Jig for multi-angle detection of appearance of laser

Abstract

The utility model discloses a jig for multi-angle detection of the appearance of a laser, and belongs to the technical field of lasers. The device comprises a supporting assembly, a clamping assembly and a damping assembly, the supporting assembly comprises two oppositely-arranged supporting frames and a connecting piece, and the connecting piece is connected with the two supporting frames in a sliding and clamping mode so that the distance between the two supporting frames can be adjusted; the clamping assembly comprises two clamping units matched with the two supporting frames respectively, each clamping unit comprises a clamping piece used for clamping the wafer ring and a connecting shaft, one end of each connecting shaft is fixedly connected with the corresponding clamping piece, and the other side of each connecting shaft is rotationally connected with the corresponding supporting frame; the damping assembly is arranged between the connecting shaft and the supporting frame and can increase the rotating resistance of the connecting shaft. According to the utility model, wafer rings with different sizes can be clamped, and the accuracy and the stability of relative angle adjustment of the wafer rings are improved.

Description

Technical Field

[0001] This utility model relates to the field of laser technology, and in particular to a fixture for multi-angle inspection of the appearance of lasers. Background Technology

[0002] In the manufacturing process of optical communication lasers, it is necessary to cut strips from the wafer and then cut the strips into cores. After each cutting, the appearance of the strips or cores needs to be inspected, and the inspection results of the appearance inspection are crucial to the quality of the strips or cores.

[0003] Existing inspection fixtures place bar strips or chips on a wafer ring during appearance inspection, and then use a CCD optical camera to perform appearance inspection on the bar strips or chips on the wafer ring to determine whether the product is qualified.

[0004] When testing bar strips or core particles, human intervention is generally used to adjust the angle by feel, which is not very stable, difficult to operate, and has extremely low testing efficiency. Utility Model Content

[0005] In view of this, it is necessary to provide a fixture for multi-angle inspection of the appearance of lasers, in order to solve the problem of difficulty in angle adjustment during the inspection of existing bar strips or core particles.

[0006] This utility model provides a fixture for multi-angle inspection of the appearance of a laser, comprising:

[0007] A support assembly includes two opposing support frames and a connector, wherein the connector is slidably engaged with the two support frames to adjust the distance between the two support frames;

[0008] A clamping assembly includes two clamping units that respectively cooperate with the two support frames. Each clamping unit includes a clamping member for clamping a wafer ring and a connecting shaft. One end of the connecting shaft is fixedly connected to the clamping member, and the other end of the connecting shaft is rotatably connected to the support frame.

[0009] A damping component is disposed between the connecting shaft and the support frame, and the damping component can increase the rotational resistance of the connecting shaft.

[0010] Furthermore, the damping assembly includes a damping block and a screw connector. The damping block is embedded in the support frame, one end of the damping block abuts against the connecting shaft, and the screw connector abuts against the other end of the damping block via the support frame.

[0011] Furthermore, the top of the support frame is provided with a connecting groove, which includes a sliding hole adapted to the connecting shaft and a damping hole adapted to the damping block. The damping hole is arranged perpendicular to the sliding hole, and the damping block can act on the connecting shaft radially.

[0012] Furthermore, the support frame is provided with a sliding groove in the middle, and the connector is slidably inserted into the sliding groove.

[0013] Furthermore, one side of the sliding groove is provided with fasteners for securing the connector.

[0014] Furthermore, the clamping member includes an openable elastic clamp capable of clamping the wafer rings of different thicknesses, and the connecting shaft is connected to the elastic clamp.

[0015] Furthermore, the clamping member also includes an abutment block, which is mounted on the elastic clamp and can flexibly abut against the wafer ring.

[0016] Furthermore, the angle between the clamping member and the horizontal plane ranges from 0° to 90°.

[0017] Furthermore, it also includes an angle measuring component, which includes an angle disk fixedly connected to the support frame, and the connecting shaft is inserted into the angle disk via the support frame.

[0018] Furthermore, the end of the connecting shaft is provided with a mark for identifying the angle disk.

[0019] Compared with the prior art, the beneficial effects of this utility model are as follows:

[0020] (1) This utility model provides a fixture for multi-angle inspection of the appearance of a laser, which is equipped with a clamping assembly. The clamping assembly includes two clamping units that cooperate with two support frames respectively. Each clamping unit includes a clamping member for clamping a wafer ring and a connecting shaft. The two clamping members can clamp the two sides of the wafer ring respectively to fix the wafer ring. One end of the connecting shaft is fixedly connected to the clamping member, and the other end of the connecting shaft is rotatably connected to the support frame. The clamping member can be rotatably connected to the support frame with the help of the connecting shaft, thereby assisting in the angle adjustment of the wafer ring, which is more operable and more stable.

[0021] (2) This utility model provides a fixture for multi-angle inspection of the appearance of lasers, which includes a support assembly comprising two opposing support frames and connectors. The connectors are slidably engaged with the two support frames. The direct connection between the support frames and the connectors forms a stable inverted door-shaped frame structure, improving the overall stability of the support frame and effectively preventing swaying and tipping. The connectors slide with the two support frames, allowing the distance between them to be adjusted as needed, adapting to different diameter wafer rings and improving the versatility of the support assembly.

[0022] (3) A fixture of this utility model for multi-angle inspection of the appearance of a laser is provided with a damping component. The damping component is disposed between the connecting shaft and the support frame. The damping component can increase the rotational resistance of the connecting shaft, so that the connecting shaft can achieve self-locking when it is freed from external power, and prevent the wafer ring from rotating under its own gravity. The damping component can increase the resistance during angle adjustment, so that the angle adjustment is more precise and accurate. Attached Figure Description

[0023] The accompanying drawings, which are included to provide a further understanding of the present invention and form part of this application, illustrate exemplary embodiments of the present invention and, together with the description thereof, serve to explain the present invention and do not constitute an undue limitation thereof. In the drawings:

[0024] Figure 1 This is a schematic diagram of the overall structure of the present invention. Figure 1 ;

[0025] Figure 2 This is a schematic diagram of the overall structure of the present invention. Figure 2 ;

[0026] Figure 3 This is a schematic diagram of the support frame in this utility model;

[0027] Figure 4 This is a cross-sectional view of the support frame in this utility model;

[0028] Figure 5 yes Figure 4 A magnified structural diagram of point A;

[0029] Figure 6 This is a schematic diagram of the clamping component in this utility model;

[0030] In the figure, 100 is the support assembly; 110 is the support frame; 111 is the connecting groove; 111a is the sliding hole; 111b is the damping hole; 112 is the sliding groove; 113 is the fastener; and 120 is the connector.

[0031] 200, clamping assembly; 210, clamping unit; 211, clamping element; 211a, elastic clamp; 211b, abutment block; 212, connecting shaft; 212a, marking;

[0032] 300. Damping assembly; 310. Damping block; 320. Screw connector;

[0033] 400. Angle measuring assembly; 410. Angle dial;

[0034] 500, wafer ring;

[0035] 600, core particles. Detailed Implementation

[0036] The preferred embodiments of the present invention will now be described in detail with reference to the accompanying drawings, which constitute a part of this application and are used together with the embodiments of the present invention to illustrate the principles of the present invention, but are not intended to limit the scope of the present invention.

[0037] This embodiment describes a fixture for multi-angle inspection of a laser's appearance, relating to the field of laser technology. Utilizing the clamping unit 210 on the clamping assembly 200, it can clamp wafer rings 500 of different sizes, exhibiting versatility. A damping unit is provided between the clamping unit 210 and the support frame 110, which increases the rotational resistance of the connecting shaft 212, improving the accuracy and stability of adjusting the relative angle of the wafer ring 500.

[0038] Please see Figures 1 to 6 This embodiment describes a fixture for multi-angle inspection of a laser's appearance, comprising a support component 100, a clamping component 200, and a damping component 300. The support component 100 serves as a connecting structure, providing the necessary connection and fixing foundation for the entire fixture. The clamping component 200 can clamp wafer rings 500 of different sizes and can also be rotatably connected to the support component 100 to achieve angle adjustment. The damping component 300 increases the rotational resistance of the clamping component 200 relative to the support component 100, improving the accuracy and stability of adjusting the relative angle of the wafer ring 500.

[0039] The support assembly 100 includes two opposing support frames 110 and connectors 120. The connectors 120 are slidably engaged with the two support frames 110. The direct connection between the support frames 110 and the connectors 120 forms a stable, inverted door-shaped frame structure, improving the overall stability of the support frames 110 and effectively preventing swaying and tipping. The sliding of the connectors 120 with the two support frames 110 allows the spacing between them to be adjusted as needed, adapting to different diameter wafer rings 500 and improving the versatility of the support assembly 100.

[0040] The clamping assembly 200 includes two clamping units 210 that respectively cooperate with the two support frames 110. Each clamping unit 210 includes a clamping member 211 for clamping the wafer ring 500 and a connecting shaft 212. The two clamping members 211 can respectively clamp both sides of the wafer ring 500, thus fixing the wafer ring 500. One end of the connecting shaft 212 is fixedly connected to the clamping member 211, and the other end of the connecting shaft 212 is rotatably connected to the support frame 110. The clamping member 211 can be rotatably connected to the support frame 110 via the connecting shaft 212, thereby assisting in the angle adjustment of the wafer ring 500, resulting in greater operability and higher stability.

[0041] A damping component 300 is disposed between the connecting shaft 212 and the support frame 110. The damping component 300 increases the rotational resistance of the connecting shaft 212, enabling the connecting shaft 212 to self-lock when it is freed from external power, thus preventing the wafer ring 500 from rotating under its own gravity. The damping component 300 also increases the resistance during angle adjustment, allowing for more precise and accurate angle adjustment.

[0042] In some embodiments, please refer to Figure 4 and Figure 5 The damping assembly 300 includes a damping block 310 and a swivel joint 320. The damping block 310 is embedded in the support frame 110. One end of the damping block 310 abuts against the connecting shaft 212. The swivel joint 320 abuts against the other end of the damping block 310 via the support frame 110. By adjusting the swivel joint 320, the damping block 310 can be driven to tighten or loosen against the connecting shaft 212, thereby adjusting the rotational resistance of the connecting shaft 212.

[0043] In a specific implementation, the top of the support frame 110 is provided with a connecting groove 111. The connecting groove 111 includes a sliding hole 111a and a damping hole 111b. The sliding hole 111a is formed in the connecting groove 111 and is adapted to the connecting shaft 212. The damping hole 111b is formed in the connecting groove 111 and is adapted to the damping block 310. The damping hole 111b is set perpendicular to the sliding hole 111a. The damping block 310 is slidably engaged with the damping hole 111b. The connecting shaft 212 is rotatably connected to the sliding hole 111a. The damping block 310 can act radially on the connecting shaft 212 along the damping hole 111b, which can provide a lateral positive pressure to the connecting shaft 212 and apply sufficient friction to the connecting shaft 212.

[0044] In some embodiments, please refer to Figure 1 and Figure 3 The support frame 110 has a sliding groove 112 in the middle, and a docking hole is opened in the middle of the sliding groove 112. The connector 120 is slidably inserted into the docking hole, so that the two support frames 110 can remain relatively parallel, avoiding relative misalignment between the two support frames 110, which would affect the fixation of the wafer ring 500.

[0045] In the specific implementation process, a fastener 113 for fastening the connector 120 is provided on one side of the sliding groove 112. The fastener 113 is a bolt. The bolt is threadedly connected to the sliding groove 112. The bolt can lock the connector 120 from the side to lock the connector 120 and prevent the support frame 110 after adjustment and fixing from sliding relative to the connector 120.

[0046] It should be noted that the support frame 110 is specifically T-shaped. Both the support frame 110 and the connector 120 are square profiles. A square through hole is provided in the middle of the sliding groove 112. The connector 120 can be slidably inserted into the square through hole to adjust the distance between the two support frames 110.

[0047] In some embodiments, please refer to Figure 6 The clamping member 211 includes an openable elastic clamp 211a, which can clamp wafer rings 500 of different thicknesses, adapting to different wafer rings 500 and improving the versatility of the elastic clamp 211a. The end of the connecting shaft 212 is connected to the elastic clamp 211a, thereby fixing the elastic clamp 211a to the support frame 110.

[0048] In the specific implementation process, the elastic clamp 211a includes two clamping plates that are hinged together. A bolt, a butterfly nut, and a spring are provided between the two clamping plates. The bolt passes through the two clamping plates, and the spring is sleeved on the bolt and located between the two clamping plates. By rotating the butterfly nut, the two clamping plates can be clamped or loosened, thereby realizing the clamping of wafers of different thicknesses.

[0049] In some embodiments, please refer to Figure 6 The clamping component 211 also includes an abutment block 211b, which is installed on the inner side of the clamping piece. The abutment block 211b is specifically made of flexible rubber. Its soft texture allows it to elastically deform when abutting the wafer ring 500, thus better conforming to the wafer ring 500 and ensuring stable clamping of the wafer ring 500. When clamping the wafer ring 500, the abutment block 211b will not cause scratches or damage to the relatively hard wafer ring 500, ensuring the integrity of the wafer ring 500.

[0050] It should be noted that the angle between the clamping member 211 and the horizontal plane is in the range of 0°-90°. The clamping member 211 can drive the wafer ring 500 to rotate relative to the horizontal plane in the range of 0°-90°, so that the optical observation lens can observe the core 600 located on the wafer ring 500 at any angle, ensuring the accuracy of observation and inspection.

[0051] A fixture for multi-angle inspection of a laser's appearance further includes an angle measuring component 400. The angle measuring component 400 includes an angle disk 410 fixedly connected to a support frame 110, with 360° angle graduations on the angle disk 410. A through hole is provided in the center of the angle disk 410, and a connecting shaft 212 passes through the support frame 110 and is inserted into the through hole of the angle disk 410. The rotation of the connecting shaft 212 relative to the angle disk 410 allows for the determination of the rotation angle of the connecting shaft 212.

[0052] In the specific implementation process, the end of the connecting shaft 212 is provided with a mark 212a for marking the angle disk 410. The mark 212a can be a pointer that is fixedly connected to the connecting shaft 212. The pointer can rotate with the connecting shaft 212 and the pointer indicates an angle mark 212a on the angle disk 410 in real time, thereby assisting the staff in adjusting the angle of the wafer.

[0053] Workflow: First, the die 600 is placed on the wafer ring 500, ensuring a neat array of dies. Then, two elastic clamps 211a hold both sides of the wafer ring 500, securing it in place. Finally, the support frame 110 is placed on the worktable, allowing optical instruments to inspect the die 600 located on the wafer ring 500.

[0054] The above description is only a preferred embodiment of the present utility model, but the protection scope of the present utility model is not limited thereto. Any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in the present utility model should be included within the present utility model.

Claims

1. A jig for satisfying multi-angle detection of a laser appearance, characterized by, The utility model provides a wafer ring clamping device, which comprises a support assembly, a clamping assembly and a damping assembly. The support assembly comprises two oppositely arranged support frames and connecting pieces, which are respectively slidably connected with the two support frames to adjust the distance between the two support frames. The clamping assembly comprises two clamping units matched with the two support frames, each of which comprises a clamping piece for clamping a wafer ring and a connecting shaft, one end of which is fixedly connected with the clamping piece, and the other end of which is rotatably connected with the support frame. The damping assembly is arranged between the connecting shaft and the support frame and can increase the rotational resistance of the connecting shaft.

2. The jig for satisfying the appearance of the multi-angle detection laser according to claim 1, wherein The damping assembly comprises a damping block and a threaded piece, the damping block is embedded in the support frame, one end of the damping block is in abutment with the connecting shaft, and the threaded piece is in abutment with the other end of the damping block through the support frame.

3. The jig for satisfying the appearance of the multi-angle detection laser according to claim 2, wherein The top of the support frame is provided with a connecting groove, which comprises a sliding hole matched with the connecting shaft and a damping hole matched with the damping block, the damping hole is arranged perpendicular to the sliding hole, and the damping block can act on the connecting shaft in the radial direction of the connecting shaft.

4. The jig for satisfying the appearance of the multi-angle detection laser according to claim 1, wherein, The middle part of the support frame is provided with a sliding groove, and the connecting piece is slidably inserted into the sliding groove.

5. The jig for satisfying the appearance of the multi-angle detection laser according to claim 4, wherein, One side of the sliding groove is provided with a fastener for fastening the connecting piece.

6. The jig for satisfying the appearance of a multi-angle detection laser according to claim 1, wherein The clamping piece comprises an elastic clamp that can be opened, which can clamp wafer rings of different thicknesses, and the connecting shaft is connected with the elastic clamp.

7. The jig for satisfying the appearance of the multi-angle detection laser according to claim 6, wherein, The clamping piece further comprises an abutting block mounted on the elastic clamp, which can be flexibly abutted with a wafer ring.

8. The jig for satisfying the appearance of the multi-angle detection laser according to claim 7, wherein, The included angle between the clamping piece and the horizontal plane ranges from 0° to 90°.

9. The jig for satisfying the appearance of the multi-angle detection laser according to claim 1, wherein, The utility model also comprises an angle measuring assembly, which comprises a protractor fixedly connected with the support frame, and the connecting shaft is inserted into the protractor through the support frame.

10. The jig for satisfying the appearance of a multi-angle detection laser according to claim 9, wherein, The end of the connecting shaft is provided with a mark for identifying the protractor.

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