Temporary storage device for chip verification test

By installing detachable limiting covers and limiting strips on the chip storage tray, the problems of inaccurate test results and low efficiency caused by vibration or impact in small-batch chip sample testing are solved, achieving higher testing accuracy and operational efficiency.

CN223619173UActive Publication Date: 2025-12-02SHENZHEN COMOS INTELLIGENT TECHNOLOGY CO LTD
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Patent Information

Application Number
CN202423291717.4
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-12-27
Publication Date
2025-12-02
Estimated Expiration
2034-12-27

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Abstract

The utility model relates to the field of chip production detection equipment, and discloses a temporary storage device for a chip verification test, which comprises a chip storage tray, chip storage acupoints are uniformly arranged on the chip storage tray in a longitudinal and transverse manner, a detachable pick-and-place limiting cover is arranged on the chip storage tray, and the pick-and-place limiting cover is provided with a first surface and a second surface which are opposite up and down. The second face of the taking and placing limiting cover abuts against the face, provided with the chip storage acupoints, of the chip storage tray, and chip taking and placing holes vertically extending to penetrate through the first face are formed in the positions, corresponding to the chip storage acupoints, of the second face of the taking and placing limiting cover. According to the chip storage tray, the situation that chips in the chip storage tray jump out or fall off or chips in different chip storage acupoints are mixed when the chip storage tray is subjected to accidental vibration and collision is effectively avoided, limiting protection on the chips is increased, the influence of accidental situations on test is reduced, and the accuracy of test detection is improved.
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Description

Technical Field

[0001] This utility model relates to the field of chip production and testing equipment, and in particular to a temporary storage device for chip verification testing. Background Technology

[0002] In chip manufacturing, it is often necessary to conduct detailed tests on the performance of small batches of chip samples to inform subsequent processing decisions. These small batches typically consist of only tens to hundreds of chips, stored using standard chip storage trays. These trays have evenly spaced chip storage slots, generally holding around one hundred chips (e.g., 8 slots per row, 12 per column, totaling 96). To facilitate automated processing, the chip storage slots on the trays are generally shallow, around 30µm, while the packaged chip thickness is typically around 10µm. During testing, if the chip storage tray is accidentally bumped (testers must be extremely careful when placing the tray on the test bench; excessive speed or dropping it too quickly can cause chips to misalign), chips in the tray can easily jump out of their designated slots. This can lead to chips from adjacent rows becoming mixed up, falling to the ground, or getting into gaps in the testing equipment. Vibrations and drops can damage the chips, affecting the test results. If chips have already been tested and placed separately, this mixing can also affect subsequent retesting. Because the testing is done in small batches, even damage from vibrations or drops to individual chips, or mixing of chips with different performance characteristics, can significantly impact the overall test results. Therefore, testers must be extremely careful, resulting in lower testing efficiency. Over long-term testing, chip jumping will inevitably occur. Utility Model Content

[0003] This invention provides a temporary storage device for chip verification testing, which solves the problem mentioned in the background art that when testing small batches of chip samples, the testing personnel need to be extremely careful, the testing efficiency is low, and chip jumps inevitably occur during long-term testing, which adversely affect the accuracy of chip testing results.

[0004] The technical solution adopted by this utility model to solve its technical problem is: a temporary storage device for chip verification testing, including a chip storage tray. Chip storage slots are evenly arranged longitudinally and transversely on the chip storage tray. A detachable pick-and-place limiting cover is provided on the chip storage tray. The pick-and-place limiting cover has a first side and a second side facing each other. The second side of the pick-and-place limiting cover abuts against the side of the chip storage tray where the chip storage slots are located. A chip pick-and-place hole extending vertically through the first side is provided on the second side of the pick-and-place limiting cover at a position corresponding to the chip storage slot. This effectively prevents chips from jumping out, falling out, or getting mixed up with chips in different chip storage slots when the chip storage tray is subjected to accidental vibration or impact. It increases the limiting protection of chips, reduces the impact of accidental situations on testing, and improves the accuracy of testing.

[0005] Furthermore, the second side of the pick-and-place limiting cover elastically abuts against the side of the chip storage tray where the chip storage slots are located. This prevents the chip from getting stuck in the gap between the two surfaces and also facilitates the pick-and-place operation.

[0006] Furthermore, the pick-and-place limiting cover is equipped with an anti-detachment limiting structure to prevent the chip from detaching from the chip pick-and-place hole. This further limits the chip during experimental operations, preventing it from falling out of the chip pick-and-place hole.

[0007] Furthermore, the thickness of the pick-and-place limiting cover is less than the length of the short side of the chip in the chip storage cavity. This reduces the distance the chip moves within the chip storage cavity and chip pick-and-place hole during the pick-and-place process, thus reducing the difficulty of operation.

[0008] Furthermore, the anti-detachment limiting structure includes multiple independently arranged limiting strips. Each limiting strip has a movable connecting end and a snap-fit ​​end at both ends. The chip placement holes evenly arranged on the chip placement limiting cover have connecting parts and snap-fit ​​parts on both sides of the horizontal row. The movable connecting end of the limiting strip is movably connected to the connecting part. The snap-fit ​​end of the limiting strip rotates around the movable connecting end and engages with the corresponding snap-fit ​​part. The limiting strip has multiple limiting parts on its main body. After the snap-fit ​​end of the limiting strip engages with the corresponding snap-fit ​​part, the multiple limiting parts on its main body correspond to the multiple horizontally arranged chip placement holes and limit the chip placement in the chip placement holes. The structure is simple, the operation is convenient, and it effectively limits the chip placement in the chip storage acupoint.

[0009] Furthermore, after the latching end of the limiting strip is engaged with the corresponding latching part, the distance between the lower surface of the limiting part and the bottom of the chip storage cavity is less than half the length of the short side of the chip inside the chip storage cavity. This reduces the impact of accidental vibrations and impacts on the chip inside the chip storage cavity, improving detection accuracy.

[0010] Furthermore, both the main body and the limiting part of the limiting strip are made of transparent material. This facilitates the corresponding observation, placement, counting, and verification operations.

[0011] Furthermore, the limiting part is made of an elastic material, and the corners at the end corresponding to the chip are all rounded. When the limiting part comes into contact with the chip in the chip storage cavity, it does not cause damage to the outer surface of the chip, and can reduce the impact of accidental vibrations and bumps on the chip in the chip storage cavity.

[0012] Furthermore, the limiting part is cylindrical. This reduces material consumption and the overall weight of the device, and makes it easier to observe the chip within the chip storage area. Attached Figure Description

[0013] Figure 1 This is a front view diagram showing the upper and lower parts of the detachable limit cover and the chip storage tray.

[0014] Figure 2 This is a front view diagram showing the combined state of the retrieval limit cover and the chip storage tray.

[0015] The markings in the figure are as follows: chip storage tray 100, chip storage acupoint 110, pick-up and put-out limiting cover 200, first surface 201, chip pick-up and put-out hole 210, snap fastener 211, snap fastener structure 220, limiting strip 230, movable connecting end 231, snap fastener end 232, and limiting part 233. Detailed Implementation

[0016] The present invention will be further described below with reference to the accompanying drawings and specific embodiments.

[0017] like Figure 1 The illustrated temporary storage device for chip verification testing includes a chip storage tray 100. Chip storage slots 110 are evenly arranged on the chip storage tray 100 in both directions. A detachable pick-and-place limiting cover 200 is provided on the chip storage tray 100. The pick-and-place limiting cover 200 has a first surface 201 and a second surface that are vertically opposite each other. The second surface of the pick-and-place limiting cover 200 abuts against the side of the chip storage tray 100 where the chip storage slots 110 are located. A chip pick-and-place hole 210 is provided on the second surface of the pick-and-place limiting cover 200 at a position corresponding to the chip storage slots 110, extending vertically through the first surface 201. In this specific embodiment, the pick-and-place limiting cover 200 and the chip storage tray 100 are provided with two snap-fit ​​structures 220 in each of the four directions to ensure stability during use and prevent detachment. In specific implementation, more or fewer snap-fit ​​structures can be set according to the actual situation. Alternatively, a docking slot can be set on one side of the pick-and-place limiting cover 200 and a snap-fit ​​structure can be set on the other side to facilitate disassembly and assembly. The structure is simple and easy to operate.

[0018] The pick-and-place limiting cover 200 further limits the chips in the chip storage slots 110, effectively preventing the chips inside the chip storage tray 100 from jumping out, falling out, or getting mixed up with chips in different chip storage slots 110 when subjected to accidental vibrations and bumps. This increases the limiting protection for the chips, reduces the impact of accidents on the test, and improves the accuracy of the test.

[0019] Based on the above, such as Figure 1 As shown, the second surface of the pick-and-place limiting cover 200 elastically abuts against the side of the chip storage tray 100 where the chip storage acupoints 110 are located. In this specific embodiment, the pick-and-place limiting cover 200 is made of a high-toughness plastic material, and its second surface is provided with an elastic sealing layer made of elastic rubber material. In specific implementations, the pick-and-place limiting cover 200 can also be made directly of a plastic material with high elasticity and toughness. The second surface of the pick-and-place limiting cover 200 is in close contact with the corresponding surface of the chip storage tray 100 where the chip storage acupoints 110 are located, without gaps, preventing the chip from getting stuck in the gap between the two and facilitating the pick-and-place operation.

[0020] Based on the above, such as Figure 1 As shown, the pick-and-place limiting cover 200 is provided with an anti-detachment limiting structure to prevent the chip from detaching from the chip pick-and-place hole 210. This further limits the chip during experimental operations, preventing it from detaching from the chip pick-and-place hole 210 and falling out.

[0021] Based on the above, such as Figure 1 As shown, the thickness of the pick-and-place limiting cover 200 is less than the length of the short side of the chip in the chip storage cavity 110. This reduces the distance the chip moves within the chip storage cavity 110 and the chip pick-and-place hole 210 during the pick-and-place process, thus reducing the difficulty of operation.

[0022] Based on the above, such as Figure 1 and Figure 2 As shown, the anti-detachment limiting structure includes multiple independently set limiting strips 230. The two ends of the main body of the limiting strip 230 are respectively provided with a movable connecting end 231 and a snap-fit ​​end 232. The chip pick-up and put-down holes 210 evenly arranged on the pick-up and put-down limiting cover 200 are provided with connecting parts and snap-fit ​​parts 211 on both sides of the horizontal row. The movable connecting end 231 of the limiting strip 230 is movably connected to the connecting part. After the snap-fit ​​end 232 of the limiting strip 230 rotates around the movable connecting end 231, it snaps into the corresponding snap-fit ​​part 211. The main body of the limiting strip 230 is provided with multiple limiting parts 233. After the snap-fit ​​end 232 of the limiting strip 230 snaps into the corresponding snap-fit ​​part 211, the multiple limiting parts 233 on its main body correspond to the multiple chip pick-up and put-down holes 210 arranged horizontally and limit the chip in the chip pick-up and put-down hole 210.

[0023] In practical implementation, each row of chip pick-and-place holes 210 is equipped with a corresponding limiting strip 230. In actual testing, chips of the same type are typically stored in the same row of chip storage slots 110 on the chip storage tray 100. During operation, the limiting strip 230 can be opened or closed to release or complete the restriction of chips within the corresponding row of chip storage slots 110 on the chip storage tray 100, further preventing chips from jumping and getting mixed up in adjacent rows during operation.

[0024] In this specific embodiment, the movable connecting end 231 of the limiting strip 230 and the connecting part on the pick-up and place limiting cover 200 are an integral structure made of a tough plastic material. During testing, high-frequency operation is not required as in batch testing, and the foldable and deformable plastic connecting structure of the integral structure is sufficient to meet the needs. In specific implementations, the movable connecting end 231 of the limiting strip 230 and the connecting part on the pick-up and place limiting cover 200 can also be designed as an assembled link structure or a rotatable structure, depending on actual requirements. The structure is simple, the operation is convenient, and it effectively limits the chip position in the chip storage cavity 110.

[0025] Based on the above, such as Figure 1 and Figure 2 As shown, after the latching end 232 of the limiting strip 230 is engaged with the corresponding latching part 211, the distance between the lower surface of the limiting part 233 and the bottom of the chip storage cavity 110 is less than half the length of the short side of the chip inside the chip storage cavity 110. In this specific embodiment, after the latching end 232 of the limiting strip 230 is engaged with the corresponding latching part 211, the lower surface of the limiting part 233 is located on the upper surface of the chip storage cavity 110. This reduces the range of motion of the chip in the chip storage cavity 110, preventing the chip inside the chip storage cavity 110 from flipping when subjected to accidental vibrations and impacts while the limiting strip is in the limiting state, thereby reducing the impact of accidental vibrations and impacts on the chip inside the chip storage cavity 110 and improving detection accuracy.

[0026] Based on the above, such as Figure 1 and Figure 2 As shown, both the main body and the limiting part 233 of the limiting strip 230 are made of transparent material. In specific implementation, the temporary storage position and quantity of chips in the chip storage acupoints 110 on the chip storage tray 100 can be observed through the main body and the limiting part 233 of the transparent limiting strip 230, which facilitates the corresponding observation, retrieval, counting, and verification operations.

[0027] Based on the above, such as Figure 1 and Figure 2As shown, the limiting part 233 is made of elastic material, and the corners at the end corresponding to the chip are all rounded. When the limiting part 233 comes into contact with the chip in the chip storage cavity 110, it does not damage the outer surface of the chip, and can reduce the impact of accidental vibrations and bumps on the chip in the chip storage cavity 110.

[0028] Based on the above, such as Figure 1 and Figure 2 As shown, the limiting part 233 is cylindrical. This reduces material consumption and the overall weight of the device, and makes it easier to observe the chip within the chip storage cavity 110.

[0029] The specific embodiments described above further illustrate the purpose, technical solution, and beneficial effects of this utility model. It should be understood that the above descriptions are merely specific embodiments of this utility model and are not intended to limit this utility model. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this utility model should be included within the protection scope of this utility model.

Claims

1. A temporary storage device for chip verification testing, comprising a chip storage tray (100), wherein chip storage slots (110) are evenly arranged longitudinally and transversely on the chip storage tray (100), characterized in that... The chip storage tray (100) is provided with a detachable pick-and-place limiting cover (200). The pick-and-place limiting cover (200) has a first side (201) and a second side that are opposite each other. The second side of the pick-and-place limiting cover (200) abuts against the side of the chip storage tray (100) where the chip storage acupoint (110) is located. The second side of the pick-and-place limiting cover (200) and the chip storage acupoint (110) are provided with a chip pick-and-place hole (210) that extends vertically through the first side (201) at the corresponding position.

2. The temporary storage device for chip verification testing according to claim 1, characterized in that: The second side of the pick-and-place limiting cover (200) elastically abuts against the side of the chip storage tray (100) where the chip storage acupoints (110) are located.

3. The temporary storage device for chip verification testing according to claim 1, characterized in that: The pick-and-place limiting cover (200) is provided with an anti-detachment limiting structure that prevents the chip from detaching from the chip pick-and-place hole (210).

4. The temporary storage device for chip verification testing according to claim 3, characterized in that: The thickness of the pick-and-place limiting cover (200) is less than the length of the short side of the chip in the chip storage acupoint (110).

5. A temporary storage device for chip verification testing according to claim 3, characterized in that: The anti-detachment limiting structure includes multiple independently arranged limiting strips (230). Each limiting strip (230) has a movable connecting end (231) and a snap-fit ​​end (232) at both ends. The chip pick-up and drop-off holes (210) evenly arranged on the pick-up and drop-off limiting cover (200) have connecting parts and snap-fit ​​parts (211) on both sides of the horizontal row. The movable connecting end (231) of the limiting strip (230) is movably connected to the connecting part. After the snap-on end (232) rotates around the movable connecting end (231), it snaps onto the corresponding snap-on part (211). The main body of the limiting strip (230) is provided with multiple limiting parts (233). After the snap-on end (232) of the limiting strip (230) snaps onto the corresponding snap-on part (211), the multiple limiting parts (233) on its main body correspond to the multiple chip pick-up and drop holes (210) arranged laterally and limit the chip in the chip pick-up and drop hole (210).

6. A temporary storage device for chip verification testing according to claim 5, characterized in that: After the buckle end (232) of the limiting strip (230) is fastened to the corresponding buckle part (211), the distance between the lower surface of the limiting part (233) and the bottom of the chip storage acupoint (110) is less than half the length of the short side of the chip inside the chip storage acupoint (110).

7. A temporary storage device for chip verification testing according to claim 5, characterized in that: The main body and the limiting part (233) of the limiting strip (230) are both made of transparent material.

8. A temporary storage device for chip verification testing according to claim 7, characterized in that: The limiting part (233) is made of elastic material and the corners of the end corresponding to the chip are all set as smooth transition surfaces.

9. A temporary storage device for chip verification testing according to claim 7, characterized in that: The limiting part (233) is cylindrical.