Measuring head product circuit board test board

Abstract

A test board for a circuit board of a probe product comprises a test circuit board (1), and a product qualification lamp (2), an alarm indicator lamp (3), a fault reminding lamp (4) and a multi-stage voltage test module (5) which are electrically connected with the test circuit board (1), wherein the multi-stage voltage test module (5) comprises a plurality of detection circuits which are connected in parallel and have different voltage values. And the infrared detection module (6) is electrically connected with the test circuit board (1). And the multi-stage voltage test module (5) comprises a 7V detection circuit, a 3V detection circuit and a 3.3 V detection circuit. The beneficial effects of the utility model lie in that: 1, the efficiency of detecting the circuit board is improved; 2, a problem point of the circuit board can be quickly positioned; and 3, compared with a simple test frame, the operation is simpler, and only a fault lamp needs to be seen.

Description

Technical Field

[0001] This utility model relates to the field of testing technology, specifically to a test board for a probe product circuit board. Background Technology

[0002] Most current testing instruments use simplified methods for testing circuit boards. Furthermore, these simplified test fixtures are prone to overlooking problems on the circuit boards because they are operated manually, which increases the risk of misoperation or omitting issues. Additionally, each problem requires manual inspection, resulting in low testing efficiency.

[0003] Therefore, there is an urgent need to develop a circuit board test board with high detection efficiency for probe products. Utility Model Content

[0004] This utility model aims to solve at least one of the above-mentioned technical problems to a certain extent.

[0005] Therefore, the purpose of this utility model is to propose a test board for a probe product circuit board, which has high testing efficiency.

[0006] To achieve the above objectives, this utility model discloses a test board for a probe product circuit board, including: a test circuit board 1, and a product qualification light 2, an alarm indicator light 3, a fault reminder light 4, and a multi-level voltage test module 5 electrically connected to the test circuit board 1; wherein, the multi-level voltage test module 5 includes multiple parallel detection circuits with different voltage values.

[0007] In addition, the test board of the probe product circuit board according to the above-mentioned technical solution of this utility model may also have the following additional technical features:

[0008] Optionally, it also includes an infrared detection module 6 electrically connected to the test circuit board 1.

[0009] Optionally, the multi-level voltage testing module 5 includes a 7V detection circuit, a 3V detection circuit, and a 3.3V detection circuit.

[0010] Optionally, the test circuit board 1 uses an STM32F103C8T6 chip as the central controller.

[0011] Optionally, the central controller includes several groups of LED R, LED G, and LED B pins. Each LED R, LED G, and LED B in each group is connected to the base (B) of an npn transistor, the emitter (E) of the npn transistor is grounded, and the collector (C) of the npn transistor is connected to the LED module.

[0012] Optionally, the multi-level voltage test module (5) is isolated via a pin header and female header connector.

[0013] Optionally, the pin header and female header connector is model PZ254V-11-02P.

[0014] The advantages of this invention are: 1. Improved efficiency in testing circuit boards; 2. Quickly located problem points on the circuit board; 3. Compared with simple test fixtures, the operation is relatively simple, requiring only observation of fault lights. Attached Figure Description

[0015] Figure 1 This is a schematic diagram of the structure of a test board for a probe product circuit board provided in one embodiment of this utility model;

[0016] Figure 2 This is a schematic diagram of the structure of a test board for a probe product circuit board provided in another embodiment of this utility model;

[0017] Figure 3 This is a circuit diagram provided in one embodiment of the present invention.

[0018] Figure label:

[0019] 1-Test circuit board, 2-Product qualification light, 3-Alarm indicator light, 4-Fault reminder light, 5-Multi-level voltage test module, 6-Infrared detection module. Detailed Implementation

[0020] The embodiments of this utility model are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or components / elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain this utility model, and should not be construed as limiting this utility model.

[0021] The following describes the test board circuit board of the probe product according to an embodiment of the present invention with reference to the accompanying drawings.

[0022] Figure 1 This is a schematic diagram of the structure of a test board for a probe product circuit board provided in one embodiment of this utility model; Figure 2 This is a schematic diagram of the structure of a test board for a probe product circuit board provided in another embodiment of this utility model; Figure 3 This is a circuit diagram provided in one embodiment of the present invention. Figure 1-3 As shown, the test board of the probe product circuit board includes a test circuit board 1, a product qualification light 2, an alarm indicator light 3, a fault reminder light 4, and a multi-level voltage test module 5, which are electrically connected to the test circuit board 1; wherein, the multi-level voltage test module 5 contains multiple parallel detection circuits with different voltage values.

[0023] According to one embodiment of the present invention, the multi-level voltage testing module 5 includes a 7V detection circuit, a 3V detection circuit, and a 3.3V detection circuit.

[0024] Specifically, Figure 1 This is a structural diagram of the basic structure of this application. Figure 2-3 This is a structural diagram and circuit diagram of the multi-level voltage test module 5, which includes three detection circuits: 7V, 3V, and 3.3V. The test circuit board integrates several circuits (7V detection circuit, 3V detection circuit, and 3.3V detection circuit) and several indicator light circuits. The test points of the circuit board are connected to the test circuit board under test via a test fixture. Then, the power of the test fixture is turned on, and the test circuit board under test sequentially performs tests on the 7V detection circuit, 3V detection circuit, and 3.3V detection circuit.

[0025] Once all tests are completed and the functions are normal, product qualification light 2 will turn green, while alarm indicator light 3 and fault reminder light 4 will remain off.

[0026] During the sequential testing, a problem was found in the 7V testing circuit after the test was completed. Alarm indicator light 3 turned red, and fault reminder light 4 turned red.

[0027] During the sequential testing, a problem was found in the 3V testing circuit after the test was completed. Alarm indicator light 3 turned red and fault indicator light 4 turned green.

[0028] During the sequential testing, a problem was found in the 3.3V testing circuit after the test was completed. Alarm indicator light 3 turned red and fault indicator light 4 turned blue.

[0029] According to the circuit board test board of the probe product of this utility model, multiple tests can be performed on one test board, which improves the efficiency of circuit board testing; it can quickly locate the problem point of the circuit board; compared with the simple test fixture, the operation is relatively simple, only requiring the inspection of the fault light.

[0030] According to one embodiment of the present invention, an infrared detection module 6 electrically connected to the test circuit board 1 is also included.

[0031] Specifically, after the multiple detection circuits in the multi-level voltage test module 5 have been tested sequentially, infrared detection by the infrared detection module 6 is performed. Similarly, if all tests are completed without problems, the product qualification light 2 will light up green, while the alarm indicator light 3 and the fault reminder light 4 will remain off. Finally, if a problem is found with the infrared detection circuit after the last test, the alarm indicator light will light up red, and the fault reminder light will light up yellow.

[0032] According to one embodiment of the present invention, the test circuit board 1 uses an STM32F103C8T6 chip as the central controller.

[0033] Specifically, the STM32F103C8T6 processor is inexpensive, has powerful processing capabilities and computing performance, rich interfaces, low power consumption, high stability, and is easy to connect to and handle the test scenarios that require access to test various voltage levels as described in this application.

[0034] According to one embodiment of the present invention, the central controller includes several groups of LED R, LED G, and LED B pins. Each LED R, LED G, and LED B in each group is connected to the base (B) of an npn transistor, the emitter (E) of the npn transistor is grounded, and the collector (C) of the npn transistor is connected to a light-emitting diode module.

[0035] Specifically, transistors are used as control circuits to control different LEDs to turn on or off, which is inexpensive and highly stable.

[0036] According to one embodiment of the present invention, the multi-level voltage test module 5 is isolated by a pin header and female header connector.

[0037] According to one embodiment of the present invention, the pin header and female header connector is model PZ254V-11-02P.

[0038] Specifically, the PZ254V-11-02P can be used for connections between circuit boards, especially between circuits that are blocked or isolated within a device, to handle the transmission of current or signals. It is suitable for use in test circuits that isolate different voltage levels in this application.

[0039] The above embodiments are preferred implementations of this application. In addition, this application can be implemented in other ways. Any obvious substitutions without departing from the concept of this application are within the protection scope of this application.

Claims

1. A test board for a probe product circuit board, characterized in that, include: Test circuit board (1), and product qualification light (2), alarm indicator light (3), fault reminder light (4) electrically connected to the test circuit board (1), and multi-level voltage test module (5); The multi-level voltage test module (5) contains multiple parallel detection circuits with different voltage values.

2. The test board for a probe product circuit board according to claim 1, characterized in that: It also includes an infrared detection module (6) electrically connected to the test circuit board (1).

3. The test board for a probe product circuit board according to claim 1, characterized in that: The multi-level voltage test module (5) includes a 7V detection circuit, a 3V detection circuit, and a 3.3V detection circuit.

4. The test board for a probe product circuit board according to claim 1, characterized in that: The test circuit board (1) uses a chip with the model number STM32F103C8T6 as the central controller.

5. A test board for a probe product circuit board according to claim 4, characterized in that: The central controller includes several groups of LED R, LED G, and LED B pins. Each LED R, LED G, and LED B in each group is connected to the base (B) of an npn transistor, the emitter (E) of the npn transistor is grounded, and the collector (C) of the npn transistor is connected to the LED module.

6. The test board for a probe product circuit board according to claim 1, characterized in that: The multi-level voltage test module (5) is isolated by a pin header and female header connector.

7. A test board for a probe product circuit board according to claim 6, characterized in that: The pin header and female header connector model is PZ254V-11-02P.

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