Detection equipment for memory device

Abstract

The utility model discloses detection equipment for a memory device, which relates to the technical field of memory testing and comprises a controller, a communication component, an interaction component, a power supply component and a data storage component, and the communication component, the interaction component, the power supply component and the data storage component are all electrically connected with the controller. The communication assembly, the interaction assembly and the data storage assembly are electrically connected with the power supply assembly; the power supply assembly is used for supplying power to the communication assembly, the interaction assembly and the data storage assembly; and the controller is in communication connection with the upper computer through the communication assembly and is used for acquiring test parameters configured by the upper computer and carrying out positioning test or full-chip test on the to-be-tested storage device installed and replaced on the interaction assembly according to the test parameters. According to the utility model, rapid replacement of the to-be-tested memory device and visualization of the test result are realized through the interaction assembly, the test efficiency is improved, test parameters configured by the upper computer are obtained through the communication assembly, the operability is improved, and the detection equipment is small in size, easy to carry and convenient to use.

Description

Technical Field

[0001] This utility model relates to the field of memory testing technology, and in particular to a testing device for memory devices. Background Technology

[0002] In the development of embedded devices, if there is a need for data storage after power failure, a memory chip is incorporated into the hardware development process to solve the data storage problem. Common memory devices include Flash chips and EEPROM chips. The security of data storage in memory devices is crucial to the reliability of embedded devices; therefore, reliability testing of Flash chips and EEPROM chips, as storage media, is also essential. The reliability of memory devices is generally determined by the number of times they can be erased and rewritten to determine whether they meet standards.

[0003] While existing storage devices undergo reliability testing before leaving the factory, defective units inevitably end up in the embedded device production process. Embedded device manufacturers typically outsource the reliability testing of purchased storage devices to third parties, or they may develop test code for the storage devices on the embedded device itself to achieve reliability testing. However, outsourcing the reliability testing to third parties is costly, has a long production cycle, and cannot meet the demands of large-scale supply. On the other hand, adding storage test code to the embedded device for reliability testing requires replacing both the storage device and the test program, which is inconvenient and inefficient.

[0004] In the process of realizing this utility model, the applicant discovered that the prior art has at least the following problems:

[0005] Existing reliability testing methods for storage devices cannot adequately meet user needs. Utility Model Content

[0006] The purpose of this invention is to provide a testing device for storage devices, thereby solving the technical problem that existing reliability testing methods for storage devices cannot adequately meet user needs. The preferred technical solutions among the various technical solutions provided by this invention and their numerous technical effects are detailed below.

[0007] To achieve the above objectives, the present invention provides the following technical solution:

[0008] This utility model provides a testing device for storage devices, comprising a controller, a communication component, an interaction component, a power supply component, and a data storage component. The communication component, interaction component, power supply component, and data storage component are all electrically connected to the controller. The communication component, interaction component, and data storage component are all electrically connected to the power supply component, which supplies power to the communication component, interaction component, and data storage component. The controller communicates with a host computer through the communication component to obtain test parameters configured by the host computer, and performs positioning tests or full-chip tests on the storage device under test installed or replaced on the interaction component according to the test parameters.

[0009] Optionally, the controller is model SCM301.

[0010] Optionally, the interactive component includes a display screen, a storage device test interface, and buttons. The display screen, the storage device test interface, and the buttons are all electrically connected to the controller. The testing device is detachably connected to the storage device under test through the storage device test interface for installing and replacing the storage device under test.

[0011] Optionally, the testing device further includes a fixing cover, which is fixed to the test interface of the storage device on which the storage device under test is installed, for encapsulating the storage device under test.

[0012] Optionally, the button is used to switch the current test state of the detection device and switch the display page of the display screen.

[0013] Optionally, the display screen is used to display the current test status, wherein the current test status includes a preparation status, a test process status, a run error status, and an end status, and the test data displayed in the test process status includes the current number of tests completed and the current number of test errors.

[0014] Optionally, the communication component includes a data communication interface, and the communication protocol between the data communication interface and the host computer is the RS-485 communication protocol.

[0015] Optionally, the power supply component includes a TYPE-C charging interface or a USB charging interface, and the detection device is connected to an external power source through the TYPE-C charging interface or the USB charging interface.

[0016] Optionally, the data storage component includes a storage chip for storing the test parameters and test data during the test process, and the storage chip transmits the test data to the host computer through the communication component.

[0017] Implementing one of the above-described technical solutions of this utility model has the following advantages or beneficial effects:

[0018] This invention enables rapid replacement of the storage device under test and visualization of test results through interactive components, thereby improving testing efficiency. It also improves operability by acquiring test parameters configured by the host computer through communication components. The testing device is small in size, easy to carry, and convenient to use. Attached Figure Description

[0019] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort. In the drawings:

[0020] Figure 1 This is a first structural schematic diagram of an embodiment of the present utility model;

[0021] Figure 2 This is a second structural schematic diagram of an embodiment of the present utility model. Detailed Implementation

[0022] To make the objectives, technical solutions, and advantages of this utility model clearer, various exemplary embodiments described below will be referenced to the accompanying drawings, which form part of the exemplary embodiments, illustrating various exemplary embodiments that may be adopted to implement this utility model. Unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this disclosure. It should be understood that they are merely examples of processes, methods, and apparatuses consistent with some aspects of this utility model disclosed as detailed in the appended claims, and other embodiments may be used, or structural and functional modifications may be made to the embodiments listed herein without departing from the scope and spirit of this utility model.

[0023] In the description of this utility model, it should be understood that the terms "center," "longitudinal," "lateral," etc., indicate the orientation or positional relationship based on the accompanying drawings, and are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the referred element must have a specific orientation, or be constructed and operated in a specific orientation. The terms "first," "second," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. The term "multiple" means two or more. The terms "connected" and "linked" should be interpreted broadly, for example, they can be fixed connections, detachable connections, integral connections, mechanical connections, electrical connections, communication connections, direct connections, indirect connections through an intermediate medium, and can be the internal connection of two elements or the interaction relationship between two elements. The term "and / or" includes any and all combinations of one or more of the related listed items. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0024] To illustrate the technical solution described in this utility model, specific embodiments are described below, showing only the parts related to the embodiments of this utility model.

[0025] Example 1:

[0026] like Figure 1As shown, this utility model provides a testing device for storage devices, including a controller, a communication component, an interaction component, a power supply component, and a data storage component. The communication component, interaction component, power supply component, and data storage component are all electrically connected to the controller. The communication component, interaction component, and data storage component are all electrically connected to the power supply component, which supplies power to the communication component, interaction component, and data storage component. The controller communicates with a host computer through the communication component to obtain test parameters configured by the host computer and performs positioning tests or full-chip tests on the storage device under test installed or replaced on the interaction component according to the test parameters. Specifically, the communication component, interaction component, power supply component, and data storage component are all electrically connected to the controller, which is a main control chip (MCU) used to control the communication component, interaction component, power supply component, and data storage component. The testing device supplies power to the communication component, interaction component, and data storage component through the power supply component to ensure the normal operation of the testing device. The controller communicates with a host computer via a communication component. The host computer configures the test parameters for the testing equipment and sends them to the testing equipment. The testing equipment uses the received test parameters to test the storage device under test (DUT) installed on the interactive component and transmits the test results back to the host computer. The host computer outputs the test results in file format, allowing testers to easily analyze whether the DUT is a qualified product. The test parameters configured by the host computer include the capacity of the DUT, the serial number of a specific block of the DUT to be tested, and the number of tests. Since different storage devices have different testing methods—for example, the physical properties of Flash memory require erasure before writing, while EEPROM memory can be written directly—the host computer can configure different test parameters according to the DUT being tested, thereby shortening the testing time and improving testing efficiency. Furthermore, the host computer can perform location testing on a specified storage area of ​​the DUT, select full-chip testing, and customize the number of erase / write cycles to accommodate the different lifespans of different storage devices, improving the operability of the testing equipment.

[0027] More specifically, when performing location testing on the storage device under test, the testing equipment needs to divide the storage device into blocks, each block being divided according to a preset size. The number of blocks for the storage device under test can be determined based on its total size and the block size. The preset block size can be selected as 64KB. After dividing the storage device under test into multiple blocks, each block is assigned a corresponding sequence number. By selecting the block sequence number and customizing the number of tests via a host computer, targeted testing of a specific area of ​​the storage device under test can be achieved, i.e., location testing. By controlling the amount of test data, the testing time can be controlled, making full use of the tester's time and thus improving the operability of the testing equipment.

[0028] This invention enables rapid replacement of the storage device under test and visualization of test results through interactive components, thereby improving testing efficiency. It also improves operability by acquiring test parameters configured by the host computer through communication components. The testing device is small in size, easy to carry, and convenient to use.

[0029] As an optional implementation, the controller model is SCM301.

[0030] As an optional implementation, the interactive components include a display screen, a storage device test interface, and buttons. All three are electrically connected to the controller. The testing device is detachably connected to the storage device under test (DUT) via the storage device test interface for installing and replacing the DUT. Specifically, the storage device test interface is electrically connected to the controller. The controller tests the DUT installed on the storage device test interface based on test parameters received through the communication component. After testing, the tested storage device is obtained. The tested storage device can be directly removed from the testing device, and a new DUT can be replaced on the storage device test interface for testing. The detachable connection between the DUT and the storage device test interface facilitates quick and easy replacement of the DUT, eliminating the need for soldering components and effectively saving test preparation time, thereby improving test efficiency. The storage device test interface can be an 8-pin interface. The display screen is electrically connected to the controller. The controller displays the test results of the controlled testing equipment and the tested storage device to the display screen for visualization. This allows users to observe the testing process in real time, promptly detect any issues that arise, and pause the test at any time without waiting for the complete test cycle, thus improving testing efficiency. The buttons, also electrically connected to the controller, control the start-up of the testing equipment and switch between different test display interfaces on the screen.

[0031] As an optional implementation, the testing equipment also includes a fixing cover, which is fixed to the storage device test interface on which the storage device under test (DUT) is mounted, for encapsulating the DUT. Specifically, when the DUT is mounted on the storage device test interface in the correct orientation, the fixing cover is placed over the storage device test interface and the DUT on the interface, thus encapsulating the DUT and ensuring that it will not move or detach from the test interface during testing, enabling stable testing. The fixing cover can be made of metal or plastic, preferably plastic, to reduce production costs.

[0032] As an optional implementation, the buttons are used to switch the current test status of the testing equipment and switch the display page on the screen. Specifically, the buttons can be pressed by long-pressing or short-pressing. The testing equipment can be turned on via the host computer or by long-pressing the button, thus starting the test. During the test, the display interface can be switched by short-pressing the button, and the test can be stopped or ended by long-pressing the button, thereby improving the testing efficiency of the testing equipment.

[0033] As an optional implementation, the display screen is used to show the current test status, which includes a ready state, a test process state, a runtime error state, and an end state. The test data displayed in the test process state includes the current number of tests completed and the current number of test errors. Specifically, when the testing device is not being tested, the display screen shows the ready state (i.e., "Ready"). When the testing device is started via a host computer or by pressing and holding a button, the display screen shows the test process state, which includes the current number of tests completed and the current number of test errors. These two values ​​can be displayed on different screen interfaces, and switching between them can be achieved by simply pressing a button. When the testing device starts testing, if it detects that no device under test (DUT) is installed on the device, it will not be able to read the DUT, and the display screen will show a runtime error state (i.e., "Error"), returning to the ready state after a preset time. The preset time can be adaptively set according to actual needs and can be selected as 3 seconds. When the testing device is in operation, if the tester presses and holds a button to stop or end the test, the display screen will show the end state (i.e., "Stop").

[0034] As an optional implementation, the communication component includes a data communication interface, and the communication protocol between the data communication interface and the host computer is RS-485. Specifically, the testing device is wired to the host computer via the data communication interface, and the communication protocol between the testing device and the host computer is RS-485. The testing device sends a TTL level signal from the controller, which is then converted to RS-485 level to achieve communication with the external host computer, thereby obtaining the test parameters configured by the host computer. The host computer can also read the test results and generate files through the data communication interface, facilitating simple analysis by testers to determine whether the storage device under test is qualified.

[0035] As an optional implementation, the power supply component includes a Type-C charging interface or a USB charging interface, through which the detection device is connected to an external power source. Specifically, the power supply component also includes a power supply circuit. The external power source is connected to the power supply circuit via the Type-C or USB charging interface. The power supply circuit transforms the voltage to 3.3V to supply the controller. The external voltage can be a power bank or a USB 5V power supply.

[0036] As an optional implementation, the data storage component includes a storage chip. The storage chip stores test parameters and test data during the testing process. The storage chip transmits the test data to the host computer via a communication component. Specifically, the storage chip can be an EEPROM chip. The controller transmits the test parameters obtained through the communication component to the storage chip for storage. During testing, the controller saves the test data and test time to the data storage component, allowing the host computer to read the stored test data and output a file, facilitating analysis by testing personnel to determine the pass / fail status of the storage device.

[0037] The embodiment is merely a special case and does not indicate that this utility model is implemented in such a way.

[0038] The above description is merely a preferred embodiment of the present utility model. Those skilled in the art will understand that various changes or equivalent substitutions can be made to these features and embodiments without departing from the spirit and scope of the present utility model. Furthermore, under the teachings of the present utility model, these features and embodiments can be modified to adapt to specific situations and materials without departing from the spirit and scope of the present utility model. Therefore, the present utility model is not limited to the specific embodiments disclosed herein, and all embodiments falling within the scope of the claims of this application are within the protection scope of the present utility model.

Claims

1. A testing device for storage devices, characterized in that, The system includes a controller, a communication component, an interaction component, a power supply component, and a data storage component. The communication component, interaction component, power supply component, and data storage component are all electrically connected to the controller. The communication component, interaction component, and data storage component are all electrically connected to the power supply component, which supplies power to the communication component, interaction component, and data storage component. The controller communicates with the host computer through the communication component to obtain the test parameters configured by the host computer, and performs positioning tests or full-chip tests on the replaced storage device under test installed on the interaction component according to the test parameters.

2. The testing equipment for storage devices according to claim 1, characterized in that, The controller is model SCM301.

3. The testing equipment for storage devices according to claim 2, characterized in that, The interactive components include a display screen, a storage device test interface, and buttons. The display screen, the storage device test interface, and the buttons are all electrically connected to the controller. The testing device is detachably connected to the storage device under test through the storage device test interface for installing and replacing the storage device under test.

4. The testing equipment for storage devices according to claim 3, characterized in that, The testing equipment also includes a fixing cover, which is fixed to the test interface of the storage device on which the storage device under test is installed, and is used to encapsulate the storage device under test.

5. The testing equipment for storage devices according to claim 4, characterized in that, The buttons are used to switch the current test status of the testing device and switch the display page of the screen.

6. The testing device for storage devices according to claim 5, characterized in that, The display screen is used to display the current test status, which includes a preparation status, a test process status, a run error status, and an end status. The test data displayed in the test process status includes the current number of tests completed and the current number of test errors.

7. The testing device for storage devices according to claim 1, characterized in that, The communication component includes a data communication interface, and the communication protocol between the data communication interface and the host computer is the RS-485 communication protocol.

8. The testing equipment for storage devices according to claim 1, characterized in that, The power supply component includes a TYPE-C charging interface or a USB charging interface, and the detection device is connected to an external power source through the TYPE-C charging interface or the USB charging interface.

9. The testing device for storage devices according to claim 1, characterized in that, The data storage component includes a storage chip, which is used to store the test parameters and test data during the test process. The storage chip transmits the test data to the host computer through the communication component.

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