Semiconductor device sorting device based on aging test

Abstract

The utility model belongs to the technical field of semiconductor aging test, and particularly relates to a semiconductor device sorting device based on aging test, which comprises a working table, a supporting seat is arranged on the left side above the working table, a conveying belt is arranged in the supporting seat, a sorting mechanism is arranged above the conveying belt, and the sorting mechanism is arranged on the working table. The sorting mechanism comprises a pre-screening unit and a test sorting unit; and the pre-screening unit comprises a second support, a second infrared detector, a second electric push rod, a push block, a groove and a material distributing plate, the second support is fixedly connected to the left side of the upper portion of the workbench, and the second infrared detector is arranged on the bottom face of the second support. According to the semiconductor device sorting device based on the aging test, through the design of the second support and the second infrared detector, the position of the push block is adjusted according to the detection result of the second infrared detector, semiconductor devices which do not meet the requirement are pushed out of the conveying belt, and potential bad devices are screened out in advance; and time and resources are prevented from being wasted in the testing process.

Description

TECHNICAL FIELD

[0001] The utility model relates to the technical field of semiconductor aging test, concretely to a semiconductor device sorting device based on aging test. BACKGROUND

[0002] The sorting of semiconductor devices is an important link in the semiconductor manufacturing process, and needs to be screened and classified to ensure that its quality and performance meet the design requirements. With the continuous development of semiconductor technology, the sorting requirements of semiconductor devices are becoming higher and higher, and a more efficient and accurate sorting process needs to be realized. Aging test is an important means to evaluate the performance and stability of semiconductor devices. By simulating the high temperature, high humidity and other conditions in the actual working environment, the aging process of semiconductor devices is accelerated, so as to evaluate its performance and stability within the service life. Aging test is of great significance to ensure the reliability and service life of semiconductor devices.

[0003] The Chinese patent with publication number CN209198610U discloses a device supporting high-temperature aging test of semiconductor devices, which includes a tested unit and a backboard. The tested unit and the backboard are connected and placed in a high-temperature box. The backboard is provided with a first air pipe and a second air pipe. The tested unit includes a PCB board, an ATE single board, a DUT, and a heat insulation cavity. The DUT is located on the top surface of the PCB board. The ATE single board is connected with the bottom surface of the PCB board. The heat insulation cavity is connected with the bottom surface of the PCB board. The ATE single board is located inside the heat insulation cavity. The heat insulation cavity is provided with an air inlet and an air outlet. The air inlet is connected with the first air pipe, and the air outlet is connected with the second air pipe.

[0004] The existing technical solution in the above has the following defects: the patent mainly describes the structure and function of the high-temperature aging test device, but does not mention how to effectively sort semiconductor devices before testing. Sorting is a key step to ensure the accuracy and efficiency of testing, as it can pre-screen potential defective devices to avoid wasting time and resources during testing.

[0005] Therefore, we propose a semiconductor device sorting device based on aging test to solve the above problems. UTILITY MODEL CONTENTS

[0006] The utility model aims at providing a semiconductor device sorting device based on aging test to solve the problem of no sorting of semiconductor devices mentioned in the background technology.

[0007] To achieve the above object, the utility model provides following technical scheme: a kind of semiconductor device sorting device based on aging test, including workbench, support seat is arranged on the left side of workbench upper side, conveying belt is arranged in support seat, sorting mechanism is arranged on the upper side of conveying belt, and the sorting mechanism includes pre-screening unit and test sorting unit;

[0008] The pre-screening unit includes bracket two, infrared detector two, electric push rod two, push block, groove and distribution plate, the bracket two is fixedly connected to the left side of the upper side of the workbench, the infrared detector two is arranged on the bottom surface of bracket two, the groove is opened on the front of support seat, the distribution plate is connected to the groove, the electric push rod two is connected to the front of bracket two below, and the output end of the electric push rod two is connected to the push block.

[0009] Preferably, the test sorting unit includes connecting frame, heating box, fan, air supply pipe, heating rod, exhaust plate, bracket one and infrared detector one, the connecting frame is fixedly connected to the upper side of the conveying belt, the heating box bottom is fixedly connected to the connecting frame, the fan is arranged on the top surface of the heating box, one end of the air supply pipe is connected to the air outlet of the fan, the other end of the air supply pipe is connected to the inside of the heating box, the heating rod is fixedly connected to the inside of the heating box, the exhaust plate is opened on the bottom of the heating box and extends downward through the connecting frame, the bracket one is fixedly connected to the right side of the connecting frame, and the infrared detector one is arranged below the bracket one.

[0010] Preferably, the conveying belt right side is fixedly connected with distribution disc, the distribution disc outer side is fixedly connected with fixed seat, the fixed seat back surface is fixedly connected with electric push rod one, the output end of the electric push rod one is connected to connecting piece, the connecting piece is connected to one end of baffle, the other end of the baffle is rotatably connected to the middle part of distribution disc through rotating shaft, the baffle moves on the distribution disc by electric push rod one, and automatic distribution and guidance of semiconductor device are realized.

[0011] Preferably, the distribution disc is Y-shaped, and the Y-shaped distribution disc design makes semiconductor device flow more smoothly in the sorting process, reduces the possibility of blockage and accumulation.

[0012] Preferably, the electric push rod one and the electric push rod two are electrically connected with an external power supply and a control system to realize automatic control and precise operation, automatically adjust the action of the electric push rod according to the detection result of the infrared detector, thereby realizing rapid and accurate sorting of the semiconductor device, and greatly improving the intelligent level of the sorting device through the automatic control and precise operation of the electric push rod. The real-time detection result of the infrared detector can automatically trigger the action of the electric push rod, thereby realizing rapid and accurate sorting of the semiconductor device, and improving the production efficiency and quality stability.

[0013] Preferably, the heating rod has two groups, and each group has a plurality of heating rods uniformly arranged in the heating box, thereby improving the heating efficiency and temperature uniformity of the heating box. This helps to ensure that the semiconductor device is uniformly heat-treated during the aging test, thereby improving the accuracy and reliability of the test.

[0014] Preferably, the exhaust plate has a cavity inside, which helps to enhance the exhaust effect and improve the circulation speed of the gas in the heating box, which helps to quickly exhaust the heated gas, thereby further improving the accuracy and reliability of the aging test.

[0015] Compared with the prior art, the semiconductor device sorting device based on aging test has the following beneficial effects:

[0016] 1. The semiconductor device sorting device based on aging test, through the design of the bracket two and the infrared detector two, adjusts the position of the push block according to the detection result of the infrared detector two, and pushes out the semiconductor device that does not meet the requirements from the conveying belt, thereby pre-selecting potential defective devices and avoiding wasting time and resources during the test.

[0017] 2. The semiconductor device sorting device based on aging test, by integrating the heating box, the fan, the air supply pipe and the heating rod and other components, an efficient aging test environment is constructed, which can quickly raise and maintain the temperature in the heating box, meet the temperature conditions required by the semiconductor device aging test, and ensure the accuracy and reliability of the test. BRIEF DESCRIPTION OF DRAWINGS

[0018] Figure 1 It is a schematic view of the overall right side structure of the utility model;

[0019] Figure 2 It is a schematic view of the overall top structure of the utility model;

[0020] Figure 3 It is a schematic view of the heating test structure of the utility model;

[0021] Figure 4 It is a schematic view of the overall right side structure of the utility model;

[0022] Figure 5 It is the whole left side structure schematic view of the utility model.

[0023] In the figure: 1 workbench, 2 support seat, 201 recess, 202 distribution board, 3 conveyor belt, 4 support one, 401 infrared detector one, 5 connecting frame, 6 distribution tray, 601 fixed base, 602 electric push rod one, 603 connecting piece, 604 baffle, 701 support two, 702 infrared detector two, 703 electric push rod two, 704 push block, 8 heating box, 801 fan, 802 air supply pipe, 803 heating rod, 804 exhaust baffle. DETAILED DESCRIPTION

[0024] The technical solutions in the embodiments of the utility model will be clearly and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by those skilled in the art without creative labor belong to the protection scope of the utility model.

[0025] Please refer to Figures 1-5 The utility model provides a technical scheme: Embodiment one:

[0026] A semiconductor device sorting device based on aging test, including workbench 1, workbench 1 top left side is provided with support seat 2, workbench 1 is as the basis of whole sorting device, has provided stable support and operating platform. Support seat 2 inside is provided with conveyor belt 3, is used for conveying semiconductor device, ensures that device can smoothly, continuously enter sorting mechanism. Conveyor belt 3 top is provided with sorting mechanism, and sorting mechanism includes pre-screening unit;

[0027] The pre-screening unit comprises a bracket two 701, an infrared detector two 702, an electric push rod two 703, a push block 704, a groove 201 and a distribution plate 202. The bracket two 701 is fixedly connected to the upper left side of the workbench 1, and provides a stable mounting position for the infrared detector two 702 and the electric push rod two 703. The infrared detector two 702 is arranged on the bottom surface of the bracket two 701, and is used to detect the semiconductor devices on the conveying belt 3, identify the size, position or whether there is a defect, etc. The groove 201 is opened on the front surface of the support seat 2, and the distribution plate 202 is connected to the groove 201. The electric push rod two 703 is connected to the front surface below the bracket two 701. According to the detection result of the infrared detector two 702, the position of the push block 704 is automatically adjusted, and the semiconductor devices that do not meet the requirements are pushed out of the conveying belt 3, so as to realize preliminary screening. The output end of the electric push rod two 703 is connected to the push block 704. The electric push rod one 602 and the electric push rod two 703 are electrically connected with an external power supply and a control system, so as to realize automatic control and accurate operation. According to the detection result of the infrared detector, the action of the electric push rod is automatically adjusted, so as to realize fast and accurate sorting of the semiconductor devices. Embodiment two:

[0028] On the basis of embodiment one, the sorting mechanism further comprises a test sorting unit, the test sorting unit comprising a connecting frame 5, a heating box 8, a fan 801, a air supply pipe 802, a heating rod 803, an exhaust plate 804, a bracket one 4 and an infrared detector one 401, the connecting frame 5 being fixedly connected to the upper two sides of the conveying belt 3, and being fixedly connected to the upper two sides of the conveying belt 3 to provide a stable mounting position for the heating box 8, the fan 801 and other components. The bottom of the heating box 8 is fixedly connected to the connecting frame 5, the fan 801 is arranged on the top surface of the heating box 8, one end of the air supply pipe 802 is connected to the air outlet of the fan 801, the other end of the air supply pipe 802 is connected to the inside of the heating box 8, the heating rod 803 is fixedly connected to the inside of the heating box 8, and the heating rod 803 has two groups, each group having a plurality of heating rods evenly arranged in the inside of the heating box 8, which are used to simulate the aging environment of semiconductor devices and perform temperature testing. The exhaust plate 804 is opened at the bottom of the heating box 8 and extends downward through the connecting frame 5, and the inside of the exhaust plate 804 is a cavity. The bracket one 4 is fixedly connected to the right side of the connecting frame 5, and the infrared detector one 401 is arranged below the bracket one 4, which is used to monitor the state of the semiconductor devices in real time during the aging test process, such as temperature change, performance stability, etc. The conveying belt 3 is fixedly connected with a distribution tray 6 on the right side, the distribution tray 6 is fixedly connected with a fixed seat 601 on the outside, the fixed seat 601 is fixedly connected with an electric push rod one 602 on the back, the output end of the electric push rod one 602 is connected with a connecting piece 603, the connecting piece 603 is connected with one end of a baffle 604, and the other end of the baffle 604 is rotationally connected with the middle part of the distribution tray 6 through a rotating shaft. The distribution tray 6 is Y-shaped, and together forms an automatic distribution mechanism. The electric push rod one 602 drives the baffle 604 to move on the distribution tray 6, and according to the test results, the semiconductor devices are guided to different collection positions to realize automatic sorting.

[0029] Working principle: when the semiconductor devices are placed on the conveying belt 3, they will move smoothly and continuously forward. The infrared detector two 702 will monitor the semiconductor devices on the conveying belt 3 in real time, identify their size, position and whether there are defects. Once the semiconductor devices that do not meet the requirements are detected, the infrared detector two 702 will send a signal to the control system. The control system will then drive the electric push rod two 703 to act, and the unqualified semiconductor devices will be pushed out of the conveying belt 3 by the push block 704 to realize preliminary screening.

[0030] After the pre-screening unit, the semiconductor devices continue to move along the conveying belt 3 to the test sorting unit. In the test sorting unit, the semiconductor devices are sent into the heating box 8, and the heating rods 803 inside the heating box 8 simulate the aging environment to test the temperature of the semiconductor devices. At the same time, the fan 801 sends air into the heating box 8 through the air supply pipe 802 to ensure that the temperature in the box is evenly distributed. The infrared detector 401 monitors the state of the semiconductor devices in the aging test process in real time, such as temperature change, performance stability, etc. After the test is completed, the semiconductor devices are sent out of the heating box 8 and continue to move along the conveying belt 3 to the distribution tray 6. At this time, the electric push rod 602 drives the baffle 604 to move on the distribution tray 6 according to the test results, guides the semiconductor devices to different collection positions, and realizes automatic sorting.

[0031] It should be noted that the relational terms herein, such as first and second, are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any such actual relationship or order between such entities or actions. Moreover, the terms "comprises", "comprising", or any other variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but can also include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without more limitations, an element defined by the statement "comprising a..." does not exclude the existence of additional identical elements in the process, method, article, or apparatus that includes the element.

Claims

1. A device for sorting semiconductor devices based on aging tests, comprising a worktable (1), characterized in that: The left side of the workbench (1) is provided with a support seat (2), the inside of the support seat (2) is provided with a conveyor belt (3), the top of the conveyor belt (3) is provided with a sorting mechanism, the sorting mechanism comprises a pre-screening unit and a test sorting unit; The pre-screening unit comprises a bracket two (701), an infrared detector two (702), an electric push rod two (703), a push block (704), a groove (201) and a distribution plate (202), the bracket two (701) is fixedly connected to the top left side of the workbench (1), the infrared detector two (702) is arranged on the bottom surface of the bracket two (701), the groove (201) is formed on the front surface of the support seat (2), the distribution plate (202) is connected to the groove (201), the electric push rod two (703) is connected to the front surface below the bracket two (701), and the output end of the electric push rod two (703) is connected to the push block (704).

2. A semiconductor device sorting apparatus based on aging test according to claim 1, wherein: The test sorting unit comprises a connecting frame (5), a heating box (8), a fan (801), a air supply pipe (802), a heating rod (803), an exhaust plate (804), a bracket one (4) and an infrared detector one (401), the connecting frame (5) is fixedly connected to the top of the conveyor belt (3), the bottom of the heating box (8) is fixedly connected to the connecting frame (5), the fan (801) is arranged on the top surface of the heating box (8), one end of the air supply pipe (802) is connected to the air outlet of the fan (801), the other end of the air supply pipe (802) is connected to the inside of the heating box (8), the heating rod (803) is fixedly connected to the inside of the heating box (8), the exhaust plate (804) is formed on the bottom of the heating box (8) and extends downwardly through the connecting frame (5), the bracket one (4) is fixedly connected to the right side of the connecting frame (5), and the infrared detector one (401) is arranged below the bracket one (4).

3. The semiconductor device sorting apparatus based on aging test of claim 1, wherein: The right side of the conveyor belt (3) is fixedly connected with a distribution disc (6), the outer side of the distribution disc (6) is fixedly connected with a fixing seat (601), the back surface of the fixing seat (601) is fixedly connected with an electric push rod one (602), the output end of the electric push rod one (602) is connected to a connecting piece (603), one end of the connecting piece (603) is connected to a baffle (604), and the other end of the baffle (604) is rotationally connected to the middle part of the distribution disc (6) through a rotating shaft.

4. The semiconductor device sorting apparatus based on aging test of claim 3, wherein: The distribution disc (6) is Y-shaped.

5. The semiconductor device sorting apparatus based on aging test of claim 3, wherein: The electric push rod one (602) and the electric push rod two (703) are electrically connected with an external power supply and a control system.

6. The semiconductor device sorting apparatus based on aging test of claim 2, wherein: The heating rod (803) has two groups, and each group has a plurality of heating rods arranged uniformly in the inside of the heating box (8).

7. The semiconductor device sorting apparatus based on aging test of claim 2, wherein: The inside of the exhaust plate (804) is a cavity.

Images