IO module test frame

Abstract

The utility model discloses an IO module test frame, which comprises a mounting plate, a guide slide rail is arranged on the outer wall of the top of the mounting plate, a mounting block is slidably connected to the inner wall of the guide slide rail, an elastic telescopic rod is fixed on the outer wall of the top of the mounting block, a support plate is fixed at the telescopic end of the elastic telescopic rod, and a clamping mechanism is arranged on the outer wall of the top of the support plate; a guide frame is fixed to the outer wall of the top of the mounting plate, a metal block is slidably connected to the inner wall of the guide frame, and a guide plate is fixed to the outer wall of one side of the metal block. According to the utility model, when a probe at the bottom of the probe plate is in contact with a to-be-tested terminal at the top of the small IO module, the elastic telescopic rod can buffer the pressed small IO module through the elastic force of the elastic telescopic rod, so that hard collision between the probe moving downwards and the small IO module is avoided; the contact between the probe and the top terminal of the small IO module is not affected, and the probability of loss of the small IO module and the probe board during testing is reduced.

Description

TECHNICAL FIELD

[0001] The utility model relates to IO module detection technical field especially relates to a IO module test rack. BACKGROUND

[0002] With the rapid development of industrial automation technology, digital acquisition module is applied more and more widely in various fields, and the integration, miniaturization and high performance of digital acquisition module have become important pursuit in current design process, and this miniaturized hybrid digital IO acquisition module for small equipment application can effectively reduce the equipment occupied space, so more and more models of equipment are adopted.

[0003] The small IO module product needs to be tested for performance and function for many times during production, generally a series of adapters are selected to be connected with the IO module product, then the IO module product and adapter assembly are placed on the test rack and connected with the detection probe, then the test signal is led out through the test connection of multiple lines to realize the test of the module.

[0004] Through the search, the patent with the Chinese patent application number CN202420786218.3 discloses an IO module test rack, which comprises a probe test platform, and the first test probe assembly, the second test probe assembly and the third test probe assembly are sequentially installed on the probe test platform from right to left, but the above technical scheme does not set the mechanism capable of buffering between the test probe and the IO module, so the problem that the IO module is easy to be hard contacted with the test probe and the IO module and the test probe are easy to be damaged during the test still exists. UTILITY MODEL CONTENT

[0005] The utility model aims at solving the shortcomings in the prior art and provides an IO module test rack.

[0006] In order to achieve the above-mentioned purpose, the utility model adopts the following technical scheme:

[0007] An IO module test rack, comprising a mounting plate, a guide rail is opened on the top outer wall of the mounting plate, a mounting block is slidably connected to the inner wall of the guide rail, an elastic telescopic rod is fixed to the top outer wall of the mounting block, a support plate is fixed to the telescopic end of the elastic telescopic rod, and a clamping mechanism is arranged on the top outer wall of the support plate.

[0008] A group of guide frames are fixed to the top outer wall of the mounting plate, a metal block is slidably connected to the inner wall of the guide frame, a group of guide plates are fixed to one side of the outer wall of the metal block, a movable block is slidably connected to the inner wall of the guide plate, a fixed sheet is fixed to the outer wall of the movable block on both sides, a probe plate is fixed to the inner wall of the fixed sheet through a screw, and the inner wall of the guide frame is slidably connected to the outer wall of the support plate on both sides.

[0009] As a further scheme of the utility model: the outer wall of the top of the movable block is fixed with a handle.

[0010] As a further scheme of the utility model: the clamping mechanism comprises a clamping plate, a third supporting block, a sliding block, a double-threaded rod and a knob, the third supporting block is fixed on the outer wall of the top of the supporting plate, the double-threaded rod is rotatably connected to the inner wall of the third supporting block, a group of sliding blocks are slidably connected to the outer wall of the top of the supporting plate, the sliding blocks are respectively connected to the outer wall of the double-threaded rod through threads, the clamping plate is fixed on the outer wall of one side of the sliding block, and the knob is fixed on the outer wall of one side of the double-threaded rod.

[0011] As a further scheme of the utility model: the inner wall of the metal block is rotatably connected with a second threaded rod, and the movable block is connected to the outer wall of the second threaded rod through threads.

[0012] As a further scheme of the utility model: the outer wall of the top of the mounting plate is fixed with a first supporting block and a second supporting block, the inner wall of the first supporting block is rotatably connected with a first threaded rod, one end of the first threaded rod is rotatably connected to the outer wall of one side of the second supporting block, and the mounting block is connected to the outer wall of the first threaded rod through threads.

[0013] As a further scheme of the utility model: the outer wall of the top of the supporting plate is fixed with a rubber pad.

[0014] As a further scheme of the utility model: the outer walls of one side of the mounting plate and the guide plate are respectively provided with scale marks, and the outer walls of one side of the movable block and the mounting block are respectively provided with pointers.

[0015] As a further scheme of the utility model: the outer wall of the top of the guide frame is fixed with a magnet piece.

[0016] The utility model discloses beneficial effects are:

[0017] 1. Through the clamping mechanism of the top of the supporting plate, small IO module is clamped and fixed, then the probe plate corresponding to the small IO module is fixed at the bottom of the movable block through the screw, then the handle can be held to push the movable block and move down as a whole, when the probe at the bottom of the probe plate contacts the terminal to be tested on the top of the small IO module, the elastic expansion rod can buffer the small IO module under pressure through the elastic force of itself, avoid the hard collision between the probe and the small IO module when moving down, reduce the probability of the loss of small IO module and probe plate when testing while not affecting the contact between the probe and the terminal on the top of the small IO module.

[0018] 2. The staff can drive the small IO module to move back and forth by rotating the first threaded rod, thereby adjusting the back and forth position of the small IO module relative to the probe plate, making the probe at the bottom of the probe plate can be aligned with the terminal on the top of the small IO module, and improving the test accuracy.

[0019] 3. The staff pulls the metal block to the top of the guide frame using the handle. At this time, the magnetic sheet can attract the metal block with its own magnetism, thereby supporting and fixing the guide plate that has moved to the top of the guide frame, making it convenient for the staff to replace the probe plate later. Attached Figure Description

[0020] Figure 1 This is a schematic diagram of the main structure of an IO module test fixture proposed in this utility model;

[0021] Figure 2 This is a schematic diagram of the support plate structure of an IO module test fixture proposed in this utility model;

[0022] Figure 3 This is a schematic diagram of the guide plate structure of an IO module test fixture proposed in this utility model.

[0023] In the diagram: 1-Mounting plate, 2-First support block, 3-First threaded rod, 4-Scale ruler, 5-Mounting block, 6-Second support block, 7-Guide frame, 8-Knob, 9-Second threaded rod, 10-Magnetic piece, 11-Grip, 12-Metal block, 13-Probe plate, 14-Small IO module, 15-Support plate, 16-Elastic telescopic rod, 17-Clamping plate, 18-Slider, 19-Third support block, 20-Double threaded rod, 21-Fixing plate, 22-Moving block, 23-Guide plate. Detailed Implementation

[0024] The technical solution of this patent will be further described in detail below with reference to specific embodiments.

[0025] The embodiments of this patent are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this patent, and should not be construed as limiting this patent.

[0026] Example 1

[0027] An I / O module test fixture, such as Figures 1-3 As shown, it includes a mounting plate 1, a guide rail is provided on the top outer wall of the mounting plate 1, a mounting block 5 is slidably connected to the inner wall of the guide rail, an elastic telescopic rod 16 is fixed on the top outer wall of the mounting block 5, a support plate 15 is fixed to the telescopic end of the elastic telescopic rod 16, and a clamping mechanism is provided on the top outer wall of the support plate 15.

[0028] A group of guide frames 7 are fixed to the top outer wall of the mounting plate 1, metal blocks 12 are slidably connected to the inner wall of the guide frames 7, a group of guide plates 23 are fixed to the outer wall of one side of the metal blocks 12, movable blocks 22 are slidably connected to the inner wall of the guide plates 23, fixed sheets 21 are respectively fixed to the outer wall of two sides of the movable blocks 22, probe plates 13 are fixed to the inner wall of the fixed sheets 21 through screws, and the outer wall of two sides of the support plates 15 is slidably connected to the inner wall of the guide frames 7.

[0029] The top outer wall of the movable block 22 is fixed with a handle 11.

[0030] Firstly, the staff places the small IO module 14 to be tested on the top of the support plate 15, then clamps and fixes the small IO module 14 through the clamping mechanism on the top of the support plate 15, then fixes the probe plate 13 corresponding to the small IO module 14 on the bottom of the movable block 22 through screws, and then pushes the movable block 22 as a whole downward by hand holding the handle 11, when the probes at the bottom of the probe plate 13 contact the terminals to be tested on the top of the small IO module 14, at this time, the elastic expansion rod 16 can buffer the small IO module 14 under pressure through its own elastic force, avoiding hard collision between the probes and the small IO module 14 when moving downward, so as to reduce the probability of damage to the small IO module 14 and the probe plate 13 during testing without affecting the contact between the probes and the terminals on the top of the small IO module 14.

[0031] When the movable block 22 moves downward, the metal blocks 12 on both sides will slide in the inner wall of the guide frame 7, thereby guiding the probe plate 13 moving up and down, at the same time, the guide frame 7 can guide and support the support plate 15 slidably connected to the inner wall, improving the support and limiting effect of the support plate 15 on the small IO module 14.

[0032] As shown in Figure 2 The clamping mechanism includes a clamping plate 17, a third support block 19, a sliding block 18, a double-threaded rod 20 and a knob 8, the third support block 19 is fixed to the top outer wall of the support plate 15, the double-threaded rod 20 is rotatably connected to the inner wall of the third support block 19, a group of sliding blocks 18 are slidably connected to the top outer wall of the support plate 15, the sliding blocks 18 are respectively connected to the outer wall of the double-threaded rod 20 through threads, the clamping plate 17 is fixed to the outer wall of one side of the sliding block 18, and the knob 8 is fixed to the outer wall of one side of the double-threaded rod 20; after the staff places the small IO module 14 on the top of the support plate 15, the double-threaded rod 20 can be rotated through the knob 8, thereby driving the two sliding blocks 18 to move relatively through threads, thereby driving the clamping plate 17 to clamp the small IO module 14 on both sides, completing the positioning and clamping of the small IO module 14.

[0033] As shown in Figure 1 and Figure 3As shown, the inner wall of the metal block 12 is rotatably connected with a second threaded rod 9, and the movable block 22 is threadedly connected to the outer wall of the second threaded rod 9; the staff can drive the movable block 22 to move left and right by rotating the second threaded rod 9, so as to adjust the left and right positions of the probe plate 13 relative to the small IO module 14.

[0034] As shown in the figure, Figures 1-2 As shown, the top outer wall of the mounting plate 1 is fixed with a first support block 2 and a second support block 6, the inner wall of the first support block 2 is rotatably connected with a first threaded rod 3, one end of the first threaded rod 3 is rotatably connected to the outer wall of one side of the second support block 6, and the mounting block 5 is threadedly connected to the outer wall of the first threaded rod 3; the staff can drive the small IO module 14 to move forward and backward by rotating the first threaded rod 3, so as to adjust the front and back positions of the small IO module 14 relative to the probe plate 13, so that the probes at the bottom of the probe plate 13 can be aligned with the terminals at the top of the small IO module 14, and the test accuracy is improved.

[0035] As shown in the figure, Figure 1 As shown, the top outer wall of the support plate 15 is fixed with a rubber pad;

[0036] As shown, Figures 1-3 The mounting plate 1 and the guide plate 23 are provided with a scale 4 on one side of the outer wall, and the movable block 22 and the mounting block 5 are provided with a pointer on one side of the outer wall; by setting the pointer and the corresponding scale 4, the staff can accurately adjust the front and back positions between the probe plate 13 and the small IO module 14.

[0037] Working principle: the staff first places the small IO module 14 to be tested on the top of the support plate 15, then clamps and fixes the small IO module 14 through the clamping mechanism on the top of the support plate 15, then fixes the probe plate 13 corresponding to the small IO module 14 on the bottom of the movable block 22 through a screw, and then pushes the movable block 22 downward by holding the handle 11, so that when the probes at the bottom of the probe plate 13 contact the terminals to be tested at the top of the small IO module 14, the elastic expansion rod 16 can buffer the small IO module 14 under pressure through its own elasticity.

[0038] When the movable block 22 moves downward, the metal block 12 on both sides will slide in the inner wall of the guide frame 7, so as to guide the probe plate 13 moving up and down, and the guide frame 7 can guide and support the support plate 15 slidingly connected to the inner wall; after the staff places the small IO module 14 on the top of the support plate 15, the staff can rotate the double-threaded rod 20 through the knob 8, so as to drive the two sliding blocks 18 to move relatively through the thread, and then drive the clamping plate 17 to clamp the small IO module 14 on both sides.

[0039] Example 2

[0040] An IO module test rack, as shown in Figure 3 The embodiment is improved on the basis of the embodiment 1 and the magnet sheet 10 is fixed to the outer wall of the top of the guide frame 7; after the test, the worker pulls the metal block 12 to the top of the guide frame 7 through the handle 11, at this time, the magnet sheet 10 can adsorb the metal block 12 through the magnetism of itself, thereby supporting and fixing the guide plate 23 as a whole which is moved to the top of the guide frame 7, and the worker is convenient for replacing the probe plate 13 subsequently.

[0041] Working principle: after the test, the worker pulls the metal block 12 to the top of the guide frame 7 through the handle 11, at this time, the magnet sheet 10 can adsorb the metal block 12 through the magnetism of itself, thereby supporting and fixing the guide plate 23 as a whole which is moved to the top of the guide frame 7.

[0042] The above is only the preferred specific implementation of the present application, but the protection scope of the present application is not limited to this, any skilled person in the art can make equivalent replacement or change according to the technical scheme and the inventive concept of the present application within the technical range disclosed by the present application, which should be covered in the protection scope of the present application.

Claims

1. An IO module test rack comprising a mounting plate (1), characterized in that, The outer wall of the top of the mounting plate (1) is provided with a guide slide rail, the inner wall of the guide slide rail is slidably connected with a mounting block (5), the outer wall of the top of the mounting block (5) is fixedly connected with an elastic telescopic rod (16), the telescopic end of the elastic telescopic rod (16) is fixedly connected with a supporting plate (15), and the outer wall of the top of the supporting plate (15) is provided with a clamping mechanism. The outer wall of the top of the mounting plate (1) is fixedly connected with a group of guide frames (7), the inner wall of the guide frame (7) is slidably connected with a metal block (12), one side of the outer wall of the metal block (12) is fixedly connected with a group of guide plates (23), the inner wall of the guide plate (23) is slidably connected with a movable block (22), the outer walls of the two sides of the movable block (22) are respectively fixedly connected with fixed pieces (21), the inner wall of the fixed piece (21) is fixedly connected with a probe plate (13) through a screw, and the outer walls of the two sides of the supporting plate (15) are slidably connected to the inner walls of the guide frames (7).

2. The IO module test rack of claim 1, wherein, The outer wall of the top of the movable block (22) is fixedly connected with a handle (11).

3. The IO module test rack of claim 1, wherein, The clamping mechanism comprises a clamping plate (17), a third supporting block (19), a sliding block (18), a double-threaded rod (20) and a knob (8), the third supporting block (19) is fixedly connected to the outer wall of the top of the supporting plate (15), the double-threaded rod (20) is rotatably connected to the inner wall of the third supporting block (19), a group of sliding blocks (18) are slidably connected to the outer wall of the top of the supporting plate (15), the sliding blocks (18) are respectively connected to the outer wall of the double-threaded rod (20) through threads, the clamping plate (17) is fixedly connected to the outer wall of one side of the sliding block (18), and the knob (8) is fixedly connected to the outer wall of one side of the double-threaded rod (20).

4. The IO module test rack of claim 1, wherein, The inner wall of the metal block (12) is rotatably connected with a second threaded rod (9), and the movable block (22) is connected to the outer wall of the second threaded rod (9) through threads.

5. The IO module test rack of claim 1, wherein, The outer wall of the top of the mounting plate (1) is fixedly connected with a first supporting block (2) and a second supporting block (6), the inner wall of the first supporting block (2) is rotatably connected with a first threaded rod (3), one end of the first threaded rod (3) is rotatably connected to the outer wall of one side of the second supporting block (6), and the mounting block (5) is connected to the outer wall of the first threaded rod (3) through threads.

6. The IO module test rack of claim 3, wherein, The outer wall of the top of the supporting plate (15) is fixedly connected with a rubber pad.

7. The IO module test rack of claim 5, wherein, The outer walls of one side of the mounting plate (1) and the guide plate (23) are respectively provided with a scale (4), and the outer walls of one side of the movable block (22) and the mounting block (5) are respectively provided with a pointer.

8. The IO module test rack of claim 1, wherein, The outer wall of the top of the guide frame (7) is fixedly connected with a magnet piece (10).

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