, and the water outlet end of the collecting pipe is aligned with the inner cavity of the flow guide groove.

[0012] Preferably, the surface of the support plate is rotationally connected with a sealing cover.

[0013] Compared with the prior art, the heat-sensitive resistor aging test box has the advantages that:

[0014] 1、The heat-sensitive resistor aging test box has the advantages that: the spring and the fixed plate are matched, the fixed plate is first pushed to one side, then the two groups of pins of the heat-sensitive resistor are respectively inserted into the inner cavities of the arc-shaped grooves, then the fixed plate is loosened, and the fixed plate moves to the heat-sensitive resistor under the pushing of the first spring, so that the arc-shaped blocks abut the pins of the heat-sensitive resistor to the inner cavities of the arc-shaped grooves, the heat-sensitive resistor is effectively fixed, and is not affected by temperature difference.

[0015] 2、The heat-sensitive resistor aging test box has the advantages that: the water collecting pipe is arranged, when the heat-sensitive resistor is subjected to cold and hot test, water droplets generated in the placing groove flow to the flow guide groove through the water collecting pipe, and flow to the outside through the flow guide groove, so that the water droplets are prevented from remaining in the placing groove. BRIEF DESCRIPTION OF DRAWINGS

[0016] Figure 1 It is a structural schematic view of the heat-sensitive resistor aging test box of the utility model;

[0017] Figure 2 It is a structural schematic view of the heat-sensitive resistor aging test box of the utility model from another perspective;

[0018] Figure 3 It is a structural schematic view of the inside of the test box of the utility model;

[0019] Figure 4 It is a sectional view of the support plate of the utility model;

[0020] Figure 5 It is an enlarged structural schematic view of position A of the utility model; Figure 4

[0021] It is an enlarged structural schematic view of position B of the utility model. Figure 6 Figure 3

[0022] ​​In the figure: 100, test box; 101, box cover; 103, display screen; 104, liquid nitrogen tank; 105, air heater; 106, placing groove; 107, sealing cover; 108, support plate; 109, temperature rising pipe; 110, air permeable pipe; 111, temperature sensor; 200, flow guide groove; 201, collection pipe; 300, power supply; 301, cable; 302, Hall effect current sensor; 303, fixed plate; 304, metal contact; 305, arc block; 306, arc groove; 307, single-chip microcomputer; 400, connecting plate; 401, connecting block; 402, guide rod; 403, fixed column; 404, push rod; 405, limiting groove; 406, first spring; 500, plug-in column; 501, second spring; 502, guide column; 503, guide groove; 504, plug-in hole. DETAILED DESCRIPTION

[0023] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the present application.

[0024] Please refer to Figures 1-6The embodiment provides a thermistor aging test box, which comprises a test box 100 for thermistor aging test, a box cover 101 rotatably connected to the top of the test box 100, a supporting plate 108 fixedly connected to the inner cavity of the test box 100, a plurality of groups of placing grooves 106 formed in the surface of the supporting plate 108, a fixing plate 303 slidably connected to the inner cavity of the placing groove 106, a first spring 406 arranged between the fixing plate 303 and the inner wall of one side of the placing groove 106, the two ends of the first spring 406 being fixedly connected to the surface of the fixing plate 303 and the inner wall of the placing groove 106, an arc-shaped block 305 fixedly installed on the surface of one side of the fixing plate 303, an arc-shaped groove 306 corresponding to the arc-shaped block 305 formed in the surface of the placing groove 106, a monitoring assembly arranged in the inner cavity of the arc-shaped groove 306 for monitoring the thermistor, a plurality of groups of temperature rising pipes 109 and air permeable pipes 110 inserted into the surface of the supporting plate 108, an air heater 105 and a liquid nitrogen tank 104 arranged on one side of the test box 100, the output end of the air heater 105 being in communication with the inner cavity of the temperature rising pipe 109, and the gas outlet end of the liquid nitrogen tank being in communication with the inner cavity of the air permeable pipe 110, the fixing plate 303 being first pushed to one side, then the two groups of pins of the thermistor being inserted into the inner cavities of the arc-shaped grooves 306, then the fixing plate 303 being loosened and moved to the thermistor under the pushing of the first spring 406, so that the arc-shaped block 305 abuts the pins of the thermistor in the inner cavities of the arc-shaped grooves 306, the thermistor is effectively fixed, and is not affected by temperature difference.

[0025] Further, the monitoring assembly comprises a metal contact 304 fixedly installed in the inner cavity of the arc-shaped groove 306, a cable 301 connected to the bottom of the metal contact 304, a power supply 300 and a single-chip microcomputer 307 fixedly installed on the bottom inner wall of the test box 100, wherein the model of the single-chip microcomputer 307 is STC89C51, one end of the cable 301 is electrically connected with the power supply 300, a Hall effect current sensor 302 is sleeved on the surface of the cable 301, wherein the model of the Hall effect current sensor 302 is CHB-100P, the signal output end of the Hall effect current sensor 302 is connected with the signal input end of the single-chip microcomputer 307 through wires, a display screen 103 is fixedly installed on the surface of the test box 100, the signal input end of the display screen 103 and the signal output end of the single-chip microcomputer 307 are electrically connected together through wires, and a temperature sensor 111 is arranged on the surface of the supporting plate 108, wherein the model of the temperature sensor 111 is PT100, the signal output end of the temperature sensor 111 is electrically connected with the signal input end of the single-chip microcomputer 307 through wires, the temperature in the sealing cover 107 and the current passing condition of the thermistor under high temperature can be observed through the display screen 103, and the thermistor data under different temperature conditions can be recorded.

[0026] Further, the inside of the support plate 108 and located on one side of the placement groove 106 is provided with a limiting groove 405, the inner cavity of the limiting groove 405 is slidably connected with a fixed column 403, one end of the fixed column 403 is fixedly connected with a push rod 404, one end of the push rod 404 is fixedly connected to the surface of the fixed plate 303, the top of the fixed column 403 is fixedly installed with a connecting plate 400, the top of a plurality of groups of connecting plates 400 is fixedly connected with a connecting block 401, the connecting plate 400 is pushed to one side, and the fixed plate 303 in the placement groove 106 is moved to one side, without pushing one by one, which is very suitable for testing multiple thermistors, and improves the fixing efficiency of the thermistor.

[0027] Preferably, the surface of the connecting block 401 is slidably inserted with a guide rod 402, both ends of the guide rod 402 are fixedly connected to the surface of the support plate 108, the connecting block 401 is provided with a guide groove 503, the inner cavity of the guide groove 503 is slidably connected with a guide column 502, the inner cavity of the guide column 502 is fixedly inserted with an insertion column 500, the surface of the insertion column 500 and located above the guide column 502 is sleeved with a second spring 501, both ends of the insertion column 500 respectively penetrate the inner cavity of the corresponding side limiting groove 405, the surface of the guide rod 402 is provided with an insertion hole 504 corresponding to the insertion column 500, by the setting of the spring and the insertion column 500, the connecting block 401 is pushed to one side, and the insertion column 500 on the surface of the connecting block 401 is inserted into the inner cavity of the insertion hole 504 under the action of the spring, so as to fix the connecting block 401.

[0028] Desirably, the bottom inner wall of the placement groove 106 is inserted with a collecting pipe 201, the inner cavity of the test box 100 is fixedly installed with a flow guide groove 200, one end of the flow guide groove 200 penetrates the surface of the test box 100, the water outlet end of the collecting pipe 201 is aligned with the inner cavity of the flow guide groove 200, by the setting of the water collecting pipe, when the hot and cold test of the thermistor is carried out, the water droplets generated in the placement groove 106 flow to the flow guide groove 200 through the water collecting pipe, and are guided to flow to the outside through the flow guide groove 200, so as to avoid the water droplets remaining in the placement groove 106.

[0029] Further, the surface of the support plate 108 is rotatably connected with a sealing cover 107, the sealing cover 107 is turned to cover the thermistor, so as to reduce the space which needs to be heated or cooled, thereby further accelerating the heating or cooling speed and improving the test speed of the thermistor.

[0030] Working principle;

[0031] Firstly, the thermistor to be tested is taken out, then the box cover 101 is turned over, at this time the connecting block 401 is pushed to one side, and the plug-in column 500 on the surface of the connecting block 401 is plugged into the inner cavity of the plug-in hole 504 under the action of the spring, so as to fix the connecting block 401, so as to drive the several groups of connecting plates 400 to slide to one side, while the connecting plates 400 slide to one side, the push rod 404 drives the fixed plate 303 to slide to one side, so that the arc block 305 is separated from the inner cavity of the arc groove 306, then the two groups of pins of the thermistor are plugged into the inner cavity of the arc groove 306, then the plug-in column 500 is pulled up, so that the plug-in column 500 is separated from the inner cavity of the plug-in hole 504, so as to release the restriction of the fixed plate 303, then the fixed plate 303 is pushed by the second spring 501, the arc block 305 on the surface of the fixed plate 303 is plugged into the inner cavity of the arc groove 306, so that the pins of the thermistor abut against the surface of the metal contact 304, then the sealing cover 107 is turned over, the thermistor is covered, then the air heater 105 is started, the temperature in the sealing cover 107 is increased, so as to simulate the running condition of the thermistor under the extreme working condition, and the temperature in the sealing cover 107 and the current passing condition of the thermistor under high temperature are watched through the display screen 103, when the thermistor data under high temperature is recorded, the air heater 105 is turned off, and after a period of natural cooling, the valve of the liquid nitrogen tank 104 is opened, liquid nitrogen is injected into the sealing cover 107, so as to simulate the running condition of the thermistor under extremely low temperature, and the data is recorded.

[0032] Although the embodiments of the present application have been shown and described, it should be understood by those skilled in the art that various changes, modifications, substitutions and variations can be made to these embodiments without departing from the principles and spirit of the present application, and the scope of the present application is defined by the appended claims and their equivalents.

Claims

1. A thermal resistor burn-in test chamber characterized by, The utility model provides a test box (100) for the aging test of thermistor, the top of test box (100) is rotatably connected with the box cover (101), the inner chamber of test box (100) is fixedly connected with the support plate (108), the surface of support plate (108) is provided with a plurality of groups of placing grooves (106), the inner chamber of placing groove (106) is slidably connected with the fixed plate (303), the first spring (406) is arranged between the fixed plate (303) and the inner wall of one side of placing groove (106), the both ends of first spring (406) are fixedly connected to the surface of fixed plate (303) and the inner wall of placing groove (106), the side surface of fixed plate (303) is fixedly installed with the arc block (305), the surface of placing groove (106) is provided with the arc slot (306) corresponding with arc block (305), the inner chamber of arc slot (306) is provided with the monitoring assembly for monitoring thermistor, the surface of support plate (108) is inserted with a plurality of groups of temperature rising pipes (109) and air pipes (110), one side of test box (100) is provided with air heater (105) and liquid nitrogen tank (104) respectively, the output end of air heater (105) is communicated with the inner chamber of temperature rising pipe (109), the air outlet end of liquid nitrogen tank (104) is communicated with the inner chamber of air pipe (110).

2. The thermal resistance aging test chamber according to claim 1, wherein The monitoring assembly includes a metal contact (304) fixedly installed in the inner chamber of the arc slot (306), a cable (301) connected to the bottom of the metal contact (304), a power supply (300) and a single-chip microcomputer (307) fixedly installed on the inner wall of the bottom of the test box (100), one end of the cable (301) electrically connected with the power supply (300), a Hall effect current sensor (302) sleeved on the surface of the cable (301), a signal output end of the Hall effect current sensor (302) connected with a signal input end of the single-chip microcomputer (307) through a wire, a display screen (103) fixedly installed on the surface of the test box (100), a signal input end of the display screen (103) electrically connected with a signal output end of the single-chip microcomputer (307) through a wire, and a temperature sensor (111) arranged on the surface of the support plate (108), a signal output end of the temperature sensor (111) electrically connected with a signal input end of the single-chip microcomputer (307) through a wire.

3. The thermal resistance aging test chamber according to claim 1, wherein: The inside of the support plate (108) and one side of the placing groove (106) are provided with a limiting groove (405), the inner chamber of the limiting groove (405) is slidably connected with a fixed column (403), one end of the fixed column (403) is fixedly connected with a push rod (404), one end of the push rod (404) is fixedly connected to the surface of the fixed plate (303), the top of the fixed column (403) is fixedly installed with a connecting plate (400), and the top of a plurality of connecting plates (400) is fixedly connected with a connecting block (401).

4. The thermal resistor burn-in test chamber of claim 3, wherein: The surface of the connecting block (401) is slidably inserted with a guide rod (402), both ends of the guide rod (402) are fixedly connected to the surface of the support plate (108), the connecting block (401) is provided with a guide groove (503), the inner cavity of the guide groove (503) is slidably connected with a guide column (502), the inner cavity of the guide column (502) is fixedly inserted with a plug-in column (500), the surface of the plug-in column (500) and above the guide column (502) is sleeved with a second spring (501), both ends of the plug-in column (500) respectively penetrate the inner cavity of the corresponding side limiting groove (405), the surface of the guide rod (402) is provided with a plug-in hole (504) corresponding to the plug-in column (500).

5. The thermal sensor burn-in test chamber of claim 1, wherein: The bottom inner wall of the placing groove (106) is inserted with a collecting pipe (201), the inner cavity of the test box (100) is fixedly installed with a flow guide groove (200), one end of the flow guide groove (200) penetrates the surface of the test box (100), and the water outlet end of the collecting pipe (201) is aligned with the inner cavity of the flow guide groove (200).

6. A thermal resistor burn-in oven according to any one of claims 1-5, characterized in that: The surface of the support plate (108) is rotatably connected with a sealing cover (107).

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