Test bench of 4644-point load power supply module

Abstract

The utility model discloses a test seat of a 4644 point load power supply module, which comprises a base, a limit frame and a seat cover, the base is provided with a plurality of bidirectional elastic telescopic probes directly facing a bonding pad at the bottom of the power supply module, the limit frame is fixedly connected to the upper surface of the base, the middle part of the limit frame is provided with a limit groove for placing the power supply module, and the rear side of the seat cover is hinged to the limit frame. After the base cover is closed, the clamping tongue can be embedded into the clamping groove of the limiting frame, the base cover abuts against the upper end face of the power module, the upper end of the bidirectional elastic telescopic probe abuts against a bonding pad of the power module in an elastic mode, and the lower end of the bidirectional elastic telescopic probe stretches out of the base and then abuts against a bonding pad of the PCB in an elastic mode. According to the utility model, the test seat is adopted to replace a bonding pad, and the 4644 power supply module only needs to be placed in the test seat, so that the testability is greatly optimized, and the influence on delivery is avoided.

Description

Technical Field

[0001] This utility model relates to a test fixture for a 4644-point load power module, belonging to the technical field of power module test fixtures. Background Technology

[0002] The 4644-point load power supply is a four-output switching-mode DC / DC power module, model XEC4644BS from Shunluo Xunda. Each output provides 4A of current, replacing ADI's LTM4644IY. The package includes a switching controller, power MOSFETs, inductors, and all supporting components. It supports input voltages from 4V to 14V or external bias voltages from 2.375V to 14V; the output voltage range is 0.6V to 5.5V. Its pinout is as follows. Figure 1 As shown, there are a total of 77 BGA pins.

[0003] For the high and low temperature environment testing items in the 4644-point load power module acceptance project, the commonly used tooling is generally an integrated system, which is costly and appears to be a waste of resources in daily R&D use. There are also many simple test fixtures, but common test fixtures have the following shortcomings in addition to testing the relevant functions: When testing the power module, it is necessary to solder the module onto the PCB, which affects delivery. Generally, products that have been soldered cannot be delivered. Summary of the Invention

[0004] The technical problem to be solved by this utility model is to provide a test socket for a 4644-point load power module, so as to solve the problems existing in the prior art.

[0005] The technical solution adopted in this utility model is as follows: A test socket for a 4644-point load power module includes a base, a limiting frame, and a socket cover. The base is equipped with multiple bidirectional elastic telescopic probes facing the bottom pads of the power module. The limiting frame is fixedly connected to the upper surface of the base and has a limiting groove in the middle for placing the power module. The back of the socket cover is hinged to the limiting frame, and the front has an elastic latch. When the socket cover is closed, the latch can be embedded into the groove of the limiting frame, and the socket cover abuts against the upper surface of the power module. The upper ends of the bidirectional elastic telescopic probes elastically abut against the pads of the power module, and the lower ends of the bidirectional elastic telescopic probes extend out of the base and elastically abut against the pads of the PCB board. This utility model uses a test socket instead of pads; the 4644 power module only needs to be placed inside the test socket, greatly optimizing testability and avoiding any impact on delivery.

[0006] Furthermore, the aforementioned base includes a lower plate and an upper plate. The lower plate is provided with an inlay groove, and the upper plate is inlaid in the inlay groove and fixedly connected by bolts. The bolt holes for installing the bolts are stepped bolt holes. The lower plate is provided with multiple stepped holes in the middle. The stepped holes are embedded in the middle tube of a bidirectional elastic telescopic probe. The lower probe extends movably out of the lower end of the stepped hole, and the upper probe extends movably out of the upper stepped hole on the upper plate.

[0007] Furthermore, the aforementioned limiting groove has notches on all four sides.

[0008] Furthermore, the bottom of the aforementioned base is equipped with a limit pin, which is then locked in place with screws after being embedded in the PCB board.

[0009] The beneficial effects of this utility model are as follows: Compared with the prior art, this utility model uses a test socket to replace the solder pads, and the 4644 power module only needs to be placed in the test socket, which greatly optimizes testability and avoids affecting delivery. Attached Figure Description

[0010] Figure 1 This is a top view of the 4644-point load power supply module (pin arrangement).

[0011] Figure 2 This is the wiring diagram for the test principle;

[0012] Figure 3 It is a test circuit diagram;

[0013] Figure 4 This is a schematic diagram of the LTM4644EY test controller;

[0014] Figure 5 This is a schematic diagram of the input and temperature measurement circuit.

[0015] Figure 6 This is a schematic diagram of the circuit structure of output channel 1 (output channels 2-4 have the same circuit).

[0016] Figure 7 This is a schematic diagram of the drive circuit;

[0017] Figure 8 This is a side view of the test socket when it is open;

[0018] Figure 9 This is a top view of the test stand's structure.

[0019] Figure 10 This is a schematic diagram of the left-side structure of the test stand;

[0020] Figure 11 This is a schematic diagram of the front view of the test stand;

[0021] Figure 12 This is a schematic diagram of the structure of the bidirectional elastic telescopic probe mounting location;

[0022] Figure 13 This is a schematic diagram of a bidirectional elastic telescopic probe structure;

[0023] Figure 14 This is a schematic diagram of the test results for a 4644-point load power module. Detailed Implementation

[0024] The present invention will be further described below with reference to the accompanying drawings and specific embodiments.

[0025] Example 1: As Figure 1-14 As shown, a high and low temperature test fixture for a 4644-point load power module includes a PCB board 1 and a test socket 2. The test socket 2 is mounted in the middle of the PCB board 1 and is electrically connected to it. The PCB board 1 is equipped with a mode selection switch 3, an enable switch 4, an output voltage selection switch 5, four channels 6 for multimeter voltage testing, and four channels 7 for load connection. The upper side of the PCB board 1 also has a DC input terminal 8 for connecting a current power supply. The test socket 2 has a placement slot for placing the power module 9. In the adopted test socket structure, the pins of the power module are electrically connected to the PCB board through bidirectional elastic telescopic probes in the placement slot on the test socket.

[0026] To facilitate rapid device placement, the aforementioned test stand 2 includes a base 201, a limiting frame 202, and a cover 203. The base 201 is equipped with multiple bidirectional elastic telescopic probes 204 facing the bottom pads of the power module 9. The limiting frame 202 is fixedly connected to the upper surface of the base 201 and has a limiting groove 205 in the middle for placing the power module 9. The cover 203 is hinged to the limiting frame 202 at the rear and has an elastic latch 206 at the front. When the cover 203 is closed, the latch 206 can be inserted into the slot 207 of the limiting frame 202, and the cover 203 abuts against the upper surface of the power module 9. The upper end of the bidirectional elastic telescopic probe 204 elastically abuts against the pad of the power module 9, and the lower end of the bidirectional elastic telescopic probe 204 extends out of the base 201 and elastically abuts against the pad of the PCB board 1. The test seat uses a bidirectional elastic telescopic probe for bidirectional elastic contact, which is reliable and stable, with stable connection and reliable signal transmission. The limit frame can quickly realize the positioning of the power module, improve the positioning accuracy, and reduce the installation difficulty. The seat cover 203 is provided with a latch, which can quickly realize the closing of the seat cover 203. The seat cover 203 is provided with a pressing handle 215 for easy opening and closing of the seat cover 203.

[0027] The base 201 includes a lower plate 208 and an upper plate 209. The lower plate 208 is provided with an inlay groove 210, and the upper plate 209 is inlaid in the inlay groove 210 and fixedly connected by bolts. The bolt holes for the mounting bolts are stepped bolt holes. The lower plate 208 has multiple stepped holes 211 in the middle. The stepped holes 211 are embedded in the middle tube of the bidirectional elastic telescopic probe 204. The lower probe extends movably out of the lower end of the stepped hole 211, and the upper probe extends movably out of the upper stepped hole on the upper plate 209 (the upper end of the middle tube is also embedded in the upper stepped hole). This structure facilitates the installation of the bidirectional elastic telescopic probe 204 and provides better limiting for the middle tube of the probe. The probes at both ends can extend and retract freely. Moreover, the inlay method of the upper and lower plates ensures precise positioning and facilitates installation. The upper end face of the upper probe of the bidirectional elastic telescopic probe 204 has a serrated structure, which improves the contact reliability.

[0028] For convenience, the bottom of the limiting groove 205 is provided with a pad step hole 217 facing the upper probe. The upper probe extends into the pad step hole 217 and the upper end of the upper probe extends half of the large hole of the step hole, which can realize the stability of the limiting groove and the stable and reliable placement of the power module. The pad step hole 217 can movably embed the protruding pad into the pad step hole 217, and then elastically abut against the upper probe. The limiting groove 205 is provided with notches 212 on all four sides, and a circular transition notch 216 is provided at the corner of the limiting groove 205, which facilitates clamping the device under test and enables quick picking and placing of the device.

[0029] To ensure precise positioning, a limiting pin 213 is provided at the bottom of the base 201. After the limiting pin 213 is embedded in the PCB board 1, it is locked with a screw 214, which enables quick installation, improves installation efficiency and accuracy, and avoids poor contact caused by misalignment between the solder pad and the elastic telescopic probe.

[0030] The specific test circuit diagram for PCB board 1 is as follows: Figure 3-7 As shown.

[0031] The testing method for the test fixture is as follows:

[0032] 1) Fabricate printed circuit boards according to the PCB design requirements of the PCB engineering files;

[0033] 2) Solder the test socket, resistor, capacitor, switch, terminal block, and high-temperature wire onto the fixture printed circuit board respectively;

[0034] 3) According to Figure 2 The test schematic diagram shown is connected in wires.

[0035] 4) Place the power module into the test fixture and fix it in place. Except for the high and low temperature test fixture, which needs to be placed in the high and low temperature chamber, all other equipment leads should be placed outside the high and low temperature chamber.

[0036] The testing fixture has the following advantages:

[0037] 1) By using a test socket instead of solder pads, the 4644 power module only needs to be placed inside the test socket, which greatly optimizes testability and avoids affecting delivery.

[0038] 2) Switch selection was designed for each of the four inputs of the 4644 power module, which can realize the selection of single-channel operation and shutdown;

[0039] 3) Three output voltage levels are available, and shorting plates are used for connection to avoid damage caused by replacing components;

[0040] 4) Select components with an operating temperature range of -55℃ to 125℃ to avoid the fixture from malfunctioning in low-temperature environments of -40℃ and +85℃.

[0041] 5) Small size, light weight, easy to install, move and disassemble. Dimensions: 129mm long × 105mm wide.

[0042] The above description is merely a specific embodiment of this utility model, but the protection scope of this utility model is not limited thereto. Any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this utility model should be included within the protection scope of this utility model. Therefore, the protection scope of this utility model should be determined by the protection scope of the claims.

Claims

1. A test socket for a 4644-point load power supply module, characterized in that: The device includes a base (201), a limiting frame (202), and a cover (203). The base (201) is provided with multiple bidirectional elastic telescopic probes (204) facing the bottom pads of the power module (9). The limiting frame (202) is fixedly connected to the upper surface of the base (201) and has a limiting groove (205) in the middle for placing the power module (9). The cover (203) is hinged to the limiting frame (202) on the rear side and has an elastic latch (206) on the front side. After the cover (203) is closed, the latch (206) can be embedded into the slot (207) of the limiting frame (202) and the cover (203) abuts against the upper surface of the power module (9). The upper end of the bidirectional elastic telescopic probe (204) elastically abuts against the pads of the power module (9). The lower end of the bidirectional elastic telescopic probe (204) extends out of the base (201) and elastically abuts against the pads of the PCB board (1).

2. The test socket for a 4644-point load power module according to claim 1, characterized in that: The base (201) includes a lower plate (208) and an upper plate (209). The lower plate (208) is provided with an inlay groove (210). The upper plate (209) is inlaid in the inlay groove (210) and fixedly connected by bolts. The bolt holes for mounting bolts are stepped bolt holes. The lower plate (208) is provided with multiple stepped holes (211) in the middle. The stepped holes (211) are embedded in the middle tube of the bidirectional elastic telescopic probe (204). The lower probe extends out of the lower end of the stepped hole (211), and the upper probe extends out of the upper stepped hole on the upper plate (209).

3. The test socket for a 4644-point load power module according to claim 1, characterized in that: The limiting groove (205) has notches (212) on all four sides.

4. The test socket for a 4644-point load power module according to claim 1, characterized in that: The base (201) has a limit pin (213) at the bottom. The limit pin (213) is embedded in the PCB board (1) and then locked with screws (214).

Images