Device for measuring surface shape and transmitted wavefront of thin plane mirror

By using a dovetail groove structure and a chiral threaded guide rail in conjunction with a V-shaped clamp and velvet protection, the problem of unstable fixation in the testing of thin flat mirror surfaces and transmission wavefronts is solved, improving measurement accuracy and efficiency, and making it suitable for lenses of various specifications.

CN223623589UActive Publication Date: 2025-12-02FUJIAN CASTECH CRYSTALS
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Patent Information

Application Number
CN202520234376.2
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-02-14
Publication Date
2025-12-02
Estimated Expiration
2035-02-14

AI Technical Summary

Technical Problem

Existing technologies are unstable when measuring the shape of thin planar mirrors and transmitted wavefronts, resulting in large test errors and potential stress effects. It is also difficult to guarantee the light transmission aperture, leading to low test efficiency.

Method used

The system employs a dovetail groove structure and a guide rail with chiral threads, combined with V-shaped clamps and velvet protection, to achieve stable clamping of the lens. The lens orientation can be adjusted by rotating and swinging the platform to ensure testing accuracy.

Benefits of technology

It improves the measurement accuracy of thin planar mirror surface shape and transmitted wavefront, simplifies the operation process, reduces test errors and stress effects, and is suitable for testing lenses of different specifications.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to a device for measuring the surface shape and transmitted wavefront of a thin plane mirror. The system device comprises a rotating platform, a swinging platform, a dovetail groove main body, a guide rail, a guide rail sliding block, a supporting rod and a V-shaped clamp. The utility model provides the device for measuring the surface shape and the transmission wavefront of the thin plane mirror, the position of the lens can be accurately adjusted by using the device, the lens is prevented from toppling and deforming due to stress, and the accuracy of a measurement result is improved while the lens is protected.
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Description

Technical Field

[0001] This invention belongs to the field of optical testing, and more specifically, it relates to a device for measuring the shape of a thin planar mirror and the transmitted wavefront. Background Technology

[0002] A plane mirror is an optical component made of optical glass. Its structure is typically prism or cylinder, with one or both surfaces polished. Plane mirrors with a thickness of less than 2mm are generally called thin plane mirrors. Depending on the materials, processing, and coatings used, plane mirrors can be manufactured into various commonly used optical components such as reticles, filters, reflectors, and compensating plates, and are commonly used in various optical systems and instruments.

[0003] Plane mirrors require strict control over their surface shape and transmitted wavefront. Testing these parameters is easily affected by environmental factors and product stress, leading to errors. Currently, laser interferometers are commonly used to test these parameters. For thin plane mirrors, since they cannot be simply placed in a V-groove or attached to the sample stage with double-sided tape, a sponge is typically placed on the sample stage. A small opening is made at the top of the sponge with a blade, and a small portion of the bottom of the mirror is inserted into the opening. Another sponge with a similar opening is then used to secure both sides of the mirror. This process is complex. Because the sponge cannot firmly fix the mirror, problems such as wobbling may occur during testing. Furthermore, since the openings in the sponge securing the sides cannot be perfectly aligned with the mirror, the mirror may be subjected to torsional forces. Additionally, because part of the mirror needs to be inserted into the sponge, the required aperture size cannot be guaranteed. When the outer diameter of the mirror is large, tape may be needed for further fixation, introducing stress.

[0004] This invention effectively solves the aforementioned problems. Through a dovetail groove structure and guide rails with both left and right chiral threads, two V-shaped clamps can simultaneously converge towards the center and expand outwards. The line connecting the V-shaped ends of the two clamps is parallel to the mirror surface, ensuring the lens is not twisted. Applying felt to the V-shaped clamp openings protects the lens from damage. The rotating and swinging platforms allow for adjustment of the lens orientation, facilitating pre-test alignment. Using this device for surface shape and transmitted wavefront testing effectively improves testing efficiency and accuracy. Furthermore, the device is highly versatile, allowing for the design and selection of V-shaped clamps of different specifications to accommodate plane mirrors of varying sizes. Summary of the Invention

[0005] The technical problem to be solved by this utility model is to provide a device for measuring the shape of a thin planar mirror and the transmitted wavefront.

[0006] A device for measuring the shape and transmitted wavefront of a thin planar mirror includes a rotating platform, a swinging platform, a dovetail groove body, a guide rail, a guide rail slider, a support rod, and a V-shaped clamp. The swinging platform is fixed above the rotating platform, the dovetail groove body is fixed above the swinging platform, the guide rail is fixed inside the dovetail groove body, the guide rail slider passes through the guide rail and moves via a threaded connection, the bottom end of the guide rail slider has a dovetail structure that engages with the dovetail groove body, the support rod is fixed above the guide rail slider, and the V-shaped clamp passes through the support rod and is fixed to the support rod.

[0007] The advantages of this invention are: the use of a rotating platform, a swing platform, a dovetail groove body, a guide rail, a guide rail slider, a support rod, and a V-shaped clamp in combination to test the shape of a thin planar mirror and the transmitted wavefront, thereby improving the accuracy of the measurement results. Attached Figure Description

[0008] Figure 1 This invention relates to a device for measuring the shape of a thin planar mirror and the transmitted wavefront.

[0009] Figure 2 This is a schematic diagram of the structure of a thin plane mirror used for surface shape and wavefront testing with the device of this invention.

[0010] The diagram includes a rotating platform 1, a swing platform 2, a dovetail groove body 3, a guide rail 4, a guide rail slider 5, a support rod 6, and a V-shaped clamp 7. Detailed Implementation

[0011] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0012] like Figure 2 As shown, a device for measuring the shape and transmitted wavefront of a thin planar mirror includes a rotating platform 1, a swinging platform 2, a dovetail groove body 3, a guide rail 4, a guide rail slider 5, a support rod 6, and a V-shaped clamp 7. The swinging platform 2 is fixed above the rotating platform 1, the dovetail groove body 3 is fixed above the swinging platform 2, the guide rail 4 is fixed inside the dovetail groove body 3, the guide rail slider 5 passes through the guide rail 4 and moves via a threaded connection, the bottom end of the guide rail slider 5 has a dovetail structure that engages with the dovetail groove body 3, the support rod 6 is fixed above the guide rail slider 5, and the V-shaped clamp 7 passes through the support rod 6 and is fixed to the support rod 6.

[0013] Using the apparatus described above, first fix the device in front of the interferometer 9. Select a suitable V-shaped clamp 7 according to the specifications of the plane mirror 8, and fix the V-shaped clamp 7 to the support rod 6. The distance between the V-shaped clamp 7 and the upper surface of the dovetail groove body 3 should be slightly smaller than the radius of the plane mirror 8. Move the two guide rail sliders 5 by rotating the guide rail 4 to move the two V-shaped clamps 7 to a suitable distance. After attaching protective cloth for the lens to the locking position of the V-shaped clamp 7, place the plane mirror 8 in the middle of the two V-shaped clamps 7, and then fine-tune the distance between the two V-shaped clamps 7 to slightly lock the plane mirror 8. Then, depending on whether the index to be tested is the surface shape or the transmitted wavefront, adjust the rotating platform 1 and the swinging platform 2 to perform the light focusing operation and test.

Claims

1. A device for measuring the shape and transmitted wavefront of a thin planar mirror, comprising a rotating platform, a swing platform, a dovetail groove body, a guide rail, a guide rail slider, a support rod, and a V-shaped clamp, characterized in that, The swing platform is fixed above the rotating platform, the dovetail groove body is fixed above the swing platform, the guide rail is fixed inside the dovetail groove body, the guide rail slider passes through the guide rail and moves through threaded engagement, the bottom end of the guide rail slider has a dovetail structure and engages with the dovetail groove body, the support rod is fixed above the guide rail slider, and the V-shaped clamp passes through the support rod and is fixed on the support rod.