Chip testing equipment

Abstract

The utility model discloses a chip testing device, which belongs to the technical field of chip testing, and can simultaneously meet the testing requirements of a plurality of chips during working, thereby adapting to the testing requirements of large-scale chip production and improving the overall practicability of the device. The chip testing equipment comprises a testing base, four placement cavities are formed in the top of the testing base at equal intervals, containing bases are installed in the placement cavities, and chip placement openings for chip testing are formed in the centers of the tops of the containing bases; a top cover is installed at one end of the top of the test base through a hinge in a hinged mode, a covering assembly for assisting a chip compression test is arranged at the end, facing the test base, of the top cover in a protruding mode, clamping ports are symmetrically formed in the end, away from the hinge, of the test base, and a clamping assembly is installed at the end, away from the hinge, of the top cover in a hinged mode; the clamping opening and the clamping assembly are clamped in a matched mode.

Description

Technical Field

[0001] This utility model belongs to the field of chip testing technology, and specifically relates to a chip testing device. Background Technology

[0002] A chip, also known as a microcircuit, microchip, or integrated circuit, is a silicon wafer containing integrated circuits. It is very small and is a crucial component of electronic devices such as computers. Due to the intricate structure, complex manufacturing process, and cumbersome procedures involved in chip production, potential defects are inevitably left behind. This can prevent the manufactured chips from meeting standard requirements and lead to malfunctions at any time due to various reasons. Therefore, to ensure chip quality, chips are typically tested (including multiple tests such as electrical parameter measurements and functional tests) to separate good from defective products.

[0003] Existing chip testing equipment can mostly only process and test individual chips. When mass production is carried out, the overall testing efficiency is often low, which cannot effectively improve the overall chip testing efficiency. Therefore, a chip testing device is needed to help solve this problem. Utility Model Content

[0004] (1) Technical problems to be solved

[0005] In view of the shortcomings of the existing technology, the purpose of this utility model is to provide a chip testing device that can simultaneously meet the testing needs of multiple chips during operation, thereby adapting to the testing needs of large-scale chip production and improving the overall practicality of the device.

[0006] (2) Technical solution

[0007] To solve the above-mentioned technical problems, this utility model provides a chip testing device, which includes a test base, four placement cavities are equally spaced at the top of the test base, a receiving seat is installed in each placement cavity, and a chip placement port for chip testing is opened at the center of the top of the receiving seat.

[0008] A top cover is hinged to one end of the test base. An auxiliary chip clamping test cover component is provided on the end of the top cover facing the test base. A snap-fit ​​interface is symmetrically opened on the end of the test base away from the hinge. A snap-fit ​​component is hinged to the top cover away from the hinge. The snap-fit ​​interface and the snap-fit ​​component are engaged and snap-fitted together.

[0009] Furthermore, the snap-fit ​​assembly includes a snap-fit ​​box, which is hinged to the top cover. The snap-fit ​​box has a cavity inside, and a sliding block is slidably disposed in the cavity. The bottom of the sliding block extends out of the cavity, and a snap-fit ​​block is fixed to one end of the sliding block extending out of the cavity. The snap-fit ​​block and the snap-fit ​​interface are engaged. A lead screw is rotatably disposed in the cavity, and the lead screw passes through the sliding block. The sliding block and the lead screw are threadedly engaged.

[0010] Furthermore, the top of the lead screw extends out of the snap-fit ​​box, and a knob is fixed to one end of the lead screw extending out of the snap-fit ​​box. An embedded ring is fitted and fixed on the knob, and the embedded ring is embedded in the snap-fit ​​box.

[0011] Furthermore, the placement cavity is symmetrically provided with mounting seats, and the bottom of the receiving seat is symmetrically provided with mounting holes, and the mounting seats and the mounting holes are fitted together.

[0012] Furthermore, a fixing bolt is installed through the mounting hole, and the mounting base is fixed to the fixing bolt.

[0013] Furthermore, the top cover has a receiving cavity, and the cover assembly includes a pressing seat, which is disposed in the receiving cavity. A pressing block is protruding from the side of the pressing seat away from the receiving cavity, and fastening bolts are installed at the four corners of the pressing seat. The receiving cavity and the fastening bolts are threadedly engaged.

[0014] Furthermore, a support base is installed at the bottom of the test base, and the support base is located at the four corners of the bottom of the test base.

[0015] (3) Beneficial effects

[0016] Compared with the prior art, the beneficial effects of this utility model are as follows:

[0017] This utility model, through the receiving seat set in the placement cavity at the top of the test base, can simultaneously meet the testing needs of multiple chips during operation by setting multiple chip placement ports, thereby adapting to the testing needs of large-scale chip production and improving the overall practicality of the device.

[0018] This utility model, through the cooperation between the set card interface and the card-connecting components, allows the knob to be reversed during operation. The knob drives the lead screw to rotate as a whole, and the sliding block and the lead screw are threaded together, thereby causing the lead screw to move as a whole. When the lead screw moves, it drives the sliding block to move as a whole, thereby causing the card-connecting block to move and be stably locked in the card interface. During the testing process, the top cover and the test base are tightened together to ensure that the test can be carried out smoothly. Attached Figure Description

[0019] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 This is a schematic diagram of the structure of this utility model;

[0021] Figure 2 This is a schematic diagram of the structure of the present invention after the receiving seat has been disassembled;

[0022] Figure 3 This utility model Figure 2 Enlarged structural diagram at point A;

[0023] Figure 4 This is a cross-sectional view of the snap-fit ​​assembly of this utility model.

[0024] The labels in the attached diagram are as follows: 1. Test base; 2. Support base; 3. Placement cavity; 4. Mounting base; 5. Receiving base; 51. Mounting hole; 52. Fixing bolt; 53. Chip placement port; 6. Top cover; 61. Receiving cavity; 7. Cover assembly; 71. Pressing base; 72. Pressing block; 73. Fastening bolt; 8. Snap-in interface; 9. Snap-in assembly; 10. Snap-in box; 11. Sliding block; 111. Snap-in block; 12. Lead screw; 13. Knob; 131. Embedding ring. Detailed Implementation

[0025] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0026] This specific embodiment is a chip testing device, such as... Figure 1 and Figure 2As shown, the chip testing equipment includes a test base 1, a support base 2 installed at the bottom of the test base 1, a PCBA circuit board for chip testing installed inside the test base 1, the support base 2 located at the four corners of the bottom of the test base 1, four placement cavities 3 equidistantly opened at the top of the test base 1, a receiving seat 5 installed in each placement cavity 3, and mounting seats 4 symmetrically protruding inside the placement cavity 3, mounting holes 51 symmetrically opened at the bottom of the receiving seat 5, the mounting seats 4 and mounting holes 51 are fitted together, and fixing bolts 52 are installed through the mounting holes 51, the mounting seats 4 and fixing bolts 52 are fitted together to fix them, and a chip placement port 53 for chip testing is opened at the center of the top of the receiving seat 5. The detachable receiving seat 5 can be easily replaced if it is damaged. By setting the receiving seats 5 in the placement cavities 3 at the top of the test base 1, multiple chip placement ports 53 can be set up during operation to meet the testing needs of multiple chips at the same time, thereby adapting to the large-scale chip production testing needs and improving the overall practicality of the device.

[0027] A top cover 6 is hinged to one end of the test base 1. The top cover 6 has a receiving cavity 61. A cover assembly 7 for assisting chip clamping test is protruding from the end of the top cover 6 facing the test base 1. The cover assembly 7 includes a pressing seat 71, which is disposed in the receiving cavity 61. A pressing block 72 is protruding from the side of the pressing seat 71 away from the receiving cavity 61. Fastening bolts 73 are installed at the four corners of the pressing seat 71. The receiving cavity 61 and the fastening bolts 73 are threadedly engaged. By setting up the cover assembly 7, the chip can be stably clamped during the test, ensuring that subsequent testing can proceed smoothly.

[0028] Reference Figure 1-4 As shown, the test base 1 has symmetrically arranged card interfaces 8 at the end away from the hinge. The top cover 6 is hinged to a card assembly 9 away from the hinge. The card interfaces 8 and the card assembly 9 are engaged. The card assembly 9 includes a card box 10, which is hinged to the top cover 6. The card box 10 has a cavity inside, and a sliding block 11 is slidably arranged in the cavity. The bottom of the sliding block 11 extends out of the cavity, and a card block 111 is fixed at one end of the sliding block 11 that extends out of the cavity. The card block 111 is engaged with the card interface 8. A lead screw 12 is rotatably arranged in the cavity. The lead screw 12 passes through the sliding block 11, and the sliding block 11 and the lead screw 12 are threaded together. The top of the lead screw 12 extends out of the card box 10, and a knob 13 is fixed at one end of the lead screw 12 that extends out of the card box 10. An embedded ring 131 is fitted and fixed on the knob 13 and is embedded in the card box 10.

[0029] Through the cooperation between the set card interface 8 and the card-connecting component 9, the knob 13 can be reversed during operation. The knob 13 drives the lead screw 12 to rotate as a whole. The sliding block 11 is threadedly engaged with the lead screw 12, thereby causing the lead screw 12 to move as a whole. When the lead screw 12 moves, it drives the sliding block 11 to move as a whole, thereby causing the card-connecting block 111 to move and be stably connected and installed in the card interface 8. During the test, the test can be carried out smoothly by tightening the top cover 6 with the test base 1.

[0030] Working principle:

[0031] During operation, before testing the chip, the mounting hole 51 on the receiving seat 5 is positioned with the mounting seat 4. The fixing bolt 52 is rotated, and the mounting seat 4 and the fixing bolt 52 are engaged, thereby achieving the overall positioning and fastening of the receiving seat 5. The fastening bolt 73 is threaded into the receiving cavity 61, thereby completing the overall installation and fastening of the cover assembly 7. The top cover 6 is placed on the top of the test base 1, and the snap-fit ​​block 111 at the bottom of the snap-fit ​​assembly 9 is snapped into the snap-fit ​​interface 8. The knob 13 is reversed, and the knob 13 drives the lead screw 12 to rotate. The sliding block 11 is threadedly engaged with the lead screw 12, thereby moving the lead screw 12. When the lead screw 12 moves, it drives the sliding block 11 to move, thereby moving the snap-fit ​​block 111 and stably snapping the snap-fit ​​block 111 into the snap-fit ​​interface 8.

[0032] All technical features in this embodiment can be freely combined according to actual needs.

[0033] Finally, it should be noted that the above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Although the present utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A chip testing device, comprising a test base (1), characterized in that, The test base (1) has four placement cavities (3) equidistantly spaced at the top. Each placement cavity (3) contains a receiving seat (5). The receiving seat (5) has a chip placement port (53) for chip testing at the center of its top. The test base (1) has a top cover (6) mounted on one end of the top via a hinge. The top cover (6) has a cover assembly (7) for assisting chip pressing test protruding from the end facing the test base (1). The test base (1) has symmetrical card interfaces (8) on the end away from the hinge. The top cover (6) has a card connector assembly (9) mounted on the top away from the hinge. The card interface (8) and the card connector assembly (9) are engaged and connected.

2. The chip testing equipment according to claim 1, characterized in that, The snap-fit ​​assembly (9) includes a snap-fit ​​box (10), which is hinged to the top cover (6). The snap-fit ​​box (10) has a cavity inside, and a sliding block (11) is slidably disposed in the cavity. The bottom of the sliding block (11) extends out of the cavity, and a snap-fit ​​block (111) is fixed at one end of the sliding block (11) extending out of the cavity. The snap-fit ​​block (111) is engaged with the snap-fit ​​interface (8). A lead screw (12) is rotatably disposed in the cavity. The lead screw (12) passes through the sliding block (11), and the sliding block (11) and the lead screw (12) are threadedly engaged.

3. The chip testing equipment according to claim 2, characterized in that, The top of the lead screw (12) extends out of the snap-fit ​​box (10). A knob (13) is fixed at one end of the lead screw (12) extending out of the snap-fit ​​box (10). An embedded ring (131) is fitted and fixed on the knob (13). The embedded ring (131) is embedded in the snap-fit ​​box (10).

4. The chip testing equipment according to claim 1, characterized in that, The placement cavity (3) is symmetrically provided with mounting bases (4), and the bottom of the receiving base (5) is symmetrically provided with mounting holes (51). The mounting bases (4) and the mounting holes (51) are fitted together.

5. The chip testing equipment according to claim 4, characterized in that, A fixing bolt (52) is installed through the mounting hole (51), and the mounting base (4) is fixed to the fixing bolt (52).

6. The chip testing equipment according to claim 1, characterized in that, The top cover (6) has a receiving cavity (61), and the cover assembly (7) includes a pressing seat (71). The pressing seat (71) is disposed in the receiving cavity (61). A pressing block (72) is provided on the side of the pressing seat (71) away from the receiving cavity (61). Fastening bolts (73) are installed at the four corners of the pressing seat (71). The receiving cavity (61) and the fastening bolts (73) are threaded together.

7. The chip testing equipment according to claim 1, characterized in that, The test base (1) is equipped with a support base (2) at its bottom, and the support base (2) is located at the four corners of the bottom of the test base (1).

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