Multi-channel capacitor test fixture

By designing a multi-channel capacitance test fixture, the problem of low testing efficiency for multiple capacitors in existing technologies is solved, enabling synchronous clamping and testing and improving operational efficiency.

CN223808479UActive Publication Date: 2026-01-16GUANGDONG EMERALD ENERGY STORAGE TECHNOLOGY CO LTD
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Patent Information

Application Number
CN202423076136.9
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-12-12
Publication Date
2026-01-16
Estimated Expiration
2034-12-12

AI Technical Summary

Technical Problem

In existing technologies, the clamping and testing efficiency of multiple capacitors is low, and the workload is large.

Method used

Design a multi-channel capacitance test fixture, including a base, a capacitor placement plate, and test components, which can simultaneously hold multiple capacitors and achieve synchronous testing through the sliding connection of the front and rear test components.

Benefits of technology

It improves the efficiency of capacitance testing, reduces clamping workload, enables simultaneous testing of multiple capacitors, and is easy to operate.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a multichannel capacitor test fixture, which comprises a base, the base is provided with a capacitor placing plate, a front test assembly and a rear test assembly, the capacitor placing plate is provided with a plurality of placing grooves, the front test assembly comprises a plurality of first test pieces, the first test pieces can abut against first electrodes of capacitors, and the second test pieces can abut against second electrodes of capacitors. The rear test assembly comprises a plurality of second test pieces, the second test pieces can abut against shell bottom plates of the capacitors, the rear test assembly is in sliding connection with the base, the rear test assembly can be close to or away from the front test assembly in the front-back direction, and the rear test assembly and the front test assembly can clamp the multiple capacitors when the rear test assembly is close to the front test assembly. The multi-channel capacitor testing clamp can clamp a plurality of capacitors synchronously, realizes simultaneous testing of the plurality of capacitors, is convenient to operate, reduces the workload of clamping the plurality of capacitors, and effectively improves the capacitor testing efficiency of the capacitor testing clamp.
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Description

TECHNICAL FIELD

[0001] The utility model relates to capacitor test technical field, especially a kind of multi-channel capacitor test fixture. BACKGROUND

[0002] In the capacitor production process, capacitor is often tested before leaving factory, to make capacitor meet the prescribed requirements, avoid unqualified product to flow into market. The test mode of some current can only test single capacitor, and other test mode needs multiple capacitors to be respectively manually operated clamping electrode, but these capacitor test mode generally exist the problems of low efficiency and heavy workload. Therefore, the technical personnel in the field hope to have a capacitor test fixture, which can improve the clamping and testing efficiency of multiple capacitors. SUMMARY

[0003] The main purpose of the utility model is to provide a kind of multi-channel capacitor test fixture, to solve the problem of low clamping and testing efficiency of multiple capacitors in prior art.

[0004] To achieve the above-mentioned purpose, the utility model provides a kind of multi-channel capacitor test fixture, including base, the base is equipped with capacitor placement plate, front test component and rear test component, the capacitor placement plate is equipped with multiple placement grooves, multiple placement grooves are sequentially arranged along left-right direction, multiple placement grooves are used to place multiple capacitors horizontally, the front test component includes multiple first test pieces, multiple first test pieces are arranged on the front side of capacitor placement plate, multiple first test pieces are arranged opposite to multiple placement grooves one by one, the first test piece can abut against the first electrode of capacitor, the rear test component includes multiple second test pieces, multiple second test pieces are arranged on the back side of capacitor placement plate, multiple second test pieces are arranged opposite to multiple placement grooves one by one, the second test piece can abut against the shell bottom plate of capacitor, the rear test component is slidably connected with base, the rear test component can be close to or away from the front test component along front-back direction, the rear test component can clamp multiple capacitors with the front test component when close to the front test component.

[0005] The capacitor placement plate is provided with a plurality of placement slots in the left-right direction, and one capacitor can be placed in each placement slot. The plurality of capacitors are placed in the placement slots so that the first electrode of each capacitor is opposite to each first test piece and the shell bottom plate of each capacitor is opposite to each second test piece. The first test piece and the second test piece are respectively electrically connected to two test poles of an external test device. Then, the plurality of second test pieces of the rear test assembly are synchronously moved towards the front test assembly until the first test piece abuts against the first electrode and the second test piece abuts against the shell bottom plate, so that the front test assembly and the rear test assembly clamp the capacitors. Then, the test device can be started to test the capacitance of the capacitors. After the test is completed, the rear test assembly is pulled away from the test assembly, and the front test assembly and the rear test assembly no longer clamp the capacitors, and then the capacitors can be taken out to complete the test. The multi-channel capacitor test fixture can synchronously clamp a plurality of capacitors to simultaneously test the plurality of capacitors, is convenient to operate, reduces the work load of clamping the plurality of capacitors, and effectively improves the efficiency of the capacitor test fixture in testing capacitors.

[0006] Preferably, the front test assembly further comprises a base, the first test piece is arranged on the base, the base is fixedly connected to the pedestal, the first test piece is connected with a hollow bolt and a first nut, the first test piece is fixed in the hollow bolt, the base is provided with a connecting long hole, the connecting long hole extends in the up-down direction, the hollow bolt is arranged in the connecting long hole, the hollow bolt can move up and down along the connecting long hole, the head of the hollow bolt is wider than the connecting long hole, the first nut is threadedly connected with the tail of the hollow bolt, the first nut is wider than the connecting long hole, the first nut and the head of the hollow bolt are respectively arranged on the front and rear sides of the connecting long hole, and the first nut and the head of the hollow bolt can clamp the base and lock and fix the first test piece on the base.

[0007] The connecting long hole on the base enables the first test piece to move up and down, the first test piece is connected in the hollow bolt and fixed on the base by the first nut, which can improve the connection stability of the first test piece, and the first test piece can be conveniently moved by unscrewing the first nut, and the height of each first test piece can be conveniently adjusted to correspond to the first electrode of the capacitor.

[0008] Preferably, the base is provided with a height adjusting screw hole and a height fixing long hole, the height adjusting screw hole is arranged on the left and right sides of the base, the height adjusting screw hole penetrates up and down, a height adjusting screw is threadedly connected in the height adjusting screw hole, the lower end of the height adjusting screw abuts against the pedestal, the height fixing long hole extends in the up-down direction, the capacitor placement plate is provided with a first screw hole, the height fixing long hole is opposite to the first screw hole, and the height fixing long hole and the first screw hole are connected by a first screw.

[0009] Loosen the first screw, rotate the height adjustment screw can change the height of the base, thereby synchronously adjusting the height of a plurality of first test pieces, can be convenient to adjust the height of the first electrode corresponding to different specifications of capacitors, can meet the testing needs of capacitors of various specifications; The height fixing long hole on the base can be fixed with the capacitor placing plate, and when the height of the plurality of first test pieces is adjusted, the first screw can be locked to fix the base and the capacitor placing plate.

[0010] Preferably, a quick clamp is fixedly connected to the base, the quick clamp is arranged behind the rear test assembly, the quick clamp is in transmission connection with the rear test assembly, and the quick clamp can drive the rear test assembly to move forward and backward and lock the rear test assembly.

[0011] When the rear test assembly and the front test assembly abut against the capacitor respectively, the quick clamp is tightened to lock the rear test assembly, so that the front test assembly and the rear test assembly clamp the capacitor, and the capacitor is effectively fixed; the structure of the quick clamp is simple, the quick clamp can be quickly locked and loosened, and the operation is convenient.

[0012] Preferably, an adjusting long hole is arranged on the base, the adjusting long hole extends in the front-rear direction, a second connecting hole is arranged on the quick clamp, the second connecting hole is opposite to the adjusting long hole, and the second connecting hole is fixedly connected to the adjusting long hole through a second screw.

[0013] When the position of the rear test assembly needs to be changed, the position of the quick clamp also changes, the quick clamp is adjusted to a suitable position, the quick clamp is tightened to clamp the capacitor by the rear test assembly and the front test assembly, and then the second screw is used to pass through the second connecting hole and the adjusting long hole to fix the quick clamp, so that capacitors of different lengths can be clamped and tested.

[0014] Preferably, a first guide rod and a second guide rod are fixedly connected to the base, the first guide rod and the second guide rod both extend in the front-rear direction, the rear test assembly comprises a rear sliding seat, a plurality of second test pieces are fixedly connected to the rear sliding seat, the left side of the rear sliding seat is in sliding connection with the first guide rod, the right side of the rear sliding seat is in sliding connection with the second guide rod, and the rear test assembly can slide forward and backward along the extension directions of the first guide rod and the second guide rod.

[0015] The first guide rod and the second guide rod can support the rear test assembly on the left and right sides, and improve the stability of the rear test assembly when moving forward and backward.

[0016] Preferably, two first supports and two second supports are fixedly connected to the base, the first support is provided with a first long hole, the second support is provided with a second long hole, the first long hole and the second long hole extend in the up-down direction, the two first supports are respectively arranged on the front side and the rear side of the first guide rod, the two second supports are respectively arranged on the front side and the rear side of the second guide rod, the front and rear sides of the first guide rod are respectively inserted into the two first long holes, the first guide rod can be adjusted up and down in the first long hole, the front and rear sides of the second guide rod are respectively inserted into the second long holes of the two second supports, and the second guide rod can be adjusted up and down in the second long hole.

[0017] The two first supports can support the front side and the rear side of the first guide rod, the two second supports can support the front side and the rear side of the second guide rod, and the rear test assembly is further supported, the height of the rear test assembly can be changed by adjusting the height of the first guide rod on the first support and adjusting the height of the second guide rod on the second support, so as to adapt to capacitors of different height specifications.

[0018] Preferably, the first support is provided with a first through hole, the first through hole is arranged on the upper side of the first long hole and communicates with the first long hole, the front and rear sides of the first guide rod are both provided with a first guide rod screw hole, the first through hole is opposite to the first guide rod screw hole, a first guide rod screw is arranged in the first through hole, the lower side of the first guide rod screw is threadedly connected with the first guide rod screw hole, a first guide rod nut is threadedly connected with the first guide rod screw, the first guide rod nut is arranged above the first through hole, the first guide rod nut abuts against the upper side of the first support, the second support is provided with a second through hole, the second through hole is arranged on the upper side of the second long hole and communicates with the second long hole, the front and rear sides of the second guide rod are both provided with a second guide rod screw hole, the second through hole is opposite to the second guide rod screw hole, a second guide rod screw is arranged in the second through hole, the lower side of the second guide rod screw is threadedly connected with the second guide rod screw hole, a second guide rod nut is threadedly connected with the second guide rod screw, the second guide rod nut is arranged above the second through hole, and the second guide rod nut abuts against the upper side of the second support. The first guide rod screw and the first guide rod nut can adjust the height of the first guide rod, and the second guide rod screw and the second guide rod nut can adjust the height of the second guide rod.

[0019] Rotating the first guide rod screw and / or the first guide rod nut can make the height of the first guide rod rise or fall, rotating the second guide rod screw and / or the second guide rod nut can make the height of the second guide rod rise or fall, so that the height of the rear test assembly can be conveniently adjusted.

[0020] Preferably, one test module is formed by one front test assembly and one rear test assembly, and a plurality of test modules are arranged along the left-right direction. BRIEF DESCRIPTION OF DRAWINGS

[0021] In order to more clearly illustrate the technical solutions of the embodiments of the present application or the prior art, the drawings needed in the following embodiment or prior art description will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can also be obtained according to the structures shown in the drawings without creative labor for those skilled in the art.

[0022] Figure 1 Structure diagram of the capacitor tested by the multi-channel capacitor clamp of the present application;

[0023] Figure 2 Structure diagram of the rear side of the multi-channel capacitor clamp of the present application;

[0024] Figure 3 Structure diagram of the front side of the multi-channel capacitor clamp of the present application;

[0025] Figure 4 Structure diagram of the first test piece and the base of the multi-channel capacitor clamp of the present application;

[0026] Figure 5 Structure diagram of the multi-channel capacitor clamp of the present application when clamping the capacitor;

[0027] Figure 6 Structure diagram of the multi-channel capacitor clamp of the present application with a plurality of test modules.

[0028] In the drawings: 1-base, 11-quick clamp, 111-second connecting hole, 12-adjusting long hole, 112-second screw, 2-capacitor placement plate, 21-placement groove, 22-first screw hole, 3-front test assembly, 31-first test piece, 311-hollow bolt, 312-first nut, 32-base, 321-connecting long hole, 322-height adjusting screw hole, 323-height adjusting screw, 33-height fixing long hole, 4-rear test assembly, 41-second test piece, 42-rear slide base, 5-first guide rod, 51-first support, 511-first long hole, 512-first through hole, 53-first guide rod screw, 54-first guide rod nut, 6-second guide rod, 61-second support, 611-second long hole, 612-second through hole, 63-second guide rod screw, 64-second guide rod nut, 8-capacitor, 81-housing, 82-first electrode, 83-second electrode, 84-housing bottom plate.

[0029] The realization of the purpose, functional features and advantages of this utility model will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0030] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of the present utility model.

[0031] It should be noted that if the embodiments of this utility model involve directional indicators, such as up, down, left, right, front, back, etc., the directional indicators are only used to explain the relative positional relationship and movement of the components in a specific posture. If the specific posture changes, the directional indicators will also change accordingly.

[0032] Furthermore, if the embodiments of this utility model involve descriptions such as "first" or "second," these descriptions are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of those features. Additionally, the technical solutions of the various embodiments can be combined with each other, but this must be based on the ability of those skilled in the art to implement them. When the combination of technical solutions is contradictory or impossible to implement, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection claimed by this utility model.

[0033] like Figures 2 to 6 As shown, a multi-channel capacitance test fixture includes a base 1, on which a capacitor placement plate 2, a front test assembly 3, and a rear test assembly 4 are provided. The capacitor placement plate 2 has multiple placement slots 21 arranged sequentially in the left-right direction. The multiple placement slots 21 are used to place multiple capacitors 8 laterally. The front test assembly 3 includes multiple first test elements 31, which are located on the front side of the capacitor placement plate 2 and are directly opposite to the multiple placement slots 21. The first test elements 31 can abut against the first electrode 82 of the capacitor 8. The rear test assembly 4 includes multiple second test elements 41, which are located on the rear side of the capacitor placement plate 2 and are directly opposite to the multiple placement slots 21. The second test elements 41 can abut against the housing bottom plate 84 of the capacitor 8. The rear test assembly 4 is slidably connected to the base 1 and can move closer to or further away from the front test assembly 3 in the front-back direction. When the rear test assembly 4 is close to the front test assembly 3, it can clamp multiple capacitors 8 with the front test assembly 3.

[0034] The multi-channel capacitor testing fixture can test multiple capacitors 8 at the same time. In the embodiment, four placement grooves 21 are arranged on the capacitor placement plate 2 from left to right, and one capacitor 8 can be placed horizontally in each placement groove 21. The capacitor 8 to be tested has a first electrode 82 and a second electrode 83, and the first electrode 82 and the second electrode 83 are positive and negative electrodes, respectively. Referring to Figure 1 , the first electrode 82 and the second electrode 83 are both on the front side, and the second electrode 83 is in conductive communication with the shell 81 of the capacitor 8. Therefore, the capacitor 8 can be tested by contacting the first electrode 82 and the shell bottom plate 84. Four first testing pieces 31 are arranged on the front testing assembly 3, and four second testing pieces 41 are arranged on the rear testing assembly 4. The four first testing pieces 31 are arranged in order from left to right, and the four second testing pieces 41 are arranged in order from left to right. One capacitor 8 is placed in a set of first testing piece 31, placement groove 21, and second testing piece 41. The testing device has multiple testing channels. A pair of first testing piece 31 and second testing piece 41 are connected to two electrodes of one testing channel of the testing device by wires. The placement groove 21 can stably place the capacitor 8 to prevent the capacitor 8 from rolling on the capacitor placement plate 2. For example, Figure 5 , when the capacitor 8 is placed in the placement groove 21, the first electrode 82 faces forward and directly opposite the first testing piece 31, and the shell bottom plate 84 faces backward and directly opposite the second testing piece 41. The rear testing assembly 4 is pushed forward to make the front testing assembly 3 and the rear testing assembly 4 abut against the first electrode 82 and the shell bottom plate 84 of the capacitor 8. Then the testing device can be started to test the capacitance value of the capacitor 8.

[0035] After the test is completed, the rear testing assembly 4 is pulled away from the testing assembly, and the front testing assembly 3 and the rear testing assembly 4 no longer hold the capacitor 8. Then the capacitor 8 can be taken out to complete the test. The multi-channel capacitor testing fixture can simultaneously hold multiple capacitors 8, realize the simultaneous testing of multiple capacitors 8, and is relatively convenient to operate, reduces the workload of holding multiple capacitors 8, and effectively improves the efficiency of the capacitor testing fixture in testing capacitors 8.

[0036] In some embodiments, the front test assembly 3 further comprises a base 32, the first test piece 31 is arranged on the base 32, the base 32 is fixedly connected to the base 1, the first test piece 31 is connected with a hollow bolt 311 and a first nut 312, the first test piece 31 is fixed in the hollow bolt 311, the base 32 is provided with a connecting long hole 321 extending in the up-down direction, the hollow bolt 311 is arranged in the connecting long hole 321, the hollow bolt 311 can move up and down along the connecting long hole 321, the head of the hollow bolt 311 is wider than the connecting long hole 321, the first nut 312 is threadedly connected with the tail of the hollow bolt 311, the first nut 312 is wider than the connecting long hole 321, the first nut 312 and the head of the hollow bolt 311 are respectively arranged on the front and rear sides of the connecting long hole 321, and the first nut 312 and the head of the hollow bolt 311 can clamp the base 32 and lock and fix the first test piece 31 on the base 32.

[0037] The connecting long hole 321 on the base 32 enables the first test piece 31 to move up and down, the first test piece 31 is connected in the hollow bolt 311 and fixed on the base 32 by the first nut 312, which can improve the connection stability of the first test piece 31, and the first test piece 31 can be conveniently moved by unscrewing the first nut 312, and the height of each first test piece 31 can be conveniently adjusted to correspond to the first electrode 82 of the capacitor 8. When it is necessary to adjust the up-down height of the first test piece 31, the first nut 312 is loosened, the hollow bolt 311 is adjusted to the required height, and then the first nut 312 is tightened and locked on the base 32. The cooperation of the first nut 312 and the hollow bolt 311 enables the front test assembly 3 to have both stability and flexibility.

[0038] In some embodiments, the base 32 is provided with a height adjusting screw hole 322 and a height fixing long hole 33, the height adjusting screw hole 322 is arranged on the left and right sides of the base 32, the height adjusting screw hole 322 extends in the up-down direction, a height adjusting screw 323 is threadedly connected in the height adjusting screw hole 322, the lower end of the height adjusting screw 323 abuts against the base 1, the height fixing long hole 33 extends in the up-down direction, the capacitor placement plate 2 is provided with a first screw hole 22, the height fixing long hole 33 is opposite to the first screw hole 22, and the height fixing long hole 33 and the first screw hole 22 are connected by a first screw.

[0039] Loosening the first screw and rotating the height adjusting screw 323 can change the height of the base 32, thereby synchronously adjusting the heights of the plurality of first test pieces 31, conveniently adjusting the heights of the first electrodes 82 corresponding to capacitors 8 of different specifications, and meeting the testing requirements of capacitors 8 of various specifications; the height fixing long hole 33 on the base 32 can be fixed with the capacitor placement plate 2, and when the heights of the plurality of first test pieces 31 are adjusted, the first screw can be locked to fix the base 32 with the capacitor placement plate 2.

[0040] In some specific embodiments, the base 1 is fixedly connected with a quick clamp 11, the quick clamp 11 is arranged behind the rear test assembly 4, the quick clamp 11 is in transmission connection with the rear test assembly 4, and the quick clamp 11 can drive the rear test assembly 4 to move forward and backward and lock the rear test assembly 4.

[0041] When the rear test assembly 4 and the front test assembly 3 respectively abut against the capacitor 8, the quick clamp 11 can lock the rear test assembly 4, so that the front test assembly 3 and the rear test assembly 4 clamp the capacitor 8, effectively fixing the capacitor 8. The structure of the quick clamp 11 is simple, and the quick clamp 11 can be quickly locked and loosened, which is convenient to operate.

[0042] In some specific embodiments, the base 1 is provided with an adjusting long hole 12 extending along the front and back directions, the quick clamp 11 is provided with a second connecting hole 111, the second connecting hole 111 is opposite to the adjusting long hole 12, and the second connecting hole 111 is fixedly connected with the adjusting long hole 12 through a second screw 112.

[0043] When the position of the rear test assembly 4 needs to be changed, the position of the quick clamp 11 will also change. After the quick clamp 11 is adjusted to the appropriate position, the quick clamp 11 is tightened to clamp the capacitor 8 by the rear test assembly 4 and the front test assembly 3, and then the second screw 112 is used to pass through the second connecting hole 111 and the adjusting long hole 12 to fix the quick clamp 11. The second connecting hole 111 can be a threaded hole directly locked with the second screw 112, or the second connecting hole 111 is a through hole locked with the second screw 112 through a nut, which can adapt to clamp and test capacitors 8 of different length specifications. The quick clamp 11 is a prior art, including a vertical quick clamp 11, a horizontal quick clamp 11, a push-pull quick clamp 11, a squeeze quick clamp 11, a door latch quick clamp 11, etc. According to the activity direction of the quick clamp 11, the push-pull quick clamp 11 is preferably adopted.

[0044] In some specific embodiments, the base 1 is fixedly connected with a first guide rod 5 and a second guide rod 6, the first guide rod 5 and the second guide rod 6 both extend along the front and back directions, the rear test assembly 4 includes a rear sliding seat 42, a plurality of second test pieces 41 are fixedly connected to the rear sliding seat 42, the left side of the rear sliding seat 42 is in sliding connection with the first guide rod 5, and the right side of the rear sliding seat 42 is in sliding connection with the second guide rod 6. The rear test assembly 4 can slide forward and backward along the extension direction of the first guide rod 5 and the second guide rod 6.

[0045] The first guide rod 5 and the second guide rod 6 can support the rear test assembly 4 on the left and right sides, improving the stability of the rear test assembly 4 when moving forward and backward. Pushing the rear test assembly 4 to slide on the first guide rod 5 and the second guide rod 6 can adjust the front and back positions of the rear test assembly 4.

[0046] In some embodiments, the base 1 is fixedly connected with two first supports 51 and two second supports 61, the first support 51 is provided with a first long hole 511, the second support 61 is provided with a second long hole 611, the first long hole 511 and the second long hole 611 extend in the up-down direction, the two first supports 51 are respectively arranged on the front side and the rear side of the first guide rod 5, the two second supports 61 are respectively arranged on the front side and the rear side of the second guide rod 6, the front and rear sides of the first guide rod 5 are respectively inserted into the two first long holes 511, the first guide rod 5 can be adjusted in the up-down direction in the first long hole 511, and the front and rear sides of the second guide rod 6 are respectively inserted into the second long holes 611 of the two second supports 61, and the second guide rod 6 can be adjusted in the up-down direction in the second long hole 611.

[0047] The two first supports 51 can support the front side and the rear side of the first guide rod 5, the two second supports 61 can support the front side and the rear side of the second guide rod 6, and then support the rear test assembly 4, adjusting the height of the first guide rod 5 on the first support 51 and adjusting the height of the second guide rod 6 on the second support 61 can change the height of the rear test assembly 4, so as to adapt to capacitors 8 of different height specifications.

[0048] In some embodiments, the first support 51 is provided with a first through hole 512, the first through hole 512 is arranged on the upper side of the first long hole 511 and communicates with the first long hole 511, the front and rear sides of the first guide rod 5 are provided with first guide rod screw holes, the first through hole 512 is opposite to the first guide rod screw hole, a first guide rod screw 53 is arranged in the first through hole 512, the lower side of the first guide rod screw 53 is threadedly connected with the first guide rod screw hole, a first guide rod nut 54 is threadedly connected with the first guide rod screw 53, the first guide rod nut 54 is arranged above the first through hole 512, and the upper side of the first guide rod nut 54 abuts against the first support 51, the second support 61 is provided with a second through hole 612, the second through hole 612 is arranged on the upper side of the second long hole 611 and communicates with the second long hole 611, the front and rear sides of the second guide rod 6 are provided with second guide rod screw holes, the second through hole 612 is opposite to the second guide rod screw hole, a second guide rod screw 63 is arranged in the second through hole 612, the lower side of the second guide rod screw 63 is threadedly connected with the second guide rod screw hole, a second guide rod nut 64 is threadedly connected with the second guide rod screw 63, the second guide rod nut 64 is arranged above the second through hole 612, and the upper side of the second guide rod nut 64 abuts against the second support 61, the first guide rod screw 53 and the first guide rod nut 54 can adjust the height of the first guide rod 5, and the second guide rod screw 63 and the second guide rod nut 64 can adjust the height of the second guide rod 6.

[0049] The height of the first guide rod 5 can be adjusted by rotating the first guide rod screw 53 and / or the first guide rod nut 54, and the height of the second guide rod 6 can be adjusted by rotating the second guide rod screw 63 and / or the second guide rod nut 64, so that the height of the rear test assembly 4 can be conveniently adjusted. The first guide rod screw 53 and the first guide rod nut 54 can be connected in two ways. In one way, the first guide rod screw 53 and the first guide rod nut 54 are fixed, and the height of the first guide rod 5 can be adjusted by rotating the first guide rod screw 53 and the first guide rod nut 54 while the first guide rod nut 54 abuts against the upper side of the first support 51 under the action of gravity. In another way, the first guide rod screw 53 and the first guide rod nut 54 are threadedly connected, and the relative position of the first guide rod screw 53 and the first guide rod nut 54 can be changed by rotating the first guide rod nut 54, and the height of the first guide rod 5 can be adjusted by rotating the first guide rod nut 54 while the first guide rod nut 54 abuts against the upper side of the first support 51 under the action of gravity.

[0050] In some implementations, referring to Figure 6 One test module includes one front test assembly 3 and one rear test assembly 4, and the number of test modules is multiple, and the multiple test modules are arranged in the left-right direction. The multiple test modules can test multiple groups of capacitors 8 respectively, and the multiple groups of capacitors 8 can be alternately disassembled and tested, so that the test efficiency is improved.

[0051] The above description is only preferred embodiments of the present application, and does not limit the patent range of the present application. Any equivalent structural transformation made according to the contents of the present application specification and drawings, or direct / indirect application in other related technical fields is included in the patent protection range of the present application.

Claims

1. A multi-channel capacitance test fixture, comprising: The utility model relates to a kind of capacitor testing device, including pedestal (1), which is equipped with capacitor placement plate (2), front test component (3) and rear test component (4) on the pedestal (1), and the capacitor placement plate (2) is equipped with multiple placement slots (21), multiple placement slots (21) are sequentially arranged along left and right direction, and multiple placement slots (21) are used to place multiple capacitors (8) horizontally, the front test component (3) includes multiple first test pieces (31), multiple first test pieces (31) are arranged on the front side of capacitor placement plate (2), multiple first test pieces (31) are arranged one by one with multiple placement slots (21), and first test piece (31) can abut the first electrode (82) of capacitor (8), and the rear test component (4) includes multiple second test pieces (41), multiple second test pieces (41) are arranged on the rear side of capacitor placement plate (2), multiple second test pieces (41) are arranged one by one with multiple placement slots (21), and second test piece (41) can abut the shell bottom plate (84) of capacitor (8), and the rear test component (4) is slidably connected with the pedestal (1), the rear test component (4) can be close to or away from the front test component (3) along front and back direction, and the rear test component (4) can hold multiple capacitors (8) with the front test component (3) when being close to the front test component (3).

2. The multi-channel capacitance test fixture of claim 1, wherein, The front test component (3) further includes base (32), and the first test piece (31) is arranged on the base (32), the base (32) is fixedly connected to the pedestal (1), the first test piece (31) is connected with hollow bolt (311) and first nut (312), the first test piece (31) is fixed in the hollow bolt (311), the base (32) is provided with connecting long hole (321), the connecting long hole (321) extends along up and down direction, the hollow bolt (311) is arranged in the connecting long hole (321), the hollow bolt (311) can move up and down along the connecting long hole (321), the head of the hollow bolt (311) is wider than the connecting long hole (321), the first nut (312) is threadedly connected with the tail of the hollow bolt (311), the first nut (312) is wider than the connecting long hole (321), and the first nut (312) and the head of the hollow bolt (311) are respectively arranged on the front and rear sides of the connecting long hole (321), the first nut (312) and the head of the hollow bolt (311) can clamp the base (32) and lock and fix the first test piece (31) on the base (32).

3. The multi-channel capacitance test fixture of claim 2, wherein, The base (32) is provided with height adjusting screw holes (322) and height fixing long holes (33), the height adjusting screw holes (322) are arranged on the left and right sides of the base (32), the height adjusting screw holes (322) are vertically through, the height adjusting screw holes (322) are threadedly connected with height adjusting screws (323), the lower ends of the height adjusting screws (323) abut against the base (1), the height fixing long holes (33) extend in the vertical direction, the capacitor placement plate (2) is provided with a first screw hole (22), the height fixing long holes (33) are opposite to the first screw hole (22), and the height fixing long holes (33) and the first screw hole (22) are connected through a first screw.

4. The multi-channel capacitance test fixture of claim 1, wherein, The base (1) is fixedly connected with a quick clamp (11), the quick clamp (11) is arranged behind the rear test assembly (4), the quick clamp (11) is in transmission connection with the rear test assembly (4), and the quick clamp (11) can drive the rear test assembly (4) to move forward and backward and lock the rear test assembly (4).

5. The multi-channel capacitance test fixture of claim 4, wherein, The base (1) is provided with an adjusting long hole (12), the adjusting long hole (12) extends in the front-rear direction, the quick clamp (11) is provided with a second connecting hole (111), the second connecting hole (111) is opposite to the adjusting long hole (12), and the second connecting hole (111) is fixedly connected with the adjusting long hole (12) through a second screw (112).

6. The multi-channel capacitance test fixture of claim 1, wherein, The base (1) is fixedly connected with a first guide rod (5) and a second guide rod (6), the first guide rod (5) and the second guide rod (6) extend in the front-rear direction, the rear test assembly (4) comprises a rear sliding seat (42), a plurality of second test pieces (41) are fixedly connected to the rear sliding seat (42), the left side of the rear sliding seat (42) is in sliding connection with the first guide rod (5), the right side of the rear sliding seat (42) is in sliding connection with the second guide rod (6), and the rear test assembly (4) can slide forward and backward along the extension directions of the first guide rod (5) and the second guide rod (6).

7. The multi-channel capacitance test fixture of claim 6, wherein, The base (1) is fixedly connected with two first supports (51) and two second supports (61), the first support (51) is provided with a first long hole (511), the second support (61) is provided with a second long hole (611), the first long hole (511) and the second long hole (611) extend in the vertical direction, the two first supports (51) are arranged on the front side and the rear side of the first guide rod (5) respectively, the two second supports (61) are arranged on the front side and the rear side of the second guide rod (6) respectively, the front-rear sides of the first guide rod (5) are inserted into the two first long holes (511) respectively, the first guide rod (5) can be adjusted up and down in the first long hole (511), and the front-rear sides of the second guide rod (6) are inserted into the second long holes (611) of the two second supports (61) respectively, and the second guide rod (6) can be adjusted up and down in the second long hole (611).

8. The multi-channel capacitance test fixture of claim 7, wherein, The first support (51) is provided with a first through hole (512), the first through hole (512) is arranged on the upper side of the first long hole (511) and communicates with the first long hole (511), the front and rear sides of the first guide rod (5) are provided with first guide rod screw holes, the first through hole (512) is opposite to the first guide rod screw hole, a first guide rod screw (53) is arranged in the first through hole (512), the lower side of the first guide rod screw (53) is threadedly connected with the first guide rod screw hole, a first guide rod nut (54) is threadedly connected with the first guide rod screw (53), the first guide rod nut (54) is arranged above the first through hole (512), the first guide rod nut (54) abuts against the upper side of the first support (51), the second support (61) is provided with a second through hole (612), the second through hole (612) is arranged on the upper side of the second long hole (611) and communicates with the second long hole (611), the front and rear sides of the second guide rod (6) are provided with second guide rod screw holes, the second through hole (612) is opposite to the second guide rod screw hole, a second guide rod screw (63) is arranged in the second through hole (612), the lower side of the second guide rod screw (63) is threadedly connected with the second guide rod screw hole, a second guide rod nut (64) is threadedly connected with the second guide rod screw (63), the second guide rod nut (64) is arranged above the second through hole (612), the second guide rod nut (64) abuts against the upper side of the second support (61), the first guide rod screw (53) and the first guide rod nut (54) can adjust the height of the first guide rod (5), and the second guide rod screw (63) and the second guide rod nut (64) can adjust the height of the second guide rod (6).

9. The multi-channel capacitance test fixture of claim 1, wherein, One of the front test assemblies (3) and one of the rear test assemblies (4) form a test module, the number of test modules is multiple, and multiple test modules are arranged along the left-right direction.