Semiconductor chip test probe convenient to assemble and disassemble
By designing a semiconductor chip test probe with easily replaceable needles, the problem of inconvenient replacement of existing probes is solved, the detection range is expanded, it can adapt to the detection needs of various circuit boards, and the ease of use and detection efficiency are improved.
Patent Information
- Application Number
- CN202423004548.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-06
- Publication Date
- 2025-12-23
- Estimated Expiration
- 2034-12-06
AI Technical Summary
Existing semiconductor chip test probes are inconvenient to change when changing probes and are difficult to adapt to the testing needs of different modules.
A semiconductor chip test probe was designed, comprising a needle tube, a needle tip, and a spring structure. The needle tip can be easily replaced through a snap-fit method using a sleeve and a slot, and the detection range can be expanded and the stability of the robotic arm connection can be enhanced through the design of a claw block and a ball bearing.
It enables convenient mounting and dismounting of probes, expands the detection range, adapts to the detection needs of different circuit boards, and improves ease of use and detection efficiency.
Smart Images
Figure CN223711680U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of semiconductor chip test probe technology, specifically a semiconductor chip test probe that is easy to install and remove. Background Technology
[0002] A test probe is a tool that uses pressure and voltage to detect whether a circuit can flow out of a plate. It tests various chips, wafers, and other objects on the surface of a circuit board through multiple contacts. The top of the probe is held by a robotic arm, while the bottom is held in contact with the object to be tested by a spring.
[0003] However, traditional probes often only have a single needle for detection. Different probes need to be replaced for different sections. Ordinary probes are often assembled with a syringe, which is inconvenient to disassemble or replace with other needles, making them quite inconvenient to use.
[0004] Now, a novel semiconductor chip test probe that is easy to install and remove is proposed to solve the above problems. Utility Model Content
[0005] The purpose of this invention is to provide a semiconductor chip test probe that is easy to install and remove, so as to solve the problem of inconvenient replacement of test probes mentioned in the background art.
[0006] To achieve the above objectives, this utility model provides the following technical solution: a semiconductor chip test probe that is easy to assemble and disassemble, comprising a needle tube and a cylindrical chamber. A cylindrical chamber is provided between the two sides inside the needle tube. A needle head one is fixedly connected to the left side of the needle tube, and a needle head two is movably inserted into the right side inside the needle tube. Ball bearings are respectively embedded above and below the left side of the needle head two. A left connecting block is fixed to the right side of the needle head one, and a right connecting block is fixed to the left side of the needle head two. A spring is welded at the center between the left and right connecting blocks. A sleeve block is sleeved on the right side of the needle tube, and a housing is welded to the right side of the sleeve block. Positioning rods are respectively welded to the upper and lower left sides of the sleeve block, and a locking block is fixed to the lower left corner of the positioning rod. A locking groove is provided at the top and bottom of the right side of the needle tube. A through groove is provided at the center of the inside of the housing, and the needle head two is embedded in the through groove. A slot is provided at the top and bottom of the left side of the sleeve block.
[0007] As a further technical solution of this utility model, the card block is embedded inside the card slot, and the sleeve block, shell and needle tube are arranged in concentric circles.
[0008] As a further technical solution of this utility model, the ball is attached to the inner wall of the cylindrical cavity, and the second needle is made of beryllium copper plated with gold.
[0009] As a further technical solution of this utility model, four sets of holes and grooves are provided around the left side of the outside of the needle tube, and a rubber ring is fixed in the hole of the hole and groove.
[0010] As a further technical solution of this utility model, four sets of claw blocks are fixedly connected to the left side of the first needle, and a groove is formed between the claw blocks and the first needle.
[0011] As a further technical solution of this utility model, the needle and the four sets of claw blocks form a crown-shaped detection structure, and the claw blocks are made of palladium alloy material.
[0012] Compared with the prior art, the beneficial effects of this utility model are: this semiconductor chip test probe, which is easy to install and disassemble, not only makes it easy to replace a certain needle and realizes dual-head detection, but also makes it easy to snap and fix the needle tube.
[0013] By attaching a sleeve block to the right side of the syringe, the sleeve block is snapped and fixed to the syringe from the right side. When the two sets of positioning rods connected to the left side of the sleeve block are respectively inserted into the slots by the snap block, the sleeve block can be prevented from detaching from the slots of the syringe. Alternatively, a tool can be inserted from the corresponding slot to squeeze the positioning rod and pull out the sleeve block and the housing, and then the needle can be removed for replacement. It is also convenient to replace different needle structures.
[0014] A needle is fixedly connected to the left side of the syringe, and a needle is movably inserted into the right side inside the syringe. The needles are fixed with horizontal springs by the left and right connecting blocks respectively. The claw blocks on the left can form a crown-shaped structure for detecting larger solder joints, pins, planes, etc. The needle on the right is more rounded and can detect dense gold fingers under the push of the spring, thus expanding the detection range of the test probe.
[0015] By setting four sets of holes and slots around the left side of the needle tube, and leaving holes and slots on the left side of the needle tube surface for connecting other accessories such as robotic arms, and installing matching rubber rings on the inner walls of the holes and slots, the frictional resistance when the connecting accessories come into contact can be increased, preventing the needle tube from separating from the robotic arm and other objects. It also allows the orientation of needle one and needle two to be changed and different circuit boards to be detected separately, making it convenient for the device to use this detection structure. Attached Figure Description
[0016] Figure 1 This is a front view cross-sectional structural diagram of the present invention;
[0017] Figure 2 This is a front view structural diagram of the needle of this utility model;
[0018] Figure 3 This is a side view of the needle structure of this utility model;
[0019] Figure 4This is a frontal cross-sectional view of the needle tube of this utility model.
[0020] In the diagram: 1. Needle tube; 2. Cylindrical chamber; 3. Spring; 4. Groove; 5. Rubber ring; 6. Left connecting block; 7. Needle one; 8. Claw block; 9. Groove; 10. Sleeve block; 11. Housing; 12. Needle two; 13. Through groove; 14. Ball bearing; 15. Slot; 16. Locking block; 17. Positioning rod; 18. Right connecting block; 19. Groove opening. Detailed Implementation
[0021] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0022] Please see Figures 1-4 This utility model provides an embodiment of a semiconductor chip test probe that is easy to assemble and disassemble, comprising a needle tube 1 and a cylindrical chamber 2. The cylindrical chamber 2 is disposed between the two sides inside the needle tube 1. A first needle 7 is fixedly connected to the left side of the needle tube 1, and a second needle 12 is movably inserted into the right side inside the needle tube 1. Ball bearings 14 are respectively embedded above and below the left side of the second needle 12. A left connecting block 6 is fixed to the right side of the first needle 7, and a right connecting block 18 is fixed to the left side of the second needle 12. The left connecting block 6 and the right connecting block 18 are connected together. A spring 3 is welded at the center between the connecting blocks 18. A sleeve block 10 is sleeved on the right side of the needle tube 1, and a housing 11 is welded to the right side of the sleeve block 10. A positioning rod 17 is welded to the upper and lower left sides of the sleeve block 10, and a locking block 16 is fixed to the lower left corner of the positioning rod 17. A locking groove 15 is provided at the top and bottom of the right side of the needle tube 1. A through groove 13 is provided at the center of the inside of the housing 11, and the second needle 12 is embedded in the through groove 13. A slot 19 is provided at the top and bottom of the left side of the sleeve block 10.
[0023] The card block 16 is embedded inside the card slot 15. The sleeve block 10, the shell 11 and the needle tube 1 are arranged in concentric circles. The ball 14 is attached to the inner wall of the cylindrical chamber 2. The second needle 12 is made of beryllium copper plated with gold.
[0024] Specifically, such as Figure 1 and Figure 4 As shown, when the sleeve 10 is snapped and fixed onto the needle tube 1 from the right side, and the two sets of positioning rods 17 connected to the left side of the sleeve 10 are respectively inserted into the slots 15 through the locking blocks 16, the sleeve 10 can be prevented from detaching from the slots 15 of the needle tube 1. Alternatively, a tool can be inserted from the corresponding slot 19 to squeeze the positioning rods 17 and pull out the sleeve 10 and the housing 11, and then the needle 12 and other items can be removed for replacement.
[0025] Four sets of holes and grooves 4 are provided around the left side of the outside of the needle tube 1, and a rubber ring 5 is fixed in the hole of the hole and groove 4.
[0026] Specifically, such as Figure 1 , Figure 2 and Figure 3 As shown, a needle 7 is fixedly connected to the left side of the needle tube 1, and a needle 12 is movably inserted into the right side inside the needle tube 1. The needle 7 and the needle 12 are respectively fixed to the horizontal spring 3 by the left connecting block 6 and the right connecting block 18. The claw block 8 on the left side can form a crown-shaped structure for detecting larger solder joints, pins, planes, etc. The needle 12 on the right side is more rounded and can detect dense gold fingers under the push of the spring 3.
[0027] Four sets of claw blocks 8 are fixedly connected to the left side of the needle 7. A slot 9 is formed between the claw blocks 8 and the needle 7. The needle 7 and the four sets of claw blocks 8 form a crown-shaped detection structure. The claw blocks 8 are made of palladium alloy material.
[0028] Specifically, such as Figure 1 and Figure 2 As shown, the left side of the surface of the needle tube 1 has a slot 4 for connecting other accessories such as the robotic arm, and the inner wall of the slot 4 is equipped with a matching rubber ring 5, which can increase the frictional resistance when the connecting accessories come into contact, prevent the needle tube 1 from separating from the robotic arm and other objects, and also allow the orientation of the first needle 7 and the second needle 12 to be changed and different circuit boards to be detected respectively.
[0029] Working principle: In use, the sleeve 10 is first snapped onto the needle tube 1 from the right side. When the two sets of positioning rods 17 connected to the left side of the sleeve 10 are respectively inserted into the slots 15 by the locking blocks 16, the sleeve 10 is prevented from detaching from the slots 15 of the needle tube 1. Alternatively, a tool can be inserted from the corresponding slot 19 to squeeze the positioning rods 17 and pull out the sleeve 10 and the housing 11. Then, the needle 12 and other items can be removed and replaced. The first needle 7 and the second needle 12 are respectively fixed to the transverse springs by the left connecting block 6 and the right connecting block 18. Spring 3 and the claw block 8 on the left can form a crown-shaped structure for detecting larger solder joints, pins, planes, etc. The needle 12 on the right is more rounded and can detect dense gold fingers under the push of spring 3. The left side of the needle tube 1 also has a slot 4 for connecting other accessories such as robotic arms. The inner wall of the slot 4 is equipped with a matching rubber ring 5, which can increase the frictional resistance when the connecting accessories are in contact, prevent the needle tube 1 from separating from the robotic arms, etc., and also allow the orientation of needle 7 and needle 12 to be changed and different circuit boards to be detected separately.
[0030] It will be apparent to those skilled in the art that this invention is not limited to the details of the exemplary embodiments described above, and that it can be implemented in other specific forms without departing from the spirit or essential characteristics of this invention. Therefore, the embodiments should be considered illustrative and non-limiting in all respects, and the scope of this invention is defined by the appended claims rather than the foregoing description. Thus, it is intended that all variations falling within the meaning and scope of equivalents of the claims be included within this invention. No reference numerals in the claims should be construed as limiting the scope of the claims.
Claims
1. A semiconductor chip test probe that is easy to install and remove, comprising a needle tube (1) and a cylindrical chamber (2), characterized in that: A cylindrical chamber (2) is provided between the two sides inside the needle tube (1). A needle head one (7) is fixedly connected to the left side of the needle tube (1). A needle head two (12) is movably inserted into the right side of the needle tube (1). Ball bearings (14) are respectively embedded above and below the left side of the needle head two (12). A left connecting block (6) is fixed to the right side of the needle head one (7). A right connecting block (18) is fixed to the left side of the needle head two (12). A spring (3) is welded at the center between the left connecting block (6) and the right connecting block (18). A sleeve block (10) is fitted on the right side of the tube (1), and a housing (11) is welded to the right side of the sleeve block (10). A positioning rod (17) is welded to the upper and lower left sides of the sleeve block (10), and a locking block (16) is fixed to the lower left corner of the positioning rod (17). A locking groove (15) is provided at the top and bottom of the right side of the needle tube (1). A through groove (13) is provided at the center of the inside of the housing (11), and the needle tip (12) is embedded in the through groove (13). A slot (19) is provided at the top and bottom of the left side of the sleeve block (10).
2. The semiconductor chip test probe that is easy to install and remove according to claim 1, characterized in that: The card block (16) is embedded inside the card slot (15), and the sleeve block (10), the shell (11) and the needle tube (1) are arranged in concentric circles.
3. The semiconductor chip test probe that is easy to install and remove according to claim 1, characterized in that: The ball (14) is attached to the inner wall of the cylindrical cavity (2), and the needle (12) is made of beryllium copper plated with gold.
4. The semiconductor chip test probe that is easy to install and remove according to claim 1, characterized in that: The needle tube (1) has four sets of holes (4) around its left side, and a rubber ring (5) is fixed in the hole of the hole (4).
5. A semiconductor chip test probe that is easy to install and remove according to claim 1, characterized in that: Four sets of claw blocks (8) are fixedly connected to the left side of the needle (7), and a groove (9) is formed between the claw blocks (8) and the needle (7).
6. A semiconductor chip test probe that is easy to install and remove according to claim 1, characterized in that: The needle (7) and the four claw blocks (8) form a crown-shaped detection structure, and the claw blocks (8) are made of palladium alloy material.