Instrument rapid test system

Abstract

The utility model discloses an instrument rapid test system, which comprises a master control module, a signal modulation module and a power supply module, the master control module is used for receiving an instruction of a user and sending a control instruction to the signal modulation module, and the signal modulation module communicates with an instrument through a CAN communication line based on the instruction sent by the master control module. The power module supplies power to the instrument; the test based on the modules comprises the following steps: setting fault codes and control parameters for different fault lamps and writing the fault codes and the control parameters into a memory, reading the fault codes and the control parameters from the memory by a microcontroller, lightening the corresponding fault lamps, controlling a timer to start timing, and generating an interruption when the timer reaches a preset time interval; the microcontroller responds to the interruption of the timer, turns off the fault lamp and executes the operation of turning on the next fault lamp; the above process is repeated, and timing lighting of all fault lamps is achieved. The fault lamp triggering condition of the whole vehicle can be simulated, the lightening duration of the indicator lamp can be controlled, the numerical value of a triggering interval and lightening detection of the indicator lamp can be better simulated, and therefore better instrument and vehicle matching design is achieved.

Description

TECHNICAL FIELD

[0001] The utility model relates to the field of instrument test, especially a kind of instrument rapid test system. BACKGROUND

[0002] Instrument is one of the key electrical devices for displaying user vehicle information, and left and right turn signals and high beam are hard-wire controlled, and other fault light signals such as water temperature signal and oil pressure signal are sent through CAN communication line, so when instrument fault indicator light test is carried out, instrument is directly mounted on the vehicle, and the state of the vehicle is adjusted to control whether the fault alarm light on the instrument is on or off. This way of testing the instrument directly connected to the vehicle has low flexibility, is not convenient to operate, and the test operation of confirming the state of the instrument indicator light by controlling the state of the vehicle also causes damage to the vehicle to some extent. Therefore, a scheme for testing the instrument fault indicator light is urgently needed. SUMMARY

[0003] The utility model aims at providing a kind of instrument rapid test system, which can test the instrument fault light conveniently away from the vehicle.

[0004] Technical scheme: To achieve the above purpose, the utility model discloses an instrument rapid test system, which comprises a main control module, a signal modulation module and a power module. The main control module is used to receive user's instructions and send control instructions to the signal modulation module. The signal modulation module communicates with the instrument through CAN communication line based on the instructions sent by the main control module. The power module supplies power to the instrument.

[0005] The signal modulation module comprises a microcontroller, a memory and a timer. The memory is used to store the corresponding codes and control parameters of each fault light at the time of lighting written by the user through the main control module. The microcontroller reads the fault codes and control parameters from the memory according to the instructions to determine the lighting time and duration of the fault light, and then controls the state of the instrument fault light. The timer is used to control the duration of the fault light state.

[0006] The microcontroller communicates with the instrument through CAN communication line to control the state of the instrument fault light.

[0007] The control parameters include the lighting sequence, lighting duration and lighting frequency of each fault light.

[0008] The microcontroller comprises a plurality of parallel signal output ports to simultaneously communicate with multiple instruments synchronously.

[0009] The fault indicator light of the instrument includes engine fault light, oil pressure light, water temperature light and ABS indicator light.

[0010] The power module comprises a power supply manager for controlling output voltage and current of the power supply.

[0011] Beneficial effects: The system can test the instrument fault light independently of the whole vehicle, is simple and convenient to operate, can test multiple instruments at the same time through the setting of multiple communication ports, greatly improves the test efficiency, especially in a large-batch instrument production environment, and has wide applicability. BRIEF DESCRIPTION OF DRAWINGS

[0012] Figure 1 is a test system working principle framework diagram;

[0013] Figure 2 is a test flowchart. DETAILED DESCRIPTION

[0014] The technical scheme of the utility model will be described in detail below in combination with embodiments and drawings.

[0015] As shown in Figure 1 , 2 The instrument rapid test system comprises a main control module, a signal modulation module and a power module, wherein the main control module is used for receiving instructions of a user and sending control instructions to the signal modulation module, the signal modulation module is used for receiving instructions of a user and communicating with an instrument through a CAN communication line, and the power module supplies power to the instrument.

[0016] The signal modulation module comprises a microcontroller, a memory and a timer, the memory is used for storing corresponding codes and control parameters of each fault light at the time of lighting of the fault light written by a user through the main control module, the control parameters comprise lighting sequence, time length, single lighting frequency (such as 3 times of continuous lighting, each lighting time is 1s, and the interval is 1s) and the like of each fault light, the microcontroller reads the fault codes and control parameters from the memory according to the instructions, determines the lighting time and duration of the fault light, and controls the lighting of the fault light through the CAN communication line, and the timer is used for controlling the lighting time length of the fault light and can support multiple timing modes such as single timing and periodic timing to meet different test requirements.

[0017] In this embodiment, the microcontroller comprises multiple parallel signal output ports to simultaneously test multiple instruments synchronously. The device applied to the system can be applied in an instrument test room to light all fault lights in a single instrument in sequence for a fixed time length or light all fault lights simultaneously for a fixed time length, and can also synchronously light all fault lights in multiple instruments in sequence for a fixed time length or light all fault lights simultaneously for a fixed time length and the like.

[0018] CAN communication line includes two signal lines CANH and CANL, CANH and CANL signal lines transmit data by using differential signals, and usually adopt the form of twisted pair, so that the reliability of data transmission can be improved and the influence of electromagnetic interference can be reduced.

[0019] The fault indicator of the instrument includes an engine fault light, an oil pressure light, an over-temperature light, and an ABS indicator light, etc.

[0020] In the embodiment, the power module further includes a power manager for controlling the output voltage and current of the power supply to meet the power requirements of different instruments, and further regulating the brightness when the fault light is lit. The power module also includes multiple power supply ports, which can simultaneously supply power to multiple instruments.

[0021] In the embodiment, a first instrument testing method based on the above system is provided:

[0022] 1. Set fault codes and control parameters for different fault lights, including the fixed time length of lighting all fault lights in order, and write them into the memory of the signal modulation module through the main control module;

[0023] 2. The user sends a test instruction to the microcontroller through the main control module, the microcontroller reads the fault code from the memory, lights the corresponding fault light, and controls the timer to start timing. When the predetermined time interval is reached, an interrupt is generated;

[0024] 3. The microcontroller responds to the timer interrupt, turns off the fault light, and executes the operation of lighting the next fault light;

[0025] 4. The microcontroller repeats the above process to realize the timed lighting of all fault lights.

[0026] In the embodiment, a second instrument testing method based on the above system is provided:

[0027] 1. Set fault codes and control parameters for different fault lights, including the fixed time length of lighting all fault lights at the same time, and write them into the memory of the signal modulation module through the main control module;

[0028] 2. The user sends a test instruction to the microcontroller through the main control module, the microcontroller reads the fault code from the memory, lights all the fault lights, and controls the timer to start timing. When the predetermined time interval is reached, an interrupt is generated;

[0029] 3. The microcontroller responds to the timer interrupt and turns off all the fault lights.

[0030] The system can further set a temperature simulation interval, for example, a water temperature signal, and test the normal working condition of the instrument water temperature signal lamp through the receiving code adjustment of the temperature.

[0031] According to the regulation requirement when the high beam / overpassing light is lighted, the instrument should have information prompt of the light lighting, the device can simulate the high beam opening state or the overpassing light in the riding state to test the service life and response speed of the instrument indicating lamp through the multi-frequency lighting of the indicating lamp, and the service life of the indicating lamp can be tested through the multi-frequency test of the timer.

[0032] The system and the measurement method solve the condition that the instrument fault light needs to be connected with the whole vehicle for measurement in the prior art, the measurement of the whole vehicle has certain risk, and there is the possibility of destructive test, so the triggering condition of the fault light of the whole vehicle and the lighting duration of the control indicating lamp can be simulated, the value of the triggering interval and the lighting detection of the indicating lamp are better simulated, and therefore better instrument and vehicle cooperation design is achieved.

Claims

1. A rapid instrument testing system, characterized in that, The system includes a main control module, a signal modulation module, and a power supply module. The main control module receives user commands and sends control commands to the signal modulation module. The signal modulation module communicates with the instrument via a CAN communication line based on the commands sent by the main control module. The power supply module supplies power to the instrument. The signal modulation module includes a microcontroller, a memory, and a timer. The memory stores the corresponding codes and control parameters for each fault light that the user writes through the main control module. The microcontroller reads the fault codes and control parameters from the memory according to the user's commands, determines the timing and duration of the fault light's illumination, and thus controls the state of the instrument's fault lights. The timer controls the duration of the fault light's state.

2. The rapid instrument testing system according to claim 1, characterized in that, The microcontroller communicates with the instrument via a CAN communication line, thereby controlling the status of the instrument's fault indicator.

3. The rapid instrument testing system according to claim 1, characterized in that, The control parameters include the lighting sequence, lighting duration, and lighting frequency of each fault lamp.

4. The rapid instrument testing system according to claim 1, characterized in that, The microcontroller includes multiple parallel signal output ports to communicate synchronously with multiple instruments simultaneously.

5. The rapid instrument testing system according to claim 1, characterized in that, The instrument's fault indicator lights include the engine fault light, oil pressure light, high water temperature light, and ABS indicator light.

6. The rapid instrument testing system according to claim 1, characterized in that, The power module includes a power manager for controlling the output voltage and current of the power supply.

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