Electrical characteristic test assembly and electrical characteristic test system
By using a test fixture and calibration kit with a mirror-symmetric design, the problem of the fixture affecting the signal integrity of the device under test was solved, and more accurate electrical characteristic test results were achieved.
Patent Information
- Application Number
- CN202422668471.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-01
- Publication Date
- 2025-11-25
- Estimated Expiration
- 2034-11-01
AI Technical Summary
In high-speed integrated circuit testing, the use of fixtures can affect the signal integrity of the device under test, leading to inaccurate test results.
The test fixture and calibration piece are designed with mirror symmetry. The electrical characteristics of the fixture are simulated by setting a connecting conductor in the calibration piece, whose loss value is twice that of the second electrical connection component of the test fixture. The influence of the fixture on the signal is eliminated by de-embedding technology.
It improves the accuracy of electrical characteristic testing, reduces unnecessary reflections and distortions of signals by the fixture, and enhances the reliability and bandwidth of test results.
Smart Images
Figure CN223597709U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to the technical field of circuit test, more particularly to an electrical characteristic test assembly and an electrical characteristic test system. BACKGROUND
[0002] In the electronic industry, electrical performance test is often needed to determine the performance of the device. The test often needs to use a special fixture to connect the device under test to the test instrument. However, with the rapid development of modern electronic design, the use of fixtures will affect the signal integrity of the device under test during the test of high-speed integrated circuits, thereby affecting the test results of the device under test. Therefore, it is necessary to eliminate or reduce the impact of the fixture on the test results as much as possible. SUMMARY
[0003] Therefore, the utility model embodiment provides an electrical characteristic test assembly and an electrical characteristic test system, which can solve at least part of the above problems in the prior art.
[0004] In a first aspect, the utility model embodiment provides an electrical characteristic test assembly, which comprises a test fixture and a calibration piece. The test fixture has two groups of test links arranged at intervals, and the two groups of test links are mirror-symmetric to each other. Each group of test links comprises a test transmission conductor, a first electrical connection component, and a second electrical connection component. The first electrical connection component is arranged at a first end of the test transmission conductor and is configured to be electrically connected to a test instrument. The second electrical connection component is arranged at a second end of the test transmission conductor and is configured to be electrically connected to a device under test. The calibration piece comprises a board body and two groups of calibration links arranged on the board body. The two groups of calibration links are mirror-symmetric to each other. Each group of calibration links comprises a de-embedding reference conductor and a third electrical connection component. The de-embedding reference conductor has the same structure as the test transmission conductor. The third electrical connection component has the same structure as the first electrical connection component and is connected to a first end of the de-embedding reference conductor. The calibration piece further comprises a connection conductor connected between second ends of the de-embedding reference conductors of the two groups of calibration links. The structure of the connection conductor is configured to have a loss value twice that of the second electrical connection component of one group of test links.
[0005] Further, the connection conductor and the de-embedding reference conductor are a continuous and integral structure.
[0006] Further, the first electrical connection component comprises at least one of a coaxial connector, a probe, and a solder pad.
[0007] Further, the second electrical connection component comprises a conductive via.
[0008] Further, the test fixture comprises two groups of fixture halves arranged in phase separation, and each group of the test links is arranged in a corresponding group of the fixture halves.
[0009] Further, the test fixture comprises a first base and a second base which are detachably connected, the test links comprise a first sub-test link and a second sub-test link, the first sub-test link is arranged in the first base and comprises the first electrical connection component, and the second sub-test link is arranged in the second base and comprises the second electrical connection component.
[0010] Further, the test transmission conductor comprises a first sub-test transmission conductor and a second sub-test transmission conductor, the first sub-test link comprises the first sub-test transmission conductor which is connected with the first electrical connection component, and the second sub-test link comprises the second sub-test transmission conductor which is connected with the second electrical connection component; when the first base and the second base are connected, the first sub-test transmission conductor is connected with the second sub-test transmission conductor.
[0011] In the second aspect, the utility model embodiment further provides an electrical characteristic test system, comprising a test instrument, and the electrical characteristic test assembly as described in the first aspect.
[0012] The utility model embodiment provides an electrical characteristic test assembly and electrical characteristic test system, electrical characteristic test assembly includes test fixture and with test fixture corresponding calibration spare, through with test link of test fixture setting is mirror symmetry, in calibration spare setting connection conductor connects two groups of calibration link, and make the loss value of connection conductor be the loss value of second electrical connection component of one group of test link of test fixture, fully consider the influence of second electrical connection component in test fixture, make calibration spare more accurately simulated the electrical characteristic of test fixture. BRIEF DESCRIPTION OF DRAWINGS
[0013] The above and other objects, features and advantages of the utility model will become more apparent from the following description of the utility model embodiments referring to the drawings, in which:
[0014] Figure 1 It is the test fixture and calibration spare of electrical characteristic test assembly of one embodiment of the utility model top structure contrast schematic drawing;
[0015] Figure 2is a sectional structure comparison schematic view of the test fixture and the calibration piece of the electrical characteristic test assembly of an embodiment of the utility model;
[0016] Figure 3 is a top view structure schematic view of the test fixture of another embodiment of the utility model;
[0017] Figure 4 is a sectional structure comparison schematic view of the test fixture and the calibration piece of the electrical characteristic test assembly of another embodiment of the utility model;
[0018] Figure 5 is a schematic view of the electrical characteristic test system of the utility model embodiment carries out electrical characteristic test to the device to be measured;
[0019] Figure 6 is a schematic view of the electrical characteristic test system of the utility model embodiment through the calibration piece to embed.
[0020] Explanation of reference signs:
[0021] 1-test fixture;11-test link;111-first sub test link;112-second sub test link;12-test transmission conductor;121-first sub test transmission conductor;122-second sub test transmission conductor;13-first electric connection component;14-second electric connection component;15-clamp half;16-first base body;17-second base body;2-calibration piece;21-plate body;22-calibration link;23-embedding reference conductor;24-third electric connection component;25-connection conductor;3-test instrument;4-device to be measured. DETAILED DESCRIPTION
[0022] The present application is described below based on embodiments, but the present application is not limited to only these embodiments. In the following detailed description of the present application, some specific details are described in detail. The present application can also be fully understood without the description of these details. In order to avoid confusion of the essence of the present application, the well-known methods, processes, flows, elements and circuits are not described in detail.
[0023] In addition, those of ordinary skill in the art should understand that the drawings provided herein are for illustrative purposes only, and the drawings are not necessarily drawn to scale.
[0024] Unless the context clearly requires otherwise, throughout the present application, the words "comprise", "comprises" and the like are to be construed in an inclusive sense as opposed to an exclusive or exhaustive sense; that is to say, in the sense of "including, but not limited to".
[0025] In the description of the present application, it should be understood that the terms "first", "second" and the like are only for descriptive purposes and cannot be understood as indicating or implying relative importance. In addition, in the description of the present application, the meaning of "a plurality of" is two or more, unless otherwise stated.
[0026] Figures 1-4 is a schematic diagram of an electrical characteristic test assembly of several different embodiments of the present application. Referring to Figures 1-4 , the electrical characteristic test assembly of the embodiments of the present application comprises a test fixture 1 and a calibration piece 2 corresponding to the test fixture 1, wherein, Figures 1-2 and Figure 4 the dashed line in the figure is only for the convenience of the schematic description of the corresponding structure of the test fixture 1 and the calibration piece 2, and does not constitute a part of the structure of the electrical characteristic test assembly. The test fixture 1 is used to carry the device under test 4 and has two groups of test links 11 arranged at intervals. Referring to Figure 5 , the test link 11 is connected between the test instrument 3 and the device under test 4 to realize the signal transmission between the test instrument 3 and the device under test 4, and during the test, the two groups of test links 11 are respectively connected with different interfaces of the device under test 4. The test process can adopt TDR (Time Domain Reflectometry, Time Domain Reflectometry), which is a technology for measuring and analyzing reflected signals on a signal transmission line. In TDR, the characteristics of the line are analyzed by sending a pulse signal to the line and measuring the signal reflected back. The calibration piece 2 is used to simulate the electrical transmission link in the test fixture 1, and the electrical characteristic parameters of the calibration piece 2 are basically the same as those of the test fixture 1. Therefore, based on the electrical characteristic parameters extracted by testing the calibration piece 2, the physical signal output by the test fixture 1 can be de-embedded, so that when the test fixture 1 is used to test the electrical characteristics of the device under test 4, the signal integrity influence of the test fixture 1 on the device under test 4 can be eliminated or reduced, so that the electrical characteristics of the device under test 4 can be accurately obtained. Wherein, de-embedding refers to removing the influence of the fixture from the measurement results.
[0027] In the present embodiment, the two groups of test links 11 are mirror-symmetrical to each other, and the mirror-symmetrical test links 11 can ensure that the signal experiences the same electrical path when entering and leaving the fixture. This design can better control the propagation characteristics of the signal in the fixture and reduce unnecessary reflections and distortions. By mirror-symmetrical design of the fixture, the asymmetric influence of the signal in the fixture can be effectively reduced, thereby improving the transmission quality of the signal. Since the mirror-symmetrical design can better compensate for the parasitic effects in the fixture, it can maintain good transmission characteristics in a wider frequency range, thereby improving the use bandwidth of the fixture.
[0028] Each test link 11 includes a test transmission conductor 12, a first electrical connection component 13 and a second electrical connection component 14. The test transmission conductor 12 has opposite first and second ends, the first electrical connection component 13 is arranged at the first end of the test transmission conductor 12 and is used to electrically connect with the test instrument 3, and the second electrical connection component 14 is arranged at the second end of the test transmission conductor 12 and is used to electrically connect with the device under test 4. The second electrical connection components 14 of the two test links 11 are arranged at intervals. The first electrical connection component 13 may, for example, be at least one of a coaxial connector, a probe and a pad, and can be specifically selected according to the connection structure of the test instrument 3 and the type of the device under test 4. The coaxial connector may, for example, be an SMA (Subminiature version A) connector, an SMP (SubMiniature version P) connector, an SMPM (SMP Micro) connector, an MMCX (MicroMiniature Coaxial) connector, and the like.
[0029] In the embodiment of the utility model, as shown in Figures 1-2 and Figure 4 The calibration piece 2 includes a plate body 21 and two sets of calibration links 22 arranged on the plate body 21, and the two sets of calibration links 22 are mirror-symmetrical to each other. Each calibration link 22 includes a de-embedded reference conductor 23 and a third electrical connection component 24. The de-embedded reference conductor 23 is the same as or substantially the same as the test transmission conductor 12, so that the de-embedded reference conductor 23 and the test transmission conductor 12 have substantially consistent electrical characteristics. The third electrical connection component 24 is connected with the first end of the de-embedded reference conductor 23 and is the same as the first electrical connection component 13 in structure, so that the de-embedded reference conductor 23 and the test transmission conductor 12 have substantially consistent electrical characteristics. Referring to Figure 6 The test instrument 3 is connected to the third electrical connection component 24 of the calibration piece 2, and the electrical characteristic parameters of the calibration piece 2 are tested and extracted.
[0030] The test transmission conductor 12 may include a metal wire, such as a coaxial line, a microstrip line, a strip line, and the like. Since the wire cannot be directly connected to the device under test 4 for signal transmission in general, the second electrical connection component 14 needs to be arranged between the test transmission conductor 12 and the corresponding interface of the device under test 4. The type of the second electrical connection component 14 can be determined according to the type of the device under test 4, for example, the second electrical connection component 14 may include a conductive via. In the transmission process of a high-speed signal, the loss (insertion loss and return loss) of the conductive via in the test fixture 1 will also affect the signal integrity and the accuracy of the electrical characteristic test of the device under test 4. Referring to Figures 1-2 and Figure 4In the embodiment, the calibration jig 2 further comprises a connecting conductor 25 connected between the second ends of the de-embedding reference conductors 23 of the two sets of calibration links 22 for simulating the second electrical connection component 14. The connecting conductor 25 is configured such that the loss value of the connecting conductor 25 is twice the loss value of the second electrical connection component 14 of the set of test links 11, so that the connecting conductor 25 can simulate the loss of the second electrical connection component 14 of the two sets of test links 11 in the test fixture 1. By such configuration, the calibration jig 2 takes into account the influence of the second electrical connection component 14 in the test fixture 1 and more accurately simulates the test fixture 1, which is beneficial to improving the overall accuracy of de-embedding and the accuracy of test results when testing the device under test 4 using the test fixture 1.
[0031] In an embodiment, the connecting conductor 25 and the de-embedding reference conductor 23 can be a continuous and integral structure, for example, the de-embedding reference conductor 23 and the connecting conductor 25 in the two sets of calibration links 22 can be a continuous metal wire. The shape of the connecting conductor 25 can be determined by simulation and modeling to only ensure that the loss value of the connecting conductor 25 is twice the loss value of the second electrical connection component 14 of the set of test links 11.
[0032] The test fixture 1 can be a whole structure or can be a split structure. For example, referring to Figure 3 The test fixture 1 can comprise two sets of fixture halves 15 arranged separately, and each set of test links 11 is arranged on the corresponding set of fixture halves 15.
[0033] In some use scenarios, the test fixture 1 can be assembled by multiple detachable structures, for example, different structures can be replaced to make the test fixture 1 applied to different test instruments 3 or devices under test 4. In an embodiment, referring to Figure 4The test fixture 1 comprises a first base body 16 and a second base body 17 which are detachably connected, for example, by means of insertion, clamping or other feasible ways. The test link 11 comprises a first sub-test link 111 and a second sub-test link 112, the first sub-test link 111 is arranged on the first base body 16 and comprises a first electrical connection component 13, and the second sub-test link 112 is arranged on the second base body 17 and comprises a second electrical connection component 14. The test transmission conductor 12 comprises a first sub-test transmission conductor 121 and a second sub-test transmission conductor 122, the first sub-test link 111 comprises the first sub-test transmission conductor 121 which is connected with the first electrical connection component 13, and the second sub-test link 112 comprises the second sub-test transmission conductor 122 which is connected with the second electrical connection component 14. When the first base body 16 and the second base body 17 are connected, the first sub-test transmission conductor 121 is connected with the second sub-test transmission conductor 122. For example, corresponding interfaces can be arranged on corresponding ends of the first sub-test transmission conductor 121 and the second sub-test transmission conductor 122 to realize the connection. In order to make the calibration piece 2 accurately simulate the electrical characteristics of the test fixture 1, the calibration piece 2 can also be formed in a split structure similar to the test fixture 1, and after the parts of the calibration piece 2 are connected, the de-embedded reference conductor 23 and the test link 11 have substantially the same structure, so that the de-embedded reference conductor 23 and the test link 11 have substantially the same electrical characteristics, so as to ensure that the calibration piece 2 can accurately simulate the electrical characteristics of the test fixture 1.
[0034] The electrical characteristic test assembly of the embodiment of the utility model, through setting the connecting conductor 25 to connect two groups of calibration links 22 on the calibration piece 2, and making the loss value be twice of the loss value of the second electrical connection component 14 of one group of test links 11 of the test fixture 1, fully consider the influence of the second electrical connection component 14 in the test fixture 1, make the calibration piece 2 simulate the electrical characteristics of the test fixture 1 more accurately, before using the test fixture 1 to test the device 4 to be tested, through collecting the electrical characteristics of the calibration piece 2 and de-embedding, can guarantee the accuracy of the electrical characteristic test result of the device 4 to be tested better.
[0035] The electrical characteristic test system further comprises the electrical characteristic test assembly described in at least some of the embodiments above and the test instrument 3. By applying the electrical characteristic test assembly in at least some of the embodiments above, the calibration piece 2 accurately simulates the electrical characteristics of the test fixture 1, and before using the test fixture 1 to test the device 4 to be tested, through collecting the electrical characteristics of the calibration piece 2 and de-embedding, the accuracy of the electrical characteristic test result of the device 4 to be tested can be better guaranteed.
[0036] The above descriptions are only the preferred embodiment of the application, not intended to limit the application. The application can be variously changed and modified by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the application shall be included in the protection scope of the application.
Claims
1. An electrical property test assembly characterized by, The test fixture comprises: a test fixture having two sets of test links arranged in a spaced-apart manner, the two sets of test links being mirror-symmetrical to each other, each set of test links comprising a test transmission conductor, a first electrical connection component and a second electrical connection component, the first electrical connection component being arranged at a first end of the test transmission conductor and configured to be electrically connected to a test instrument, the second electrical connection component being arranged at a second end of the test transmission conductor and configured to be electrically connected to a device under test; and a calibration piece comprising a board body and two sets of calibration links arranged on the board body, the two sets of calibration links being mirror-symmetrical to each other, each set of calibration links comprising a de-embedded reference conductor and a third electrical connection component, the de-embedded reference conductor being identical in structure to the test transmission conductor, the third electrical connection component being identical in structure to the first electrical connection component and connected to a first end of the de-embedded reference conductor, the calibration piece further comprising a connecting conductor connected between second ends of the de-embedded reference conductors of the two sets of calibration links, the connecting conductor being configured to have a loss value twice that of the second electrical connection component of one set of test links. The connecting conductor and the de-embedded reference conductor are in a continuous and integral structure.
2. The electrical property test assembly of claim 1, wherein, The first electrical connection component comprises at least one of a coaxial connector, a probe and a pad.
3. The electrical property test assembly of claim 1, wherein, The second electrical connection component comprises a conductive via.
4. The electrical property test assembly of claim 1, wherein, The test fixture comprises two sets of fixture halves arranged in a spaced-apart manner, each set of test links being arranged in a corresponding set of fixture halves.
5. The electrical property test assembly of claim 1, wherein, The test fixture comprises a first base body and a second base body, the first base body and the second base body being detachably connected; 6. The electrical property test assembly of claim 1, wherein, The test link comprises a first sub-test link and a second sub-test link, the first sub-test link being arranged on the first base body and comprising the first electrical connection component, the second sub-test link being arranged on the second base body and comprising the second electrical connection component. The test transmission conductor comprises a first sub-test transmission conductor and a second sub-test transmission conductor, the first sub-test link comprising the first sub-test transmission conductor, the first sub-test transmission conductor being connected to the first electrical connection component, the second sub-test link comprising the second sub-test transmission conductor, the second sub-test transmission conductor being connected to the second electrical connection component; 7. The electrical property test assembly of claim 6, wherein, When the first base body and the second base body are connected, the first sub-test transmission conductor is connected to the second sub-test transmission conductor. The test instrument; and 8. An electrical property testing system, characterized by, The electrical property test assembly according to any one of claims 1-7.