High-speed semiconductor ceramic device nondestructive scanning detection equipment convenient to move and install

The design of the support and connection mechanisms solves the problem of inconvenient disassembly and transportation of traditional equipment, enabling convenient movement and stable connection of the equipment, which is suitable for non-destructive scanning and inspection of semiconductor ceramic devices.

CN223796642UActive Publication Date: 2026-01-13HANGZHOU XINJIYUAN SEMICONDUCTOR EQUIPMENT CO LTD
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Patent Information

Application Number
CN202423309923.3
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-12-31
Publication Date
2026-01-13
Estimated Expiration
2034-12-31

AI Technical Summary

Technical Problem

Traditional high-speed non-destructive scanning and inspection equipment for semiconductor ceramic devices is mostly fixedly welded to a frame, which makes disassembly and transportation of the equipment inconvenient.

Method used

The design incorporates a support and connection mechanism, including a frame, connecting frame, support plate, casters, and cylinders. The combination of casters and cylinders enables convenient movement and stable connection of the equipment.

Benefits of technology

It enables convenient movement and stable connection of equipment, facilitating sampling and testing at different locations and high-speed testing on automated lines.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to the technical field of semiconductors, and discloses a high-speed semiconductor ceramic device nondestructive scanning detection device convenient to move and install, which comprises a detection device body, a supporting mechanism is arranged at the bottom of the detection device body, a connecting mechanism is arranged at one end of the supporting mechanism, and the supporting mechanism comprises a rack. A connecting frame is fixedly connected to the inner side of the rack, a supporting seat is connected to one end of the connecting frame through a screw, a supporting plate is connected to one end of the supporting seat through a screw, universal wheels are installed at the bottom of the rack, and an air cylinder is installed at the bottom of the rack. According to the high-speed semiconductor ceramic device lossless scanning detection equipment convenient to move and install, the stability and operation precision of the equipment on different terrains are ensured through stable connection of the rack, the connecting frame and the supporting plate and the height adjusting function of the air cylinder and the supporting legs, the equipment can be easily moved through the universal wheels distributed in a rectangular array, and the detection efficiency is improved. And conversion among different working areas is facilitated.
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Description

TECHNICAL FIELD

[0001] The utility model relates to the technical field of semiconductor, concretely to a high -speed semiconductor ceramic device nondestructive scanning detection equipment convenient to remove installation. BACKGROUND

[0002] In the semiconductor manufacturing industry, ceramic devices are widely used in various electronic devices due to their excellent performance, such as high hardness, high wear resistance, high corrosion resistance and good insulation performance. However, with the continuous development of semiconductor technology, the complexity and integration of ceramic devices are also continuously improved, which puts higher requirements on the quality detection of ceramic devices.

[0003] The conventional high-speed semiconductor ceramic device nondestructive scanning detection equipment is mostly fixedly welded on the rack, and the rack does not have a corresponding moving mechanism, so that the equipment is inconvenient to disassemble and carry. UTILITY MODEL CONTENTS

[0004] The utility model discloses a high -speed semiconductor ceramic device nondestructive scanning detection equipment convenient to remove installation to solve the conventional high -speed semiconductor ceramic device nondestructive scanning detection equipment mostly fixedly welded in the above -mentioned background art between the rack, and the rack does not have a corresponding moving mechanism, so that the equipment is inconvenient to disassemble and carry.

[0005] In order to solve the above technical problem, the utility model provides the following technical scheme: a high -speed semiconductor ceramic device nondestructive scanning detection equipment convenient to remove installation, including detection equipment body, the bottom of detection equipment body is provided with support mechanism, one end of support mechanism is provided with connecting mechanism;

[0006] The support mechanism includes a rack, a connecting frame is fixedly connected to the inner side of the rack, a support seat is screw connected to one end of the connecting frame, a support plate is screw connected to one end of the support seat, universal wheels are installed at the bottom of the rack, a gas cylinder is installed at the bottom of the rack, and a supporting leg is fixedly connected to the bottom of the gas cylinder.

[0007] The connecting mechanism includes a connecting plate, a plurality of threaded holes are formed in the outer part of the connecting plate, a limiting block is fixedly connected to one end of the connecting plate, and a placing frame is arranged at one end of the limiting block.

[0008] Preferably, the connecting frame is arranged in a cross shape, and a circular hole is formed in the middle of the support plate.

[0009] Through the above technical scheme, the circular hole is formed in the middle of the support plate, which facilitates the ventilation and heat dissipation of the equipment.

[0010] Preferably, the support seat is provided with two, and the two support seats are arranged in a symmetrical manner.

[0011] Preferably, the plurality of universal wheels are arranged in a rectangular array.

[0012] Preferably, the plurality of air cylinders are arranged in a rectangular array.

[0013] By the above technical solution, the plurality of air cylinders are arranged in a rectangular array to adjust the height of the device and ensure stability on different ground surfaces.

[0014] Preferably, one end of the connecting plate is fixedly connected to one end of the detection device body, and the other end of the connecting plate is screw-connected to the top of the rack.

[0015] Preferably, the two limiting blocks are symmetrically arranged.

[0016] Compared with the prior art, the utility model has the beneficial effects that:

[0017] Firstly, the utility model provides a stable support platform by taking the rack as the basis of the support mechanism, and the connecting frame is arranged in a cross shape to connect the rack and the support plate, ensuring the stability of the structure. The other end of the support plate is connected to the rack to improve the rigidity of the rack, thereby better supporting the detection device body. When the detection device body needs to be moved, the foot is retracted by the air cylinder, so that the universal wheel contacts the ground, thereby pushing the rack to carry the detection device body, facilitating the movement of the device. The universal wheels are arranged in a rectangular array, so that the device can be easily moved. After reaching the destination, the foot is lowered by the air cylinder to contact the ground, and the universal wheel is raised to leave the ground, thereby supporting the rack by the foot to facilitate the positioning of the rack, thereby achieving the effect of separately realizing the sampling detection of the product and also moving to the automatic line for high-speed detection.

[0018] Secondly, the utility model is provided with threaded holes on the outside of the connecting plate. The connecting plate can be installed on the rack by bolts and the like, and the detection device body is fixedly connected to the connecting plate, thereby facilitating the connection and disconnection of the detection device body and the rack. The limiting blocks arranged on the top of the connecting plate can position the placement frame when the placement frame is placed on the connecting plate, thereby facilitating the positioning of the semiconductor ceramic device to be detected, thereby achieving the stable connection between the detection device body and the rack and improving the overall stability of the device. BRIEF DESCRIPTION OF DRAWINGS

[0019] Figure 1 It is a front perspective view of the utility model;

[0020] Figure 2 It is a back perspective view of the utility model.

[0021] 1, detection device body; 2, supporting mechanism; 3, connecting mechanism; 21, rack; 22, connecting frame; 23, support plate; 24, universal wheel; 25, air cylinder; 26, support leg; 27, support seat; 31, connecting plate; 32, threaded hole; 33, limiting block; 34, placing frame. DETAILED DESCRIPTION

[0022] The technical solutions in the embodiments of the utility model will be clearly and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, rather than all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by those skilled in the art without creative labor fall within the protection scope of the utility model.

[0023] The utility model provides the following technical scheme:

[0024] Embodiment one

[0025] Please refer to Figure 1 、 Figure 2 A high-speed semiconductor ceramic device nondestructive scanning detection equipment convenient to move and install, including detection device body 1, the bottom of detection device body 1 is provided with supporting mechanism 2, one end of supporting mechanism 2 is provided with connecting mechanism 3;

[0026] Supporting mechanism 2 includes rack 21, the inner side of rack 21 is fixedly connected with connecting frame 22, one end of connecting frame 22 is screw-connected with support seat 27, one end of support seat 27 is screw-connected with support plate 23, the bottom of rack 21 is installed with universal wheel 24, the bottom of rack 21 is installed with air cylinder 25, the bottom of air cylinder 25 is fixedly connected with support leg 26.

[0027] Connecting frame 22 is arranged as cross, and the middle part of support plate 23 is provided with a circular hole.

[0028] Support seat 27 is provided with two, and the two support seats 27 are symmetrically distributed.

[0029] Universal wheel 24 is provided with multiple, and the multiple universal wheels 24 are arranged in rectangular array.

[0030] Air cylinder 25 is provided with multiple, and the multiple air cylinders 25 are arranged in rectangular array

[0031] Through the technical scheme, the stable support platform is provided by taking the rack 21 as the basis of the support mechanism 2, and the cross-shaped connecting frame 22 is arranged to connect the rack 21 and the support plate 23, so that the stability of the structure is ensured, and the other end of the support plate 23 is connected with the rack 21, so that the rigidity of the rack 21 is improved, so that the detection equipment body 1 can be better supported. When the detection equipment body 1 needs to be moved, the supporting leg 26 is retracted by the air cylinder 25, so that the universal wheel 24 is in contact with the ground, so that the rack 21 can be pushed, and then the detection equipment body 1 is carried and pushed, so that the movement of the equipment is facilitated. The universal wheel 24 is arranged in a rectangular array, so that the equipment can be easily moved to the place. After reaching the place, the supporting leg 26 is lowered by the air cylinder 25, so that the supporting leg 26 is in contact with the ground, the universal wheel 24 is lifted and separated from the ground, and then the supporting leg 26 supports the rack 21, so that the positioning of the rack 21 is facilitated, so that the effect of realizing the sampling detection of the product alone and moving to the automatic line for high-speed detection can be achieved.

[0032] Embodiment two

[0033] Please refer to Figure 1 、 Figure 2 , and on the basis of embodiment one, further obtained: the connecting mechanism 3 comprises a connecting plate 31, a plurality of threaded holes 32 are formed in the outer portion of the connecting plate 31, one end of the connecting plate 31 is fixedly connected with a limiting block 33, and one end of the limiting block 33 is provided with a placing frame 34.

[0034] One end of the connecting plate 31 is fixedly connected with one end of the detection equipment body 1, and the other end of the connecting plate 31 is screw-connected with the top of the rack 21.

[0035] The limiting block 33 is provided with two, and the two limiting blocks 33 are symmetrically distributed

[0036] Through the threaded holes 32 formed in the outer portion of the connecting plate 31, the connecting plate 31 can be installed on the rack 21 by bolts and the like, and then the detection equipment body 1 is fixedly connected with the connecting plate 31, so that the detection equipment body 1 and the rack 21 can be connected and detached, and then the limiting block 33 arranged on the top of the connecting plate 31 can position the placing frame 34 when the placing frame 34 is placed on the connecting plate 31, so that the semiconductor ceramic device to be detected can be positioned, so that the stable connection between the detection equipment body 1 and the rack 21 is achieved, and the overall stability of the equipment is improved.

[0037] In use, by the rack 21 as the base of the supporting mechanism 2, a stable supporting platform is provided, and then by the connecting frame 22 being arranged in a cross shape, the rack 21 and the supporting plate 23 are connected, the stability of the structure is ensured, and by the other end of the supporting plate 23 being connected with the rack 21, the rigidity of the rack 21 is improved, so that the detection equipment body 1 can be better supported, then when the detection equipment body 1 needs to be moved, the supporting leg 26 is retracted by the air cylinder 25, so that the universal wheel 24 is in contact with the ground, so that the rack 21 can be pushed, and then the detection equipment body 1 is carried, the movement of the equipment is facilitated, the universal wheel 24 is arranged in a rectangular array distribution, so that the equipment can be easily moved to the place, then after the place is reached, the supporting leg 26 is lowered by the air cylinder 25, so that the supporting leg 26 is in contact with the ground, the universal wheel 24 is lifted and separated from the ground, and then the rack 21 is supported by the supporting leg 26, the positioning of the rack 21 is facilitated, so that the effect that the sampling detection of the product can be realized alone, and the equipment can also be moved to the automatic line for high-speed detection can be achieved.

[0038] Although the embodiments of the utility model have been shown and described, it can be understood by those skilled in the art that various changes, modifications, replacements and variations can be made to these embodiments without departing from the principles and spirits, and the scope of the present utility model is defined by the appended claims and their equivalents.

Claims

1. A non-destructive scanning inspection apparatus for high speed semiconductor ceramic devices for easy mobile installation comprising an apparatus body (1), characterized in that: The bottom of the detection equipment body (1) is provided with a supporting mechanism (2), one end of the supporting mechanism (2) is provided with a connecting mechanism (3); The supporting mechanism (2) comprises a rack (21), the inner side of the rack (21) is fixedly connected with a connecting rack (22), one end of the connecting rack (22) is screw-connected with a supporting seat (27), one end of the supporting seat (27) is screw-connected with a supporting plate (23), the bottom of the rack (21) is installed with a universal wheel (24), the bottom of the rack (21) is installed with a gas cylinder (25), the bottom of the gas cylinder (25) is fixedly connected with a supporting leg (26); The connecting mechanism (3) comprises a connecting plate (31), a plurality of threaded holes (32) are formed in the outer side of the connecting plate (31), one end of the connecting plate (31) is fixedly connected with a limiting block (33), one end of the limiting block (33) is provided with a placing frame (34).

2. The non-destructive scanning inspection apparatus for high-speed semiconductor ceramic devices with easy-to-move installation according to claim 1, characterized in that: The connecting rack (22) is in cross shape, and a circular hole is formed in the middle of the supporting plate (23).

3. The non-destructive scanning inspection apparatus for high speed semiconductor ceramic devices with easy-to-move installation according to claim 1, characterized in that: The supporting seat (27) is provided with two, and the two supporting seats (27) are symmetrically distributed.

4. The non-destructive scanning inspection apparatus for high speed semiconductor ceramic devices with easy-to-move installation according to claim 1, characterized in that: The universal wheel (24) is provided with a plurality of, and the plurality of universal wheels (24) are arranged in a rectangular array.

5. The non-destructive scanning and inspection apparatus for high speed semiconductor ceramic devices with easy-to-move installation according to claim 1, characterized in that: The gas cylinder (25) is provided with a plurality of, and the plurality of gas cylinders (25) are arranged in a rectangular array.

6. The non-destructive scanning and inspection apparatus for high speed semiconductor ceramic devices with ease of installation for movement according to claim 1, wherein: One end of the connecting plate (31) is fixedly connected with one end of the detection equipment body (1), and the other end of the connecting plate (31) is screw-connected with the top of the rack (21).

7. The non-destructive scanning and inspection apparatus for high speed semiconductor ceramic devices with ease of installation for movement according to claim 1, wherein: The limiting block (33) is provided with two, and the two limiting blocks (33) are symmetrically distributed.