Grinding machining center for high-precision probe

Abstract

The grinding type machining center comprises a device body and a lifting assembly, the lifting assembly is arranged in the device body and comprises a lifting rod connected with the inner wall of the device body in a sliding mode, and a grinding block is fixedly connected to the bottom of the outer wall of the lifting rod. A grinding hole is formed in the bottom of the outer wall of the grinding block, a fixing block is fixedly connected to the rear side of the outer wall of the lifting rod, a rotating disc is arranged on the rear side of the outer wall of the fixing block, a rotating groove is formed in the position, corresponding to the fixing block, of the outer wall of the rotating disc, a sliding block is fixedly connected to the rear side of the outer wall of the rotating disc, and the outer wall of the sliding block is sleeved with a rail block. And by arranging the lifting assembly, a worker can adjust the height of a grinding block by rotating a lead screw, when the machining center grinds probes of different models, the grinding block can adapt to the heights of the probes of different models, follow-up grinding machining operation is conducted, and the applicability of the device is enhanced.

Description

TECHNICAL FIELD

[0001] The utility model relates to probe manufacturing technical field, concretely relates to a kind of for high-precision probe's grinding type machining center. BACKGROUND

[0002] With the increasing performance of chip, the complexity of chip is higher and higher, in order to ensure the quality of chip, chip testing environment is more and more valued by major manufacturers. In the test system, an important accessory is needed, that is, test fixture, the existing test fixture includes equipment connection fixture, probe table interface plate, probe card, KIT, test seat and so on, and the core component is test probe, which accounts for 70% of the total cost of test fixture. In the production and processing of probe, it needs to go through many processes, one of which is chamfering and polishing the end of probe.

[0003] According to the disclosure No. CN215036244U discloses a kind of for test probe processing's grinding device, including rack, and set up on rack's feeding mechanism, clamping mechanism, grinding mechanism and discharging mechanism;The utility model discloses through setting feeding mechanism, clamping mechanism, grinding mechanism and discharging mechanism, so that the feeding, material taking, grinding, discharging automation of probe grinding can be realized, greatly reduces manual operation, improves work efficiency;Avoid operator direct contact with grinding mechanism, reduce production risk;The first drive mechanism and second drive mechanism set up can make the grinding disc move along with the direction parallel and perpendicular to clamping hand, and then realize the all-round grinding of probe, improve grinding effect.

[0004] In the actual polishing process of probe, according to the different length of probe model, the part of probe that needs to be polished is also different, and the general polishing machining center is difficult to adjust the polishing position according to the different polishing requirements of probe. Utility model content

[0005] The utility model aims at the deficiency of prior art, provides a kind of for high-precision probe's grinding type machining center, to reach the probe of different sizes, adjust polishing mechanism height, adapt to the demand of its polishing position.

[0006] To achieve the above object, the utility model provides the following technical scheme: A kind of grinding type processing center for high-precision probe, including device main body and lifting assembly, the device main body inside is equipped with lifting assembly, the lifting assembly includes the lifting rod slidingly connected with the inner wall of device main body, the outer wall bottom of the lifting rod is fixedly connected with polishing block, the outer wall bottom of the polishing block is equipped with polishing hole, the outer wall rear side of the lifting rod is fixedly connected with fixed block, the outer wall rear side of the fixed block is equipped with rotary disc, the rotary disc outer wall is equipped with rotary groove at corresponding place of fixed block, the outer wall rear side of the rotary disc is fixedly connected with sliding block, the sliding block outer wall is equipped with track block, the inside of the sliding block is equipped with screw rod, the outer wall rear side of the track block is fixedly connected with rotating shaft, the rotating shaft rear side is fixedly connected with motor.

[0007] Preferably, the rotating shaft outer wall is equipped with support shaft, and the support shaft is fixedly connected with the outer wall of the device main body.

[0008] Preferably, the device main body inner wall middle part is fixedly connected with fixed plate, and the device main body outer wall bottom is fixedly connected with air cylinder.

[0009] Preferably, the air cylinder top is equipped with output shaft, and the output shaft outer wall top is fixedly connected with top block.

[0010] Preferably, the output shaft outer wall is equipped with mounting plate, and the top block outer wall is equipped with pulley.

[0011] Preferably, the pulley outer wall is rotatably connected with L-shaped clamping plate, and the L-shaped clamping plate is equipped with support block at the connecting place with mounting plate.

[0012] Preferably, the L-shaped clamping plate is equipped with rotating block at the connecting place with support block, and the support block is fixedly connected with mounting plate.

[0013] Compared with the prior art, the utility model has the advantages that:

[0014] 1. By setting lifting assembly, staff can adjust the height of polishing block by rotating screw rod, when processing center polishes different models of probe, polishing block can adapt to the height of different models of probe, subsequent polishing processing operation is carried out, and the applicability of the device is enhanced.

[0015] 2. By setting air cylinder and L-shaped clamping plate, when staff processes and polishes probe, air cylinder can be driven, so that the clamping and fixing of different models and sizes of probe are realized, and the clamping and fixing demand of the device to different models and sizes of probe is met. ACCURACY

[0016] Figure 1 It is the three-dimensional structure schematic diagram of the utility model;

[0017] Figure 2 is a sectional structure schematic view of the device main body in the utility model;

[0018] Figure 3 is a three-dimensional structure schematic view of the L-shaped clamping plate in the utility model;

[0019] Figure 4 is a three-dimensional structure schematic view of the rotating disc in the utility model;

[0020] Figure 5 is a disassembled structure schematic view of the sliding block and the track block in the utility model.

[0021] In the figure: 1, device main body; 201, lifting rod; 202, polishing block; 203, polishing hole; 204, fixed block; 205, rotating disc; 206, rotating groove; 207, sliding block; 208, track block; 209, screw rod; 210, rotating shaft; 211, motor; 3, support shaft; 4, fixed plate; 5, air cylinder; 6, output shaft; 7, top block; 8, mounting plate; 9, pulley; 10, L-shaped clamping plate; 11, support block; 12, rotating block. DETAILED DESCRIPTION

[0022] The technical solutions in the embodiments of the utility model will be clearly and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, rather than all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by those skilled in the art without creative labor fall within the protection scope of the utility model.

[0023] Please refer to Figure 1 , Figure 2 , Figure 4 and Figure 5The utility model provides a technical scheme: a kind of grinding type machining center for high-precision probe, to adjust the polishing position height of different model probe, including device main body 1 and lifting assembly, device main body 1 inside is equipped with lifting assembly, lifting assembly includes the lifting rod 201 slidingly connected with the inner wall of device main body 1, the outer wall bottom of lifting rod 201 is fixedly connected with polishing block 202, polishing block 202 outer wall bottom is equipped with polishing hole 203, the outer wall rear side of lifting rod 201 is fixedly connected with fixed block 204, fixed block 204 outer wall rear side is equipped with rotary disc 205, rotary disc 205 outer wall and fixed block 204 corresponding place are equipped with rotary groove 206, the outer wall rear side of rotary disc 205 is fixedly connected with sliding block 207, sliding block 207 outer wall is equipped with track block 208, sliding block 207 inside is equipped with screw rod 209, the outer wall rear side of track block 208 is fixedly connected with rotating shaft 210, the rear side of rotating shaft 210 is fixedly connected with motor 211, rotating shaft 210 outer wall is equipped with support shaft 3, support shaft 3 and device main body 1 outer wall are fixedly connected, by setting lifting assembly, staff can be adjusted the height of polishing block 202 by rotating screw rod 209, when machining center is polished to different model probe, polishing block 202 can be adapted to the height of different model probe, subsequent polishing processing operation is carried out, and the applicability of device is enhanced.

[0024] Please refer to Figure 1 And Figure 3 , to be clamped and fixed to different model probe, fixed plate 4 is fixedly connected in the middle of the inner wall of device main body 1, cylinder 5 is fixedly connected on the outer wall bottom of device main body 1, and output shaft 6 is arranged on the top of cylinder 5, and top block 7 is fixedly connected on the outer wall top of output shaft 6, and mounting plate 8 is equipped with the outer wall of output shaft 6, and pulley 9 is equipped with the outer wall of top block 7, and L-shaped clamping plate 10 is rotatably connected on the outer wall of pulley 9, and support block 11 is arranged at the connecting place of L-shaped clamping plate 10 and mounting plate 8, and rotating block 12 is arranged at the connecting place of L-shaped clamping plate 10 and support block 11, and support block 11 is fixedly connected with mounting plate 8, by setting cylinder 5 and L-shaped clamping plate 10, when staff is processed and polished to probe, cylinder 5 can be driven, so that the clamping and fixing of different model size probe is realized, and the clamping and fixing demand of device to different model size probe is met.

[0025] Working principle: when the staff puts the probe into the corresponding place of the device, when the polishing height needs to be adjusted, manually rotate the screw rod 209, at this time the sliding block 207 moves in the outer wall of the screw rod 209, when the sliding block 207 moves downward in the track block 208, at this time the rotating disc 205 is driven to move downward, at this time the fixed block 204 also moves downward, driving the lifting rod 201 to move downward, at this time the driving motor 211 operates, the rotating shaft 210 drives the track block 208 to rotate, thereby driving the rotating disc 205 to rotate, at this time the fixed block 204 drives the lifting rod 201 to reciprocatingly move up and down under the action of the rotating groove 206, driving the polishing block 202 to polish the probe, because the rotating disc 205 is driven to move downward by rotating the screw rod 209 before, in this polishing process, the rotating eccentricity of the rotating disc 205 is increased, thereby increasing the polishing height of the probe, and the reverse operation is the same;

[0026] When the probe needs to be fixed, the staff manually inserts the probe into the fixed plate 4, at this time the driving cylinder 5 operates, then the output shaft 6 drives the top block 7 to move upward, the L-shaped clamping plate 10 is deflected by the force of the outer wall of the top block 7 through the pulley 9, at this time the L-shaped clamping plate 10 clamps the probe, realizing the clamping and fixing of the probe, the above is the working process of the whole device, and the contents not described in detail in the specification all belong to the prior art known to the person skilled in the art.

[0027] Although the embodiments of the present application have been shown and described, it can be understood by those skilled in the art that various changes, modifications, replacements and modifications can be made to the embodiments without departing from the principles and spirits of the present application, the scope of the present application is defined by the appended claims and their equivalents.

Claims

1. A honing center for high-precision probes, characterized by: Including device body (1) and lifting assembly, the inside of device body (1) is equipped with lifting assembly, the lifting assembly includes the sliding connection of lifting rod (201) with device body (1) inner wall, the bottom of the outer wall of lifting rod (201) is fixedly connected with polishing block (202), the bottom of the outer wall of polishing block (202) is equipped with polishing hole (203), the rear side of the outer wall of lifting rod (201) is fixedly connected with fixed block (204), the rear side of the outer wall of fixed block (204) is equipped with rotary disc (205), the outer wall of rotary disc (205) is equipped with rotary groove (206) with fixed block (204) corresponding, the rear side of the outer wall of rotary disc (205) is fixedly connected with sliding block (207), the outer wall of sliding block (207) is equipped with track block (208), the inside of sliding block (207) is equipped with screw rod (209), the rear side of the outer wall of track block (208) is fixedly connected with rotating shaft (210), the rear side of rotating shaft (210) is fixedly connected with motor (211).

2. The grinding type machining center for a high-precision probe according to claim 1, characterized in that: The outer wall of rotating shaft (210) is equipped with support shaft (3), and the outer wall of support shaft (3) is fixedly connected with device body (1).

3. The grinding type machining center for a high-precision probe according to claim 2, characterized in that: The middle of the inner wall of device body (1) is fixedly connected with fixed plate (4), and the bottom of the outer wall of device body (1) is fixedly connected with air cylinder (5).

4. The grinding type machining center for a high-precision probe according to claim 3, characterized in that: The top of air cylinder (5) is equipped with output shaft (6), and the top of the outer wall of output shaft (6) is fixedly connected with top block (7).

5. The grinding type machining center for a high-precision probe according to claim 4, characterized in that: The outer wall of output shaft (6) is equipped with mounting plate (8), and the outer wall of top block (7) is equipped with pulley (9).

6. The grinding type machining center for a high-precision probe according to claim 5, wherein: The outer wall of pulley (9) is rotatably connected with L-shaped clamping plate (10), and the connecting part of L-shaped clamping plate (10) and mounting plate (8) is equipped with support block (11).

7. The grinding type machining center for a high-precision probe according to claim 6, characterized in that: The connecting part of L-shaped clamping plate (10) and support block (11) is equipped with rotating block (12), and support block (11) is fixedly connected with mounting plate (8).

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