X-ray diffraction sample table
By designing a fixing device and reference plate for the X-ray diffraction sample stage, the measurement errors caused by the softening of modeling clay and the contamination of the sample were solved, and the stable fixing and recycling of the sample were achieved.
Patent Information
- Application Number
- CN202520053205.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-10
- Publication Date
- 2026-01-06
- Estimated Expiration
- 2035-01-10
AI Technical Summary
In existing technologies, modeling clay tends to soften during long-term measurements, causing sample movement and resulting in measurement errors. Furthermore, modeling clay may contaminate the sample, affecting its recycling.
An X-ray diffraction sample stage was designed, including a fixing device, a reference plate, and a sample placement stage. The guide hole, adjustment components, and fixing components ensure that the sample is tested in the reference position, avoiding the use of clay for fixing.
It achieves stable sample fixation, avoids measurement errors and sample contamination, facilitates sample recycling, and ensures consistency of detection positions.
Smart Images
Figure CN223770112U_ABST
Abstract
Description
Technical Field
[0001] This utility model belongs to the field of materials testing technology, specifically an X-ray diffraction sample stage. Background Technology
[0002] X-ray diffraction (XRD) is a research technique that uses X-rays to diffract materials, analyzes their diffraction patterns, and obtains information such as the material's composition, the structure or morphology of its internal atoms or molecules. XRD uses monochromatic X-rays as the diffraction source, which can generally penetrate solids, thus verifying their internal structure. Therefore, XRD can provide information about the bulk structure of materials. Through XRD technology, qualitative and quantitative analysis of the mineral phases in substances can be achieved.
[0003] X-ray diffractometers operate based on the principle of Bragg diffraction. During measurement, to ensure accuracy, the surface of the sample must precisely coincide with the focal plane of the X-rays; otherwise, the diffraction peaks will shift, leading to measurement errors. To achieve this, when measuring block samples, due to variations in block size, thickness, and unevenness at the bottom, modeling clay is often used for adjustment: the sample is first adhered to the test stage with modeling clay, then gently pressed down with a glass slide until the sample surface coincides with the X-ray focal plane. However, while modeling clay conveniently achieves this alignment, during prolonged measurements, it often softens due to heat, causing sample movement. This leads to the sample surface gradually detaching from the X-ray focal plane, resulting in deviations in the sample's test height from the standard position and inaccurate test data. Furthermore, the oily nature of modeling clay can contaminate the sample when used to adhere to it, affecting its reusability. Utility Model Content
[0004] To address the problems existing in the prior art, the main objective of this utility model is to propose an X-ray diffraction sample stage.
[0005] To solve the above-mentioned technical problems, according to one aspect of the present invention, the present invention provides the following technical solution:
[0006] An X-ray diffraction sample stage includes a fixing device, a reference plate, and a sample placement stage;
[0007] The fixing device has three sides, each side having multiple guide holes. These guide holes are connected to the adjustment assembly to form multiple lifting points. The sample placement stage is positioned on these multiple lifting points. The sides also have multiple opposing fixing assemblies. The reference plate is fixed to the fixing device by rotating the fixing assemblies.
[0008] In a preferred embodiment of the X-ray diffraction sample stage described in this utility model, the upper surface of the fixing device is an XY axis scale surface.
[0009] As a preferred embodiment of the X-ray diffraction sample stage of this utility model, the sample placement stage is provided with a plurality of helical spring plates.
[0010] In a preferred embodiment of the X-ray diffraction sample stage described in this utility model, the adjustment component is an adjustment bolt.
[0011] In a preferred embodiment of the X-ray diffraction sample stage described in this utility model, the fixing component is a fixing screw.
[0012] In a preferred embodiment of the X-ray diffraction sample stage described in this utility model, the rotating fixing component is a rotating fixing nail.
[0013] The beneficial effects of this utility model are as follows:
[0014] This invention proposes an X-ray diffraction sample stage, including a fixing device, a reference plate, and a sample placement stage. The fixing device has three sides, each with multiple guide holes. These guide holes connect to adjustment components to form multiple support points. The sample placement stage is positioned on these support points. The sides also have multiple opposing fixing components. The reference plate is fixed to the fixing device via rotating fixing components. This invention can fix various irregular samples (e.g., blocky, sheet-like samples), avoiding the problems of sample contamination by clay and sample height deviation caused by clay softening due to heat, facilitating sample recycling. The addition of a reference plate ensures that the sample is tested at a reference position, facilitating the confirmation of identical detection positions for similar samples. Attached Figure Description
[0015] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.
[0016] Figure 1 This is a schematic diagram of the overall structure of an X-ray diffraction sample stage according to the present invention.
[0017] Figure 2 This is a front view of an X-ray diffraction sample stage according to this utility model.
[0018] Figure 3This is a top view of an X-ray diffraction sample stage according to the present invention.
[0019] The components include: 1. Fixing device; 2. Reference plate; 3. Sample placement stage; 4. Helical spring sheet; 5. XY axis scale surface; 6. Fixing assembly; 7. Adjustment assembly; 8. Guide hole; and 9. Rotation fixing assembly.
[0020] The realization of the purpose, functional features and advantages of this utility model will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation
[0021] The technical solutions in the embodiments will be clearly and completely described below. Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of this utility model.
[0022] This utility model provides, for example Figure 1-3 The X-ray diffraction sample stage shown includes a fixing device 1, a reference plate 2, and a sample placement stage 3.
[0023] The fixing device 1 has three sides, each with multiple guide holes 8 to facilitate the vertical movement of the sample placement stage 3. The guide holes 8 connect with the adjusting component 7 to form multiple support points, on which the sample placement stage 3 is positioned. The adjusting component 7 and the sample placement stage 3 together form a vertically movable sample placement device, allowing samples of different sizes and heights to be placed on the sample placement stage 3. The sides also have multiple opposing fixing components 6 for fixing block samples of different sizes and shapes. The reference plate 2 is fixed to the fixing device 1 via a rotating fixing component 9. The reference plate 2 has rotating fixing pins 9 that can rotate 360° to ensure the sample is tested in the reference position.
[0024] In one embodiment of this utility model, the upper surface of the fixing device 1 is an XY axis scale surface 5. This can locate the position of the sample being tested, making it easy to ensure that the testing positions of samples of the same type are the same.
[0025] In one embodiment of this utility model, the sample placement stage 3 is provided with a plurality of helical spring plates 4, which can be used to fix block samples and thin sheet samples.
[0026] In one embodiment of this utility model, the adjusting component 7 is an adjusting bolt.
[0027] In one embodiment of this utility model, the fixing component 6 is a fixing screw.
[0028] In one embodiment of this utility model, the rotating fixing component 9 is a rotating fixing nail.
[0029] When using the X-ray diffraction sample stage of this utility model, the test sample is placed on the sample placement stage 3 by positioning the detection position through the scale of the XY axis scale surface 5. The sample placement stage 3 is adjusted through the guide hole 8 (the guide hole has a scale) and the adjustment component 7. The sample is rotated 360° through the reference plate 2 using the rotation fixing component 9 to ensure that the test sample is tested in the reference position.
[0030] The above description is only a preferred embodiment of the present utility model and does not limit the patent scope of the present utility model. All equivalent structural transformations made under the inventive concept of the present utility model and using the contents of the present utility model specification, or direct / indirect applications in other related technical fields, are included within the patent protection scope of the present utility model.
Claims
1. An X-ray diffraction sample stage, characterized by, The fixed device, the reference plate and the sample placing table are included. The fixed device has three sides, the sides are provided with a plurality of guide holes, the guide holes are connected with the adjusting assembly to form a plurality of lifting points, the sample placing table is arranged on the lifting points, the sides are also provided with a plurality of oppositely arranged fixed assemblies, and the reference plate is fixed on the fixed device through the rotating fixed assembly.
2. The X-ray diffraction sample stage of claim 1, wherein, The upper surface of the fixed device is an X-Y axis scale surface.
3. The X-ray diffraction sample stage of claim 1, wherein, A plurality of helical spring pieces are arranged on the sample placing table.
4. The X-ray diffraction sample stage of claim 1, wherein, The adjusting assembly is an adjusting bolt.
5. The X-ray diffraction sample stage of claim 1, wherein, The fixed assembly is a fixed screw.
6. The X-ray diffraction sample stage of claim 1, wherein, The rotating fixed assembly is a rotating fixed nail.