Lamination short circuit testing device
By using a short-circuit testing device to detect the insulation performance of the electrodes in real time during the lamination process, the problem of disassembly and repair after failure in existing technologies is solved, realizing safe and efficient lamination operation and testing, and reducing costs and complexity.
Patent Information
- Application Number
- CN202423281713.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-30
- Publication Date
- 2025-12-30
- Estimated Expiration
- 2034-12-30
AI Technical Summary
In existing technologies, insulation testing after lamination reveals defects, requiring disassembly and repair, which increases labor time and may damage other electrodes. It also requires additional testing equipment and processes, increasing production costs and complexity.
Design a short-circuit testing device for laminated plates. The device uses a lifting platform and pressure plate to detect the insulation performance of the plates in real time during the lamination process. The device uses a probe group to connect to the tabs for current detection. If a defect is found, the device can be disassembled and repaired in time to avoid damage to the plates by hard contact.
It enables real-time insulation performance testing during the lamination process, reducing electrode losses, lowering material and labor costs, simplifying production line complexity, and ensuring the safety of the testing process and the quality of the finished cells.
Smart Images
Figure CN223742704U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of laminated battery cell processing technology, and in particular to a laminated short-circuit testing device. Background Technology
[0002] The stacking process involves cutting positive and negative electrode sheets into small pieces, stacking them with a separator to form small battery cells, stacking these small battery cells together to form larger capacity cells, and then assembling them into a casing. This is a common lithium battery manufacturing process.
[0003] Short-circuit testing of battery cells after lamination is an essential inspection step in battery production. Current technology typically involves testing the insulation performance of bare cells after lamination using specialized X-ray testing equipment. However, this method usually has the following problems: 1) If insulation defects are found after lamination, the cell needs to be disassembled and repaired, which not only increases labor time but may also damage other electrodes, leading to material waste; 2) Additional testing equipment and processes need to be set up on the battery production line, increasing the complexity and production cost.
[0004] Therefore, there is an urgent need to develop a stacked short-circuit testing device to solve the above problems. Utility Model Content
[0005] The purpose of this invention is to provide a short-circuit testing device for laminated plates, which can perform real-time insulation performance testing on the laminated plates during the lamination process, and promptly disassemble and repair them if defects are found, thereby reducing electrode wear, lowering material costs, and simplifying the complexity of the production line.
[0006] Based on the above concept, the technical solution adopted by this utility model is as follows:
[0007] A stacked short-circuit test device, comprising:
[0008] The lifting platform can be raised and lowered vertically.
[0009] A pressure plate is elastically connected to the lifting platform. When the lifting platform moves in the vertical direction, it can drive the pressure plate to move. The pressure plate can pick up the electrode sheet to be stacked and place it on top of the original stack, thereby forming the current stack.
[0010] A detection probe set is arranged on the lifting platform or the pressing plate, the detection probe set comprises a first probe and a second probe, and the first probe and the second probe can be electrically connected with the positive electrode lug and the negative electrode lug of the current stack respectively when the pressing plate places the to-be-stacked electrode piece on the original stack, wherein one of the positive electrode lug and the negative electrode lug is the electrode lug on the to-be-stacked electrode piece, and the other is the electrode lug on the original stack which is opposite in polarity to the electrode lug on the to-be-stacked electrode piece.
[0011] As a preferred scheme of the stack short circuit testing device provided by the utility model, the stack short circuit testing device further comprises a guide assembly arranged between the lifting platform and the pressing plate to guide the relative movement therebetween.
[0012] As a preferred scheme of the stack short circuit testing device provided by the utility model, the guide assembly comprises:
[0013] A guide sleeve is fixed to the pressing plate;
[0014] A guide column is fixed to the lifting platform at one end and is arranged in the guide sleeve at the other end.
[0015] As a preferred scheme of the stack short circuit testing device provided by the utility model, the guide assembly further comprises an elastic member arranged on the guide column, and the two ends of the elastic member are connected to the lifting platform and the guide sleeve respectively.
[0016] As a preferred scheme of the stack short circuit testing device provided by the utility model, the pressing plate is provided with a guide hole opposite the center hole of the guide sleeve, the guide column is arranged in the guide sleeve and the guide hole in sequence, and the end of the guide column away from the lifting platform is connected with a suction member capable of adsorbing the to-be-stacked electrode piece.
[0017] As a preferred scheme of the stack short circuit testing device provided by the utility model, the number of guide assemblies is multiple, and the multiple guide assemblies are arranged in an array between the pressing plate and the lifting platform.
[0018] As a preferred scheme of the stack short circuit testing device provided by the utility model, a limiting member is further arranged between the lifting platform and the pressing plate, and the limiting member is used for limiting the maximum displacement of the pressing plate.
[0019] As a preferred scheme of the stack short circuit testing device provided by the utility model, the pressing plate is provided with a first through hole, one end of the first probe is fixed to the lifting platform, and the other end is slidably arranged in the first through hole; and / or
[0020] The second probe is fixed to the lifting platform at one end and slides through the second through hole.
[0021] As a preferred scheme of the lamination short circuit testing device provided by the utility model, the setting position of the first probe on the lifting platform or the pressing plate is adjustable; and / or
[0022] The setting position of the second probe on the lifting platform or the pressing plate is adjustable.
[0023] As a preferred scheme of the lamination short circuit testing device provided by the utility model, the pressing plate is made of insulating material; or the lower surface of the pressing plate is provided with an insulating layer.
[0024] The utility model discloses the beneficial effects are:
[0025] The utility model provides a kind of lamination short circuit testing device, when carrying out lamination process, lifting platform moves along vertical direction and can drive pressing plate and its on the extreme piece to be stacked close to original lamination, and the extreme piece to be stacked is stacked on the top of original lamination, to form current lamination, simultaneously make first probe and second probe respectively electrically connected to the positive pole lug and negative pole lug of current lamination, when first probe, positive pole lug, positive pole piece, negative pole piece, negative pole lug, second probe and the loop current formed by entire lamination short circuit testing device are conducted, to judge the current lamination as bad lamination, and the extreme piece of problem is the extreme piece to be stacked located on the top of original lamination or the diaphragm adjacent thereto, and operator can disassemble and repair the extreme piece to be stacked located on the top of original lamination or the diaphragm adjacent thereto, avoid its flow into next process, affect finished product battery quality;By elastically connecting pressing plate to lifting platform, it can avoid the case that hard contact between pressing plate and lamination leads to lamination damage, to guarantee the safety of detection process.The lamination short circuit testing device can realize lamination operation and insulation performance detection operation after lamination operation simultaneously, disassemble and repair in time after finding bad, to reduce pole piece loss, reduce disassembly labor cost and auxiliary equipment cost. BRIEF DESCRIPTION OF DRAWINGS
[0026] Figure 1 It is the structure schematic view of original lamination provided by the utility model embodiment;
[0027] Figure 2 It is the structure schematic view of lamination short circuit testing device in one visual angle provided by the utility model embodiment;
[0028] Figure 3 It is the structure schematic view of current lamination provided by the utility model embodiment;
[0029] Figure 4is a partial explosion structure schematic view of the lamination short circuit testing device provided by the embodiment of the utility model;
[0030] Figure 5 is Figure 4 a partial structure schematic view of the lamination short circuit testing device provided by the embodiment of the utility model;
[0031] Figure 6 is a structure schematic view of the lamination short circuit testing device provided by the embodiment of the utility model from another perspective;
[0032] Figure 7 is Figure 6 a partial enlarged view at A.
[0033] in the figure,
[0034] 100, lamination short circuit testing device;
[0035] 110, lifting platform; 111, via hole;
[0036] 120, pressing plate; 121, first through hole; 122, second through hole; 123, guide hole;
[0037] 130, suction accessory;
[0038] 141, first probe; 142, second probe;
[0039] 150, guide assembly; 151, guide column; 152, guide sleeve; 153, elastic piece;
[0040] 160, limiting piece;
[0041] 170, fixing nut;
[0042] 200, lamination; 2001, original lamination; 2002, current lamination; 210, positive plate; 211, positive lug; 220, negative plate; 221, negative lug; 230, first diaphragm; 240, second diaphragm. DETAILED DESCRIPTION
[0043] The utility model will be further explained in detail below by combining with the drawings and embodiments. It can be understood that the specific embodiments described here are only used for explaining the utility model and not for limiting the utility model. In addition, it needs to be explained that, in order to facilitate the description, only the part related to the utility model is shown in the drawings and not all structures.
[0044] In the description of this utility model, unless otherwise explicitly specified and limited, the terms "connected," "linked," and "fixed" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.
[0045] In this invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of the second feature includes the first feature directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.
[0046] In the description of this embodiment, the terms "upper," "lower," "left," and "right," etc., refer to the orientation or positional relationship shown in the accompanying drawings. They are used only for ease of description and simplification of operation, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model. In addition, the terms "first" and "second" are only used for distinction in description and have no special meaning.
[0047] Figure 1 A schematic diagram of the original laminate 2001 provided in this embodiment is shown. Figure 2 This diagram illustrates the structure of the stacked short-circuit testing device 100 provided in this embodiment from one viewpoint. Figures 1-2 As shown, this embodiment provides a laminated short-circuit testing device 100, which is mainly used to test the insulation performance of laminated sheets 200. The laminated sheets 200 include positive electrode sheets 210, separators, and negative electrode sheets 220 stacked sequentially. This embodiment only illustrates the arrangement of one positive electrode sheet 210, one negative electrode sheet 220, a first separator 230, and a second separator 240. In an actual battery, the laminated sheets 200 can be a stack of ten or more positive electrode sheets 210 and a corresponding number of negative electrode sheets 220, with a separator between any adjacent positive electrode sheets 210 and negative electrode sheets 220.
[0048] During the lamination process, if the separator is damaged, burrs on the positive electrode 210 or negative electrode 220 puncture the separator, or there is dust between the positive electrode 210 and negative electrode 220, the positive electrode 210 and negative electrode 220 may become directly conductive, resulting in a short circuit and abnormal lamination. If this abnormal lamination flows into the downstream process, it will also cause abnormalities in the downstream process. The lamination short-circuit testing device 100 provided in this embodiment is used to test the insulation performance of the lamination 200 during the process of sequentially stacking positive electrode 210 and negative electrode 220 to form a lamination 200. That is, while placing a new electrode on the top layer of the lamination 200, the lamination short-circuit testing device 100 can perform insulation testing on the new electrode and the new lamination 200 formed by the lamination 200 below it. In other words, the insulation performance of the electrode and the lamination 200 below it is tested at the same time as each electrode is stacked. If an abnormality is found, it can be determined that the abnormality occurs in the top electrode or separator, so that defective electrodes or separators can be detected in time and removed. Finally, all electrodes and separators in the lamination 200 meet the cell quality requirements, avoiding defective laminations from flowing into the next process and affecting the quality of the finished cell.
[0049] Specifically, the stacked short-circuit testing device 100 includes a lifting platform 110, a pressure plate 120, and a detection probe assembly. The lifting platform 110 can be raised and lowered vertically. The pressure plate 120 is elastically connected to the lifting platform 110, and the lifting platform 110 can move the pressure plate 120 when it moves vertically. The pressure plate 120 can pick up the electrode to be stacked and place it on top of the original stack 2001, thereby forming the current stack 2002. The detection probe assembly is disposed on the lifting platform 110 or the pressure plate 120. On plate 120, the detection probe group includes a first probe 141 and a second probe 142. When the pressure plate 120 places the electrode to be stacked on the original stack 2001, the first probe 141 and the second probe 142 can be electrically connected to the positive electrode tab 211 and the negative electrode tab 221 of the current stack 2002, respectively. One of the positive electrode tab 211 and the negative electrode tab 221 is an electrode tab on the electrode to be stacked, and the other is an electrode tab on the original stack 2001 with the opposite polarity to the electrode tab on the electrode to be stacked.
[0050] Figure 3 A schematic diagram of the current stacked wafer 2002 provided in this embodiment is shown. The following is in conjunction with... Figures 1-3 Briefly describe the testing process of the laminated short-circuit test device 100 to test the insulation performance of the laminated sheets 200. For example... Figures 1-3 As shown, for ease of explanation, Figure 1The stack 200 in which the positive electrode sheet 210, the first separator 230, the negative electrode sheet 220 and the second separator 240 are sequentially stacked from bottom to top is referred to as a primary stack 2001; the pressing plate 120 of the stack short circuit testing device 100 can stack a to-be-stacked electrode sheet (another positive electrode sheet 210) on top of the second separator 240, and the new stack 200 formed by stacking the another positive electrode sheet 210 and the primary stack 2001 is referred to as a current stack 2002. When the lifting platform 110 drives the pressing plate 120 to move towards the primary stack 2001 and places the another positive electrode sheet 210 on top of the second separator 240, the first probe 141 and the second probe 142 can be electrically connected with the positive electrode tab 211 of the positive electrode sheet 210 on the top layer and one negative electrode tab 221 on the primary stack 2001, respectively. When the second separator 240 is damaged, the burrs on the positive electrode sheet 210 or the negative electrode sheet 220 pierce the separator, or dust exists between the positive electrode sheet 210 and the negative electrode sheet 220, the positive electrode sheet 210 and the negative electrode sheet 220 are directly in contact, resulting in electrical connection. At this time, the loop formed by the first probe 141, the positive electrode tab 211, the positive electrode sheet 210, the negative electrode sheet 220, the negative electrode tab 221, the second probe 142 and the entire stack short circuit testing device 100 is in current conduction, so that it can be judged that the current stack 2002 is a defective stack, and the operator can remove the positive electrode sheet 210 or the second separator 240 on the top layer and repeat the above operation. When no current passes through the loop formed by the first probe 141, the positive electrode tab 211, the positive electrode sheet 210, the negative electrode sheet 220, the negative electrode tab 221, the second probe 142 and the entire stack short circuit testing device 100, it can be judged that the current stack 2002 is a qualified stack.
[0051] The lamination short-circuit testing device 100 provided by the embodiment can be used in the lamination process. When the lamination process is performed, the lifting platform 110 moves along the vertical direction and can drive the pressing plate 120 and the to-be-stacked electrode plate on the pressing plate 120 to approach the original lamination plate 2001, and stack the to-be-stacked electrode plate on the top of the original lamination plate 2001, so as to form a current lamination plate 2002. Meanwhile, the first probe 141 and the second probe 142 are electrically connected to the positive electrode lug 211 and the negative electrode lug 221 of the current lamination plate 2002 respectively. When the loop current formed by the first probe 141, the positive electrode lug 211, the positive electrode plate 210, the negative electrode plate 220, the negative electrode lug 221, the second probe 142 and the entire lamination short-circuit testing device 100 is conducted, it can be determined that the current lamination plate 2002 is a defective lamination plate, and the electrode plate that causes the problem is the to-be-stacked electrode plate located on the top of the original lamination plate 2001 or the separator adjacent to the to-be-stacked electrode plate. The operator can disassemble and repair the to-be-stacked electrode plate located on the top of the original lamination plate 2001 or the separator adjacent to the to-be-stacked electrode plate to avoid affecting the quality of the finished product battery cell. The pressing plate 120 is elastically connected to the lifting platform 110, so that the hard contact between the pressing plate 120 and the to-be-stacked electrode plate or the lamination plate 200 can be avoided, and the safety of the detection process can be ensured. The lamination short-circuit testing device 100 can simultaneously realize the lamination operation and the insulation performance detection operation after the lamination operation, so that the disassembly and repair can be performed in time after the defect is found, the electrode plate loss is reduced, and the disassembly labor cost and auxiliary equipment cost are reduced.
[0052] In some embodiments, in order to realize the insulating contact between the pressing plate 120 and the lamination plate 200, the pressing plate 120 can be provided as an insulating plate structure or an insulating layer is arranged on the lower surface of the pressing plate 120, so that the pressing plate 120 is prevented from being in contact with the electrode plate located on the top of the lamination plate 200 and conducting electricity, thereby affecting the accuracy of the detection result.
[0053] In order to realize the lifting of the lifting platform 110 along the vertical direction, the lamination short-circuit testing device 100 further comprises a lifting driving member (not shown in the figure), and the output end of the lifting driving member is connected with the lifting platform 110. The specific structure of the lifting driving member is not limited in the embodiment, and any driving device with a linear driving function in the prior art, such as a pneumatic cylinder, an electric cylinder, a motor plus a screw nut pair, etc., can be used.
[0054] Figure 4 Part of the explosion structure schematic diagram of the lamination short-circuit testing device 100 provided by the embodiment is shown. Figure 5 Part of the explosion structure schematic diagram of the lamination short-circuit testing device 100 provided by the embodiment is shown. Figure 4 Part of the explosion structure schematic diagram of the lamination short-circuit testing device 100 provided by the embodiment is shown. Figures 4-5 Part of the explosion structure schematic diagram of the lamination short-circuit testing device 100 provided by the embodiment is shown. Figure 2As shown, the lamination short-circuit testing device 100 further comprises a guide assembly 150 arranged between the lifting platform 110 and the pressing plate 120 to guide the relative movement therebetween, thereby ensuring the stability of the movement of the pressing plate 120 and enabling the pressing plate 120 to accurately stack the lamination to be stacked on the original lamination 2001. Specifically, the guide assembly 150 comprises a guide sleeve 152 fixed to the pressing plate 120 and a guide column 151, one end of which is fixed to the lifting platform 110 and the other end of which is arranged in the guide sleeve 152, which is simple in structure, easy to install and has good guiding effect.
[0055] Optionally, the guide assembly 150 further comprises an elastic member 153 sleeved on the guide column 151 and connected to the lifting platform 110 and the guide sleeve 152 at two ends thereof. When the lifting platform 110 drives the pressing plate 120 to approach the lamination 200 and contact the lamination 200, the force between the pressing plate 120 and the lamination 200 can drive the guide sleeve 152 to move upward along the axial direction of the guide column 151, while compressing the elastic member 153. This process can also slow down the pressing plate 120, thereby reducing the pressure of the pressing plate 120 on the lamination 200, protecting the lamination 200 from damage and ensuring the quality of the lamination 200. When the detection process is completed, the elastic member 153 can also reset the pressing plate 120 when the lifting platform 110 drives the pressing plate 120 to move away from the lamination 200. In this embodiment, the elastic member 153 is a spring, which is convenient to obtain and install and has low cost.
[0056] Optionally, the number of guide assemblies 150 is multiple, and the multiple guide assemblies 150 are arranged in an array between the pressing plate 120 and the lifting platform 110 to further improve the stability of the movement of the pressing plate 120 in the vertical direction and ensure the uniformity of the force on the pressing plate 120 at each position. The specific number of guide assemblies 150 is not limited in this embodiment, and designers can adjust it according to actual detection needs.
[0057] To fix the guide column 151 to the lifting platform 110, the upper portion of the guide column 151 is provided with a threaded segment, the lifting platform 110 is provided with a through hole 111, the upper end of the guide column 151 passes through the through hole 111, and two fixing nuts 170 are screwed to the threaded segment of the guide column 151 from the upper and lower sides of the lifting platform 110 and abut against the upper and lower sides of the lifting platform 110, respectively, thereby realizing the stable connection between the guide column 151 and the lifting platform 110, and the threaded connection has the advantages of convenient disassembly and assembly and stable connection. Optionally, the guide column 151 can be directly selected as a stud, which is simple in structure and can reduce manufacturing cost.
[0058] Figure 6A structure schematic view of the lamination short circuit test device 100 provided by the embodiment is shown from another perspective. Figure 7 A structure schematic view of the lamination short circuit test device 100 provided by the embodiment is shown from another perspective. Figure 6 A local enlarged view at A. As shown in Figures 6-7 A local enlarged view at A. As shown in Figure 5 As shown, the pressing plate 120 is provided with a guide hole 123 opposite to the center hole of the guide sleeve 152, the guide column 151 is sequentially provided in the guide sleeve 152 and the guide hole 123, and the end of the guide column 151 away from the lifting platform 110 is connected with a suction accessory 130, which can adsorb the to-be-stacked lamination, so as to realize the acquisition and transfer of the to-be-stacked lamination. Optionally, the suction accessory 130 can adopt a flexible suction cup to avoid damaging the to-be-stacked lamination.
[0059] As shown in Figure 2 A local enlarged view at A. As shown in Figure 4 As shown, the lifting platform 110 and the pressing plate 120 are further provided with a limiting piece 160, which is used for limiting the maximum displacement of the pressing plate 120, so as to avoid that the lamination 200 is damaged due to the too long distance of the guide column 151 extending out of the pressing plate 120, thereby ensuring the safety during the whole test process. Optionally, the number of the limiting pieces 160 is multiple, and the multiple limiting pieces 160 are arrayed between the lifting platform 110 and the pressing plate 120, so as to avoid that the pressing plate 120 is deflected during the movement process when only one limiting piece 160 is arranged, thereby causing the too long distance of some guide columns 151 extending out of the pressing plate 120 to damage the lamination 200. In the embodiment, the limiting piece 160 can be a limiting bolt, which is threadedly connected to the lifting platform 110, and the end of the limiting bolt away from the lifting platform 110 is spaced apart from the pressing plate 120, and the spacing between the limiting bolt and the pressing plate 120 is the maximum moving distance of the pressing plate 120. Of course, the specific structure of the limiting piece 160 is not limited in the embodiment, and it can also be a limiting protruding part protruding from the bottom surface of the lifting platform 110, which is integrally formed with the lifting platform 110, so as to omit the assembly process between the limiting piece 160 and the lifting platform 110, thereby improving the assembly efficiency.
[0060] Continued as Figure 4 A local enlarged view at A. As shown in Figure 6As shown, the pressing plate 120 is provided with a first through hole 121, one end of the first probe 141 is fixed on the lifting platform 110, and the other end is slidably arranged in the first through hole 121; the pressing plate 120 is provided with a second through hole 122, one end of the second probe 142 is fixed on the lifting platform 110, and the other end is slidably arranged in the second through hole 122. Specifically, when the pressing plate 120 does not place the to-be-stacked pole piece on the original pole piece 2001, the first probe 141 and the second probe 142 are respectively located in the first through hole 121 and the second through hole 122; when the pressing plate 120 places the to-be-stacked pole piece on the original pole piece 2001 and presses on the current pole piece 2002, the acting force between the pressing plate 120 and the pole piece 200 can drive the guide sleeve 152 to move upward along the axis direction of the guide column 151, at this time, the first probe 141 and the second probe 142 gradually expose from the bottom of the pressing plate 120 to press on the positive electrode lug 211 and the negative electrode lug 221 respectively, forming an electrical connection. This arrangement can avoid the damage of the electrode lug caused by the contact between the first probe 141 and the second probe 142 and the positive electrode lug 211 and the negative electrode lug 221 at a large downward speed when the pressing plate 120 approaches the pole piece 200, further ensuring the safety of the entire test process and the quality of the finished pole piece 200. Of course, in other embodiments, the first probe 141 and the second probe 142 can also be directly connected to the bottom of the pressing plate 120, which can also achieve the above-mentioned effect, but when using this arrangement, the downward speed of the pressing plate 120 should be controlled in time when the pressing plate 120 approaches the pole piece 200 to avoid damage to the positive electrode lug 211 or the negative electrode lug 221.
[0061] As shown in the drawings, Figure 2 In this embodiment, the first probe 141 and the second probe 142 are respectively located at the two ends of the lifting platform 110, and are used for short circuit detection of the pole piece 200 whose positive electrode lug 211 and negative electrode lug 221 are respectively located at the two ends of the first diaphragm 230. In order to improve the universality of the pole piece short circuit test device 100, the setting position of the first probe 141 on the lifting platform 110 is adjustable; the setting position of the second probe 142 on the lifting platform 110 is adjustable. The operator can select appropriate first probe 141 and second probe 142 according to the model of the pole piece 200 to be detected and the setting position of the positive electrode lug 211 and the negative electrode lug 221 thereon, and install them on the corresponding position of the lifting platform 110, so as to ensure the accuracy of the detection result.
[0062] Specifically, the lifting platform 110 is provided with a plurality of first mounting positions and a plurality of second mounting positions, the pressing plate 120 is provided with a first through hole 121 corresponding to each first mounting position and a second through hole 122 corresponding to each second mounting position, the first probe 141 is selectively fixed to the first mounting position and can slide through the first through hole 121, and the second probe 142 is selectively fixed to the second mounting position and can slide through the second through hole 122, so that the positions of the first probe 141 and the second probe 142 on the lifting platform 110 are adjustable. In the embodiment, the first probe 141 can be connected to the first mounting position through a first fastening screw, and the second probe 142 can be connected to the second mounting position through a second fastening screw, which is convenient for connection and disassembly. Of course, in other embodiments, the first probe 141 and the second probe 142 can also be connected to the first mounting position and the second mounting position through other ways such as clamping, inserting and the like, and the embodiment is not limited in this regard.
[0063] It can be understood that when the first probe 141 and the second probe 142 are installed on the pressing plate 120, a plurality of first mounting positions and a plurality of second mounting positions can also be arranged on the pressing plate 120, and the above-mentioned effects can also be achieved.
[0064] The above embodiments only illustrate the basic principles and characteristics of the present application, and the present application is not limited by the above embodiments. Various changes and modifications can be made without departing from the spirit and scope of the present application, and these changes and modifications all fall within the scope of the present application. The scope of protection of the present application is defined by the appended claims and their equivalents.
Claims
1. A lamination short test apparatus, characterized by, The application relates to a laminated sheet short-circuit testing device. The laminated sheet short-circuit testing device comprises a lifting platform (110) capable of lifting in a vertical direction; a pressing plate (120) elastically connected to the lifting platform (110), which can drive the pressing plate (120) to move when the lifting platform (110) moves in the vertical direction; the pressing plate (120) can obtain a to-be-stacked laminated sheet and place the to-be-stacked laminated sheet on the top of an original laminated sheet (2001), thereby forming a current laminated sheet (2002); a detection probe group is arranged on the lifting platform (110) or the pressing plate (120), the detection probe group comprises a first probe (141) and a second probe (142), and when the pressing plate (120) places the to-be-stacked laminated sheet on the original laminated sheet (2001), the first probe (141) and the second probe (142) can be electrically connected with a positive electrode lug (211) and a negative electrode lug (221) of the current laminated sheet (2002) respectively, wherein one of the positive electrode lug (211) and the negative electrode lug (221) is an electrode lug on the to-be-stacked laminated sheet, and the other is an electrode lug on the original laminated sheet (2001) which is opposite in polarity to the electrode lug on the to-be-stacked laminated sheet. The laminated sheet short-circuit testing device further comprises a guide assembly (150) arranged between the lifting platform (110) and the pressing plate (120) to guide the relative movement between the two. The guide assembly (150) comprises:
2. The lamination short test apparatus of claim 1, wherein a guide sleeve (152) fixed to the pressing plate (120); 3. The lamination short test apparatus of claim 2, wherein a guide column (151) having one end fixed to the lifting platform (110) and the other end penetrating the guide sleeve (152). The guide assembly (150) further comprises an elastic member (153) sleeved on the guide column (151) and having two ends connected to the lifting platform (110) and the guide sleeve (152) respectively. The pressing plate (120) is provided with a guide hole (123) opposite to the center hole of the guide sleeve (152), the guide column (151) penetrates the guide sleeve (152) and the guide hole (123) in sequence, and one end of the guide column (151) away from the lifting platform (110) is connected with a suction member (130) capable of adsorbing the to-be-stacked laminated sheet.
4. The lamination short test apparatus of claim 3, wherein The guide assembly (150) is in an array distribution between the pressing plate (120) and the lifting platform (110).
5. The lamination short test apparatus of claim 3, wherein A limiting member (160) is further arranged between the lifting platform (110) and the pressing plate (120) to limit the maximum displacement of the pressing plate (120).
6. The lamination short test apparatus of claim 2, wherein The pressing plate (120) is provided with a first through hole (121), one end of the first probe (141) is fixed to the lifting platform (110), and the other end penetrates the first through hole (121) slidingly; and / or 7. The lamination short test apparatus of claim 1, wherein 8. The lamination short test apparatus according to any one of claims 1 to 7, characterized by The pressing plate (120) is provided with a second through hole (122), one end of the second probe (142) is fixed on the lifting platform (110), and the other end is slidably arranged in the second through hole (122).
9. The lamination short test apparatus according to any one of claims 1 to 7, characterized by The setting position of the first probe (141) on the lifting platform (110) or the pressing plate (120) is adjustable; and / or The setting position of the second probe (142) on the lifting platform (110) or the pressing plate (120) is adjustable.
10. The lamination short test apparatus according to any one of claims 1 to 7, characterized by The pressing plate (120) is made of insulating material; or the lower surface of the pressing plate (120) is provided with an insulating layer. The pressing plate (120) is made of insulating material; or the lower surface of the pressing plate (120) is provided with an insulating layer.