In-situ analysis system for grain size of key position of failure component

Abstract

The utility model belongs to the field of failure component in-situ analysis, and provides a failure component key position grain size in-situ analysis system which comprises a base, a first displacement platform, a second displacement platform, a clamp and an integrated microscope, the first displacement platform and the second displacement platform are arranged on the base; the first displacement platform and the second displacement platform are arranged on the same straight line, and the positions of the first displacement platform and the second displacement platform can be adjusted left and right. The clamp is arranged on one side face of the first displacement platform, and the position of the clamp can be adjusted up and down; the clamp is used for clamping a failure component sample; the stereomicroscope is arranged on the second displacement platform, the height of the stereomicroscope is the same as that of the clamping failure component sample, and the stereomicroscope and the clamping failure component sample are oppositely arranged. In-situ analysis of the grain size of the key position of the failure component can be realized, and loss of grain size information of the key position of the failure fracture is avoided.

Description

Technical Field

[0001] This invention belongs to the field of in-situ analysis of failed components, and particularly relates to an in-situ analysis system for grain size at critical locations of failed components. Background Technology

[0002] The statements in this section are merely background information related to this utility model and do not necessarily constitute prior art.

[0003] Differences in local properties of components are a significant factor contributing to component failure. Therefore, evaluating the local properties of components is crucial for revealing the causes of failure. Grain size testing is an important method for assessing material properties. However, the grain size testing process requires grinding and polishing the sample, which directly damages the fracture surface. This may lead to the loss of grain size information at critical locations on the fracture surface, making it impossible to pinpoint the true cause of fracture. Utility Model Content

[0004] To address the technical problems mentioned above, this invention provides an in-situ analysis system for grain size at critical locations of failed components. This system enables in-situ analysis of grain size at critical locations of failed components, preventing the loss of grain size information at critical locations of the fracture surface.

[0005] To achieve the above objectives, the present invention adopts the following technical solution:

[0006] An in-situ analysis system for grain size at critical locations of a failed component includes: a base, a first displacement platform, a second displacement platform, a fixture, and a stereo microscope; both the first and second displacement platforms are mounted on the base; the first and second displacement platforms are arranged on the same straight line, and their positions can be adjusted left and right;

[0007] The clamp is disposed on one side of the first displacement platform, and the position of the clamp can be adjusted up and down; the clamp is used to hold the failed component sample.

[0008] The stereomicroscope is mounted on the second displacement platform, and the height of the stereomicroscope is the same as and opposite to the height of the clamped failed component sample.

[0009] In one embodiment, both the first displacement platform and the second displacement platform are mounted on a horizontal slide rail; the horizontal slide rail is fixed to the base.

[0010] In one implementation, the first displacement platform is connected to a first driving mechanism, which drives the first displacement platform to move left and right.

[0011] In one embodiment, the second displacement platform is connected to a second drive mechanism, which drives the second displacement platform to move left and right.

[0012] In one embodiment, the clamp is mounted on a vertical slide rail, which is installed on one side of the first displacement platform.

[0013] In one implementation, the clamp has a built-in locking element.

[0014] In one embodiment, the clamp is connected to a third drive mechanism, which drives the clamp to move up and down.

[0015] In one embodiment, the clamp is a three-jaw chuck structure.

[0016] In one embodiment, a turntable is mounted on the bottom of the stereomicroscope, and the turntable is mounted on a second displacement platform.

[0017] In one embodiment, the turntable is connected to a fourth drive mechanism, which drives the turntable to rotate, thereby causing the stereomicroscope to rotate; the fourth drive mechanism is installed inside the second displacement platform.

[0018] The beneficial effects of this utility model are:

[0019] This invention discloses an in-situ analysis system for grain size at critical locations of failed components. By adjusting the first and second displacement platforms to a predetermined relative distance, and then adjusting the height of the clamp to align the height of the held failed component sample with that of the stereomicroscope, the system aims to align the stereomicroscope with the critical locations of the sample. A grain size etchant is then applied to cover the critical area, and the grain boundary development process is observed in real time. After the grain boundaries are revealed, the fracture surface is repeatedly cleaned with deionized water / anhydrous ethanol, the waste liquid is collected, and the fracture surface is dried. Finally, the grain boundaries at the critical locations are carefully observed using a stereomicroscope. This system achieves in-situ analysis of grain size at critical locations of failed components, avoiding the loss of grain size information at critical locations of the fracture surface caused by grinding and polishing of the sample.

[0020] Advantages of the present invention in additional aspects will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description

[0021] The accompanying drawings, which form part of this specification, are used to provide a further understanding of this utility model. The illustrative embodiments of this utility model and their descriptions are used to explain this utility model and do not constitute an improper limitation of this utility model.

[0022] Figure 1 This is a schematic diagram of the in-situ analysis system for grain size at critical locations of failed components according to an embodiment of this utility model.

[0023] Among them, 1. base; 2. first displacement platform; 3. second displacement platform; 4. fixture; 5. stereo microscope; 6. failed component sample. Detailed Implementation

[0024] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0025] It should be noted that the following detailed description is illustrative and intended to provide further explanation of the present invention. Unless otherwise specified, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains.

[0026] It should be noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the exemplary embodiments according to the present invention. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Furthermore, it should be understood that when the terms "comprising" and / or "including" are used in this specification, they indicate the presence of features, steps, operations, devices, components, and / or combinations thereof.

[0027] In this utility model, terms such as "upper", "lower", "left", "right", "front", "back", "vertical", "horizontal", "side", and "bottom" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only used to facilitate the description of the structural relationship between the various components or elements of this utility model and do not specifically refer to any component or element in this utility model. They should not be construed as limiting this utility model.

[0028] In this utility model, terms such as "fixed connection," "connected," and "joined" should be interpreted broadly, indicating a fixed connection, an integral connection, or a detachable connection; a direct connection or an indirect connection through an intermediate medium. For those skilled in the art, the specific meaning of the above terms in this utility model can be determined according to the specific circumstances, and should not be construed as a limitation of this utility model.

[0029] according to Figure 1 As shown, the in-situ analysis system for grain size at critical locations of failed components provided in this embodiment includes: a base 1, a first displacement platform 2, a second displacement platform 3, a fixture 4, and a stereomicroscope 5.

[0030] The first displacement platform 2 and the second displacement platform 3 are both mounted on the base 1; the first displacement platform 2 and the second displacement platform 3 are arranged on the same straight line, and the positions of both can be adjusted left and right; the clamp 4 is mounted on one side of the first displacement platform 2, and the position of the clamp 4 can be adjusted up and down; the clamp 4 is used to clamp the failed component sample 6; the stereomicroscope 5 is mounted on the second displacement platform 3, and the height of the stereomicroscope 5 is the same as the height of the clamped failed component sample 6 and is arranged opposite to it.

[0031] In one or more embodiments, the first displacement platform 2 and the second displacement platform 3 are both mounted on a horizontal slide rail; the horizontal slide rail is fixed to the base 1.

[0032] The movement of the first displacement platform 2 and the second displacement platform 3 can be either manual or automatic.

[0033] For example, the first displacement platform 2 is connected to a first driving mechanism, which drives the first displacement platform 2 to move left and right. The second displacement platform 3 is connected to a second driving mechanism, which drives the second displacement platform 3 to move left and right.

[0034] The first and second drive mechanisms here can be drive motors or other existing linear drive mechanisms, which will not be described in detail here. Moreover, the connection method between the first drive mechanism and the first displacement platform, as well as the connection method between the second drive mechanism and the second displacement platform, are also existing technologies. Once the structure of the first and second drive mechanisms is determined, the connection structure between the first drive mechanism and the first displacement platform, as well as the connection structure between the second drive mechanism and the second displacement platform, can be known from their specific models and equipment manuals.

[0035] In one or more embodiments, the clamp 4 is disposed on a vertical slide rail, which is mounted on one side of the first displacement platform 2.

[0036] In some alternative embodiments, the clamp is a three-jaw chuck structure. The three-jaw chuck structure is an existing structure and will not be described in detail here.

[0037] In some specific embodiments, the clamp 4 has a built-in locking element. This allows the clamp to be fixed in position.

[0038] In some alternative embodiments, the clamp 4 is connected to a third drive mechanism, which drives the clamp to move up and down. This third drive mechanism can be a drive motor or other existing linear drive mechanisms, which will not be detailed here. Furthermore, the connection method between the third drive mechanism and the clamp is also existing technology. Once the structure of the third drive mechanism is determined, the connection structure between the third drive mechanism and the clamp can be determined based on its specific model and equipment manual.

[0039] In some alternative embodiments, a turntable is mounted on the bottom of the stereomicroscope 5, and the turntable is mounted on a second displacement platform 3. The turntable is connected to a fourth drive mechanism, which drives the turntable to rotate, thereby causing the stereomicroscope to rotate; the fourth drive mechanism is mounted inside the second displacement platform 3. This allows for adjustment of the angle of the stereomicroscope 5, enabling multi-angle analysis of the grain size of failed component samples.

[0040] The fourth drive mechanism here can be a rotary motor or an existing rotary drive mechanism, which will not be described in detail here. Moreover, the connection method between the fourth drive mechanism and the turntable is also existing technology. Once the structure of the fourth drive mechanism is determined, the connection structure between the fourth drive mechanism and the turntable can be known from its specific model and equipment manual.

[0041] The working principle of the in-situ analysis system for grain size at critical locations of failed components in this embodiment is as follows:

[0042] After the failed component sample 6 is clamped and fixed by the clamp 4, the first displacement platform 2 and the second displacement platform 3 are adjusted so that the relative distance between them is a set distance. Then the height of the clamp 4 is adjusted so that the height of the failed component sample 6 is the same as the height of the stereo microscope 5. Then the stereo microscope 5 is adjusted to be aligned with the key position of the failed component sample 6.

[0043] On this basis, a grain size etchant is applied to ensure that it covers the key areas, and the grain boundary manifestation process is observed in real time. After the grain boundaries are manifested, the fracture surface is cleaned multiple times with deionized water / anhydrous ethanol, the waste liquid is collected, and the fracture surface is dried. Finally, the grain boundaries at the key locations are carefully observed with a stereomicroscope, which realizes in-situ analysis of the grain size at the key locations of the failed component, avoiding the loss of grain size information at the key locations of the failed fracture surface caused by grinding and polishing the sample.

[0044] The above description is merely a preferred embodiment of this utility model and is not intended to limit the utility model. Various modifications and variations can be made to this utility model by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this utility model should be included within the protection scope of this utility model.

Claims

1. An in-situ analysis system for grain size at critical locations of failed components, characterized in that, include: Base, first displacement platform, second displacement platform, fixture, and stereomicroscope; The first displacement platform and the second displacement platform are both mounted on the base; the first displacement platform and the second displacement platform are arranged on the same straight line, and the positions of both can be adjusted left and right; The clamp is disposed on one side of the first displacement platform, and the position of the clamp can be adjusted up and down; the clamp is used to hold the failed component sample. The stereomicroscope is mounted on the second displacement platform, and the height of the stereomicroscope is the same as and opposite to the height of the clamped failed component sample.

2. The in-situ analysis system for grain size at critical locations of failed components as described in claim 1, characterized in that, Both the first displacement platform and the second displacement platform are mounted on a horizontal slide rail; the horizontal slide rail is fixed to the base.

3. The in-situ analysis system for grain size at critical locations of failed components as described in claim 1, characterized in that, The first displacement platform is connected to the first drive mechanism, which is used to drive the first displacement platform to move left and right.

4. The in-situ analysis system for grain size at critical locations of failed components as described in claim 1, characterized in that, The second displacement platform is connected to the second drive mechanism, which is used to drive the second displacement platform to move left and right.

5. The in-situ analysis system for grain size at critical locations of failed components as described in claim 1, characterized in that, The clamp is mounted on a vertical slide rail, which is installed on one side of the first displacement platform.

6. The in-situ analysis system for grain size at critical locations of failed components as described in claim 1, characterized in that, The clamp has a built-in locking element.

7. The in-situ analysis system for grain size at critical locations of failed components as described in claim 1, characterized in that, The clamp is connected to a third drive mechanism, which drives the clamp to move up and down.

8. The in-situ analysis system for grain size at critical locations of failed components as described in claim 1, characterized in that, The clamp is a three-jaw chuck structure.

9. The in-situ analysis system for grain size at critical locations of failed components as described in claim 1, characterized in that, The stereomicroscope has a turntable mounted on its bottom, and the turntable is mounted on a second displacement platform.

10. The in-situ analysis system for grain size at critical locations of failed components as described in claim 9, characterized in that, The turntable is connected to the fourth drive mechanism, which drives the turntable to rotate, thereby causing the stereomicroscope to rotate; the fourth drive mechanism is installed inside the second displacement platform.

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