Optical module high and low temperature testing device

Abstract

The utility model discloses an optical module high and low temperature test device, which comprises a test board and a thermal insulation frame arranged on the top of the test board, a temperature sensor is arranged in the thermal insulation frame, a through groove is arranged on the left side of the thermal insulation frame, and two electric guide rails are fixedly arranged on the top of the test board. A movable baffle is slidably mounted at the top of the electric guide rail and located on the left side of the through groove, and an equipment mounting frame is fixedly mounted on the left side of the movable baffle. According to the utility model, the movable baffle plate moving transversely is arranged to realize linkage of the equipment mounting rack, the module placing rack and the synchronous baffle plate, and the movable baffle plate can seal the through groove, so that the thermal insulation frame forms a sealed state to facilitate testing, and meanwhile, the auxiliary assembly is matched to separate heat airflow after testing and reduce heat loss; and the temperature in the thermal insulation frame can be adjusted when the optical module is taken down, and the set temperature can be directly used during subsequent testing, so that the temperature adjusting time is shortened, and the testing efficiency is improved.

Description

Technical Field

[0001] This utility model relates to the field of optical module testing technology, and more specifically, to a high and low temperature testing device for optical modules. Background Technology

[0002] The module consists of optoelectronic devices, functional circuits, and optical interfaces. The optoelectronic devices include both transmitting and receiving parts. Simply put, the function of the optical module is to convert electrical signals into optical signals at the transmitting end, transmit them through optical fiber, and then convert the optical signals back into electrical signals at the receiving end. The transmitting part is: an electrical signal with a certain bit rate is input, processed by an internal driver chip, and then drives a semiconductor laser or light-emitting diode to emit a modulated optical signal at the corresponding rate. It has an internal automatic optical power control circuit to keep the output optical signal power stable. The receiving part is: an optical signal with a certain bit rate is input into the module, converted into an electrical signal by a photodetector diode, and then output as an electrical signal with the corresponding bit rate after passing through a preamplifier.

[0003] Patent application CN2020228881612 discloses a high and low temperature testing device for optical modules, including a testing machine body and a base plate. The testing machine body includes a testing chamber. The upper surface of the base plate is fixedly connected to the bottom of the testing chamber. A hydraulic cylinder is provided on the upper surface of the base plate. The telescopic rod end of the hydraulic cylinder passes through one side of the testing chamber and extends into the interior. A support column is fixedly connected to the inner wall of the testing chamber. The inlet and the sealing cover are fitted with a clearance. The bottom of the testing chamber is connected to an outlet pipe. An interceptor plate is installed inside the outlet pipe. One side of the interceptor plate extends to the outside of the outlet pipe. The purpose of this utility model is to provide a high and low temperature testing device for optical modules. Through the design of this device, the optical modules can be quickly replaced and tested one by one during the high and low temperature testing process, and the rate of temperature loss inside the testing chamber can be reduced.

[0004] In practical use, this structure requires manual opening of the enclosure to assemble and remove the optical module. This is inconvenient, and after testing, the internal temperature of the enclosure needs to return to normal. Subsequent temperature adjustment requires a lot of time and energy, which also affects the efficiency of the test. Utility Model Content

[0005] In view of the problems existing in the prior art, the purpose of this utility model is to provide a high and low temperature testing device for optical modules to solve the problems in the background technology.

[0006] To achieve the above objectives, the present invention adopts the following technical solution;

[0007] A high and low temperature testing device for optical modules includes a test platform and an insulation frame mounted on top of it. A temperature sensor is installed inside the insulation frame. A through slot is opened on the left side of the insulation frame. Two electric guide rails are fixedly installed on the top of the test platform. A movable baffle is slidably installed on the top of the electric guide rails. The movable baffle is located on the left side of the through slot. An equipment mounting bracket is fixedly installed on the left side of the movable baffle. A module placement bracket is fixedly installed on the right side of the movable baffle. The right side of the module placement bracket extends through the through slot and into the interior of the insulation frame. A synchronization baffle is fixedly connected to the right side of the module placement bracket. The synchronization baffle is located inside the insulation frame. An auxiliary component is provided on the synchronization baffle.

[0008] The auxiliary component includes a connecting groove, which is formed on the synchronization baffle. A baffle plate is slidably connected to the inner wall of the connecting groove. A rack is fixedly installed at the bottom of the baffle plate. A servo motor is fixedly installed on the left side of the synchronization baffle. A gear is connected to the output shaft of the servo motor. The gear is located at the bottom of the rack and meshes with the rack.

[0009] As a further description of the above technical solution: a sealing plate is fixedly connected to the bottom of the barrier plate, and the sealing plate is located on the right side of the rack.

[0010] As a further description of the above technical solution: the movable baffle is provided with wire holes arranged at equal intervals, and the wire holes are located at the top of the equipment mounting frame.

[0011] As a further description of the above technical solution: the top of the insulation frame has a removable maintenance plate, and the connection between the maintenance plate and the insulation frame is sealed.

[0012] As a further description of the above technical solution: a sealing ring is connected to the left side of the insulation frame, and the sealing ring is located on the right side of the movable baffle.

[0013] Compared with existing technologies, the advantages of this utility model are:

[0014] In this invention, a movable baffle with lateral movement is set to enable the equipment mounting frame, module placement frame and synchronous baffle to move together. The movable baffle can seal the through slot, so that the heat insulation frame forms a sealed state to facilitate testing. At the same time, with the help of auxiliary components, the heat flow can be separated after the test to reduce heat loss. Moreover, the temperature inside the heat insulation frame can be adjusted when the optical module is removed. The set temperature can be used directly in subsequent tests, reducing the temperature adjustment time and improving the testing efficiency. Attached Figure Description

[0015] Figure 1 This is a three-dimensional structural diagram of the present invention;

[0016] Figure 2This is a frontal cross-sectional view of the present invention.

[0017] Figure 3 For the present utility model Figure 2 Enlarged structural diagram at point A in the middle;

[0018] Figure 4 This is a top view schematic diagram of the barrier plate structure of this utility model.

[0019] Explanation of the labels in the diagram:

[0020] 1. Test bench; 2. Insulation frame; 3. Temperature sensor; 4. Through slot; 5. Electric guide rail; 6. Movable baffle; 7. Equipment mounting rack; 8. Module placement rack; 9. Synchronization baffle; 10. Auxiliary components; 1001. Connecting slot; 1002. Barrier plate; 1003. Rack; 1004. Servo motor; 1005. Gear; 11. Sealing plate; 12. Wire hole; 13. Inspection plate; 14. Sealing ring. Detailed Implementation

[0021] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention.

[0022] Please see Figures 1-4 In this utility model, the high and low temperature testing device for optical modules includes a test platform 1 and an insulation frame 2 installed on its top. A temperature sensor 3 is installed inside the insulation frame 2. A through groove 4 is opened on the left side of the insulation frame 2. Two electric guide rails 5 are fixedly installed on the top of the test platform 1. A movable baffle 6 is slidably installed on the top of the electric guide rails 5. The movable baffle 6 is located on the left side of the through groove 4. An equipment mounting bracket 7 is fixedly installed on the left side of the movable baffle 6. A module placement bracket 8 is fixedly installed on the right side of the movable baffle 6. The right side of the module placement bracket 8 passes through the through groove 4 and extends into the interior of the insulation frame 2. A synchronization baffle 9 is fixedly connected to the right side of the module placement bracket 8. The synchronization baffle 9 is located inside the insulation frame 2. An auxiliary component 10 is provided on the synchronization baffle 9.

[0023] The auxiliary component 10 includes a connecting groove 1001, which is formed on the synchronization baffle 9. A baffle 1002 is slidably connected to the inner wall of the connecting groove 1001. A rack 1003 is fixedly installed at the bottom of the baffle 1002. A servo motor 1004 is fixedly installed on the left side of the synchronization baffle 9. A gear 1005 is connected to the output shaft of the servo motor 1004. The gear 1005 is located at the bottom of the rack 1003 and meshes with the rack 1003.

[0024] The movable baffle 6 has wire holes 12 arranged at equal intervals, and the wire holes 12 are located on the top of the equipment mounting frame 7.

[0025] The equipment mounting frame 7 is equipped with devices for testing optical modules, such as optical power meters and bit error rate testers. The wiring harness of the equipment can be passed through the wire hole 12. The insulation frame 2 is equipped with the control equipment required by the equipment to change the temperature inside the insulation frame 2. The temperature sensor 3 will monitor the temperature value.

[0026] When high and low temperature tests are required on the optical module, in the initial state, the synchronous baffle 9 blocks the through slot 4. The user connects the optical module to the module placement rack 8, and then connects the equipment wiring harness to the optical module. Next, the electric guide rail 5 is controlled to drive the movable baffle 6 to move to the right. At this time, the equipment mounting rack 7, the module placement rack 8 and the synchronous baffle 9 all move to the right until the movable baffle 6 is in contact with the left side of the insulation frame 2 to block the through slot 4. At this time, the insulation frame 2 forms a sealed state. The user can set the internal temperature of the insulation frame 2 to the set value according to the requirements. The high and low temperature tests are realized by transmitting data back by the equipment at different temperatures.

[0027] After the test is completed, there is heat inside the insulation frame 2. The user controls the auxiliary component 10 to operate. At this time, the servo motor 1004 drives the gear 1005 fixedly connected to it to rotate synchronously. The rack 1003 meshing with the gear 1005 starts to move to the left, thereby driving the baffle 1002 to move to the left until it is in contact with the movable baffle 6. At this time, the baffle 1002 is located at the top of the optical module, and the airflow containing heat is also separated. The electric guide rail 5 drives the movable baffle 6 to move to the left and reset until the synchronous baffle 9 blocks the through slot 4. Then, the servo motor 1004 can be controlled to rotate in the opposite direction to reset the auxiliary component 10. The optical module is exposed and can be removed. During the above process, the heat loss inside the insulation frame 2 is small. At the same time, the temperature inside the insulation frame 2 can be adjusted at this time to adapt to the subsequent test temperature conditions. When the optical module is sent in later, it can be tested directly to reduce the temperature adjustment time.

[0028] In this invention, the equipment mounting frame 7, module placement frame 8 and synchronous baffle 9 are linked by setting a horizontally moving movable baffle 6. The movable baffle 6 can seal the through groove 4, so that the heat insulation frame 2 forms a sealed state to facilitate testing. At the same time, with the auxiliary component 10, the heat flow can be separated after the test to reduce heat loss. It can also adjust the temperature inside the heat insulation frame 2 when the optical module is removed. The set temperature can be used directly in subsequent tests, reducing the temperature adjustment time and improving the testing efficiency.

[0029] Please see Figure 2 In this case, a sealing plate 11 is fixedly connected to the bottom of the barrier plate 1002, and the sealing plate 11 is located on the right side of the rack 1003.

[0030] In this invention, when the barrier plate 1002 moves to the left, the sealing plate 11 will also move to the left. The sealing plate 11 can seal the notch on the connecting groove 1001 for the movement of the rack 1003, thus preventing air circulation.

[0031] Please see Figure 1 and 2 Among them: the top of the insulation frame 2 has a removable inspection plate 13, and the connection between the inspection plate 13 and the insulation frame 2 is sealed.

[0032] In this utility model, the inspection plate 13 facilitates the user to inspect and adjust the interior of the insulation frame 2.

[0033] Please see Figure 1 Among them, the left side of the insulation frame 2 is connected to the sealing ring 14, and the sealing ring 14 is located on the right side of the movable baffle 6.

[0034] In this invention, the sealing ring 14 can improve the sealing performance when the movable baffle 6 contacts the insulation frame 2.

[0035] The above description is merely a preferred embodiment of this utility model; however, the protection scope of this utility model is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the technical scope disclosed in this utility model, based on the technical solution and its improved concept, should be included within the protection scope of this utility model.

Claims

1. A high and low temperature testing device for optical modules, comprising a test platform (1) and an insulation frame (2) mounted on top of it, characterized in that: A temperature sensor (3) is installed inside the insulation frame (2). A through slot (4) is opened on the left side of the insulation frame (2). Two electric guide rails (5) are fixedly installed on the top of the test platform (1). A movable baffle (6) is slidably installed on the top of the electric guide rails (5). The movable baffle (6) is located on the left side of the through slot (4). An equipment mounting bracket (7) is fixedly installed on the left side of the movable baffle (6). A module placement bracket (8) is fixedly installed on the right side of the movable baffle (6). The right side of the module placement bracket (8) passes through the through slot (4) and extends into the interior of the insulation frame (2). A synchronous baffle (9) is fixedly connected to the right side of the module placement bracket (8). The synchronous baffle (9) is located inside the insulation frame (2). An auxiliary component (10) is provided on the synchronous baffle (9). The auxiliary component (10) includes a connecting groove (1001) which is opened on the synchronization baffle (9). A baffle plate (1002) is slidably connected to the inner wall of the connecting groove (1001). A rack (1003) is fixedly installed at the bottom of the baffle plate (1002). A servo motor (1004) is fixedly installed on the left side of the synchronization baffle (9). A gear (1005) is connected to the output shaft of the servo motor (1004). The gear (1005) is located at the bottom of the rack (1003) and meshes with the rack (1003).

2. The high and low temperature testing device for optical modules according to claim 1, characterized in that: A sealing plate (11) is fixedly connected to the bottom of the barrier plate (1002), and the sealing plate (11) is located on the right side of the rack (1003).

3. The high and low temperature testing device for optical modules according to claim 1, characterized in that: The movable baffle (6) has wire holes (12) arranged at equal intervals, and the wire holes (12) are located on the top of the equipment mounting frame (7).

4. The high and low temperature testing device for optical modules according to claim 1, characterized in that: The top of the insulation frame (2) has a removable inspection plate (13), and the connection between the inspection plate (13) and the insulation frame (2) is sealed.

5. The high and low temperature testing device for optical modules according to claim 1, characterized in that: A sealing ring (14) is connected to the left side of the insulation frame (2), and the sealing ring (14) is located on the right side of the movable baffle (6).

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