Supporting platform for chip detection device
By designing a support platform that includes a base, a stage, and a micrometer, the problem of inconvenient height adjustment in existing chip testing devices has been solved, enabling convenient and high-precision installation and adjustment, and improving chip testing results.
Patent Information
- Application Number
- CN202423101776.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-16
- Publication Date
- 2025-12-16
- Estimated Expiration
- 2034-12-16
AI Technical Summary
The existing chip testing device has a simple support structure design, which makes height adjustment inconvenient and affects the chip testing effect.
The design employs a support platform that includes a base, a platform, and a micrometer. The installation height of the chip testing device can be adjusted by adjusting the micrometer, and the elastic support base and rotating bearings ensure the accuracy and stability of the adjustment.
It enables convenient and high-precision height adjustment of the chip testing device, improving the chip testing effect.
Smart Images

Figure CN223671200U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to semiconductor testing technical field, in particular to a kind of supporting platform for chip detection device. BACKGROUND
[0002] Chip testing sorting machine needs to be matched with precision detection device, and the both are connected to form a complete chip testing system. The detection device is usually installed at the corresponding position around the sorting machine by the related support, and in production, the chip is transported to the detection device by the testing arm of the sorting machine for chip testing.
[0003] To achieve good chip testing effect, the installation height of chip detection device usually needs to be adjusted, but the support for chip detection device is mostly single in structure design at present, and the supporting height is not convenient to adjust, which has certain defects.
[0004] Therefore, the utility model provides a kind of supporting platform for chip detection device to solve the above problems. UTILITY MODEL CONTENTS
[0005] The utility model aims at providing a kind of supporting platform for chip detection device, to realize the convenient and accurate adjustment of the installation height of chip detection device.
[0006] To solve the above technical problems, the utility model provides a kind of supporting platform for chip detection device, including base, table body and two micrometers;
[0007] The scale frame of two micrometers is fixed at the both ends of base respectively;
[0008] The table body is located above the base, and the both ends of the table body are movably connected with the mandrel of two micrometers respectively;
[0009] The table body is slidably and rotatably connected with one of two micrometers, and the table body is rotatably connected with the other one of two micrometers.
[0010] Further, the mandrel of two micrometers is connected with rotary bearing, one of two rotary bearings is slidably installed on the table body, and the other one of two rotary bearings is fixed on the table body.
[0011] Further, the sidewall of the table body is provided with guide rail along the length direction of the table body, the guide rail is slidably installed with sliding block, and the sliding block is connected with one rotary bearing.
[0012] Further, the support platform for the chip detection device further comprises an elastic support base, which is installed on the base at a position between the two micrometers and used for supporting the bottom of the table body.
[0013] Further, the elastic support base comprises an elastic telescopic rod and a support plate arranged at the end of the elastic telescopic rod.
[0014] The elastic telescopic rod comprises an outer cylinder, an inner rod and an elastic member.
[0015] The inner rod is slidingly installed in the outer cylinder, and one end of the inner rod inside the outer cylinder is connected with the elastic member between the inner end surface of the outer cylinder.
[0016] Further, the elastic member is a compression spring, and the outer lateral wall of the elastic member is in sliding contact with the inner lateral wall of the outer cylinder.
[0017] Further, the surface of the end of the support plate away from the elastic telescopic rod is spherical.
[0018] Compared with the prior art, the support platform for the chip detection device has at least the following beneficial effects:
[0019] The support platform for the chip detection device provided by the utility model installs the chip detection device on the table body, and through the arrangement of the two micrometers at the two ends of the table body, the installation height of the chip detection device installed on the table body can be adjusted, the operation is simple, the precision is high, and good chip testing effect is ensured. BRIEF DESCRIPTION OF DRAWINGS
[0020] Figure 1 It is a whole structure schematic view of the support platform for the chip detection device.
[0021] Figure 2 It is an internal schematic view of the elastic telescopic rod in the support platform for the chip detection device.
[0022] In the figure: 1, base; 2, table body; 3, micrometer; 4, rotating bearing; 5, guide rail; 6, sliding block; 7, elastic support base; 71, elastic telescopic rod; 72, support plate; 711, outer cylinder; 712, inner rod; 713, elastic member; 8, chip detection device. DETAILED DESCRIPTION
[0023] The support platform for the chip detection device will be described in more detail below in combination with the schematic view, wherein the preferred embodiments of the utility model are represented, and it should be understood that the utility model described herein can be modified by those skilled in the art, and the advantageous effects of the utility model can still be achieved. Therefore, the following description should be understood as extensive knowledge for those skilled in the art, and not as a limitation on the utility model.
[0024] The present invention will be described in more detail below by way of example with reference to the accompanying drawings. The advantages and features of the present invention will become clearer from the following description. It should be noted that the drawings are in a very simplified form and use non-precise proportions, and are only used to facilitate and clarify the illustration of the embodiments of the present invention.
[0025] like Figure 1 As shown in the figure, this utility model embodiment proposes a support platform for a chip testing device, including a base 1, a platform 2, and two micrometers 3; the frames of the two micrometers 3 are respectively fixed at both ends of the base 1; the platform 2 is located above the base 1, and both ends of the platform 2 are movably connected to the spindles of the two micrometers respectively; the platform 2 is slidably and rotatably connected to one of the two micrometers 3, and the platform 2 is rotatably connected to the other of the two micrometers 3.
[0026] In this embodiment, the chip detection device 8 is mounted on the table. When the height of the chip detection device 8 needs to be adjusted, first turn the adjustment knob on one micrometer 3. After adjusting to the required scale, lock the state using the locking part of the micrometer 3. Then turn the knob on another micrometer 3 until its scale is consistent with the scale of the previous micrometer 3, and lock the state in the same way. This realizes the adjustment of the support height of the table 1, thus realizing the adjustment of the installation height of the chip detection device 8. The operation is simple and highly accurate.
[0027] In summary, the support platform for the chip testing device provided in this example enables the adjustment of the installation height of the chip testing device mounted on the platform. It is simple to operate, highly accurate, and ensures good chip testing results.
[0028] In the above implementation process, both micrometer spindles 3 are connected to rotating bearings 4. One of the rotating bearings 4 is slidably mounted on the platform 2, and the other rotating bearing 4 is fixed to the platform 2. The arrangement of the rotating bearings 4 ensures smoothness during the adjustment process.
[0029] Specifically, a guide rail 5 is provided at one end of the side wall of the platform 2 along the length of the platform 2, and a slider 6 is slidably mounted on the guide rail 5. The slider 6 is connected to a rotating bearing 4. The guide rail 5 and the slider 6, together with the rotating bearing 4, realize a sliding and rotating connection between the micrometer 3 and the platform 2.
[0030] In one specific embodiment, the chip detection device support platform further comprises an elastic support base 7 mounted on the base 1 between the two micrometers 3 to support the bottom of the table body 2 and improve the stability of the table body 2.
[0031] Specifically, the elastic support base 7 comprises an elastic telescopic rod 71 and a support plate 72 arranged at the end of the elastic telescopic rod 71.
[0032] In combination with the description of Figure 2 The elastic telescopic rod 71 comprises an outer cylinder 711, an inner rod 712 and an elastic member 713.
[0033] The inner rod 712 is slidingly installed in the outer cylinder 711, and one end of the inner rod 712 inside the outer cylinder 711 is connected with the elastic member 713 between the inner end face of the outer cylinder 711.
[0034] The elastic member 713 is a compression spring, which provides a force towards the support plate 72 to ensure a certain supporting effect of the support plate 72.
[0035] Preferably, the outer side wall of the elastic member 713 is in sliding contact with the inner side wall of the outer cylinder 711 to avoid excessive bending and deformation of the elastic member 713 and improve the service life of the elastic member 713.
[0036] In the above specific embodiment, further, the end surface of the support plate 72 away from the elastic telescopic rod 71 is spherical, which can reduce the influence of the support plate 72 on the height adjustment process to a certain extent compared with the design of a flat plate.
[0037] In summary, the chip detection device support platform of the utility model installs the chip detection device on the table body, and through the arrangement of the two micrometers at the two ends of the table body, the height of the chip detection device installed on the table body can be adjusted, which is simple to operate, high in precision and ensures good chip testing effect.
[0038] Obviously, those skilled in the art can make various modifications and variations to the utility model without departing from the spirit and scope of the utility model. Therefore, if these modifications and variations of the utility model fall within the scope of the claims of the utility model and equivalent technologies, the utility model also intends to include these modifications and variations.
Claims
1. A support platform for a chip inspection apparatus, characterized by, It comprises a base, a table body and two micrometers; The frame of the two micrometers is fixed at the two ends of the base respectively; The table body is located above the base, and the heart shaft of the two micrometers is movably connected with the two ends of the table body respectively; The table body is slidably and rotatably connected with one of the two micrometers, and is rotatably connected with the other one of the two micrometers.
2. The support platform for a chip testing apparatus according to claim 1, wherein The heart shaft of the two micrometers is connected with a rotating bearing, one of the two rotating bearings is slidably installed on the table body, and the other one of the two rotating bearings is fixed on the table body.
3. The support platform for a chip testing apparatus according to claim 2, wherein One end of the side wall of the table body is provided with a guide rail along the length direction of the table body, a sliding block is slidably installed on the guide rail, and the sliding block is connected with one of the rotating bearings.
4. The support platform for a chip testing apparatus according to claim 1, wherein It further comprises an elastic support seat, which is installed on the base at a position between the two micrometers, and is used for supporting the bottom of the table body.
5. The support platform for a chip testing apparatus according to claim 4, wherein The elastic support seat comprises an elastic telescopic rod and a support plate arranged at the end of the elastic telescopic rod; The elastic telescopic rod comprises an outer cylinder, an inner rod and an elastic member; The inner rod is slidably installed in the outer cylinder, and the elastic member is connected between the inner end of the inner rod and the inner end face of the outer cylinder.
6. The support platform for a chip testing apparatus according to claim 5, wherein The elastic member is a compression spring, and the outer side wall of the elastic member is in sliding contact with the inner side wall of the outer cylinder.
7. The support platform for a chip testing apparatus according to claim 5, wherein The surface of the end of the support plate away from the elastic telescopic rod is spherical.