Semiconductor test and inspection impact control system

By introducing a combined structure of buffer spring rod, damping shock absorber rod and damping shock absorber into the semiconductor testing and inspection shock control system, the influence of vibration on the test data is eliminated, and the system's operating efficiency is improved by cooling with a fan, thus solving the problem of inaccurate test data in the prior art.

CN223622551UActive Publication Date: 2025-12-02ANHUI LIANGLIANG ELECTRONIC TECH CO LTD
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Patent Information

Application Number
CN202422814859.8
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-11-19
Publication Date
2025-12-02
Estimated Expiration
2034-11-19

AI Technical Summary

Technical Problem

Existing test and inspection shock control systems lack buffering and shock absorption functions during use, causing external vibrations to affect the accuracy of test data.

Method used

The system employs a combination structure of buffer spring rod, damping shock absorber rod, and damping shock absorber. Vibration force is eliminated through the movement of sliding sleeve and positioning sleeve, and heat is dissipated through a fan to improve system operating efficiency.

Benefits of technology

It effectively eliminates the impact of vibration on the detection data, improves the accuracy of detection, and enhances the system's operating efficiency through heat dissipation.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a semiconductor test inspection impact control system which comprises a bottom plate, the middle end of the top of the bottom plate is fixedly connected with an inspection impact control system body, the left side and the right side of the top of the bottom plate are fixedly connected with protective boxes, the two sides of an inner cavity of each protective box are fixedly connected with buffer spring rods, and sliding sleeves are arranged on the surfaces of the buffer spring rods. The bottom of the sliding sleeve is fixedly connected with a moving roller, the top of the sliding sleeve is fixedly connected with a positioning sleeve through a connecting rod, and the outer side of the positioning sleeve is fixedly connected with a damping rod. Vibration force is transmitted to the positioning sleeve, the positioning sleeve moves towards the outer side to drive the sliding sleeve to move, the sliding sleeve extrudes the buffer spring rod to eliminate the vibration force, the damping rod is extruded while the positioning sleeve moves towards the outer side, and the damping rod stretches towards an inner cavity of the damping shock absorber and extrudes the damping spring. And the vibration force is eliminated again through the deformation of the damping spring.
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Description

Technical Field

[0001] This utility model relates to the field of semiconductor technology, specifically to a semiconductor testing and inspection impact control system. Background Technology

[0002] Semiconductor refers to a material whose conductivity at room temperature is between that of a conductor and an insulator.

[0003] Semiconductors are used in integrated circuits, consumer electronics, communication systems, photovoltaic power generation, lighting, high-power power conversion, and other fields. For example, diodes are devices made using semiconductors.

[0004] From both a technological and economic development perspective, semiconductors are of paramount importance. The core components of most electronic products, such as computers, mobile phones, and digital recorders, are closely related to semiconductors.

[0005] Common semiconductor materials include silicon, germanium, and gallium arsenide, with silicon being the most influential in the application of various semiconductor materials.

[0006] However, existing test and inspection shock control systems lack buffering and shock absorption functions in actual use. This means that external factors can cause vibrations that affect the test data, leading to inaccurate test data. To address this, we propose a semiconductor test and inspection shock control system. Utility Model Content

[0007] The purpose of this invention is to provide a semiconductor testing and inspection shock control system to solve the problems mentioned in the background art.

[0008] To achieve the above objectives, this utility model provides the following technical solution: a semiconductor testing and inspection impact control system, comprising a base plate, an inspection impact control system body fixedly connected to the middle of the top of the base plate, protective housings fixedly connected to the left and right sides of the top of the base plate, buffer spring rods fixedly connected to both sides of the inner cavity of the protective housings, sliding sleeves provided on the surface of the buffer spring rods, movable rollers fixedly connected to the bottom of the sliding sleeves, positioning sleeves fixedly connected to the top of the sliding sleeves via connecting rods, damping shock absorbers fixedly connected to the outer side of the positioning sleeves, damping shock absorber springs provided on the surface of the damping shock absorber rods, damping shock absorbers movably connected to the outer side of the damping shock absorber rods, and one side of the damping shock absorber fixedly connected to the inner cavity of the protective housing.

[0009] Preferably, a battery box is fixedly connected to the bottom of the outer side of the protective box by bolts, and a storage battery is fixedly connected to the inner cavity of the battery box by bolts. A charging port is provided at the middle of one side of the battery box, and the output end of the charging port is unidirectionally electrically connected to the input end of the storage battery.

[0010] Preferably, a PLC controller is fixedly connected to the top of the outer side of the protective enclosure by bolts, and the surface of the PLC controller is provided with control buttons.

[0011] Preferably, a fan is fixedly installed on the top of the test impact control system body by bolts, a fixed sleeve is fixedly connected to the output end of the fan by a pipe, an exhaust hood is fixedly connected to the inner side of the fixed sleeve by a pipe, a fixed rod is fixedly connected to both sides of the fixed sleeve, a fixed block is fixedly connected to the outer side of the fixed rod, and the surface of the fixed block is fixedly connected to the surface of the protective box.

[0012] Preferably, a shock-absorbing rubber pad is fixedly connected to the inner side of the positioning sleeve, and the surface of the shock-absorbing rubber pad is in contact with the surface of the test impact control system body.

[0013] Preferably, a heat dissipation hole is provided on one side of the test impact control system body, and a dustproof mesh is provided inside the heat dissipation hole.

[0014] Compared with the prior art, the beneficial effects of this utility model are as follows:

[0015] 1. This utility model transmits vibration force to the positioning sleeve, which moves outward and drives the sliding sleeve to move. The sliding sleeve squeezes the buffer spring rod to eliminate the vibration force. At the same time as the positioning sleeve moves outward, it squeezes the damping shock absorber rod. The damping shock absorber rod extends and retracts into the inner cavity of the damping shock absorber and squeezes the damping shock absorber spring. The damping shock absorber spring deforms and eliminates the vibration force again.

[0016] 2. This utility model starts working by starting the fan, which blows air into the inner cavity of the fixed sleeve. The fixed sleeve guides the airflow to the inner cavity of the exhaust hood. The airflow through the exhaust hood can dissipate heat from the test impact control system body, thereby improving the operating efficiency of the test impact control system body. Attached Figure Description

[0017] Figure 1 This is a schematic diagram of the structure of this utility model;

[0018] Figure 2 This is a schematic diagram of the battery structure of this utility model;

[0019] Figure 3 This is a schematic diagram of the buffer spring rod structure of this utility model.

[0020] In the diagram: 1. Base plate; 2. Protective enclosure; 3. Fixing block; 4. Fixing sleeve; 5. Fixing rod; 6. Positioning sleeve; 7. Shock-absorbing rubber pad; 8. Inspection impact control system body; 9. Fan; 10. Damping shock absorber rod; 11. Damping shock absorber; 12. Charging port; 13. Battery; 14. Battery box; 15. PLC controller; 16. Damping shock absorber spring; 17. Exhaust hood; 18. Buffer spring rod; 19. Moving roller; 20. Sliding sleeve. Detailed Implementation

[0021] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0022] The components of this application, namely: 1. base plate; 2. protective housing; 3. fixing block; 4. fixing sleeve; 5. fixing rod; 6. positioning sleeve; 7. shock-absorbing rubber pad; 8. inspection impact control system body; 9. fan; 10. damping shock absorber rod; 11. damping shock absorber; 12. charging port; 13. storage battery; 14. battery box; 15. PLC controller; 16. damping shock absorber spring; 17. exhaust hood; 18. buffer spring rod; 19. moving roller; 20. sliding sleeve, are all general standard parts or parts known to those skilled in the art. Their structure and principle can be learned by those skilled in the art through technical manuals or conventional experimental methods. Example 1:

[0023] Please see Figures 1-3 The following technical solution is provided, specifically disclosing: a semiconductor testing and inspection impact control system, including a base plate 1, an inspection impact control system body 8 fixedly connected to the middle of the top of the base plate 1, protective housings 2 fixedly connected to the left and right sides of the top of the base plate 1, buffer spring rods 18 fixedly connected to the two sides of the inner cavity of the protective housing 2, a sliding sleeve 20 provided on the surface of the buffer spring rod 18, a movable roller 19 fixedly connected to the bottom of the sliding sleeve 20, a positioning sleeve 6 fixedly connected to the top of the sliding sleeve 20 through a connecting rod, a damping shock absorber 10 fixedly connected to the outer side of the positioning sleeve 6, a damping shock absorber spring 16 provided on the surface of the damping shock absorber 10, a damping shock absorber 11 movably connected to the outer side of the damping shock absorber 10, and one side of the damping shock absorber 11 fixedly connected to the inner cavity of the protective housing 2;

[0024] In actual use, the vibration force is transmitted to the positioning sleeve 6, which moves outward and drives the sliding sleeve 20 to move. The sliding sleeve 20 squeezes the buffer spring rod 18 to eliminate the vibration force. At the same time as the positioning sleeve 6 moves outward, it squeezes the damping shock absorber rod 10. The damping shock absorber rod 10 extends and retracts into the inner cavity of the damping shock absorber 11 and squeezes the damping shock absorber spring 16. The damping shock absorber spring 16 deforms to eliminate the vibration force again. Example 2:

[0025] Please see Figure 1 and Figure 2 The following technical solution is provided, specifically: A battery box 14 is bolted to the bottom of the outer side of the protective housing 2; a storage battery 13 is bolted to the inner cavity of the battery box 14; a charging port 12 is provided at the middle of one side of the battery box 14; the output end of the charging port 12 is unidirectionally electrically connected to the input end of the storage battery 13; a PLC controller 15 is bolted to the top of the outer side of the protective housing 2; control buttons are provided on the surface of the PLC controller 15; and a fan is bolted to the top of the impact control system body 8. The output end of the fan 9 is fixedly connected to a fixed sleeve 4 through a pipe. The inner side of the fixed sleeve 4 is fixedly connected to an exhaust hood 17 through a pipe. Fixed rods 5 are fixedly connected to both sides of the fixed sleeve 4. Fixed blocks 3 are fixedly connected to the outer side of the fixed rods 5. The surface of the fixed blocks 3 is fixedly connected to the surface of the protective box 2. The inner side of the positioning sleeve 6 is fixedly connected to a shock-absorbing rubber pad 7. The surface of the shock-absorbing rubber pad 7 is in contact with the surface of the inspection impact control system body 8. A heat dissipation hole is opened on one side of the inspection impact control system body 8. A dustproof net is installed in the inner cavity of the heat dissipation hole.

[0026] In actual use, the fan 9 is started to work, and the fan 9 blows air into the inner cavity of the fixed sleeve 4. The fixed sleeve 4 guides the air to the inner cavity of the exhaust hood 17. The air blown by the exhaust hood 17 can dissipate heat from the test impact control system body 8 and improve the operating efficiency of the test impact control system body 8.

[0027] In use: The vibration force is transmitted to the positioning sleeve 6, which moves outward and drives the sliding sleeve 20 to move. The sliding sleeve 20 squeezes the buffer spring rod 18 to eliminate the vibration force. At the same time as the positioning sleeve 6 moves outward, it squeezes the damping shock absorber rod 10. The damping shock absorber rod 10 extends and retracts into the inner cavity of the damping shock absorber 11 and squeezes the damping shock absorber spring 16. The damping shock absorber spring 16 deforms to eliminate the vibration force again.

[0028] It is important to note that the constructions and arrangements of this application shown in several different exemplary embodiments are merely illustrative. Although only a few embodiments are described in detail in this disclosure, those who consult this disclosure will readily understand that many modifications are possible (e.g., changes in the size, dimensions, structure, shape and proportion of various elements, as well as parameter values ​​(e.g., temperature, pressure, etc.), mounting arrangements, use of materials, color, orientation, etc.) without substantially departing from the novel teachings and advantages of the subject matter described in this application). For example, an element shown as integrally formed may be composed of multiple parts or elements, the position of elements may be inverted or otherwise altered, and the nature or number or position of discrete elements may be changed or altered. Therefore, all such modifications are intended to be included within the scope of this utility model. The order or sequence of any process or method steps may be changed or reordered according to alternative embodiments. In the claims, any "device plus function" clause is intended to cover the structure described herein that performs the function, and not only structural equivalents but also equivalent structures. Without departing from the scope of this invention, other substitutions, modifications, alterations, and omissions may be made in the design, operation, and arrangement of the exemplary embodiments. Therefore, this invention is not limited to the specific embodiments, but extends to various modifications that still fall within the scope of the appended claims.

[0029] Furthermore, in order to provide a concise description of exemplary embodiments, not all features of actual embodiments (i.e., those features that are not relevant to the best mode of carrying out the present invention as currently considered, or those features that are not relevant to implementing the present invention) may be omitted.

[0030] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this utility model, and are not intended to limit the scope of protection of this utility model. Although this utility model has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of this utility model without departing from the essence and scope of the technical solutions of this utility model.

Claims

1. A semiconductor testing and inspection shock control system, comprising a base plate (1), characterized in that: The impact control system body (8) is fixedly connected to the middle of the top of the base plate (1). Protective housings (2) are fixedly connected to the left and right sides of the top of the base plate (1). Buffer spring rods (18) are fixedly connected to both sides of the inner cavity of the protective housing (2). Sliding sleeves (20) are provided on the surface of the buffer spring rods (18). Moving rollers (19) are fixedly connected to the bottom of the sliding sleeves (20). Positioning sleeves (6) are fixedly connected to the top of the sliding sleeves (20) through connecting rods. Damping shock absorbers (10) are fixedly connected to the outer side of the positioning sleeves (6). Damping shock absorbers (16) are provided on the surface of the damping shock absorbers (10). Damping shock absorbers (11) are movably connected to the outer side of the damping shock absorbers (10). One side of the damping shock absorbers (11) is fixedly connected to the inner cavity of the protective housing (2).

2. The semiconductor testing and inspection shock control system according to claim 1, characterized in that: The bottom of the outer side of the protective box (2) is fixedly connected to a battery box (14) by bolts. The inner cavity of the battery box (14) is fixedly connected to a storage battery (13) by bolts. A charging port (12) is provided at the middle of one side of the battery box (14). The output end of the charging port (12) is unidirectionally electrically connected to the input end of the storage battery (13).

3. The semiconductor testing and inspection shock control system according to claim 1, characterized in that: The top of the outer side of the protective box (2) is fixedly connected to a PLC controller (15) by bolts, and the surface of the PLC controller (15) is provided with control buttons.

4. The semiconductor testing and inspection shock control system according to claim 1, characterized in that: The top of the test impact control system body (8) is fixedly installed with a fan (9) by bolts. The output end of the fan (9) is fixedly connected to a fixed sleeve (4) by a pipe. The inner side of the fixed sleeve (4) is fixedly connected to an exhaust hood (17) by a pipe. The two sides of the fixed sleeve (4) are fixedly connected to fixed rods (5). The outer side of the fixed rods (5) is fixedly connected to a fixed block (3). The surface of the fixed block (3) is fixedly connected to the surface of the protective box (2).

5. The semiconductor testing and inspection shock control system according to claim 1, characterized in that: The inner side of the positioning sleeve (6) is fixedly connected to a shock-absorbing rubber pad (7), and the surface of the shock-absorbing rubber pad (7) is in contact with the surface of the test impact control system body (8).

6. The semiconductor testing and inspection shock control system according to claim 1, characterized in that: The test impact control system body (8) has a heat dissipation hole on one side, and the inner cavity of the heat dissipation hole is provided with a dustproof mesh.