Height-adjustable chip test assembly

Abstract

The utility model relates to a height-adjustable chip test assembly, which comprises a base, a first adjusting piece, a second adjusting piece, a base, a test circuit board and a golden finger assembly, the test circuit board is fixedly arranged on the base, the golden finger assembly is fixedly arranged on the test circuit board, and the first adjusting piece and the second adjusting piece are arranged on the base. A chip to be tested is placed in the golden finger assembly, on one hand, the first adjusting piece is fixedly connected with the base, the first adjusting piece and the second adjusting piece are detachably and fixedly connected, the first adjusting piece can move up and down relative to the second adjusting piece, and on the other hand, the first adjusting piece can move up and down relative to the second adjusting piece. Therefore, the height of the first adjusting piece is changed relative to the height of the second adjusting piece, and the second adjusting piece is fixedly installed on the base.

Description

TECHNICAL FIELD

[0001] The utility model relates to chip test field, concretely relates to a chip test subassembly of height adjustable. BACKGROUND

[0002] Chip is the most core one component part in electronic product. In the current production manufacturing process, after chip completes manufacturing, needs testing to it, in one prior art, chip testing device includes circuit board, gold finger subassembly and base, circuit board installs on the base, gold finger subassembly one side and circuit board electric connection, the other side and circuit board fixed mounting, places the chip to be tested to gold finger subassembly, to this realizes the electric connection between the chip to be tested and circuit board.

[0003] But, prior art lacks the device or invention that can adjust the height of chip testing device, this is because, needs to move the chip to be tested before putting into chip testing device, at present, all through the automatic equipment and shift, but, for the automatic equipment of different height, the height constant chip testing device in prior art does not meet the requirement, the solution to this problem makes the automatic equipment can adjust the height, or the chip testing device can adjust the height, but, the automatic equipment that satisfies height adjustment is high in price, cost rises, therefore, can only adjust the height of chip testing device, and there is no height adjustable chip testing device in the market at present. SUMMARY

[0004] The utility model discloses a kind of height adjustable chip test components to solve the shortcomings in prior art.

[0005] To achieve the above object, the utility model adopts the following technical scheme: a kind of height adjustable chip test components, comprising: base, first adjusting piece, second adjusting piece, base, test circuit board, gold finger subassembly, the test circuit board is fixedly installed on the base, the gold finger subassembly is fixedly installed on the test circuit board, the chip to be tested is put into the gold finger subassembly, wherein, the first adjusting piece one side and the base are fixedly connected together, the first adjusting piece and the second adjusting piece are detachably fixed connection, and the first adjusting piece can be moved up and down relative to the second adjusting piece, to this makes the height of the first adjusting piece relative to the second adjusting piece change, the second adjusting piece is fixedly installed on the base.

[0006] Further, the first adjusting member is provided with at least one first adjusting through hole which penetrates the first adjusting member; the second adjusting member is provided with at least one second adjusting through hole which penetrates the second adjusting member; when the first adjusting member and the second adjusting member are installed together, bolts pass through the first adjusting through hole and the second adjusting through hole respectively; when the bolts are tightened, the first adjusting member and the second adjusting member are fixedly installed together; when the bolts are loosened and the first adjusting member moves up and down relative to the second adjusting member, the height of the first adjusting member changes; the longitudinal section of the second adjusting member is in the shape of a long strip.

[0007] Further, the first adjusting member is further provided with a positioning groove which is recessed inward from the first adjusting member by a preset depth; the second adjusting member is provided with a positioning through hole which penetrates the second adjusting member; when the first adjusting member and the second adjusting member are installed together, the positioning groove and the positioning through hole are aligned, and a bolt is inserted into the positioning through hole and the positioning groove, so that the installation of the first adjusting member and the second adjusting member is more accurate.

[0008] Further, the first adjusting member comprises a connecting part which is provided with at least one bolt hole which penetrates the connecting part; the connecting part and the base are fixedly connected together by means of bolt connection, so that the first adjusting member and the base are fixedly connected.

[0009] Further, the first adjusting member further comprises a first part, a second part and a third part; one end of the first part is fixedly connected with the connecting part, the other end of the first part is fixedly connected with one end of the second part, the other end of the second part is fixedly connected with the third part, the first part and the second part are perpendicular, and the second part and the third part are perpendicular.

[0010] Further, the first adjusting through hole is arranged on the third part, and the positioning groove is arranged on the third part.

[0011] Further, the second adjusting member comprises a vertical plate and a connecting plate; the vertical plate and the connecting plate are fixedly connected, and the vertical plate and the connecting plate are perpendicular.

[0012] Further, the positioning through hole and the second adjusting through hole are both arranged on the vertical plate; the vertical plate and the third part of the first adjusting member are installed together; and the connecting plate and the base are fixedly installed together.

[0013] Further, the upright plate has a first outer surface and a second outer surface, and the second outer surface of the upright plate is in contact with the third part of the first adjusting member when the upright plate and the third part of the first adjusting member are mounted together.

[0014] Further, a sliding groove is arranged on the second outer surface of the upright plate, the sliding groove is recessed from the second outer surface towards the first outer surface by a preset depth, the sliding groove extends from the upper portion to the lower portion of the upright plate, the third part of the first adjusting member is fitted into the sliding groove, and the third part of the first adjusting member slides up and down in the sliding groove when the first adjusting member moves up and down.

[0015] The chip testing assembly with height adjustment provided by the application has the advantages that the chip testing assembly with height adjustment provided by the application has simple structure and is easy to disassemble and assemble, the first adjusting hole is arranged on the first adjusting member, the second adjusting hole is arranged on the second adjusting member, the second adjusting hole is in the shape of a long strip, the bolt is inserted into the first adjusting hole and the second adjusting hole, the first adjusting member and the second adjusting member are fixedly connected together when the bolt is tightened, and the first adjusting member moves up and down relative to the second adjusting member when the bolt is loosened, so that the height of the chip to be tested is adjusted. BRIEF DESCRIPTION OF DRAWINGS

[0016] Figure 1 FIG. 1 is a structural schematic view of a chip testing assembly with height adjustment provided by the application.

[0017] Figure 2 FIG. 2 is another structural schematic view of the chip testing assembly with height adjustment provided by the application.

[0018] Figure 3 FIG. 3 is a structural schematic view of a first adjusting member of the chip testing assembly with height adjustment provided by the application.

[0019] Figure 4 FIG. 4 is a structural schematic view of a second adjusting member of the chip testing assembly with height adjustment provided by the application.

[0020] Figure 5 FIG. 5 is another structural schematic view of the second adjusting member of the chip testing assembly with height adjustment provided by the application. DETAILED DESCRIPTION

[0021] The application will be described in further detail below with specific reference being made to the drawings. Like elements in different embodiments are denoted by like reference numerals. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the application. However, those skilled in the art will readily recognize that many of the specific details presented herein can be replaced by other elements, materials, methods, etc. In some instances, detailed descriptions of such elements, materials, methods, etc. are omitted so as not to obscure the core teachings of the application. Embodiments of the application will employ, unless otherwise indicated herein, artificial intelligence, expert systems, and / or the like, for the purpose of enhancing the accuracy and reliability of computations.

[0022] In addition, the features, operations or steps described in the specification can be combined in any suitable manner in various embodiments, and the order of the steps involved in the various embodiments can be adjusted as can be apparent to those skilled in the art. Therefore, the specification and the drawings are merely intended to illustrate certain embodiments, and do not necessarily imply the essential components and / or order.

[0023] In this document, the terms "first", "second", etc. are used only to distinguish the described objects, and do not have any sequential or technical meaning. In this document, "connected", "coupled" or the like, unless otherwise specified, includes direct and indirect connections (couplings).

[0024] Please refer to Figures 1-5 The application provides a chip testing assembly capable of adjusting height (hereinafter referred to as "the assembly"), which comprises a base 1, a first adjusting member 2, a second adjusting member 3, a base 4, a test circuit board 5, and a gold finger assembly 6. The test circuit board 5 is fixedly installed on the base 1, and the gold finger assembly 6 is fixedly installed on the test circuit board 5. A chip to be tested 7 is placed in the gold finger assembly 6. The first adjusting member 2 is fixedly connected with the base 1, and the first adjusting member 2 and the second adjusting member 3 are detachably fixedly connected. The first adjusting member 2 can move up and down relative to the second adjusting member 3, so that the height of the first adjusting member 2 relative to the second adjusting member 3 changes. The second adjusting member 3 is fixedly installed on the base 4.

[0025] In an embodiment of the present application, the first adjusting part 2 is provided with at least one first adjusting through hole 230 which penetrates through the first adjusting part 2, and the second adjusting part 3 is provided with at least one second adjusting through hole 310 which penetrates through the second adjusting part 3; when the first adjusting part 3 and the second adjusting part 3 are installed together, bolts pass through the first adjusting through hole 230 and the second adjusting through hole 310 respectively, and when the bolts are tightened, the first adjusting part 2 and the second adjusting part 3 are fixedly installed together; when the bolts are loosened and the first adjusting part 2 moves up and down relative to the second adjusting part 3, the height of the first adjusting part 2 changes; the longitudinal section of the second adjusting part 3 is in the shape of a long strip.

[0026] In an embodiment of the present application, the first adjusting part 2 is further provided with a positioning groove 231 which is recessed inward from the first adjusting part 2 by a preset depth, and the second adjusting part 3 is provided with a positioning through hole 311 which penetrates through the second adjusting part 3; when the first adjusting part 2 and the second adjusting part 3 are installed together, the positioning groove 231 and the positioning through hole 311 are opposite to each other, and a bolt (not shown, cylindrical) is inserted into the positioning through hole 311 and the positioning groove 231, so that the installation of the first adjusting part 2 and the second adjusting part 3 is more accurate.

[0027] In an embodiment of the present application, the first adjusting part 2 comprises a connecting part 24 which is provided with at least one bolt hole 240 which penetrates through the connecting part 24, and the connecting part 24 and the base 1 are fixedly connected together by bolt connection, so that the first adjusting part 2 and the base 1 are fixedly connected.

[0028] In an embodiment of the present application, the first adjusting part 2 further comprises a first part 21, a second part 22 and a third part 23, one end of the first part 21 is fixedly connected with the connecting part 24, the other end of the first part 21 is fixedly connected with one end of the second part 22, the other end of the second part 22 is fixedly connected with the third part 23, and the first part 21 and the second part 22 are perpendicular, and the second part 22 and the third part 23 are perpendicular.

[0029] In an embodiment of the present application, the first adjusting through hole 230 is arranged on the third part 23, and the positioning groove 231 is arranged on the third part 23.

[0030] In an embodiment of the present application, the second adjusting member 3 comprises an upright plate 31 and a connecting plate 32, the upright plate 31 and the connecting plate 32 are fixedly connected, and the upright plate 31 and the connecting plate 32 are perpendicular to each other.

[0031] In an embodiment of the present application, the positioning through hole 311 and the second adjusting through hole 310 are arranged on the upright plate 31, the upright plate 31 and the third part 23 of the first adjusting member 2 are mounted together, and the connecting plate 32 and the base 4 are fixedly mounted together.

[0032] In an embodiment of the present application, the upright plate 31 has a first outer surface 311 and a second outer surface 312, when the upright plate 31 and the third part 23 of the first adjusting member 1 are mounted together, the second outer surface 312 of the upright plate 31 and the third part 23 of the first adjusting member 1 are in contact.

[0033] In an embodiment of the present application, the second outer surface 312 of the upright plate 31 is provided with a sliding groove 313, the sliding groove 313 is recessed from the second outer surface 312 to the first outer surface 311 by a preset depth, the sliding groove 313 extends from the top of the upright plate 31 to the bottom, the sliding groove 313 and the third part 23 of the first adjusting member 2 are adapted, the third part 23 of the first adjusting member 2 is embedded in the sliding groove 313, and when the first adjusting member 3 moves up and down, the third part 23 of the first adjusting member 2 synchronously slides up and down in the sliding groove 313.

[0034] The height-adjustable chip testing assembly provided by the present application has simple structure and is easy to disassemble and assemble, the first adjusting through hole is arranged on the first adjusting member, the second adjusting through hole is arranged on the second adjusting member, the second adjusting through hole is in the shape of a long strip, the bolt is inserted into the first adjusting through hole and the second adjusting through hole, when the bolt is tightened, the first adjusting member and the second adjusting member are fixedly connected together, when the bolt is loosened, the first adjusting member moves up and down relative to the second adjusting member, so that the height of the chip to be tested is adjusted.

[0035] The above embodiments are only for illustrating the technical concept and characteristics of the present application, the purpose is to enable those skilled in the art to understand the content of the present application and implement it, and cannot limit the protection scope of the present application. Any equivalent changes or modifications made according to the spirit and essence of the present application shall be covered within the protection scope of the present application.

Claims

1. A height-adjustable chip testing assembly, characterized by, The utility model relates to a test fixture for testing chip, which comprises a base, a first adjusting part, a second adjusting part, a pedestal, a test circuit board and a golden finger assembly, wherein the test circuit board is fixedly installed on the base, the golden finger assembly is fixedly installed on the test circuit board, and a chip to be tested is placed in the golden finger assembly. The first adjusting part is fixedly connected with the base, the first adjusting part and the second adjusting part are detachably fixedly connected, the first adjusting part can move up and down relative to the second adjusting part, and the height of the first adjusting part relative to the second adjusting part is changed.

2. The height-adjustable chip testing assembly of claim 1, wherein, The first adjusting part is provided with at least one first adjusting through hole which penetrates the first adjusting part, the second adjusting part is provided with at least one second adjusting through hole which penetrates the second adjusting part, when the first adjusting part and the second adjusting part are installed together, bolts pass through the first adjusting through hole and the second adjusting through hole respectively, when the bolts are tightened, the first adjusting part and the second adjusting part are fixedly installed together, when the bolts are loosened and the first adjusting part moves up and down relative to the second adjusting part, the height of the first adjusting part is changed, and the longitudinal section of the second adjusting part is in the shape of a long strip.

3. The height-adjustable chip testing assembly of claim 2, wherein, The first adjusting part is further provided with a positioning groove which is recessed inward from the first adjusting part by a preset depth, the second adjusting part is provided with a positioning through hole which penetrates the second adjusting part, when the first adjusting part and the second adjusting part are installed together, the positioning groove and the positioning through hole are aligned, a bolt is inserted into the positioning through hole and the positioning groove, and the installation of the first adjusting part and the second adjusting part is more accurate.

4. The height-adjustable chip testing assembly of claim 3, wherein, The first adjusting part comprises a connecting part which is provided with at least one bolt hole which penetrates the connecting part, and the connecting part and the base are fixedly connected by bolt connection, so that the first adjusting part and the base are fixedly connected.

5. The height-adjustable chip testing assembly of claim 4, wherein, The first adjusting part further comprises a first part, a second part and a third part, one end of the first part is fixedly connected with the connecting part, the other end of the first part is fixedly connected with one end of the second part, the other end of the second part is fixedly connected with the third part, the first part and the second part are perpendicular, and the second part and the third part are perpendicular.

6. The height-adjustable chip testing assembly of claim 5, wherein, The first adjusting through hole is arranged on the third part, and the positioning groove is arranged on the third part.

7. The height-adjustable chip testing assembly of claim 6, wherein, The second adjusting part comprises a vertical plate and a connecting plate which are fixedly connected, and the vertical plate and the connecting plate are perpendicular.

8. The height-adjustable chip testing assembly of claim 7, wherein, The positioning through hole and the second adjusting through hole are arranged on the vertical plate, the vertical plate and the third part of the first adjusting part are installed together, and the connecting plate and the pedestal are fixedly installed together.

9. The height-adjustable chip testing assembly of claim 8, wherein, The upright plate has a first outer surface and a second outer surface, and the second outer surface of the upright plate is in contact with the third part of the first adjusting member when the upright plate and the third part of the first adjusting member are mounted together.

10. The height-adjustable chip testing assembly of claim 9, wherein, The second outer surface of the upright plate is provided with a sliding groove recessed from the second outer surface by a preset depth in a direction towards the first outer surface, the sliding groove extends from the upper portion of the upright plate to the lower portion, and the third part of the first adjusting member is adapted to the sliding groove, the third part of the first adjusting member is embedded in the sliding groove, and the third part of the first adjusting member slides up and down in the sliding groove synchronously when the first adjusting member moves up and down.

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