Testing device and testing equipment

Abstract

The utility model discloses a test device and test equipment, the test device comprises a mainboard, an adapter plate and an expansion test board, the mainboard is provided with a memory card position, a first interface and a second interface, the mainboard is connected with the adapter plate through the first interface or the second interface, and the adapter plate is connected with the expansion test board through the first interface or the second interface. The adapter plate and the extension test plate are connected through a connecting line, and the extension test plate is provided with a plurality of ports; wherein the memory card position on the mainboard is connected with a first test product, the port on the expansion test board is connected with a second test product, and the first test product and the second test product are different test products. The novel testing device is designed, the adapter plate and the extension testing plate are added, different products are tested in a time-sharing mode, idle equipment ports are fully and effectively utilized, and the utilization rate of the testing device is increased.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of memory chip testing, and in particular to a testing device and testing equipment. BACKGROUND

[0002] Recently, with the continuous optimization of DDR SDRAM (Double Data Rate Synchronous Dynamic Random Access Memory), it has been widely supported in the memory industry; moreover, because DDR SDRAM can continuously transmit data at the rising and falling edges of the clock signal, doubling the amount of data transmission per unit time, and it only needs a supply voltage of 2.5V, the internal memory chip has a lower capacitance, and the power consumption is significantly reduced, etc. The characteristics of PC133 SDRAM make the era of using DDR SDRAM as the memory module of personal computers and notebook computers come quickly.

[0003] The commonly used memory module test platform is used for testing memory modules (DDR3, DDR4, DDR5) alone, that is, the memory bar is inserted into the memory card slot of the mainboard for testing. In the production process, the device is idle when not testing DDR, causing resource waste. CONTENT OF THE INVENTION

[0004] The purpose of the present application is to provide a testing device and testing equipment, increase the adapter plate, avoid the idle of the testing device for testing the memory module, and improve the utilization rate of the testing device.

[0005] The present application discloses a testing device, which comprises a mainboard, an adapter plate and an extension test board, the mainboard is provided with a memory card slot, a first interface and a second interface, the mainboard is connected with the adapter plate through the first interface or the second interface, the adapter plate and the extension test board are connected through a connecting line, and the extension test board is provided with a plurality of ports; wherein the memory card slot on the mainboard is connected with a first test product, the ports on the extension test board are connected with a second test product, and the first test product and the second test product are different test products.

[0006] Optionally, the first test product includes DDR3, DDR4 and DDR5 memory modules, and the second test product includes a PCIe SSD product; when the memory card slot is idle, the ports of the extension test board are connected with the second test product for testing.

[0007] Optionally, the testing device further comprises a pressing structure, the pressing structure comprises a first fixing part, a second fixing part and a rotating part connecting the first fixing part and the second fixing part, the first fixing part and the second fixing part of the pressing structure are respectively located at two ends of the expansion test board and are fixed on the main board, the rotating part is detachably connected with the first fixing part and the second fixing part, the rotating part comprises a first connecting rod, a first horizontal rod and a second connecting rod, one end of the first connecting rod is connected with the first fixing part, the other end of the first connecting rod is connected with the first horizontal rod, two ends of the first horizontal rod are respectively connected with the first connecting rod and the second connecting rod, one end of the second connecting rod is connected with the second fixing part, the other end of the second connecting rod is connected with the first horizontal rod, when the second test product is tested, the rotating part of the pressing structure is rotated to above the second test product, the first horizontal rod of the rotating part presses the second test product.

[0008] Optionally, the first interface comprises an M.2 interface, the second interface comprises an Add in card interface, the adapter board comprises a first adapter board and a second adapter board, the first adapter board is connected with the M.2 interface, and the second adapter board is connected with the Add in card interface; wherein the first adapter board and the second adapter board are adapter boards of different types.

[0009] Optionally, the first adapter board comprises an M.2 to SFF8654 adapter board, and the second adapter board comprises an Add in card to SFF8654 adapter board.

[0010] Optionally, the connection line comprises a plurality of SFF8654 connection lines, part of the plurality of connection lines passes through the first adapter board and the expansion test board from below the main board, and the other part of the connection lines passes through the second adapter board and the expansion test board from below the main board.

[0011] Optionally, the first interface and the second interface are both M.2 interfaces or Add in card interfaces, the first interface and the second interface are respectively connected with one adapter board, and the two adapter boards are both M.2 to SFF8654 adapter boards or Add in card to SFF8654 adapter boards.

[0012] Optionally, the number of the first interfaces is 2-4, the number of the second interfaces is 4-6, and the ports on the expansion test board are provided with 2-10 ports.

[0013] Optionally, the PCIe SSD product comprises an M.2 2280 PCIe, an M.2 2242 PCIe and an M.2 2230 PCIe product.

[0014] The application also discloses a test device, which comprises the test device and a test platform.

[0015] Compared with a test device used for testing a memory module (DDR3, DDR4, DDR5) alone, the application adds an adapter board and an extension test board, the adapter board is arranged on a main board of the test device, the adapter board is connected with an interface on the main board, the adapter board and the extension test board are connected through a connecting line, a first test product is inserted into a memory card slot on the main board to be tested, and a second test product is inserted into a port on the extension test board to be tested when the first test product is not tested, the first test product and the second test product are different test products, so that idle device ports are fully and effectively utilized, and the utilization rate of the test device is improved. BRIEF DESCRIPTION OF DRAWINGS

[0016] The accompanying drawings, which are included to provide a further understanding of the embodiments of the application and constitute a part of the specification, illustrate the embodiments of the application and together with the text description serve to explain the principles of the application. Obviously, the drawings in the following description are only some embodiments of the application, and other drawings can be obtained by those skilled in the art without creative labor on the basis of these drawings. In the drawings:

[0017] Figure 1 is a structural schematic diagram of a test device of a first embodiment of the application;

[0018] Figure 2 is a structural schematic diagram of a test device of a second embodiment of the application;

[0019] Figure 3 is a structural schematic diagram of a test device of a third embodiment of the application;

[0020] Figure 4 is a structural schematic diagram of a test device of a fourth embodiment of the application.

[0021] In the drawings, 100 is a test device, 110 is a main board, 111 is a first interface, 112 is a second interface, 113 is a memory card slot, 120 is an adapter board, 121 is a first adapter board, 122 is a second adapter board, 130 is an extension test board, 131 is a port, 140 is a connecting line, 150 is a pressing structure, 160 is a first fixing part, 170 is a second fixing part, 180 is a rotating part, 181 is a first connecting rod, 182 is a second connecting rod, 183 is a first horizontal rod, 210 is a first test product, 220 is a second test product, 300 is a test device, and 400 is a test platform. DETAILED DESCRIPTION

[0022] It is to be understood that the terminology used herein is for the purpose of describing specific embodiments only and is not intended to be limiting, but is intended to be representative of many alternative forms of implementation.

[0023] In the description of the present application, the terms "first", "second", "third", etc. are used only to describe various embodiments and are not to be construed as indicating relative importance of the technical features indicated. Thus, unless otherwise stated, the features defined with "first", "second", etc. can explicitly or implicitly include one or more of the features; the meaning of "a plurality" is two or more. The term "comprising" and any variation thereof means inclusive, and one or more other features, integers, steps, operations, units, components and / or combinations thereof can be present or added.

[0024] In addition, the terms indicating the orientation or positional relationship of "center", "transverse", "upper", "lower", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. are described based on the orientation or relative position relationship shown in the drawings, and are only for the convenience of the simplified description of the present application, and are not intended to indicate that the devices or elements indicated must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the present application.

[0025] Furthermore, unless otherwise explicitly specified and limited, the terms "mounting", "connecting", "connection" should be interpreted broadly, for example, it can be fixed connection, or detachable connection, or integral connection; it can be mechanical connection, or electrical connection; it can be direct connection, or indirect connection through intermediate medium, or internal communication of two elements. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0026] The present application will be described in detail below with reference to the accompanying drawings and optional embodiments.

[0027] As Figure 1As shown, as an embodiment of the present application, a test device 100 is disclosed, which comprises a mainboard 110, an adapter board 120 and an extension test board 130, the mainboard 110 is provided with a memory card site 113, a first interface 111 and a second interface 112, the mainboard 110 is connected with the adapter board 120 through the first interface 111 or the second interface 112, the adapter board 120 and the extension test board 130 are connected through a connecting line 140, the extension test board 130 is provided with a plurality of ports 131; wherein the memory card site 113 on the mainboard 110 is inserted into a first test product 210 for testing, the port 131 on the extension test board 130 is inserted into a second test product 220 for testing, the first test product 210 and the second test product 220 are different test products.

[0028] Considering that the test device 100 needs to wait until the product is available for testing after testing one test product, and in the waiting process, the test device 100 is idle, resources are wasted, therefore, in order to utilize the idle test device 100, the test device 100 is provided with the adapter board 120 and the extension test board 130, the adapter board 120 connects the mainboard 110 and the extension test board 130, the connecting line 140 is arranged between the adapter board 120 and the extension test board 130 for data transmission connection, and the reliability test or other test of another test product can be completed during the idle time.

[0029] Generally, the first test product 210 comprises DDR3, DDR4 and DDR5 memory modules, the second test product 210 comprises PCIe SSD products, the PCIe SSD products comprise M.2 2280 PCIe, M.2 2242 PCIe and M.2 2230 PCIe products; when the memory card site 113 is idle, the second test product 220 is inserted into the port 131 on the extension test board 130 for testing; for the test device 100 which can only test memory modules (DDR3, DDR4, DDR5) originally, the device is prone to be idle when there is no production demand for memory module products; by using the combination of adapter and extension, the PCIe product test port 131 is increased without affecting the memory module test, and the PCIe product can be tested when the memory module product is not tested.

[0030] As Figure 2As shown, as the second embodiment of the present application, it is a further refinement of the above-mentioned first embodiment, the first interface 111 includes M.2 interface, the second interface 112 includes Add in card interface, the adapter board 120 includes the first adapter board 121 and the second adapter board 122, the first adapter board 121 is connected with the M.2 interface, the second adapter board 122 is connected with the Add in card interface; the first adapter board 121 and the second adapter board 122 are different types of adapter boards 120; for example: the first adapter board 121 is M.2 to SFF8654 adapter board 120, and the second adapter board 122 is Add in card to SFF8654 adapter board 120; the adapter boards 120 corresponding to different interfaces are set to realize the conversion to complete the test of the diffusion test board to the PCIe SSD product.

[0031] Specifically, the first interface 111 specifically refers to M.2 interface, which is a physical connection standard commonly used in solid state drives and other small devices. And the second interface 112 refers to Add in card interface, which is usually used to expand the functions or performance of the computer, such as adding additional storage space or improving processing capacity, etc. In order to realize the effective conversion between the two different types of interfaces and ensure that the test work of PCIe SSD product can be carried out smoothly, two specially designed adapter boards 120 are used in the design, namely the first adapter board 121 and the second adapter board 122.

[0032] Among them, the first adapter board 121 is specially used to convert the M.2 interface into another form (such as SFF8654) to match the corresponding position on the diffusion test board; similarly, the second adapter board 122 is optimized for Add in card interface, so that it can also meet the test requirements by converting to SFF8654 standard. It is worth noting that although the two adapter boards 120 have similar functions, they are specially adjusted for different input and output ports 131, so they belong to different types of products. Through such configuration arrangement, whether using M.2 or Add in card as the data transmission medium of the device, it can be accurately connected to the diffusion test board, so as to complete the comprehensive and efficient performance evaluation of the related products such as PCIe SSD. This way not only improves the flexibility of the test process, but also ensures the accuracy and reliability of the results.

[0033] In addition, the connection lines 140 include a plurality of SFF8654 connection lines 140, and a part of the plurality of connection lines 140 passes through the first adapter board 121 and the expansion test board 130 from below the main board 110, and another part of the connection lines 140 passes through the second adapter board 122 and the expansion test board 130 from below the main board 110; the connection lines 140 are respectively arranged between different adapter boards 120 and expansion test boards 130, and the connection lines 140 pass through the expansion test board 130 from below the main board 110 in order to prevent the SFF8654 connection lines 140 from being hindered in operation.

[0034] In order to ensure the stability of the test product during the test process, the test device further includes a pressing structure 150, the pressing structure 150 includes a first fixed part 160, a second fixed part 170, and a rotating part 180 connected between the first fixed part 160 and the second fixed part 170, the first fixed part 160 and the second fixed part 170 of the pressing structure 150 are respectively located at two ends of the expansion test board and are fixed on the main board, the rotating part 180 is detachably connected with the first fixed part 160 and the second fixed part 170, the rotating part 180 includes a first connecting rod 181, a first cross rod 183 and a second connecting rod 182, one end of the first connecting rod 181 is connected with the first fixed part 160, the other end of the first connecting rod 181 is connected with the first cross rod 183, two ends of the first cross rod 183 are respectively connected with the first connecting rod 181 and the second connecting rod 182, one end of the second connecting rod 182 is connected with the second fixed part 170, the other end of the second connecting rod 182 is connected with the first cross rod 183, and when the second test product 220 is tested, the rotating part 180 of the pressing structure 150 is rotated to above the second test product 220, and the first cross rod 183 of the rotating part 180 presses the second test product 220.

[0035] Further, the number of the first interfaces 111 is 2-4, the number of the second interfaces 112 is 4-6, and the number of the ports 131 on the expansion test board 130 is 2-10. Such a design is based on multiple considerations, aiming to balance test efficiency, equipment compatibility, cost control and other factors.

[0036] The reason for choosing 2-4 primary interfaces (M.2 interfaces) is primarily because M.2 interfaces are typically used to connect solid-state drives or other high-speed storage devices, which often require high data transfer rates and stability during testing. A smaller number of primary interfaces ensures that each interface receives sufficient system resources and bandwidth, thus avoiding performance bottlenecks or instability caused by too many interfaces. Furthermore, limiting the number of interfaces also helps simplify hardware design and reduce production costs. However, this design may not be suitable for scenarios requiring simultaneous testing of a large number of M.2 devices due to the limited number of available interfaces.

[0037] The reason for choosing 4-6 interfaces for the second interface 112 (Add-in card interface) is that this type of interface is mainly used to expand the computer's functionality, such as adding additional network adapters, sound cards, or other peripheral devices. Compared to the M.2 interface, the devices connected to the Add-in card interface usually have lower requirements for data transfer speed, but their flexibility and expandability are more important. Therefore, providing more of these interfaces allows users to flexibly configure the system according to their actual needs, enhancing the adaptability and diversity of the testing environment.

[0038] The inclusion of 2-10 ports 131 on the expansion test board 130 is to further increase the system's flexibility and scalability. Fewer ports 131 help maintain design simplicity and ease of use, suitable for smaller labs or those with limited budgets; while more ports 131 allow for more complex experimental layouts, especially important when conducting large-scale parallel testing. However, increasing the number of ports 131 not only leads to higher manufacturing costs but may also introduce more points of failure, affecting the overall system reliability. Furthermore, when typically two ports 131 are selected, the PCIe test transmission speed for testing the second test product 220 is twice that of the original platform, reaching a maximum of 7200MB / s.

[0039] like Figure 3 As shown, the third embodiment of this application is a further refinement of the first embodiment described above. Unlike the second embodiment, both the first interface 111 and the second interface 112 are M.2 interfaces or Add-in-card interfaces. Both the first interface 111 and the second interface 112 are connected to an adapter board 120. Both adapter boards 120 are either M.2 to SFF8654 adapter boards or Add-in-card to SFF8654 adapter boards; or the second adapter board 122 is an M.2 to SFF8654 adapter board, and the first adapter board 121 is an Add-in-card to SFF8654 adapter board, enabling multiple tests of the same type of interface.

[0040] Generally, the first interface 111 and the second interface 112 are both M.2 interfaces or Add in card interfaces, ensuring that the test device 100 has a certain flexibility when performing tests, and different types of interfaces can be selected for configuration according to actual needs; in the first case, when the first interface 111 and the second interface 112 are both M.2 interfaces, it indicates that the system is particularly suitable for performing a large number of tests on solid state disks or other storage devices based on the M.2 standard; since the M.2 interface supports high-speed data transmission rates, this setting is very suitable for application scenarios that require fast read and write speeds; in addition, in this case, each M.2 interface is connected to the diffusion test board through a dedicated adapter board 120, and these adapter boards 120 can be M.2 to SFF8654 type, which is a common high-performance connection standard used in enterprise servers. Using such an adapter scheme not only improves data throughput, but also ensures signal integrity and stability.

[0041] In the second case, if the first interface 111 and the second interface 112 are both Add in card interfaces, it indicates that the test platform 400 focuses more on functional expansion rather than extreme performance. The Add in card interface allows users to easily add additional hardware components such as network adapters, graphics cards, etc., thereby enhancing the functionality of the host. Similarly, each Add in card interface also accesses the test environment via a dedicated adapter board (e.g., Add in card to SFF8654).

[0042] There is also a hybrid mode, where the second adapter board 122 is M.2 to SFF8654 and the first adapter board 121 is Add in card to SFF8654. This layout combines the advantages of the two schemes described above: on the one hand, it can take advantage of the high bandwidth provided by the M.2 interface to handle a large number of data-intensive tasks; on the other hand, it can introduce more external resources through the Add in card interface to support the diversified needs of complex application scenarios. Regardless of the specific case, the purpose is to achieve multiple tests of the same type of interface to ensure accurate and reliable results regardless of the specific application conditions.

[0043] As shown in Figure 4 As a fourth embodiment of the present application, a test device 300 is disclosed, which includes a test device 100 and a test platform 400 as described in any of the above embodiments, and the test device 100 is arranged on the test platform 400.

[0044] It should be noted that the inventive concept of the present application can form a very large number of embodiments, but the length of the application file is limited and cannot list them one by one, so the above described embodiments or technical features can be combined to form new embodiments without conflict, and the combination of each embodiment or technical feature will enhance the original technical effect.

[0045] The above is a further detailed description of the present application in combination with specific optional embodiments, and cannot be considered as limiting the specific implementation of the present application to these descriptions. For ordinary skilled persons in the art to which the present application belongs, without departing from the concept of the present application, a number of simple deductions or substitutions can be made, which should be considered as belonging to the protection scope of the present application.

Claims

1. A test device, characterized by The test device comprises a mainboard, an adapter board and an extension test board, the mainboard is provided with a memory card site, a first interface and a second interface, the mainboard is connected with the adapter board through the first interface or the second interface, the adapter board and the extension test board are connected through a connecting line, and the extension test board is provided with a plurality of ports. The memory card site on the mainboard is connected with a first test product, the ports on the extension test board are connected with a second test product, and the first test product and the second test product are different test products.

2. The test device of claim 1, wherein, The first test product comprises DDR3, DDR4 and DDR5, and the second test product comprises a PCIe SSD product; when the memory card site is idle, the ports of the extension test board are connected with the second test product for testing.

3. The test device of claim 1, wherein, The test device further comprises a pressing structure, the pressing structure comprises a first fixing part, a second fixing part and a rotating part connecting the first fixing part and the second fixing part, the first fixing part and the second fixing part of the pressing structure are located at two ends of the extension test board and are fixed on the mainboard, the rotating part is detachably connected with the first fixing part and the second fixing part, the rotating part comprises a first connecting rod, a first horizontal rod and a second connecting rod, one end of the first connecting rod is connected with the first fixing part, the other end of the first connecting rod is connected with the first horizontal rod, two ends of the first horizontal rod are connected with the first connecting rod and the second connecting rod respectively, one end of the second connecting rod is connected with the second fixing part, and the other end of the second connecting rod is connected with the first horizontal rod; when the second test product is tested, the rotating part of the pressing structure is rotated to the upper side of the second test product, and the first horizontal rod of the rotating part presses the second test product.

4. The test device of claim 1, wherein, The first interface comprises an M.2 interface, the second interface comprises an Add in card interface, the adapter board comprises a first adapter board and a second adapter board, the first adapter board is connected with the M.2 interface, and the second adapter board is connected with the Add in card interface. The first adapter board and the second adapter board are different types of adapter boards.

5. The test device of claim 4, wherein, The first adapter board comprises an M.2 to SFF8654 adapter board, and the second adapter board comprises an Add in card to SFF8654 adapter board.

6. The test device of claim 5, wherein, The connecting line comprises a plurality of SFF8654 connecting lines, and part of the connecting lines passes through the first adapter board and the extension test board from below the mainboard, and the other part of the connecting lines passes through the second adapter board and the extension test board from below the mainboard.

7. The test device of claim 1, wherein, The first interface and the second interface are both M.2 interfaces or Add in card interfaces, the first interface and the second interface are respectively connected with one adapter board, and the two adapter boards are both M.2 to SFF8654 adapter boards or Add in card to SFF8654 adapter boards.

8. The test device of claim 1, wherein, The number of the first interface is 2-4, the number of the second interface is 4-6, and the ports on the extension test board are provided with 2-10 ports.

9. The test device of claim 2, wherein, The PCIe SSD products include M.2 2280 PCIe, M.2 2242 PCIe and M.2 2230 PCIe products.

10. A test apparatus, characterized by, The test device as claimed in any one of claims 1-9 is arranged on the test platform.

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