Electric energy meter calibrating device
By combining the forward/reverse detection switching module and the error module, the problems of poor adaptability and insufficient accuracy of existing electricity meter verification devices are solved, and high-accuracy verification of electricity meters from multiple manufacturers is achieved.
Patent Information
- Application Number
- CN202520010363.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-03
- Publication Date
- 2026-01-02
- Estimated Expiration
- 2035-01-03
AI Technical Summary
Existing electricity meter calibration devices are only applicable to a single model, resulting in poor adaptability. Furthermore, the fixed-cycle time measurement method and the timed-cycle measurement method cannot effectively address the influence of external conditions and human factors on errors, leading to insufficient calibration accuracy.
The system employs a forward/reverse detection switching module, which includes a forward detection unit and a reverse detection unit. It outputs low-frequency or high-frequency pulse signals through standard meter A and standard meter B, and performs error verification through the forward/reverse detection switching module. Combined with the error module, it enables the verification of electricity meters from multiple manufacturers.
It improves the accuracy of electricity meter calibration and is applicable to standard electricity meters from multiple manufacturers, achieving adaptability to various electricity meters and higher calibration accuracy.
Smart Images

Figure CN223756898U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to the technical field of electric energy meter, specifically relates to an electric energy meter calibrating device. BACKGROUND
[0002] At present, the electric energy meter needs to be calibrated in error and function before installation and use. The calibration of the electric energy meter generally has the fixed circle measurement time method and the fixed time measurement circle method. The fixed circle measurement time method: the fixed number of circles of the electric energy meter is set, and then the time consumption of the electric energy meter rotating the predetermined number of circles is measured to determine the error of the electric energy meter. The fixed time measurement circle method: the time is set in advance, and then the number of rotating circles of the electric energy meter in the specified time is observed, and the measured error of the electric energy meter is determined by the measured number of circles. However, the error may be caused by external conditions (such as temperature change), human factors or the device itself, and the single fixed circle measurement time method or the fixed time measurement circle method cannot well calibrate the error and function. In addition, the existing electric energy meter calibration device can only be applied to a single type of electric energy meter, and the adaptability is poor. CONTENT OF UTILITY MODEL
[0003] To solve the above technical problems, the utility model provides an electric energy meter calibration device, which is calibrated by two calibration modes of positive and negative calibration, has high accuracy, and can be applied to standard electric energy meters of multiple manufacturers.
[0004] The utility model adopts the following technical scheme:
[0005] An electric energy meter calibration device, comprising a positive and negative calibration switching module and an error module connected with the positive and negative calibration module, the positive and negative calibration switching module comprising a positive calibration unit and a negative calibration unit; when the positive calibration is carried out, the standard meter A outputs a low-frequency pulse, which is transmitted to the low-frequency pulse input end of the standard meter B through the positive and negative calibration switching module for error calibration; when the negative calibration is carried out, the standard meter A outputs a high-frequency pulse to the error system, and the standard meter B outputs a high-frequency pulse to the positive and negative calibration switching module, which is converted into a low-frequency pulse output to the error system for calibration after being processed by the positive and negative calibration switching module.
[0006] As a preferred, the positive calibration unit comprises a switching control circuit, a high-frequency signal input shaping circuit and an indication circuit.
[0007] As preferred, the switch control circuit comprises connector J1, relay K1, diode D1, resistor R1, light emitting diode L1 and triode Q1; the first pin of connector J1 is connected with VCC, the third pin is connected with GND, the second pin is suspended, the seventeenth and eighteenth pins are connected with VCC, the fifteenth and sixteenth pins are connected with GND, the fourteenth and thirteenth pins are connected with PC10; the fifth pin of relay K1 is connected with the third pin of relay K1; one end of resistor R1 is connected with PC10, the other end is connected with the anode of light emitting diode L1, the cathode of light emitting diode L1 is connected with the base of triode Q1; the anode of diode D1 is connected with GND, the cathode of diode D1 is connected with the eighth pin of relay K1; the first pin of relay K1 is connected with VCC.
[0008] As preferred, the high frequency signal input shaping circuit comprises connector JP2, connector JP3, double-row pin P4, double-row pin P5, double-row pin P6, double-row pin P7 and chip U1; the first pin of connector JP2 is connected with the second pin of double-row pin P6 and then connected with FH1, the third pin of connector JP2 is connected with GND, the second pin is suspended; the first pin of connector JP3 is connected with the sixth pin of relay K1, the third pin is connected with GND, the second pin is suspended; the first pin of double-row pin P4 is connected with FHIN, the second pin is connected with FHIN2; the first pin of double-row pin P5 is connected with FHIN, the second pin is connected with FH; the first pin of double-row pin P7 is connected with FHIN, the second pin is connected with FH1; the first pin of double-row pin P6 is connected with the fifth pin of chip U1, the sixth pin of chip U1 is connected with the ninth pin of chip U1, the eighth pin of chip U1 is connected with the seventh pin of relay K1, the third pin of chip U1 is connected with the fourth pin of relay K1 and then connected with FH, the fourth pin of chip U1 is connected with the eleventh pin of chip U1, the tenth pin of chip U1 is connected with FHIN.
[0009] As preferred, the indication circuit comprises connector JP1, connector J2, connector J5, resistor R7, light emitting diode L2 and capacitor C1; one end of resistor R7 is connected with VCC, the other end is connected with the anode of light emitting diode L2, the cathode of light emitting diode L2 is connected with GND; one end of capacitor C1 is connected with VC, the other end is connected with GND; connector J2 and connector J5 are suspended.
[0010] As preferred, the reverse inspection unit comprises frequency division circuit, low frequency signal output circuit and low frequency signal input shaping circuit.
[0011] As preferred, the frequency dividing circuit comprises resistor R2, resistor R3, resistor R4, resistor R5, resistor R6, chip U2, chip U3, transistor Q2, transistor Q3 and connector P9; one end of resistor R2 is connected with VCC, and the other end is connected with the collector of transistor Q2; one end of resistor R3 is connected with FHIN, and the other end is connected with GND; one end of resistor R4 is connected with FHIN, and the other end is connected with the base of transistor Q2; the emitter of transistor Q2 is connected with GND, and the collector is connected with the first pin of chip U2; the second pin of chip U2 is connected with VCC, the seventh pin is connected with GND, the sixth pin is connected with the ninth pin of chip U2, and is connected with / 10; the tenth pin of chip U2 is connected with VCC, the fifteenth pin is connected with GND, the fourteenth pin is connected with the first pin of chip U3, and is connected with / 100; the second pin of chip U3 is connected with VCC, the seventh pin is connected with GND, the tenth pin is connected with VCC, the fifteenth pin is connected with GND, the sixth pin is connected with the ninth pin, and is connected with / 1000, and the fourteenth pin is connected with / 10000; the first pin of connector P9 is connected with / 10000, the second pin is connected with / 1000, the third pin is connected with / 100, the fourth pin is connected with / 10, the fifth, sixth, seventh and eighth pins are connected with resistor R6; the other end of resistor R6 is connected with the base of transistor Q3, and the emitter of transistor Q3 is connected with GND; one end of resistor R5 is connected with VCC, and the other end is connected with the collector of transistor Q3; the first pin of double-row pin P8 is connected with OUT, and the second pin is connected with the emitter of transistor Q3.
[0012] As preferred, the low-frequency signal output circuit comprises connector J3; the ninth pin of connector J3 is connected with OUT, and the tenth pin is connected with FL1.
[0013] As preferred, the low-frequency signal input shaping circuit comprises connector JP4, double-row pin P1, double-row pin P2 and double-row pin P3; the first pin of chip U1 is connected with FL, the second pin is connected with the thirteenth pin, the twelfth pin is connected with the second pin of double-row pin P3, and the first pin is connected with FL1; the first pin of connector JP4 is connected with the second pin of double-row pin P1 and the first pin of P2, and the third pin of connector JP4 is connected with GND; the first pin of double-row pin P1 is connected with FL, and the second pin of double-row pin P2 is connected with FL1.
[0014] Compared with the prior art, the utility model has the advantages that the utility model discloses a watt-hour meter calibrating device, including positive and negative check switching module and with positive and negative check module connected error module, when positive check, standard table A exports low frequency pulse, via positive and negative check switching module transmission to standard table B low frequency pulse input end carries out error check, when negative check, standard table A exports high frequency pulse to error system, and standard table B exports high frequency pulse to positive and negative check switching module, and after via positive and negative check switching module processing, change into low frequency pulse and output to error system to carry out check, carry out check through positive and negative check two kinds of check mode, and the accuracy is higher, and can be applicable to the standard watt-hour meter of many manufacturers. BRIEF DESCRIPTION OF DRAWINGS
[0015] Figure 1 It is a module schematic diagram of the electric energy meter calibration device.
[0016] Figure 2 It is a circuit diagram of the switching control circuit.
[0017] Figure 3 It is a circuit diagram of the high-frequency signal input shaping circuit.
[0018] Figure 4 It is a circuit diagram of the indication circuit.
[0019] Figure 5 It is a circuit diagram of the frequency division circuit.
[0020] Figure 6 It is a circuit diagram of the low-frequency signal output circuit.
[0021] Figure 7 It is a circuit diagram of the low-frequency signal input shaping circuit. DETAILED DESCRIPTION
[0022] In order to facilitate the understanding of the technical scheme of the utility model, the following will be described in detail in combination with the drawings and specific embodiments.
[0023] Embodiment 1
[0024] As Figure 1 shown, an electric energy meter calibration device, comprising a positive and negative calibration switching module and an error module connected with the positive and negative calibration module, the positive and negative calibration switching module comprises a positive calibration unit and a negative calibration unit; when positive calibration, the standard meter A outputs low-frequency pulse, which is transmitted to the standard meter B low-frequency pulse input end via the positive and negative calibration switching module for error calibration; when negative calibration, the standard meter A outputs high-frequency pulse to the error system, and the standard meter B outputs high-frequency pulse to the positive and negative calibration switching module, which is converted into low-frequency pulse output to the error system for calibration after being processed by the positive and negative calibration switching module.
[0025] Embodiment 2
[0026] The positive calibration unit comprises a switching control circuit, a high-frequency signal input shaping circuit and an indication circuit.
[0027] As Figure 2As shown, the switching control circuit includes connector J1, relay K1, diode D1, resistor R1, LED L1, and transistor Q1; the first pin of connector J1 is connected to VCC, the third pin is connected to GND, the second pin is left floating, the seventeenth and eighteenth pins are connected to VCC, the fifteenth and sixteenth pins are connected to GND, and the fourteenth and thirteenth pins are connected to PC10; the fifth pin of relay K1 is connected to the third pin of relay K1; one end of resistor R1 is connected to PC10, and the other end is connected to the positive terminal of LED L1, the negative terminal of LED L1 is connected to the base of transistor Q1; the emitter of transistor Q1 is connected to GND, the collector of transistor Q1 is connected to the positive terminal of diode D1 and the eighth pin of relay K1; the negative terminal of diode D1 is connected to VCC, and the first pin of relay K1 is connected to VCC.
[0028] like Figure 3 As shown, the high-frequency signal input shaping circuit includes connectors JP2 and JP3, dual-row pin headers P4, P5, P6, and P7, and chip U1. The first pin of connector JP2 is connected to the second pin of dual-row pin header P6, and then connected to FH1. The third pin of connector JP2 is connected to GND, and the second pin is left floating. The first pin of connector JP3 is connected to the sixth pin of relay K1, the third pin is connected to GND, and the second pin is left floating. The first pin of dual-row pin header P4 is connected to FHIN, and the second pin is connected to FHIN2. The first pin of dual-row pin header P5 is connected to... FHIN, pin 2 is connected to FH; pin 1 of dual-row pin P7 is connected to FHIN, pin 2 is connected to FH1; pin 1 of dual-row pin P6 is connected to pin 5 of chip U1, pin 6 of chip U1 is connected to pin 9 of chip U1, pin 8 of chip U1 is connected to pin 7 of relay K1, pin 3 of chip U1 is connected to pin 4 of relay K1 and then connected to FH, pin 4 of chip U1 is connected to pin 11 of chip U1, pin 10 of chip U1 is connected to FHIN; chip U1 includes shaping circuit U1B, shaping circuit U1C, shaping circuit U1D and shaping circuit U1E.
[0029] like Figure 4 As shown, the indicator circuit includes connector JP1, connector J2, connector J5, resistor R7, light-emitting diode L2, and capacitor C1; one end of resistor R7 is connected to VCC, and the other end is connected to the positive terminal of light-emitting diode L2, and the negative terminal of light-emitting diode L2 is connected to GND; one end of capacitor C1 is connected to VC, and the other end is connected to GND; connector J2 and connector J5 are left floating.
[0030] Working process in positive test state: The fifth and sixth pins of relay K1 are connected, and the third and second pins are connected. Standard meter A is the standard meter under test, and standard meter B is the standard meter to be calibrated. At this time, the low frequency signal of standard meter A is input through connector JP2, shaped by shaping circuit U1C and shaping circuit U1D, and then from the eighth pin of shaping circuit U1D to the seventh pin of relay K1, then to the sixth pin of relay K1, and finally output to standard meter B for calibration through connector JP3.
[0031] The reverse detection unit includes a frequency division circuit, a low-frequency signal output circuit, and a low-frequency signal input shaping circuit.
[0032] like Figure 5 As shown, the frequency divider circuit includes resistors R2, R3, R4, R5, and R6, chip U2, chip U3, transistors Q2 and Q3, and connector P9. One end of resistor R2 is connected to VCC, and the other end is connected to the collector of transistor Q2. One end of resistor R3 is connected to FHIN, and the other end is connected to GND. One end of resistor R4 is connected to FHIN, and the other end is connected to the base of transistor Q2. The emitter of transistor Q2 is connected to GND, and the collector is connected to the first pin of chip U2. The second pin of chip U2 is connected to VCC, the seventh pin is connected to GND, the sixth pin is connected to the ninth pin of chip U2, and connected to / 10. The tenth pin of chip U2 is connected to VCC, the fifteenth pin is connected to GND, and the fourteenth pin is connected to the first pin of chip U3, and connected to / 100. The second pin of chip U3 is connected to VCC. CC, pin 7 is connected to GND, pin 10 is connected to VCC, pin 15 is connected to GND, pin 6 is connected to pin 9, connected to / 1000, pin 14 is connected to / 10000; connector P9 pin 1 is connected to / 10000, pin 2 is connected to / 100, pin 3 is connected to / 100, pin 4 is connected to / 10, pins 5, 6, 7, and 8 are connected to resistor R6. The above / 10, / 100, / 1000, and / 10000 are frequency division coefficients used to convert high-frequency signals into low-frequency signals; the other end of resistor R6 is connected to the base of transistor Q3, and the emitter of transistor Q3 is connected to GND; one end of resistor R5 is connected to VCC, and the other end is connected to the collector of transistor Q3; the first pin of the dual-row connector P8 is connected to OUT, and the second pin is connected to the emitter of transistor Q3.
[0033] like Figure 6 As shown, the low-frequency signal output circuit includes connector J3; the ninth pin of connector J3 is connected to OUT, the tenth pin is connected to FL1, and the ninth and tenth pins are connected together.
[0034] like Figure 7As shown, the low frequency signal input shaping circuit includes connector JP4, double row pin P1, double row pin P2 and double row pin P3; the first pin of chip U1 is connected with FL, the second pin is connected with the thirteenth pin, the twelfth pin is connected with the second pin of double row pin P3, and the first pin is connected with FL1; the first pin of connector JP4 is connected with the second pin of double row pin P1 and the first pin of P2, and the third pin of connector JP4 is connected with GND; the first pin of double row pin P1 is connected with FL, and the second pin of double row pin P2 is connected with FL1.
[0035] Reverse inspection state workflow: when the circuit is switched to the reverse inspection state, the standard table B is the inspected standard table, and the standard table A is the calibrated standard table, at this time, the relay K1 is switched to the normally open contact, the fifth pin and the sixth pin of the relay K1 are connected, and the third pin and the fourth pin are connected. The high frequency signal output by the standard table B passes through the connector JP3, and then passes through the sixth pin, the fifth pin, the third pin and the fourth pin of the relay K1, and then is input from the third pin of the shaping circuit U1B to be shaped, and then is output from the tenth pin of the shaping circuit U1E as FHIN2, and then is processed by the resistor R4, the triode Q2 and the chip U2 to be divided into frequency, and then is output from the connector P9, the connector P9 can select the frequency division gear, and generally defaults to one million frequency division, and then passes through the resistor R6, the triode Q3 and the double row pin P8 to be output as OUT, and then is output from the connector J3 to the error system to be calibrated.
[0036] The chip U1 further includes shaping circuit U1A and shaping circuit U1F; in the reverse inspection state, if the standard table B can directly output a low frequency pulse, the low frequency pulse can be input as FL from the connector JP4, enter the shaping circuit U1A to be shaped, output FL1 from the twelfth pin of the shaping circuit U1F, and then output from the connector J3 to the error system.
[0037] The preferred embodiments of the utility model are only above, the protection scope of the utility model is accurate with the range defined by claim, and several improvements and refinements made by the person skilled in the art without departing from the spirit and range of the utility model should also be regarded as the protection scope of the utility model.
Claims
1. An electric energy meter calibrating device, characterized by comprising: The error module is connected with the forward-backward inspection switching module, and the forward-backward inspection switching module comprises a forward inspection unit and a backward inspection unit; when forward inspection is performed, the standard table A outputs a low-frequency pulse, which is transmitted to a low-frequency pulse input end of the standard table B via the forward-backward inspection switching module to perform error inspection; When backward inspection is performed, the standard table A outputs a high-frequency pulse to the error system, and the standard table B outputs a high-frequency pulse to the forward-backward inspection switching module, which is converted into a low-frequency pulse after being processed via the forward-backward inspection switching module and then output to the error system to perform inspection.
2. The electric energy meter testing device according to claim 1, characterized in that, The forward inspection unit comprises a switching control circuit, a high-frequency signal input shaping circuit and an indication circuit.
3. The electric energy meter testing device according to claim 2, characterized in that, The switching control circuit comprises a connector J1, a relay K1, a diode D1, a resistor R1, a light-emitting diode L1 and a triode Q1; the first pin of the connector J1 is connected with VCC, the third pin is connected with GND, the second pin is suspended, the seventeenth and eighteenth pins are connected with VCC, the fifteenth and sixteenth pins are connected with GND, the fourteenth and thirteenth pins are connected with PC10; the fifth pin of the relay K1 is connected with the third pin of the relay K1; one end of the resistor R1 is connected with PC10, the other end is connected with the anode of the light-emitting diode L1, the cathode of the light-emitting diode L1 is connected with the base of the triode Q1; the anode of the diode D1 and the eighth pin of the relay K1 are connected with the emitter of the triode Q1; the cathode of the diode D1 is connected with VCC, the first pin of the relay K1 is connected with VCC.
4. The electric energy meter testing device according to claim 3, wherein, The high-frequency signal input shaping circuit comprises a connector JP2, a connector JP3, double-row pins P4, double-row pins P5, double-row pins P6, double-row pins P7 and a chip U1; the first pin of the connector JP2 is connected with the second pin of the double-row pins P6 and then connected with FH1, the third pin of the connector JP2 is connected with GND, and the second pin is suspended; the first pin of the connector JP3 is connected with the sixth pin of the relay K1, the third pin is connected with GND, and the second pin is suspended; the first pin of the double-row pins P4 is connected with FHIN, and the second pin is connected with FHIN2; the first pin of the double-row pins P5 is connected with FHIN, and the second pin is connected with FH; the first pin of the double-row pins P7 is connected with FHIN, and the second pin is connected with FH1; the first pin of the double-row pins P6 is connected with the fifth pin of the chip U1, the sixth pin of the chip U1 is connected with the ninth pin of the chip U1, the eighth pin of the chip U1 is connected with the seventh pin of the relay K1, the third pin of the chip U1 is connected with the fourth pin of the relay K1 and then connected with FH, the fourth pin of the chip U1 is connected with the eleventh pin of the chip U1, and the tenth pin of the chip U1 is connected with FHIN.
5. The electric energy meter testing device according to claim 4, characterized in that, The indication circuit comprises a connector JP1, a connector J2, a connector J5, a resistor R7, a light-emitting diode L2 and a capacitor C1; one end of the resistor R7 is connected with VCC, and the other end is connected with the anode of the light-emitting diode L2; the cathode of the light-emitting diode L2 is connected with GND; one end of the capacitor C1 is connected with VC, and the other end is connected with GND; the connector J2 and the connector J5 are suspended.
6. The electric energy meter testing device according to claim 1, wherein, The backward inspection unit comprises a frequency division circuit, a low-frequency signal output circuit and a low-frequency signal input shaping circuit.
7. The electric energy meter testing device according to claim 6, characterized in that, The frequency dividing circuit comprises resistors R2, R3, R4, R5, R6, chip U2, chip U3, transistors Q2 and Q3, and connector P9; one end of resistor R2 is connected to VCC, and the other end is connected to the collector of transistor Q2; one end of resistor R3 is connected to FHIN, and the other end is connected to GND; one end of resistor R4 is connected to FHIN, and the other end is connected to the base of transistor Q2; the emitter of transistor Q2 is connected to GND, and the collector is connected to the first pin of chip U2; the second pin of chip U2 is connected to VCC, the seventh pin is connected to GND, the sixth pin is connected to the ninth pin of chip U2, and / 10 is connected; the tenth pin of chip U2 is connected to VCC, the fifteenth pin is connected to GND, the fourteenth pin is connected to the first pin of chip U3, and / 100 is connected; the second pin of chip U3 is connected to VCC, the seventh pin is connected to GND, the tenth pin is connected to VCC, the fifteenth pin is connected to GND, the sixth pin is connected to the ninth pin, and / 1000 is connected; the fourteenth pin of chip U3 is connected to / 10000; the first pin of connector P9 is connected to / 10000, the second pin is connected to / 1000, the third pin is connected to / 100, the fourth pin is connected to / 10, the fifth, sixth, seventh and eighth pins are connected to resistor R6; the other end of resistor R6 is connected to the base of transistor Q3, and the emitter of transistor Q3 is connected to GND; one end of resistor R5 is connected to VCC, and the other end is connected to the collector of transistor Q3; the first pin of double-row pin P8 is connected to OUT, and the second pin is connected to the emitter of transistor Q3.
8. The electric energy meter testing device according to claim 7, characterized in that, The low-frequency signal output circuit comprises connector J3; the ninth pin of connector J3 is connected to OUT, and the tenth pin is connected to FL1.
9. The electric energy meter testing device according to claim 8, characterized in that, The low-frequency signal input shaping circuit comprises connector JP4, double-row pins P1, P2 and P3; the first pin of chip U1 is connected to FL, the second pin is connected to the thirteenth pin, the twelfth pin is connected to the second pin of double-row pin P3, and the first pin is connected to FL1; the first pin of connector JP4 is connected to the second pin of double-row pin P1 and the first pin of P2, and the third pin of connector JP4 is connected to GND; the first pin of double-row pin P1 is connected to FL, and the second pin of double-row pin P2 is connected to FL1.