Ray tolerance testing device

Abstract

The utility model discloses a ray tolerance testing device which is used for testing the maximum tolerance time of a switching tube under a fixed ray irradiation condition. The device comprises a ray protection chamber, and a high voltage generator, a ray tube, a source meter, a timer, a first switch, a liftable objective table, a probe seat and a receiver which are located in the ray protection chamber, and a monitoring terminal located outside the ray protection chamber, the output end of the high-voltage generator is electrically connected with the ray tube; the liftable objective table and the receiver are sequentially arranged along the emission direction of the ray tube; the liftable objective table is used for bearing the probe seat and the tested switch tube; a probe on the probe seat is electrically connected with the source meter and an electrode of the tested switch tube; the first switch is connected in series with a power bus; the power bus is electrically connected with the power ends of the high-voltage generator, the source meter and the timer; the control ends of the first switch and the liftable objective table and the communication ends of the receiver, the high voltage generator, the source meter and the timer are all electrically connected with the monitoring terminal.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of non-destructive testing, and particularly relates to a radiation resistance testing device. BACKGROUND

[0002] In the field of failure analysis of components, radiation detection (such as X-ray detection) is an important non-destructive analysis method. The basic principle of radiation detection is based on the penetration of radiation and the difference in absorption characteristics of different materials.

[0003] However, when the sample to be detected is a switch tube, the ionizing radiation of the radiation may induce the accumulation of electric charges inside the switch tube, and further cause the switch tube to appear electrical parameter degradation or failure. The switch tube subjected to the radiation test may mislead the judgment of engineers, cause misjudgment of the analysis result, and further waste a large amount of resources on meaningless troubleshooting. CONTENT OF THE INVENTION

[0004] In view of the above problems, the present application provides a radiation resistance testing device to test the maximum tolerance time of a switch tube under fixed radiation irradiation conditions. The specific scheme is as follows:

[0005] The present application provides a radiation resistance testing device, which comprises a radiation protection chamber, a high-voltage generator located inside the radiation protection chamber, a radiation tube, a source table, a timer, a first switch, a liftable loading platform, a probe seat and a receiver, and a monitoring terminal located outside the radiation protection chamber.

[0006] The output end of the high-voltage generator is electrically connected with the radiation tube; the high-voltage generator is used to generate high-voltage electricity to drive the radiation tube to emit radiation.

[0007] The liftable loading platform and the receiver are arranged in sequence along the emission direction of the radiation tube, wherein the receiver is located behind the liftable loading platform; the liftable loading platform is used to carry the probe seat and the switch tube to be detected; the probe on the probe seat is electrically connected with the source table and the electrode of the switch tube to be detected; and the receiver is used to receive the radiation and convert it into an electrical signal.

[0008] The first switch is connected in series on a power supply bus, and the power supply bus is electrically connected with the power supply end of the high-voltage generator, the source table and the timer.

[0009] The control end of the first switch, the control end of the liftable loading platform, the communication end of the receiver, the communication end of the high-voltage generator, the communication end of the source table and the communication end of the timer are all electrically connected with the monitoring terminal.

[0010] In a possible implementation, the liftable object table is adjusted in height by a slide rail.

[0011] In a possible implementation, the liftable object table comprises a table top, a lifting mechanism and a vertical slide rail.

[0012] The table top is fixed to the lifting mechanism and used for carrying objects.

[0013] The lifting mechanism is connected to the vertical slide rail through a guide rail connector and electrically connected to the monitoring terminal; the lifting mechanism is used for driving the guide rail connector to move along the vertical slide rail through the monitoring terminal, so as to guide the table top to lift.

[0014] In a possible implementation, a hollow structure is arranged in the middle of the liftable object table.

[0015] In a possible implementation, the timer and the surface of the source table are both provided with shielding covers.

[0016] In a possible implementation, the probe seat is fixed to the liftable object table in the form of adhesion, clamps or bolts.

[0017] In a possible implementation, a pluggable carbon rod is arranged on the liftable object table, and the pluggable carbon rod is used for sticking the measured switch tube.

[0018] In a possible implementation, the ray tube is used for emitting X rays, the ray protection chamber is an X ray protection chamber, and the receiver is used for receiving X rays and converting the X rays into electric signals.

[0019] In a possible implementation, the ray resistance testing device further comprises a second switch.

[0020] The second switch is electrically connected to the source table and the first switch, and the second switch is used for triggering the first switch to be closed when it is detected that the current flowing through the measured switch tube fed back by the source table reaches a preset current.

[0021] In a possible implementation, the second switch comprises a digital-to-analog converter and a voltage comparator.

[0022] The digital-to-analog converter is electrically connected to the source table and the voltage comparator, and is used for converting digital current output by the source table into an analog voltage and outputting the analog voltage to the voltage comparator.

[0023] An output end of the voltage comparator is electrically connected to a control end of the first switch, and is used for outputting a level to flip when an output voltage of the digital-to-analog converter is equal to or higher than a preset reference voltage, so as to trigger the first switch to be closed.

[0024] By the technical scheme, the ray resistance testing device comprises a ray protection chamber, a high-voltage generator, a ray tube, a source table, a timer, a first switch, a liftable object table, a probe seat, a receiver, a monitoring terminal and the like. An engineer configures a test voltage and a test current of a measured switch tube in the monitoring terminal, then controls the components to be opened by the monitoring terminal, applies the test voltage to a control end of the measured switch tube, adjusts the power of the high-voltage generator and the height of the liftable object table, ensures that the ray penetrates the measured switch tube and the imaging multiple meets the requirements, after the measured switch tube experiences a period of ray irradiation, the electrical parameters are degraded, when the measured switch tube is critically failed (i.e. the current flowing through the measured switch tube reaches the test current), the monitoring terminal closes the components, and records the related data, so as to obtain the maximum tolerance time of the measured switch tube under specific conditions. The whole testing process is simple in operation, high in efficiency and low in cost, and is convenient for popularization and application. BRIEF DESCRIPTION OF DRAWINGS

[0025] The above and other features, advantages and aspects of the embodiments of the present disclosure will become more apparent by thoroughly examining the following detailed description, the accompanying drawings and the appended claims. Identical or similar reference numerals denote identical or similar elements throughout the drawings. It should be understood that the drawings are schematic and elements are not necessarily drawn to scale.

[0026] Figure 1 A structure schematic diagram of a ray resistance testing device provided by the present application;

[0027] Figure 2 A structure schematic diagram of another ray resistance testing device provided by the present application;

[0028] Figure 3 A structure schematic diagram of another ray resistance testing device provided by the present application;

[0029] Figure 4 A structure schematic diagram of a second switch provided by the present application.

[0030] Reference numerals:

[0031] 1-high-voltage generator; 2-ray tube; 3-source table; 4-timer; 5-first switch; 6-liftable object table; 7-probe seat; 8-receiver; 9-monitoring terminal; 10-ray protection chamber; 11-pluggable carbon rod; 12-shielding cover; 13-second switch. DETAILED DESCRIPTION

[0032] In the following elaboration, in order to ensure the accuracy of the cited and the fluency of the reading, the key technical terms, abbreviations or acronyms involved in the text are summarized and explained as follows:

[0033] X-Ray: X-ray;

[0034] MOSFET: Metal-Oxide-Semiconductor Field-Effect Transistor, metal-oxide-semiconductor field-effect transistor, abbreviated as MOS tube;

[0035] IGBT: Insulated Gate Bipolar Transistor, insulated gate bipolar transistor;

[0036] Molding compound: plastic encapsulant such as epoxy resin;

[0037] NMOS tube: N-type channel MOS tube;

[0038] PMOS tube: P-type channel MOS tube.

[0039] In the field of component failure analysis, X-ray detection (such as X-ray detection) is an important non-destructive analysis method. It can clearly observe the internal structure details of the chip without damaging the chip packaging structure, and provide intuitive and powerful evidence for packaging failure analysis. The following will take X-ray detection as an example for specific description, but the principles and methods described are also applicable to other types of X-ray detection.

[0040] The basic principle of X-ray detection is based on the penetration of X-rays and the difference in X-ray absorption characteristics of different materials. Specifically, X-rays, as a kind of high-energy electromagnetic wave, can penetrate most materials, but different materials have different absorption of X-rays due to their density and atomic number. When X-rays pass through the measured sample, different materials in the measured sample will absorb X-rays to different degrees according to their density and atomic number, resulting in changes in the intensity of X-rays passing through the measured sample. The receiver captures the intensity distribution of X-rays after passing through the measured sample to generate an image reflecting the internal structure of the measured sample. Among them, the material with higher density or larger atomic number will absorb more X-rays, forming a darker image on the receiver; on the contrary, the material with lower density or smaller atomic number will absorb less X-rays, forming a brighter image on the receiver.

[0041] However, when the sample to be measured is a switch tube, the ionizing radiation of X-rays can induce charge accumulation inside the switch tube, and further cause the switch tube to have electrical parameter degradation or even failure. The switch tube can be a MOS tube, an IGBT or a triode. The MOS tube can be an NMOS tube or a PMOS tube. The IGBT can be an N-type IGBT or a P-type IGBT. The triode can be an NPN triode or a PNP triode. When the switch tube is a MOS tube or an IGBT, if the total dose of ionizing radiation of X-rays is too large, the turn-on voltage V TH begins to decrease (degradation), and when V TH is lower than the lower limit of the turn-on voltage range given in the specification, if the control terminal of the switch tube is still applied with a voltage in the turn-on voltage range given in the specification, the switch tube will fail. When the switch tube is a triode, if the total dose of ionizing radiation of X-rays is too large, the turn-on voltage of the switch tube begins to decrease (degradation), and at this time, if the control terminal of the switch tube is still applied with a voltage in the turn-on voltage range given in the specification, the current flowing through the switch tube will exceed the maximum allowable current of the switch tube, resulting in failure of the switch tube.

[0042] However, the switch tube subjected to X-Ray test may have electrical parameter degradation or failure, which can mislead the judgment of engineers, cause misjudgment of analysis results, and further waste a large amount of resources on meaningless troubleshooting.

[0043] In order to ensure that the switch tube is not damaged by ionizing radiation (i.e., does not fail due to ionizing radiation) during X-Ray detection, engineers need to carefully evaluate the key factors affecting the total dose of X-ray ionizing radiation to which the switch tube is subjected before X-Ray detection, such as the power P of the X-ray tube, the distance S between the X-ray tube and the switch tube to be measured, and the cumulative irradiation time T of the switch tube to be measured. The greater the total dose, the higher the risk of ionizing radiation damage to the switch tube during X-Ray detection.

[0044] In order to ensure that the switch tube does not fail due to ionizing radiation, it is usually necessary to test the maximum tolerance time T max of the switch tube at a fixed power P and distance S (i.e., the cumulative irradiation time corresponding to the critical failure of the switch tube). Once the power P and distance S change, the maximum tolerance time T max will also change. When performing X-Ray detection, as long as the time T is less than the maximum tolerance time T max , the switch tube to be measured will not fail due to ionizing radiation.

[0045] The conventional X-ray resistance test scheme is: after the X-ray switch is turned on, timing starts; the power P is adjusted to ensure that the measured switch tube is penetrated by X-rays; the distance S is adjusted to ensure that the X-ray imaging multiple meets the requirements; when the timing time reaches the preset value, the X-ray switch is turned off, and the first test ends. At this time, the engineer tests the static parameters of the measured switch tube to determine whether it has failed due to ionizing radiation. If the measured switch tube has failed in the first test, the safe irradiation time of the measured switch tube cannot be determined, and a new switch tube needs to be replaced and the test parameters (such as shortening the power P, increasing the distance S, or shortening the preset value) need to be adjusted for continuous testing. If the measured switch tube does not fail in the first test, the preset value is gradually increased under the fixed power P and distance S for multiple rounds of X-ray testing until the measured switch tube fails. The timing time recorded in the last round of testing before the measured switch tube fails must be within the maximum tolerance time T of the measured switch tube, which is the safe irradiation time of the measured switch tube and can be used as the upper limit of the time T used in subsequent batch testing of switch tubes. max

[0046] However, the conventional X-ray resistance test scheme has the following defects:

[0047] 1) It cannot monitor the change of the electrical parameters of the switch tube in real time during X-ray testing, and the maximum tolerance time T of the switch tube cannot be accurately obtained. max

[0048] 2) It causes unnecessary sample damage, increases testing costs, and reduces economic efficiency.

[0049] 3) It needs to undergo multiple tests, and the operation process is complicated and inefficient.

[0050] To solve the above problems, the embodiments of the present application provide a radiation resistance test device which is simple to operate, efficient, low in cost, and can accurately determine the maximum tolerance time T of the switch tube under the fixed power P and distance S. max

[0051] The radiation resistance test device provided by the embodiments of the present application will be described in detail below with reference to the accompanying drawings. Those skilled in the art can know that the technical solutions provided by the embodiments of the present application are also applicable to similar technical problems as technology develops and new scenarios emerge.

[0052] ​​​The terms "first", "second", and the like in the description and in the claims of the present application and above-described drawings are used to distinguish similar objects and are not necessarily used to describe a specific sequential or chronological order. It should be understood that terms so used are interchangeable under appropriate circumstances and are merely employed in the descriptions of embodiments of the present application for the purpose of differentiation among like objects. Moreover, the terms "comprising", "having", "including", and the like, are used in the detailed description and in the claims of the present application to mean "including but not limited to" such that the processes, methods, systems, articles, or apparatuses described herein cover or encompass process, methods, systems, articles, or apparatuses that consist of, in addition to, or in lieu of, the elements specified. It will be understood that such terms do not imply "consisting only of the listed items.

[0053] Referring to Figure 1 The ray resistance test device provided by the embodiments of the present application comprises a ray protection chamber 10, a high-voltage generator 1, a ray tube 2, a source table 3, a timer 4, a first switch 5, a liftable object table 6, a probe seat 7, a receiver 8, and a monitoring terminal 9.

[0054] The output end of the high-voltage generator 1 is electrically connected to the ray tube 2 (electrical connection refers to connecting electrical equipment through electrical connection components such as cables, wires, plugs, pins, and terminals to realize the transmission of electrical signals and electrical energy, and the control and adjustment of electrical equipment).

[0055] The high-voltage generator 1 is used to generate high-voltage electricity to drive the ray tube 2 to emit rays.

[0056] The liftable object table 6 and the receiver 8 are arranged in sequence along the emission direction of the ray tube 2, wherein the receiver 8 is located behind the liftable object table 6 (i.e., along the emission direction of the ray tube 2, the liftable object table 6 is first, and then the receiver 8).

[0057] The liftable object table 6 is used to carry the probe seat 7 and the measured switch tube; the probes on the probe seat 7 are electrically connected to the source table 3 and the electrodes of the measured switch tube.

[0058] The receiver 8 is used to receive rays and convert them into electrical signals.

[0059] The first switch 5 is connected in series on a power supply bus which is electrically connected to the power supply end of the high-voltage generator 1, the source table 3, and the timer 4.

[0060] The control end of the first switch 5, the control end of the liftable object table 6, the communication end of the receiver 8, the communication end of the high-voltage generator 1, the communication end of the source table 3, and the communication end of the timer 4 are all electrically connected to the monitoring terminal 9.

[0061] Still taking the X-Ray detection as an example (i.e. taking the X-ray tube 2 to emit X-rays, the X-ray protection chamber 10 as the X-ray protection chamber, and the receiver 8 to receive the X-rays and convert them into electrical signals as an example), the specific operation of the radiation resistance test based on the device shown in Figure 1 The specific operation of the radiation resistance test based on the device shown in

[0062] Step S1: Preparation phase - based on the pre-built radiation resistance test device, the engineer first places the measured switch tube on the liftable object table 6, and connects the three electrodes of the measured switch tube to the three probes on the probe seat 7 one by one.

[0063] Specifically, the measured switch tube can be a MOS tube, an IGBT or a triode, the MOS tube can be an NMOS tube or a PMOS tube, the IGBT can be an N-type IGBT or a P-type IGBT, and the triode can be an NPN triode or a PNP triode. When the measured switch tube is a MOS tube, the three electrodes of the measured switch tube are the drain, source and gate of the MOS tube, and the gate of the MOS tube is the control end of the MOS tube. When the measured switch tube is an IGBT, the three electrodes of the measured switch tube are the collector, emitter and gate of the IGBT, and the gate of the IGBT is the control end of the IGBT. When the measured switch tube is a triode, the three electrodes of the measured switch tube are the collector, emitter and base of the triode, and the base of the triode is the control end of the triode.

[0064] In one possible implementation, to ensure that the measured switch tube and the probe seat 7 do not displace or fall off during vertical movement with the liftable object table 6, it is required that the measured switch tube and the probe seat 7 are stably fixed on the liftable object table 6.

[0065] The probe seat 7 can be fixed on the liftable object table 6 by sticking, clamping, bolting or other forms. The sticking fixation means that the probe seat 7 is firmly stuck on the liftable object table 6 by using an adhesive (such as strong double-sided tape, hot melt adhesive, epoxy resin or other special adhesive). The clamping fixation means that the probe seat 7 is firmly fixed on the liftable object table 6 by the clamping force of the clamp, which can be customized according to the shape and size of the probe seat 7. The bolting fixation means that the probe seat 7 is tightly connected with the liftable object table 6 by pre-drilling holes and installing bolts.

[0066] Referring to Figure 2 Figure 2 ​Only part of the components and wiring in the radiation resistance test device is shown, and the fixing method of the measured switch tube can be: the pluggable carbon rod 11 is arranged on the liftable loading platform 6, the engineer takes the pluggable carbon rod 11 off the liftable loading platform 6, and then uses an adhesive (such as strong double-sided tape, hot melt adhesive, epoxy resin or other special adhesive) to firmly paste the measured switch tube on the pluggable carbon rod 11, and then inserts the pluggable carbon rod 11 back into the liftable loading platform 6. The advantages of this fixing method are at least the following three points:

[0067] 1) By pasting the measured switch tube on the carbon rod, the installation process can be quickly and simply completed without the need for complex fixing devices or tools.

[0068] 2) The carbon rod serves as an intermediate medium to facilitate the adjustment of the position and angle of the measured switch tube to adapt to different test requirements.

[0069] 3) The carbon rod, as a material with high thermal conductivity, can effectively conduct the heat generated by the measured switch tube during operation to prevent the measured switch tube from being damaged due to overheating.

[0070] Step S2: Parameter configuration phase - configure the test voltage and test current of the measured switch tube in the monitoring terminal 9. Specifically, if the measured switch tube is a MOS tube or an IGBT, configure the test voltage in the monitoring terminal 9 as the opening voltage V TH of the measured switch tube specified in the specification of the measured switch tube, and the test current as the current value that will flow through the measured switch tube when the control end voltage of the measured switch tube is equal to the lower limit value, and if the measured switch tube is a triode, configure the test voltage in the monitoring terminal 9 as the opening voltage of the measured switch tube specified in the specification of the measured switch tube, and the test current as the maximum allowed current of the measured switch tube.

[0071] Step S3: Test switch phase, specifically including the following steps S31-S33.

[0072] Step S31: The monitoring terminal 9 controls the first switch 5 to open, so that the high-voltage generator 1, the timer 4 and the source table 3 are turned on at the same time; then, the monitoring terminal 9 controls the source table 3 to apply the test voltage to the control end of the measured switch tube, and obtains the IV (current-voltage) characteristic curve of the measured switch tube measured by the source table 3 and the timing value of the timer 4.

[0073] Specifically, after the monitoring terminal 9 controls the first switch 5 to open, the high-voltage generator 1, the timer 4 and the source table 3 are powered on at the same time, so that the high-voltage generator 1, the timer 4 and the source table 3 are turned on at the same time.

[0074] The high-voltage generator 1 is used to generate high-voltage electricity to drive the ray tube 2 to emit X-rays. The ray tube 2 is a vacuum tube containing a cathode (electron emission source) and an anode (target material) inside. When high-voltage electricity generated by the high-voltage generator 1 is applied to the ray tube 2, the cathode in the ray tube 2 emits high-speed electrons under the action of the high-voltage electric field. These electrons are accelerated in the electric field to form a beam of high-speed electron flow. The high-speed electrons hit the target material (usually heavy metals such as tungsten) in the anode, causing the inner layer electrons of the target material to be excited or ionized. When the inner layer electrons refill the vacancies, energy is released in the form of X-rays.

[0075] The X-rays emitted by the ray tube 2 penetrate the measured switch tube and are absorbed by the receiver 8. The receiver 8 converts the absorbed X-rays into an electrical signal and sends it to the monitoring terminal 9 for imaging. The timer 4 starts counting when it is turned on, recording the time of X-ray irradiation. The source table 3 is a test equipment that integrates voltage source, current source and measurement function, which can provide stable voltage or current output and measure the current, voltage and power of the measured element at the same time.

[0076] The X-ray protection room is a professional facility designed to protect relevant personnel from X-ray radiation hazards. It can effectively shield X-rays and provide a safe operating environment for relevant personnel.

[0077] Among the many types of X-ray protection rooms, lead houses are widely used due to their excellent protection performance. As the name implies, lead houses are X-ray protection rooms made of lead, a high-density, high-atomic-number metal. Lead has strong absorption capacity for X-rays, effectively blocking X-rays from penetrating, thus ensuring that the radiation level inside the protection room is far below the safety limit. The main structure of the lead house, including the walls, roof and floor, is usually made of thick lead plates or composite materials containing lead to form an impregnable protective barrier.

[0078] Step S32: The monitoring terminal 9 adjusts the power of the high-voltage generator 1 to ensure that the measured switch tube is penetrated by X-rays, and adjusts the vertical height of the liftable loading platform 6 to ensure that the X-ray imaging magnification meets the requirements.

[0079] Specifically, the liftable loading platform 6 is a mechanical device designed to carry and move objects at different heights.

[0080] In a possible implementation, the liftable object table 6 is adjusted in height by a slide rail. The slide rail is, for example, a vertical slide rail. Specifically, the liftable object table 6 includes a table top, a lifting mechanism, and a vertical slide rail; the table top is fixed on the lifting mechanism and is used to carry an object; the lifting mechanism is mechanically connected (mechanically connected is to connect two or more components together in a physical way, mainly through threaded, bayonet, pin, connecting rod, and other mechanical connecting components) with the vertical slide rail through a guide rail connector (for example, a sliding block or a roller) and is electrically connected with the monitoring terminal 9; and the lifting mechanism is used to drive the guide rail connector to move up and down along the vertical slide rail under the control of the monitoring terminal 9, to guide the lifting of the table top.

[0081] In a possible implementation, still referring to Figure 2 The liftable object table 6 can adopt a hollow structure in the middle to optimize the transmission path of the X rays and reduce the loss of the X rays in the transmission process. Specifically, the X rays will attenuate when penetrating a substance, and therefore, through the hollow design in the middle of the liftable object table 6, more X rays can be directly irradiated onto the to-be-tested switch tube instead of being absorbed or scattered by the liftable object table 6 itself. This design not only improves the utilization efficiency of the X rays, but also makes the test result more accurate and reliable.

[0082] After the to-be-tested switch tube is irradiated by the X rays for a period of time, the electrical parameters of the to-be-tested switch tube are degraded. The degradation of different types of switch tubes is described above and will not be repeated here.

[0083] Step S33: When the monitoring terminal 9 detects that the current flowing through the to-be-tested switch tube reaches the test current according to the feedback data of the source table 3, the monitoring terminal 9 controls the first switch 5 to be closed, so as to simultaneously close the timer 4, the source table 3, and the high-voltage generator 1, and record the power P of the ray tube, the distance S between the ray tube and the to-be-tested switch tube, and the cumulative irradiation time T of the to-be-tested switch tube at this time. Then, the current time T is the maximum endurance time T of the to-be-tested switch tube under the current power P and distance S. max .

[0084] In summary, the ray resistance test device provided by the embodiment of the application comprises a ray protection chamber 10, a high-voltage generator 1, a ray tube 2, a source table 3, a timer 4, a first switch 5, a liftable object table 6, a probe seat 7, a receiver 8, a monitoring terminal 9, and the like. An engineer configures a test voltage and a test current of a switch tube to be tested in the monitoring terminal 9, then controls the components to be started by the monitoring terminal 9, applies the test voltage to a control end of the switch tube to be tested, adjusts the power of the high-voltage generator 1 and the height of the liftable object table 6, ensures that the ray penetrates the switch tube to be tested and the imaging magnification meets the requirements, and after the switch tube to be tested is irradiated by the ray for a period of time, the electrical parameters are degraded, when the switch tube to be tested is critically failed (that is, the current flowing through the switch tube to be tested reaches the test current), the monitoring terminal 9 closes the components, and relevant data are recorded, so that the maximum tolerance time of the switch tube to be tested under specific conditions is obtained. The whole test process is simple in operation, high in efficiency, low in cost, and convenient for popularization and application.

[0085] In a possible implementation, the high-voltage generator 1 and the ray tube 2 are located in the middle area below the ray protection chamber 10; the timer 4 and the source table 3 are located in the right area below the ray protection chamber 10.

[0086] The timer 4 and the source table 3 are key components in the ray resistance test device, and the accuracy and stability thereof are crucial to the reliability of the test results. In order to effectively protect the two precision instruments from potential interference of the ray radiation, in a possible implementation, still referring to Figure 2 , a shielding cover 12 can be additionally arranged on the surface of the timer 4 and the source table 3.

[0087] Specifically, the shielding cover 12 is made of a material with high density and high absorption rate, such as lead or an alloy containing heavy metals. These materials can effectively absorb and block the ray, significantly reduce the direct influence of the radiation on the internal electronic elements of the timer 4 and the source table 3, ensure that the timing accuracy of the timer 4 is not disturbed, and the current and voltage measurement data of the source table 3 are accurate. In a possible implementation, the shielding cover 12 adopts a design easy to disassemble, which is convenient for daily maintenance and troubleshooting.

[0088] In a possible implementation, referring to Figure 3 , any one of the ray resistance test devices provided above further comprises a second switch 13, which is electrically connected with the source table 3 and the first switch 5, and is used for triggering the first switch 5 to be closed when it is detected that the current flowing through the switch tube to be tested reaches the test current.

[0089] In a possible implementation, referring to Figure 4 , the second switch 13 can comprise a digital-to-analog converter and a voltage comparator.

[0090] The digital-to-analog converter is electrically connected with the source table 3 and the voltage comparator, and is used to convert the digital current output by the source table 3 into an analog voltage;

[0091] The output end of the voltage comparator is electrically connected with the control end of the first switch 5, and is used to output a level inversion to trigger the first switch 5 to be closed when the output voltage of the digital-to-analog converter is equal to or higher than a preset reference voltage Vref. The reference voltage Vref corresponds to the test current, and when the digital current output by the source table 3 reaches or exceeds the test current, the output voltage of the digital-to-analog converter is equal to or higher than the reference voltage Vref.

[0092] Specifically, the control process of the monitoring terminal 9 controlling the first switch 5 to be closed when the current flowing through the measured switch tube reaches the test current according to the feedback data of the source table 3 belongs to pure software control. The second switch 13 uses pure hardware circuit to control the first switch 5 to be closed when the current flowing through the measured switch tube reaches the test current. The response speed of the pure hardware circuit control is faster than that of the pure software control, because the hardware circuit itself has a faster signal processing capability, and does not need to go through a complex algorithm or data processing process. Therefore, the embodiment introduces the second switch 13, which is a pure hardware circuit, to replace the pure software control, which is more suitable for application scenarios that require high-speed response. This design not only improves the response speed of the ray resistance testing device, but also enhances the stability and reliability of the ray resistance testing device, ensuring that the measured switch tube can be quickly stopped from emitting rays when the current of the measured switch tube reaches the test current, thereby protecting the measured switch tube from failure.

[0093] In a possible implementation, the monitoring terminal 9 in any of the above embodiments can be a traditional computer, a special control console, a smart phone or a tablet computer, and is not limited.

[0094] The traditional computer is, for example, a desktop computer and a notebook computer. The desktop computer and the notebook computer, as classic monitoring terminals, are suitable for application scenarios that require complex calculations and detailed data analysis, due to their powerful computing capabilities and large screen displays.

[0095] The special control console, such as an industrial control computer, is designed for a specific industry and has higher stability and durability.

[0096] The smart phone and the tablet computer, with portability and touch interfaces, have become the first choice for users in daily operations and controls. With the help of special application programs, the smart phone and the tablet computer can realize remote monitoring and control of various smart devices and systems.

[0097] The above description of disclosed embodiments enables one of ordinary skill in the art to make or use the application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein can be applied to other embodiments without departing from the spirit or scope of the application. Thus, the present application is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A radiation resistance test apparatus characterized by comprising: The application relates to a ray resistance test device. The device comprises a ray resistance chamber (10), a high-voltage generator (1) arranged inside the ray resistance chamber (10), a ray tube (2), a source table (3), a timer (4), a first switch (5), a liftable loading table (6), a probe base (7) and a receiver (8), and a monitoring terminal (9) arranged outside the ray resistance chamber (10). An output end of the high-voltage generator (1) is electrically connected with the ray tube (2); the high-voltage generator (1) is used for generating high-voltage electricity to drive the ray tube (2) to emit rays. The liftable loading table (6) and the receiver (8) are arranged in sequence along the emitting direction of the ray tube (2), wherein the receiver (8) is located behind the liftable loading table (6); the liftable loading table (6) is used for carrying the probe base (7) and a measured switch tube; probes on the probe base (7) are electrically connected with the source table (3) and electrodes of the measured switch tube; and the receiver (8) is used for receiving rays and converting the rays into electric signals. The first switch (5) is connected in series on a power supply bus which is electrically connected with power supply ends of the high-voltage generator (1), the source table (3) and the timer (4). Control ends of the first switch (5), the liftable loading table (6), a communication end of the receiver (8), a communication end of the high-voltage generator (1), a communication end of the source table (3) and a communication end of the timer (4) are all electrically connected with the monitoring terminal (9).

2. The radiation tolerance testing device of claim 1, wherein, The liftable loading table (6) is adjusted in height through a slide rail.

3. The radiation tolerance testing device of claim 2, wherein, The liftable loading table (6) comprises a table top, a lifting mechanism and a vertical slide rail. The table top is fixed on the lifting mechanism and used for carrying articles. The lifting mechanism is connected with the vertical slide rail through a guide rail connector and electrically connected with the monitoring terminal (9); the lifting mechanism is used for driving the guide rail connector to move along the vertical slide rail through the monitoring terminal (9) to guide the table top to lift.

4. The radiation tolerance testing device of claim 1, wherein, A hollow structure is arranged in the middle of the liftable loading table (6).

5. The radiation tolerance testing device of claim 1, wherein, Shielding covers (12) are arranged on surfaces of the timer (4) and the source table (3).

6. The radiation tolerance testing device of claim 1, wherein, The probe base (7) is fixed on the liftable loading table (6) in the form of adhesion, clamps or bolts.

7. The radiation tolerance testing device of claim 1, wherein, A pluggable carbon rod (11) is arranged on the liftable loading table (6) and used for sticking the measured switch tube.

8. The radiation tolerance testing device of claim 1, wherein, The ray tube (2) is used for emitting X rays; the ray resistance chamber (10) is an X ray resistance chamber; and the receiver (8) is used for receiving X rays and converting the X rays into electric signals.

9. The radiation tolerance testing device according to any one of claims 1 to 8, characterized in that The ray resistance test device further comprises a second switch (13). The second switch (13) is electrically connected with the source table (3) and the first switch (5); and the second switch (13) is used for triggering the first switch (5) to be closed when it is detected that the source table (3) feeds back a preset current flowing through the measured switch tube.

10. The radiation tolerance testing device of claim 9, wherein, The second switch (13) comprises a digital-to-analog converter and a voltage comparator. The digital-to-analog converter is electrically connected with the source table (3) and the voltage comparator, and is used for converting the digital current output by the source table (3) into an analog voltage and outputting to the voltage comparator; The output end of the voltage comparator is electrically connected with the control end of the first switch (5), and is used for outputting level inversion when the output voltage of the digital-to-analog converter is equal to or higher than a preset reference voltage, so as to trigger the first switch (5) to be closed.

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