Jig for testing crystal on PCB

Abstract

The utility model discloses a jig for testing a crystal on a PCB (Printed Circuit Board). The jig comprises a bottom plate, wherein a circuit board is arranged above the bottom plate; the lower surface of the circuit board is connected with symmetrically arranged interface bonding pads and a conversion circuit, the upper surface of the circuit board is connected with symmetrically arranged connection serial ports corresponding to the interface bonding pads, and the connection serial ports are welded at the interface bonding pads; the middle of the upper surface of the bottom plate is connected with a connector. A worker holds the two measuring lines, enables the measuring probe to be in contact with the crystal on the PCB, receives a signal through the conversion circuit after contact, converts signal parameters obtained through testing on the PCB to corresponding measuring software to be displayed, and can judge whether the performance of the crystal is abnormal or not by observing and analyzing data. The problem that detection can only be carried out by dismounting the crystal is solved, the crystal and the PCB are not damaged, the accuracy of crystal detection is improved, crystals of different sizes and models can be detected, and the adaptability is improved.

Description

TECHNICAL FIELD

[0001] The utility model belongs to the technical field of PCB board, specifically relates to a test fixture of crystal on PCB board. BACKGROUND

[0002] The crystal on the PCB board usually refers to the crystal oscillator, and its core is a quartz crystal. The crystal oscillator is a clock component in a circuit, which can provide a stable clock frequency for a microprocessor chip and is the heart of a microprocessor.

[0003] The crystal test fixture is a fixture device specially used for testing the performance of the crystal on the PCB board, which can ensure the accuracy and stability of the test signal and help quickly and accurately detect whether the crystal has a fault.

[0004] In the prior art, the crystal is welded on the PCB board. When testing and analyzing the crystal on the PCB board, the common method is to disassemble the crystal from the PCB board, and then place the disassembled crystal on a corresponding type of fixture for testing and analysis. Although the above method can test and analyze the crystal, the disassembly of the crystal is achieved by locally heating the position corresponding to the crystal on the PCB board. During the heating process, the PCB board is damaged, and the heating behavior also affects the performance of the crystal, and even causes damage to the crystal, thereby preventing accurate testing of the performance of the crystal. UTILITY MODEL CONTENTS

[0005] To solve the technical problem of being unable to accurately test the performance of the crystal, the utility model provides a test fixture of crystal on a PCB board.

[0006] The purpose of the utility model can be achieved through the following technical solutions:

[0007] A test fixture of crystal on a PCB board, comprising a bottom plate: a circuit board is arranged above the bottom plate; a symmetrical interface pad and a conversion circuit are connected to the lower surface of the circuit board, a symmetrical connection serial port is connected to the position corresponding to the interface pad on the upper surface of the circuit board, and the connection serial port is welded at the interface pad; a connector is connected to the middle of the upper surface of the bottom plate, symmetrical measurement lines are connected to the side of the connector away from the conversion circuit, and a measurement probe is connected to the end of the measurement line away from the connector.

[0008] Preferably, symmetrical racks are connected to the position corresponding to the measurement line in the middle of the upper surface of the bottom plate, a gear is engaged with the end of the rack away from the connector, a winding rod is connected to the middle of the gear, and a U-shaped clamping block is connected to the lower surface of the winding rod.

[0009] Preferably, a anti-drop plate is connected to the upper end of the winding rod, and a lever is rotatably connected to the upper surface of the anti-drop plate.

[0010] Preferably, the middle part of the lower surface of the gear is connected with a sliding rod, and the bottom plate is provided with a sliding groove corresponding to the position of the sliding rod, and the sliding rod is slidingly connected in the sliding groove.

[0011] Preferably, the bottom of the sliding rod is provided with a moving block, and the side of the moving block close to the middle part of the bottom plate is connected with a spring.

[0012] Preferably, the lower end of the sliding rod is connected with a positioning block corresponding to the position of the moving block, the upper side of the moving block is provided with a positioning slot corresponding to the position of the positioning block, and the positioning block is inserted in the positioning slot.

[0013] Preferably, the outer side of the moving block is connected with symmetrically arranged sliding blocks, the bottom plate is connected with symmetrically arranged sliding rails corresponding to the position of the sliding blocks, and the adjacent sliding blocks are connected with a synchronous block.

[0014] Preferably, the upper surface of the bottom plate is connected with symmetrically arranged vertical rods corresponding to the position of the measuring line away from the connector, the upper side of the vertical rod is connected with a cover plate corresponding to the position of the winding rod, the middle part of the cover plate is provided with a hollow slot, and the hollow slot is slidingly connected with an extension plate.

[0015] The utility model discloses the beneficial effects of:

[0016] By holding two measuring lines by the staff, and contacting the measuring probe with the crystal on the PCB, the converted circuit receives the signal after contacting, and the signal parameters obtained by testing the PCB are converted to the corresponding measurement software to display, by observing the data, whether the performance of the crystal is abnormal can be analyzed, the problem that the crystal needs to be removed for detection is solved, the crystal is not damaged, the accuracy of the crystal detection is improved, and different size models of the crystal can be detected, and the adaptability is improved.

[0017] When the measuring probe is used up and the measuring line needs to be arranged, the measuring line is straightened and placed in the clamping block, so that the measuring line is fixed. After the measuring line is fixed, the staff drives the push-pull block to make the extension plate enter the sleeve plate. After the extension plate enters the sleeve plate, the winding rod is no longer blocked. Under the action of the spring restoring force, the moving block is reset. The moving block will synchronously drive the gear to move during the resetting process. The gear can be wound outside the winding rod in cooperation with the rack during the moving process, so that the purpose of arranging the measuring line is achieved, and the two measuring lines are prevented from being wound and knotted. The measuring line can be used more conveniently; when the measuring probe needs to be used to detect the crystal on the PCB, one of the levers is pulled to move away from the connector. Because the two moving blocks are connected through the synchronous block, when one of the levers drives one of the gears to move, the other gear will also move synchronously. During the process of driving the two gears to move, the lever rotates the gear in cooperation with the rack. When the gear rotates, the measuring line outside the winding rod will gradually separate from the winding rod, and under the cooperation of the clamping block, the separated measuring line will also be in a straight line state, so that the two measuring lines are prevented from being wound and knotted. After the lever is pulled to the position beyond the sleeve plate, the two push-pull blocks are respectively driven to make the two extension plates move out of the corresponding sleeve plates and correspond to the positions of the winding rods. The lever is loosened, and under the action of the spring restoring force, the winding rod abuts against the extension plate, so that the position of the winding rod is fixed. The measuring line is taken out of the clamping block, and the measuring probe can be used to detect the crystal on the PCB. BRIEF DESCRIPTION OF DRAWINGS

[0018] In order to more clearly illustrate the technical scheme of the embodiments of the present application, the following will briefly introduce the drawings needed to be used in the embodiment description. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can also be obtained by those skilled in the art without creative labor.

[0019] Figure 1 It is a perspective view of the present application for testing the crystal on the PCB.

[0020] Figure 2 It is a perspective view of the conversion line in the present application for testing the crystal on the PCB.

[0021] Figure 3 It is a perspective view of the rack in the present application for testing the crystal on the PCB.

[0022] Figure 4 It is a front view of the gear in the present application for testing the crystal on the PCB.

[0023] Figure 5 Figure 1 is a perspective view of a spring in a jig for testing a crystal on a PCB according to the present application;

[0024] Figure 6 Figure 2 is a perspective view of a sleeve plate in the jig for testing the crystal on the PCB according to the present application;

[0025] Figure 7 Figure 3 is a sectional view of the sleeve plate in the jig for testing the crystal on the PCB according to the present application.

[0026] In the drawings, the components represented by the respective reference numerals are listed as follows:

[0027] 1, base plate; 2, rack; 3, sliding rod; 4, vertical rod;

[0028] 11, circuit board; 111, interface pad; 112, conversion circuit; 12, connection serial port; 13, connector; 14, measurement line; 15, measurement probe; 16, protective ring;

[0029] 21, gear; 22, winding rod; 23, clamping block; 24, non-slip pad; 25, anti-dropping plate; 26, lever;

[0030] 31, sliding groove; 32, positioning block; 33, moving block; 34, positioning groove; 35, spring; 36, sliding block; 37, sliding rail; 38, synchronization block;

[0031] 41, sleeve plate; 42, hollow groove; 43, lengthening plate; 44, push-pull block; 45, movable groove. DETAILED DESCRIPTION

[0032] The technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the present application.

[0033] Please refer to Figure 1 - Figure 7 As shown in FIG. 1, a jig for testing a crystal on a PCB includes a base plate 1, and a circuit board 11 is arranged above the base plate 1.

[0034] The lower surface of the circuit board 11 is connected with symmetrically arranged interface pads 111 and conversion circuits 112. The conversion circuits 112 are used to convert the signal parameters tested on the circuit board to the corresponding measurement software for display.

[0035] The upper surface of the circuit board 11 is connected with symmetrically arranged connecting serial ports 12 corresponding to the positions of the interface pads 111. The connecting serial ports 12 are welded at the interface pads 111, and are used to connect special test board cards, conduction measurement systems and test PCB cards.

[0036] The upper surface of the bottom plate 1 is connected with a connector 13 at the middle part. The connector 13 is used to connect measurement lines 14.

[0037] The connector 13 is connected with symmetrically arranged measurement lines 14 away from the conversion line 112. The measurement lines 14 are connected with measurement probes 15 at the ends away from the connector 13. The measurement probes 15 are used to detect crystals on PCBs.

[0038] The outer side of the end of the measurement line 14 close to the measurement probe 15 is connected with a protective ring 16. The protective ring 16 is used to protect the detection personnel.

[0039] In specific use, the staff holds the two measurement lines 14, and contacts the measurement probe 15 with the crystal on the PCB. After the contact, the conversion line 112 receives the signal, converts the signal parameters obtained by the test on the PCB to the corresponding measurement software for display, and the performance of the crystal is analyzed by observing the data. The problem that the crystal needs to be removed for detection is solved, the crystal is not damaged, the accuracy of crystal detection is improved, and different sizes of crystals can be detected, improving the adaptability.

[0040] The upper surface of the bottom plate 1 is connected with symmetrically arranged racks 2 corresponding to the positions of the measurement lines 14 at the middle part. The end of the rack 2 away from the connector 13 is engaged with a gear 21. Through the cooperation of the rack 2 and the gear 21, the measurement line 14 can be wound outside the winding rod 22.

[0041] The upper middle part of the gear 21 is connected with a winding rod 22. The winding rod 22 is used to wind the measurement line 14.

[0042] The lower part of the winding rod 22 is connected with a U-shaped clamping block 23. The clamping block 23 is used to clamp the measurement line 14, so that the measurement line 14 can be wound by the winding rod 22.

[0043] The inner part of the clamping block 23 is connected with a U-shaped anti-skid pad 24. The anti-skid pad 24 is used to prevent the phenomenon of slipping during winding the measurement line 14.

[0044] The upper end of the winding rod 22 is connected with an anti-falling plate 25. The anti-falling plate 25 is used to limit the position of the measurement line 14, so that the measurement line 14 can always be between the anti-falling plate 25 and the gear 21, preventing the measurement line 14 from falling off.

[0045] The upper part of the anti-falling plate 25 is rotationally connected with a lever 26. By pushing the lever 26, the position of the gear 21 can be moved.

[0046] The middle of the lower surface of the gear 21 is connected with a sliding rod 3, and the bottom plate 1 is provided with a sliding groove 31 corresponding to the position of the sliding rod 3. The sliding rod 3 is slidingly connected in the sliding groove 31. Through the cooperation of the sliding rod 3 and the sliding groove 31, the position of the gear 21 can be limited to prevent the gear 21 from being displaced.

[0047] It is worth noting here that in order to prevent external force from damaging the jig and prevent foreign objects from entering the gap of the jig and blocking the normal use of the gear 21, a shell can be provided above the bottom plate corresponding to the positions of the gear 21 and the rack 2 to protect the jig and block foreign objects.

[0048] The lower side of the sliding rod 3 is provided with a moving block 33, and the lower end of the sliding rod 3 is connected with a positioning block 32 corresponding to the position of the moving block 33. The upper side of the moving block 33 is provided with a positioning groove 34 corresponding to the position of the positioning block 32. The positioning block 32 is inserted into the positioning groove 34. Through the cooperation of the positioning block 32 and the positioning groove 34, the gear 21 is connected with the moving block 33, so that the gear 21 and the moving block 33 can move synchronously.

[0049] The side of the moving block 33 close to the middle of the bottom plate 1 is connected with a spring 35 between the moving block 33 and the bottom plate 1. The spring 35 is used to reset the moving block 33 and the gear 21.

[0050] The outer side of the moving block 33 is connected with symmetrically arranged sliding blocks 36, and the bottom plate 1 is connected with symmetrically arranged sliding rails 37 corresponding to the positions of the sliding blocks 36. Through the cooperation of the sliding blocks 36 and the sliding rails 37, the position of the moving block 33 can be limited to prevent it from leaving the moving track.

[0051] The adjacent sliding blocks 36 are connected with a synchronous block 38, which is used to connect the two moving blocks 33, so that the two moving blocks 33 can move synchronously.

[0052] The upper surface of the bottom plate 1 is connected with symmetrically arranged vertical rods 4 corresponding to the position of the measuring line 14 away from one end of the connector 13. The upper side of the vertical rod 4 is connected with a cover plate 41 corresponding to the position of the winding rod 22. The cover plate 41 is used to accommodate the extension plate 43.

[0053] The middle of the cover plate 41 is provided with a hollow groove 42, and the hollow groove 42 is slidingly connected with the extension plate 43. The extension plate 43 is used to block the winding rod 22 and fix the position of the winding rod 22.

[0054] The upper side of the extension plate 43 is connected with a push-pull block 44 away from the position of the winding rod 22. The push-pull block 44 is used to adjust the position of the extension plate 43.

[0055] The upper side of the cover plate 41 is provided with a movable groove 45 corresponding to the position of the push-pull block 44. The push-pull block 44 is slidingly connected in the movable groove 45. The movable groove 45 is used to provide the moving position of the push-pull block 44.

[0056] In specific use, when the measuring probe 15 is used up and the measuring line 14 needs to be arranged, the measuring line 14 is straightened and placed in the clamping block 23, so that the measuring line 14 is fixed, and after the measuring line 14 is fixed, the staff member drives the push-pull block 44 to make the lengthening plate 43 enter the sleeve plate 41, after the lengthening plate 43 enters the sleeve plate 41, the winding rod 22 is no longer blocked, under the action of the restoring force of the spring 35, the moving block 33 is reset, and the moving block 33 synchronously drives the gear 21 to move in the resetting process, the gear 21 cooperates with the rack 2 in the moving process, and the measuring line 14 can be wound outside the winding rod 22, so that the purpose of arranging the measuring line 14 is achieved, and the winding and knotting between the two measuring lines 14 are prevented, and the measuring line 14 can be used more conveniently;

[0057] When the measuring probe 15 needs to be used to detect the crystal of the PCB, one of the levers 26 is pulled to move away from the connector 13, because the two moving blocks 33 are connected through the synchronous block 38, so when one of the levers 26 drives one of the gears 21 to move, the other gear 21 also moves synchronously, in the process that one of the levers 26 drives the two gears 21 to move, the gear 21 cooperates with the rack 2, and the gear 21 rotates, when the gear 21 rotates, the measuring line 14 outside the winding rod 22 gradually separates from the winding rod 22, and under the cooperation of the clamping block 23, the separated measuring line 14 is also in a straight line state, so that the winding and knotting between the two measuring lines 14 are avoided, after one of the levers 26 is pulled to the position beyond the sleeve plate 41, the two push-pull blocks 44 are driven respectively to make the two lengthening plates 43 move out of the corresponding sleeve plates 41 and correspond to the positions of the winding rods 22, one of the levers 26 is released, under the action of the restoring force of the spring 35, the winding rod 22 abuts against the lengthening plate 43, so that the position of the winding rod 22 is fixed, the measuring line 14 is taken out of the clamping block 23, and the measuring probe 15 can be used to detect the crystal on the PCB.

[0058] In the description of the specification, the description of the terms "one embodiment", "example", "specific example" and the like means that the specific features, structures, materials or characteristics described in connection with the embodiment or example are contained in at least one embodiment or example of the utility model. In the specification, the illustrative description of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner.

[0059] The above is only an example and description of the structure of the utility model, and various modifications or supplements or similar replacements of the described specific embodiments can be made by the skilled in the art without deviating from the structure of the utility model or beyond the scope defined by the claims, which shall belong to the protection scope of the utility model.

Claims

1. A test fixture for testing a crystal on a PCB board, comprising a base plate (1); characterized in that: The circuit board (11) is arranged above the bottom plate (1); The lower surface of the circuit board (11) is connected with symmetrically arranged interface pads (111) and conversion circuits (112), and the upper surface of the circuit board (11) is connected with symmetrically arranged connection serial ports (12) at positions corresponding to the interface pads (111); the connection serial ports (12) are welded at the interface pads (111); The upper surface of the bottom plate (1) is connected with a connector (13) in the middle, symmetrically arranged measurement lines (14) are connected to the side of the connector (13) away from the conversion circuits (112), and measurement probes (15) are connected to the ends of the measurement lines (14) away from the connector (13).

2. The apparatus for testing a crystal on a PCB according to claim 1, wherein: The upper surface of the bottom plate (1) is connected with symmetrically arranged racks (2) in the middle at positions corresponding to the measurement lines (14), the racks (2) are engaged with gears (21) at the ends thereof away from the connector (13), and the gears (21) are connected with winding rods (22) in the middle above the gears (21); the winding rods (22) are connected with U-shaped clamping blocks (23) below the winding rods (22).

3. The apparatus for testing a crystal on a PCB according to claim 2, wherein: The upper ends of the winding rods (22) are connected with anti-dropping plates (25), and the anti-dropping plates (25) are rotationally connected with lever rods (26) above the anti-dropping plates (25).

4. The apparatus for testing a crystal on a PCB according to claim 3, wherein: The lower surfaces of the gears (21) are connected with sliding rods (3) in the middle, and the bottom plate (1) is provided with sliding grooves (31) at positions corresponding to the sliding rods (3); the sliding rods (3) are slidingly connected in the sliding grooves (31).

5. The apparatus for testing a crystal on a PCB according to claim 4, wherein: The bottom plate (1) is provided with moving blocks (33) below the sliding rods (3), and the moving blocks (33) are connected with springs (35) between the side thereof close to the middle of the bottom plate (1) and the bottom plate (1).

6. The apparatus for testing a crystal on a PCB according to claim 5, wherein: The lower ends of the sliding rods (3) are connected with positioning blocks (32) at positions corresponding to the moving blocks (33), and the moving blocks (33) are provided with positioning grooves (34) above the moving blocks (33) at positions corresponding to the positioning blocks (32); the positioning blocks (32) are inserted into the positioning grooves (34).

7. The tool for testing a crystal on a PCB board according to claim 6, wherein: The moving blocks (33) are connected with symmetrically arranged sliding blocks (36) on the outer sides thereof, the bottom plate (1) is connected with symmetrically arranged sliding rails (37) at positions corresponding to the sliding blocks (36), and the adjacent sliding blocks (36) are connected with synchronous blocks (38).

8. The tool for testing a crystal on a PCB board according to claim 7, wherein: The upper surface of the bottom plate (1) is connected with symmetrically arranged vertical rods (4) at positions close to the ends of the measurement lines (14) away from the connector (13), the vertical rods (4) are connected with sleeve plates (41) above the vertical rods (4) at positions corresponding to the winding rods (22), the sleeve plates (41) are provided with hollow grooves (42) in the middle thereof, and the hollow grooves (42) are slidingly connected with lengthened plates (43).

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