Temperature control box for high and low temperature aging detection of electronic component

Abstract

The utility model discloses a temperature control box for high and low temperature aging detection of an electronic component, and relates to the technical field of temperature control boxes. The device comprises a temperature control box, a temperature control structure is arranged in the temperature control box, a placing plate is fixedly connected in the temperature control box, a supporting plate is fixedly connected to the back side face of the temperature control box, and a clamping device is arranged in the temperature control box; the clamping device comprises a motor, and the back side face of the motor is fixedly connected to the front side face of the supporting plate. According to the clamping device, the output shaft of the motor rotates to be matched with a connecting plate, a rotating shaft, a clamping plate and other assemblies in the clamping device, so that when a U-shaped rod pushes the stress plate, one end of the stress plate can move upwards through a sliding plate, and the other end of the stress plate rotates through a connecting column to extrude the connecting plate; and the connecting plate rotates towards the middle of the temperature control box through the rotating rod, so that the connecting plate drives the clamping plate to clamp and fix the electronic element through the rotating shaft.

Description

Technical Field

[0001] This utility model belongs to the field of temperature control boxes, and in particular relates to a temperature control box for high and low temperature aging testing of electronic components. Background Technology

[0002] Temperature control chambers for high and low temperature aging testing of electronic components, often referred to as high and low temperature aging chambers or temperature aging test chambers, are used to test the performance changes and reliability of electronic components, assemblies, materials or equipment under different temperature environments.

[0003] According to a published high and low temperature aging test chamber for photovoltaic modules (publication number: CN218217297U), the chamber includes a test chamber body, a temperature control module for adjusting the temperature inside the test chamber, a humidification module for increasing the humidity inside the test chamber, ventilation openings, and an opening and closing mechanism for keeping the ventilation openings open or closed. This application can improve the detection accuracy of photovoltaic module aging tests.

[0004] The aforementioned application uses a test chamber, which is equipped with a temperature control module for adjusting the temperature inside the test chamber. This makes it impossible to recycle the tested items, requiring manual recycling. Therefore, we propose a temperature control chamber for high and low temperature aging testing of electronic components. Utility Model Content

[0005] The purpose of this invention is to provide a temperature control box for high and low temperature aging testing of electronic components. Through the rotation of the rotating shaft and the interaction of components such as bevel gear one, fixed plate, threaded rod, bevel gear two, threaded sleeve, slide bar, slide rail, push block, and through hole inside the recycling device, the downward movement of the threaded sleeve causes the slide bar to move downward, which in turn causes the push block to move downward. When the push block moves downward, it pushes against the baffle. When the push block pushes the baffle, the baffle, through the rotation of the fixed column, opens the through hole, allowing the electronic components on the baffle to enter the recycling box through the inclined baffle and the opened through hole, thus solving the existing problems.

[0006] To solve the above-mentioned technical problems, this utility model is achieved through the following technical solution:

[0007] This utility model is a temperature control box for high and low temperature aging testing of electronic components, including a temperature control box, a temperature control structure is provided inside the temperature control box, a placement plate is fixedly connected inside the temperature control box, a support plate is fixedly connected to the back side of the temperature control box, and a clamping device is provided inside the temperature control box.

[0008] The clamping device includes a motor, the back side of which is fixedly connected to the front side of a support plate. A rotating shaft is fixedly connected to the output shaft of the motor. The circumferential surface of the rotating shaft extends through the back side of the temperature control box. The circumferential surface of the rotating shaft is rotatably connected to the inner wall of the temperature control box. A drive gear is fixedly connected to the front side of the rotating shaft. A rack is slidably connected to the inner wall of the temperature control box. A U-shaped rod is fixedly connected to the front side of the rack. A fixing rod is fixedly connected inside the temperature control box. A rotating rod is fixedly connected to the front side of the fixing rod. A connecting plate is rotatably connected to the circumferential surface of the rotating rod. A rotating shaft is fixedly connected to the front side of the connecting plate. A clamping plate is rotatably connected to the circumferential surface of the rotating shaft.

[0009] Furthermore, the top of the placement plate is provided with a sliding groove, the front and side sides of the connecting plate are slidably connected to the inner wall of the sliding groove, the front and side sides of the connecting plate are fixedly connected to a connecting column, the circumferential surface of the connecting column is rotatably connected to a force-bearing plate, the side of the force-bearing plate is slidably connected to a sliding plate, and the bottom of the sliding plate is fixedly connected to the inner wall of the temperature control box. The function of the sliding groove is to allow the connecting plate to slide inside, and the function of the sliding plate is to allow the force-bearing plate to slide inside.

[0010] Furthermore, a torsion spring is fixedly connected to the circumferential surface of the rotating rod. The end of the torsion spring away from the rotating rod is fixedly connected to the side of the connecting plate. The function of the torsion spring is to drive the connecting plate to reset.

[0011] Furthermore, the number of each of the connecting plate, rotating shaft, clamping plate, connecting column, force plate, and sliding plate is set to two. They are arranged linearly along the vertical central axis of the rotating rod. The circumferential surface of the driving gear meshes with the side of the rack. The bottom of the force plate is located on the displacement trajectory of the U-shaped rod. The linear arrangement along the vertical central axis of the rotating rod allows for better clamping of the detected electronic components. The meshing of the circumferential surface of the driving gear with the side of the rack allows the rack to move when the driving gear rotates. The bottom of the force plate being located on the displacement trajectory of the U-shaped rod allows the force plate to rotate using the connecting column when the U-shaped rod moves.

[0012] Furthermore, the temperature control box is equipped with a recycling device, which includes a first bevel gear. The inner wall of the first bevel gear is fixedly connected through the circumferential surface of the rotating shaft. A fixing plate is fixedly connected to the back side of the temperature control box. A threaded rod is rotatably connected to the bottom of the fixing plate. A second bevel gear is fixedly connected to the bottom of the threaded rod. A threaded sleeve is threadedly connected to the circumferential surface of the threaded rod. A slide bar is fixedly connected to the circumferential surface of the threaded sleeve. A slide rail is provided on the back side of the temperature control box. The side of the slide bar is slidably connected to the inner wall of the slide rail. A push block is fixedly connected to the bottom of the slide bar. A through hole is provided on the top of the placement plate. A fixing post is fixedly connected inside the through hole. A baffle is rotatably connected to the circumferential surface of the fixing post. The baffle is used to block the through hole and prevent electronic components from falling in during testing.

[0013] Furthermore, a second torsion spring is fixedly connected to the circumferential surface of the fixed column, and the end of the second torsion spring away from the fixed column is fixedly connected to the top of the baffle. A recycling box is slidably connected to the bottom of the placement plate. The function of the second torsion spring is to drive the baffle to reset.

[0014] Furthermore, the number of the fixed column, baffle, and torsion spring II are each set to two, and they are arranged linearly along the vertical central axis of the through hole. The circumferential surface of the first bevel gear meshes with the circumferential surface of the second bevel gear. The top of the baffle is located on the displacement trajectory of the push block. The purpose of setting the number of the fixed column, baffle, and torsion spring II to two, and arranging them linearly along the vertical central axis of the through hole, is to better block the electronic components. The purpose of the circumferential surface of the first bevel gear meshing with the circumferential surface of the second bevel gear is to drive the second bevel gear to rotate when the first bevel gear rotates. The purpose of the top of the baffle being located on the displacement trajectory of the push block is to push the baffle to open the through hole by rotating the fixed column when the push block moves, so that the tested electronic components can enter the recycling bin.

[0015] This utility model has the following beneficial effects:

[0016] This invention utilizes the interaction between the rotation of the motor output shaft and the internal components of the clamping device, including a rotating shaft, drive gear, rack, U-shaped rod, fixed rod, rotating rod, connecting plate, rotating shaft, and clamping plate. When the rotating shaft rotates clockwise, it drives the drive gear to rotate clockwise. When the drive gear rotates clockwise, it pushes the rack upwards. When the rack moves upwards, it drives the U-shaped rod upwards. When the U-shaped rod moves upwards, it pushes the force plate. When the U-shaped rod pushes the force plate, one end of the force plate moves upwards via a sliding plate. This causes the other end of the force plate to rotate and press against the connecting plate via a connecting column. This causes the connecting plate to rotate towards the center of the temperature control box via the rotating rod, allowing the connecting plate to clamp and fix the electronic components via the rotating shaft.

[0017] This invention utilizes the rotation of a shaft in conjunction with components such as bevel gear one, fixed plate, threaded rod, bevel gear two, threaded sleeve, slide bar, slide rail, push block, and through hole inside the recycling device. This enables the threaded sleeve to move downwards, which in turn drives the slide bar downwards. When the slide bar moves downwards, it drives the push block downwards. When the push block moves downwards, it pushes against the baffle. When the push block pushes against the baffle, the baffle opens the through hole by rotating the fixed column, allowing the electronic components on the baffle to enter the recycling bin through the inclined baffle and the opened through hole.

[0018] Of course, any product implementing this utility model does not necessarily need to achieve all of the advantages described above at the same time. Attached Figure Description

[0019] To more clearly illustrate the technical solutions of the embodiments of this utility model, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 This is a three-dimensional structural diagram of the present invention;

[0021] Figure 2 This is a three-dimensional overall structural diagram of the clamping device of this utility model;

[0022] Figure 3 This is a three-dimensional overall structural diagram of the recycling device of this utility model;

[0023] Figure 4 For the present utility model Figure 2 A three-dimensional magnified structural diagram at point A in the middle;

[0024] Figure 5 For the present utility model Figure 3 A three-dimensional magnified structural diagram at point B.

[0025] The attached diagram lists the components represented by each number as follows:

[0026] 1. Temperature control box; 2. Temperature control structure; 3. Placement plate; 4. Support plate; 5. Clamping device; 51. Motor; 52. Rotating shaft; 53. Drive gear; 54. Rack; 55. U-shaped rod; 56. Fixed rod; 57. Rotating rod; 58. Connecting plate; 59. Rotating shaft; 510. Clamping plate; 511. Slide groove; 512. Connecting column; 513. Force plate; 514. Slide plate; 515. Torsion spring one; 6. Recycling device; 61. Bevel gear one; 62. Fixed plate; 63. Threaded rod; 64. Bevel gear two; 65. Threaded sleeve; 66. Slide bar; 67. Slide track; 68. Push block; 69. Through hole; 610. Fixed column; 611. Baffle; 612. Torsion spring two; 613. Recycling box. Detailed Implementation

[0027] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of the present utility model.

[0028] Please see Figure 1-5 This utility model is a temperature control box for high and low temperature aging testing of electronic components, including a temperature control box 1, a temperature control structure 2 is provided inside the temperature control box 1, a placement plate 3 is fixedly connected inside the temperature control box 1, a support plate 4 is fixedly connected to the back side of the temperature control box 1, and a clamping device 5 is provided inside the temperature control box 1.

[0029] The clamping device 5 includes a motor 51, the back side of which is fixedly connected to the front side of the support plate 4. The output shaft of the motor 51 is fixedly connected to a rotating shaft 52. The circumferential surface of the rotating shaft 52 passes through the back side of the temperature control box 1. The circumferential surface of the rotating shaft 52 is rotatably connected to the inner wall of the temperature control box 1. A drive gear 53 is fixedly connected to the front side of the rotating shaft 52. A rack 54 is slidably connected to the inner wall of the temperature control box 1. A U-shaped rod 55 is fixedly connected to the front side of the rack 54. A fixing rod 56 is fixedly connected inside the temperature control box 1. A rotating rod 57 is fixedly connected to the front side of the fixing rod 56. A connecting plate 58 is rotatably connected to the circumferential surface of the rotating rod 57. A rotating shaft 59 is fixedly connected to the front side of the connecting plate 58. A clamping plate 510 is rotatably connected to the circumferential surface of the rotating shaft 59.

[0030] The top of the placement plate 3 is provided with a sliding groove 511. The front and side sides of the connecting plate 58 are slidably connected to the inner wall of the sliding groove 511. The front and side sides of the connecting plate 58 are fixedly connected to a connecting column 512. The circumferential surface of the connecting column 512 is rotatably connected to a force-bearing plate 513. The side of the force-bearing plate 513 is slidably connected to a sliding plate 514. The bottom of the sliding plate 514 is fixedly connected to the inner wall of the temperature control box 1. The function of the sliding groove 511 is to allow the connecting plate 58 to slide inside, and the function of the sliding plate 514 is to allow the force-bearing plate 513 to slide inside.

[0031] A torsion spring 515 is fixedly connected to the circumferential surface of the rotating rod 57. The end of the torsion spring 515 away from the rotating rod 57 is fixedly connected to the side of the connecting plate 58. The function of the torsion spring 515 is to drive the connecting plate 58 to reset.

[0032] The number of connecting plate 58, rotating shaft 59, clamping plate 510, connecting column 512, force plate 513, and sliding plate 514 are each set to two. They are linearly arranged along the vertical central axis of the rotating rod 57. The circumferential surface of the drive gear 53 meshes with the side of the rack 54. The bottom of the force plate 513 is located on the displacement trajectory of the U-shaped rod 55. The linear arrangement of the connecting plate 58, rotating shaft 59, clamping plate 510, connecting column 512, force plate 513, and sliding plate 514 is set to two. The purpose of this linear arrangement along the vertical central axis of the rotating rod 57 is to better clamp the electronic components being tested. The meshing of the circumferential surface of the drive gear 53 with the side of the rack 54 allows the rack 54 to move when the drive gear 53 rotates. The bottom of the force plate 513 being located on the displacement trajectory of the U-shaped rod 55 allows the force plate 513 to rotate using the connecting column 512 when the U-shaped rod 55 moves.

[0033] The temperature control box 1 is equipped with a recycling device 6, which includes a bevel gear 61. The inner wall of the bevel gear 61 is fixedly connected to the circumferential surface of the rotating shaft 52. A fixing plate 62 is fixedly connected to the back side of the temperature control box 1. A threaded rod 63 is rotatably connected to the bottom of the fixing plate 62. A bevel gear 64 is fixedly connected to the bottom of the threaded rod 63. A threaded sleeve 65 is threadedly connected to the circumferential surface of the threaded rod 63. A slide bar 66 is fixedly connected to the circumferential surface of the threaded sleeve 65. A slide rail 67 is opened on the back side of the temperature control box 1. The side of the slide bar 66 is slidably connected to the inner wall of the slide rail 67. A push block 68 is fixedly connected to the bottom of the slide bar 66. A through hole 69 is opened on the top of the placement plate 3. A fixing post 610 is fixedly connected to the inside of the through hole 69. A baffle 611 is rotatably connected to the circumferential surface of the fixing post 610. The function of the baffle 611 is to block the through hole 69 and prevent electronic components from falling in during testing.

[0034] A second torsion spring 612 is fixedly connected to the circumferential surface of the fixed post 610. The end of the second torsion spring 612 away from the fixed post 610 is fixedly connected to the top of the baffle 611. A recycling box 613 is slidably connected to the bottom of the placement plate 3. The function of the second torsion spring 612 is to drive the baffle 611 to reset.

[0035] The number of fixed posts 610, baffles 611, and torsion springs 612 are each set to two, and they are arranged linearly along the vertical central axis of the through hole 69. The circumferential surface of bevel gear 61 meshes with the circumferential surface of bevel gear 64. The top of baffle 611 is located on the displacement trajectory of push block 68. The purpose of setting the number of fixed posts 610, baffles 611, and torsion springs 612 to two, and arranging them linearly along the vertical central axis of the through hole 69, is to better block the electronic components. The purpose of the circumferential surface of bevel gear 61 meshing with the circumferential surface of bevel gear 64 is to drive bevel gear 64 to rotate when bevel gear 61 rotates. The purpose of the top of baffle 611 being located on the displacement trajectory of push block 68 is to push baffle 611 to open the through hole 69 by rotating fixed posts 610 when push block 68 moves, so that the tested electronic components can enter the recycling bin 613.

[0036] A specific application of this embodiment is as follows: First, when the device needs to test electronic components, the clamping device 5 can be used to clamp and fix the electronic components to prevent position displacement during testing, which would affect the testing effect. By starting the motor 51, when the output shaft of the motor 51 rotates clockwise, it can drive the rotating shaft 52 to rotate clockwise. When the rotating shaft 52 rotates clockwise, it will drive the drive gear 53 to rotate clockwise. When the drive gear 53 rotates clockwise, it will push the rack 54 to move upward. When the rack 54 moves upward, it will drive the U-shaped... When the U-shaped rod 55 moves upward, it pushes the force plate 513. When the U-shaped rod 55 pushes the force plate 513, one end of the force plate 513 moves upward using the sliding plate 514. As a result, the other end of the force plate 513 rotates and presses the connecting plate 58 through the connecting column 512, causing the connecting plate 58 to rotate towards the center of the temperature control box 1 using the rotating rod 57. When the connecting plate 58 rotates towards the center, it drives the clamping plate 510 to rotate towards the center through the rotating shaft 59, thereby clamping and fixing the electronic components placed on the baffle 611.

[0037] The rotation of shaft 52 drives the recycling device 6. After the electronic components have been tested, the recycling device 6 can be used to recycle them. The output shaft of motor 51 rotates counterclockwise, which in turn drives shaft 52 to rotate counterclockwise. When shaft 52 rotates counterclockwise, it drives bevel gear 61 to rotate counterclockwise. When bevel gear 61 rotates counterclockwise, it drives bevel gear 64 to rotate clockwise. When bevel gear 64 rotates clockwise, it drives threaded rod 63 to rotate clockwise on fixed plate 62. When the threaded rod 63 rotates clockwise, it will cause the threaded sleeve 65 to move downward. When the threaded sleeve 65 moves downward, it will cause the slide bar 66 to move downward. When the slide bar 66 moves downward, it will cause the push block 68 to move downward. When the push block 68 moves downward, it will push the baffle 611. When the push block 68 pushes the baffle 611, the baffle 611 will use the rotation of the fixed post 610 to open the through hole 69. Thus, the electronic components on the baffle 611 will enter the recycling bin 613 through the inclined baffle 611 and the opened through hole 69.

[0038] In the description of this specification, references to terms such as "an embodiment," "example," "specific example," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0039] The preferred embodiments of this utility model disclosed above are merely illustrative of the present utility model. These preferred embodiments do not exhaustively describe all details, nor do they limit the utility model to the specific implementations described. Clearly, many modifications and variations can be made based on the content of this specification. This specification selects and specifically describes these embodiments to better explain the principles and practical applications of this utility model, thereby enabling those skilled in the art to better understand and utilize it. This utility model is limited only by the claims and their full scope and equivalents.

Claims

1. A temperature control chamber for high and low temperature aging testing of electronic components, comprising a temperature control chamber (1), characterized in that: The temperature control box (1) is provided with a temperature control structure (2) inside, a placement plate (3) is fixedly connected inside the temperature control box (1), a support plate (4) is fixedly connected to the back side of the temperature control box (1), and a clamping device (5) is provided inside the temperature control box (1). The clamping device (5) includes a motor (51), the back side of which is fixedly connected to the front side of the support plate (4). The output shaft of the motor (51) is fixedly connected to a rotating shaft (52). The circumferential surface of the rotating shaft (52) passes through the back side of the temperature control box (1). The circumferential surface of the rotating shaft (52) is rotatably connected to the inner wall of the temperature control box (1). A drive gear (53) is fixedly connected to the front side of the rotating shaft (52). The inner wall of the temperature control box (1) slides. A rack (54) is connected, and a U-shaped rod (55) is fixedly connected to the front side of the rack (54). A fixing rod (56) is fixedly connected inside the temperature control box (1). A rotating rod (57) is fixedly connected to the front side of the fixing rod (56). A connecting plate (58) is rotatably connected to the circumferential surface of the rotating rod (57). A rotating shaft (59) is fixedly connected to the front side of the connecting plate (58). A clamping plate (510) is rotatably connected to the circumferential surface of the rotating shaft (59).

2. The temperature control chamber for high and low temperature aging testing of electronic components according to claim 1, characterized in that, The top of the placement plate (3) is provided with a sliding groove (511). The front side of the connecting plate (58) is slidably connected to the inner wall of the sliding groove (511). The front side of the connecting plate (58) is fixedly connected to a connecting column (512). The circumferential surface of the connecting column (512) is rotatably connected to a force plate (513). The side of the force plate (513) is slidably connected to a sliding plate (514). The bottom of the sliding plate (514) is fixedly connected to the inner wall of the temperature control box (1).

3. The temperature control chamber for high and low temperature aging testing of electronic components according to claim 2, characterized in that, A torsion spring (515) is fixedly connected to the circumferential surface of the rotating rod (57), and the end of the torsion spring (515) away from the rotating rod (57) is fixedly connected to the side of the connecting plate (58).

4. The temperature control chamber for high and low temperature aging testing of electronic components according to claim 3, characterized in that, The number of the connecting plate (58), rotating shaft (59), clamping plate (510), connecting column (512), force plate (513) and sliding plate (514) are each set to two, and are arranged linearly along the vertical central axis of the rotating rod (57). The circumferential surface of the driving gear (53) meshes with the side of the rack (54), and the bottom of the force plate (513) is located on the displacement trajectory of the U-shaped rod (55).

5. A temperature control chamber for high and low temperature aging testing of electronic components according to claim 4, characterized in that, The temperature control box (1) is equipped with a recycling device (6), which includes a bevel gear (61). The inner wall of the bevel gear (61) is fixedly connected to the circumferential surface of the rotating shaft (52). A fixing plate (62) is fixedly connected to the back side of the temperature control box (1). A threaded rod (63) is rotatably connected to the bottom of the fixing plate (62). A bevel gear (64) is fixedly connected to the bottom of the threaded rod (63). A threaded sleeve (6) is threadedly connected to the circumferential surface of the threaded rod (63). 5) A slide bar (66) is fixedly connected to the circumferential surface of the threaded sleeve (65). A slide rail (67) is provided on the back side of the temperature control box (1). The side of the slide bar (66) is slidably connected to the inner wall of the slide rail (67). A push block (68) is fixedly connected to the bottom of the slide bar (66). A through hole (69) is provided on the top of the placement plate (3). A fixing post (610) is fixedly connected inside the through hole (69). A baffle (611) is rotatably connected to the circumferential surface of the fixing post (610).

6. A temperature control chamber for high and low temperature aging testing of electronic components according to claim 5, characterized in that, The circumferential surface of the fixed column (610) is fixedly connected to a torsion spring (612), and the end of the torsion spring (612) away from the fixed column (610) is fixedly connected to the top of the baffle (611). The bottom of the placement plate (3) is slidably connected to a recycling box (613).

7. A temperature control chamber for high and low temperature aging testing of electronic components according to claim 6, characterized in that, The number of fixed column (610), baffle (611) and torsion spring (612) are each set to two, and are arranged linearly along the vertical central axis of the through hole (69). The circumferential surface of bevel gear (61) meshes with the circumferential surface of bevel gear (64). The top of baffle (611) is located on the displacement trajectory of push block (68).

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