Novel panel circuit structure
By adding a Data_Switch Shorting Bar to the skewed wiring area and directly connecting the Data Line to the P-inspection Pad, the problem of Open anomalies in the skewed wiring area that could not be detected in the factory was solved. This enabled timely interception during P-inspection, improved inspection efficiency, and avoided product loss.
Patent Information
- Application Number
- CN202520253520.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-18
- Publication Date
- 2025-11-25
- Estimated Expiration
- 2035-02-18
AI Technical Summary
Existing technology cannot effectively detect Open anomalies in the skewed wiring area on in-plant electrical measurement equipment, resulting in anomalies being discovered only during module inspection, leading to a waste of production capacity and resources.
A new Data_Switch Shorting Bar is added to the slanted wiring area, and the Data Line is directly connected to the P-test Pad through the new Data_Switch Shorting Bar. Power is supplied to the inside through the slanted wiring area, and the abnormal detection path during P-test is designed and optimized.
This enables timely interception and detection of Open anomalies in the oblique wiring area during P-inspection, improving anomaly detection capabilities, preventing products from being directly transferred to modules, and reducing losses.
Smart Images
Figure CN223598356U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of panel circuit design, specifically to a novel panel circuit structure. Background Technology
[0002] With technological advancements and evolving consumer aesthetics, narrow bezel designs for mobile phone panels have become a trend. Driven by this trend, the design approach for narrow bezel circuitry is undergoing adjustments, and the inspection of finished array components will face new challenges. The oblique wiring area features densely packed lines with relatively small line widths (approximately 1.8-2µm), while the normal in-plane line width is ≥3µm. The factory's AOI equipment has a maximum detection capability of 3µm. Even with optimized algorithm logic and the establishment of special enhanced detection recipes, complete detection of open anomalies in the oblique wiring area cannot be guaranteed. Therefore, currently, open anomalies in the oblique wiring area are detected by applying power.
[0003] Due to the narrow bezel design and customer requirements for IC design, the slanted wiring area could not accommodate a sufficient number of DataLines and Switch Shorting Bars. Therefore, the product routing design was changed, and data now needs to be powered from the reverse terminal side (e.g., Figure 1 As shown), this design does not affect the detection of anomalies in the in-plane Active Area. However, for Open anomalies occurring in the skewed wiring area, since the detection signals of the array segment (hereinafter referred to as A-detection) and Beol segment (hereinafter referred to as P-detection) do not pass through this area, Open anomalies in the skewed wiring area cannot be detected. The module timing operation principle is to supply power through the IC, directly entering the in-plane area through the skewed wiring area (as shown). Figure 2 As shown, an open fault in the skewed wiring area can be detected. This is a major fault that will directly render the finished product unusable. Therefore, because the power supply direction is different between A / P inspection and module inspection, faults in the skewed wiring area cannot be detected by the in-plant electrical measurement equipment. The fault must be traced back to the module to be detected, resulting in a waste of production capacity and resources. Summary of the Invention
[0004] The technical problem to be solved by this utility model is to provide a new panel circuit structure that can promptly detect Open anomalies in the oblique wiring area during P inspection, thereby improving the anomaly detection capability and preventing further losses.
[0005] This utility model is implemented as follows:
[0006] A novel panel circuit structure includes:
[0007] Both P-test pads are located below the AA area;
[0008] The first data switch has two working states: on and off. It is connected to two P-detection pads at both ends and passes through the reverse terminal side above the AA area.
[0009] The second data switch has two working states: on and off. It does not work simultaneously with the first data switch in the on state. Its two ends are connected to two P-detection pads respectively, and it passes through the slanted wiring area below the AA area.
[0010] Two sets of Data Lines are connected to two P-detection Pads at both ends and pass over the AA area; both sets of Data Lines are connected to the IC through the AA area via the first Data Switch; and then connected to the two P-detection Pads through the slanted wiring area via the second Data Switch.
[0011] Furthermore, the first data switch and the second data switch are not both open at the same time.
[0012] Furthermore, when the first Data Switch or the second Data Switch is positively charged, the operating state is on; when the first Data Switch or the second Data Switch is negatively charged, the operating state is off.
[0013] Furthermore, the width / length ratio of the first data switch and the second data switch is 400 / 7.
[0014] Optionally, the first and second data switches can be configured as molybdenum-aluminum-molybdenum.
[0015] Optionally, the first and second data switches can be constructed of titanium-aluminum-titanium.
[0016] Optionally, the first and second data switches can be constructed of aluminum-molybdenum.
[0017] The advantages of this utility model are:
[0018] To address the issue of undetectable anomalies in the skewed wiring area, a design optimization was implemented. By adding a Data_Switch Shorting Bar (i.e., a second Data Switch) at the skewed wiring location, all Data Lines are directly connected to the P-test Pad via this new Data_Switch Shorting Bar. This allows the P-test Pad to power the in-plane area (AA area) through the skewed wiring area without needing to split the R / G / B Data Lines. If an Open anomaly occurs in the skewed wiring area at this time, the signal cannot be input to the in-plane area, and the anomaly of the black line running through the in-plane area can be detected. This enables timely interception of Open anomalies in the skewed wiring area during P-testing, improving the anomaly interception capability and ensuring that product anomalies are detected in the array segment in a timely manner. This enhances the timeliness of anomaly feedback in the array segment and prevents products from being directly passed to the module, causing greater losses. Attached Figure Description
[0019] The present invention will be further described below with reference to the accompanying drawings and embodiments.
[0020] Figure 1 This is a schematic diagram showing the P-detector being powered from the reverse terminal side.
[0021] Figure 2 This is a schematic diagram showing how the module is powered by the IC.
[0022] Figure 3 This is a schematic diagram of the panel circuit structure according to an embodiment of the present utility model;
[0023] Figure 4 This invention adds a schematic diagram of the detection of abnormal through-line on the positive input force measurement screen in this embodiment of the invention;
[0024] Figure 5 This is a schematic diagram illustrating the detection of a through-line anomaly in the positive input force measurement screen of the P-inspection embodiment of this utility model.
[0025] Figure 6 A schematic diagram showing an anomaly in a single DataLine observed using a 50X microscope in the positive input force measurement screen of the embodiment P of this utility model. Detailed Implementation
[0026] The technical solution of this utility model will now be clearly and completely described with reference to the accompanying drawings and specific embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of this utility model without creative effort are within the scope of protection of this utility model.
[0027] In the description of this utility model, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.
[0028] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances.
[0029] Please see Figure 3 As shown, this example provides a novel panel circuit structure, including:
[0030] Both P-test pads are located below the AA area;
[0031] The first Data Switch (Data_SW1) has two working states: on and off. It is connected to two P-detection Pads at both ends and passes through the reverse terminal side above the AA area.
[0032] The second Data Switch (Data_SW2) has two working states: on and off. It does not work in the on state at the same time as the first Data Switch. It is connected to two P-detection Pads at both ends and passes through the slanted wiring area below the AA area (the slanted wiring area is located between the AA area and the P-detection Pad).
[0033] Two sets of Data Lines are connected to two P-detection Pads at both ends and pass over the AA area; both sets of Data Lines are connected to the IC through the AA area via the first Data Switch; and then connected to the two P-detection Pads through the slanted wiring area via the second Data Switch.
[0034] In one possible implementation, the operating state is "on" when the first Data Switch or the second Data Switch is positively energized, and "off" when the first Data Switch or the second Data Switch is negatively energized. When the first Data Switch is on and the second Data Switch is off, the two P-detection pads are connected to the in-plane via the reverse terminal side; when the first Data Switch is off and the second Data Switch is on, the two P-detection pads are connected to the in-plane via the slanted wiring area.
[0035] Preferably, the width / length ratio of the first data switch and the second data switch is 400 / 7.
[0036] Preferably, the first and second data switches have a molybdenum-aluminum-molybdenum structure. Alternatively, a titanium-aluminum-titanium structure or an aluminum-molybdenum structure can be used.
[0037] The working principle of this utility model is as follows:
[0038] The routing design was optimized in the Array segment, and a new Data_Switch Shorting Bar (the second Data Switch) was added to the diagonal wiring area. Figure 3 In the Data_SW2 section, two sets of DataLines are connected to two P-detection Pads respectively through the second Data Switch and the oblique wiring area. When Data_SW1 is in the off state (i.e., disconnected state) and Data_SW2 is in the open state (i.e., connected state), the two P-detection Pads are powered on in the face through the oblique wiring area without splitting the R / G / B DataLines. A new positive input force measurement is added. When the white screen is input, the first Data Switch is turned off, so that the Data can only be powered through the newly added second Data Switch. If an Open abnormality occurs in the oblique wiring area at this time, the signal cannot be input to the face, and the abnormal black line penetrating in the face can be detected.
[0039] The power supply for R / G / B and special screens still occurs through the reverse terminal side. In this case, the second data switch is turned off, and data is supplied through the first data switch. By controlling the first data switch on the reverse terminal side and the second data switch in the skewed wiring area to provide different signals, in conjunction with the new measurement screen, timely detection of anomalies is ensured.
[0040] The newly added positive input force measurement may include the following steps:
[0041] (1) During measurement and debugging on the ArrayFinish testing equipment, a new positive input force measurement screen was added, which can detect abnormalities in the through-line, such as... Figure 4 As shown;
[0042] (2) Move the abnormal sample to the P-test location, add a positive input force measurement screen, and confirm that the through-line abnormality can be detected at the same location. Figure 5 As shown;
[0043] (3) Observation using a 50X microscope reveals anomalies in a single DataLine, such as... Figure 6 As shown.
[0044] This invention optimizes the design of areas where abnormalities in the skewed wiring area cannot be detected. By adding a Data_Switch Shorting Bar (i.e., a second Data Switch) at the skewed wiring location, all Data Lines are directly connected to the P-test Pad through the new Data_Switch Shorting Bar. This allows the P-test Pad to supply power to the inside (AA area) of the skewed wiring area without splitting the R / G / B Data Lines. If an Open anomaly occurs in the skewed wiring area at this time, the signal cannot be input to the inside, and the anomaly of the black line running through the inside can be detected. This allows for timely interception of Open anomalies in the skewed wiring area during P-testing, improving the anomaly interception capability and ensuring that product anomalies are detected in the array segment in a timely manner. This enhances the timeliness of anomaly feedback in the array segment and prevents products from being directly passed to the module, causing greater losses.
[0045] While specific embodiments of the present invention have been described above, those skilled in the art should understand that the specific embodiments described are merely illustrative and not intended to limit the scope of the present invention. Equivalent modifications and variations made by those skilled in the art in accordance with the spirit of the present invention should be covered within the scope of protection of the claims of the present invention.
Claims
1. A novel panel wiring structure, characterized by, Comprise: Two P-pad, both located below the AA region; The first Data Switch, including two working states of open and close, two ends are connected to two P-pad, and pass from the opposite side of the AA region above; The second Data Switch, including two working states of open and close, two ends are connected to two P-pad, and pass from the oblique wiring area below the AA region; Two groups of Data Line, two ends are connected to two P-pad, and pass from the AA region above; two groups of Data Line pass through the AA region with IC through the first Data Switch; then pass through the oblique wiring area and connect to two P-pad through the second Data Switch.
2. A novel panel wiring structure according to claim 1, characterized by: The first Data Switch and the second Data Switch are not open at the same time.
3. A novel panel line structure according to claim 1 or 2, characterized in that: When the first Data Switch or the second Data Switch is positive, the working state is open; when the first Data Switch or the second Data Switch is negative, the working state is closed.
4. A novel panel wiring structure according to claim 1, characterized by: The width / length ratio of the first Data Switch and the second Data Switch is 400 / 7.
5. A novel panel wiring structure according to claim 1, characterized by: The structure of the first Data Switch and the second Data Switch is molybdenum-aluminum-molybdenum.
6. A novel panel wiring structure according to claim 1, characterized by: The structure of the first Data Switch and the second Data Switch is titanium-aluminum-titanium.
7. A novel panel wiring structure according to claim 1, characterized by: The structure of the first Data Switch and the second Data Switch is aluminum-molybdenum.