Switch device fault diagnosis circuit, switch equipment and automobile
By using a fault diagnosis circuit for switching devices that includes resistors, components, and inductors, a fault in the negative relay is determined by using a single sampling point output signal. This solves the problem of low reliability in existing technologies and achieves highly reliable fault detection.
Patent Information
- Application Number
- CN202520278072.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-20
- Publication Date
- 2026-01-13
- Estimated Expiration
- 2035-02-20
AI Technical Summary
In existing technologies, fault diagnosis schemes for negative relays require the setting of two sampling points. A fault at either sampling point will affect the diagnosis results, resulting in low reliability.
A fault diagnosis circuit for switching devices is adopted, including a first resistor, a second resistor, a third resistor, a high-resistance element, and a clamping element. The fault of the switching device is determined by the output signal of a sampling point. The high-resistance element and the clamping element are used to prevent overvoltage damage, the inductor suppresses arcing, and the switching switch controls the diagnosis of two switching devices.
This improves the reliability of fault diagnosis, reduces the probability of sampling circuit failure, and achieves highly reliable fault detection.
Smart Images
Figure CN223796656U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of electronic circuits, in particular to a switching device fault diagnosis circuit, a switching device and a vehicle. BACKGROUND
[0002] The negative electrode relay in the power battery is an important component of the power battery system internal charge and discharge control execution element. The negative electrode relay is controlled by the vehicle control unit (VCU) and is used to control the on-off of the power battery negative electrode loop. When the power battery system needs to be powered or charged, the VCU controls the negative electrode relay to close, so that the negative electrode loop is connected. When the power supply needs to be disconnected, the VCU controls the negative electrode relay to open, to ensure the safety of the power battery system. The negative electrode relay also plays a protective role in the power battery system. When the power battery system appears abnormal conditions such as overcurrent and short circuit, the negative electrode relay can quickly cut off the loop to prevent the battery from being damaged or causing a safety accident.
[0003] In order to ensure that the negative electrode relay can act safely and reliably, it is necessary to diagnose the fault of the negative electrode relay. The installation method of the negative electrode relay in the circuit is shown in Figure 1 and Figure 2 In the existing scheme, two voltage sampling circuits are respectively arranged at both ends of the negative electrode relay to sample the voltage at both ends of the negative electrode relay. Figure 1 S1 and S2 are sampling points of the two voltage sampling circuits, and the voltage difference between the sampling voltages of the sampling points S1 and S2 is compared to diagnose the fault of the negative electrode relay.
[0004] This fault diagnosis method needs to set two sampling points to diagnose the fault of the negative electrode relay. If any one of the two sampling points fails (for example, poor contact), it will affect the diagnosis result. Therefore, there is an urgent need for a relay fault diagnosis scheme with high reliability. Content of the utility model
[0005] In view of the above problems, the present application provides a switching device fault diagnosis circuit, a switching device and a vehicle to provide a relay fault diagnosis scheme with high reliability. The specific scheme is as follows:
[0006] The first aspect of the present application provides a switching device fault diagnosis circuit, comprising:
[0007] a first resistor (R1), a second resistor (R2), a third resistor (R3), a high resistance element (D1) and a clamping element (D2)
[0008] The first end of the first resistor (R1) is connected to the output end of an external power supply.
[0009] a first end of the second resistor (R2) is connected with a second end of the first resistor (R1), and a second end of the second resistor (R2) is connected with an output end of the first measured switching device;
[0010] a second end of the high-resistance element (D1) is connected with a common end of the first resistor (R1) and the second resistor (R2);
[0011] a first end of the third resistor (R3) is connected with a first end of the high-resistance element (D1), and a second end of the third resistor (R3) is connected with an input end of the first measured switching device;
[0012] a first end of the clamping element (D2) is connected with a first end of the high-resistance element (D1), and a second end of the clamping element (D2) is connected with a second end of the second resistor (R2);
[0013] the common end of the first resistor (R1) and the second resistor (R2) is used as an output end of the switching device fault diagnosis circuit, and the output end is used for providing a sampling result of the switching device fault diagnosis circuit.
[0014] Optionally, in the switching device fault diagnosis circuit, the high-resistance element (D1) is a reverse blocking protection diode, and the clamping element (D2) is a clamping protection diode.
[0015] Optionally, in the switching device fault diagnosis circuit, the switching device fault diagnosis circuit further comprises:
[0016] an inductor (L), which is arranged between the input end of the first measured switching device and the third resistor (R3).
[0017] Optionally, in the switching device fault diagnosis circuit, the switching device fault diagnosis circuit further comprises:
[0018] a first switching switch (K1) and a second switching switch (K2);
[0019] a first end of the first switching switch (K1) is connected with an input end of the first measured switching device, and a second end of the first switching switch (K1) is connected with a second end of the third resistor (R3);
[0020] a first end of the second switching switch (K2) is connected with an input end of the second measured switching device, and a second end of the second switching switch (K2) is connected with a second end of the third resistor (R3).
[0021] Optionally, in the switching device fault diagnosis circuit, the switching device fault diagnosis circuit further comprises:
[0022] a switching controller;
[0023] The control signal output end of the switch controller is connected with the control end of the first switch (K1) and the second switch (K2);
[0024] The switch controller is used to provide a control signal to the first switch (K1) and the second switch (K2), the control signal is used to control the conduction state of the first switch (K1) and the second switch (K2), and under the control of the control signal, when the first switch (K1) is turned on, the second switch (K2) is turned off, and when the first switch (K1) is turned off, the second switch (K2) is turned on.
[0025] Optionally, the switch device fault diagnosis circuit comprises:
[0026] The first measured switch device is a negative relay, and the second measured switch device is a positive relay corresponding to the negative relay.
[0027] Optionally, the switch device fault diagnosis circuit comprises:
[0028] The first resistor (R1), the second resistor (R2) and / or the third resistor (R3) are formed by at least two sub-resistors in parallel.
[0029] The second aspect of the present application provides a switch device, comprising a switch device body and the switch device fault diagnosis circuit of any one of the above, the switch device body is the first measured switch device.
[0030] Optionally, in the switch device, the switch device is a relay device.
[0031] The third aspect of the present application provides an automobile, comprising the switch device fault diagnosis circuit of any one of the above or the switch device of any one of the above.
[0032] By means of the technical scheme, the switch device fault diagnosis circuit provided by the application comprises a first resistor, a second resistor, a third resistor, a high-resistance element and a clamping element, wherein a first end of the first resistor is connected with an output end of an external power supply, a first end of the second resistor is connected with a second end of the first resistor, a second end of the second resistor is connected with an output end of a first measured switch device, a second end of the high-resistance element is connected with a common end of the first resistor and the second resistor, a first end of the third resistor is connected with a first end of the high-resistance element, a second end of the third resistor is connected with an input end of the first measured switch device, a first end of the clamping element is connected with the first end of the high-resistance element, and a second end of the clamping element is connected with the second end of the second resistor; the common end of the first resistor and the second resistor serves as an output end of the switch device fault diagnosis circuit, and the output end is used for providing a sampling result of the switch device fault diagnosis circuit.
[0033] When the on-off states of the first measured switch device are different, the sampling signals output by the output end of the switch device fault diagnosis circuit are different; by comparing the sampling signals output by the output end of the switch device fault diagnosis circuit with a reference signal matched with the on-off state of the first measured switch device, whether the current state of the first measured switch device is faulty can be determined; it can be seen that the application can realize the fault detection of the first measured switch device by using only one sampling point (the output end of the switch device fault diagnosis circuit), and the probability of failure of one sampling node is less than the probability of failure of at least any one of two nodes; therefore, the reliability of the switch device fault diagnosis circuit disclosed by the application is higher than that of the prior art. BRIEF DESCRIPTION OF DRAWINGS
[0034] The above and other features, advantages, and aspects of the various embodiments of the application will become more apparent with reference to the following detailed description in conjunction with the accompanying drawings. Throughout the drawings, the same or similar reference numerals are used to denote the same or similar elements. It should be understood that the drawings are schematic, and the original and elements are not necessarily drawn according to the scale.
[0035] Figure 1 A structure schematic diagram of a relay fault diagnosis scheme provided by an embodiment of the application;
[0036] Figure 2 A structure schematic diagram of a relay fault diagnosis scheme provided by another embodiment of the application;
[0037] Figure 3 A structure schematic diagram of a switch device fault diagnosis circuit provided by an embodiment of the application;
[0038] Figure 4A structural schematic diagram of a switch device fault diagnosis circuit provided by another embodiment of the present application is shown in FIG. 4;
[0039] Figure 5 A current path schematic diagram of a switch device fault diagnosis circuit in a scenario provided by an embodiment of the present application is shown in FIG. 5;
[0040] Figure 6 A current path schematic diagram of a switch device fault diagnosis circuit in a scenario provided by another embodiment of the present application is shown in FIG. 6;
[0041] Figure 7 A structural schematic diagram of a switch device fault diagnosis circuit provided by another embodiment of the present application is shown in FIG. 7;
[0042] Figure 8 A structural schematic diagram of a switch device fault diagnosis circuit provided by another embodiment of the present application is shown in FIG. 8. DETAILED DESCRIPTION
[0043] The embodiments of the present application are described below in conjunction with the drawings in the embodiments of the present application. The terms used in the manner part of the embodiments of the present application are only used to explain the specific embodiments of the present application, and are not intended to limit the present application.
[0044] The embodiments of the present application are described below in conjunction with the drawings. It is known to those of ordinary skill in the art that as technology develops and new scenarios appear, the technical solutions provided by the embodiments of the present application are also applicable to similar technical problems.
[0045] The terms “first”, “second”, and the like in the specification and claims of the present application and the above-described drawings are used to distinguish similar objects, and do not necessarily describe a specific order or sequence. It should be understood that the terms used in this way can be interchanged as appropriate, and this is only a way of distinguishing objects with the same attributes used in the description of the embodiments of the present application. In addition, the terms “include” and “have” and any variations thereof are intended to cover non-exclusive inclusion, so that the products or devices including a series of units are not necessarily limited to those units, but can include other units not clearly listed or inherent to these products or devices.
[0046] The embodiments of the present application disclose a switch device fault diagnosis scheme with high reliability. The switch device can be a relay. The scheme can determine whether the switch device has failed only by the output signal of one sampling point. Therefore, the probability of failure of the sampling circuit is reduced, and the reliability of the diagnosis result is improved.
[0047] The embodiments of the present application disclose a switch device fault diagnosis circuit for fault diagnosis of a switch device (a relay is a kind of switch device). Referring to FIG. 1, the switch device fault diagnosis circuit comprises a sampling circuit 1 and a fault diagnosis circuit 2. Figure 3The switch device fault diagnosis circuit comprises:
[0048] A first resistor R1, a second resistor R2, a third resistor R3, and a high-resistance element D1.
[0049] The first resistor R1 has a first end connected to an output end of an external power supply. The external power supply refers to a direct-current power supply module located outside the switch device fault diagnosis circuit. The switch device fault diagnosis circuit can provide a power supply interface through which the first end of the first resistor R1 is connected to the external power supply. The output voltage of the external power supply can be selected according to design requirements. For example, in the embodiment, the external power supply can be a 5V direct-current power supply module, a 3V direct-current power supply module, or a direct-current power supply module with other amplitudes. Of course, the switch device fault diagnosis circuit can also include a DC-DC conversion circuit. One end of the DC-DC conversion circuit is connected to the external power supply, and the other end of the DC-DC conversion circuit is connected to the first end of the first resistor. The DC-DC conversion circuit is used to convert the output voltage of the external power supply into a voltage suitable for the switch device fault diagnosis circuit, such as a 5V direct-current voltage or a 3V direct-current voltage.
[0050] The second resistor R2 has a first end connected to a second end of the first resistor R1 and a second end connected to an output end of a first measured switch device Q1. The first measured switch device Q1 has two ends, an input end and an output end. The output end of the first measured switch device Q1 is connected to the negative pole of a power supply, and the input end of the first measured switch device Q1 is connected to the positive pole of the power supply. The power supply connected to the first measured switch device Q1 is a different power supply from the external power supply. The former is a high-voltage power supply, and the latter is a low-voltage direct-current power supply.
[0051] A high-resistance element D1, a second end of the high-resistance element D1 being connected to a common end of the first resistor R1 and the second resistor R2; through the high-resistance element D1, a problem of overvoltage damage of a processor connected to an output end S of a switch device fault diagnosis circuit can be prevented when a voltage of an L-node is higher than a voltage of a negative node (a second end of the second resistor), wherein the L-node is a circuit node connected to an input end of a first measured switch device Q1, and the negative node is a node to which the second end of the second resistor R2 is connected, and specifically can be a ground node. If the high-resistance element D1 is not provided, when a high voltage appears at the L-node, the high voltage signal is applied to the output end S of the switch device fault diagnosis circuit through the third resistor R3, and the output end S of the switch device fault diagnosis circuit is connected to a processor for fault analysis of the first measured switch device Q1. If the voltage applied to the output end S of the switch device fault diagnosis circuit is too high and exceeds the bearing capacity of the processor, the processor is damaged by overvoltage. When the high-resistance element D1 is provided, the high-resistance element D1 can provide reverse blocking protection function to prevent the processor connected to the output end S of the switch device fault diagnosis circuit from being damaged by overvoltage when the voltage of the L-node is higher than the voltage of the output end S of the switch device fault diagnosis circuit.
[0052] A third resistor R3, a first end of the third resistor R3 being connected to a first end of the high-resistance element D1, and a second end of the third resistor R3 being connected to an input end of the first measured switch device Q1;
[0053] The common end of the first resistor R1 and the second resistor R2 serves as the output end S of the switch device fault diagnosis circuit, and a fault analysis device acquires a sampling signal of the switch device fault diagnosis circuit through the output end S of the switch device fault diagnosis circuit. Based on the sampling signal and a current state of the first measured switch device Q1, the first measured switch device Q1 can be quickly fault detected.
[0054] When the switch device fault diagnosis circuit is applied to an actual scene, the connection relationship of each device in the switch device fault diagnosis circuit with a battery pack and the first measured switch device Q1 can be referred to the high-resistance element D1 and the clamping element D2 in Figure 4 , Figure 3 , and Figure 4 The high-resistance element D1 and the clamping element D2 in the figures can be regarded as a resistor with very high resistance. The resistance of the high-resistance element D1 is denoted as Rd. When the first measured switch device Q1 is closed, the L-node and the negative node are connected together through the first measured switch device Q1. At this time, the output current direction of the external power supply is as shown in Figure 5As shown, the L-node is equal to the potential of the negative pole, at this time, the output voltage of the output end S of the switch device fault diagnosis circuit is: Wherein, Vcc is the output voltage of the external power supply, R1, R2 and R3 in the formula are the resistance values of the first resistor R1, the second resistor R2 and the third resistor R3 respectively, and Rd is the equivalent resistance value of the high resistance element D1.
[0055] When the first measured switch device Q1 is open, the L-node is equivalent to a suspended state, at this time, the output current direction of the external power supply is as shown in the figure: Figure 6 As shown, the output voltage of the output end S of the switch device fault diagnosis circuit is: .
[0056] In the present scheme, when the first measured switch device Q1 is closed, the output voltage of the output end S of the switch device fault diagnosis circuit is recorded as V1, when the first measured switch device Q1 is open, the output voltage of the output end S of the switch device fault diagnosis circuit is recorded as V2, after the processor obtains the output voltage of the output end S of the switch device fault diagnosis circuit and the state of the first measured switch device Q1, by comparing and analyzing the output voltage of the output end and the corresponding reference voltage, whether the first measured switch device Q1 fails can be quickly judged.
[0057] For example, when the first measured switch device Q1 is in a closed state, the output voltage V1 of the output end S of the switch device fault diagnosis circuit is compared with the first reference voltage, to determine whether they are equal or whether the error between them is within the allowable range, when they are equal or the error between them is within the allowable range, it indicates that the first measured switch can be reliably closed. When the first measured switch device Q1 is in an open state, the output voltage V2 of the output end S of the switch device fault diagnosis circuit is compared with the second reference voltage, to determine whether they are equal or whether the error between them is within the allowable range, when they are equal or the error between them is within the allowable range, it indicates that the first measured switch can be reliably opened. Wherein, the first reference voltage is the output voltage of the output end S of the switch device fault diagnosis circuit when the first measured switch device Q1 is reliably closed, and the second reference voltage is the output voltage of the output end S of the switch device fault diagnosis circuit when the first measured switch device Q1 is reliably opened.
[0058] As can be seen from the above scheme, the switch device fault diagnosis circuit disclosed in the application can realize fault diagnosis of the first measured switch device Q1 through only one sampling node, and the probability of failure of one sampling node is less than the probability of failure of at least any one of two nodes, so that the reliability of the switch device fault diagnosis circuit disclosed in the application is higher than that of the prior art.
[0059] Further, referring to Figure 1 The switch device fault diagnosis circuit disclosed in the embodiment can further include a clamping element D2, a first end of the clamping element D2 being connected with the first end of the high-resistance element D1, and a second end of the clamping element D2 being connected with the second end of the second resistor R2. Similar to the high-resistance element D1, the clamping element D2 is used to realize a clamping protection function, and can prevent the processor connected with the output end S of the switch device fault diagnosis circuit from being damaged due to overvoltage when the voltage of the output end S of the switch device fault diagnosis circuit is higher than the voltage of the L-node.
[0060] In the technical scheme disclosed in the embodiment, the types of the high-resistance element D1 and the clamping element D2 can be selected according to setting requirements. In the embodiment, the high-resistance element D1 can be a reverse protection diode, and the clamping element D2 is used to realize a clamping protection function, so that the clamping element D2 can be a clamping diode. The reverse protection diode is also called reverse polarity diode or self-recovery diode, and is mainly used for protecting a circuit from damage caused by reverse voltage. When the input voltage is in a forward direction, the reverse protection diode is in a cut-off state and does not affect the circuit, and when the input voltage is in a reverse direction, the reverse protection diode becomes conductive, thereby isolating the circuit from the reverse voltage and protecting the circuit from voltage damage. The clamping protection diode, also called clamping diode or clamping diode, is a diode used to limit the potential of a certain point in a circuit. The clamping protection diode realizes the limitation of the potential of a certain point in the circuit by using the unidirectional conductivity of the diode. When the potential of the point exceeds or is lower than a set threshold, the clamping protection diode becomes conductive, thereby pulling or pushing the potential to a predetermined direct current level. This function helps to protect other elements in the circuit from damage caused by excessive or low voltage.
[0061] In the embodiment, when the first measured switch device Q1 is closed, the output end of the first measured switch device Q1 is connected with the negative pole of the power supply, and the input end of the first measured switch device Q1 is connected with the positive pole of the power supply. At this time, there is a large current flowing through the first measured switch device Q1. When the first measured switch device is disconnected, if the contact separation speed is too slow, an electric arc will be formed between the contacts during the disconnection process. This is because, due to electromagnetic induction and inductance, a high self-induced voltage will be generated between the contacts at the moment of disconnection, so as to break through the air to form an electric arc. The electric arc will act on the third resistor R3. If the intensity of the electric arc is too large, the third resistor R3 or the circuit in the switch device fault diagnosis circuit can be burnt out. In order to suppress the electric arc, the above-mentioned switch device fault diagnosis circuit can further comprise an inductor L, which is arranged between the input end of the first measured switch device Q1 and the third resistor R3. The inductor L has the function of blocking direct current and allowing alternating current, and can block the electric arc generated instantaneously from entering the switch device fault diagnosis circuit, so as to prevent the switch device fault diagnosis circuit from being damaged by the high-voltage electric arc.
[0062] In the embodiment, the switch device fault diagnosis circuit can diagnose two switch devices at the same time. In the present application, one of the switch devices is referred to as the first measured switch device Q1, and the other is referred to as the second measured switch device Q2. At this time, referring to Figure 7 , the switch device fault diagnosis circuit further comprises a first switching switch K1 and a second switching switch K2. The first switching switch K1 is arranged between the input end of the first measured switch device Q1 and the third resistor R3. The second switching switch K2 is arranged between the input end of the second measured switch device Q2 and the third resistor R3. When it is necessary to diagnose the first measured switch device Q1 by using the switch device fault diagnosis circuit, the first switching switch K1 is controlled to be kept in a closed state, and the second switching switch K2 is controlled to be kept in an open state. When it is necessary to diagnose the second measured switch device Q2 by using the switch device fault diagnosis circuit, the first switching switch K1 is controlled to be kept in an open state, and the second switching switch K2 is controlled to be kept in a closed state. The present scheme can determine whether the diagnosed switch device is the first measured switch device Q1 or the second measured switch device Q2 by the conduction state of the first switching switch K1 and the second switching switch K2, and then judge whether the diagnosed switch device has a fault based on the output result of the output end S of the switch device fault diagnosis circuit. As can be seen from the embodiment, the present application can realize the abnormal state diagnosis of two switch devices through one sampling point (the output end S of the switch device fault diagnosis circuit).
[0063] Referring to Figure 8As shown, two switching devices are usually connected across the power supply, one of which is connected to the positive terminal of the power supply, and the other is connected to the negative terminal of the power supply. In this embodiment, the switching device connected to the negative terminal of the power supply is denoted as the first switching device Q1, and the switching device connected to the positive terminal of the power supply is denoted as the second switching device Q2.
[0064] In this embodiment, the on-off states of the first switch K1 and the second switch K2 can be controlled by a switch controller connected to the control terminals of the first switch K1 and the second switch K2. The switch controller is configured to provide a switch control signal to the first switch K1 and the second switch K2 to control the on-off states of the first switch K1 and the second switch K2. That is, the switch controller is configured to provide a control signal to the first switch K1 and the second switch K2 to control the on-off states of the first switch K1 and the second switch K2. Under the control of the control signal, when the first switch K1 is on, the second switch K2 is off, and when the first switch K1 is off, the second switch K2 is on. When the second switch K2 is on, the load between the high-voltage output port and the high-voltage input port is equivalent to a resistor. At this time, it can be considered that the output terminal of the second switching device Q2 is connected to the second terminal of the second resistor through the first switching device Q1. The switch controller can be integrated into a processor connected to the output terminal S of the switching device fault diagnosis circuit. Further, the processor can be integrated into a battery management system. In this case, the present application does not need to configure an additional processor.
[0065] In this embodiment, the types and structures of the first resistor R1, the second resistor R2, and / or the third resistor R3 can be selected according to design requirements and cost requirements. For example, the first resistor R1, the second resistor R2, and / or the third resistor R3 are formed by at least two sub-resistors in parallel. The design of multiple sub-resistors in parallel can disperse the current in the circuit, so that each resistor bears a part of the current. In this way, even if a certain resistor fails or bears too much current, the other resistors can still work normally, improving the reliability and stability of the circuit.
[0066] For the above-mentioned circuit, the present application also discloses a switching device, which comprises a switching device body and a switching device fault diagnosis circuit. The switching device fault diagnosis circuit can be any one of the switching device fault diagnosis circuits described in the embodiments of the present application. The switching device body in the switching device serves as the first switching device Q1. The switching device has a data interface connected to the output terminal S of the switching device fault diagnosis circuit.
[0067] In the embodiment, the switch device has two switch device bodies, one of which is denoted as a first measured switch device Q1, and the other is denoted as a second measured switch device Q2.
[0068] In the embodiment, the switch device can be a relay device.
[0069] The embodiment also discloses an automobile, a household appliance and an engineering device, to which the switch device fault diagnosis circuit or the switch device of any one of the above embodiments is applied.
[0070] In the description of the utility model, it is understood that, if the terms "first", "second" appear, they are only for the purpose of description, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features with "first" and "second" can be explicitly or implicitly included at least one of the features. In the description of the utility model, the meaning of "multiple" is at least two, such as two, three, etc., unless otherwise specifically limited.
[0071] In the utility model, unless otherwise specifically defined and limited, the terms such as "installation", "connection", "connection", "fixing" and the like should be understood in a broad sense, for example, it can be fixedly connected, or it can be detachably connected, or it can be integrated; it can be mechanically connected, or it can be electrically connected or in communication with each other; it can be directly connected, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two elements or the interaction relationship between two elements, unless otherwise specifically limited. For ordinary skilled in the art, the specific meaning of the above terms in the utility model can be understood according to the specific circumstances.
[0072] In the utility model, if the terms "one embodiment", "some embodiments", "example", "specific example" or "some examples" appear, it means that the specific features, structures, materials or characteristics described in combination with the embodiment or example are included in at least one embodiment or example of the utility model. In the specification, the illustrative representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner. In addition, the skilled in the art can combine and combine the different embodiments or examples described in the specification and the features of different embodiments or examples without contradiction.
[0073] Although the embodiments of the present application have been shown and described above, it should be understood by those skilled in the art that the above embodiments are exemplary and cannot be understood as limiting the present application, and those skilled in the art can change, modify, replace and transform the above embodiments within the scope of the present application.
[0074] The various embodiments are described in the present specification by progressive stages, and each embodiment focuses on the difference from other embodiments, and the same or similar parts between various embodiments can be referred to each other. For the device disclosed by the embodiments, since it corresponds to the method disclosed by the embodiments, the description is relatively simple, and the related parts can be referred to the method part.
[0075] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present application. Various modifications to the embodiments will be apparent to those skilled in the art, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to the embodiments shown herein, but will conform to the widest scope consistent with the principles and novel features disclosed herein.
Claims
1. A switching device failure diagnosis circuit characterized by comprising: The application relates to a switch device fault diagnosis circuit. The first end of the first resistor (R1) is connected with the output end of an external power supply. The first end of the second resistor (R2) is connected with the second end of the first resistor (R1), and the second end of the second resistor (R2) is connected with the output end of a first measured switch device and the ground. The second end of the high-resistance element (D1) is connected with the second end of the first resistor (R1). The first end of the third resistor (R3) is connected with the first end of the high-resistance element (D1), and the second end of the third resistor (R3) is connected with the input end of the first measured switch device. The common end of the first resistor (R1) and the second resistor (R2) is used as the output end of the switch device fault diagnosis circuit, and the output end is used for providing the sampling result of the switch device fault diagnosis circuit. The application further comprises:
2. The switching device failure diagnosis circuit according to claim 1, characterized by, The first end of the clamping element (D2) is connected with the first end of the high-resistance element (D1), and the second end of the clamping element (D2) is connected with the second end of the second resistor (R2). The application further comprises: The inductor (L) is arranged between the input end of the first measured switch device and the third resistor (R3).
3. The switching device failure diagnosis circuit according to any one of claims 1-2, wherein The application further comprises: The first switch (K1) and the second switch (K2); 4. The circuit according to any one of claims 1 to 3, wherein The first end of the first switch (K1) is connected with the input end of the first measured switch device, and the second end of the first switch (K1) is connected with the second end of the third resistor (R3). The first end of the second switch (K2) is connected with the input end of a second measured switch device, and the second end of the second switch (K2) is connected with the second end of the third resistor (R3). The application further comprises: The control signal output end of the switch controller is connected with the control ends of the first switch (K1) and the second switch (K2).
5. The switch device failure diagnosis circuit according to claim 4, characterized by, The switch controller is used for providing control signals to the first switch (K1) and the second switch (K2), the control signals are used for controlling the conduction states of the first switch (K1) and the second switch (K2), and under the control of the control signals, when the first switch (K1) is turned on, the second switch (K2) is turned off, and when the first switch (K1) is turned off, the second switch (K2) is turned on. The first measured switch device is a negative relay, and the second measured switch device is a positive relay corresponding to the negative relay. The high-resistance element (D1) is a reverse protection diode, and the clamping element (D2) is a clamping diode. The application further comprises a switch device fault diagnosis circuit as claimed in any one of claims 1-7.
6. The switch device failure diagnosis circuit according to claim 4 or 5, characterized by, The switch device is a relay device. 7. The switch device failure diagnosis circuit according to claim 2, characterized by, 8. A switching device, characterized by 9. The switching device of claim 8, wherein 10. An automobile characterized by comprising: A switch device failure diagnosis circuit according to any one of claims 1 to 7 or a switching apparatus according to any one of claims 8 to 9.