Dummy load device for laser power supply debugging

Abstract

The utility model provides a dummy load device for laser power supply debugging, which comprises n groups of load diode arrays, a relay, a power supply module and a control circuit, the load diode arrays are sequentially numbered, each group is sequentially provided with 2, 4,..., 2n diodes connected in series, the relay is connected with the power supply module, the relay is connected with the power supply module, and the control circuit is connected with the relay. The load diode arrays are connected in series according to a serial number sequence, relays are arranged between the first and last load diode arrays and the control circuit and between the load diode arrays, normally closed ends of the relays are connected with the diode arrays to form backflow, and a connecting circuit is arranged between the adjacent relays. The connecting circuit is connected with the normally open ends of the relays, the control circuit is controlled by adopting a single-chip microcomputer system and is connected with and controls a switch of each relay, and the power supply module supplies power to the control circuit. The device is easy to regulate and control, and has a current monitoring function, a voltage protection function and an over-temperature protection function.

Description

TECHNICAL FIELD

[0001] The utility model belongs to the technical field of laser power debugging, and particularly relates to a dummy load device for laser power debugging. BACKGROUND

[0002] The load array is an important component of the laser, and at present, the load array of the solid-state laser is usually composed of a laser diode array in the related field, which plays a role of excitation source in the laser. When in use, the laser needs to be connected to a high voltage and a large current as a whole, and the laser diode is a precision device, so that the laser diode array is easily damaged once the power supply is abnormal, which hinders the development of the laser and increases the development cost of the laser. There is no good solution to the problem that the laser diode is easily damaged by the abnormal power supply in the development process of the semiconductor laser.

[0003] As shown in Figure 1 The solid-state laser can be regarded as being composed of a laser power supply and a laser emitting head, wherein the emitting head of the laser is internally provided with a load array and a solid-state laser material, and the load array is a laser diode array. The solid-state laser material is the working medium of the laser, and the load array is the excitation source of the laser.

[0004] When the laser works, the load array is excited by the laser power supply to emit light, irradiates the solid-state laser material, and makes the particle number inversion inside the solid-state laser material to generate laser. Since the laser diode is a precision device and needs to be connected to a high voltage and a large current as a whole when in use, the performance of the laser power supply has a very high requirement for the working of the laser, and the load array is easily damaged once the laser power supply is abnormal. INVENTION CONTENTS

[0005] The utility model provides a kind of dummy load device for laser power debugging, the device is easy to control, and it has current monitoring function, voltage protection function and over-temperature protection function.

[0006] The utility model achieves the purpose by the following technical solutions:

[0007] A dummy load device for laser power debugging includes load diode array, relay, power module and control circuit, the load diode array is equipped with n groups, and is numbered in sequence, and each group is equipped with 2, 4, …, 2 nA series of diodes, each group of load diode array is connected in series in order, and relays are arranged between the first and last group of load diode array and between each group of load diode array, the normally closed end of the relay is connected with each group of diode array to form a backflow, a connecting circuit is arranged between the adjacent relays, the connecting circuit is connected with the normally open end of the relay, the control circuit is controlled by a single-chip microcomputer system, and the switch of each relay is connected and controlled, and the power module supplies power for the control circuit.

[0008] Further, the dummy load device is provided with a temperature sensor for monitoring the temperature of each group of load diode array, and the temperature sensor is connected with the single-chip microcomputer.

[0009] Further, the relay is connected with an over-temperature protection circuit, and the over-temperature protection circuit is connected with the single-chip microcomputer.

[0010] Further, the single-chip microcomputer is connected with a cooling module, and the cooling module is used for temperature reduction protection of the load diode.

[0011] Further, the dummy load device is provided with a current monitoring circuit for monitoring the current of each group of load diode array, and the current monitoring circuit is connected with the single-chip microcomputer.

[0012] Further, the dummy load device is provided with a voltage monitoring circuit for monitoring the voltage of each group of load diode array, and the voltage monitoring circuit is connected with the single-chip microcomputer.

[0013] Further, the control circuit is connected with a display assembly, the display assembly includes a display screen, a state indicating lamp and a fault indicating lamp, the display screen is used for displaying the number of load diodes of the access circuit, the load temperature, the load voltage, the load current and the load state, the state indicating lamp is used for displaying whether each group of diode array is connected to the circuit, and the fault indicating lamp is used for displaying the running state and the fault state of the load diode array connected to the circuit.

[0014] Further, the device is provided with a shell, and the front panel of the shell is provided with a load diode array connecting interface, an emergency stop switch and a power-on switch of a power module, a key, a state indicating lamp display area, a fault indicating lamp display area and a display screen display area, and the key is used for inputting the number of load diodes accessed to the single-chip microcomputer.

[0015] Further, the shell is provided with a handle and a heat dissipation hole.

[0016] Compared with the prior art, the utility model has the beneficial effects that:

[0017] The utility model provides a kind of for laser power debugging dummy load device, for the performance test of laser power of solid laser.The automatic dummy load device has the working effect consistent with real load array, in the development process of laser, real load array can be replaced by automatic dummy load device and accessed entire laser.Laser is accessed after the automatic dummy load device, engineer passes through the working result of recording, analysis laser power, and adjusts electrical parameter of laser power according to working result, completes power performance debugging.Through the above-mentioned performance debugging process, laser power can be adjusted to appropriate range, load quantity is easy to control, can adapt to various laser test needs, and with voltage protection function, temperature protection function and current protection function, easy operation, good safety, can significantly improve power supply performance test efficiency, effectively avoid real load array to be damaged by laser power anomaly influence. BRIEF DESCRIPTION OF DRAWINGS

[0018] In order to more clearly illustrate the embodiment of the utility model or the technical scheme in the prior art, the drawings needed to be used in the embodiment or the prior art description will be briefly introduced below. Obviously, the drawings in the following description are only exemplary, and those skilled in the art can also obtain other implementation drawings according to the provided drawings without creative labor.

[0019] Figure 1 It is a schematic diagram of laser structure;

[0020] Figure 2 It is the appearance of the embodiment of the utility model;

[0021] Figure 3 It is the schematic diagram of component connection relationship of the embodiment of the utility model;

[0022] Figure 4 It is the schematic diagram of load array arrangement of the embodiment of the utility model;

[0023] Figure 5 It is the load array control circuit diagram of the embodiment of the utility model;

[0024] Figure 6 It is the operation flow chart of the embodiment of the utility model.

[0025] Reference numerals in the drawing: 1-shell, 2-front panel, 3-load diode array connection interface, 4-display screen, 5-key, 6-state indicator light, 7-fault indicator light, 8-power-on switch, 9-emergency stop switch, 10-handle, 11-vent hole. DETAILED DESCRIPTION

[0026] Exemplary embodiments of the present application will be described in greater detail below with reference to the accompanying drawings. Although exemplary embodiments of the present application are shown in the drawings, it is understood that the present application can be implemented in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided so that the present application can be more thoroughly understood, and so that the scope of the present application can be conveyed to those skilled in the art. It should be noted that the embodiments in the present application and the features in the embodiments can be combined with each other without conflict. The present application will be described in detail below with reference to the accompanying drawings and in conjunction with the embodiments.

[0027] Referring to Figures 1 to 6 , the present application provides an embodiment of a dummy load device for laser power debugging, which uses a diode array with lower cost to replace a real load array based on the principle that diodes have similar electrical characteristics, and performs performance debugging on the laser power to achieve the purpose of protecting the real load array from abnormal damage by the power supply. The device can automatically generate a dummy load array with specific electrical parameters according to external input control instructions, meet the power debugging needs of various lasers, and control in a simple manner. At the same time, the device has functions such as over-temperature protection, voltage protection, and current monitoring.

[0028] The dummy load device includes a load diode array, a control circuit, relays, and a power module. The load diode array is provided in n groups, which are sequentially numbered, and each group is provided with 2, 4, …, 2 n n diodes in series. Each group of load diode arrays is connected in series in order of numbering, and relays are provided between the first and last groups of load diode arrays and the control circuit and between each group of load diode arrays. The normally closed end of the relay connects each group of diode arrays to form a backflow, and a connection circuit is provided between adjacent relays. The connection circuit is connected to the normally open end of the relay. The control circuit uses a single-chip microcomputer system to control and connect the switches of each relay, and the power module supplies power to the control circuit.

[0029] A temperature sensor connected to the single-chip microcomputer is provided for monitoring the temperature of each group of load diode arrays. The relay is connected to an over-temperature protection circuit, which is connected to the single-chip microcomputer. The single-chip microcomputer is also connected to a cooling module for temperature reduction protection of the load diodes.

[0030] The control circuit is connected to a display assembly, which includes a display screen 4, a status indicator light 6, and a fault indicator light 7. The display screen 4 is used to display the number of load diodes connected to the circuit, the load temperature, the load voltage, the load current, and the load state. The status indicator light 6 is used to display whether each group of diode arrays is connected to the circuit. The fault indicator light 7 is used to display the operating state and fault state of the load diode array connected to the circuit.

[0031] The connection relationship of each component is asFigure 3 As shown.

[0032] The device has a housing 1, and its overall appearance is as follows: Figure 2 As shown. The front panel 2 of the housing 1 includes a load diode array connection interface 3, a display screen 4, buttons 5, status indicator lights 6, fault indicator lights 7, a power switch 8, an emergency stop switch 9, and a handle 10. The load quantity control function is realized through buttons 5 and the LED display screen 4.

[0033] The model of the dummy load diode should be selected based on the electrical parameter requirements of the laser during actual operation.

[0034] In this embodiment, DSEI60-06 is selected as the load diode. The maximum supply voltage of a real load diode array is 400VDC, the DC current is no more than 50A, and the pulse current is no more than 150A. The current parameters of DSEI60-06 can meet the usage requirements and leave some margin, so DSEI60-06 is used as a dummy load diode to meet the actual load current requirements.

[0035] To facilitate control, this embodiment divides all dummy load diodes into 8 groups and uses 8 sets of control sub-circuits to control them in binary form, thus achieving arbitrary digital outputs from 0 to 255. The total number of load arrays is 2. 8 -1 = 255 units. Each group is distinguished by using the same PCB pad and spacing during soldering. The pad PCB design is as follows: Figure 4 As shown in the figure, the arrows indicate the direction of current flow.

[0036] The connection configuration of the relay and load diode array is as follows: Figure 5 As shown, eight relays K1-K8 are used to connect all the dummy load diodes. When it is necessary to reduce the number of dummy load diodes, the relays are controlled to close, so that some diodes are short-circuited from the overall circuit. If any relay fails to close, there will be more load diodes in the dummy load array circuit than required. This can effectively prevent the external laser power supply from being damaged when the relay fails.

[0037] Meanwhile, a single normally open relay K9 is used as the master control for the dummy load array circuit, which facilitates the disconnection of the dummy load array circuit in case of a fault.

[0038] The power module provides power to the control circuit, which in turn controls the relays to control the connection of each diode array to the test circuit. In conjunction with the relay drive circuit, the signals output by the microcontroller are mapped to each relay in the dummy load device, with each signal controlling one relay, thus precisely controlling the number of dummy load diodes.

[0039] Display screen 4 is controlled by the signal output of the single-chip microcomputer. The display screen 4 can display the current setting number of the dummy load diode, load temperature, load voltage, load current, load state and other parameters.

[0040] The key 5 is a general thin film key, which is provided with 0-9 number keys and "*" and "#" two keys. The number of load diodes is input to the single-chip microcomputer, and the single-chip microcomputer outputs a signal to the corresponding relay, so that the corresponding number of diodes is connected to the test circuit.

[0041] The state indicating lamp 6 is composed of 8 LED lamps connected in parallel across the relay; the fault indicating lamp 7 is composed of 2 LED lamps directly controlled by the single-chip microcomputer, which respectively represent the running state and the fault state of the dummy load device.

[0042] The power-on indicating lamp is combined with the power-on switch 8, which is a power-on switch 8 selected with an indicating lamp, and no additional indicating lamp is designed to control the connection of the test circuit.

[0043] The state indicating lamp light effect is shown in Table 1.

[0044] Table 1 State indicating lamp light effect meaning table

[0045]

[0046] The cooling module is a structure function, which can determine whether water cooling or air cooling is needed by relying on the over-temperature protection function.

[0047] The voltage protection function detects the voltage across the dummy load array by resistance division, and calculates the actual voltage drop on the dummy load diode. When the voltage drop is higher or significantly lower than the voltage of the official device manual curve, it indicates that the dummy load diode is working abnormally at this time, that is, the laser power output is abnormal at this time. The voltage protection function will cut off the dummy load array loop and issue a fault indication. The fault state lamp is on and the display screen displays abnormal data.

[0048] The single-chip microcomputer judges the temperature of the dummy load array in real time through the temperature sensor to realize the over-temperature protection function. When the temperature near the load diode is higher than the warning value, the over-temperature protection function will cut off the load loop and issue a fault indication. The fault state lamp is on and the display screen displays abnormal data.

[0049] The current monitoring function is used as an auxiliary function of the voltage protection function during use, and is displayed through the display screen.

[0050] The power module is an internal power supply part of the automatic dummy load device, which is directly driven by AC mains power.

[0051] The single-chip microcomputer is written with embedded program software to realize automatic control of different numbers of dummy load diode arrays according to the number of the connected load diode arrays, and monitoring and conversion of parameters such as temperature, current and voltage. Figure 6

[0052] The above detailed description of the present application is made through the embodiments, but the content described is only exemplary embodiments of the present application, and cannot be considered as limiting the implementation scope of the present application. The protection scope of the present application is defined by the claims. Any similar technical solution that utilizes the technical solution described in the present application, or is inspired by the technical solution of the present application, and achieves the above technical effects within the substantial and protection scope of the present application, or any equivalent changes and improvements to the application scope, shall still belong to the patent coverage protection scope of the present application. It should be noted that, in order to clearly express, the description of the present application omits the description of some components and processes that are not directly and obviously related to the protection scope of the present application but are known to those skilled in the art.​

Claims

1. A dummy load device for laser power supply debugging, characterized in that, The system includes a load diode array, a relay, a power supply module, and a control circuit. The load diode array has n groups, which are numbered sequentially, with each group having 2, 4, ..., 2 units. n A series of diodes are connected in series, and each group of load diode arrays is connected in series according to the numbering order. Relays are provided between the first and last groups of the load diode arrays and the control circuit, as well as between each group of load diode arrays. The normally closed terminals of the relays are connected to each group of diode arrays to form a return current. A connection circuit is provided between adjacent relays, and the connection circuit is connected to the normally open terminal of the relay. The control circuit is controlled by a microcontroller system, which connects to and controls the switching of each relay. The power supply module supplies power to the control circuit.

2. The dummy load device for laser power supply debugging according to claim 1, characterized in that, The load diode arrays are separated by using the same PCB pads and are distinguished by intermittent soldering.

3. The dummy load device for laser power supply debugging according to claim 2, characterized in that, The dummy load device is equipped with a temperature sensor to monitor the temperature of each group of load diode arrays, and the temperature sensor is connected to a microcontroller.

4. The dummy load device for laser power supply debugging according to claim 3, characterized in that, The relay is connected to an over-temperature protection circuit, which is connected to a microcontroller.

5. A dummy load device for laser power supply debugging according to claim 4, characterized in that, The microcontroller is connected to a cooling module, which is used for cooling and protecting the load diode.

6. A dummy load device for laser power supply debugging according to claim 5, characterized in that, The dummy load device is equipped with a current monitoring circuit for monitoring the current magnitude of each group of load diode arrays. The current detection circuit is connected to a microcontroller.

7. A dummy load device for laser power supply debugging according to claim 6, characterized in that, The dummy load device is equipped with a voltage monitoring circuit for monitoring the voltage of each group of load diode arrays. The voltage detection circuit is connected to a microcontroller.

8. A dummy load device for laser power supply debugging according to claim 7, characterized in that, The control circuit is connected to a display component, which includes a display screen, status indicator lights, and fault indicator lights. The display screen is used to display the number of load diodes connected to the circuit, load temperature, load voltage, load current, and load status. The status indicator lights are used to display whether each group of diode arrays is connected to the circuit. The fault indicator lights are used to display the operating status and fault status of the load diode arrays connected to the circuit.

9. A dummy load device for laser power supply debugging according to claim 8, characterized in that, The device has a housing, and the front panel of the housing has the load diode array connection interface, the emergency stop switch and power-on switch of the power module, buttons, a status indicator display area, a fault indicator display area and a display screen area. The buttons are used to input the number of connected load diodes to the microcontroller.

10. A dummy load device for laser power supply debugging according to claim 9, characterized in that, The outer casing is equipped with a handle and ventilation holes.

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