Double-sided circuit board probe test structure

Abstract

The utility model discloses a double-sided circuit board probe test structure, which comprises a fixed base, a movable sliding block, a limiting cover and a push rod, the fixed base is provided with a clamping groove matched with the size of a double-sided circuit board, the movable sliding block is clamped by the fixed base and the limiting cover to form a sliding block which can only move in a single direction, and a part of the double-sided circuit board is fixed; the limiting cover is fixed on the fixed base and has a limiting function on the double-sided circuit board; and the push rod is fixed on the limiting cover through a thread of the push rod, and the push rod is rotated to push the movable sliding block to advance so as to fix the double-sided circuit board or return the double-sided circuit board. The double-sided circuit board probe test structure has the advantages of miniaturization, low cost, high compatibility and customizability.

Description

TECHNICAL FIELD

[0001] The utility model relates to high -speed optical communication, optical chip technology field especially, is photoelectric detector technology and advanced packaging technology field, concretely is a double -sided circuit board probe test structure. BACKGROUND

[0002] Printed circuit board is indispensable in modern electronic equipment, has far -reaching influence to computer, communication, medical treatment, aerospace etc.

[0003] With the application of circuit board more and more, the assembly, test and other supporting function structures related to circuit board need also increase to cope with more and more complex application background.

[0004] At present, realize circuit board double -sided probe test, there is quite a lot of large -scale assembly line test equipment, but its price is high, occupies space is larger, and the customization cost is larger, is not suitable for laboratory internal small -batch circuit board test. For this reason, it is very necessary to carry out small -sized, low -cost, high -compatibility test fixture structure.

[0005] The known technology realizes circuit board double -sided probe test, and there are quite a lot of large -scale assembly line test equipment, and there are the following defects:

[0006] 1, there is the realization scheme that the circuit board front is fixed upwards, first tests the front, and after completing the test, the circuit board is turned over and is tested again, which cannot complete the front and back test at the same time.

[0007] 2, there is the realization scheme that the circuit board front is fixed upwards, and the lower hollow additional probe clamping structure and observation structure are fixed, which is relatively complex, the lower probe clamping structure and observation structure complete the cost higher and the space limitation is larger, and is not low -cost and small -sized. Utility model content

[0008] The utility model solves the technical problems in the known technology that the two sides of the circuit board cannot be tested at the same time, the cost is high, the volume is large, and it is not easy to customize freely according to small -batch experiments, compared with the structure that the circuit board front is upwards, the probe is added from the upper and lower parts, the circuit board is vertically fixed, the image of the probe pressing can be observed from the front and back at low cost, without adding more complex structures to fix and observe the probe from the lower part, which is not suitable for the existing common equipment in the experiment.

[0009] To solve the above technical problems, the utility model provides a double -sided circuit board probe test structure, which can test the two sides of the circuit board at the same time, and has strong adaptability with the original equipment in the laboratory, without additional complex probe clamping structure and observation structure, low cost, small volume, high compatibility, strong customization ability.

[0010] The specific technical solutions adopted are as follows:

[0011] A double-sided circuit board probe test structure comprises

[0012] The fixed base has a clamping groove matched with the size of the double-sided circuit board;

[0013] The movable slider is clamped by the fixed base and the limiting cover and forms a slider capable of moving in only one direction, and the movable slider is used for fixing the double-sided circuit board partially;

[0014] The limiting cover is fixed on the fixed base and is used for limiting the double-sided circuit board;

[0015] The push rod is fixed on the limiting cover through the self-provided thread, and rotating the push rod can push the movable slider to move forward to fix the double-sided circuit board or make the movable slider retreat.

[0016] Further to the technical scheme of the utility model, the double-sided circuit board probe test structure further comprises a base adapter block, and the base adapter block is connected with the fixed base.

[0017] A four-axis object table is arranged below the base adapter block and is fixed through a screw, and the four-axis object table is used for supporting the double-sided circuit board probe test structure of the utility model, lifting the actual height of the double-sided circuit board, so as to facilitate setting up a probe fixing structure and a visible light observation structure, and if the height is too low, the two structures cannot be set up or are inconvenient to set up.

[0018] Since the four-axis platform has the functions of x, y and z three-axis displacement adjustment and plane deflection angle adjustment, higher stroke is brought to the maximum adjustment distance of the whole test structure, and when the position of the probe is adjusted, the position of the circuit board can also be adjusted, so that the adjustment is more convenient.

[0019] Further to the technical scheme of the utility model, the clamping groove is vertically arranged on the rear side of the fixed base. The vertical clamping groove changes the state of the double-sided circuit board from flat placement to vertical placement, and the surface needed to be pressed by the probe changes from the upper and lower surfaces to the front and rear surfaces. Since the complexity of the fixing structure of the probe on the upper and lower surfaces and the difficulty of the visual observation are far greater than those on the front and rear surfaces, the design can greatly reduce the difficulty of the probe pressing test.

[0020] Further to the technical scheme of the utility model, the movable slider is in an L shape. The design of the movable slider is simple, and the fixing mode using a screw is also simple and convenient. The use of the movable slider only has certain limitation on the thickness of the fixed double-sided circuit board, relaxes the requirement on the width, and can press and fix the double-sided circuit board as long as the width is less than the distance from the initial position of the slider to the right edge of the clamping groove, and has almost no requirement on the length.

[0021] The utility model discloses a double-sided circuit board probe test structure, the clamping groove on fixed base can be free to customize according to the size of circuit board, further, a large number of double-sided circuit boards of different sizes, different structures will appear in the development process, and therefore the fixture of fixed circuit board is hoped to have better compatibility or simple structure can conveniently modify size and processing and manufacturing, the clamping groove design only has strict requirement to the thickness of circuit board, and the long and wide size of circuit board is very large.

[0022] 1, the double-sided circuit board probe test structure of the utility model, the clamping groove on fixed base can be free to customize according to the size of circuit board, further, a large number of double-sided circuit boards of different sizes, different structures will appear in the development process, and therefore the fixture of fixed circuit board is hoped to have better compatibility or simple structure can conveniently modify size and processing and manufacturing, the clamping groove design only has strict requirement to the thickness of circuit board, and the long and wide size of circuit board is very large.

[0023] 2, the double-sided circuit board probe test structure of the utility model, the structure scheme of vertical fixed circuit board, further, the design of vertical clamping groove makes double-sided circuit board change from the state of plane placement to the state of vertical placement, and therefore the surface that probe needs to press from upper and lower surfaces becomes front and rear surfaces, and the complexity of the fixed structure of probe and the difficulty degree of visual observation are reduced.

[0024] 3, the double-sided circuit board probe test structure of the utility model, the structure design of movable sliding block, the design of movable sliding block is simple, and the fixed mode of using screw is also simple and convenient, and the width of the double-sided circuit board that is fixed using movable sliding block is relaxed, and as long as the width is less than the distance from the initial position of sliding block to the right edge of clamping groove, the width can be pressed and fixed. BRIEF DESCRIPTION OF DRAWINGS

[0025] Figure 1 It is the schematic diagram of the double-sided circuit board probe test structure of the embodiment;

[0026] Figure 2 It is the exploded view of Figure 1 ;

[0027] Figure 3 It is the placement condition schematic diagram of probe when testing;

[0028] Among them, 1-base adapter block, 2-fixed base, 3-movable sliding block, 4-limiting cover, 5-double-sided circuit board, 6-push rod. DETAILED DESCRIPTION

[0029] In order to make the purpose, technical scheme and advantages of the utility model more clear and obvious, the utility model is further explained in detail below with the drawings Figures 1-3 And embodiments, it should be understood that the specific embodiments described here are only used to explain the utility model, and are not used to limit the utility model.In addition, the technical features involved in each embodiment of the utility model described below can be combined with each other as long as they do not conflict with each other. Embodiment 1

[0030] As Figure 1 and 2 shown, the embodiment is a double-sided circuit board probe test structure, which includes a base adapter block 1, a fixed base 2, a movable slider 3, a limiting cover 4 and a push rod 6, and a double-sided circuit board 5 is a circuit board to be tested.

[0031] According to the actual size requirements of the double-sided circuit board 5, the size of the clamping groove on the fixed base 2 is customized, and the clamping groove is opened on the rear side of the fixed base 2. The double-sided circuit board 5 is inserted into the clamping groove from top to bottom.

[0032] When assembling, the bottom screw holes of the base adapter block 1 and the fixed base 2 are fixed by screws, and then the through holes on the four corners of the base adapter block 1 are fixed to the four-axis object table below by screws.

[0033] The movable slider 3 is placed at the corresponding position of the fixed base 2, and it is fixed with the fixed base 2 through the two screws on the top and the two screws on the side of the limiting cover 4. Specifically, the movable slider 3 in the embodiment is in the shape of L as a whole, and an L-shaped slide is formed between the upper surface of the fixed base 2 and the protrusion arranged on the upper surface, and the movable slider 3 is arranged in cooperation with the L-shaped slide. The limiting cover 4 is used to limit the movable slider 3, so that the movable slider 3 slides linearly along the L-shaped slide. In the embodiment, the limiting cover 4 is a right-angle corner plate, and the limiting cover 4 is fixed with the fixed base 2 through the two screws on the top and the two screws on the side.

[0034] The push rod 6 is turned into the threaded hole at the rear of the limiting cover 4, and the push rod 6 can be turned to push the movable slider 3 forward to complete its fixing function or make it retreat. Then the double-sided circuit board 5 is placed in the clamping groove of the fixed base 2, and the push rod 6 is turned to push the movable slider 3 to press the circuit board. Specifically, the movable slider 3 after advancing contacts the double-sided circuit board 5 inserted in the clamping groove, and clamps it in the clamping groove.

[0035] As Figure 3 shown, when testing, the double-sided circuit board 5 to be tested is fixed on the double-sided circuit board probe test structure 10 of the embodiment, and two probe cards 7 connected with six-axis displacement platforms 8 are respectively placed on the front and rear sides of the required probe pressing plane of the double-sided circuit board 5 to be tested, as Figure 3 shown, under the assistance of the visible light observation system 9 arranged outside, the six-axis displacement platform 8 corresponding to the fixed probe card 7 is adjusted, the probe is aligned with the metal pad on the double-sided circuit board 5, and the probe pressing operation is performed, and then the related electrical test is completed.

[0036] Further, the double-sided circuit board probe test structure of the embodiment can directly combine the fixed base 2 and the limiting cover 4 as a whole for manufacturing. The shape of the movable slider 3 can be modified, and the fixed base 2 can adopt a similar slide rail structure to realize single-axis limiting function. The part clamping the circuit board can also be modified according to the shape of the circuit board. The push rod 6 and the movable slider 3 structure can be combined as a whole through mechanical structure or integral processing, and are not fixed in position through the threads on the push rod, but are fixed by increasing screws or other ways on the side, which can also have the same effect.

[0037] Those skilled in the art can easily understand that the above description is only a preferred embodiment of the present application, and is not intended to limit the present application. Any modification, equivalent replacement and improvement made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A double-sided circuit board probe test structure, characterized by, Comprising Fixed base (2): with a card slot matching the size of the double-sided circuit board (5); Movable slider (3): clamped by the fixed base (2) and the limiting cover (4), forming a slider that can only move in one direction, partially fixing the double-sided circuit board (5); Limiting cover (4): fixed on the fixed base (2), used to limit the double-sided circuit board (5); Push rod (6): fixed on the limiting cover (4) through its own thread, rotating the push rod (6) can push the movable slider (3) forward to complete its fixation of the double-sided circuit board (5) or make it retreat.

2. The double-sided circuit board probe test structure of claim 1, wherein, The double-sided circuit board probe test structure further comprises a base adapter block (1), which is connected with the fixed base (2).

3. The double-sided circuit board probe test structure of claim 2, wherein, A four-axis object table is arranged below the base adapter block (1).

4. The double-sided circuit board probe test structure of claim 1, wherein, The card slot is vertically arranged on one side of the fixed base (2).

5. The double-sided circuit board probe test structure of claim 1, wherein, The movable slider (3) is L-shaped.

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