Product defect detection device
By combining the chamfering and body position image acquisition module with the light source illumination module, the problems of low accuracy and efficiency in cover plate chamfering and body position detection are solved, achieving high-precision and high-efficiency defect detection.
Patent Information
- Application Number
- CN202422882828.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-25
- Publication Date
- 2025-11-28
- Estimated Expiration
- 2034-11-25
AI Technical Summary
In the production process of cover plates, the accuracy and efficiency of defect detection in special locations such as chamfers and corrugated parts are low, making it difficult to achieve high-precision and high-efficiency defect detection.
The system employs a chamfer image acquisition module and a standing position image acquisition module, combined with a light source illumination module, to acquire detection images of the chamfer and standing position areas respectively. An arc-shaped light source is used to provide illumination for both areas. In conjunction with a rotation module and a moving component, the system ensures the accuracy and efficiency of image acquisition.
It improves the accuracy and efficiency of cover plate defect detection, can accurately identify defects in chamfer and chamfer areas, and reduces detection errors.
Smart Images
Figure CN223611403U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of visual imaging, in particular to a product defect detection device. BACKGROUND
[0002] In the production and preparation process of the cover plate, due to the influence of equipment, process, transportation and packaging, various defects will inevitably be produced, which will have major adverse effects on the performance and service life of the subsequent cover plate. Therefore, before the cover plate is formally put into use, a defect detection process needs to be introduced to inspect the cover plate, and the detection of special positions such as chamfer and body position is also included.
[0003] Due to the particularity of the chamfer and body position on the cover plate, the defect detection of the corresponding positions has always been a technical difficulty. The special shape of the chamfer and body position makes the light change complex in the process of reflection and refraction, thereby reducing the accuracy and efficiency of the defect detection of the chamfer and body position on the cover plate. CONTENT OF THE UTILITY MODEL
[0004] Therefore, it is necessary to provide a product defect detection device to accurately and quickly obtain chamfer area detection images and body position area detection images, and improve the accuracy and efficiency of cover plate defect detection.
[0005] The utility model provides a product defect detection device, which comprises a chamfer image acquisition module, a body position image acquisition module and a light source illumination module.
[0006] The light source illumination module is arranged on one side of the product to be detected, and is used for emitting detection light to the chamfer and body position of the product to be detected.
[0007] The central axis of the chamfer image acquisition module is perpendicular to the chamfer, and is used for receiving the detection light reflected by the chamfer.
[0008] The central axis of the body position image acquisition module is perpendicular to the body position, and is used for receiving the detection light reflected by the body position.
[0009] The technical scheme of the utility model comprises the following steps: a chamfer image acquisition module, a body position image acquisition module and a light source illumination module are arranged in the product defect detection device, the chamfer area of the product to be detected is detected by the chamfer image acquisition module, the body position area of the product to be detected is detected by the body position image acquisition module, and the accuracy of product defect detection is improved. The light source illumination module provides illumination light for the chamfer area and the body position area at the same time, is compatible with the light effect of the chamfer and body position double stations, the chamfer image acquisition module and the body position image acquisition module can acquire detection images of the corresponding areas at the same time, and the efficiency of product defect detection is improved. BRIEF DESCRIPTION OF DRAWINGS
[0010] Figure 1 is a detection structure schematic view of a product defect detection device provided by the embodiment of the present application;
[0011] Figure 2 is a detection principle schematic view of a product defect detection device provided by the embodiment of the present application;
[0012] Figure 3 is a first detection image schematic view of a product defect detection device provided by the embodiment of the present application;
[0013] Figure 4 is a second detection image schematic view of a product defect detection device provided by the embodiment of the present application;
[0014] Figure 5 is a third detection image schematic view of a product defect detection device provided by the embodiment of the present application;
[0015] Figure 6 is a structure schematic view of an arc-shaped light source provided by the embodiment of the present application;
[0016] Figure 7 is a structure schematic view of an arc-shaped light source provided by the embodiment of the present application;
[0017] Figure 8 is Figure 7 is a sectional view along the direction of A-A';
[0018] Figure 9 is Figure 7 is a projection structure schematic view on a plane. DETAILED DESCRIPTION
[0019] The present application will be further described below in conjunction with the drawings and embodiments. It can be understood that the specific embodiments described herein are only used to explain the present application, but not to limit the present application. In addition, it should be noted that, for the convenience of description, only the parts related to the present application are shown in the drawings, but not all the structures.
[0020] The terms used in the embodiments of the present utility model are merely for the purpose of describing specific embodiments, and are not intended to limit the present utility model. It should be noted that the orientation words such as 'upper', 'lower', 'left', 'right' and the like described in the embodiments of the present utility model are described in the angle shown in the drawings, and should not be understood as limiting the embodiments of the present utility model. In addition, it should also be understood in the context that when referring to one element being formed 'on' or 'under' another element, it can not only be directly formed 'on' or 'under' another element, but also indirectly formed 'on' or 'under' another element through an intermediate element. The terms 'first','second' and the like are merely for the purpose of description, and do not represent any order, quantity or importance, but are only used to distinguish different components. The specific meanings of the above terms in the present utility model can be understood by the person skilled in the art according to the specific circumstances.
[0021] The term 'including' and its variants used in the present utility model are open inclusion, that is, 'including but not limited to'. The term 'based on' is 'at least partially based on'. The term 'one embodiment' means 'at least one embodiment'.
[0022] It should be noted that the concepts of 'first','second' and the like mentioned in the present utility model are merely used to distinguish the corresponding content, and are not used to limit the order or mutual dependency.
[0023] It should be noted that the modification of 'one', 'a plurality of' mentioned in the present utility model is illustrative and not restrictive, and the person skilled in the art should understand that unless otherwise explicitly indicated in the context, it should be understood as 'one or more'.
[0024] Figure 1 is a detection structure schematic view of a product defect detection device provided by the embodiments of the present utility model, Figure 2 is a detection principle schematic view of a product defect detection device provided by the embodiments of the present utility model, as Figure 1 and Figure 2 shown, the product defect detection device comprises: a chamfer image acquisition module 1, a body position image acquisition module 2 and a light source illumination module 3.
[0025] The light source illumination module 3 is arranged on one side of the product to be detected 4, and is used for emitting detection light to the chamfer and the body position of the product to be detected 4.
[0026] The central axis of the chamfer image acquisition module 1 is perpendicular to the chamfer, and is used for receiving the detection light reflected by the chamfer.
[0027] The central axis of the body position image acquisition module 2 is perpendicular to the body position, and is used for receiving the detection light reflected by the body position.
[0028] The chamfer image acquisition module 1 can be used for acquiring the image of the chamfer region of the product to be inspected 4, and can convert the light signal into an electric signal based on the optical principle and generate the chamfer region image; the body position image acquisition module 2 can be used for acquiring the image of the body position region of the product to be inspected 4, and can convert the light signal into an electric signal based on the optical principle and generate the body position region image. It can be understood that the product to be inspected 4 in the embodiment of the utility model can be a product including a chamfer and a body position, and specifically can be the shell of a 3D glass watch, and the chamfer region and the body position region of the shell of the 3D glass watch can be exposed by placing the shell of the 3D glass watch with the convex surface upward.
[0029] The light source illumination module 3 can simultaneously provide light illumination for the chamfer image acquisition module 1 and the body position image acquisition module 2, and assist the chamfer image acquisition module 1 and the body position image acquisition module 2 in clear imaging. The light of the light source illumination module 3 can be incident on the chamfer region and the body position region of the product to be inspected 4 at the same time, so that the chamfer image acquisition module 1 and the body position image acquisition module 2 can work at the same time, and the efficiency of defect detection is improved.
[0030] The middle axis of the chamfer image acquisition module 1 is perpendicular to the chamfer, so that the detection light emitted by the light source illumination module 3 is reflected to the chamfer image acquisition module 1 through the chamfer, and a complete and clear chamfer detection image is acquired. Figure 3 is a first detection image schematic view of the product defect detection device provided by the embodiment of the utility model, and is combined with Figure 1 and Figure 3 When the chamfer region is defect-free, the reflection angle of the detection light is different due to the angle relationship between the chamfer and the upper surface of the product to be inspected 4, and then the chamfer corresponding region in the chamfer detection image is a bright and regular strip; Figure 4 is a second detection image schematic view of the product defect detection device provided by the embodiment of the utility model, and is combined with Figure 1 and Figure 4 When the chamfer region has defects such as dirt and uneven roughness, the reflectivity of the dirt or uneven roughness is different, so that the chamfer corresponding region in the chamfer detection image has a non-uniform gray scale; Figure 5 is a third detection image schematic view of the product defect detection device provided by the embodiment of the utility model, and is combined with Figure 1 and Figure 5As shown, when the chamfer region has chamfer angle, chamfer position difference or chamfer collapse, chamfer scratch and other defects, since such defects will cause the chamfer surface to be uneven and irregular, the chamfer corresponding area in the chamfer detection image will change from a regular bar to an irregular wave deformation, so whether the chamfer region has defects can be determined according to the detection image of the chamfer corresponding area. Similarly, since the body position image acquisition module 2 is used to obtain the detection image of the body position of the product 4 to be detected, and then judge the defects of the body position according to the detection image, the central axis of the body position image acquisition module 2 is perpendicular to the body position, so that the detection light emitted by the light source illumination module 3 is reflected to the body position image acquisition module 2 through the body position, and a complete and clear body position detection image is obtained. When the body position region has defects such as dirt, uneven roughness, since the reflectivity of the dirt or uneven roughness is different, the body position corresponding area in the body position detection image will have uneven gray scale; when the body position region has defects such as body position angle, body position position difference or body position collapse, body position scratch and other defects, since such defects will cause the body position surface to be uneven and irregular, the body position corresponding area in the body position detection image will change from a regular bar to an irregular wave deformation, so whether the body position region has defects can be determined according to the detection image of the body position corresponding area.
[0031] In some embodiments, continuing to refer to Figure 2 As shown, the angle between the central axis of the chamfer image acquisition module and the plane where the product 4 to be detected is located is 45°; the angle between the central axis of the body position image acquisition module and the plane where the product 4 to be detected is located is 90°. Among them, since the central axis of the chamfer image acquisition module 1 is perpendicular to the chamfer, the angle between the central axis of the chamfer image acquisition module 1 and the plane where the product 4 to be detected is located is also 45°, so that the detection light of the light source illumination module 3 is reflected to the chamfer image acquisition module 1 through the chamfer region to form an image; since the body position region is perpendicular to the plane where the product 4 to be detected is located, the central axis of the body position image acquisition module 2 is perpendicular to the body position, and the central axis of the body position image acquisition module 2 is parallel to the plane where the product 4 to be detected is located, so that the body position image acquisition module 2 is placed horizontally, the incident light path and the reflected light path coincide to form an image, and the simultaneous detection of the chamfer region and the body position region is ensured.
[0032] In some embodiments, the chamfer image acquisition module 1 comprises a first line-scan camera 11 and a first lens 12; the first lens 12 is mounted on the first line-scan camera 11, and the first lens 12 is located on the side of the first line-scan camera 11 close to the product to be inspected 4; the body position image acquisition module 2 comprises a second line-scan camera 21 and a second lens 22; the second lens 22 is mounted on the second line-scan camera 21, and the second lens 22 is located on the side of the second line-scan camera 21 close to the product to be inspected 4. Among them, the chamfer image acquisition module 1 comprises the first line-scan camera 11 and the first lens 12 assembled together. Among them, the first lens 12 can adjust the accuracy of the chamfer image acquisition module 1, such as magnification 5X, 10X, 20X, etc. The first line-scan camera 11 can receive the reflected detection light of the product to be inspected 4 and image. Illustratively, the resolution of the first line-scan camera 11 can be 2048pix. Illustratively, the pixel accuracy of the first lens 12 can be 8.75μm / pix. The body position image acquisition module 2 comprises the second line-scan camera 21 and the second lens 22 assembled together. Among them, the second lens 22 can adjust the accuracy of the body position image acquisition module 2, such as magnification 5X, 10X, 20X, etc. The second line-scan camera 21 can receive the reflected detection light of the product to be inspected 4 and image. Illustratively, the resolution of the second line-scan camera 21 can be 2048pix. Illustratively, the pixel accuracy of the second lens 22 can be 8.75μm / pix.
[0033] Illustratively, Figure 6 is a structural diagram of a product to be inspected provided by an embodiment of the present application, as shown in Figure 1 、 Figure 2 and Figure 6 , the product to be inspected 4 can be a mobile phone lens, the mobile phone lens comprises a chamfer 41 and a body position 42, and the light source illumination module 3 is arranged on the side of the product to be inspected 4 and emits detection light to one side of the product to be inspected 4. The chamfer image acquisition module 1 is installed at 45 degrees, that is, the central axis of the chamfer image acquisition module 1 is perpendicular to the chamfer 41, receives the detection light reflected by the chamfer 41 area and images. The body position image acquisition module 2 is placed horizontally, the central axis of the body position image acquisition module 2 is perpendicular to the body position 42, receives the detection light reflected by the body position 42 area and images. After obtaining the detection image, the defects of the chamfer 41 and the body position 42 of the product to be inspected 4 can be judged manually, or the defects of the chamfer 41 and the body position 42 of the product to be inspected 4 can be judged through the recognition module.
[0034] The technical scheme of the embodiment of the utility model discloses, through setting chamfer image acquisition module, body position image acquisition module and light source illumination module in product defect detection device, utilize chamfer image acquisition module to detect the chamfer area of the product to be detected alone, utilize body position image acquisition module to detect the body position area of the product to be detected alone, improve the precision of product defect detection.Set up light source illumination module and provide illumination light for chamfer area and body position area simultaneously, compatible chamfer and body position double position light effect, chamfer image acquisition module and body position image acquisition module can acquire the detection image of the corresponding area simultaneously, improve the efficiency of product defect detection.
[0035] Optionally, Figure 7 It is a kind of structure schematic diagram of arc light source provided in the embodiment of the utility model, continue to refer to Figure 1 、 Figure 2 And Figure 7 Light source illumination module 3 includes arc light source 30 as shown in the figure.
[0036] The emitting surface of arc light source 30 is projected on the chamfer and body position of the product to be detected 4.
[0037] Wherein, arc light source 30 can include the emitting surface with a certain radius of curvature.As chamfer and body position are not in the same plane, arc light source 30 is arranged in light source illumination module 3, the arc emitting surface of arc light source 30 corresponds the position of chamfer and body position and the projection of emitting surface on the product to be detected 4 covers chamfer and body position, so that the detection light of light source illumination module 3 can be incident on chamfer and body position simultaneously.
[0038] It can be understood that the arc emitting surface of arc light source 30 needs to adapt to the position of chamfer and body position, that is, to ensure that the detection light of arc emitting surface can be incident on chamfer and body position.
[0039] In some embodiments, the radius of curvature at any position of arc emitting surface can be set to be the same, that is, the arc emitting surface is circular arc, and the chamfer of the product to be detected 4 is arranged at the center of the circular arc, so that more detection light of arc light source 30 can be received at the chamfer, improving the imaging effect of chamfer area detection image and improving the defect detection precision.Similarly, the body position of the product to be detected 4 can be arranged at the center of the circular arc, so that more detection light of arc light source 30 can be received at the body position, improving the imaging effect of chamfer area detection image and improving the defect detection precision.Exemplarily, arc light source 30 can be arranged in light source illumination module 3.
[0040] The technical scheme of the embodiment of the utility model discloses, through setting arc light source in light source lighting module, the projection of arc light source's luminous surface is in the projection of the product to be examined Cover chamfer and body position, make the detection light of arc light source emission can simultaneously incident chamfer and body position, the light efficiency of compatible chamfer and body position double position, chamfer image acquisition module and body position image acquisition module can simultaneously acquire the detection image of corresponding area, improve the efficiency of product defect detection.
[0041] Optionally, Figure 8 is Figure 7 The sectional view along the A-A' direction, combine Figure 1 , Figure 2 , Figure 8 And Figure 7 As shown, arc light source 30 includes arc substrate 301 and lamp bead 302.
[0042] Arc substrate 301 is inclined to set and the projection on the plane is semicircular ring type;Lamp bead 302 is set on the side of arc substrate 301 close to the product to be examined 4 and the detection light emitted by each lamp bead 302 is inclined to incident the product to be examined 4.
[0043] Among them, arc substrate 301 can be used to fix lamp bead 302. The lamp bead 302 can be LED lamp bead 302, including multiple, the specification of each lamp bead 302 is the same, for example, all are white point light source with color temperature of 6500K. Multiple lamp beads 302 are arranged in array on arc substrate 301, since the projection of arc substrate 301 on the plane is semicircular ring type, that is, the top view of arc substrate 301 is semicircular ring type, so the lamp bead 302 arranged on arc substrate 301 is also semicircular ring type, so that the luminous surface of arc light source 30 is arc luminous surface, further guaranteeing that the detection light is incident chamfer and body position simultaneously.
[0044] Among them, arc substrate 301 is inclined to set, so that the detection light of lamp bead 302 is also inclined to emit. The purpose of the inclined setting of arc substrate 301 is to change the angle of emission of lamp bead 302, since the detection light incident chamfer and body position needs to be reflected to chamfer image acquisition module 1 and body position image acquisition module 2 as much as possible, the detection light of lamp bead 302 is inclined to emit to prevent more detection light from being incident along the direction of arc substrate 301 again, and the detection light is inclined to emit to change the incident point in chamfer area and body position area, so that when chamfer image acquisition module 1 and body position image acquisition module 2 acquire corresponding detection light, the corresponding area is not blocked by arc substrate 301, which guarantees the imaging effect of chamfer image acquisition module 1 and body position image acquisition module 2.
[0045] Exemplarily, continue to refer to Figure 7 And Figure 8As shown, three rows of LED beads 302 are arranged on the arc-shaped substrate 301. The arc-shaped substrate 301 is tilted so that the angle between the detection light emitted by the LED beads 302 and the plane where the product to be inspected 4 is located is 60°. At the same time, since the projection of the arc-shaped substrate 301 on the plane is a semi-circular ring, the detection light emitted by the LED beads 302 is more uniform, which ensures the imaging effect of the detection image and improves the accuracy of the defect detection device.
[0046] In some embodiments, the lamp beads 302 are arranged in different positions on the arc-shaped substrate 301 and the angle between the illumination angle of the lamp beads 302 and the plane where the product to be inspected 4 is located is 60°. Figure 9 yes Figure 7 A schematic diagram of the projected structure on a plane, combined with Figure 7 , Figure 8 and Figure 9 As shown, the inner radius R1 of the arc-shaped substrate 301 projected onto the plane is 16mm, and the outer radius R2 is 37mm. The illumination angle of the LED bead 302 is 60° to the plane containing the product 4 under inspection, and the projection of the arc-shaped substrate 301 onto the plane is a semi-circular ring. This ensures that the detection light emitted by the LED bead 302 is uniform, thereby making the light-emitting surface of the arc-shaped light source 30 uniform and improving the imaging effect of the inspection image. Setting the inner radius R1 of the arc-shaped substrate 301 projected onto the plane to 16mm and the outer radius R2 to 37mm ensures that the detection light emitted from the arc-shaped substrate 301 can simultaneously cover the chamfer and the protruding part, thus ensuring the efficiency of the product defect detection device and the reliability of the arc-shaped light source 30. Furthermore, in some embodiments, the height of the arc-shaped substrate 301 can be 22mm to ensure that the LED bead 302 has sufficient placement area.
[0047] The technical solution of this utility model embodiment, by setting an arc-shaped substrate and lamp beads in an arc-shaped light source, and tilting the substrate to make the light-emitting surface arc-shaped, ensures that the detection light can be incident on both the chamfer and the standing position simultaneously. At the same time, the tilted exit of the detection light changes the incident point in the chamfer and standing position areas, so that when the chamfer image acquisition module and the standing position image acquisition module acquire the corresponding detection light, there is no arc-shaped substrate blocking the corresponding area, which ensures the imaging effect of the chamfer image acquisition module and the standing position image acquisition module and improves the accuracy of the product defect detection device.
[0048] Optional, continue to refer to Figure 1 and Figure 2 As shown, the product defect detection device also includes a placement platform 5 and a rotation module; Figure 1 (Diagram of rotating module not shown)
[0049] The product to be inspected 4 is placed on the support structure 51 of the placement platform 5. The rotation module is fixedly connected to the support structure 51 and is used to control the rotation of the support structure 51, thereby driving the product to be inspected 4 to rotate.
[0050] Wherein, the product 4 to be detected can be placed on the support structure 51 of the placement platform 5, the placement platform 5 can provide a static detection area for the product 4 to be detected, and placing the product 4 to be detected on the support structure 51 can fix the product 4 to be detected, so that the product 4 to be detected will not deviate in position during detection, and the problem of consistency deviation of multiple acupuncture points is solved.
[0051] Wherein, the product defect detection device further comprises a rotating module, which can drive the support structure 51 to rotate, and in turn drive the product 4 to be detected to rotate. Since the chamfered region of the product 4 to be detected is on the side and continuous, and the body position structure is also on the side and continuous, the rotating structure is provided to drive the product 4 to be detected to rotate during detection, and the positions of the chamfered image acquisition module 1, the body position image acquisition module 2 and the light source illumination module 3 remain unchanged, so that the chamfered image acquisition module 1 and the body position image acquisition module 2 can acquire all detection images of the side of the product 4 to be detected in real time, avoiding the problem of inaccurate positioning caused by moving the chamfered image acquisition module 1, the body position image acquisition module 2 and the light source illumination module 3 during detection, and eliminating the positional error in the detection image.
[0052] In some embodiments, the chamfered image acquisition module 1 and the body position image acquisition module 2 each include a line-scan camera, which acquires detection images of corresponding positions in real time during rotation of the product 4 to be detected and integrates the detection images together to form complete chamfered detection images and body position detection images, which include all chamfered regions and body position regions of the product 4 to be detected. Through acquisition of the complete chamfered detection images and body position detection images, it can be more accurately determined whether the problems of uneven gray scale or wavy deformation of region edges occur in the chamfered detection images and body position detection images, thereby improving the precision of the product defect detection device.
[0053] The technical scheme of the embodiment of the utility model, by placing the product to be detected on the support structure of the placement platform and simultaneously controlling the support structure to rotate by the rotating module to drive the product to be detected to rotate, the chamfered image acquisition module, the body position image acquisition module and the light source illumination module acquire complete chamfered detection images and body position detection images in a fixed manner, thereby improving the precision of the product defect detection device.
[0054] Optionally, continuing to refer to Figure 1 and Figure 2 The product defect detection device further comprises a first moving assembly 6 and a second moving assembly 7.
[0055] The first moving assembly 6 comprises a first moving plate 61 and a first sliding block; the first sliding block is fixedly connected with the chamfered image acquisition module 1; the first moving plate comprises a first moving slot 62, and the first sliding block is slidingly connected with the first moving slot 62;
[0056] The second moving assembly 7 comprises a second moving plate 71 and a second slider, the second slider is fixedly connected with the body position image acquisition module 2, and the second moving plate 71 comprises a second moving groove 72, and the second slider is slidably connected with the second moving groove 72. Figure 1 The first slider and the second slider are not shown in the structure diagram
[0057] The first moving assembly 6 comprises a first moving plate 61 and a first slider, and the second moving assembly 7 comprises a second moving plate 71 and a second slider, and the first moving plate 61 and the second moving plate 71 can provide a moving platform for the chamfer image acquisition module 1 and the body position image acquisition module 2. The first slider is fixedly connected with the chamfer image acquisition module 1, and the first slider drives the chamfer image acquisition module 1 to move when moving in the first moving groove 62, so that the chamfer image acquisition module 1 can acquire detection images at different positions of the chamfer region of the product to be detected 4; the second slider is fixedly connected with the body position image acquisition module 2, and the second slider drives the body position image acquisition module 2 to move when moving in the second moving groove 72, so that the body position image acquisition module 2 can acquire detection images at different positions of the body position region of the product to be detected 4.
[0058] It can be understood that the first moving groove 62 and the second moving groove 72 can be provided with an arc corresponding to the chamfer region and the body position region, so as to change the moving track of the slider in the moving groove, eliminate the error of the detection image acquisition, and improve the detection precision.
[0059] In some embodiments, the moving track of the first slider in the first moving groove 62 is a circular arc with a central angle of 30°, and the moving track of the second slider in the second moving groove 72 is a circular arc with a central angle of 30°. Wherein, the moving track of the first slider in the first moving groove 62 is a circular arc with a central angle of 30°, so that the chamfer image acquisition module 1 can move in an arc track during the movement, ensuring that the chamfer image acquisition module 1 maintains the same distance with the product to be detected 4 at all times, ensuring that the magnification of the acquired chamfer detection image is the same, and improving the detection precision; the moving track of the second slider in the second moving groove 72 is a circular arc with a central angle of 30°, so that the body position image acquisition module 2 can move in an arc track during the movement, ensuring that the body position image acquisition module 2 maintains the same distance with the product to be detected 4 at all times, ensuring that the magnification of the acquired body position detection image is the same, and improving the detection precision.
[0060] The technical scheme of the embodiment of the utility model discloses, through setting first mobile assembly and second mobile assembly in product defect detection device, make chamfer image acquisition module can utilize first slider and move on first moving plate, make the image acquisition module can utilize second slider and move on second moving plate, make the acquisition of continuous chamfer detection image and the image of the body position detection of the product to be examined under the condition of fixed, improve the precision of product defect detection device.
[0061] Optionally, continuing to refer to Figure 2 As shown, along the direction of the central axis of the chamfer image acquisition module 1, the distance range L1 between the chamfer image acquisition module 1 and the product to be examined 4 is 100-120mm.
[0062] Along the direction of the central axis of the body position image acquisition module 2, the distance range L2 between the body position image acquisition module 2 and the product to be examined 4 is 100-120mm.
[0063] Specifically, the distance L1 between the detection surface of the product to be examined 4 and the chamfer image acquisition module 1 can be understood as the distance between the detection surface of the product to be examined 4 and the chamfer image acquisition module 1 along the direction of the central axis of the chamfer image acquisition module 1. Exemplarily, in the direction of the straight line corresponding to the central axis of the chamfer image acquisition module 1, the distance L1 between the detection surface of the product to be examined 4 and the chamfer image acquisition module 1 can be the focal distance of the chamfer image acquisition module 1, that is, the product to be examined 4 is placed at the focal position of the chamfer image acquisition module 1, and the imaging effect of the detection image is improved. Exemplarily, in the direction of the straight line corresponding to the central axis of the chamfer image acquisition module 1, the distance L1 between the detection surface of the product to be examined 4 and the chamfer image acquisition module 1 can be 100mm.
[0064] Specifically, the distance L2 between the detection surface of the product to be examined 4 and the body position image acquisition module 2 can be understood as the distance between the detection surface of the product to be examined 4 and the body position image acquisition module 2 along the direction of the central axis of the body position image acquisition module 2. Exemplarily, in the direction of the straight line corresponding to the central axis of the body position image acquisition module 2, the distance L2 between the detection surface of the product to be examined 4 and the body position image acquisition module 2 can be the focal distance of the body position image acquisition module 2, that is, the product to be examined 4 is placed at the focal position of the body position image acquisition module 2, and the imaging effect of the detection image is improved. Exemplarily, in the direction of the straight line corresponding to the central axis of the body position image acquisition module 2, the distance L2 between the detection surface of the product to be examined 4 and the body position image acquisition module 2 can be 100mm.
[0065] In some embodiments, when the product 4 to be inspected includes a concave-convex surface, the distance L1 between the detection surface of the product 4 to be inspected and the chamfer image acquisition module 1 can be understood as the distance between the top of the convex surface of the product 4 to be inspected and the chamfer image acquisition module 1 along the central axis of the chamfer image acquisition module 1 in the direction close to the convex surface of the product 4 to be inspected. Similarly, the distance L2 between the detection surface of the product 4 to be inspected and the body position image acquisition module 2 can be understood as the distance between the top of the convex surface of the product 4 to be inspected and the body position image acquisition module 2 along the central axis of the body position image acquisition module 2 in the direction close to the convex surface of the product 4 to be inspected.
[0066] The technical features of the above embodiments can be combined in any manner. To make the description concise, not all possible combinations of the technical features in the above embodiments are described, but as long as the combinations of the technical features do not contradict, they should be considered within the scope of the present disclosure.
[0067] The above embodiments only express several implementation manners of the present application, and the description is relatively specific and detailed, but it should not be understood as a limitation on the scope of the patent of the present application. It should be pointed out that for ordinary skilled persons in the art, several modifications and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the appended claims.
Claims
1. A product defect detection device, characterized in that, The product defect detection device comprises a chamfer image acquisition module, a body position image acquisition module and a light source illumination module. The light source illumination module is arranged on one side of the product to be detected, and is used for emitting detection light to the chamfer and the body position of the product to be detected. The central axis of the chamfer image acquisition module is perpendicular to the chamfer, and is used for receiving the detection light reflected by the chamfer. The central axis of the body position image acquisition module is perpendicular to the body position, and is used for receiving the detection light reflected by the body position. The light source illumination module comprises an arc-shaped light source.
2. The product defect detection apparatus according to claim 1, characterized by, The light emitting surface of the arc-shaped light source is projected on the chamfer and the body position of the product to be detected. The arc-shaped light source comprises an arc-shaped substrate and a lamp bead.
3. The product defect detection apparatus according to claim 2, characterized by, The arc-shaped substrate is arranged obliquely, and the projection of the arc-shaped substrate on a plane is a semicircular ring type. The lamp beads are arranged on the side of the arc-shaped substrate close to the product to be detected, and the detection light emitted by each lamp bead is obliquely incident on the product to be detected.
4. The product defect detection apparatus according to claim 3, characterized by The lamp beads are arranged at different positions on the arc-shaped substrate, and the angle between the irradiation angle of the lamp bead and the plane on which the product to be detected is located is 60°. The inner radius of the projection of the arc-shaped substrate on a plane is 16 mm, and the outer radius is 37 mm.
5. The product defect detection apparatus according to claim 1, characterized by, The product defect detection device further comprises a placing platform and a rotating module. The product to be detected is placed on the support structure of the placing platform, and the rotating module is fixedly connected with the support structure and is used for controlling the rotation of the support structure and thereby driving the product to be detected to rotate.
6. The product defect detection apparatus according to claim 1, characterized by The product defect detection device further comprises a first moving assembly and a second moving assembly. The first moving assembly comprises a first moving plate and a first sliding block, the first sliding block is fixedly connected with the chamfer image acquisition module, and the first moving plate comprises a first moving groove, and the first sliding block is slidingly connected with the first moving groove. The second moving assembly comprises a second moving plate and a second sliding block, the second sliding block is fixedly connected with the body position image acquisition module, and the second moving plate comprises a second moving groove, and the second sliding block is slidingly connected with the second moving groove.
7. The product defect detection apparatus according to claim 6, characterized by The moving track of the first sliding block in the first moving groove is circular arc-shaped, and the central angle is 30°. The moving track of the second sliding block in the second moving groove is circular arc-shaped, and the central angle is 30°.
8. The product defect detection apparatus according to claim 1, characterized by, The angle between the central axis of the chamfer image acquisition module and the plane on which the product to be detected is located is 45°, and the angle between the central axis of the body position image acquisition module and the plane on which the product to be detected is located is 90°.
9. The product defect detection apparatus according to claim 1, characterized by, Along the direction of the central axis of the chamfer image acquisition module, the distance between the chamfer image acquisition module and the product to be detected ranges from 100 mm to 120 mm. Along the direction of the central axis of the body position image acquisition module, the distance between the body position image acquisition module and the product to be detected ranges from 100 mm to 120 mm.
10. The product defect detection apparatus according to claim 1, characterized by, The chamfer image acquisition module comprises a first line-scan camera and a first lens. The first lens is installed on the first line-scan camera, and the first lens is located on the side of the first line-scan camera close to the product to be detected. The body position image acquisition module comprises a second line-scan camera and a second lens. The second lens is installed on the second line-scan camera, and the second lens is located on a side of the second line-scan camera close to the product to be inspected.