Auxiliary board for testing

Abstract

The embodiment of the utility model provides an auxiliary board (100) for testing. The auxiliary board (100) for testing can be applied to a testing device (200) of a component bearing part. The test device (200) comprises a receiving space (204) formed by a device frame (202) for receiving a plurality of test boards (300) for testing component carriers. The test auxiliary plate (100) comprises: at least one space filling member (102) configured to at least partially fill a margin space (205) in the accommodation space (204) except a space occupied by the test plate (300); and a first sealing member (104) configured to seal a space between the space filling member (102) and a surrounding device frame (202).

Description

TECHNICAL FIELD

[0001] The present application relates to the field of testing semiconductor devices, and in particular to an auxiliary board for testing. BACKGROUND

[0002] This section provides background information to the present application which is not necessarily prior art.

[0003] In the background of increasing functionality of products equipped with one or more component carriers such as printed circuit boards and the ever-increasing miniaturization of such electronic components and the ever-increasing number of electronic components to be mounted on the component carriers, ever more powerful array-like components or packages having several electronic components are being employed. Such array-like components or packages have a plurality of contacts or connections between which the spacing is becoming ever smaller. Such component carriers should have good electrical properties in order to be able to operate even under adverse conditions.

[0004] During the manufacture and / or use of component carriers, it is necessary to test the electrical properties of the component carriers. It is desirable that the testing equipment is able to perform the testing of the electrical properties of the component carriers electrically reliably and cost-effectively. SUMMARY

[0005] This section provides a general summary of the present application and not a comprehensive disclosure of all of the possible embodiments of the application.

[0006] The exemplary embodiments of the present application provide an auxiliary board for testing, which is applied in a testing equipment for component carriers, the testing equipment including an accommodation space for accommodating a plurality of testing boards for testing component carriers formed by an equipment frame, wherein the auxiliary board for testing includes at least one space filling member configured to at least partially fill a remaining space in the accommodation space other than a space occupied by the testing boards, and a first sealing member configured to seal a space between the space filling member and the surrounding equipment frame.

[0007] In the context of the present application, the term "test aid board" can particularly mean a device or structure capable of being used to enhance and support the testing process of a component carrier. The test aid board can provide stability and accuracy to the testing environment by facilitating stable contact (e.g., relative position remains unchanged or substantially unchanged) between the test board (particularly, electrical contacts on the test board for contacting the component carrier to be tested, such as test probes) and the component carrier to be tested (particularly, electrically conductive structures on the surface of the component carrier, such as metal pads, traces) during the testing process. In other words, the test aid board does not really participate in the testing of the electrical performance of the component carrier, but rather "indirectly" enhances the accuracy and reliability of the testing by assisting the test board that really performs the testing in accurately aligning with the object to be tested and / or other related components (e.g., equipment frame, etc.).

[0008] In the context of the present application, the term "test board" can particularly mean a device or structure specially designed for evaluating the electrical performance of a component carrier, such as a printed circuit board. The test board is usually equipped with interface components such as test probes to enable contact testing of the circuit on the component carrier. For example, the test probes can physically interface with the contacts on the component carrier such as a printed circuit board to automate signal transmission and data acquisition, thereby enabling fast and accurate detection of, for example, pass, open, short circuit conditions and other electrical characteristics of the circuit. Such test boards can be applied in production lines and quality control environments to ensure that the products meet the design specifications.

[0009] In the context of the present application, the term "space-filling member" can particularly mean a physical member capable of filling the excess space in a specific housing space (e.g., test cavity) of a test apparatus other than the space occupied by the test board. The structure, material, etc. of the space-filling member are not particularly limited as long as it can physically facilitate the stability of contact between the test board and the object to be tested and / or the equipment frame by filling the excess space.

[0010] In the context of the present application, the expression "sealing the space between the space-filling member and the surrounding device frame" can in particular mean that the first sealing member fills the clearance space between the space-filling member and the surrounding device frame in a sealing manner. In some implementations, this can manifest itself in that, in use (or, in other words, when the test auxiliary board is applied in the test device), the first sealing member can sealingly fill the clearance space between the space-filling member and the surrounding device frame (e.g. the device frame including the top and / or the device frame including the sides) at least over the lateral extension (or, in other words, the length extension) of the space-filling member, such that the first sealing member can exert a force on the adjacent test board in a direction perpendicular to the length extension of the space-filling member (or, in other words, in the stacking direction of the test boards) to bring the test boards as close to each other as possible.

[0011] In the context of the present application, the term "component carrier" can in particular mean any support structure capable of accommodating one or more components thereon and / or therein to provide mechanical support and / or electrical and / or optical and / or thermal connections. In other words, the component carrier can be configured as a mechanical and / or electronic carrier for components.

[0012] Exemplary embodiments provide a test auxiliary board that can be applied in a test device for testing the electrical properties of a test component carrier. The test device comprises an accommodation space, such as a test cavity, for placing test boards formed by a device frame. The test auxiliary board comprises at least one space-filling member and a first sealing member. The space-filling member can at least partially fill the remaining space in the accommodation space other than the space occupied by the test boards, and the first sealing member can in turn seal the clearance space between the space-filling member and the surrounding device frame.

[0013] In some embodiments, the test boards can be arranged substantially centrally in the accommodation space of the test device, i.e. the test boards can substantially occupy the middle portion of the accommodation space. Correspondingly, the test auxiliary board can be arranged in the accommodation space and distributed on both sides of the test boards in the stacking direction of the test boards. In such embodiments, the space-filling member of the test auxiliary board can at least partially fill the remaining space in the accommodation space on both sides of the test boards.

[0014] In some embodiments, the test auxiliary board can be disposed in the accommodation space of the device frame and distributed on both sides of the plurality of test boards in the stacking direction of the plurality of test boards. In such embodiments, the space-filling member of the test auxiliary board can at least partially fill the excess space in the accommodation space on both sides of the plurality of test boards.

[0015] By using the space-filling member and the first sealing member, the test auxiliary board can significantly fill the excess space in the test device frame other than the space occupied by the plurality of test boards, thereby effectively facilitating the secure positioning of the test boards relative to the device frame. In this way, the test boards can be prevented from being displaced due to vibration or other external forces during testing and / or device handling, ensuring that their relative positions with respect to the objects under test remain unchanged. Ensuring the stable position of the test boards and the accurate positioning of electrical contact portions such as test probes helps to obtain accurate test data to reduce measurement errors caused by instability or positional deviation of the test boards, and also helps to shorten the debugging time of the test device before testing, improving test efficiency.

[0016] Furthermore, in the related art, it is necessary to fill the test cavity of the test device with test boards. The test needs to be performed with the test surface (particularly the main surface) of the component carrier in contact with one side (containing electrical contact portions) of the plurality of stacked test boards, so the number of test boards required usually depends on the size of the component carrier. In actual testing, due to the relatively small size of the component carrier, only a portion of all the test boards in the test cavity will be in electrical contact with the component carrier under test to perform electrical testing. The remaining test boards, although not in electrical contact with the object under test, can still be damaged when a short circuit or high voltage occurs in the test circuit. This is obviously not cost-effective. The application of the test auxiliary board provided by the embodiments of the present application in the test device to replace the test boards in the non-test area will not cause damage to the test auxiliary board even if a short circuit or high voltage occurs in the test circuit, which can significantly reduce the cost of testing.

[0017] In the following, further exemplary embodiments of the test auxiliary board will be explained.

[0018] In some alternative embodiments, the test aid further comprises a lower extension member extending from the bottom of the space-filling member, the lower extension member being configured to extend towards the bottom of the housing space when in use to fit the test aid to the bottom device frame. The lower extension member extends to the bottom of the housing space when in use, closely fitting the bottom device frame. This allows additional support and stability to be provided in three dimensions, preventing the test aid from moving during testing due to vibrations or other forces. The lower extension member can help ensure accurate positioning of the test aid within the device frame, in turn facilitating accurate alignment between the test board and the component carrier.

[0019] In some alternative embodiments, the test aid further comprises a second sealing member configured to seal the space between the lower extension member and the bottom device frame.

[0020] In the context of the present application, "sealing the space between the lower extension member and the bottom device frame" can in particular mean that the second sealing member fills the clearance space between the lower extension member and the bottom device frame in a sealed manner. In some implementations, this can manifest as the second sealing member sealingly filling the clearance space between the lower extension member and the bottom device frame over the lateral extent (or lengthwise extent) of the lower extension member when in use (or, in other words, when the test aid is applied in the test device).

[0021] The second sealing member can provide additional support and fixation. By providing the second sealing member, structural movement due to other physical factors can be reduced, thereby facilitating the stability of the test aid relative to the device frame. The sealed filling configuration can also absorb some of the vibrations and impacts, enhancing the vibration and impact resistance of the entire test system to reduce disturbances due to possible vibrations or impacts when performing sensitive tests.

[0022] In some alternative embodiments, the second sealing member is connected to the lower extension member at the outer periphery thereof, which facilitates detachable connection between the second sealing member and the lower extension member.

[0023] In some alternative embodiments, the second sealing member is provided with a second connecting member matching a first connecting member on the bottom device frame, to fix the lower extension member, and thus the test aid, to the bottom device frame. The second connecting member may, for example, comprise a pin provided at the bottom of the second sealing member. Correspondingly, the first connecting member can be a positioning hole for the pin to be inserted.

[0024] By providing the second connecting member on the second sealing member that matches the first connecting member on the device frame, the lower extending member and thus the auxiliary board for testing is stably connected to the bottom of the device frame. This way of connection enhances the overall stability of the system, avoiding displacement or vibration that can occur during testing. The matching connecting members also make the installation and dismounting process simpler and faster.

[0025] In some alternative embodiments, the second sealing member is provided on a side of the lower extending member opposite to the space filling member.

[0026] In some alternative embodiments, the lower extending member is fastened to the space filling member by at least one screwing member. The lower extending member can be detachably connected to the space filling member, in particular to the outer periphery of the space filling member, more particularly at the bottom periphery of the space filling member, by a plurality of screwing members such as screws.

[0027] In some alternative embodiments, the lower extending member comprises at least one first recess partially extending along the thickness direction of the lower extending member; and / or the lower extending member comprises at least one first opening extending through the lower extending member along the thickness direction of the lower extending member.

[0028] In some examples, the lower extending member can comprise only at least one recess partially extending along the thickness direction thereof. In some examples, the lower extending member can comprise only at least one opening extending through the lower extending member along the thickness direction thereof. In some examples, the lower extending member can comprise at least one recess partially extending along the thickness direction thereof, and at least one opening extending through the lower extending member along the thickness direction thereof.

[0029] By forming at least one recess and / or opening along the thickness direction of the lower extending member, the weight of the auxiliary board for testing can be made close to, or substantially the same as, the weight of the test board. This is beneficial to the overall stability of the testing device in use, especially when a plurality of auxiliary boards for testing are arranged in a stacked form on both sides of a plurality of stacked test boards, the auxiliary boards for testing with close or substantially the same weight and the test boards can prevent the testing device from tilting.

[0030] In some alternative embodiments, the first recess and / or the first opening can be symmetrically arranged with respect to the vertical central axis of the auxiliary board for testing, which makes the lower extending member structurally symmetric with respect to the vertical central axis. This is also beneficial to the overall stability of the testing device in use.

[0031] In some alternative embodiments, the space-filling member includes at least one second recess partially extending along a thickness direction of the space-filling member; and / or the space-filling member includes at least one second opening extending through the space-filling member along a thickness direction of the space-filling member.

[0032] In some examples, the space-filling member can include only at least one recess partially extending along a thickness direction thereof. In some examples, the space-filling member can include only at least one opening extending through the space-filling member along a thickness direction thereof. In some examples, the space-filling member can include at least one recess partially extending along a thickness direction thereof, and at least one opening extending through the space-filling member along a thickness direction thereof.

[0033] By forming at least one second recess and / or second opening along a thickness direction of the space-filling member, the weight of the test auxiliary board can be made close to, or substantially the same as, the weight of the test board. This is beneficial to the overall stability of the testing apparatus in use, especially when a plurality of test auxiliary boards are arranged in a stacked form on both sides of a plurality of stacked test boards, the test auxiliary boards and test boards with close or substantially the same weight can prevent the testing apparatus from tilting.

[0034] In some alternative embodiments, the second recess and / or second opening can be symmetrically arranged with respect to a vertical central axis of the test auxiliary board, which makes the space-filling member have symmetry with respect to the vertical central axis in structure. This is also beneficial to the overall stability of the testing apparatus in use.

[0035] It can be understood that, according to actual needs (such as different test boards having different weights or weight distributions), the size and position of each recess and / or opening in the space-filling member and / or the lower extending member can be flexibly adjusted so that the weight or weight distribution of the test auxiliary board is close to that of the corresponding test board.

[0036] In some alternative embodiments, the first sealing member is located at a top side of the space-filling member.

[0037] In some alternative embodiments, a plurality of holes are provided in the first sealing member, which extend through the first sealing member in the vertical direction, and a plurality of screw grooves are provided in the top portion of the space filling member, which correspond to the plurality of holes in position, and the first sealing member is configured to be fastened at the top side of the space filling member by screwing a screw through the holes and into the corresponding screw grooves. The fastening configuration between the first sealing member and the space filling member formed by the screw passing through the holes and being screwed into the corresponding screw grooves facilitates a stable connection between the two, which in turn facilitates the test auxiliary plate to facilitate the accurate positioning of the test plate, thereby improving the mechanical stability and electrical reliability of the test equipment.

[0038] In some alternative embodiments, a plurality of elongated holes are provided in the first sealing member, which extend through the first sealing member in the vertical direction, thereby allowing the position of the first sealing member relative to the space filling member to be adjusted accordingly according to the state of the test plate.

[0039] The elongated holes allow the first sealing member to move or adjust within a certain range relative to the space filling member. This adjustability enables the first sealing member to be positioned flexibly during installation and debugging to adapt to different test plate states or sizes. In particular, after being used for a long time, when the test plate (in particular, the side of the test plate containing the electrical contacts for contacting the component carriers to be tested) deforms slightly, the relative position of the first sealing member and the test plate (in particular, the side of the test plate containing the electrical contacts for contacting the component carriers to be tested) can be adjusted to apply force to the adjacent test plate in the stacking direction of the test plates to make the test plates as close as possible. In addition, during equipment operation, the elongated holes also allow the member to absorb or alleviate deformation stress caused by thermal expansion and contraction or mechanical stress to some extent.

[0040] In some alternative embodiments, the plurality of holes are evenly distributed along the length of the first sealing member. The evenly distributed holes provide the first sealing member with uniform fixing points, making the fixing force of the first sealing member more balanced in the entire length direction. The even distribution of holes can also minimize local deformation or stress concentration caused by thermal expansion and contraction or mechanical stress.

[0041] In some alternative embodiments, the test auxiliary board further comprises at least two fixing members, the at least two fixing members being arranged at two opposite corners of the space-filling member in the length extension direction, and the at least two fixing members being configured to fix the space-filling member to the equipment frame. This allows the test auxiliary board to be stably connected to the equipment frame located on both sides thereof. The stable connection of the test auxiliary board to the equipment frame can further facilitate the accurate alignment of the test board relative to the object to be tested.

[0042] In some alternative embodiments, the first sealing member and / or the second sealing member are configured as electrically insulating sealing members.

[0043] Advantageously, the first sealing member and the second sealing member are each made of an electrically insulating material. The electrically insulating sealing members can prevent undesired electrical contact between the test auxiliary board located in the non-test area and the test board and / or the object to be tested.

[0044] In embodiments, the electrically insulating sealing members can comprise at least one of the following: resin (e.g. reinforced or non-reinforced resin, such as epoxy resin or bismaleimide-triazine resin), cyanate ester resin, polyphenylene derivative, glass, prepreg material, polyimide, polyamide, liquid crystal polymer, epoxy resin-based build-up film, polytetrafluoroethylene, ceramic and metal oxide. Reinforcing structures made of glass (multi-layer glass), such as meshes, fibers or spheres, can be used, for example.

[0045] In embodiments, the test equipment applying the test auxiliary board provided by the exemplary embodiments of the present application can be particularly used for testing a component carrier shaped as a board. The board-shaped component carrier facilitates a compact design and still provides a large base for mounting components thereon.

[0046] In embodiments, the test equipment applying the test auxiliary board provided by the exemplary embodiments of the present application can be particularly used for testing a component carrier configured as one of a printed circuit board, a substrate (in particular an IC substrate) and an interposer or a preform thereof.

[0047] In the context of the present application, the term "printed circuit board" (PCB) can in particular denote a plate-like component carrier formed by laminating a plurality of electrically conductive layer structures with a plurality of insulating layer structures, for example by applying pressure and / or providing thermal energy. The various electrically conductive layer structures can be connected to each other in a desired manner by forming holes through the laminate, for example by laser drilling or mechanical drilling, and by partially or completely filling the holes with an electrically conductive material, in particular copper, thereby forming vias such as through-hole connections. In addition to one or more components that can be embedded in the printed circuit board, the printed circuit board is typically configured to accommodate one or more components on one or both opposite surfaces of the plate-like printed circuit board. They can be connected to the respective main surface by soldering. The dielectric part of the PCB can consist of a resin with reinforcing fibers such as glass fibers.

[0048] In the context of the present application, the term "substrate" can in particular denote a small component carrier. The substrate can be a relatively small component carrier in relation to the PCB, on which one or more components can be mounted and which can act as a connection medium between one or more chips and another PCB. For example, the substrate can have substantially the same size as the components, in particular electronic components, to be mounted thereon, for example in the case of a chip-scale package (CSP). More particularly, the substrate can be understood as a carrier for electrical connections or electrical networks and as a component carrier comparable to a printed circuit board (PCB), but with a comparably high density of laterally and / or vertically arranged connections. Lateral connections are, for example, electrically conductive paths, while vertical connections can be, for example, drilled holes. These lateral and / or vertical connections are arranged within the substrate and can be used to provide electrical, thermal and / or mechanical connections of a housed component or a non-housed component, such as a bare die, in particular an IC chip, with a printed circuit board or an intermediate printed circuit board. Thus, the term "substrate" also includes "IC substrate". The dielectric part of the substrate can consist of a resin with reinforcing particles such as reinforcing balls, in particular glass balls.

[0049] The substrate or interposer can comprise or consist of at least the following: glass; silicon and / or a photosensitive or dry-etchable organic material, such as an epoxy-based build-up material (e.g. an epoxy-based build-up film); or a polymeric compound (which can or can not include light- and / or heat-sensitive molecules).

[0050] The above-defined aspects and further aspects of the present application are apparent from the examples of embodiment to be described hereinafter and to be explained with reference to these examples of embodiment. BRIEF DESCRIPTION OF DRAWINGS

[0051] The features and advantages of the embodiments of the present application will become more apparent from the following description with reference to the accompanying drawings, of which:

[0052] Figure 1 A structural diagram of a test auxiliary board according to an exemplary embodiment of the present application is provided.

[0053] Figure 2 An exploded view of a test auxiliary board according to an exemplary embodiment of the present application is provided.

[0054] Figure 3 A schematic diagram of a test apparatus for testing electrical properties of a component carrier is provided, wherein the test apparatus is loaded only with a plurality of test boards, but not yet with a test auxiliary board according to an exemplary embodiment of the present application.

[0055] Figure 4 A cross-sectional view of a first sealing member in a test auxiliary board according to an exemplary embodiment of the present application is provided, wherein a plurality of elongated holes provided at a top side of the first sealing member are shown. DETAILED DESCRIPTION

[0056] The present application will be described in detail by referring to the attached drawings, with reference to the exemplary embodiments of the present application. It is noted that the following detailed description of the present application is merely for illustrative purposes rather than to limit the present application. In addition, the same reference numerals are used throughout the various drawings to designate the same components.

[0057] It is also noted that, for the sake of clarity, not all of the features of a practical, specific embodiment are described and illustrated in the description and drawings, and that, additionally, some of the features described and illustrated in the description and drawings are not necessarily to be combined with some of the other features described and illustrated in the description and drawings, but can be implemented independently of some of the other features described and illustrated in the description and drawings.

[0058] In order to make the purposes, technical solutions, and advantages of the embodiments of the present application clearer, the embodiments of the present application will be described in detail below with reference to the drawings. However, those skilled in the art can understand that, in the embodiments of the present application, many technical details are presented in order to make the present application better understood by the readers. However, the technical solutions claimed by the present application can be implemented even without these technical details and based on various changes and modifications of the following embodiments. The division of the following embodiments is for the convenience of description, and should not constitute any limitation on the specific embodiments of the present application, and the embodiments can be combined with each other and cited to each other without contradiction.

[0059] It is to be understood that the terms "first", "second", and the like, used in the description and the claims of the present application are used to differentiate between similar objects, and do not connote an ordering, unless otherwise indicated. Thus, a feature specified as "first" can imply that there is one or more such feature(s) and implicitly that there are one or more of the feature(s) specified as "second". It is also to be understood that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting. In this document, relational terms such as "first", "second", and the like can be used solely to distinguish one entity or action from another entity or action, without necessarily implying any actual relationship or order. Furthermore, although embodiments of the present application have been described, various alterations, modifications, and improvements can be made hereto without departing from the scope of the present application, which are intended to cover all such modifications and changes as would be within the scope of the claims of the present application. In this document, the terms "comprises", "comprising", or similar terms are intended to cover a non-exclusive inclusion, such that any process, method, article, or apparatus that comprises a list of elements is not necessarily limited to those elements but can include other elements not expressly listed or inherent to such process, method, article, or apparatus. In this document, the terms "coupled" and "connected", along with derivatives thereof, can be used to describe both an indirect and direct connection or coupling. In this document, the term "unit" can refer to a self-contained component, or a combination of components, that is integrally formed or operatively coupled.

[0060] In this document, terms such as "upper", "lower", "outer" and "inner" are used for convenience only and are not to be construed as limiting. In addition, although the present application has been described in detail with particular reference to certain illustrative embodiments thereof, it should be understood that modifications, variations and alterations can be made to such embodiments without departing from the scope of the present application as defined by the appended claims.

[0061] Reference Figures 1 to 4 The exemplary embodiments of the present application provide a test auxiliary board 100 that can be applied in a test device 200 as shown in the accompanying drawings. Figure 3 The test auxiliary board 100 according to the exemplary embodiments of the present application is provided. Figure 1 A structural schematic diagram of the test auxiliary board 100 according to the exemplary embodiments of the present application is shown. Figure 2 An exploded view of the test auxiliary board 100 according to the exemplary embodiments of the present application is shown. Figure 4 A cross-sectional view of the first sealing member 104 in the test auxiliary board 100 according to the exemplary embodiments of the present application is provided, in which a plurality of elongated holes provided at the top side of the first sealing member 104 are shown.

[0062] The test device 200 is provided with a receiving space 204, such as a test cavity or a test chamber, formed by the device frame 202. A plurality of test boards 300 for testing a component carrier can be received in the receiving space 204. As shown in the accompanying drawings, Figure 3 The plurality of test boards 300 can be arranged in the receiving space 204 in close proximity to each other. Each test board 300 can be connected to the surrounding device frame by a corresponding fixing member, respectively.

[0063] The test auxiliary board 100 includes at least one space-filling member 102. The space-filling member 102 can be configured to at least partially fill the remaining space 205 in the accommodation space 204 other than the space occupied by the test boards 300. The test auxiliary board 100 further includes a first sealing member 104, which can be configured to seal the space between the space-filling member 102 and the surrounding device frame 202.

[0064] Exemplarily, a plurality of test boards 300 can be substantially centrally arranged in the accommodation space 204 of the test device 200, as shown in Figure 3 Accordingly, the test auxiliary board 100 can be arranged in the accommodation space 204 and distributed along the stacking direction of the test boards 300 on both sides of the plurality of test boards 300 (e.g., the unoccupied spaces on both sides of the plurality of test boards 300 as shown in Figure 3 Thus, the space-filling member 102 of the test auxiliary board 100 at least partially fills the remaining space on both sides of the plurality of test boards 300 in the accommodation space 204, while the first sealing member 104 of the test auxiliary board 100 further seals or substantially seals the remaining space between the corresponding space-filling member 102 and the surrounding device frame 202. Here, "sealing" can be understood as, for example, that there is no more remaining space between the space-filling member 102 and the surrounding device frame 202 to be filled so that the test auxiliary board 100 can further assist in the accurate positioning of the test boards 300.

[0065] The test auxiliary board 100 according to the exemplary embodiments of the present application facilitates the stable positioning of the test boards 300 by effectively filling the remaining space 205 in the accommodation space 204 other than the space occupied by the plurality of test boards 300, thereby preventing the undesired relative displacement between the test boards 300 and the objects under test during the test (in particular, such undesired relative displacement can cause the relative displacement of the electrical contacts such as test probes on the test boards 300 and the electrical interfaces on the objects under test). The accurate alignment of the electrical contacts such as test probes on the test boards 300 and the electrical interfaces on the component carriers facilitates the acquisition of accurate test data to reduce the measurement errors due to the instability or positional deviation of the test boards 300. In addition, the stable positioning of the test boards 300 is particularly advantageous for shortening the debugging time of the test device before the test.

[0066] In addition, in the related art, the test chamber of the test device 200 needs to be filled with the test boards 300. However, depending on the size of the component carriers to be tested, only a portion of the test boards 300 can be in electrical contact with the component carriers to be tested to perform electrical tests during the test process. However, the remaining test boards 300, which are not in electrical contact with the component carriers to be tested, can be damaged when a short circuit or high voltage occurs in the test circuit. The test auxiliary board 100 provided by the embodiments of the present application is used to replace the test boards 300 in the non-test area in the test device 200, so that the test auxiliary board 100 is not damaged even if a short circuit or high voltage occurs in the test circuit, which provides significant cost savings.

[0067] In some embodiments, the space-filling member 102 can include at least one second recess extending partially in the thickness direction of the space-filling member 102. When there are two or more second recesses, the two or more second recesses can be symmetrically arranged with respect to the vertical center axis of the test auxiliary board 100, so that the space-filling member 102 has structural symmetry with respect to the vertical center axis. In some embodiments, the space-filling member 102 can include at least one second opening 114 extending through the space-filling member 102 in the thickness direction of the space-filling member 102. When there are two or more second openings 114, the two or more second openings 114 can be symmetrically arranged with respect to the vertical center axis of the test auxiliary board 100, so that the space-filling member 102 has structural symmetry with respect to the vertical center axis, so that the weight distribution of a single test auxiliary board is substantially balanced in its planar direction. In some embodiments, the space-filling member 102 includes at least one second recess extending partially in the thickness direction of the space-filling member 102, and the space-filling member 102 further includes at least one second opening 114 extending through the space-filling member 102 in the thickness direction of the space-filling member 102. The at least one second recess and the at least one second opening can be symmetrically arranged with respect to the vertical center axis of the test auxiliary board 100 as a whole, so that the space-filling member 102 has structural symmetry with respect to the vertical center axis, so that the weight distribution of a single test auxiliary board is substantially balanced in its planar direction.

[0068] The second recess and / or the second opening may, for example, have a square shape with rounded corners. It can be understood that, in other embodiments, the second recess and / or the second opening can also have different shapes.

[0069] The first sealing member 104 can be located at the top side of the space filling member 102. In some embodiments, the first sealing member 104 can be fixedly connected to the space filling member 102. In some embodiments, the first sealing member 104 can be detachably connected to the space filling member 102. In some embodiments, the first sealing member 104 of the test auxiliary board and the electrical contact portion of the test board are both disposed at the side of the respective board facing the component carrier during testing.

[0070] A plurality of holes 116 can be provided in the first sealing member 104, which extend through the first sealing member 104 in the vertical direction. The plurality of holes 116 can be uniformly distributed along the length of the first sealing member 104. However, it can be appreciated that in some applications, a non-uniform distribution of the plurality of holes 116 along the length of the first sealing member 104 is also possible. A plurality of threaded slots corresponding in position to the plurality of holes 116 are provided in the top portion of the space filling member 102. The first sealing member 104 can be fastened at the top side of the space filling member 102 by a screwing member such as a screw passing through the hole 116 and being screwed into the corresponding threaded slot.

[0071] The first sealing member 104 can be made of an electrically insulating material. The electrically insulating first sealing member 104 is advantageous for preventing undesired electrical contact between the test auxiliary board 100 located in the non-test area and the test board 300 and / or the object to be tested.

[0072] In some embodiments, the hole 116 can be configured as an oblong hole. A plurality of oblong holes can be uniformly distributed along the length of the first sealing member 104. The first sealing member 104 can be fastened at the top side of the space filling member 102 by a screwing member passing through the oblong hole and being screwed into the corresponding threaded slot.

[0073] The design of the elongated hole is particularly advantageous. The elongated hole allows the position of the first sealing member 104 relative to the space-filling member 102 to be adjusted at any time according to the state of the test board 300. It can be appreciated that the elongated hole allows the first sealing member 104 to move or adjust within a certain range relative to the space-filling member 102. This adjustability enables the first sealing member 104 to be flexibly positioned during installation and debugging to adapt to different states of the test board 300. In particular, the first sealing member 104 can be adaptively adjusted to facilitate the flat state of the side of the plurality of test boards 300 provided with the electrical contacts. For example, a greater force can be applied to the plurality of test boards 300 by positioning the first sealing member 104 closer to the test boards 300 in the stacking direction (as shown, extending perpendicular to the length of the first sealing member) so that the plurality of test boards 300 are closer to each other. For example, a smaller force can be applied to the plurality of test boards 300 by positioning the first sealing member 104 farther away from the test boards 300 in the stacking direction so that the plurality of test boards 300 are less close to each other.

[0074] In addition, during operation of the device, the elongated hole can also allow the member to absorb or alleviate deformation stress caused by thermal expansion and contraction or mechanical stress, etc. to some extent.

[0075] Different elongated holes can have the same or different lateral extensions (lengths). Different elongated holes can have the same or different vertical extensions (depths). Different threaded grooves can have the same or different vertical extensions (depths).

[0076] In some embodiments, the test auxiliary board 100 can further include at least two fixing members 120. Figure 1 And Figure 2 The test auxiliary board 100 shown is provided with two fixing members 120. The at least two fixing members 120 can be provided at opposite ends of the space-filling member 102, for example, at opposite corners of the space-filling member 102 in the lengthwise direction of the space-filling member 102. The fixing member 120 can be configured to connect the space-filling member 102 to the device frame 202 by matching with the corresponding structure on the device frame 202, such as a snap-fit connection.

[0077] Also refer to Figure 1 And Figure 2The test aid plate 100 can also include a lower extending member 106 extending from the bottom of the space filling member 102. The lower extending member 106 can be configured to extend towards the bottom of the housing space 204 when in use to mate the test aid plate 100 to the bottom device frame 202. The lower extending member 106 extends from the bottom of the space filling member 102 and, when in use (when the test aid plate is fitted into the test equipment), will extend to the bottom of the housing space 204 to mate with the bottom device frame 202. This allows additional mechanical support and stability to be provided in three-dimensional space, preventing the test aid plate 100 from moving during testing due to the effects of vibration or other forces.

[0078] The lower extending member 106 can be detachably connected to the space filling member 102 by one or more screws.

[0079] In some embodiments, the lower extending member 106 can include at least one first recess extending partially in the thickness direction of the lower extending member 106. When there are two or more first recesses, the two or more first recesses can be symmetrically disposed with respect to the vertical central axis of the test aid plate 100, such that the lower extending member 106 has structural symmetry with respect to the vertical central axis. In some embodiments, the lower extending member 106 can include at least one first opening 112 extending through the lower extending member 106 in the thickness direction of the lower extending member 106. When there are two or more first openings 112, the two or more first openings 112 can be symmetrically disposed with respect to the vertical central axis of the test aid plate 100, such that the lower extending member 106 has structural symmetry with respect to the vertical central axis. In some embodiments, the lower extending member 106 includes at least one first recess extending partially in the thickness direction of the lower extending member 106, and the lower extending member 106 includes at least one first opening 112 extending through the lower extending member 106 in the thickness direction of the lower extending member 106. The at least one first recess and the at least one first opening 112 can be symmetrically disposed as a whole with respect to the vertical central axis of the test aid plate 100, such that the lower extending member 106 has structural symmetry with respect to the vertical central axis.

[0080] The first recess and / or the first opening may, for example, be square in shape with rounded corners. It will be appreciated that in further embodiments, the first recess and / or the first opening can also have different shapes.

[0081] The first recess and / or the first opening in the lower extending member 106 can have a size and shape that is different from the size and shape of the second recess and / or the second opening in the space filling member 102. For example, in some embodiments, the first recess and / or the first opening in the lower extending member 106 has a relatively large size, while the second recess and / or the second opening in the space filling member 102 has a relatively small size.

[0082] In some embodiments, the test aid plate 100 can further comprise a second sealing member 108. The second sealing member 108 can be configured to seal the space between the lower extending member 106 and the device frame 202 of the bottom part. Here, "sealing" can be understood, for example, as meaning that there is no more clearance space between the lower extending member 106 and the device frame 202 of the bottom part that can be filled so that the test aid plate 100 can further assist in the precise positioning of the test plate 300. By means of the second sealing member 108, a positional deviation of the test aid plate 100 relative to the device frame 202 due to other physical factors can be reduced.

[0083] The second sealing member 108 can be arranged on the side of the lower extending member 106 that is opposite the space filling member 102. The second sealing member 108 can be connected to the outer periphery of the lower extending member 106, for example. The second sealing member 108 can further comprise a second connecting member 110 that matches the first connecting member on the device frame 202 of the bottom part, so that the lower extending member 106 and thus the test aid plate 100 is connected to the device frame 202 of the bottom part. The second connecting member 110 can comprise a pin arranged at the bottom of the second sealing member 108, for example. The first connecting member can be a positioning hole into which the pin is inserted, for example.

[0084] The second sealing member 108 can be made of an electrically insulating material. The electrically insulating second sealing member 108 advantageously prevents undesired electrical contact between the test aid plate 100 in the non-test area and the test plate 300 and / or the object to be tested.

[0085] Although the present application has been described with reference to exemplary embodiments, it is to be understood that the application is not limited to the specific embodiments disclosed. Various modifications apparent to those skilled in the art are intended to be within the scope of the claims defining the scope of the application.

[0086] Features mentioned and / or shown in the above description of exemplary embodiments of the present application can be combined with one or more of the other embodiments in the same or analogous manner as the features are combined in another embodiment to form yet further embodiments of the application. Such further embodiments of the application are also intended to fall within the scope of the application.

Claims

1. A test aid board (100) for use in a test apparatus (200) for component carriers, the test apparatus (200) comprising a housing space (204) formed by an apparatus frame (202) for accommodating a plurality of test boards (300) for testing component carriers, characterized in that The test auxiliary board (100) includes: at least one space filling member (102) configured to at least partially fill a remaining space (205) in the accommodation space (204) other than a space occupied by the test board (300); and a first sealing member (104) configured to seal a space between the space filling member (102) and a surrounding device frame (202).

2. The test aid panel (100) according to claim 1, characterized in that The test auxiliary board (100) further includes a lower extension member (106) extending from a bottom of the space filling member (102), the lower extension member (106) being configured to extend toward a bottom of the accommodation space (204) when in use to match the test auxiliary board (100) to a bottom device frame (202).

3. The test aid (100) according to claim 2, characterized in that The test auxiliary board (100) further includes a second sealing member (108) configured to seal a space between the lower extension member (106) and the bottom device frame (202).

4. The test aid (100) according to claim 3, characterized in that The second sealing member (108) is connected to an outer periphery of the lower extension member (106).

5. The test aid (100) according to claim 3, characterized in that The second sealing member (108) is provided with a second connecting member (110) matching a first connecting member on the bottom device frame (202) to fix the lower extension member (106) to the bottom device frame (202) to fix the test auxiliary board (100) to the bottom device frame (202).

6. The test aid (100) according to claim 5, characterized in that The second connecting member (110) includes a pin provided at a bottom of the second sealing member (108).

7. The test aid (100) according to claim 3, characterized in that The second sealing member (108) is provided on a side of the lower extension member (106) opposite to the space filling member (102).

8. The test aid (100) according to claim 2, characterized in that The lower extension member (106) is fastened to the space filling member (102) by at least one screwing member.

9. The test auxiliary board (100) according to claim 2, wherein the lower extension member (106) includes at least one first recess partially extending in a thickness direction of the lower extension member (106); and / or the lower extension member (106) includes at least one first opening (112) extending through the lower extension member (106) in the thickness direction of the lower extension member (106).

10. The test aid (100) according to claim 9, characterized in that The first recess and / or the first opening (112) are symmetrically provided with respect to a vertical central axis of the test auxiliary board (100).

11. The test auxiliary board (100) according to claim 1, wherein the space filling member (102) includes at least one second recess partially extending in a thickness direction of the space filling member (102); and / or the space filling member (102) includes at least one second opening (114) extending through the space filling member (102) in the thickness direction of the space filling member (102).

12. The test aid (100) according to claim 11, characterized in that The second recess and / or the second opening (114) are symmetrically disposed with respect to a vertical center axis of the test auxiliary plate (100).

13. The test aid (100) according to claim 1, characterized in that The first sealing member (104) is located at a top side of the space filling member (102).

14. Test aid (100) according to claim 13, characterized in that A plurality of holes (116) that pass through the first sealing member (104) in a vertical direction are provided in the first sealing member (104), a plurality of screw grooves corresponding to the plurality of holes (116) in position are provided in a top portion of the space filling member (102), and the first sealing member (104) is configured to be fastened at a top side of the space filling member (102) by a screwing member passing through the holes (116) and being screwed into the corresponding screw grooves.

15. Test aid (100) according to claim 14, characterized in that A plurality of elongated holes that pass through the first sealing member (104) in a vertical direction are provided in the first sealing member (104), thereby allowing a position of the first sealing member (104) with respect to the space filling member (102) to be adjusted according to a state of the test plate (300).

16. The test aid (100) according to claim 14, characterized in that The plurality of holes are uniformly distributed along a length of the first sealing member (104).

17. The test aid (100) according to claim 1, characterized in that The test auxiliary plate (100) further includes at least two fixing members (120) disposed at two opposite corner portions of the space filling member (102) in a length extension direction, and the at least two fixing members (120) are configured to fix the space filling member (102) to the equipment frame (202).

18. The test aid (100) according to claim 3, characterized in that The first sealing member (104) and / or the second sealing member (108) are configured as electrically insulating sealing members.

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