Test device

Abstract

The utility model belongs to the technical field of machinery, and particularly relates to test equipment which comprises a test mechanism, and the test mechanism comprises a first carrier, a test element and a first test assembly. Wherein the first carrier is configured to accommodate at least part of a to-be-tested piece, and the test element is located on the first carrier. According to the invention, the test element and the first test assembly are arranged in the test mechanism, and the test element and the first test assembly are configured to test the performances of the different areas of the to-be-tested piece, so that the situation that multiple sets of test equipment need to be provided to test the performances of the different areas of the to-be-tested piece is improved; and the test efficiency can be improved while the test cost and the test difficulty are reduced.

Description

TECHNICAL FIELD

[0001] The present disclosure belongs to the technical field of machinery, and particularly relates to a test equipment. BACKGROUND

[0002] In the production and processing of some to-be-tested pieces, in order to ensure the quality of the to-be-tested pieces, the performance of the to-be-tested pieces needs to be tested before the to-be-tested pieces are put into production. When different performances of the to-be-tested pieces are tested, the testing is generally carried out separately, and multiple sets of test equipment are needed to test multiple performances of one to-be-tested piece, and multiple test sites need to be increased and transported, and the to-be-tested piece needs to be taken multiple times, resulting in high testing cost and low testing efficiency. CONTENT OF THE UTILITY MODEL

[0003] The present application provides a test equipment to reduce the number of times of taking and transporting the to-be-tested piece for multiple performance tests, thereby reducing the testing cost and improving the testing efficiency.

[0004] The present disclosure provides a test equipment, which comprises a test mechanism, the test mechanism comprising a first carrier, a test element and a first test assembly; wherein the first carrier is configured to accommodate at least part of a to-be-tested piece, the test element is located in the first carrier, and the test element and the first test assembly are configured to test the performance of different regions of the to-be-tested piece, respectively.

[0005] In an exemplary embodiment of the present disclosure, the to-be-tested piece has a first part, the first carrier is provided with an accommodation groove configured to accommodate the first part, the first test assembly is located outside the accommodation groove, a mounting groove is formed in the groove bottom surface of the accommodation groove, and the test element is embedded in the mounting groove.

[0006] In an exemplary embodiment of the present disclosure, the first test assembly comprises a first driving member and a first test contact, the first test contact is connected with the first driving member, and the first driving member is configured to drive the first test contact to contact test with the to-be-tested piece.

[0007] In an exemplary embodiment of the present disclosure, the to-be-tested piece has a second part, the test mechanism further comprises a second carrier, and the second carrier is formed with a containing cavity configured to accommodate the second part.

[0008] In an exemplary embodiment of the present disclosure, the test mechanism further comprises a second test assembly, the second test assembly comprising a second driving member and a second test contact, and the second test contact is connected with the second driving member; wherein the second driving member is configured to drive the second test contact to contact test with the second part.

[0009] In an example embodiment of the present disclosure, one of the first test contact and the second test contact is located on one side of the second carrier in the horizontal direction, and the other is located on one side of the second carrier in the vertical direction; or, the first test contact and the second test contact are located on both sides of the second carrier in the horizontal direction; or, the first test contact and the second test contact are located on both sides of the second carrier in the vertical direction.

[0010] In an example embodiment of the present disclosure, the first test contact is located on one side of the second carrier in the horizontal direction, and the second test contact is located on one side of the second carrier in the vertical direction, wherein:

[0011] The test device comprises two test mechanisms arranged in the horizontal direction, and the contact surfaces of the first test contacts of the two test mechanisms are oppositely arranged; and / or, the test mechanism further comprises a third test assembly, the third test assembly comprises a third driving member and a third test contact, the third test contact is connected with the third driving member, the third test contact is located on both sides of the second carrier in the vertical direction, and the third driving member is configured to drive the third test contact to perform contact test with the second part.

[0012] In an example embodiment of the present disclosure, in at least one test assembly: the test contact is detachably connected with the driving member.

[0013] In an example embodiment of the present disclosure, the test mechanism further comprises a bracket, the first carrier is installed on the bracket; the driving member of the at least one test assembly is slidingly installed on the bracket, and the driving member is configured to be movable relative to the bracket to the direction close to the to-be-tested member, so as to adjust the pressure when the test contact of the same test assembly performs contact test with the to-be-tested member.

[0014] In an example embodiment of the present disclosure, the test mechanism further comprises a cover body, the cover body is configured to be installed on the first carrier after at least part of the to-be-tested member is located in the accommodation groove, so as to cover the accommodation groove.

[0015] The technical solution provided by the example embodiments of the present disclosure has at least the following advantages:

[0016] By arranging the test element and the first test assembly in the test mechanism, and configuring the test element and the first test assembly to test the performance of different regions of the to-be-tested member respectively, compared with the case of needing to provide multiple sets of test devices to test the performance of multiple different regions of the to-be-tested member, the present disclosure can realize the test of the performance of different regions of the to-be-tested member through the test element and the first test assembly in the test mechanism after the to-be-tested member is placed on the first carrier, thereby improving the complex process of needing to take the to-be-tested member multiple times to transport the to-be-tested member to different test devices and test the performance of different regions of the to-be-tested member, and thereby reducing the test difficulty and test cost.

[0017] Other features and advantages of the present application will be apparent from the following detailed description, or can be learned by practice of the application.

[0018] It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the application, as claimed. BRIEF DESCRIPTION OF DRAWINGS

[0019] The accompanying drawings, which are incorporated herein and form a part of the specification, illustrate embodiments consistent with the present disclosure and, together with the description, further serve to explain the principles of the disclosure. It is to be expressly understood that the drawings are only for purposes of illustration and are not to be construed as limiting the present disclosure.

[0020] Figure 1 A perspective view of a test device in an embodiment of the present disclosure is shown.

[0021] Figure 2 A top view of a case in an embodiment of the present disclosure is shown.

[0022] Figure 3 A front view of a test device in an embodiment of the present disclosure is shown.

[0023] Figure 4 A perspective view of a first carrier in an embodiment of the present disclosure is shown.

[0024] Figure 5 A sectional view of a second carrier in an embodiment of the present disclosure is shown.

[0025] Figure 6 A sectional view of a second carrier in an embodiment of the present disclosure is shown. Figure 3

[0026] Figure 7 A connection between a driving member and an adjusting plate in an embodiment of the present disclosure is shown.

[0027] Figure 8 A sectional view of a second carrier in an embodiment of the present disclosure is shown. Figure 6

[0028] Figure 9 A sectional view of a second carrier in an embodiment of the present disclosure is shown.

[0029] Figure 10 A perspective view of a cover in an embodiment of the present disclosure is shown.

[0030] BRIEF DESCRIPTION OF DRAWINGS

[0031] 1. test device​​

[0032] 2, case; 21, single-chip microcomputer; 22, LED detector; 23, relay switch board; 24, expansion module; 25, USB board; 26, power switch; 27, short guide rail; 28, threading box;

[0033] 3, test mechanism;

[0034] 31, first carrier; 311, containing groove; 312, assembling groove;

[0035] 32, test element;

[0036] 33, first test assembly; 331, first driving piece; 332, first test contact;

[0037] 34, second carrier; 341, containing cavity; 342, bearing seat; 343, cover plate; 344, first through hole; 345, second through hole; 346, third through hole;

[0038] 35, bracket; 351, fixed plate; 352, adjusting plate;

[0039] 36, second test assembly; 361, second driving piece; 362, second test contact;

[0040] 37, third test assembly; 371, third driving piece; 372, third test contact;

[0041] 38, cover body;

[0042] X, horizontal direction; Y, vertical direction. DETAILED DESCRIPTION

[0043] Example implementations are now described with reference to the drawings; however, these implementations are merely examples of implementations provided according to this disclosure. Therefore, should a person of ordinary skill in the art wish to make use of the teachings of this disclosure, they should not be limited in their implementations to the particular examples disclosed herein. Rather, they should look to the claims to determine the proper scope of the teachings of this disclosure.

[0044] Furthermore, the described features, structures, or characteristics can be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided to give a thorough understanding of embodiments of the application. One skilled in the relevant art will recognize, however, that the

[0045] The application will be described in further detail below with reference to the drawings and specific embodiments. It should be noted that the technical features involved in the various embodiments of the application described below can be combined with each other as long as they do not conflict with each other. The embodiments described below by reference to the drawings are exemplary and are intended to explain the application, but cannot be understood as limiting the application.

[0046] As shown in Figure 1 , the present disclosure provides a test device 1 comprising a test mechanism 3.

[0047] In some embodiments, the test device 1 further comprises a cabinet 2 and the test mechanism 3 disposed on the cabinet 2.

[0048] The cabinet 2 can comprise various electronic components.

[0049] For example, as shown in Figure 2 , the cabinet 2 can comprise a single-chip microcomputer 21, a relay switch board 23, a USB board 25, a power switch 26, a short guide rail 27 for wiring, a threading box 28, etc. The specific connection relationship of these components can be determined according to actual conditions, but is not limited thereto. In addition to the aforementioned electronic components, the cabinet 2 can also comprise an LED detector 22 (i.e., a light-emitting diode detector, which is an optional optical testing instrument), an expansion module 24, and other electronic components.

[0050] The present embodiment provides the aforementioned various electronic components on the cabinet 2, and communicatively connects the test components 32 and test assemblies in the test mechanism 3 with the corresponding electronic components in the cabinet 2, so that the test mechanism 3 can meet various optional testing requirements.

[0051] As shown in Figures 3-4 , the test mechanism 3 can comprise a first carrier 31.

[0052] In the present embodiment of the disclosure, the first carrier 31 is provided with a receiving groove 311 configured to accommodate at least part of a test piece.

[0053] In some embodiments, the test piece can have a first part, wherein the receiving groove 311 is configured to accommodate the first part of the test piece. It should be noted that the test piece in the present embodiment can only comprise the first part, but is not limited thereto. The test piece can also comprise other parts in addition to the first part.

[0054] In the present disclosure, the shape of the accommodation groove 311 can be determined according to the shape of the to-be-tested piece accommodated therein, that is, the accommodation groove 311 can be a profiling groove, and the shape of the profiling groove (i.e., the accommodation groove 311) can be matched with the shape of the to-be-tested piece accommodated therein, so that the to-be-tested piece can be accommodated and at the same time be limited to reduce the shaking of the to-be-tested piece, thereby improving the accuracy of the test result. In addition, by setting the accommodation groove 311 as a profiling groove, the space occupied by the first carrier 31 as a whole can be reduced, and the saved space can be used to arrange other elements.

[0055] In some embodiments, the first carrier 31 in the present disclosure can be made of silica gel, which has excellent softness, elasticity, weather resistance, durability, and other characteristics, so that the wear of the to-be-tested piece can be improved while the service life of the first carrier 31 is prolonged, thereby reducing the maintenance and replacement cost of the first carrier 31.

[0056] Reference Figure 5 As shown in the drawings, in some embodiments, the test mechanism 3 can further include a test element 32, which is located in the first carrier 31, and the test element 32 is configured to test the performance of a specific region of the to-be-tested piece.

[0057] In the present embodiment, the test element 32 can be in communication connection with the case 2, and the test element 32 can be configured to test the performance of the specific region of the to-be-tested piece under the control of the case 2.

[0058] In some embodiments, the test element 32 can be located in the accommodation groove 311.

[0059] For example, the groove bottom surface of the accommodation groove 311 can be provided with a mounting groove 312, and the test element 32 can be embedded in the mounting groove 312. By providing the mounting groove 312, the test element 32 and the to-be-tested piece can be placed in different spaces, thereby improving the problem of the test element 32 occupying the placement space of the to-be-tested piece.

[0060] In some embodiments, the test mechanism 3 can further include a first test assembly 33, which is configured to test the performance of a specific region of the to-be-tested piece.

[0061] In the present embodiment, the first test assembly 33 is located outside the accommodation groove 311. The first test assembly 33 can be in communication connection with the case 2, and the first test assembly 33 can be configured to test the performance of the specific region of the to-be-tested piece under the control of the case 2.

[0062] It should be noted that the specific area of ​​the test element 32 to be tested and the specific area of ​​the test element 33 to be tested are two different areas on the test element. Therefore, in this disclosure, the test element 32 and the first test element 33 in one set of test equipment 1 can test the performance of different areas of the test element separately. Compared with the situation that multiple sets of test equipment 1 are required to test the performance of multiple different areas of the test element separately, this disclosure can achieve the testing of the performance of different areas of the test element by controlling the test element 32 and the first test element 33 in the test mechanism 3 after one loading (that is: placing the test element on the first carrier 31). This improves the complicated process of having to pick up the test element multiple times to transfer the test element to different test equipment 1 and test the performance of different areas of the test element, thereby reducing the testing difficulty and testing cost.

[0063] In some embodiments, a set of testing equipment 1 can simultaneously perform performance tests on different areas of the test piece. For example, the test element 32 and the first test component 33 in the same testing mechanism 3 can simultaneously perform performance tests on different areas of the test piece, thereby improving testing efficiency.

[0064] However, this is not the only possibility. In other embodiments, a single test apparatus 1 can also perform performance tests on different areas of the test piece at different times. For example, the test element 32 and the first test assembly 33 in the same test mechanism 3 can perform performance tests on different areas of the test piece at different times, thereby improving test efficiency.

[0065] In some embodiments, the test piece can be manually loaded onto the testing mechanism 3, but this is not a limitation; the test piece can also be loaded onto the testing mechanism 3 by a robotic arm. After the test piece is loaded onto the testing mechanism 3, starting the chassis 2 can automatically begin the performance test of the test piece.

[0066] like Figure 6 and Figure 7 As shown, in some embodiments, the first test component 33 may include a first driver 331 and a first test contact 332. The first test contact 332 is connected to the first driver 331, and the first driver 331 is configured to drive the first test contact 332 to perform a contact test with the test piece.

[0067] In this embodiment, the first driving component 331 can be communicatively connected to the chassis 2. The first driving component 331 can be configured to drive the first test contact 332 to perform contact testing with the test piece under the control of the chassis 2.

[0068] In some embodiments, the first driving member 331 can be detachably connected with the first test contact 332, so that the performance test of different types of testees can be realized by replacing the test contact, which can improve the versatility of the first test assembly 33 and save test cost. In addition, when the first test contact 332 is damaged, the first test assembly 33 can ensure the test performance by replacing the first test contact 332.

[0069] In some embodiments of the present disclosure, the first test assembly 33 can perform contact test on the testee.

[0070] For example, if there is a certain gap between the first test assembly 33 and the corresponding test area on the testee after the testee is placed on the first carrier 31, the first test contact 332 can be driven by the first driving member 331 to contact the testee, thereby realizing the contact test. Of course, after the testee is placed on the first carrier 31, the testee can also directly contact the first test contact 332 and realize the contact test on the corresponding test area.

[0071] But not limited to this, in some other embodiments of the present disclosure, the first test assembly 33 can also perform non-contact test with the testee, which can be determined according to the actual situation.

[0072] As shown in Figure 3 , Figure 8 and Figure 9 , in some embodiments, the test mechanism 3 can further include a second carrier 34, and the second carrier 34 is formed with a receiving cavity 341 configured to accommodate at least part of the testee.

[0073] Specifically, as shown in Figure 5 and Figure 9 , the second carrier 34 can include a bearing seat 342 and a cover plate 343, the bearing seat 342 is formed with the receiving cavity 341, and the cover plate 343 covers the top surface of the bearing seat 342.

[0074] In some embodiments, the testee can include a second part, and the first part and the second part are two different parts of the testee.

[0075] The receiving cavity 341 is configured to accommodate the second part of the testee. The shape of the receiving cavity 341 can be matched with the shape of the second part, so that the receiving cavity 341 can realize the positioning of the second part.

[0076] As shown in Figure 8As shown in some embodiments, a first through hole 344 can be formed on the cavity wall opposite to the accommodation cavity 341 and the first test contact 332, and the first test contact 332 is configured to pass through the first through hole 344 and contact the second part under the driving of the first driving member 331, so as to realize the contact test on the second part.

[0077] In some embodiments, the to-be-tested member can further include a third part, which can be used to realize the connection between the first part and the second part. In order to facilitate the stable placement of the to-be-tested member on the test mechanism 3, the first carrier 31, the second carrier 34 and the like structures in the present disclosure for accommodating the to-be-tested member can be correspondingly provided with a relief space matched with the shape of the third part.

[0078] It should be noted that in some embodiments, when the to-be-tested member is loaded on the test mechanism 3 by the robot hand, the to-be-tested member can be first loaded on the first carrier 31, and then the first carrier 31 loaded with the to-be-tested member is placed on the second carrier 34 by the robot hand. After the case 2 is started, the performance test of the to-be-tested member can be automatically started, without manual operation of the test equipment 1. The loading and testing process of the to-be-tested member can be completely automatic, so as to improve the automation degree of the performance test of the to-be-tested member.

[0079] As shown in some embodiments, Figure 3 , Figure 5 and Figure 10 , the test mechanism 3 can further include a cover body 38, which is configured to be installed on the first carrier 31 after at least part of the to-be-tested member is located in the accommodation groove 311, so as to cover the accommodation groove 311. By providing the cover body 38, the present disclosure can be used to protect the to-be-tested member placed on the first carrier 31, and reduce the pollution and damage of the external environment to the to-be-tested member.

[0080] Specifically, when the to-be-tested member is placed on the first carrier 31, and the first carrier 31 is installed on the second carrier 34, the cover body 38 is installed on the first carrier 31 and covers the accommodation groove 311. At this time, the cover plate 343 in the second carrier 34 can also be simultaneously pressed on the top surface of the support seat 342 and the cover body 38, so as to realize the fixation of the second part of the to-be-tested member by using the cover plate 343 to exert pressure on the cover body 38 and the support seat 342.

[0081] As shown in some embodiments, Figure 3 and Figure 6 , the test mechanism 3 can further include a support 35, and the first carrier 31 is installed on the support 35, and the first driving member 331 is also installed on the support 35. When the case 2 is included in the test equipment 1, the support 35 can be installed on the top surface of the case 2.

[0082] As shown in some embodiments, Figure 3As shown in some embodiments, the second carrier 34 can be mounted on the bracket 35, and the first carrier 31 is mounted on the second carrier 34, so that the first carrier 31 can be indirectly mounted on the bracket 35 through the second carrier 34.

[0083] In some embodiments, the testing mechanism 3 can further include a second testing assembly 36, which can be configured to test the performance of a specific region of the to-be-tested piece.

[0084] In some embodiments, the second testing assembly 36 can be in communication connection with the case 2, and the second testing assembly 36 can be configured to test the performance of a specific region of the to-be-tested piece under the control of the case 2.

[0085] It should be noted that the second testing assembly 36 and the first testing assembly 33 and the testing element 32 are respectively used to test the performance of different regions of the to-be-tested piece.

[0086] As shown in some embodiments, the second testing assembly 36 can include a second driving element 361 and a second testing contact 362, the second testing contact 362 is connected with the second driving element 361, and the second driving element 361 can be configured to drive the second testing contact 362 to test the second part of the to-be-tested piece. Figure 6 Figure 8 As shown in some embodiments, the second testing assembly 36 can include a second driving element 361 and a second testing contact 362, the second testing contact 362 is connected with the second driving element 361, and the second driving element 361 can be configured to drive the second testing contact 362 to test the second part of the to-be-tested piece.

[0087] For example, the second driving element 361 in the embodiment can be mounted on the bracket 35 and in communication connection with the case 2, and the second driving element 361 is configured to drive the second testing contact 362 to test the to-be-tested piece under the control of the case 2.

[0088] In some embodiments, the second driving element 361 can be detachably connected with the second testing contact 362, so that the performance test of different types of to-be-tested pieces can be realized by replacing the testing contact, which can improve the universality of the second testing assembly 36 and save testing cost. In addition, when the second testing contact 362 is damaged, the second testing contact 362 can be replaced to ensure the testing performance of the second testing assembly 36.

[0089] In some embodiments of the present disclosure, the second testing assembly 36 is used to perform contact test on the to-be-tested piece. If there is a certain gap between the second testing assembly 36 and the corresponding test region on the to-be-tested piece after the to-be-tested piece is placed on the second carrier 34, the second driving element 361 can be used to drive the second testing contact 362 to move towards the to-be-tested piece, so that the second testing contact 362 is in contact with the to-be-tested piece, thereby realizing the contact test. Of course, after the to-be-tested piece is placed on the second carrier 34, the to-be-tested piece can be directly in contact with the second testing contact 362, thereby realizing the contact test on the corresponding test region. ​

[0090] As shown in Figure 8 When the second test assembly 36 performs contact test on the test object, the second through hole 345 can be formed on the cavity wall opposite to the second test contact 362 in the accommodating cavity 341, and the second driving member 361 is configured to drive the second test contact 362 to pass through the second through hole 345 to perform contact test on the second part under the control of the cabinet 2.

[0091] But not limited to this, in other embodiments of the present disclosure, the second test assembly 36 can also be used for non-contact test on the test object, which can be determined according to actual conditions.

[0092] In some embodiments, the second driving member 361 can be mounted on the bracket 35.

[0093] Among them, one of the first test contact 332 and the second test contact 362 in the present disclosure can be located on one side of the second carrier 34 in one direction, and the other can be located on the other side of the second carrier 34 in the other direction. But not limited to this, the first test contact 332 and the second test contact 362 can be located on both sides of the second carrier 34 in one direction respectively.

[0094] It should be noted that the first test contact 332 and the second test contact 362 located on both sides of the second carrier 34 in one direction respectively can mean that the first test contact 332 and the second test contact 362 are located on opposite sides of the second carrier 34 in one direction respectively, but not limited to this, when the first test contact 332 and the second test contact 362 are located on both sides of the second carrier 34 in one direction respectively, the first test contact 332 can also be staggered between the second test contact 362.

[0095] For example, as shown in Figure 3 and Figure 6 One of the first test contact 332 and the second test contact 362 in the present disclosure can be located on one side of the second carrier 34 in the horizontal direction X, and the other can be located on one side of the second carrier 34 in the vertical direction Y. Or, the first test contact 332 and the second test contact 362 can be located on both sides of the second carrier 34 in the vertical direction Y respectively. Or, the first test contact 332 and the second test contact 362 can be located on both sides of the second carrier 34 in the horizontal direction X respectively. But not limited to this, the first test assembly 33 and the second test assembly 36 can also be located on one side of the second carrier 34 in other directions except the vertical direction Y and the horizontal direction X, which can be determined according to actual conditions.

[0096] As shown in Figure 1As shown, in some embodiments, the test device 1 can include two test mechanisms 3 arranged at intervals in the horizontal direction X, and the present disclosure can place one to-be-tested piece on each of the two test mechanisms 3 at the same time, so that the performance test of two to-be-tested pieces can be completed at the same time in one set of test device 1, thereby improving the test efficiency. In addition, the two test mechanisms 3 can share one machine box 2, thereby reducing the manufacturing cost of the test device 1.

[0097] It should be noted that two identical test mechanisms 3 can be arranged in one set of test device 1 for testing to-be-tested pieces of the same type. At this time, the two test mechanisms 3 can be arranged at intervals on opposite sides of the central axis of the machine box 2, and one test mechanism 3 can coincide with the other test mechanism 3 after being rotated by 180° around the central axis of the machine box 2. The central axis of the machine box 2 refers to the center line of the machine box 2 in the horizontal direction X.

[0098] However, the two test mechanisms 3 arranged in one set of test device 1 can also be different, so as to simultaneously test two to-be-tested pieces of different types.

[0099] It should also be noted that in one set of test device 1, the first test assembly 33 and the second test assembly 36 in the two test mechanisms 3 will not interfere with each other.

[0100] As shown in Figure 3 , Figure 6 and Figure 8 , for example, the first test contact 332 is located on one side of the second carrier 34 in the horizontal direction X, and the second test contact 362 is located on one side of the second carrier 34 in the vertical direction Y. At this time, the contact surfaces of the first test contacts 332 in the two test mechanisms 3 can be arranged oppositely, which can not only reduce the mutual interference of the two first test assemblies 33 during movement, but also reduce the spacing between the two test mechanisms 3, thereby reducing the occupied space of the test device 1. However, in addition to oppositely arranging the contact surfaces of the first test contacts 332 in the two test mechanisms 3, other positions that can reduce the mutual interference of the two first test assemblies 33 during movement can also be included in the embodiments of the present disclosure.

[0101] In addition, in some embodiments, the test mechanism 3 can also include a third test assembly 37, which can be configured to test the performance of a specific region of the to-be-tested piece.

[0102] In the present embodiment, the third test assembly 37 can be in communication connection with the machine box 2, and the third test assembly 37 can be configured to test the performance of a specific region of the to-be-tested piece under the control of the machine box 2.

[0103] It is to be noted that the third test assembly 37 is used to test the performance of different regions of the to-be-tested piece respectively with the first test assembly 33, the second test assembly 36 and the test element 32.

[0104] As shown in Figure 6 and Figure 8 In some embodiments, the third test assembly 37 can include a third driving piece 371 and a third test contact 372, the third test contact 372 is connected with the third driving piece 371, and the third driving piece 371 is configured to drive the third test contact 372 to test the second part of the to-be-tested piece.

[0105] For example, the third driving piece 371 in the present disclosure can be mounted on the bracket 35 and communicatively connected with the cabinet 2, and the third driving piece 371 is configured to drive the third test contact 372 to test the to-be-tested piece under the control of the cabinet 2.

[0106] In some embodiments, the third driving piece 371 can be detachably connected with the third test contact 372, so that the performance test of different types of to-be-tested pieces can be realized by replacing the test contact, which can improve the universality of the third test assembly 37 and save the test cost. In addition, when the third test contact 372 is damaged, the test performance of the third test assembly 37 can be ensured by replacing the third test contact 372.

[0107] In some embodiments of the present disclosure, the third test assembly 37 is used to perform contact test on the to-be-tested piece. If there is a certain gap between the third test assembly 37 and the corresponding test region on the to-be-tested piece after the to-be-tested piece is placed on the first carrier 31, the third test contact 372 can be driven by the third driving piece 371 to move towards the to-be-tested piece to make the third test contact 372 contact the to-be-tested piece, so as to realize the contact test. Of course, after the to-be-tested piece is placed on the first carrier 31, the to-be-tested piece can also directly contact the third test contact 372, so as to realize the contact test on the corresponding test region.

[0108] As shown in Figure 8 When the third test assembly 37 performs contact test on the to-be-tested piece, the present disclosure can open a third through hole 346 on the cavity wall opposite to the third test contact 372 in the accommodating cavity 341, and the third driving piece 371 is configured to drive the third test contact 372 to pass through the third through hole 346 to perform contact test on the third part under the control of the cabinet 2.

[0109] But not limited to this, in other embodiments of the present disclosure, the third test assembly 37 can also be used to perform non-contact test on the to-be-tested piece, which can be determined according to actual conditions.

[0110] In some embodiments, the third drive 371 may be mounted on the bracket 35.

[0111] Among them, one of the first test component 33, the second test component 36, and the third test component 37 can be located on one side of the second vehicle 34 in one direction, and the other two can be located on opposite sides of the second vehicle 34 in another direction. However, it is not limited to this; the first test component 33, the second test component 36, and the third test component 37 can also be located on one side of the second vehicle 34 in three different directions, depending on the actual situation.

[0112] In this embodiment of the disclosure, when the two test components are located on opposite sides of the second carrier 34 in one direction, it can mean that the test contacts of the two test components are located on opposite sides of the second carrier 34 in one direction, but it is not limited to this. It can also include the case where the test contacts of the two test components are staggered.

[0113] For example, one of the first test component 33, the second test component 36, and the third test component 37 in this disclosure may be located on one side of the second vehicle 34 in the horizontal direction X, and the other two may be located on opposite sides of the second vehicle 34 in the vertical direction Y. However, this is not a limitation; the first test component 33, the second test component 36, and the third test component 37 may also be located on one side of the second vehicle 34 in directions other than the vertical direction Y and the horizontal direction X, depending on the actual situation.

[0114] In some embodiments, when a set of test equipment 1 is provided with two test mechanisms 3, the first test component 33, the second test component 36 and the third test component 37 in the two test mechanisms 3 will not interfere with each other during use.

[0115] like Figure 3 , Figure 6 and Figure 8 As shown, taking the example where the first test contact 332 is located on one side of the second carrier 34 in the horizontal direction X, and the second test contact 362 is located on one side of the second carrier 34 in the vertical direction Y, the third test contact 372 and the second test contact 362 can be located on opposite sides of the second carrier 34 in the vertical direction Y. When the two first test components 33 move along the horizontal direction X, the first test component 33 in one test mechanism 3 will not collide with the structure in the other test mechanism 3, thus ensuring the smooth progress of the performance test.

[0116] In some embodiments, when the test mechanism 3 of this disclosure includes the above three sets of test components, two supports 35 may be provided in the test mechanism 3, and the two supports 35 may be respectively provided on opposite sides of the second carrier 34.

[0117] For example, as shown in Figure 3 The first test assembly 33 can be mounted on the bracket 35 on the side of the second carrier 34 close to the first test assembly 33, and the second test assembly 36 and the third test assembly 37 can be mounted on the bracket 35 on the side of the second carrier 34 away from the first test assembly 33, and the second test assembly 36 and the third test assembly 37 are vertically spaced on the bracket 35.

[0118] However, the first test assembly 33 and the second test assembly 36 can also be mounted on the bracket 35 on the side of the second carrier 34 close to the first test assembly 33, and the third test assembly 37 can be mounted on the bracket 35 on the side of the second carrier 34 away from the first test assembly 33 (the second test assembly 36 can be above or below the second carrier 34, and the third test assembly 37 can be below or above the second carrier 34), which can be determined according to actual conditions.

[0119] In some embodiments, the driving member of at least one test assembly can be slidingly mounted on the bracket 35. That is, at least one of the first driving member 331, the second driving member 361, and the third driving member 371 can be slidingly mounted on the bracket 35. The driving member is configured to move towards the to-be-tested member to adjust the pressure of the test contact of the same test assembly when the test contact is in contact with the to-be-tested member.

[0120] For example, as shown in Figure 7 The test mechanism 3 in the present disclosure can include a fixed plate 351 and an adjusting plate 352, the fixed plate 351 is fixedly connected with the bracket 35, the adjusting plate 352 is mounted on the fixed plate 351, and the driving member in the test assembly is mounted on the adjusting plate 352. The adjusting plate 352 can be connected with the fixed plate 351 by a screw. The driving member and the adjusting plate 352 can be fixedly connected by a screw.

[0121] The adjusting plate 352 is provided with a sliding groove, the extension direction of the sliding groove can be the same as the moving direction of the test assembly, the first test assembly 33 is mounted on the adjusting plate 352 and can slide along the sliding groove on the adjusting plate 352. When the test assembly moves to contact the to-be-tested member, the test contact moves towards the second carrier 34 under the driving of the driving member, and the driving member also slides along the sliding groove on the adjusting plate 352, thereby increasing the movable distance of the test assembly, so as to accurately adjust the contact pressure of the test contact on the to-be-tested member to adapt to different test requirements.

[0122] In addition, in some embodiments, the adjusting plate 352 can also slide relative to the fixed plate 351 along the moving direction of the test assembly, thereby driving the test assembly fixedly connected with the adjusting plate 352 to slide.

[0123] In some embodiments, the driving member can be an electromagnet, but is not limited thereto, and can also be a cylinder, a motor, or other driving element as the driving member of the present disclosure.

[0124] In some embodiments, the to-be-tested member can be an earphone.

[0125] At this time, the test items of the to-be-tested member by the test element 32, the first test assembly 33, the second test assembly 36, and the third test assembly 37 can include touch test, key test, conduction test, acoustic test, and the like.

[0126] For example, the test element 32 in the present disclosure can be a test microphone for acoustic curve test of the to-be-tested member. In this case, the sound outlet of the to-be-tested member can be directly opposite the test element 32.

[0127] The first test contact 332, the second test contact 362, and the third test contact 372 can be conductive silicone heads, probes, or the like for contact test of the to-be-tested member. It should be noted that the contact test of the to-be-tested member by the test contact can be direct contact test, but is not limited thereto, and a connecting member can also be provided on the test contact to achieve the contact test of the to-be-tested member by the test contact through contacting the connecting member with the to-be-tested member.

[0128] For example, the conductive silicone head can achieve the wearing detection of the to-be-tested member by long-time contact with the wearing detection point. The conductive silicone head can also achieve the touch detection of the to-be-tested member by repeatedly contacting the touch detection point for a short time.

[0129] The probe can achieve the conduction test of the to-be-tested member by testing the charging pin point (i.e., a metal contact or pin for charging connection).

[0130] When the to-be-tested member is an earphone, the cover 38 in the present disclosure can be a soundproof cover. The cover 38 as the acoustic shielding structure in the test mechanism 3 can isolate the to-be-tested member from external noise, thereby achieving acoustic test of the to-be-tested member.

[0131] In some embodiments, when the to-be-tested member is an earphone, the cover 38 can be made of metal material to ensure the structural strength of the cover 38, thereby reducing the risk of damage to the cover 38 and the to-be-tested member caused by external structures. However, the cover 38 in the present disclosure can also be made of other materials other than metal, which can be determined according to actual conditions.

[0132] In some embodiments, when the to-be-tested member is an earphone, the thickness of the cover body 38 can be set to 2 mm to ensure the sound insulation performance of the cover body 38. However, the thickness of the cover body 38 can also be greater than 2 mm or less than 2 mm, which can be determined according to actual conditions.

[0133] In addition, the present disclosure can also be provided with sound insulation structures such as egg cotton in the cover body 38 to improve the sound insulation performance of the cover body 38.

[0134] However, the to-be-tested member in the present disclosure can also be other structures other than earphones, which can be determined according to actual conditions.

[0135] It should be noted that the communication connection in the above can be wired connection or wireless connection.

[0136] In addition, when the test equipment 1 tests the performance of different regions of the to-be-tested member, the test element 32, the first test assembly 33, the second test assembly 36, and the third test assembly 37 can test different performances on different regions of the to-be-tested member, but the test element 32, the first test assembly 33, the second test assembly 36, and the third test assembly 37 can also test the same performance on different regions of the to-be-tested member, which can be determined according to actual conditions.

[0137] In the description of the present disclosure, the terms "first", "second", "third", and the like are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined with "first", "second", "third" can explicitly or implicitly include one or more features. In the description of the present application, the meaning of "a plurality of" is two or more, unless otherwise specifically limited.

[0138] In addition, it should be noted that "up", "down", "left", "right", and the like are only used for differentiation to facilitate description, and do not limit the position of the embodiments of the present application, for example, the "up" can be "down", "left", "right", and the like in practice. In the present disclosure, unless otherwise specifically specified and limited, the terms "assembly", "connection" and the like should be understood in a broad sense, for example, it can be fixed connection, or detachable connection, or integrated; it can be mechanical connection, or electrical connection; it can be direct connection, or indirect connection through an intermediate medium; it can be the internal communication of two elements or the interaction relationship between two elements. For those skilled in the art, the specific meaning of the above terms in the present disclosure can be understood according to the specific circumstances.

[0139] In the description of the specification, the description of the terms "some embodiments", "exemplarily" and the like means that the specific features, structures, materials or characteristics described in connection with the embodiments or examples are contained in at least one embodiment or example of the present application. In the specification, the illustrative description of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any appropriate manner in any one or more embodiments or examples. In addition, the person skilled in the art can combine and combine the different embodiments or examples described in the specification and the features of the different embodiments or examples without contradiction.

[0140] Although the embodiments of the present application have been shown and described above, it is understood that the above embodiments are exemplary and cannot be construed as limiting the present application, and those skilled in the art can make changes, modifications, replacements and variations to the above embodiments within the scope of the present application. Any changes or modifications made in accordance with the claims and specification of the present application shall be within the scope of the present application.

Claims

1. A test apparatus, characterized by, The test device comprises: a test mechanism comprising a first carrier, a test element and a first test assembly; wherein the first carrier is configured to accommodate at least a portion of a test piece, the test element is located on the first carrier, and the test element and the first test assembly are configured to test the performance of different regions of the test piece, respectively.

2. The test apparatus of claim 1, wherein, The test piece has a first portion, the first carrier is provided with an accommodation groove configured to accommodate the first portion, the first test assembly is located outside the accommodation groove, and a mounting groove is formed in a groove bottom surface of the accommodation groove, and the test element is embedded in the mounting groove.

3. The test device according to claim 1, wherein: the first test assembly comprises a first driving member and a first test contact, the first test contact is connected to the first driving member, and the first driving member is configured to drive the first test contact to contact test the test piece.

4. The test apparatus of claim 3, wherein, The test piece has a second portion, and the test mechanism further comprises a second carrier, the second carrier is formed with a receiving cavity configured to accommodate the second portion.

5. The test device according to claim 4, wherein: the test mechanism further comprises a second test assembly, the second test assembly comprises a second driving member and a second test contact, the second test contact is connected to the second driving member, and the second driving member is configured to drive the second test contact to contact test the second portion.

6. The test device according to claim 5, wherein: one of the first test contact and the second test contact is located on one side of the second carrier in a horizontal direction, and the other is located on one side of the second carrier in a vertical direction; or the first test contact and the second test contact are located on both sides of the second carrier in the horizontal direction; or the first test contact and the second test contact are located on both sides of the second carrier in the vertical direction.

7. The test apparatus of claim 6, wherein, The first test contact is located on one side of the second carrier in the horizontal direction, and the second test contact is located on one side of the second carrier in the vertical direction, wherein: the test device comprises two test mechanisms arranged in the horizontal direction, and the contact surfaces of the first test contacts of the two test mechanisms are oppositely arranged; and / or the test mechanism further comprises a third test assembly, the third test assembly comprises a third driving member and a third test contact, the third test contact is connected to the third driving member, the third test contact and the second test contact are located on both sides of the second carrier in the vertical direction, and the third driving member is configured to drive the third test contact to contact test the second portion.

8. The test apparatus of any one of claims 3 to 7, wherein, In at least one test assembly, the test contact and the driving member are detachably connected.

9. The test apparatus of any one of claims 3 to 7, wherein, The test mechanism further comprises a support, and the first carrier is mounted on the support. A driving member of at least one test assembly is slidingly mounted on the bracket, and is configured to be movable relative to the bracket toward the direction of the to-be-tested member to adjust the pressure of the test contacts of the same test assembly when the test contacts are in contact with the to-be-tested member for testing.

10. The test apparatus of claim 2, wherein, The test mechanism further comprises a cover configured to be mounted on the first carrier after at least a part of the to-be-tested member is located in the accommodating groove to cover the accommodating groove.

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