Semiconductor chip test sorting machine
Through the mechanical structure design of electric push rod and motor drive, the chip position is fixed and stable transmission and accurate sorting are achieved, which solves the problem of increased noise and measurement error caused by vibration in semiconductor chip inspection, and improves inspection accuracy and production efficiency.
Patent Information
- Application Number
- CN202520094907.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-15
- Publication Date
- 2026-01-30
- Estimated Expiration
- 2035-01-15
AI Technical Summary
In the prior art, when a semiconductor chip is detecting high-frequency characteristics, external vibration or its own movement can change the coupling state with the high-frequency detection probe, increasing noise and causing a large error in the signal-to-noise ratio measurement results, thus affecting the accurate assessment of the chip's weak signal processing capabilities.
A semiconductor chip testing and sorting machine is adopted, which uses an electric push rod to drive a triangular block to drive a rolling shaft and a squeezing block to fix the position of the chip on the conveyor plate. Combined with a motor-driven rotating disk and a sliding column to push the stop block, the chip can be stably transported and accurately sorted.
It effectively avoids the impact of external vibration or its own movement on the detection accuracy, improves the accuracy of chip testing and the efficiency of the production line, reduces the probability of defective chips, lowers after-sales costs and maintains the brand image.
Smart Images
Figure CN223847525U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of semiconductor chip technology, and in particular to a semiconductor chip testing and sorting machine. Background Technology
[0002] In today's era of rapid technological advancement, semiconductor chips, as core components of modern electronic devices, have been widely applied across various fields, from consumer electronics such as smartphones and computers to high-end sectors like automobiles, industrial automation, aerospace, and medical equipment. With the continuous progress of semiconductor technology, chips are becoming increasingly integrated and their functions are becoming more complex and diverse.
[0003] Semiconductor chip testing and sorting machines include feeding, testing, sorting, and control systems. The feeding system uses a vibratory feeder or conveyor belt to organize the chips; the testing system uses fixtures, probes, and test boards to test the chip functions and parameters; the sorting system uses a robotic arm to place the chips into the corresponding bins based on the test results; and the control system coordinates the operation of the entire machine.
[0004] In existing technologies, some semiconductor chips are difficult to fix in place when detecting the high-frequency characteristics of the chip. The positional stability of the chip is crucial. If it is difficult to fix the chip, the coupling state between the chip and the high-frequency detection probe will change due to external vibration or its own movement. This unstable state will lead to increased noise and a large error in the measurement result of the signal-to-noise ratio, affecting the accurate assessment of the chip's weak signal processing capability. To address this issue, a semiconductor chip testing and sorting machine is proposed. Utility Model Content
[0005] To overcome the above shortcomings, this utility model provides a semiconductor chip testing and sorting machine, which aims to improve the problem of semiconductor chips being difficult to fix in the prior art. This causes the coupling state between the chip and the high-frequency detection probe to change due to external vibration or self-movement when detecting high-frequency characteristics, increasing noise and increasing the signal-to-noise ratio measurement error.
[0006] To achieve the above objectives, the present invention adopts the following technical solution:
[0007] A semiconductor chip testing and sorting machine includes a connecting box, a support frame fixedly connected inside the connecting box, an electric push rod fixedly connected inside the support frame, a triangular block fixedly connected to the drive end of the electric push rod, a square slider one fixedly connected to the right side of the triangular block, two support blocks fixedly connected inside the support frame, connecting rods rotatably connected inside the support blocks, rolling shafts rotatably connected to the bottom of the connecting rods, squeezing blocks rotatably connected to the top of the connecting rods, and square slider two slidably connected to the bottom of the squeezing blocks, and a rejection sorting component fixedly connected to the top of the support frame.
[0008] As a further description of the above technical solutions:
[0009] The sorting assembly comprises a connecting plate, the outer part of the connecting plate is fixedly connected to the inner part of the support frame, the inner part of the connecting plate is fixedly connected with a motor, the driving end of the motor is fixedly connected with a rotating disc, the top of the rotating disc is fixedly connected with two sliding columns, the top of the connecting plate is fixedly connected with a fixed rod, the top of the fixed rod is rotatably connected with an L-shaped block, the left side of the L-shaped block is fixedly connected with an L-shaped block, the bottom of the L-shaped block is rotatably connected with a sliding strip, and the top of the sliding strip is fixedly connected with a stop block.
[0010] As a further description of the above technical solutions:
[0011] The outer parts of the two rolling shafts are in contact with the opposite sides of the triangular blocks, the bottoms of the two extrusion blocks are slidably connected to the top of the support frame, and the outer part of the square sliding block one is slidably connected to the inner part of the support frame.
[0012] As a further description of the above technical solutions:
[0013] The top of the support frame is fixedly connected with two supports, the top of the two supports is rotatably connected with a detector, and the top of the support frame is slidably connected with a conveying plate.
[0014] As a further description of the above technical solutions:
[0015] The bottom of the sliding strip is fixedly connected with a sliding block, and the outer part of the sliding block is fixedly connected to the inner part of the connecting plate.
[0016] As a further description of the above technical solutions:
[0017] The outer part of the stop block is in contact with the outer parts of the two sliding columns, and the rear side of the L-shaped block is in contact with the outer parts of the two sliding columns.
[0018] As a further description of the above technical solutions:
[0019] The top of the connecting plate is rotatably connected with a plurality of stop columns, and the opposite side of the sliding strip is slidably connected to the outer parts of the plurality of stop columns.
[0020] As a further description of the above technical solutions:
[0021] The inner part of the connecting box is slidably connected with a sliding plate, the right side of the connecting box is fixedly connected with an operation table, the top of the operation table is fixedly connected with a display screen, and the inner rear side of the connecting box is in contact with a containing barrel.
[0022] The utility model has the advantages of the following beneficial effects:
[0023] 1. The utility model discloses a chip is placed on the conveying board in working, first, the electric push rod pushes the triangular block, and the triangular block drives the square sliding block no. 1 in the support frame sliding, simultaneously makes the rolling axle rotate, and the rolling axle rotation reduces the chip moving friction and controls its speed direction, and the chip moves to the detection position.
[0024] 2. The utility model discloses, then, the motor drives the rotary disc rotation, and the sliding column on the rotary disc pushes the block, and the block drives the sliding bar to slide in the link plate through the sliding block, and the L type block cooperates and moves, and the sliding bar pushes the chip to corresponding barrel and completes the sorting, thereby improve the production capacity and efficiency of whole production line, reduce the probability that the chip of bad quality appears on the market, can reduce the after-sales cost caused by product quality problem. Such as the cost of return and exchange, maintenance etc. also help to maintain the brand image of enterprise, avoid the potential economic loss that the brand reputation is damaged because of quality problem. BRIEF DESCRIPTION OF DRAWINGS
[0025] Figure 1 It is a perspective view of a semiconductor chip test sorting machine that the utility model proposes;
[0026] Figure 2 It is the structure schematic diagram of the detector of a semiconductor chip test sorting machine that the utility model proposes;
[0027] Figure 3 It is the structure schematic diagram of the triangular block of a semiconductor chip test sorting machine that the utility model proposes;
[0028] Figure 4 It is Figure 2 The enlarged view of A in the middle.
[0029] Legend:
[0030] 1, connection box;2, support frame;3, electric push rod;4, triangular block;5, square sliding block no. 1;6, rolling axle;7, connecting rod;8, support block;9, extrusion block;10, square sliding block no. 2;11, link plate;12, motor;13, rotary disc;14, sliding column;15, block;16, sliding bar;17, sliding block;18, L type block;19, block column;20, fixed rod;21, support;22, detector;23, conveying board;24, barrel;25, sliding plate;26, operation table;27, display screen. DETAILED DESCRIPTION
[0031] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all the other embodiments obtained by those skilled in the art without creative labor fall within the protection scope of the present application.
[0032] With reference to Figure 1 , Figure 2The utility model provides a kind of semiconductor chip test sorting machine of one embodiment, including connecting box 1, connecting box 1 is as the shell main body of entire semiconductor chip test sorting machine, protection and installation foundation are provided for each component in inside, its internal space has received support frame 2.Connecting box 1 is fixedly connected with support frame 2 in inside, support frame 2 plays the role of firm support in connecting box 1, provides reliable installation site for electric push rod 3, sorting component etc., ensure that each component is stable in position during operation.Support frame 2 is fixedly connected with electric push rod 3 in inside, electric push rod 3 is the key part of driving device, its telescopic action can push triangular block 4 to move.Electric push rod 3 is fixedly connected with triangular block 4 in driving end, triangular block 4 shape is special, its right side connects square slide block one 5, bottom and rolling shaft 6 contact.When electric push rod 3 is pushed, the movement of triangular block 4 will make rolling shaft 6 generate corresponding rotation, simultaneously, force is transmitted to other components by its structural features, changes the relative position relationship between each component, plays the role of hinge in the switching and control of chip transmission path.Right side of triangular block 4 is fixedly connected with square slide block one 5, square slide block one 5 is slidably connected in support frame 2 inside, it slides in the track defined in support frame 2 along with the movement of triangular block 4.Support frame 2 is fixedly connected with two support blocks 8 in inside, the inside of support block 8 is rotatably connected with connecting rod 7 respectively, connecting rod 7 can transmit the force that triangular block 4 acts on rolling shaft 6 to extrusion block 9 partially, makes extrusion block 9 generate corresponding movement, simultaneously, its rotary connection mode makes the movement between each component more flexible, in the linkage mechanism of entire mechanical structure, it is the key link for realizing force and motion conversion in different directions.The bottom of connecting rod 7 is rotatably connected with rolling shaft 6 respectively, when triangular block 4 moves, rolling shaft 6 will rotate under the action of triangular block 4, its rotation can reduce the friction of chip in transmission process, so that chip moves more smoothly on conveying plate 23, and it is helpful to accurately control the moving speed and direction of chip, guarantee the efficiency of test sorting.The top of connecting rod 7 is rotatably connected with extrusion block 9 respectively, under the action of connecting rod 7, extrusion block 9 can move up and down, can extrude chip on conveying plate 23, such as fixing chip in suitable position when chip is tested, prevent it from shaking or displacement, ensure the accuracy and reliability of test.Extrusion block 9 is slidably connected with square slide block two 10 respectively in bottom, square slide block two 10 avoids the situation that extrusion block 9 deviates from predetermined track during movement, so that the extrusion operation of extrusion block 9 to chip is more accurate and stable, effectively improve the precision and quality of chip test sorting, the top of support frame 2 is fixedly connected with sorting component of elimination;
[0033] Refer to Figure 3 、 Figure 4The sorting assembly includes an adapter plate 11, which ensures stable and efficient power transmission and mechanical movement inside the sorting assembly, and plays a core supporting and connecting role in the sorting function module of the entire test sorting machine. The adapter plate 11 is fixedly connected to the inside of the support frame 2, and the inside of the adapter plate 11 is fixedly connected with a motor 12. The motor 12 serves as a power source of the sorting assembly and is connected to a rotating disc 13 at the driving end. The driving end of the motor 12 is fixedly connected with the rotating disc 13. During rotation of the rotating disc 13, the sliding column 14 interacts with the stop block 15, the L-shaped block 18 and other components. Through the ingenious design of this mechanical structure, the rotary motion of the motor 12 is converted into the linear motion of the sliding bar 16, and then the pushing and sorting action of the chip on the conveying plate 23 is realized, which is the core conversion component of the sorting action. The top of the rotating disc 13 is fixedly connected with two sliding columns 14. The rotating force of the rotating disc 13 is transmitted to the sliding columns 14, which drives the stop block 15 and the L-shaped block 18 to move correspondingly. In the mechanical transmission chain of the entire sorting assembly, the sliding columns 14 are the key medium for realizing force and motion conversion, and directly affect the sorting operation of the chip. The top of the adapter plate 11 is fixedly connected with a fixed rod 20, and the top of the fixed rod 20 is rotatably connected with the L-shaped block 18, which provides a fulcrum for the rotation of the L-shaped block 18. The position and structure design of the fixed rod 20 fixed on the top of the adapter plate 11 enable the L-shaped block 18 to stably rotate around the fixed rod 20 under the action of the sliding column 14, which guarantees the effectiveness and stability of the force transmission and motion conversion inside the entire sorting assembly, and is an important supporting component for maintaining the normal operation of the sorting assembly. The top of the fixed rod 20 is rotatably connected with the L-shaped block 18, and the left side of the L-shaped block 18 is fixedly connected with another L-shaped block 18. The bottom of the L-shaped block 18 is rotatably connected with the sliding bar 16, and the rear side is in contact with the outside of the two sliding columns 14. The left side of the L-shaped block 18 is fixedly connected with the L-shaped block 18, and the bottom of the L-shaped block 18 is rotatably connected with the sliding bar 16. The movement of the L-shaped block 18 can push or pull the chip on the conveying plate 23, realize the movement and sorting of the chip between different positions, and is one of the sorting execution components directly acting on the chip. The top of the sliding bar 16 is fixedly connected with the stop block 15. When the sliding column 14 rotates with the rotating disc 13, the stop block 15 will drive the sliding bar 16 to move under the pushing of the sliding column 14, so as to control the movement state of the chip on the conveying plate 23, such as blocking the chip from continuing to advance or allowing the chip to enter the next sorting link, which plays a key switching role in the path control of the chip sorting.
[0034] Referring to Figures 2 to 4The outer part of the two rolling shafts 6 is in contact with the far side of the triangular block 4. When the triangular block 4 moves, the rolling shaft 6 rotates under the action of the triangular block 4, which can reduce the friction of the chip during transmission. The bottom of the two extrusion blocks 9 is slidingly connected to the top of the support frame 2. Under the action of the connecting rod 7, the extrusion block 9 can move up and down, and can perform extrusion operation on the chip on the conveying plate 23, such as fixing the chip in the right position during chip testing to prevent it from shaking or moving, and ensuring the accuracy and reliability of the test. The outer part of the square sliding block 5 is slidingly connected to the inner part of the support frame 2. The top of the support frame 2 is fixedly connected with two supports 21. The top of the support 21 is rotatably connected with the detector 22, which is fixed to the top of the support frame 2. It provides a stable mounting position and support for the detector 22, while allowing the detector 22 to rotate within a certain range. The top of the two supports 21 is rotatably connected with the detector 22, which is rotatably connected to the top of the support frame 2 through the support 21, and is used for detecting various performance parameters of the chip on the conveying plate 23. The top of the support frame 2 is slidingly connected with the conveying plate 23, which is slidingly connected to the top of the support frame 2 and is the transmission carrier of the chip in the test sorting machine. The bottom of the sliding bar 16 is fixedly connected with the sliding block 17, so that the sliding bar 16 can accurately transmit force to the chip, ensuring the accuracy and reliability of the chip sorting action. The outer part of the sliding block 17 is fixedly connected to the inner part of the adapter plate 11. The outer part of the stop block 15 is in contact with the outer part of the two sliding columns 14. In the mechanical transmission chain of the entire sorting assembly, it is the key medium for force and motion conversion, directly affecting the sorting operation of the chip. The rear side of the L-shaped block 18 is in contact with the outer part of the two sliding columns 14. The top of the adapter plate 11 is rotatably connected with a plurality of stop columns 19, which play an auxiliary role in precise guidance and stable motion during the execution of the chip sorting action. The far side of the sliding bar 16 is slidingly connected to the outer part of the plurality of stop columns 19. The inner part of the connecting box 1 is slidingly connected with the sliding plate 25, which is slidingly connected to the inner part of the connecting box 1. Its specific function may be related to the transmission, buffering or other auxiliary operation of the chip. The right side of the connecting box 1 is fixedly connected with the operation table 26, which is fixed to the right side of the connecting box 1 and is the interface for the operator to interact with the test sorting machine. The operator can perform various parameter settings, start and stop operations, etc. on the operation table 26. The top of the operation table 26 is fixedly connected with the display screen 27, which is fixed to the top of the operation table 26 and is used to display various information of the test sorting machine, such as chip detection data, sorting results, equipment running status, etc., so that the operator can intuitively understand the working condition of the equipment. The inner rear side of the connecting box 1 is in contact with the container 24.
[0035] The working principle is that when the electric push rod 3 starts to work, the telescopic movement of the electric push rod 3 drives the triangular block 4 to move, the triangular block 4 drives the square slide block 5 to slide in the track of the support frame 2, and at the same time, the rolling shaft 6 connected with the support block 8 through the connecting rod 7 is driven to rotate, the rolling shaft 6 rotationally assists the chip to move smoothly on the conveying plate 23 and controls the speed and direction of the chip, when the chip reaches a specific position, the connecting rod 7 transmits force to drive the extrusion block 9 to move up and down under the guidance of the square slide block 10, and the chip is fixed to be detected, after the detection is completed, the chip is classified and processed under the action of subsequent sorting components, and the whole process is realized through the cooperative operation of various components, so that the chip can be efficiently tested and sorted, the reasonable clamping manner can also avoid scratching the surface of the chip, especially for the chip with high-precision photoetching patterns or optical coating, the key parts are prevented from being damaged, so that the quality and performance of the chip are not affected, the small size and complex internal structure of the chip require high detection precision, the clamping can fix the chip at a stable position, and the detection precision is prevented from being affected due to external vibration or slight movement of the chip, which is particularly important for the performance indexes such as high-frequency characteristics and weak signal processing of the chip.
[0036] When the motor 12 is started, the rotating disc 13 is driven to rotate, and the two sliding columns 14 at the top of the rotating disc 13 are driven to move in a circle. When the sliding column 14 rotates to a specific position, the sliding column 14 will be in contact with the stop block 15 at the top of the sliding bar 16 and push the stop block 15, the stop block 15 drives the sliding bar 16 to move, and since the sliding bar 16 at the bottom slides in the link plate 11 through the sliding block 17, the movement direction of the sliding bar 16 is stable. At the same time, the L-shaped block 18 rotates around the fixed rod 20 under the action of the sliding column 14, and the rotation of the L-shaped block 18 further cooperates with the movement of the sliding bar 16, so that the sliding bar 16 can accurately push or pull the chip on the conveying plate 23, and the movement and sorting of the chip between different positions on the conveying plate 23 are realized. After the defective chip on the production line is removed, the production equipment can be more focused on the processing and treatment of qualified chips, the production delay caused by repeated debugging, rework and the like of defective products is reduced, the production capacity and efficiency of the whole production line are improved, the probability of the chip with poor quality appearing on the market is reduced, the cost caused by product quality problems such as return and replacement, maintenance and the like is reduced, and the brand image of the enterprise is also maintained, and the potential economic loss caused by the damage of brand reputation due to quality problems is avoided.
[0037] Finally, it should be noted that: the above only describes the preferred embodiments of the utility model, and is not used to limit the utility model, although the utility model is described in detail with reference to the foregoing embodiments, for those skilled in the art, still can modify the technical scheme recorded in the foregoing embodiments, or equivalent replacement is carried out to part of the technical features, any modification, equivalent replacement, improvement and the like within the spirit and principle of the utility model should be included in the protection scope of the utility model.
Claims
1. A semiconductor chip test handler comprising a connection box (1), characterized in that: The inside of the connecting box (1) is fixedly connected with a support frame (2), the inside of the support frame (2) is fixedly connected with an electric push rod (3), the driving end of the electric push rod (3) is fixedly connected with a triangular block (4), the right side of the triangular block (4) is fixedly connected with a square slide block one (5), the inside of the support frame (2) is fixedly connected with two support blocks (8), the inside of the support block (8) is rotatably connected with a connecting rod (7) respectively, the bottom of the connecting rod (7) is rotatably connected with a rolling shaft (6) respectively, the top of the connecting rod (7) is rotatably connected with an extrusion block (9) respectively, the bottom of the extrusion block (9) is slidably connected with a square slide block two (10) respectively, the top of the support frame (2) is fixedly connected with a sorting assembly.
2. A semiconductor chip testing handler according to claim 1, characterized in that: The sorting assembly comprises an adapter plate (11), the outside of the adapter plate (11) is fixedly connected in the inside of the support frame (2), the inside of the adapter plate (11) is fixedly connected with a motor (12), the driving end of the motor (12) is fixedly connected with a rotating disc (13), the top of the rotating disc (13) is fixedly connected with two sliding columns (14), the top of the adapter plate (11) is fixedly connected with a fixed rod (20), the top of the fixed rod (20) is rotatably connected with an L-shaped block (18), the left side of the L-shaped block (18) is fixedly connected with an L-shaped block (18), the bottom of the L-shaped block (18) is rotatably connected with a sliding bar (16), the top of the sliding bar (16) is fixedly connected with a stop block (15).
3. The semiconductor chip testing handler according to claim 1, wherein: The outside of two rolling shafts (6) is in contact with the opposite side of the triangular block (4), the bottom of two extrusion blocks (9) is slidably connected on the top of the support frame (2), the outside of the square slide block one (5) is slidably connected in the inside of the support frame (2).
4. The semiconductor chip testing handler according to claim 1, wherein: The top of the support frame (2) is fixedly connected with two supports (21), the top of two supports (21) is rotatably connected with a detector (22), the top of the support frame (2) is slidably connected with a conveying plate (23).
5. The semiconductor chip testing handler according to claim 2, wherein: The bottom of the sliding bar (16) is fixedly connected with a sliding block (17), the outside of the sliding block (17) is fixedly connected in the inside of the adapter plate (11).
6. A semiconductor chip testing handler according to claim 2, wherein: The outside of the stop block (15) is in contact with the outside of two sliding columns (14), the back side of the L-shaped block (18) is in contact with the outside of two sliding columns (14).
7. A semiconductor chip testing handler according to claim 5, wherein: The top of the adapter plate (11) is rotatably connected with a plurality of stop columns (19), the opposite side of the sliding bar (16) is slidably connected on the outside of a plurality of stop columns (19).
8. The semiconductor chip testing handler according to claim 1, wherein: The inside of the connecting box (1) is slidably connected with a sliding plate (25), the right side of the connecting box (1) is fixedly connected with an operation table (26), the top of the operation table (26) is fixedly connected with a display screen (27), the inside of the connecting box (1) is in contact with a container (24) on the back side.