Walk-in silent high and low temperature test box

Abstract

The utility model discloses a step-in silent high and low temperature test box, which relates to the technical field of high and low temperature test boxes, and comprises a buffer cabinet, the rear end of the buffer cabinet is provided with a silent test cabinet used for reducing the noise inside the test box, and one side of the buffer cabinet and one side of the silent test cabinet are provided with a temperature supply mechanism used for providing high and low temperature environments. Through the temperature supply mechanism, when testing is carried out, hot air or cold air is input into the buffer cabinet and the test cabinet through the buffer area high-low temperature host and the test area high-low temperature host via the input pipe, so that the internal temperatures of the buffer cabinet and the test cabinet are changed according to requirements, and the performance and the function of the electronic product in the high-low temperature environment are better verified. Through the mute test cabinet, the internal sound absorption layer, the internal sound insulation layer, the hollowing layer and the external sound insulation layer are wrapped layer by layer to form a mute chamber, so that the purpose of mute is achieved, and the problems that due to the fact that internal noise is large, audio performance detection of electronic products cannot be achieved, and noise measurement cannot be carried out when operation is carried out on structural parts of the electronic products are avoided.

Description

Technical Field

[0001] This utility model relates to the field of high and low temperature test chamber technology, specifically a walk-in silent high and low temperature test chamber. Background Technology

[0002] Various electronic products, such as laptops, tablets, mobile phones, and keyboards, as well as components of various products, such as audio performance measurement of electronic products, simulated operation performance testing of hinge mechanisms, button pressing noise testing, USB plugging and unplugging noise testing, and mobile phone power-on and power-off noise testing, need to verify their noise values ​​during operation in high and low temperature environments. However, traditional temperature chambers have relatively high internal noise, making it impossible to accurately measure the noise during various operations, unable to perform audio performance testing of products, unable to measure the noise of structural parts of products during operation, and unable to perform product operation testing actions without affecting the temperature and humidity inside the temperature chamber.

[0003] Based on this, a walk-in silent high and low temperature test chamber is now provided, which can eliminate the drawbacks of existing devices. Utility Model Content

[0004] The purpose of this invention is to provide a walk-in silent high and low temperature test chamber to solve the problems of being unable to accurately measure the noise during various operations and being unable to perform product operation and testing actions without affecting the temperature and humidity inside the chamber.

[0005] To achieve the above objectives, this utility model provides the following technical solution:

[0006] A walk-in silent high and low temperature test chamber includes a buffer cabinet. The front end of the buffer cabinet is provided with a cabinet door. The front left side of the cabinet door is provided with an outer door handle for the buffer zone. The rear left side of the cabinet door is provided with an inner door handle for the buffer zone. The rear end of the buffer cabinet is provided with a silent test cabinet for reducing noise inside the chamber. A heating mechanism for providing high and low temperature environments is provided on one side of the buffer cabinet and the silent test cabinet.

[0007] Based on the above technical solutions, this utility model also provides the following optional technical solutions:

[0008] In one alternative embodiment: the temperature supply mechanism includes an input pipe, an output pipe, a buffer zone high and low temperature host, a silent test zone high and low temperature host, and a heat dissipation vent. Multiple sets of input pipes are located on the top of one side of the buffer cabinet and the silent test cabinet; multiple sets of output pipes are located on the bottom of one side of the buffer cabinet and the silent test cabinet; an input pipe is located on the top of one side of the buffer zone high and low temperature host and the silent test zone high and low temperature host; an output pipe is located on the bottom of one side of the buffer zone high and low temperature host and the silent test zone high and low temperature host; a heat dissipation vent is located on the top of the buffer cabinet; a buffer zone LED explosion-proof light is located at the top of the interior of the buffer cabinet; an emergency stop and one-button call button are located inside the buffer cabinet; a buffer zone return air vent is located at the bottom of the side of the buffer cabinet; and a buffer zone air outlet is located at the top of the side of the buffer cabinet.

[0009] In one alternative: a temperature controller is provided on the left side of the front center of the buffer cabinet, an alarm is provided on the left side of the front top of the buffer cabinet, and a monitoring display is provided on the top of the front of the buffer cabinet.

[0010] In one alternative: the silent test cabinet is composed of layers of sound-absorbing layer, inner sound insulation layer, hollow layer and outer sound insulation layer, wherein the sound-absorbing layer is 50mm thick, the inner sound insulation layer is 80mm thick, the hollow layer is 90mm thick and the outer sound insulation layer is 80mm thick.

[0011] In one alternative: the top of the silent test cabinet is equipped with an LED explosion-proof light for the silent test area, and the top of the silent test cabinet is equipped with multiple sets of air inlet silencers and sound-absorbing mesh panels.

[0012] In one alternative: an oxygen content detector is installed at the rear of the interior of the silent test cabinet, and a temperature, humidity and noise monitor is installed at the bottom of the oxygen content detector.

[0013] In one alternative: the buffer cabinet has a stainless steel sample shelf inside, the silent test cabinet has a waterproof industrial socket on one side inside, and the silent test cabinet has multiple sets of return air vents at the bottom.

[0014] In one alternative: the inner bottom of the silent test cabinet and the hollow layer is provided with multiple sets of hollow area damping rubber, the bottom of the buffer cabinet is provided with multiple sets of buffer zone damping rubber, the bottom of the silent test cabinet is provided with multiple sets of silent test area damping rubber, the top of the silent test cabinet is provided with a monitoring camera, and one side of the silent test cabinet is provided with a silent test area emergency stop and one-button call button.

[0015] Compared with the prior art, the beneficial effects of this utility model are as follows:

[0016] 1. This utility model uses a temperature supply mechanism to input hot or cold air into the buffer cabinet and test cabinet through the input pipe during testing. This allows the internal temperature of the buffer cabinet and test cabinet to be changed according to the requirements, thereby better verifying the performance and function of electronic products in high and low temperature environments.

[0017] 2. This utility model uses a silent testing cabinet, which consists of an inner sound-absorbing layer, an inner sound-insulating layer, a hollow layer, and an outer sound-insulating layer to form a silent chamber, thereby achieving the purpose of silence and avoiding the inability to perform audio performance testing on electronic products or measure the noise of the structural parts of electronic products during operation due to excessive internal noise. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the structure of this utility model.

[0019] Figure 2 This is a schematic diagram of the main structure of this utility model.

[0020] Figure 3 This is a top view of the structure of this utility model.

[0021] Figure 4 This is a schematic diagram of the internal structure of the buffer zone and the silent room of this utility model.

[0022] Figure Labels and Annotations: 1. Buffer Cabinet; 2. Test Cabinet; 3. Heating Mechanism; 301. Input Pipe; 302. Output Pipe; 303. High and Low Temperature Main Unit for Buffer Zone; 304. High and Low Temperature Main Unit for Test Zone; 305. Heat Dissipation Vent; 306. LED Explosion-proof Light for Buffer Zone; 307. Emergency Stop and One-button Call Button for Buffer Zone; 308. Return Air Vent for Buffer Zone; 309. Air Outlet for Buffer Zone; 4. Shock-absorbing Damping Rubber for Buffer Zone; 5. Cabinet Door; 6. Door Handle for Buffer Zone Outer Box; 7. Temperature Controller; 8. Alarm; 9. Monitoring Display; 1 0. Inner door handle of the buffer zone; 11. Sound-absorbing layer; 12. Inner sound insulation layer; 13. Hollow layer; 14. Outer sound insulation layer; 15. LED explosion-proof light of the silent test area; 16. Air inlet silencer; 17. Sound-absorbing perforated panel; 18. Oxygen content detector; 19. Temperature and humidity / noise monitor; 20. Stainless steel sample shelf; 21. Waterproof industrial socket; 22. Return air vent; 23. Vibration damping adhesive in the hollow area; 24. Vibration damping adhesive in the silent test area; 25. Monitoring camera; 26. Emergency stop and one-button call in the silent test area; Detailed Implementation

[0023] To make the objectives, technical solutions, and advantages of this utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments.

[0024] In one embodiment, such as Figure 1 - Figure 4 As shown, a walk-in silent high and low temperature test chamber includes a buffer cabinet 1. The front of the buffer cabinet 1 is provided with a cabinet door 5. The left side of the front middle of the cabinet door 5 is provided with a buffer outer box door handle 6. By turning the buffer outer box door handle 6, the cabinet door 5 can be opened, allowing the test personnel to enter the buffer cabinet 1. The left side of the rear middle of the cabinet door 5 is provided with a buffer inner box door handle 10. By turning the buffer inner box door handle 10, the cabinet door 5 can be opened, allowing the test personnel to exit the buffer cabinet 1. The rear of the buffer cabinet 1 is provided with a silent test cabinet 2 for reducing the noise inside the chamber. The interior is used for testing electronic products. A temperature supply mechanism 3 for providing high and low temperature environments is provided on one side of the buffer cabinet 1 and the silent test cabinet 2, which is beneficial for verifying the performance and function of electronic products in high and low temperature environments.

[0025] In one embodiment, such as Figure 1 - Figure 4 As shown, the heating mechanism 3 includes an input pipe 301, an output pipe 302, a buffer zone high / low temperature host 303, a silent test zone high / low temperature host 304, and a heat dissipation vent 305. Multiple sets of input pipes 301 are provided on the top of one side of the buffer cabinet 1 and the silent test cabinet 2 for inputting hot or cold air. Multiple sets of output pipes 302 are provided on the bottom of one side of the buffer cabinet 1 and the silent test cabinet 2 for exhausting air. Input pipes 301 are provided on the top of one side of the buffer zone high / low temperature host 303 and the silent test zone high / low temperature host 304, and input pipes 305 are provided on the bottom of one side of the buffer zone high / low temperature host 303 and the silent test zone high / low temperature host 304. The buffer cabinet 1 has an output pipe 302. The top of the buffer high and low temperature host 303 and the silent test area high and low temperature host 304 is equipped with a heat dissipation vent 305. When the buffer high and low temperature host 303 and the test area high and low temperature host 304 are in use, they are used to dissipate heat. The top of the buffer cabinet 1 is equipped with a buffer LED explosion-proof light 306 for providing lighting. The buffer cabinet 1 is equipped with a buffer emergency stop and one-button call button 307 for easy one-button stop of the buffer and simultaneous call. The bottom of the side of the buffer cabinet 1 is equipped with a buffer return air vent 308, and the top of the side of the buffer cabinet 1 is equipped with a buffer air outlet 309.

[0026] In one embodiment, such as Figure 4 As shown, a temperature controller 7 is provided on the left side of the front middle of the buffer cabinet 1, which is used to set and control the internal temperature of the buffer cabinet 1 and the silent test cabinet 2. An alarm 8 is provided on the left side of the front top of the buffer cabinet 1, which is used to sound an alarm when danger occurs. A monitoring display 9 is provided on the top of the front of the buffer cabinet 1, which can observe the internal situation of the buffer cabinet 1 in real time.

[0027] In one embodiment, such as Figure 4As shown, the silent test cabinet 2 is composed of a sound-absorbing layer 11, an inner sound insulation layer 12, a hollow layer 13, and an outer sound insulation layer 14. The sound-absorbing layer 11 is 50mm thick, the inner sound insulation layer 12 is 80mm thick, the hollow layer 13 is 90mm thick, and the outer sound insulation layer 14 is 80mm thick, so that it can form a silent room to achieve the purpose of silence.

[0028] In one embodiment, such as Figure 4 As shown, the top of the silent test cabinet 2 is equipped with an LED explosion-proof light 15 for the silent test area, which is used to provide lighting for the interior of the silent test cabinet 2. The top of the silent test cabinet 2 is equipped with multiple sets of air inlet silencers 16 and sound-absorbing mesh panels 17, which are used to reduce the noise of the incoming air.

[0029] In one embodiment, such as Figure 4 As shown, the silent test cabinet 2 has an oxygen content detector 18 at the rear of its interior, which can measure the oxygen concentration in the silent room in real time. When the oxygen content is lower than the preset lower limit, the exhaust device will be automatically opened, and the ventilation function of the high and low temperature host 303 in the buffer zone and the high and low temperature host 304 in the test area will be activated. The exhaust gas will be discharged through the output pipe 302 and fresh air will be discharged through the input pipe 301, thus automatically exchanging air to ensure the safety of the test personnel. The bottom of the oxygen content detector 18 is equipped with a temperature and humidity / noise monitor 19, which displays the indoor temperature, humidity and noise decibel value in real time.

[0030] In one embodiment, such as Figure 4 As shown, the interior of the buffer cabinet 1 is equipped with a stainless steel sample shelf 20, and the interior of the silent test cabinet 2 is equipped with a waterproof industrial socket 21 on one side to provide power for the testing of electronic products. The bottom of the silent test cabinet 2 is equipped with multiple sets of return air vents 22.

[0031] In one embodiment, such as Figure 4 As shown, the bottom of the silent test cabinet 2 and the hollow layer 13 is provided with multiple sets of hollow area damping rubber 23, the bottom of the buffer cabinet 1 is provided with multiple sets of buffer zone damping rubber 4, and the bottom of the silent test cabinet 2 is provided with multiple sets of silent test area damping rubber 24. These can support the buffer cabinet 1 and the silent test cabinet 2, and at the same time treat the external vibration source. The top of the inside of the silent test cabinet 2 is provided with a monitoring camera 25. The monitoring camera 25 is used for detection, and the external personnel can observe the situation of the test personnel in real time through the monitoring display 9. The inside side of the silent test cabinet 2 is provided with a silent test area emergency stop and one-button call button 26. After the test personnel enter the silent test cabinet 2, in case of an accident, they can trigger the external alarm 8 through the silent test area emergency stop and one-button call button 26, so that the external personnel can know the internal situation in time and stop the work inside the silent test area in an emergency.

[0032] Working Principle: The above embodiment discloses a walk-in silent high and low temperature test chamber. During use, the cabinet door 5 is opened by turning the outer door handle 6 of the buffer zone, allowing the tester to enter the buffer cabinet 1. The height of the stainless steel sample shelf 20 is adjusted according to the testing requirements of the electronic products, and the electronic products to be tested are placed on it. Power is supplied to the electronic products for testing via a waterproof industrial socket 21. During testing, hot or cold air is input to the buffer cabinet 1 and the silent test cabinet 2 through the input pipe 301 via the high and low temperature host 303 in the buffer zone and the high and low temperature host 304 in the test area. This allows the internal temperature of the buffer cabinet 1 and the silent test cabinet 2 to change according to requirements, thereby better verifying the performance and function of the electronic products in high and low temperature environments. Simultaneously, the silent test cabinet 2 is composed of layers of internal sound-absorbing layer 11, internal sound insulation layer 12, hollow layer 13, and external sound insulation layer 14, forming a silent chamber to achieve the purpose of quiet operation. This avoids the inability to perform audio performance testing of electronic products or measure noise during operation of the structural parts of the electronic products due to excessive internal noise.

[0033] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A walk-in silent high and low temperature test chamber, comprising a buffer cabinet (1), wherein the front end of the buffer cabinet (1) is provided with a cabinet door (5), the front left side of the cabinet door (5) is provided with an outer buffer chamber door handle (6), and the rear left side of the cabinet door (5) is provided with an inner buffer chamber door handle (10), characterized in that: The rear end of the buffer cabinet (1) is provided with a mute test cabinet (2) for reducing the noise inside the temperature box, and one side of the buffer cabinet (1) and the mute test cabinet (2) is provided with a temperature supply mechanism (3) for providing high and low temperature environment.

2. The walk-in high-low temperature test chamber of claim 1, wherein: The temperature supply mechanism (3) comprises input pipes (301), output pipes (302), buffer area high and low temperature main machines (303), mute test area high and low temperature main machines (304) and heat dissipation openings (305), a plurality of groups of input pipes (301) are arranged on the top of one side of the buffer cabinet (1) and the mute test cabinet (2), a plurality of groups of output pipes (302) are arranged on the bottom of one side of the buffer cabinet (1) and the mute test cabinet (2), the input pipes (301) are arranged on the top of one side of the buffer area high and low temperature main machines (303) and the mute test area high and low temperature main machines (304), the output pipes (302) are arranged on the bottom of one side of the buffer area high and low temperature main machines (303) and the mute test area high and low temperature main machines (304), the heat dissipation openings (305) are arranged on the top of the buffer area high and low temperature main machines (303) and the mute test area high and low temperature main machines (304), the buffer area LED explosion-proof lamp (306) is arranged on the top of the inside of the buffer cabinet (1), the buffer area emergency stop and one-key calling button (307) is arranged in the buffer cabinet (1), the buffer area air return opening (308) is arranged on the bottom of the side of the buffer cabinet (1), and the buffer area air outlet opening (309) is arranged on the top of the side of the buffer cabinet (1).

3. The walk-in high-low temperature test chamber of claim 1, wherein: The temperature controller (7) is arranged on the left side of the middle of the front end of the buffer cabinet (1), the alarm (8) is arranged on the left side of the top of the front end of the buffer cabinet (1), and the monitoring display (9) is arranged on the top of the front end of the buffer cabinet (1).

4. The walk-in high-low temperature test chamber of claim 1, wherein: The mute test cabinet (2) is wrapped by the sound-absorbing layer (11), the inner sound insulation layer (12), the hollow drum layer (13) and the outer sound insulation layer (14) layer by layer, the sound-absorbing layer (11) is 50mm thick, the inner sound insulation layer (12) is 80mm thick, the hollow drum layer (13) is 90mm thick, and the outer sound insulation layer (14) is 80mm thick.

5. The walk-in high-low temperature test chamber of claim 1, wherein: The mute test area LED explosion-proof lamp (15) is arranged on the top of the inside of the mute test cabinet (2), and a plurality of groups of air inlet device silencers (16) and sound-absorbing mesh plates (17) are arranged on the top of the mute test cabinet (2).

6. The walk-in high-low temperature test chamber of claim 1, wherein: The oxygen content detector (18) is arranged at the rear end of the inside of the mute test cabinet (2), and the temperature and humidity / noise monitor (19) is arranged at the bottom of the oxygen content detector (18).

7. The walk-in high-low temperature test chamber of claim 1, wherein: The stainless steel sample shelf (20) is arranged in the buffer cabinet (1), the waterproof industrial socket (21) is arranged on one side of the inside of the mute test cabinet (2), and a plurality of groups of air return openings (22) are arranged at the bottom of the mute test cabinet (2).

8. The walk-in high-low temperature test chamber of claim 1, wherein: The inner bottom of the mute test cabinet (2) and the hollow layer (13) is provided with a plurality of hollow area shock absorption damping glue (23), the bottom of the buffer cabinet (1) is provided with a plurality of buffer area shock absorption damping glue (4), the bottom of the mute test cabinet (2) is provided with a plurality of mute test area shock absorption damping glue (24), the inner top of the mute test cabinet (2) is provided with a monitoring camera (25), and one side of the inner top of the mute test cabinet (2) is provided with a mute test area emergency stop and one-key calling button (26).

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