Automatic sample holder for silicon detector
By designing an automated sample holder for silicon detectors and employing a sample tray positioning mechanism, the problems of complex sample holder structure and low testing efficiency were solved. This enabled direct placement of the sample tray and automatic sample changing measurement, thereby reducing production costs.
Patent Information
- Application Number
- CN202520216651.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-11
- Publication Date
- 2025-11-25
- Estimated Expiration
- 2035-02-11
AI Technical Summary
Existing low-background αβ counters have complex sample holder structures, many types of parts, low testing efficiency, high production costs, and the sample trays need to be placed sequentially, which affects measurement efficiency.
An automated sample holder for silicon detectors is designed, employing a sample tray positioning mechanism including claws and a return spring. The sample tray can be directly placed into the sample holder, and automatic sample changing is achieved through the claws and the return spring, simplifying the component structure and enabling automatic sample changing and measurement of 55 samples.
The sample holder structure has been simplified, testing efficiency has been improved, production costs have been reduced, mass production is easier, and direct insertion of sample trays and automatic sample changing measurement have been achieved.
Smart Images
Figure CN223597905U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to the sample rack field related to silicon detection, specifically is a kind of automatic sample rack for silicon detector. BACKGROUND
[0002] Low background alpha beta counter is a kind of alpha beta radioactive analysis instrument based on high-performance PIPS silicon detector, it is mainly used to measure and analyze alpha, beta radioactivity in various environmental media or process samples, the system uses automatic sample changing structure, and the previous product needs 2 different sample racks to realize the automatic sample changing measurement of 50 samples, its structure part is complex, and the part type is many, in the use process, only sample rack can be placed first, then sample tray is sequentially placed, and the test efficiency is low, and the production cost is high.Therefore, design a PIPS automatic sample rack, simplify the original complex parts, take and place function in one, and 55 samples can be automatically measured, sample tray can be directly placed into sample rack, and no longer limited to first and second, improve test efficiency, reduce production cost, and facilitate mass production. SUMMARY
[0003] In view of the above technical problems of the prior art, the utility model provides an automatic sample rack for silicon detector, which can directly place sample tray into sample rack, and no longer limits the order, to improve the test efficiency.
[0004] The utility model discloses a technical scheme for solving the technical problems:
[0005] An automatic sample rack for silicon detector, comprising a sample tray, an upper fixed frame, a lower fixed frame and a sample tray guide rail connecting the upper fixed frame and the lower fixed frame, a sample tray clamping mechanism is arranged on at least one side of the lower fixed frame, the sample tray clamping mechanism comprises a clamping jaw and a return spring, the return spring is sleeved on the pivot of the clamping jaw, a positioning groove corresponding to the clamping jaw is arranged on the sample tray, and the front end of the clamping jaw is located in the positioning groove under the action of the return spring in the initial state.
[0006] Further, one sample tray clamping mechanism is arranged on each of the left and right sides of the lower fixed frame.
[0007] Further, the sample tray clamping mechanism further comprises a clamping cover and a clamping cover cover, the clamping jaw is arranged in the clamping cover through the pivot, the bottom of the clamping cover is provided with a clamping cover cover, a thimble hole is arranged on the clamping cover cover directly below the clamping jaw, when the thimble passes through the thimble hole, the thimble pushes the clamping jaw to rotate around the pivot, and the clamping jaw is separated from the positioning groove.
[0008] Further, the clamping jaw comprises a connecting rod and a jaw head located at both ends of the connecting rod, and the pivot penetrates through the connecting rod. Further, the clamping jaw comprises a connecting rod and a jaw head located at both ends of the connecting rod, and the pivot penetrates through the connecting rod.
[0009] Further, the positioning groove is located on the side of the sample disc, and the inner side of the positioning groove is a slope.
[0010] Further, positioning pins are arranged on four corners of the lower fixed frame, inner threaded holes are arranged on upper ends of the positioning pins, and bolts are connected with the positioning pins after sequentially penetrating the lower fixed frame, the clamping cover and the clamping cover lid.
[0011] Further, a clamping jaw position indicating color strip is arranged on the connecting rod, and an observation window is arranged on the clamping cover.
[0012] Further, one side of the upper fixed frame and the lower fixed frame is open.
[0013] Further, the sample disc guide rails are three, and are fixed on three sides of the upper fixed frame and the lower fixed frame.
[0014] Further, top portions of at least two sample disc guide rails protrude from the upper fixed frame.
[0015] The utility model discloses a beneficial effect is:
[0016] The utility model discloses a sample disc clamping mechanism design realizes the limiting and automatic replacement of sample disc, and the design of clamping jaw position indicating color strip and observation window can make the user accurate and direct state of sample disc clamping mechanism.
[0017] The utility model discloses simplifying the originally complex part, and the taking and placing function is integrated, and can realize the automatic sample replacement measurement of 55 samples, and the sample disc rack can be directly placed into the sample rack, and no longer is limited to first and later, improves test efficiency low, reduces production cost, and is convenient for batch production. DRAWINGS
[0018] Figure 1 It is whole structure schematic diagram of the utility model;
[0019] Figure 2 It is lower fixed frame explosion structure schematic diagram of the utility model;
[0020] Figure 3 It is state schematic diagram of the utility model and is placed on the silicon detector panel base;
[0021] Figure 4 It is state schematic diagram of the utility model and is placed on the silicon detector panel base;
[0022] Figure 5 It is sample disc clamping mechanism schematic diagram of the utility model;
[0023] Figure 6 It is sample disc schematic diagram of the utility model;
[0024] Figure 7 It is a sample disc profile schematic view of the utility model;
[0025] Figure 8 It is a claw position state schematic view of the utility model;
[0026] In the drawing, sample disc 1, positioning groove 101, upper fixed frame 2, lower fixed frame 3, sample disc guide rail 4, sample disc guide rail I 401, claw 501, connecting rod 5011, claw head 5012, green indication strip 5013, red indication strip 5014, front and back surface 5015, inclined surface 5016, reset spring 502, rotating shaft 503, cover 504, observation window 5041, cover cap 505, thimble hole 5051, positioning pin 6, panel base 7. DETAILED DESCRIPTION
[0027] In order to better understand the utility model, the following will be combined with Figures 1-8 The technical scheme in the embodiments of the utility model is clearly and completely described, obviously, the described embodiments are only part of the embodiments of the utility model, not all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by the person skilled in the art without creative labor belong to the protection scope of the utility model.
[0028] Embodiment one:
[0029] In this embodiment, the automatic sample holder for silicon detector includes sample disc 1, upper fixed frame 2, lower fixed frame 3 and sample disc guide rail 4 connecting upper fixed frame 2 and lower fixed frame 3.
[0030] The upper fixed frame 2 and the lower fixed frame 3 adopt the frame structure with one side opening as shown in Figure 2 , the sample disc guide rail 4 adopts cylindrical rod, the sample disc guide rail 4 has three, is fixed on three edges of the upper fixed frame 2 and the lower fixed frame 3, specifically, as shown in Figure 1 And 2 , the left and right two sides of sample disc guide rail 4 are fixed on the upper fixed frame 2 and the lower fixed frame 3 through the transversely arranged screw, and the rear sample disc guide rail can be fixed by the same way, or the through hole is arranged on the upper fixed frame 2 as shown in Figure 1 , the top of sample disc guide rail I 401 is provided with screw hole, the top of sample disc guide rail I 401 is fixed through the internal hexagonal bolt, and the bottom of sample disc guide rail I 401 is fixed through the transverse screw. The sample disc guide rail 4 is fixed on the inner side of the upper fixed frame 2 and the lower fixed frame 3, and protrudes from the inner side surface of the upper fixed frame 2 and the lower fixed frame 3, and the recess corresponding to the sample disc guide rail 4 is arranged on the sample disc 1. Figure 1As shown, the top of the two sample disc guide rails 4 on the left and right sides of the upper fixed frame 2 extends out of the upper fixed frame 2, and the top can be further designed as a conical shape. This design can more conveniently position the sample disc 1 and smoothly put the sample disc 1 into the automatic sample holder. Of course, the top of the rear sample disc guide rail I 401 can also extend out of the upper fixed frame 2.
[0031] A sample disc clamping mechanism is arranged on one or both sides (preferably two sides in this embodiment, i.e. on the left and right sides of the lower fixed frame 3) of the lower fixed frame 3. The sample disc clamping mechanism comprises a clamping jaw 501 and a return spring 502, and the return spring 502 is sleeved on the rotating shaft 503 of the clamping jaw 501. The sample disc 1 is provided with a positioning groove 101 corresponding to the clamping jaw 501, as shown in Figure 6 As shown, the positioning groove 101 is located on the side of the sample disc 1, as shown in Figure 7 As shown, the inner side of the positioning groove 101 is a slope. In the initial state, the front end of the clamping jaw 501 is located in the positioning groove 101 under the action of the return spring 502, at this time, the clamping jaw 501 fixes the sample disc 1, and the sample disc 1 will not fall down. When the automatic sample holder is placed on the silicon detector, the clamping jaw 501 contacts the clamping jaw triggering part on the silicon detector, the clamping jaw 501 is pushed to disengage from the positioning groove 101, and the sample disc 1 falls down by gravity.
[0032] Embodiment two:
[0033] On the basis of the above-mentioned embodiment one, a sample disc clamping mechanism is further designed in this embodiment. As shown in Figure 2 and 5 As shown, the sample disc clamping mechanism further comprises a clamping cover 504 and a clamping cover cap 505, the clamping jaw 501 comprises a connecting rod 5011 and a jaw head 5012 located at both ends of the connecting rod 5011, the rotating shaft 503 penetrates through the connecting rod 5011, and the return spring 502 is a torsion spring and is sleeved on the rotating shaft 503. The clamping jaw 501 is rotatably arranged in the clamping cover 504 through a rotating shaft 503. The two ends of the rotating shaft 503 are fixedly or movably arranged at both ends of the clamping cover 504. In order to facilitate installation and maintenance, the bottom of the clamping cover 504 is provided with a clamping cover cap 505, a thimble hole 5051 is arranged on the clamping cover cap 505 below the clamping jaw 501, and a thimble is used on the clamping jaw triggering part on the silicon detector. When the thimble passes through the thimble hole 5051, the thimble pushes the clamping jaw 501 to rotate around the rotating shaft 503, and the clamping jaw 501 disengages from the positioning groove 101.
[0034] Positioning pins 6 are arranged on the four corners of the lower fixed frame 3, and the upper end of the positioning pin 6 is provided with an internal threaded hole. The bolts are sequentially connected with the positioning pin 6 after penetrating through the lower fixed frame 3, the clamping cover 504 and the clamping cover cap 505.
[0035] When the automatic sample holder is inserted into the panel base 7 of the PIPS silicon detector, the thimble on the panel base 7 will push the pawl 501 to disengage from the sample disc, and the sample disc will fall under the action of gravity, and then the remaining actions are performed through the PIPS transmission mechanism. After the measurement is completed, the automatic sample holder is removed, and the automatic sample holder leaves the thimble on the panel base. At this time, the pawl 501 extends into the positioning groove 101 of the sample disc under the action of the reset spring 502, and the automatic sample holder can carry 55 sample discs away.
[0036] Embodiment three:
[0037] In order to indicate the position of the pawl 501, after the automatic sample holder is placed on the silicon detector, it can be clearly seen whether the pawl 501 releases the limiting of the sample disc 1. The pawl position indicating color bar is designed on the basis of embodiment one or two. Specifically, the pawl position indicating color bar is arranged on the connecting rod 5011, and the observation window 5041 is arranged on the pawl cover 504. The pawl position indicating color bar is preferably provided with two, including a red indicating bar 5014 and a green indicating bar 5013. The red indicating bar 5014 is located on the front and back surface 5015 of the connecting rod 5011, and the green indicating bar 5013 is located on the inclined surface 5016 above the connecting rod 5011. When the pawl 501 is located in the positioning groove 101, the red indicating bar 5014 is opposite to the observation window 5041. When the pawl trigger part on the silicon detector pushes the pawl 501 out of the positioning groove 101, the green indicating bar 5013 is opposite to the observation window 5041 (such as Figure 8 the pawl 501 shown by the dashed line in the middle).
[0038] Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present application, and not to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that they can still modify the technical solutions recorded in the foregoing embodiments, or make equivalent replacement for part or all of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present application.
Claims
1. An automated sample holder for silicon detectors, comprising a sample tray, an upper fixing frame, a lower fixing frame, and a sample tray guide rail connecting the upper fixing frame and the lower fixing frame, characterized in that: A sample tray positioning mechanism is provided on at least one side of the lower fixed frame. The sample tray positioning mechanism includes a claw and a return spring. The return spring is sleeved on the rotating shaft of the claw. The sample tray is provided with a positioning groove corresponding to the claw. In the initial state, the front end of the claw is located in the positioning groove under the action of the return spring.
2. The automated sample holder for silicon detectors as described in claim 1, characterized in that: A sample tray positioning mechanism is provided on each of the left and right sides of the lower fixed frame.
3. An automated sample holder for silicon detectors as described in claim 1 or 2, characterized in that: The sample tray positioning mechanism also includes a clamping cover and a clamping cover cover. The clamping claw is set inside the clamping cover via a rotating shaft. The clamping cover cover is set at the bottom of the clamping cover. A pin hole is set on the clamping cover cover directly below the clamping claw. When the pin passes through the pin hole, the pin pushes the clamping claw to rotate around the rotating shaft, and the clamping claw disengages from the positioning groove.
4. An automated sample holder for silicon detectors as described in claim 3, characterized in that: The chuck includes a connecting rod and chuck heads located at both ends of the connecting rod, and the rotating shaft passes through the connecting rod.
5. An automated sample holder for silicon detectors as described in claim 3, characterized in that: The positioning groove is located on the side of the sample plate, and the inner side of the positioning groove is a slope.
6. An automated sample holder for silicon detectors as described in claim 3, characterized in that: Positioning pins are provided at the four corners of the lower fixing frame. The upper end of the positioning pin is provided with an internal thread hole. The bolt passes through the lower fixing frame, the retaining cover and the retaining cover in sequence and then connects to the positioning pin.
7. An automated sample holder for silicon detectors as described in claim 4, characterized in that: The connecting rod is provided with a color bar indicating the position of the pawl, and the pawl cover is provided with an observation window.
8. An automated sample holder for silicon detectors as described in claim 1, characterized in that: The upper and lower fixing frames have openings on one side.
9. An automated sample holder for silicon detectors as described in claim 1, characterized in that: The sample tray guide rail has three rails, which are fixed to the three sides of the upper and lower fixing frames respectively.
10. An automated sample holder for silicon detectors as described in claim 1, characterized in that: At least two of the sample tray guide rails extend beyond the upper fixing frame.