Detection device for contact resistance of quick-acting switch

Abstract

The utility model relates to the technical field of locomotive electric appliance detection, and specifically comprises a mounting bottom plate and a test frame fixed on one side of the mounting bottom plate, eight probes and a threaded hole are mounted on the test frame, a relay is mounted on the other side of the mounting bottom plate, a button switch is mounted in the threaded hole, and a normally open end and a normally closed end of the relay are connected with the probes. The common end is connected with a low resistance tester, one end of the control end is connected with an AV220V positive electrode, the other end of the control end is connected with one end of a button switch, the other end of the button switch is connected with an AC220V negative electrode, the button switch is driven by a quick-action switch to control a relay to act during detection, and the purpose of detection is achieved. The reliable contact between the probe and the normally-open end and the normally-closed end of the quick-acting switch is utilized, the button switch is driven to be closed by means of the pressing force of the quick-acting switch shell on the button switch, and then the relay acts, so that the contact resistance of the normally-open end and the normally-closed end of the quick-acting switch can be detected through one-time taking, and the detection efficiency of the contact resistance of the quick-acting switch is improved.

Description

Technical Field

[0001] This utility model belongs to the field of locomotive electrical testing technology, specifically relating to a device for testing the contact resistance of a slewing switch. Background Technology

[0002] Quick-action switches are one of the important basic components of locomotive electrical systems, widely used in low-voltage electrical control circuits and auxiliary circuits. The inspection of contact resistance before leaving the factory is an important part of the production process, and the testing efficiency directly affects the production efficiency of the product. Quick-action switches are divided into two normally closed terminals and two normally open terminals, which can be converted between the normally closed and normally open terminals. When testing their resistance, a low-resistance tester is used to test the resistance when the two terminals are closed. Conventional testing is done manually to test the normally open and normally closed terminals separately, which has low testing efficiency. Utility Model Content

[0003] (a) Technical problems to be solved

[0004] This invention provides a device for detecting the contact resistance of a slewing switch, which solves the problem of low detection efficiency of slewing switch resistance.

[0005] (II) Technical Solution

[0006] To address the aforementioned problems, this utility model provides a device for detecting the contact resistance of a quick-acting switch, comprising a mounting base and a test frame fixed to one side of the mounting base. The test frame has eight probes and a threaded hole. The eight probes are divided into two groups: probes ABCD and probes EFGH. Each probe has a non-metallic sheath. A push-button switch is installed in the threaded hole, and a quick-acting switch is placed above the push-button switch. A relay is installed on the other side of the mounting base. The relay includes four normally closed terminals, four normally open terminals, four common terminals, and a control terminal. Probes ABCD are connected to the four normally closed terminals of the relay, and probes EFGH are connected to the four normally open terminals of the relay. A low-resistance tester is connected to the four common terminals of the relay. One end of the control terminal is connected to an AV220V positive terminal, and the other end is connected to one end of the push-button switch. The other end of the push-button switch is connected to an AC220V negative terminal.

[0007] Preferably, the snap-action switch includes two normally closed terminals and two normally open terminals. Each of the normally closed and normally open terminals has two probes. During detection, the normally closed terminal of the snap-action switch contacts the AB probe and the CD probe, and the normally open terminal of the snap-action switch contacts the EF probe and the GH probe.

[0008] Preferably, the lower end of the probe is connected to the relay via a wire.

[0009] Preferably, the probe is capable of sliding up and down.

[0010] Preferably, the AB probe, the CD probe, the EF probe, and the GH probe each form a probe group, and an insulating pad is provided between two probes in the probe group.

[0011] Preferably, the insulating pad is made of nylon.

[0012] (III) Technical Effects

[0013] This utility model discloses a device for detecting the contact resistance of a slew switch. It utilizes the reliable contact between a probe and the normally open and normally closed terminals of the slew switch, and uses the pressure applied by the slew switch housing to drive the button switch to close, thereby activating the relay. This allows for the detection of the contact resistance of the normally closed and normally open terminals of the slew switch in a single operation, thus improving the detection efficiency of the slew switch contact resistance. Attached Figure Description

[0014] To more clearly illustrate the technical solution of this application, the drawings used in the embodiments will be briefly introduced below. Obviously, for those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0015] Figure 1 This is a front view of the quick-action switch contact resistance detection device provided in an embodiment of this application.

[0016] Figure 2 This is a top view of the device for detecting the contact resistance of a slewing switch provided in an embodiment of this application.

[0017] Figure 3 This is a wiring diagram of the quick-action switch contact resistance detection device provided in an embodiment of this application.

[0018] Explanation of reference numerals in the attached figures:

[0019] 1-Mounting base plate, 2-Screw, 3-Test fixture, 4-Button switch, 5-Tested quick-acting switch, 6-Relay, 7-Probe A, 8-Probe B, 9-Probe C, 10-Probe D, 11-Probe E, 12-Probe F, 13-Probe G, 14-Probe H. Implementation

[0020] To enable those skilled in the art to better understand the technical solutions in this application, the technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of this application. Example

[0021] Reference Appendix Figures 1-3 , attached Figure 1 This is a front view of the quick-acting switch contact resistance detection device provided in an embodiment of this application. Figure 2 This is a top view of the quick-acting switch contact resistance detection device provided in an embodiment of this application. Figure 3 The wiring diagram of the quick-action switch contact resistance detection device provided in this application embodiment is shown in the figure. The device includes a mounting base plate 1, a test frame 3 fixed to one side of the mounting base plate 1 by screws 2, and a relay 6 mounted on the other side of the mounting base plate 1. The test frame 3 has eight probe mounting holes and one threaded hole. A push-button switch 4 rotates into the threaded hole and can be adjusted up and down to a suitable height before being fixed by the thread. Probes A, B, C, D, E, F, G, and H are respectively embedded in the eight probe mounting holes and can slide up and down along the probe mounting holes. Four probe mounting holes are provided on each side of the threaded hole as an axis of symmetry to facilitate circuit connection. The outer layer of probes A, B, C, D, E, F, G, and H is covered with a non-metallic sheath to ensure insulation between the probes and the test frame 3, as well as insulation between the probes themselves.

[0022] Relay 6 includes 4 normally closed terminals, 4 normally open terminals, 4 common terminals, and a control terminal, such as... Figure 2 and Figure 3 As shown, Figure 2 and Figure 3 In the diagram, the four normally closed terminals of relay 6 are the rightmost terminals, the four normally open terminals are the second row of terminals from the right, the common terminal is the second row of terminals from the left, and the first row from the left is the control terminal. Wires are soldered to the lower ends of probes ABCDEFGH, with the other ends of the wires connected to the relay. Probes ABCD are connected to the four normally closed terminals of relay 6 via wires, and probes EFGH are connected to the four normally open terminals of relay 6 via wires. The four common terminals of relay 6 are connected to a low-resistance tester to test the resistance of the quick-action switch. One end of the control terminal of relay 6 is connected to the AV220V positive terminal, and the other end is connected to push-button switch 4. The other end of push-button switch 4 is connected to the AC220V negative terminal.

[0023] like Figure 1As shown, the speed switch 5 under test has two normally closed terminals and two normally open terminals. The normally closed terminals are in contact with the AB / CD probes, and the normally open terminals are in contact with the EF / GH probes. Each end of the speed switch 5 has two probes, which are insulated from each other before the switch is touched.

[0024] Probes AB, CD, EF, and GH form probe groups, and an insulating pad made of nylon is placed between two probes in each probe group.

[0025] When testing the contact resistance of the normally closed terminal of the quick-action switch 5, press down on the quick-action switch 5. The quick-action switch 5 drives the push-button switch 4 downward, closing the push-button switch 4 and driving the relay 6 to operate. At this time, the normally closed terminal of the relay 6 opens and the normally open terminal closes. Press the drive rod of the quick-action switch 5 under test again to make the quick-action switch 5 operate, that is, the quick-action switch 5 changes from normally closed to normally open. The contact resistance measured at this time is the contact resistance of the normally open terminal of the quick-action switch.

[0026] The device for detecting the contact resistance of the slew switch 5 of this invention utilizes the reliable contact between the probe and the normally open and normally closed terminals of the slew switch 5, and the pressing pressure of the slew switch 5 housing on the push button switch 4 drives the push button switch 4 to close, thereby activating the relay 6. This allows for the detection of the contact resistance of the normally closed and normally open terminals of the slew switch in a single operation, thus improving the detection efficiency of the slew switch contact resistance.

[0027] It should be noted that the terms "upper," "lower," "inner," "outer," "left," and "right," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship commonly used in this application. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application.

[0028] It should also be noted that, unless otherwise explicitly specified and limited, the terms “have”, “have”, etc., should be interpreted broadly, and those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.

Claims

1. A device for detecting the contact resistance of a snap action switch, characterised in that, The utility model provides a test frame, including installation base plate and the test frame of fixed in installation base plate one side, 8 probes and a threaded hole are installed on the test frame, 8 the probe is divided into two groups, is respectively the probe ABCD and the probe EFGH, each probe outer layer has nonmetal sheath, the threaded hole is installed with button switch, the button switch top places quick -action switch, the other side of installation base plate is installed with relay, the relay includes four normally closed end, four normally open end, four common end and control end, the probe ABCD is connected with four normally closed end of relay, the probe EFGH is connected with four normally open end of relay, four common end of relay is connected with low resistance tester, one end of control end connects AV220V positive pole, and the other end is connected with one end of button switch, and the other end of button switch connects AC220V negative pole.

2. A device for detecting contact resistance of a quick-action switch according to claim 1, characterized in that, The quick -action switch includes two normally closed ends and two normally open ends, each end of the normally closed end and the normally open end has two probes, when detecting, the normally closed end of the quick -action switch is contacted with the AB probe and the CD probe, and the normally open end of the quick -action switch is contacted with the EF probe and the GH probe.

3. The device for detecting contact resistance of a quick-action switch according to claim 1, wherein The lower end of the probe is connected with the relay through a wire.

4. The device for detecting contact resistance of a quick-action switch according to claim 1, wherein The probe can slide up and down.

5. A device for detecting the contact resistance of a quick-action switch according to any one of claims 1 to 4, characterized in that The AB probe, the CD probe, the EF probe and the GH probe respectively form a probe group, and an insulating pad is arranged between the two probes of the probe group.

6. A device for detecting the contact resistance of a quick-action switch according to claim 5, characterized in that The insulating pad is made of nylon.

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