Aging test fixture

Abstract

The utility model discloses an aging test fixture, and relates to the technical field of semiconductor testing. The aging test fixture comprises a base, and the base is provided with a to-be-tested piece installation position used for installing a to-be-tested piece. A heat exchange flow channel is arranged in the base and comprises a liquid inlet flow channel and a liquid outlet flow channel, the liquid inlet flow channel is communicated with one end of the to-be-tested piece mounting position, and the other end of the to-be-tested piece mounting position is communicated with the liquid outlet flow channel. During an aging test, according to the real-time temperature of a to-be-tested piece and the temperature required by the test, a liquid with a set temperature is input into the liquid inlet flow channel, the liquid with the set temperature flows to the to-be-tested piece mounting position through the liquid inlet flow channel and is in contact with the to-be-tested piece for heat exchange, and the liquid after heat exchange flows to the liquid outlet flow channel through the other end of the to-be-tested piece mounting position and is in contact with the to-be-tested piece. And the circulation is carried out, so that heat dissipation or temperature compensation is carried out on the to-be-tested piece, the temperature requirement of the aging test of the to-be-tested piece is met, and the aging test of the to-be-tested piece is ensured to be carried out smoothly.

Description

TECHNICAL FIELD

[0001] The utility model relates to a semiconductor test technical field especially relates to an aging test fixture. BACKGROUND

[0002] Silicon carbide as a kind of wide band gap semiconductor material, with super-high insulation, high thermal conductivity and low resistivity, high temperature resistance, high voltage resistance, high frequency, high power, radiation resistance and other characteristics.This makes silicon carbide device can greatly reduce product power consumption, improve energy conversion efficiency and reduce product volume.In the field of power electronics, the high electric field saturation drift velocity and high breakdown field strength of silicon carbide enable it to manufacture high-voltage and high-frequency power devices, and it is widely used in smart grid, rail transit, electric vehicles, new energy grid-connected, communication power supply and other fields.

[0003] Generally, silicon carbide power module must be tested in the production process, in aging test, silicon carbide power module is fixed on fixture, then silicon carbide power module is electrically connected with test equipment, and aging test is carried out.Because silicon carbide power module needs to be tested in a relatively stable temperature range, the temperature of silicon carbide power module is too high or too low, and aging test cannot be completed.The fixture in the prior art sets a radiator near the silicon carbide power module to dissipate heat for the silicon carbide power module, and the heat dissipation effect is poor;and when the temperature of the silicon carbide power module is lower than the minimum temperature of the aging test, the silicon carbide power module cannot be heated. UTILITY MODEL CONTENTS

[0004] The utility model aims at providing an aging test fixture, which can adjust temperature according to the aging test temperature requirement of the test piece, has high heat dissipation efficiency and can meet the aging test temperature requirement of the test piece.

[0005] To achieve this purpose, the utility model adopts the following technical scheme:

[0006] The aging test fixture comprises a base, the base is provided with a test piece mounting position for mounting a test piece, a heat exchange channel is arranged in the base, the heat exchange channel comprises an inlet flow channel and an outlet flow channel, the inlet flow channel is communicated with one end of the test piece mounting position, and the other end of the test piece mounting position is communicated with the outlet flow channel.

[0007] As an optional solution of the aging test fixture, a sealing ring is arranged between the test piece mounting position and the test piece, the inlet flow channel is communicated with the test piece mounting position through an inlet communication channel, the outlet flow channel is communicated with the test piece mounting position through an outlet communication channel, and the communication openings of the inlet communication channel and the outlet communication channel in the test piece mounting position are arranged on the inner side of the sealing ring.

[0008] As an optional solution for the aging test fixture, both the liquid inlet channel and the liquid outlet channel are configured as inclined channels.

[0009] As an optional solution for the aging test fixture, at least two mounting positions for the test piece are provided at intervals along the width direction of the base, and one inlet channel and one outlet channel are provided.

[0010] As an optional solution for the aging test fixture, the aging test fixture also includes multiple fixing blocks. Each fixing block is provided on both sides opposite to the mounting position of the test piece. Each fixing block is provided with a pressing part on the side near the mounting position of the test piece, so as to fix and limit the test piece by the pressing part.

[0011] As an optional embodiment of the aging test fixture, the aging test fixture further includes a capacitor and a probe module. The same side of the base is provided with a capacitor mounting position and a probe mounting position, which are located at opposite ends of the test piece mounting position. The capacitor is located at the capacitor mounting position and is used to provide electrical power to the test piece. The probe module is located at the probe mounting position and is used to connect the test piece and the test equipment.

[0012] As an optional solution for the aging test fixture, the output terminal of the capacitor is electrically connected to the test piece via positive and negative copper busbars, and the positive and negative copper busbars and the output terminal of the capacitor are fixed to the base by pressure blocks.

[0013] As an alternative to the aging test fixture, the positive and negative copper busbars are made of pure copper, and the surfaces of the positive and negative copper busbars are plated with nickel.

[0014] As an optional embodiment of the aging test fixture, the aging test fixture further includes elbow clamps, which are disposed on the base and located on opposite sides of the probe module, and are used to fix the probe module.

[0015] As an optional solution for the aging test fixture, three mounting positions for the test pieces are provided, and a three-phase copper busbar is also provided below the probe module, with all three test pieces connected to the three-phase copper busbar.

[0016] The beneficial effects of this utility model are:

[0017] The aging test fixture provided by this utility model has a test piece mounting position on the base for mounting the test piece. A heat exchange channel is provided within the base, including an inlet channel and an outlet channel. The inlet channel is connected to one end of the test piece mounting position, and the outlet channel is connected to the other end. During the aging test, liquid at a set temperature is input into the inlet channel according to the real-time temperature of the test piece and the required test temperature. The liquid flows through the inlet channel to the test piece mounting position, where it contacts the test piece for heat exchange. After heat exchange, the liquid flows through the other end of the test piece mounting position to the outlet channel and is discharged. This cycle continues, dissipating or replenishing the temperature of the test piece, improving heat dissipation efficiency, meeting the temperature requirements of the aging test, and ensuring the smooth progress of the aging test. Attached Figure Description

[0018] Figure 1 This is a first structural schematic diagram of the aging test fixture provided in a specific embodiment of the present invention;

[0019] Figure 2 This is a schematic diagram of the structure of the base of the aging test fixture provided in a specific embodiment of this utility model;

[0020] Figure 3 This is a cross-sectional view of the aging test fixture provided in a specific embodiment of this utility model;

[0021] Figure 4 This is a longitudinal sectional view of the aging test fixture provided in a specific embodiment of this utility model;

[0022] Figure 5 This is a schematic diagram of the second structure of the aging test fixture provided in a specific embodiment of this utility model;

[0023] Figure 6 This is a schematic diagram of the structure of the test piece connected to the positive and negative copper busbars, the three-phase copper busbars, and the probe module according to a specific embodiment of this utility model.

[0024] In the picture:

[0025] 100. Test piece; 101. Positive terminal; 102. Negative terminal; 103. Phase terminal; 104. Pin;

[0026] 1. Base; 11. Test piece mounting position; 111. Liquid inlet connection port; 112. Liquid outlet connection port; 121. Liquid inlet channel; 1211. Main liquid inlet channel; 1212. Sub-channel of liquid inlet; 122. Liquid outlet channel; 1221. Main liquid outlet channel; 1222. Sub-channel of liquid outlet; 13. Liquid inlet connecting channel; 14. Liquid outlet connecting channel; 15. Grounding wire mounting hole; 16. Rubber feet; 17. Capacitor mounting position; 18. Three-phase copper busbar mounting position; 19. Weight reduction cavity;

[0027] 2. Sealing ring;

[0028] 3. Fixing block; 31. Pressing part;

[0029] 4. Capacitor; 41. Capacitor mounting plate; 42. Positive output plate; 43. Negative output plate;

[0030] 5. Probe module; 51. Probe mounting plate; 52. Test probe assembly; 53. Gate board; 54. Driver board; 55. PCBA board; 56. Elbow clamp; 57. Elbow clamp mounting base;

[0031] 61. Quick-connect fitting for liquid inlet; 62. Liquid inlet plug; 63. Quick-connect fitting for liquid outlet; 64. Liquid outlet plug;

[0032] 71. Positive and negative copper busbar mounting plate; 72. Positive copper busbar; 73. Negative copper busbar; 74. Press block; 75. Insulating component;

[0033] 8. Three-phase copper busbar; 81. Three-phase copper busbar mounting plate. Detailed Implementation

[0034] To make the technical problem solved by this utility model, the technical solution adopted, and the technical effect achieved clearer, the technical solution of this utility model will be further described below with reference to the accompanying drawings and specific embodiments.

[0035] In the description of this utility model, unless otherwise explicitly specified and limited, the terms "connected," "linked," and "fixed" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.

[0036] like Figures 1-6As shown, this embodiment provides an aging test fixture, including a base 1, a capacitor 4, and a probe module 5. The base 1 has a test piece mounting position 11, a capacitor mounting position 17, and a probe mounting position on the same side. The capacitor mounting position 17 and the probe mounting position are located on opposite sides of the test piece mounting position 11. The test piece mounting position 11 is used to mount the test piece 100. The capacitor 4 is located at the capacitor mounting position 17 and is used to provide power to the test piece 100. The probe module 5 is located at the probe mounting position and is used to connect the test piece 100 and the test equipment.

[0037] like Figure 2 As shown, the base 1 is made of aluminum alloy, which has good thermal conductivity and corrosion resistance, is lightweight, and has a long service life. Furthermore, a weight-reducing cavity 19 is provided below the base 1 (i.e., on the side of the base 1 away from the capacitor 4) to further reduce the weight of the base 1.

[0038] To ensure the safety of the test, the base 1 is equipped with four support legs, each covered with a rubber foot pad 16, which serves as insulation. The base 1 also has a grounding wire mounting hole 15, through which a grounding wire is connected.

[0039] During the aging test, capacitor 4 provides high voltage and current to the test piece 100, causing it to heat up and reach a high temperature. Excessive temperature can damage the test piece 100. Conversely, if the temperature is too low, it cannot be guaranteed that the test piece 100 will undergo the aging test within a relatively stable temperature range.

[0040] To solve the above technical problems, such as Figures 2-4 As shown, a heat exchange channel is provided inside the base 1, including an inlet channel 121 and an outlet channel 122. The inlet channel 121 is connected to one end of the test piece mounting position 11, and the other end of the test piece mounting position 11 is connected to the outlet channel 122. During the aging test, liquid at a set temperature is input into the inlet channel 121 according to the real-time temperature of the test piece 100 and the required test temperature. The liquid at the set temperature flows through the inlet channel 121 to the test piece mounting position 11, where it contacts the test piece 100 for heat exchange. After heat exchange, the liquid flows through the other end of the test piece mounting position 11 to the outlet channel 122 and is discharged through the outlet channel 122. This cycle is repeated to dissipate or replenish the temperature of the test piece 100, improving heat dissipation efficiency and meeting the temperature requirements of the aging test of the test piece 100, ensuring the smooth progress of the aging test of the test piece 100.

[0041] Specifically, the mounting position 11 of the test piece is set as a mounting groove, and the liquid in the liquid inlet channel 121 can enter the space between the mounting groove and the test piece 100 from one end of the mounting groove, contact the heat dissipation area of ​​the test piece 100, exchange heat, and improve the heat dissipation efficiency and heat replenishment efficiency of the test piece 100.

[0042] In one embodiment, at least two test piece mounting positions 11 are spaced apart along the width direction of the base 1, with one test piece 100 mounted in each mounting position 11. There is one inlet channel 121 and one outlet channel 122. The number of test piece mounting positions 11 can be set according to the number of test pieces 100 required for aging tests. Two or three positions can be provided. One inlet channel 121 and one outlet channel 122 can simultaneously dissipate or replenish heat for all test pieces 100, reducing the number of inlet and outlet channels and lowering processing costs. Of course, in other embodiments, only one test piece mounting position 11 can be provided.

[0043] In this embodiment, the test piece 100 is a silicon carbide power module. The aging test of the silicon carbide power module is a full-bridge test. The full-bridge test requires three silicon carbide power modules. Therefore, the base 1 is provided with three test piece mounting positions 11, which are spaced apart along the width direction of the base 1. The capacitor mounting position 17 and the probe mounting position are respectively located at both ends of the test piece mounting position 11 along the length direction of the base 1. One end of the test piece 100 is provided with a positive terminal 101 and a negative terminal 102, and the other end is provided with a phase terminal 103. The phase terminal 103 has pins 104 on both sides.

[0044] The aging test fixture also includes multiple fixing blocks 3. A fixing block 3 is provided on each of the opposite sides of the test piece mounting position 11. Each fixing block 3 has a pressing part 31 on the side closest to the test piece mounting position 11, which is used to fix and limit the test piece 100. Recesses are provided on opposite sides of the test piece 100, and limiting protrusions are also provided on the recesses. The pressing part 31 is a pressing groove at the bottom of the fixing block 3. A limiting groove is also provided on the pressing groove corresponding to the limiting protrusion. One side of the pressing groove presses against the recess. After the limiting groove and the limiting protrusion cooperate, the fixing block 3 is fixedly connected to the base 1 by the fifth fastening screw, thereby fixing the test piece 100. When disassembling or assembling the test piece 100, simply loosen the fifth fastening screw and remove the fixing block 3. Moreover, when fixing three test pieces 100 at the same time, only four fixing blocks 3 need to be set. Pressing parts 31 are set on both sides of the two middle fixing blocks 3. That is, the two middle fixing blocks 3 can fix two adjacent test pieces 100 at the same time. Compared with the prior art where the test pieces 100 are connected to the base 1 by multiple fastening screws, it saves more time and improves the efficiency of disassembly and assembly.

[0045] Specifically, the liquid inlet channel 121 includes a main liquid inlet channel 1211 and a branch liquid inlet channel 1212 that are interconnected, and the liquid outlet channel 122 includes a main liquid outlet channel 1221 and a branch liquid outlet channel 1222 that are interconnected. Both the main liquid inlet channel 1211 and the main liquid outlet channel 1221 extend along the length of the base 1, while both the branch liquid inlet channel 1212 and the branch liquid outlet channel 1222 extend along the width of the base 1 and are connected to the test piece mounting position 11. The inlet of the main liquid inlet channel 1211 is connected to a liquid source on the testing equipment via a quick-connect liquid inlet connector 61, providing liquid at a set temperature to the main liquid inlet channel 1211. The outlet of the main liquid outlet channel 1221 is connected to a liquid collector on the testing equipment via a quick-connect liquid outlet connector 63 to collect the heat-exchanged liquid.

[0046] In this embodiment, the inlet and outlet of the liquid flow channel 121 and the outlet flow channel 122 are not restricted. The liquid flow channel 121 can receive liquid through the quick-connect fitting 61 and can also receive liquid through the quick-connect fitting 61; similarly, the liquid flow channel 122 can receive liquid through the quick-connect fitting 63 and can also receive liquid through the quick-connect fitting 63. In use, the inlet and outlet of the liquid flow channel 121 and the outlet flow channel 122 can be interchanged, as long as it is ensured that one of the liquid flow channels 121 and the other of the outlet flow channel 122 is for inlet and outlet respectively.

[0047] The main inlet channel 1211 and the main outlet channel 1221 can be connected to the end of the base 1 at only one end for connecting the quick-connect fitting 61 for inlet and the quick-connect fitting 63 for outlet. The other end of the main inlet channel 1211 is connected to the inlet branch channel 1212, and the other end of the main outlet channel 1221 is connected to the outlet branch channel 1222. Alternatively, both ends of the main inlet channel 1211 and the main outlet channel 1221 can be connected to the end of the base 1. Since the main inlet channel 1211 and the main outlet channel 1221 are relatively long, when drilling, to avoid excessively long drill bits leading to high costs and unstable processing, they can be processed from both ends of the base 1, reducing processing difficulty and costs. After processing, one through end of the liquid inlet main flow channel 1211 is connected to the liquid inlet quick-change connector 61, and the other through end is blocked by the liquid inlet plug 62; similarly, one through end of the liquid outlet main flow channel 1221 is connected to the liquid outlet quick-change connector 63, and the other through end is blocked by the liquid outlet plug 64.

[0048] Since the liquid inlet branch channel 1212 and the liquid outlet branch channel 1222 are relatively short, only one end needs to be connected to the end of the base 1. As long as they can be connected to the three test piece mounting positions 11 at the same time, the through end of the liquid inlet branch channel 1212 is blocked by the liquid inlet plug 62, and the through end of the liquid outlet branch channel 1222 is blocked by the liquid outlet plug 64.

[0049] The inlet channel 121 is connected to the test piece mounting position 11 via the inlet connecting channel 13, and the outlet channel 122 is connected to the test piece mounting position 11 via the outlet connecting channel 14. There is a certain height difference between the inlet branch channel 1212 and the mounting groove of the test piece mounting position 11, and the inlet branch channel 1212 is connected to the mounting groove of the test piece mounting position 11 via the inlet connecting channel 13. The outlet branch channel 1222 is connected to the mounting groove of the test piece mounting position 11 via the outlet connecting channel 14. For example, there are three mounting positions 11 for the test piece, and three liquid inlet connecting channels 13 and three liquid outlet connecting channels 14 are provided at intervals. Both ends of the liquid inlet connecting channel 13 are connected to the liquid inlet branch channel 1212 and the mounting position 11 for the test piece through the liquid inlet connecting port 111. Both ends of the liquid outlet connecting channel 14 are connected to the liquid outlet branch channel 1222 and the mounting position 11 for the test piece through the liquid outlet connecting port 112.

[0050] Furthermore, both the inlet channel 13 and the outlet channel 14 are designed as inclined channels to extend the flow path of the liquid from the inlet branch channel 1212 to the test piece mounting position 11, thus preventing excessive liquid pressure at the test piece mounting position 11 from generating a large impact force on the test piece 100 and causing damage. Simultaneously, the inclined design of the outlet channel 14 also slows down the flow velocity of the liquid from the test piece mounting position 11 to the outlet branch channel 1222, allowing the liquid to fully exchange heat with the test piece 100 at the test piece mounting position 11 and improving heat exchange efficiency.

[0051] A sealing ring 2 is provided between the test piece mounting position 11 and the test piece 100. The inlet liquid connection channel 13 and the outlet liquid connection channel 14 are both located inside the sealing ring 2, connecting to the test piece mounting position 11. By providing the sealing ring 2 around the test piece 100, the liquid in the test piece mounting position 11 is prevented from flowing out, avoiding electric shock and improving the safety of the test.

[0052] The sealing ring 2 is made of a material with high temperature resistance and high hardness. For example, the sealing ring 2 is made of silicone rubber or fluororubber with a Shore hardness value of 50 to 60.

[0053] In this embodiment, capacitor 4 is a custom-made large capacitor used to provide stable voltage and current to the test piece 100 and to filter signals, reducing interference and effectively preventing damage to the test piece 100. Capacitor 4 is fixed to capacitor mounting position 17 via capacitor mounting plate 41. First and second fixing holes are provided on opposite sides of capacitor mounting plate 41. First mounting holes are provided on both sides of capacitor mounting position 17. First connecting holes are provided on both sides of capacitor 4. First fastening screws pass through the first connecting holes and the first fixing holes to connect with the first mounting holes. The second fixing hole is a slotted hole, and a second fastening screw passes through the slotted hole and connects with its corresponding first mounting hole. Five first mounting holes are provided on one side of capacitor mounting position 17, three of which are slotted holes for connecting with the first fastening screws, and the other two are for connecting with the second fastening screws. This design avoids the first fastening screw failing to align with the first mounting hole after passing through the first connecting hole and the first fixing hole due to processing errors.

[0054] Specifically, such as Figures 4-6 As shown, the output terminal of capacitor 4 is electrically connected to the test piece 100 via positive and negative copper busbars. The positive and negative copper busbars and the output terminal of capacitor 4 are fixed to the base 1 by a clamping block 74. The output terminal of capacitor 4 is located near the mounting position 11 of the test piece. The output terminal of capacitor 4 includes a positive output plate 42 and a negative output plate 43. The terminals of the test piece 100 include a positive terminal 101 and a negative terminal 102. The positive and negative copper busbars include a positive copper busbar 72 and a negative copper busbar 73. The positive terminal 101 is connected to the positive output plate 42 via the positive copper busbar 72, and the negative terminal 102 is connected to the negative output plate 43 via the negative copper busbar 73. The clamping block 74 ensures the stability of the connection between capacitor 4 and the positive and negative copper busbars, thereby ensuring that capacitor 4 can provide a stable high-voltage current to the test piece 100. To prevent short circuits between the sides of the positive copper busbar 72 and the negative copper busbar 73, an insulating element 75 is provided between the sides of the positive copper busbar 72 and the negative copper busbar 73. The insulating element 75 is made of a high-temperature resistant insulating material.

[0055] Specifically, a positive and negative copper busbar mounting plate 71 is provided between the test piece mounting position 11 and the capacitor mounting position 17. A positive output plate 42 and a negative output plate 43 are spaced apart along the height direction of the end of the capacitor 4. The positive copper busbar 72 is placed on the positive and negative copper busbar mounting plate 71, with one end connected to the positive output plate 42 and the other end connected to the positive terminal 101. One end of the negative copper busbar 73 is placed above the negative output plate 43, and the other end is bent downwards and connected to the negative terminal 102. Further, a pressure block 74 is provided above the positive and negative copper busbar mounting plate 71, and a pressure groove is provided below the pressure block 74. The pressure groove is used to press the negative copper busbar 73, ensuring the stability of the connection between the negative copper busbar 73 and the negative output plate 43.

[0056] The positive and negative copper busbars are made of pure copper and plated with nickel. Pure copper has high conductivity and a smooth surface, making it more suitable for transmitting and connecting the high-voltage current required by the test piece 100 during aging tests. The nickel plating on the positive and negative copper busbars prevents surface oxidation and improves their strength and corrosion resistance.

[0057] To facilitate full-bridge testing of silicon carbide power modules, a three-phase copper busbar 8 is installed below the probe module 5, and all three test pieces 100 are connected to the three-phase copper busbar 8. Each test piece 100's phase terminal 103 is connected to one three-phase copper busbar 8, and the phase terminals 103 of the three test pieces 100 respectively form the U-phase terminal, V-phase terminal, and W-phase terminal. Connecting the phase terminals 103 via the three-phase copper busbar 8 allows for testing silicon carbide power modules with different phase terminal lengths.

[0058] Furthermore, in order to improve the strength and corrosion resistance of the three-phase copper busbar 8, the surface of the three-phase copper busbar 8 is also plated with nickel.

[0059] The probe module 5 includes a probe mounting plate 51, a test probe assembly 52, a PCBA board 55, a gate-level board 53, and a driver board 54. The probe mounting plate 51 is used to mount the test probe assembly 52 and the PCBA board 55. The probe mounting plate 51 is provided with a first positioning hole, and a first positioning pin is provided at the probe mounting position. The first positioning pin cooperates with the first positioning hole to position the probe mounting plate 51 on the base 1. The test probe assembly 52, the gate-level board 53, and the driver board 54 are all electrically connected to the PCBA board 55. The test probe assembly 52 passes through the PCBA board 55 and the probe mounting plate 51 and is connected to the PCBA board 55 by soldering. The test probe assembly 52 is connected to pin 104 located below the probe mounting plate 51. The driver board 54 and the gate-level board 53 are connected to the test equipment to collect and monitor the aging test data of the test piece 100 and transmit it to the test equipment.

[0060] The aging test fixture also includes elbow clamps 56, which are mounted on the base 1 and located on opposite sides of the probe module 5. The elbow clamps 56 are used to secure the probe module 5. By pressing the probe mounting plate 51 with the two elbow clamps 56, the test probe assembly 52 contacts the pin 104. Furthermore, when disassembling the probe module 5, it can be removed simply by opening the elbow clamps 56, achieving rapid assembly and disassembly of the probe module 5. It should be noted that the elbow clamps 56 are purchased finished parts; their specific structure and switching principle will not be described in detail here.

[0061] To enable simultaneous connection of the three-phase copper busbar 8 and the test probe assembly 52 to the phase terminal 103 and pin 104 located at the same height, the probe mounting positions and the three-phase copper busbar mounting positions 18 are spaced apart along the height direction of the base 1. Specifically, refer to... Figure 2On the base 1, a groove is provided at the end of the test piece mounting position 11 away from the capacitor mounting position 17. This groove forms a three-phase copper busbar mounting position 18, and a three-phase copper busbar mounting plate 81 is set in the three-phase copper busbar mounting position 18. The three-phase copper busbar 8 is fixed to the three-phase copper busbar mounting plate 81 by a third fastening screw. The phase terminal 103 is connected to the three-phase copper busbar 8 by a fourth fastening screw. The elbow clamp 56 is fixed to the base 1 by an elbow clamp mounting seat 57. The elbow clamp mounting seat 57 is located at both ends of the three-phase copper busbar mounting plate 81, and the top surface of the elbow clamp mounting seat 57 is set as a stepped surface. The support surface with the lower height in the stepped surface is set close to the three-phase copper busbar mounting plate 81 and higher than the three-phase copper busbar mounting plate 81. The support surfaces with the lower height in the stepped surfaces of the two elbow clamp mounting seats 57 together constitute the probe mounting position. The two ends of the probe mounting plate 51 are respectively placed on the support surfaces with the lower height in the two stepped surfaces. The elbow clamp 56 is installed on the support surface with a higher height in the stepped surface, and the elbow clamp 56 can fix the two ends of the probe mounting plate 51.

[0062] It should be noted that the capacitor mounting position 17, the test piece mounting position 11, the three-phase copper busbar mounting position 18, and the probe mounting position on the base 1 are all equipped with positioning holes. The positioning holes cooperate with the positioning pins to ensure the installation accuracy of each component on the base 1. The setting of the positioning holes and positioning pins is quite conventional and will not be described in detail here.

[0063] The above description is only a preferred embodiment of this utility model. For those skilled in the art, there will be changes in the specific implementation method and application scope based on the idea of ​​this utility model. The content of this specification should not be construed as a limitation of this utility model.

Claims

1. An aging test fixture, characterized in that, The device includes a base (1) on which a test piece mounting position (11) for mounting a test piece (100) is provided; a heat exchange channel is provided inside the base (1), the heat exchange channel includes an inlet channel (121) and an outlet channel (122), the inlet channel (121) is connected to one end of the test piece mounting position (11), and the other end of the test piece mounting position (11) is connected to the outlet channel (122).

2. The aging test fixture according to claim 1, characterized in that, A sealing ring (2) is provided between the test piece mounting position (11) and the test piece (100). The liquid inlet channel (121) is connected to the test piece mounting position (11) through the liquid inlet communication channel (13). The liquid outlet channel (122) is connected to the test piece mounting position (11) through the liquid outlet communication channel (14). The communication ports of the liquid inlet communication channel (13) and the liquid outlet communication channel (14) with the test piece mounting position (11) are both located inside the sealing ring (2).

3. The aging test fixture according to claim 2, characterized in that, Both the inlet channel (13) and the outlet channel (14) are configured as inclined channels.

4. The aging test fixture according to claim 1, characterized in that, At least two mounting positions (11) for the test piece are provided at intervals along the width direction of the base (1), and one liquid inlet channel (121) and one liquid outlet channel (122) are provided.

5. The aging test fixture according to claim 1, characterized in that, The aging test fixture also includes multiple fixing blocks (3), and each fixing block (3) is provided on both sides of the test piece mounting position (11); each fixing block (3) is provided with a pressing part (31) on the side of the test piece mounting position (11) to fix and limit the test piece (100) by the pressing part (31).

6. The aging test fixture according to claim 1, characterized in that, The aging test fixture also includes a capacitor (4) and a probe module (5). The base (1) has a capacitor mounting position (17) and a probe mounting position on the same side. The capacitor mounting position (17) and the probe mounting position are located at opposite ends of the test piece mounting position (11). The capacitor (4) is located at the capacitor mounting position (17) and is used to provide power to the test piece (100). The probe module (5) is located at the probe mounting position and is used to connect the test piece (100) and the test equipment.

7. The aging test fixture according to claim 6, characterized in that, The output terminal of the capacitor (4) is electrically connected to the test piece (100) through positive and negative copper busbars. The positive and negative copper busbars and the output terminal of the capacitor (4) are fixed to the base (1) by a pressure block (74).

8. The aging test fixture according to claim 7, characterized in that, The positive and negative copper busbars are made of pure copper, and the surfaces of the positive and negative copper busbars are plated with nickel.

9. The aging test fixture according to claim 7, characterized in that, The aging test fixture also includes elbow clamps (56), which are disposed on the base (1) and located on opposite sides of the probe module (5). The elbow clamps (56) are used to fix the probe module (5).

10. The aging test fixture according to claim 6, characterized in that, There are three mounting positions (11) for the test pieces, and a three-phase copper busbar (8) is provided below the probe module (5). All three test pieces (100) are connected to the three-phase copper busbar (8).

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