Vertical double-sided module test seat
By designing a vertical double-sided module test stand, the problem of inefficient testing of electronic devices with pin interference was solved. It achieves rapid limiting of pin interference and efficient heat dissipation, ensuring efficient testing of electronic devices in new energy vehicles.
Patent Information
- Application Number
- CN202423209451.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-25
- Publication Date
- 2025-12-19
- Estimated Expiration
- 2034-12-25
AI Technical Summary
Existing conventional test sockets cannot effectively test electronic devices with interfering pin shapes, resulting in low testing efficiency.
A vertical double-sided module test stand was designed, comprising a test stand cover and a base. The base is provided with pin positioning slots, heat dissipation pressure blocks and support blocks, and the device can be quickly positioned and efficiently dissipated by rotating the locking block and buffer spring.
It enables rapid positioning and efficient heat dissipation for electronic devices with pin interference, ensuring efficient testing of electronic devices used in new energy vehicles.
Smart Images
Figure CN223692412U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to electronic device test technical field, concretely relates to vertical double -sided module test seat. BACKGROUND
[0002] With the development of new energy automobile industry, the vehicle enterprise puts forward various test requirements to various electronic components such as power module used on the automobile. Unlike conventional electronic components, the device is usually designed by the manufacturer based on the internal space and structure of the automobile, and the electronic component manufacturer is entrusted to produce the product.
[0003] At present, the electronic device used on the new energy automobile is mainly tested by means of conventional test seat, however, the conventional test seat can only test some regular electronic devices with pins, and the conventional test seat is no longer applicable to some electronic devices with pin interference, so that the electronic device with pin interference cannot be tested efficiently. UTILITY MODEL CONTENTS
[0004] (I) technical problem to be solved
[0005] The utility model to be solved technical problem is in view of the present situation of prior art, provide a kind of vertical double -sided module test seat, which can be quickly positioned and tested for electronic devices with pin interference, and ensure efficient heat dissipation of electronic devices during testing.
[0006] (II) technical scheme
[0007] The utility model discloses a vertical double -sided module test seat, including test seat upper cover, the test seat upper cover lower side is provided with test seat base, the test seat upper cover middle part is installed with heat dissipation pressing block, the test seat base upper middle part is correspondingly installed with heat dissipation support block at heat dissipation pressing block, the test seat base upper both sides are reserved with the pin positioning slot corresponding to the wide pin on the device body, test probe is further installed on the test seat base upper and positioned at the pin positioning slot side.
[0008] Further, the test seat upper cover one side wall middle part is installed with rotating clamping block, and the test seat base is provided with limiting clamping groove corresponding to the rotating clamping block.
[0009] By adopting the above technical scheme, the rotating clamping block and the limiting clamping groove jointly constitute a locking assembly, after the test seat upper cover and the test seat base are closed, the rotating clamping block is clamped into the limiting clamping groove, so that reliable closure locking of the test seat upper cover and the test seat base can be realized.
[0010] Further, the rotating clamping block is a hook-shaped structure, and the rotating clamping block is connected with the upper cover of the test seat through a snap spring shaft.
[0011] By adopting the above technical scheme, under the action of the snap spring shaft, the rotating clamping block can be conveniently rotated relative to the upper cover of the test seat, and the rotating clamping block can be automatically reset after rotation.
[0012] Further, a buffer spring is arranged between the side, which is opposite to the heat dissipation support block, of the heat dissipation pressing block and the upper cover of the test seat.
[0013] By adopting the above technical scheme, the buffer spring is designed, so that the heat dissipation pressing block has certain buffering capacity, and the device body is prevented from being damaged by the heat dissipation pressing block during testing.
[0014] Further, the buffer spring is four, and the buffer spring is inserted and connected with the upper cover of the test seat and the heat dissipation pressing block.
[0015] By adopting the above technical scheme, the buffer spring is inserted and fixed at both ends, so that reliable insertion and fixation of the buffer spring can be ensured.
[0016] Further, the heat dissipation support block penetrates the test seat base and is bolted with the test seat base, and the top end of the heat dissipation support block is higher than the upper end surface of the test seat base.
[0017] By adopting the above technical scheme, the top end of the heat dissipation support block is higher than the upper end surface of the test seat base, so that the device body has certain heat dissipation space at the bottom during testing.
[0018] Further, the test probe is in contact with the part, which is not bent, of the device body, and the test probe is provided with a spring between the test seat base.
[0019] By adopting the above technical scheme, the spring is designed, so that the test probe has certain buffering capacity.
[0020] (Three) beneficial effects
[0021] Compared with the prior art, the utility model has the following beneficial effects:
[0022] In order to solve the problem that the electronic devices used in new energy vehicles are mainly tested by means of conventional test seats at present, however, the conventional test seats can only test some electronic devices with regular pins, and the conventional test seats are no longer applicable to some electronic devices with interfering pins, so that the electronic devices with interfering pins cannot be tested efficiently, the utility model discloses a test seat base is opened in advance with the pin positioning groove corresponding to the wide pin on the device body, and the heat dissipation support block is installed on the test seat base, the pin positioning groove can realize the quick limiting of the electronic devices with interfering pins on the test seat base, and the heat dissipation support block and the heat dissipation support block can realize the efficient heat dissipation of the device body in the compression test, so that the efficient test of the new energy vehicle electronic devices with interfering pins is ensured. BRIEF DESCRIPTION OF DRAWINGS
[0023] Fig. 1 It is the top view of the vertical double-sided module test seat of the utility model when the device body is not installed.
[0024] Fig. 2 It is the bottom view of the vertical double-sided module test seat of the utility model when the device body is not installed.
[0025] Fig. 3 It is the left sectional view of the vertical double-sided module test seat of the utility model when the device body is not installed.
[0026] Fig. 4 It is the main sectional view of the vertical double-sided module test seat of the utility model when the device body is installed.
[0027] The signs are explained as follows:
[0028] 1, rotating clamping block, 2, heat dissipation pressing block, 3, test seat upper cover, 4, test seat base, 5, pin positioning groove, 6, heat dissipation support block, 7, limiting clamping groove, 8, test probe, 9, buffer spring, 10, device body. DETAILED DESCRIPTION
[0029] In order to make the purpose, technical scheme and advantages of the utility model more clear and obvious, the utility model is further described in detail below by combining with the drawings and examples.
[0030] As Figs. 1-4As shown, the vertical double-sided module test seat in the embodiment includes a test seat upper cover 3, the lower side of the test seat upper cover 3 is provided with a test seat base 4, the middle part of the test seat upper cover 3 is installed with a heat dissipation pressing block 2, the upper middle part of the test seat base 4 is installed with a heat dissipation supporting block 6 corresponding to the heat dissipation pressing block 2, the two sides of the test seat base 4 are reserved with pin positioning grooves 5 corresponding to the wide pins on the device body 10, the pin positioning grooves 5 can position the wide pins on the device body 10, the test seat base 4 is also installed with test probes 8 beside the pin positioning grooves 5, the test probes 8 can contact the unbent part of the pins of the device body 10, so as to realize the normal test of the device body 10, the heat dissipation pressing block 2 and the heat dissipation supporting block 6 can realize the efficient heat dissipation of the device body 10 in the test process, so as to ensure the efficient test process.
[0031] As shown in the figure, Figs. 1-4 In the embodiment, a rotating clamping block 1 is installed in the middle part of one side wall of the test seat upper cover 3, a limiting clamping groove 7 is opened in the position of the test seat base 4 corresponding to the rotating clamping block 1, the rotating clamping block 1 and the limiting clamping groove 7 jointly constitute a locking assembly, after the test seat upper cover 3 and the test seat base 4 are closed, the rotating clamping block 1 is clamped into the limiting clamping groove 7, the reliable closure and locking of the test seat upper cover 3 and the test seat base 4 can be realized, the rotating clamping block 1 is a hook-shaped structure, the rotating clamping block 1 and the test seat upper cover 3 are connected through a clamping spring shaft, under the action of the clamping spring shaft, not only the convenient rotation of the rotating clamping block 1 relative to the test seat upper cover 3 can be realized, but also the automatic rotation reset of the rotating clamping block 1 after rotation can be realized.
[0032] As shown in the figure, Figs. 1-4 In the embodiment, a buffer spring 9 is also installed between the side of the heat dissipation pressing block 2 opposite to the heat dissipation supporting block 6 and the test seat upper cover 3, the design of the buffer spring 9 enables the heat dissipation pressing block 2 to have certain buffering capacity, avoiding the damage of the device body 10 by the heat dissipation pressing block 2 during the test, the buffer spring 9 has four, the buffer spring 9 is inserted and connected with the test seat upper cover 3 and the heat dissipation pressing block 2, the two ends of the buffer spring 9 are respectively inserted and fixed, which can ensure the reliable installation and fixation of the buffer spring 9.
[0033] As shown in the figure, Figs. 1-4 In the embodiment, the heat dissipation supporting block 6 penetrates through the test seat base 4 and is bolted with the test seat base 4, the top end of the heat dissipation supporting block 6 is higher than the upper end surface of the test seat base 4, which can enable the bottom of the device body 10 to have certain heat dissipation space during the test, the test probe 8 contacts the unbent part of the device body 10, the test probe 8 and the test seat base 4 are also provided with a spring, the design of the spring enables the test probe 8 to have certain buffering capacity.
[0034] The specific implementation process of the embodiment is as follows: during testing, first, the device body 10 to be tested is placed on the test seat base 4, and the unbent part of the pin on the device body 10 is in contact with the test probe 8, then only the test seat upper cover 3 is pressed and locked, and the test seat is connected with the external test instrument, and the electronic device for new energy vehicles with pin interference can be tested, wherein during the testing process, the pin positioning groove 5 corresponding to the wide pin on the device body 10 is pre-formed on the test seat base 4, the heat dissipation pressing block 2 is installed on the test seat upper cover 3, and the heat dissipation supporting block 6 is installed on the test seat base 4, so that the electronic device with pin interference can be quickly limited on the test seat base 4 under the action of the pin positioning groove 5, and the device body 10 during the pressing test is efficiently cooled by cooperating with the heat dissipation pressing block 2 and the heat dissipation supporting block 6, thereby ensuring efficient testing of the electronic device for new energy vehicles with pin interference.
[0035] The above description of the disclosed embodiments enables one skilled in the art to make or use the present application. Various modifications to these embodiments will be apparent to those skilled in the art, and the generic principles defined herein can be applied to other embodiments without departing from the spirit or scope of the present application. Thus, the present application is not to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims
1. A vertical dual-sided module test socket, characterized by: The utility model provides a test seat, including test seat upper cover (3), test seat upper cover (3) lower side is equipped with test seat base (4), the middle part of test seat upper cover (3) is installed with heat dissipation press block (2), the upper middle part of test seat base (4) is installed with heat dissipation support block (6) correspondingly to heat dissipation press block (2), the both sides of test seat base (4) are reserved with the pin positioning groove (5) corresponding to the wide pin on the device body (10) upper side, test probe (8) is still installed on test seat base (4) and is located the pin positioning groove (5) side.
2. The vertical dual-sided module test socket of claim 1, wherein: The middle part of one side wall of test seat upper cover (3) is installed with rotating clamping block (1), and the position corresponding to rotating clamping block (1) on test seat base (4) is provided with limiting clamping groove (7).
3. The vertical dual-sided module test socket of claim 2, wherein: Rotating clamping block (1) is hook structure, and rotating clamping block (1) and test seat upper cover (3) are connected through snap spring shaft.
4. The vertical dual-sided module test socket of claim 1, wherein: Buffer spring (9) is installed between the side of heat dissipation press block (2) opposite heat dissipation support block (6) and test seat upper cover (3).
5. The vertical dual-sided module test socket of claim 4, wherein: Buffer spring (9) has four, and buffer spring (9) is inserted with test seat upper cover (3) and heat dissipation press block (2).
6. The vertical dual-sided module test socket of claim 1, wherein: Heat dissipation support block (6) penetrates test seat base (4) and is bolted with test seat base (4), and the top end of heat dissipation support block (6) is higher than the upper end surface of test seat base (4).
7. The vertical dual-sided module test socket of claim 1, wherein: Test probe (8) contacts the part not being bent on device body (10), and spring is further arranged between test probe (8) and test seat base (4).