A semiconductor IC pin conductive analyzer

Abstract

The utility model discloses a semiconductor IC pin conduction property analyzer, including the chip of measurement, the every pin of chip of measurement is connected to switching unit and power unit after connecting to the bias resistance, gate switch, indicator unit and double -channel micro -switch button in proper order respectively, and the gate switch is used for the conduction or close the passageway of this pin connection to power unit, and switching unit is used for switching power unit, thereby realizes the forward open short -circuit test or reverse open short -circuit test, and the every pin of chip of measurement is connected to the one pole of the battery of power unit through bias resistance, gate switch, indicator unit, the normally closed contact of double -channel micro -switch button and switching unit in proper order under the state of not being pressed to double -channel micro -switch button, and the normally open contact of double -channel micro -switch button is connected to the other pole of the battery through switching unit. The analyzer of the application simple operation is convenient to use, and greatly improves the test efficiency, and the principle is simple, and it is convenient to make and maintain.

Description

TECHNICAL FIELD

[0001] The utility model belongs to chip conduction test technical field, more specifically relates to a kind of semiconductor IC pin conduction property analyzer for semiconductor IC conduction test. BACKGROUND

[0002] In the Lot Setup (auxiliary work) of semiconductor test sorting operation, the polarity point of marked sample needs to be confirmed, to judge whether the printing direction of seal is correct; in the test production process, OS failure or defect beyond expectation can occur, then it needs to be quickly judged whether misjudgment occurs; when carrying out non-destructive analysis on OS failure, the conduction characteristics between device pins need to be understood, to preliminarily judge the main failure mode. OS failure, i.e. Open (open circuit) and Short (short circuit) failure, refers to the Open (open circuit) and Short (short circuit) test on the pins of chip in the test of semiconductor integrated circuit (IC), and the test purpose is to verify the electrical contact of test system and all pins of device, to ensure that short circuit with other pins or power supply (ground) does not occur.

[0003] At present, the method for judging the above failure needs to use multimeter or test machine. For example:

[0004] Pin1 confirmation: use the probe of multimeter to directly detect the pin of device, the device is not fixed, the pin is fine and dense, and the operation difficulty is large.

[0005] OS failure confirmation: when the OS proportion on test report is high, technician uses multimeter to analyze the pin conduction of waste product, or uses test machine to retest the test failure product.

[0006] FA failure analysis: use multimeter or curve tracer to check the conduction characteristics between pins.

[0007] In summary, in the existing production or failure analysis scene, if the conduction characteristics between IC pins are to be judged, at least multimeter needs to be used, and curve tracer and special test equipment need to be used when necessary, which is inconvenient. In the case that production reaches saturation and manpower tends to be tight, a tool or method for quickly judging the conduction characteristics of IC pin is necessary, which can not only improve production efficiency, but also simplify operation and improve the on-site problem analysis ability of technician. UTILITY MODEL CONTENT

[0008] The following presents a simplified summary of embodiments of the present application in order to provide a basic understanding of some aspects of the application. This summary is not an extensive overview of the application. It is not intended to identify key or critical elements of the application or to delineate the scope of the application. Its sole purpose is to present some concepts of the application in a simplified form as a prelude to the more detailed description that is presented later.

[0009] The utility model aims at simplifying the existing analysis scheme, improves test efficiency, provides a kind of semiconductor IC pin conductivity analyzer, and it is made into portable test analysis instrument, and the device is placed into the analyzer, and the conduction characteristic of device can be directly understood, and it is convenient for OS online analysis test.

[0010] Specifically, the present application provides a kind of semiconductor IC pin conductivity analyzer, including the chip to be measured, the pin of the chip to be measured is respectively sequentially connected to switching unit and power unit after being connected to the bias resistor, gating switch, indicator unit and double-channel micro button;Or, the pin of the chip to be measured is respectively sequentially connected to switching unit and power unit after being connected to the gating switch, bias resistor, indicator unit and double-channel micro button;Wherein, the gating switch is used to turn on or close the path of the pin connected to power unit;The indicator unit is used to indicate whether the pin is on or off;The switching unit is used to switch power unit to obtain the current of forward or reverse, to realize forward open short circuit test or reverse open short circuit test;The power unit includes battery;Double-channel micro button is test button, in the state that test button is not pressed, the pin of the chip to be measured is sequentially connected to the battery of power unit one pole (positive or negative) by bias resistor, gating switch, indicator unit, double-channel micro button normally closed contact and switching unit, double-channel micro button normally open contact is connected to the other pole (negative or positive) of battery through switching unit.

[0011] As a specific embodiment, the switching unit adopts one or more double-pole double-throw switches to switch the forward or reverse current of the power unit. The number of double-pole double-throw switches is determined according to the number of pins of the chip to be measured.

[0012] As a specific embodiment, the switching unit adopts one or more single-pole double-throw switches to switch the forward or reverse current of the power unit. The number of single-pole double-throw switches is determined according to the number of pins of the chip to be measured.

[0013] As a specific implementation, the indicator light unit is implemented by using a double-color light emitting diode in reverse parallel connection. As a further solution, the anode of the light emitting diode of the same color of the indicator light unit connected to each pin of the chip to be tested is connected to the pin of the chip to be tested through a biasing resistor, and the cathode is connected to the power supply unit through a micro button and a switching unit. For example, the double-color light emitting diode includes a green light emitting diode and a red light emitting diode, and the anode of each green light emitting diode or red light emitting diode connected to all the pins is arranged close to the side of the pin.

[0014] As a specific implementation, the power supply unit includes a battery, a power switch and a current limiting resistor; the anode of the battery is connected to the switching unit after being connected to the power switch in series, and the cathode of the battery is connected to the switching unit after being connected to the current limiting resistor in series. As a further solution, the resistance value of the current limiting resistor is 1k ohm.

[0015] The semiconductor IC pin conduction analyzer realized by the above-mentioned solution has simple operation and convenient use, greatly improves the test efficiency, and has simple principle, easy manufacturing and maintenance, and good practicability. BRIEF DESCRIPTION OF DRAWINGS

[0016] The utility model can be better understood through the description given below in conjunction with the drawings, wherein the same or similar reference signs are used to represent the same or similar parts in all the drawings. The drawings, together with the following detailed description, are included in the specification and form part of the specification, and are used to further illustrate the preferred embodiments of the utility model and explain the principles and advantages of the utility model. In the drawings:

[0017] Figure 1 It is the principle block diagram of semiconductor IC pin conduction analyzer of the utility model embodiment 1;

[0018] Figure 2 It is the principle block diagram of semiconductor IC pin conduction analyzer of the utility model embodiment 2;

[0019] Figure 3 It is the schematic diagram of semiconductor IC pin conduction analyzer of the utility model embodiment;

[0020] Figure 1 The components corresponding to each reference numeral are as follows: 1, chip to be tested, 2, gating switch, 3, indicator light unit (parallel double-color light emitting diode), 4, micro button, 5, current limiting resistor, 6, battery, 7, power switch, 8, double-pole double-throw switch, 9, biasing resistor;

[0021] Figure 2Corresponding components of each reference number are as follows: 11, DUT, 12, gate switch, 13, indicator light unit, 14, micro button, 15, current limiting resistor, 16, battery, 17, power switch, 18, double-pole double-throw switch, 19, bias resistor;

[0022] Figure 3 Corresponding components of each reference number are as follows: power switch 21, power indicator 22, manual test seat 23, green indicator 24, red indicator 25, positive and negative test button 26, gate switch 27, test button 28. DETAILED DESCRIPTION

[0023] Embodiments of the present application will be described below with reference to the accompanying drawings. The elements and features described in one drawing or one embodiment of the present application can be combined with the elements and features shown in one or more other drawings or embodiments. It should be noted that, for the purpose of clarity, the representation and description of components and processes that are irrelevant to the present application and known to those skilled in the art are omitted from the drawings and the description.

[0024] In the description of the present application, it should be noted that, unless otherwise explicitly specified and limited, the terms "mounting", "connection", "connection" should be understood broadly, for example, it can be fixedly connected, or it can be detachably connected, or integrally connected; it can be mechanically connected, or it can be electrically connected; it can be directly connected, or it can be indirectly connected through an intermediate medium, or it can be the communication inside two elements. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0025] The following are the explanations of the English abbreviations used in this application: IC, generally refers to integrated circuits, discrete devices, and packaged semiconductor devices; conductivity: refers to the conductivity between pins after packaging of semiconductor devices, specifically refers to open circuit, short circuit and diode junction voltage; OS: open circuit (Open) and short circuit (Short); Lot setup: refers to the various preparations (auxiliary) work needed before a batch production.

[0026] In the existing chip testing process, OS exceeding the standard is a common abnormal phenomenon in the production line, and engineering and technical personnel usually use a multimeter to confirm OS, which is inconvenient and time-consuming; in addition, when changing materials, technicians use a multimeter to confirm whether the stamp polarity is correct, which is inconvenient to operate.

[0027] Embodiment 1

[0028] As a specific embodiment, see Figure 1The utility model discloses IC device pin mutual conduction characteristic analyzer taking SOT23-6 as an example, in the circuit, the following corresponding components are as follows: 1, the chip under test, 2, the gating switch, 3, the indicator light unit (parallel double color light emitting diode), 4, the micro button, 5, the current -limiting resistance, 6, the battery, 7, the power switch, 8, the double -pole double -throw switch, 9, the bias resistance.

[0029] Referring to Figure 1 SOT23-6 is the chip under test 1 (or the device under test), in the embodiment, the chip under test 1 has six pins. Bias resistance 9, gating switch 2, indicator light unit 3 and double -channel micro button 4 are connected to double -pole double -throw switch 8 and power supply unit in proper order on each pin. Referring to Figure 1 Bias resistance 9, gating switch 2, indicator light unit 3 and double -channel micro button 4 are all provided with six, corresponding six pins.

[0030] The pin of the chip under test 1 is connected with a bias resistance 9, and the bias resistance is used to make the parallel circuit with large voltage difference to have current passing through to light the corresponding light emitting diode.

[0031] Gating switch 2 can disconnect the pin not needed to be detected when necessary.

[0032] Each pin has an indicator light unit, which is realized by double -color reverse parallel LED (light emitting diode), for example, realized by green light emitting diode and red light emitting diode, and the anode of the same color LED is arranged close to the side of the pin.

[0033] Each pin corresponds to a double -channel micro button 4.

[0034] The power supply unit includes current -limiting resistance 5, battery 6 and power switch 7 connected in proper order. In the embodiment, the battery 6 adopts 6V battery, and the current -limiting resistance 5 of 1k is matched, and the power switch 7,

[0035] Double -pole device switch 8 is used to exchange the positive and negative poles of the battery.

[0036] The circuit is explained as follows:

[0037] ① in the case where any micro button is not pressed, all pins are connected to the one pole of the battery through the normally closed contact of the micro switch, and the normally open contact is connected to the other pole of the battery;

[0038] ② when the state of double -pole device switch DPDT does not change, press the micro button of one pin, if the current flows into the IC from the pin, the red light of the pin is bright, if the current flows out from other pin, the green light of the pin is bright, which shows that the pin between the red light and the green light is conducted;

[0039] ③ Following the previous step, if you press the double-pole double-throw switch to switch the positive and negative terminals at this time, you can observe that other pins are conducting in reverse to this pin, and the red light pin is conducting to the green light pin. Figure 1 In the indicator light units at the top and bottom of the chip under test, the left side has a green LED and the right side has a red LED.

[0040] In actual testing, the state of the double-pole device switch DPDT can usually be fixed so that each pin is connected to the negative terminal of the battery by default. In this way, you can observe the conduction of the pin to other pins by simply pressing the microswitch button of the pin being tested.

[0041] Example 2

[0042] As another embodiment, see Figure 2 The circuit diagram shown has the following components numbered as follows: 11, Device Under Test (DUT); 12, Selector switch; 13, Indicator unit (reverse parallel bicolor LED); 14, Microswitch (test button); 15, Current-limiting resistor; 16, Battery; 17, Power switch; 18, Double-pole double-throw switch; 19, Bias resistor. In this embodiment, the DUT 11 has 6 pins. Each pin is connected in series with the selector switch 12, bias resistor 19, indicator unit 13, and microswitch 14, then connected to the double-pole double-throw switch 8 and the power supply unit. The power supply unit consists of the battery 16, current-limiting resistor 15, and power switch 17. (See also...) Figure 2 There are 6 bias resistors 19, strobe switch 12, indicator light unit 13 and micro switch 14, corresponding to 6 pins.

[0043] In implementing the analyzer for the inter-pin conduction characteristics of this utility model of IC devices, a housing can be provided. (See attached image.) Figure 3 The casing includes a power switch 21, a power indicator light 22, a manual test socket 23, a green indicator light 24, a red indicator light 25, forward and reverse test buttons 26, a selector switch 27, and a test button 28 (i.e., a micro switch). This analyzer is used to quickly analyze the internal continuity characteristics between the pins of IC devices, helping engineers to make the following judgments: 1. Whether the Pin1 position of the device stamp is correct; 2. The open and short circuit conditions between the pins of the failed product.

[0044] The analyzer implemented by this invention through the above-described scheme has the following advantages: 1. It has its own power supply; 2. It has a simple principle, making it easy to manufacture and maintain; 3. It can independently test the continuity from one pin to all other pins and from all other pins to that pin; 4. It can be freely expanded according to the specific number of pins in the package; 5. It uses a manual test socket compatible with the package and matches the test circuit. Compared with existing technologies, the testing is more comprehensive, intuitive, fast, and efficient, demonstrating excellent innovation, advancement, and practicality.

[0045] Compared with the tools such as the universal meter, the utility model is not limited to the above version and specific packaging, and the design using the same or similar principle as the above implementation of the utility model, the scheme of conducting between the pins of the LED display semiconductor device, all are within the protection scope of the patent.

[0046] Although the utility model has been disclosed through the description of the specific embodiments of the utility model above, it should be understood that all the above embodiments and examples are exemplary, but not limited. Those skilled in the art can design various modifications, improvements or equivalents of the utility model within the spirit and scope of the appended claims. The utility model is not limited to the above version and specific packaging, and the design using the same or similar principle as the above implementation of the utility model, the scheme of conducting between the pins of the LED display semiconductor device, these modifications, improvements or equivalents should also be considered to be included in the protection scope of the utility model.

Claims

1. A semiconductor IC pin conductivity analyzer characterized by: The chip under test is connected to the switching unit and the power supply unit through a bias resistor, a gate switch, an indicator unit and a double-channel micro push button in sequence; or the chip under test is connected to the switching unit and the power supply unit through a gate switch, a bias resistor, an indicator unit and a double-channel micro push button in sequence; The gate switch is used to turn on or off the path of the pin connected to the power supply unit; The indicator unit is used to indicate whether the pin is turned on or not; The switching unit is used to switch the power supply unit to obtain forward or reverse current, so as to realize forward open short circuit test or reverse open short circuit test; The power supply unit includes a battery; The double-channel micro push button is a test button, in the state of not being pressed, each pin of the chip under test is connected to one pole of the battery of the power supply unit through a bias resistor, a gate switch, an indicator unit, a normally closed contact of the double-channel micro push button and the switching unit, and the normally open contact of the double-channel micro push button is connected to the other pole of the battery through the switching unit.

2. The semiconductor IC pin conductivity analyzer of claim 1, wherein: The switching unit is implemented by one or more double-pole double-throw switches.

3. The semiconductor IC pin conductivity analyzer of claim 1, wherein: The switching unit is implemented by one or more single-pole double-throw switches.

4. The semiconductor IC pin conductivity analyzer of claim 1, wherein: The indicator unit is implemented by double-color light emitting diodes connected in reverse parallel.

5. The semiconductor IC pin conductivity analyzer of claim 4, wherein: The anode of the light emitting diode of the same color of the indicator unit connected to each pin of the chip under test is connected to each pin of the chip under test through a bias resistor, and the cathode is connected to the power supply unit through a micro push button and a switching unit.

6. The semiconductor IC pin conductivity analyzer of claim 1, wherein: The power supply unit includes a battery, a power supply switch and a current limiting resistor; the anode of the battery is connected to the switching unit through the power supply switch, and the cathode of the battery is connected to the switching unit through the current limiting resistor.

7. The semiconductor IC pin conductivity analyzer of claim 6, wherein: The resistance value of the current limiting resistor is 1k ohm.

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