Field effect transistor chip test fixture with appearance damage prevention structure

Abstract

The utility model discloses a field effect transistor chip test fixture with an appearance damage prevention structure, and relates to the technical field of chip test fixtures, the field effect transistor chip test fixture comprises a placing table, the top of the placing table is provided with a bearing plate, and the top of the bearing plate is provided with a chip body; a clamping assembly used for fixing a chip body is arranged in the placement table, the clamping assembly comprises an electric push rod fixedly connected in the placement table, a placement groove is formed in the placement table, and two fixing rods are fixedly connected in the placement groove. According to the field effect transistor chip test fixture with the appearance damage prevention structure, the bearing plate is pulled out, the chip body is placed on the bearing plate and pushed back, then the electric push rod is started, the two clamping plates move oppositely, the chip body is clamped and fixed, and therefore manual contact with the chip body for clamping is not needed, and the working efficiency is improved. The chip body is prevented from deviating in the clamping process, and the buffer pad is arranged on one side of the clamping plate, so that the appearance of the chip body can be protected.

Description

TECHNICAL FIELD

[0001] The utility model relates to chip test fixture technical field, concretely is a field effect transistor chip test fixture with appearance prevent losing structure. BACKGROUND

[0002] In the chip production and manufacturing process, it needs to carry out strict performance test, and the field effect transistor chip size is often small, pin fine, the requirement to test precision, operating environment is higher, manual test can hardly realize efficient, accurate detection, thereby needing special test fixture to assist to complete test work, and the clamping plate in the test fixture, if lack of elasticity and buffer performance on the side of adhering with the chip, very easy to leave mark on the chip surface, cause chip surface wear, scratch and the like.

[0003] In order to overcome above-mentioned defect, prior art (application number CN202321762389.4, application date is July 6, 2023 of Chinese patent) a kind of package chip test fixture, the output end of pneumatic cylinder pushes rack one to the direction away from pneumatic cylinder, drives gear one positive rotation, drives gear two synchronous positive rotation by pivot, gear two drives the two rack two meshing with it to the both sides of placement slot moves, by support plate drives clamping arm to the chip direction moves, by sponge head protection clamping arm clamps the side of chip, since the speed of the rack two on both sides moves is same, so that chip is always clamped at the center position of placement slot, it is convenient to clamp different size chips, use more convenient.

[0004] Although the prior art can clamp chip, since the size of field effect transistor chip is small, pin fine, it is difficult to place, when directly clamping chip by hand, it is easy to cause the position of chip to shift, not only will cause damage to its appearance, also will affect the accuracy of test result. UTILITY MODEL CONTENTS

[0005] The utility model aims at providing a kind of field effect transistor chip test fixture with appearance prevent losing structure to solve the problem that it is easy to cause the position of chip to shift when directly clamping chip by hand in the above background art, not only will cause damage to its appearance, also will affect the accuracy of test result.

[0006] To achieve the above object, the utility model provides following technical scheme: A field effect transistor chip test fixture with appearance prevent loss structure, including the rest platform, the top of rest platform is installed with the bearing plate, the top of bearing plate is provided with the chip body, the rest platform is provided with the clamping assembly for fixing the chip body, the clamping assembly includes the electric push rod fixedly connected in the rest platform, the rest platform is opened in the installation groove, two fixed rods are fixedly connected in the installation groove, the outer wall of fixed rod is connected with two symmetrical moving blocks slidingly, and the telescopic end of electric push rod is fixedly connected with the side wall of moving block, the top of moving block is fixedly connected with the clamping plate, the bottom wall of installation groove is fixedly connected with the support column, the top of support column is rotatably connected with the connecting plate, the top of connecting plate is rotatably connected with two symmetrical rotary rods, and the end of rotary rod away from connecting plate is rotatably connected on the top of moving block, the top of bearing plate is provided with the positioning assembly for positioning the chip body.

[0007] Further, the positioning assembly includes an installation shell fixedly connected to the top of the bearing plate, a sliding cavity is formed in the installation shell, a connecting block is slidably connected inside the sliding cavity, a plurality of springs are fixedly connected to the bottom of the connecting block, one end of each spring away from the connecting block is fixedly connected to the inner wall of the sliding cavity, and two positioning plates are slidably connected to the top of the connecting block.

[0008] Further, the bottom of the bearing plate is fixedly connected with two symmetrical guide blocks, and the outer wall of the guide block is slidably connected to the inside of the rest platform.

[0009] Further, the bottom of the bearing plate is fixedly connected with a sliding block, and a sliding groove is formed in the rest platform, and the outer wall of the sliding block is slidably connected inside the sliding groove.

[0010] Further, a plurality of evenly distributed threaded holes are formed in the top of the connecting block, a bolt is provided on the top of the positioning plate, and one end of the bolt penetrates through the positioning plate and is threadedly connected inside the threaded hole.

[0011] Further, a limiting block is fixedly connected to each side of the connecting block, and the outer wall of the limiting block is slidably connected inside the sliding cavity.

[0012] Further, a buffer pad is fixedly connected to the side of the clamping plate and the positioning plate close to the chip body, the buffer pad is tightly attached to the outer wall of the chip body, and the material of the buffer pad is rubber.

[0013] Compared with the prior art, the utility model has the advantages of:

[0014] (1) The field effect tube chip test fixture with appearance damage prevention structure, by pulling out the bearing plate, the chip body can be placed on the bearing plate, after pushing back, by starting the electric push rod, the two clamping plates can move towards each other, clamping and fixing the chip body, so that manual contact with the chip body is not needed for clamping, preventing the chip body from shifting during clamping, and by setting the buffer pad on one side of the clamping plate, the appearance of the chip body can be protected.

[0015] (2) The field effect tube chip test fixture with appearance damage prevention structure, by setting the mounting shell, the connecting block, the two positioning plates and the plurality of springs, after the chip body is placed on the bearing plate, the chip body can be preliminarily positioned, preventing it from shifting during pushing back, and by rotating the two bolts, after releasing the fixation of the two positioning plates, the spacing between the two positioning plates can be adjusted, and different size chip bodies can be positioned. BRIEF DESCRIPTION OF DRAWINGS

[0016] Figure 1 It is a structure schematic view of the utility model places the table and chip body;

[0017] Figure 2 It is a structure schematic view of the utility model bearing plate and positioning plate;

[0018] Figure 3 It is a structure schematic view of the utility model moving block and clamping plate;

[0019] Figure 4 It is a structure schematic view of the utility model bearing plate and sliding block;

[0020] Figure 5 It is a structure schematic view of the utility model connecting block and mounting shell;

[0021] Figure 6 It is a structure schematic view of the utility model positioning plate and connecting block.

[0022] In the drawing: 1, placing table; 2, chip body; 3, bearing plate; 4, handle; 5, mounting shell; 6, connecting block; 7, threaded hole; 8, positioning plate; 9, installation groove; 10, moving block; 11, fixed rod; 12, clamping plate; 13, guide block; 14, electric push rod; 15, support column; 16, connecting plate; 17, rotating rod; 18, buffer pad; 19, sliding slot; 20, sliding block; 21, sliding cavity; 22, limiting block; 23, spring; 24, bolt. DETAILED DESCRIPTION

[0023] With reference to the drawings of the embodiments of the present application, the technical solutions in the embodiments of the present application will be described clearly and completely. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments of the present application, all the other embodiments obtained by those skilled in the art without creative labor fall within the scope of the present application.

[0024] Embodiment one: please refer to Figures 1-6 The utility model provides the following technical scheme: a field effect transistor chip test fixture with appearance prevent loss structure, including placing table 1, the top of placing table 1 is installed with bearing plate 3, the top of bearing plate 3 is provided with chip body 2, the bottom of bearing plate 3 is fixedly connected with two symmetrical guide block 13, and the outer wall of guide block 13 is slidably connected with the inside of placing table 1, and the front side of bearing plate 3 is fixedly connected with handle 4, the bottom of bearing plate 3 is fixedly connected with sliding block 20, and the inside of placing table 1 is provided with sliding slot 19, and the outer wall of sliding block 20 is slidably connected in the inside of sliding slot 19.

[0025] When the chip body 2 needs to be tested, the bearing plate 3 can be pulled out of the placing table 1 by pulling the handle 4, at this time, the chip body 2 is placed on the bearing plate 3 and pushed back, and the chip body 2 can be preliminarily positioned by the positioning assembly, so as to prevent deviation caused by movement during pushing back, so that manual contact with the chip body 2 for clamping is not needed, the chip body 2 is prevented from shifting during clamping, the accuracy of the test result is ensured, the two guide blocks 13 can make the bearing plate 3 more stable when being pulled out and pushed back, and the bearing plate 3 can be prevented from sliding out of the placing table 1 by the sliding block 20 and the sliding slot 19.

[0026] Embodiment two:

[0027] On the basis of embodiment one, by setting the clamping assembly, the chip body 2 can be clamped and fixed after the bearing plate 3 is pushed back, and the specific structure is as follows: the placing table 1 is provided with a clamping assembly for fixing the chip body 2, the clamping assembly comprises a electric push rod 14 fixedly connected in the placing table 1, a placing groove 9 is opened in the placing table 1, two fixed rods 11 are fixedly connected in the placing groove 9, two symmetrical moving blocks 10 are slidably connected to the outer wall of the fixed rod 11, and the extension end of the electric push rod 14 is fixedly connected to the side wall of the moving block 10, the top of the moving block 10 is fixedly connected with a clamping plate 12, the bottom wall of the placing groove 9 is fixedly connected with a supporting column 15, the top of the supporting column 15 is rotatably connected with a connecting plate 16, the top of the connecting plate 16 is rotatably connected with two symmetrical rotating rods 17, and the end of the rotating rod 17 away from the connecting plate 16 is rotatably connected to the top of the moving block 10, and the top of the bearing plate 3 is provided with a positioning assembly for positioning the chip body 2; the side of the clamping plate 12 and the positioning plate 8 close to the chip body 2 is fixedly connected with a buffer pad 18, and the buffer pad 18 is tightly attached to the outer wall of the chip body 2, and the material of the buffer pad 18 is rubber.

[0028] When the bearing plate 3 is pushed back, the extension end is retracted by starting the electric push rod 14, and the moving block 10 is driven to move inward, and the rotating rod 17 rotatably connected to the moving block 10 is driven to rotate, and the positioning of the connecting plate 16 is cooperated with the positioning of the supporting column 15, the connecting plate 16 is driven to rotate, so that the two moving blocks 10 on the fixed rod 11 are driven to move inward synchronously, and the two clamping plates 12 are driven to move inward synchronously, and the chip body 2 is clamped and fixed, and the buffer pad 18 is provided on the side of the clamping plate 12 in contact with the chip body 2, and the material is rubber, so that the chip body 2 can be clamped and fixed at the same time, and has certain elasticity and buffer, which can prevent the appearance of the chip body 2 from being damaged.

[0029] Embodiment three:

[0030] On the basis of embodiment two, by setting the positioning assembly, the chip body 2 can be prevented from being offset when the bearing plate 3 is pushed back, and the specific structure is as follows: the positioning assembly comprises an installation shell 5 fixedly connected to the top of the bearing plate 3, a sliding cavity 21 is opened in the installation shell 5, a connecting block 6 is slidably connected in the sliding cavity 21, a plurality of springs 23 are fixedly connected to the bottom of the connecting block 6, and the end of the spring 23 away from the connecting block 6 is fixedly connected to the inner wall of the sliding cavity 21, and the top of the connecting block 6 is slidably connected with two positioning plates 8; a plurality of evenly distributed threaded holes 7 are opened in the top of the connecting block 6, a screw 24 is provided on the top of the positioning plate 8, and one end of the screw 24 penetrates the positioning plate 8 and is threadedly connected in the inside of the threaded hole 7; the two sides of the connecting block 6 are fixedly connected with a limiting block 22, and the outer wall of the limiting block 22 is slidably connected in the inside of the sliding cavity 21.

[0031] Before placing the chip body 2, the two positioning plates 8 are pushed upward, and the connecting blocks 6 are moved upward, so that the plurality of springs 23 are stretched under the action of force, when the chip body 2 is placed on the bearing plate 3, under the action of the plurality of springs 23, the two positioning plates 8 can always be pressed on the upper surface of the chip body 2, the chip body 2 is preliminarily positioned, at the same time, the buffer pad 18 at the bottom of the positioning plate 8 can prevent damage to the appearance of the upper surface of the chip body 2, by rotating the two bolts 24, the fixation of the two positioning plates 8 can be released, and the distance between the two positioning plates 8 can be adjusted according to the size of the chip body 2, finally, the two bolts 24 are threaded into the corresponding threaded holes 7 through the positioning plates 8, and the two positioning plates 8 are fixed.

[0032] The contents not described in detail in the specification belong to the prior art known to those skilled in the art.

[0033] Although the utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions recorded in the foregoing embodiments, or make equivalent replacement to part of the technical features, any modification, equivalent replacement, improvement, etc. within the spirit and principles of the utility model should be included in the protection scope of the utility model.

Claims

1. A field effect tube chip test fixture with appearance damage prevention structure, comprising a placement table (1), a bearing plate (3) is mounted on the top of the placement table (1), and a chip body (2) is arranged on the top of the bearing plate (3). characterized in that A clamping assembly for fixing the chip body (2) is arranged in the placement table (1), the clamping assembly comprises an electric push rod (14) fixedly connected in the placement table (1), a placing groove (9) is formed in the placement table (1), two fixed rods (11) are fixedly connected in the placing groove (9), two symmetrical moving blocks (10) are slidably connected to the outer wall of the fixed rods (11), the telescopic end of the electric push rod (14) is fixedly connected to the side wall of the moving block (10), a clamping plate (12) is fixedly connected to the top of the moving block (10), a supporting column (15) is fixedly connected to the bottom wall of the placing groove (9), a connecting plate (16) is rotatably connected to the top of the supporting column (15), two symmetrical rotating rods (17) are rotatably connected to the top of the connecting plate (16), and one end of the rotating rod (17) away from the connecting plate (16) is rotatably connected to the top of the moving block (10), and a positioning assembly for positioning the chip body (2) is arranged on the top of the bearing plate (3).

2. The field effect die test fixture having an appearance protection structure according to claim 1, wherein: The positioning assembly comprises a mounting shell (5) fixedly connected to the top of the bearing plate (3), a sliding cavity (21) is formed in the mounting shell (5), a connecting block (6) is slidably connected to the inside of the sliding cavity (21), a plurality of springs (23) are fixedly connected to the bottom of the connecting block (6), one end of the spring (23) away from the connecting block (6) is fixedly connected to the inner wall of the sliding cavity (21), and two positioning plates (8) are slidably connected to the top of the connecting block (6).

3. The field effect die test fixture having an appearance protection structure according to claim 1, wherein: The bottom of the bearing plate (3) is fixedly connected with two symmetrical guide blocks (13), the outer wall of the guide block (13) is slidably connected to the inside of the placement table (1), and the front side of the bearing plate (3) is fixedly connected with a handle (4).

4. The field effect die test fixture having an appearance protection structure according to claim 3, wherein: The bottom of the bearing plate (3) is fixedly connected with a sliding block (20), and the placement table (1) is provided with a sliding groove (19), and the outer wall of the sliding block (20) is slidably connected in the sliding groove (19).

5. The field effect die test fixture having an appearance protection structure according to claim 2, wherein: A plurality of uniformly distributed threaded holes (7) are formed in the top of the connecting block (6), a bolt (24) is arranged on the top of the positioning plate (8), and one end of the bolt (24) penetrates through the positioning plate (8) and is threadedly connected in the inside of the threaded hole (7).

6. The field effect die test fixture having an appearance protection structure according to claim 2, wherein: Limiting blocks (22) are fixedly connected to the two sides of the connecting block (6), and the outer wall of the limiting block (22) is slidably connected in the inside of the sliding cavity (21).

7. The field effect die test fixture having an appearance protection structure according to claim 1, wherein: The side of the clamping plate (12) and the positioning plate (8) close to the chip body (2) is fixedly connected with a buffer pad (18), the buffer pad (18) is tightly attached to the outer wall of the chip body (2), and the buffer pad (18) is made of rubber.

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