Test seat and test equipment
By designing a test stand with a visible window and a movable fixed module, the problem of existing test stands obstructing test points is solved, enabling efficient and stable chip testing, adapting to different testing needs, and improving testing efficiency and reliability.
Patent Information
- Application Number
- CN202520224838.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-12
- Publication Date
- 2026-02-06
- Estimated Expiration
- 2035-02-12
AI Technical Summary
Existing test sockets have design and functional flaws that result in low testing efficiency and potential product damage, especially in the testing of chips with high-density pins or complex layouts, where they can obstruct test sites.
A test fixture was designed, comprising a viewing window and a movable fixing module. The fixing module moves along the slide direction to clamp the sample to be tested, and a flexible structure is used to achieve a stable clamping, ensuring that the test site is exposed and avoiding obstruction, while allowing flexible replacement of the needle assembly module to adapt to different testing needs.
It improves the accuracy and consistency of testing, avoids displacement and damage to the test sample, and significantly improves the testing efficiency of chips with high-density pins or complex layouts.
Smart Images
Figure CN223883622U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present disclosure relates to the field of semiconductor, and in particular, to a test socket and a test device. BACKGROUND
[0002] In the performance test process of a PCB board or a chip product, a socket test socket is usually used to fix the chip. The existing test socket has obvious defects in design and function. For example, the socket test socket with a downward pressing structure blocks the test site, reduces the test efficiency, and may cause product damage. Therefore, it is necessary to further optimize the structure of the test socket to improve the test efficiency and reliability. SUMMARY
[0003] Therefore, the present disclosure provides a test socket and a test device to improve the test efficiency and reliability.
[0004] The technical solution of the present disclosure is implemented as follows:
[0005] The present disclosure provides a test socket, which comprises: a first surface of the base, provided with a containing groove for containing a sample to be tested; the upper cover is provided with a visual window; the inner wall of the upper cover is provided with a plurality of sliding grooves; a plurality of fixing modules are connected to the inner wall of the upper cover; each fixing module is connected to a corresponding sliding groove and can move along the extension direction of the sliding groove; in the case that the upper cover and the base are in contact with each other, the first end of the plurality of fixing modules clamps the sample to be tested with the bottom of the containing groove, and the visual window exposes the test site of the sample to be tested.
[0006] In the above scheme, the direction of the force applied by the plurality of fixing modules to the sample to be tested is perpendicular to the sample to be tested.
[0007] In the above scheme, the size of the visual window is greater than the size of the containing groove.
[0008] In the above scheme, the first end of each of the plurality of fixing modules is provided with an elastic structure; wherein the distance between the elastic structure and the bottom of the containing groove is less than the thickness of the sample to be tested; and in the case that the elastic structure is in a compressed state, the distance between the elastic structure and the bottom of the containing groove is greater than or equal to the thickness of the sample to be tested.
[0009] In the above scheme, in the case that the plurality of fixing structures clamp the sample to be tested with the bottom of the containing groove, the plurality of fixing structures are centrally symmetric; wherein the center of symmetry of the plurality of fixing structures is the center of the sample to be tested.
[0010] In the above solution, the base includes: a support frame, multiple needle assembly modules, and multiple first connecting structures; wherein, the needle assembly types of the multiple needle assembly modules are different; any one of the multiple needle assembly modules is detachably connected to the support frame through the multiple first connecting structures.
[0011] In the above scheme, the frame-like structure of the support frame is combined with the surface of any one of the multiple needle assembly modules to form the receiving groove.
[0012] In the above scheme, when the sample to be tested is clamped between the bottom of the multiple fixing structures and the receiving groove, the multiple fixing structures are centrally symmetrical; wherein, the center of symmetry of the multiple fixing structures is the center of the sample to be tested.
[0013] In the above scheme, the test seat further includes: a plurality of second connection structures; wherein, the first part and the second part of each second connection structure are respectively disposed on the upper cover and the base, and their positions correspond to each other; the upper cover and the base are locked together by the plurality of second connection structures.
[0014] In the above scheme, the test seat further includes: multiple positioning structures; wherein, the first part and the second part of each positioning structure are respectively disposed on the upper cover and the base, and their positions correspond to each other; the upper cover and the base are aligned by the multiple positioning structures.
[0015] This disclosure also provides a testing device, including one or more test sockets as described in any of the above embodiments.
[0016] This disclosure provides a test fixture, including a base, a top cover, and multiple fixing modules. The first surface of the base has a receiving groove for accommodating a sample to be tested. The top cover has a viewing window. The inner wall of the top cover has multiple sliding grooves. The multiple fixing modules are connected to the inner wall of the top cover. Each fixing module is connected to a corresponding sliding groove and is movable along the extension direction of the sliding groove. When the top cover and base are in contact, the first ends of the multiple fixing modules clamp the sample to be tested against the bottom of the receiving groove, and the viewing window exposes the test sites of the sample. In this way, the sample to be tested can be pressed firmly by the multiple fixing modules, preventing displacement and ensuring stable and reliable contact between the sample and the test fixture, thereby improving the accuracy and consistency of the test.
[0017] Simultaneously, with the top cover and base in contact, the viewing window exposes the receiving slot of the base. This allows the present invention to test the test sites of the sample under test through the viewing window, avoiding the problem of not being able to perform pin insertion tests from top to bottom, greatly facilitating testing operations, especially in the testing of chips with high-density pins or complex layouts, significantly improving testing efficiency.
[0018] In addition, each fixing module is capable of moving along the extension direction of the sliding groove. That is, the position of the fixing module can be flexibly adjusted according to the position of the test site on the surface of the sample to be tested. Thus, it is ensured that the test site of the sample to be tested can always be kept within the range of the visual window, and the test site of the sample to be tested is avoided from being blocked by the fixing structure. BRIEF DESCRIPTION OF DRAWINGS
[0019] Figure 1 A structural schematic diagram of a test seat provided by an embodiment of the present disclosure is shown in the following figure.
[0020] Figure 2 A structural schematic diagram of a base provided by an embodiment of the present disclosure is shown in the following figure. Figure 1
[0021] Figure 3 A structural schematic diagram of an upper cover provided by an embodiment of the present disclosure is shown in the following figure. Figure 1
[0022] Figure 4 A structural schematic diagram of an upper cover provided by an embodiment of the present disclosure is shown in the following figure. Figure 2
[0023] Figure 5 A structural schematic diagram of a base provided by an embodiment of the present disclosure is shown in the following figure. Figure 2
[0024] Figure 6 A structural schematic diagram of a base provided by an embodiment of the present disclosure is shown in the following figure. Figure 3
[0025] Figure 7 A structural schematic diagram of a test device provided by an embodiment of the present disclosure is shown in the following figure. DETAILED DESCRIPTION
[0026] In order to make the objects, technical solutions and advantages of the present disclosure clearer, the technical solutions of the present disclosure are further described in detail below in combination with the drawings and embodiments. The described embodiments should not be regarded as limiting the present disclosure, and all other embodiments obtained by those of ordinary skill in the art without making creative efforts fall within the scope of protection of the present disclosure.
[0027] In the following description, “some embodiments” are described, which describe a subset of all possible embodiments, but it can be understood that “some embodiments” can be the same subset or different subsets of all possible embodiments, and can be combined with each other without conflict.
[0028] If the application file contains similar descriptions such as "first / second", the following description is added. In the following description, the terms "first / second / third" are only used to distinguish similar objects, and do not represent a specific order of the objects. Understandably, "first / second / third" can be interchanged in a specific order or sequence as allowed, so that the embodiments of the disclosure described herein can be implemented in an order other than that illustrated or described herein.
[0029] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs. The terminology used herein is for the purpose of describing embodiments of the present disclosure only and is not intended to be limiting of the present disclosure.
[0030] It should be noted that in this document, the terms "comprise", "contain" or any other variant thereof are intended to cover non-exclusive inclusion, so that a process, test seat, article or device including a series of elements not only includes those elements, but also includes other elements not explicitly listed or inherent to such a process, test seat, article or device. Without more limitations, the element defined by the statement "comprises a" does not exclude the presence of additional identical elements in the process, test seat, article or device that includes the element.
[0031] Figure 1 is a structural schematic diagram of an optional test seat 100 provided by embodiments of the present disclosure, referring to Figure 1 The test seat 100 includes a base 10. The material of the base 10 can be plastic. The first surface 10a of the base 10 is provided with a containing groove 11 for accommodating a sample 40 to be tested. The sample 40 to be tested can be a PCB board or a chip, etc. The internal profile of the containing groove 11 can match the profile of the sample 40 to be tested. The top view of the sample 40 to be tested placed in the containing groove 11 can be understood with reference to Figure 2 The two surfaces of the sample 40 to be tested can be provided with test sites.
[0032] In embodiments of the present disclosure, referring to Figure 1 The test seat 100 further includes a cover 20. The material of the cover 20 can be plastic. The cover 20 can be a frame structure. The frame structure of the cover 20 is combined with the protruding part of the first surface of the base 10.
[0033] In embodiments of the present disclosure, referring to Figure 1 The cover 20 is provided with a visual window 21. The visual window 21 can be formed by cutting the cover 20. The windowing position and size of the visual window 21 on the cover 20 can be designed according to the sample 40 to be tested actually tested. The visual window 21 penetrates the cover 20 in a direction perpendicular to the cover 20.
[0034] In the embodiments of the present disclosure, referring to Figure 1 In the case that the upper cover 20 and the base 10 are in contact with each other, the visible window 21 exposes the accommodating groove 11 of the base 10. In this way, in the case that the sample to be tested 40 is placed in the accommodating groove 11 for testing, the visible window 21 can expose the test site of the sample to be tested 40. Thus, the embodiments of the present disclosure can test the test site of the sample to be tested 40 through the visible window 21, avoid the problem that the sample to be tested 40 cannot be tested from top to bottom, and greatly facilitate the testing operation. Especially in the chip testing of high-density pins or complex layout, the testing efficiency can be significantly improved.
[0035] In the embodiments of the present disclosure, referring to Figure 1 The test seat 100 further comprises a plurality of fixing modules 30. The plurality of fixing modules 30 can be in the shape of a cuboid. The plurality of fixing modules 30 can all contact the edge of the sample to be tested 40. The plurality of fixing modules 30 are connected to the inner wall of the upper cover 20. In the case that the upper cover 20 and the base 10 are in contact with each other, the first end of the plurality of fixing modules 30 clamps the sample to be tested 40 with the bottom of the accommodating groove 11. In this way, the embodiments of the present disclosure can press the sample to be tested 40 tightly through the plurality of fixing modules 30, avoid the displacement of the sample to be tested 40, and thus ensure the stable and reliable contact between the sample to be tested 40 and the test seat 100, and improve the accuracy and consistency of the test.
[0036] Figure 3 is a structural schematic diagram of an optional upper cover 20 provided by the embodiments of the present disclosure.
[0037] In the embodiments of the present disclosure, in combination with Figure 1 and Figure 3 The inner wall of the upper cover 20 is provided with a plurality of sliding grooves 22. The extension direction of the plurality of sliding grooves 22 is parallel to the first face 10a of the base 10. The first end of the plurality of fixing modules 30 can be used to press the sample to be tested 40 tightly. The second end of the plurality of fixing modules 30 can be used by the operator to adjust the position of the fixing module 30.
[0038] In the embodiments of the present disclosure, referring to Figure 2 Each fixing module 30 is connected to a corresponding sliding groove 22. Each fixing module 30 can move along the extension direction of the sliding groove 22. In this way, the position of the fixing module 30 can be flexibly adjusted according to the position of the test site on the surface of the sample to be tested 40. Thus, the test site of the sample to be tested 40 can always be kept within the range of the visible window 21, the fixing module 30 avoids blocking the test site of the sample to be tested 40, and the precise measurement of the testing equipment or probe is facilitated.
[0039] In some embodiments of the present disclosure, referring to Figure 1The forces applied to the sample 40 by the multiple fixing modules 30 are perpendicular to the sample 40. In this way, by applying forces perpendicular to the surface of the sample 40 by the multiple fixing modules 30, the displacement or misalignment caused by lateral forces can be avoided, and the warping or deformation of the sample 40 due to uneven force can be effectively prevented, thereby preventing product damage.
[0040] In some embodiments of this disclosure, reference is made to Figure 1 When the sample 40 to be tested is clamped between multiple fixing modules 30 and the bottom of the receiving groove 11, the multiple fixing modules 30 are centrally symmetrical. The center of symmetry of the multiple fixing modules 30 is the center of the sample 40 to be tested. In this way, the centrally symmetrical arrangement of the multiple fixing modules 30 can evenly distribute the clamping force and avoid local stress concentration. Thus, it prevents warping, deformation or damage to thin or fragile sample 40 during the clamping process.
[0041] In some embodiments of this disclosure, reference is made to Figure 1 The test base 100 also includes multiple second connecting structures. The upper cover 20 and the base 10 are locked together via these second connecting structures. These second connecting structures can be snap-fit mechanisms, etc. Figure 1 Taking the buckle shown as an example: each second connecting structure may include a hook 51 and a block 52. The hook 51 is the first part of the second connecting structure and can be disposed on the upper cover 20. The block 52 is the second part of the second connecting structure and can be disposed on the base 10. The hook 51 and the block 52 are positioned correspondingly to each other. In this way, the upper cover 20 and the base 10 can be further locked together by the second connecting structure to ensure the stability of the sample 40 under test during the testing process.
[0042] In some embodiments of this disclosure, reference is made to Figure 1 The test base 100 also includes multiple positioning structures 60. The upper cover 20 and the base 10 are aligned using these positioning structures 60. The positioning structures 60 can be magnets, tenons, or other similar structures. For example, the frame structure of the upper cover 20 can be fitted with a positioning magnet, i.e., the first part of the positioning structure 60 is located on the upper cover 20; the protruding portion of the first surface of the base 10 can be fitted with a positioning iron plate, i.e., the second part of the positioning structure 60 is located on the base 10. The positions of the positioning iron plate and the positioning magnet correspond to each other. Thus, during the assembly of the upper cover 20 and the base 10, the positioning structures 60 can quickly align the upper cover 20 and the base 10, thereby improving testing efficiency.
[0043] In some embodiments of this disclosure, reference is made to Figure 1 The size of the viewing window 21 is larger than the size of the receiving groove 11. In this way, when the top cover 20 and the base 10 are in contact with each other, the first ends of the multiple fixing modules 30 can extend into the receiving groove 11 to press the sample 40 to be tested in the receiving groove 11.
[0044] Figure 4 is a structural schematic diagram of an optional fixed module 30 provided by an embodiment of the present disclosure.
[0045] In some embodiments of the present disclosure, in combination with Figure 1 and Figure 4 , the first end of each of the plurality of fixed modules 30 is provided with an elastic structure 31. For example, the elastic structure 31 can be formed of a material such as rubber. The elastic structure 31 can cover part or all of the first end of each fixed module 30.
[0046] In an embodiment of the present disclosure, in combination with Figure 1 and Figure 4 , the distance between the elastic structure 31 and the bottom of the accommodation groove 11 is less than the thickness of the sample to be tested 40. The elastic structure 31 can be a material such as rubber. In the case where the elastic structure 31 is in a compressed state, the distance between the elastic structure 31 and the bottom of the accommodation groove is greater than or equal to the thickness of the sample to be tested 40. When the sample to be tested 40 is placed in the accommodation groove 11, the elastic structure 31 rebounds and exerts a certain pressure, stably clamping the sample to be tested 40 in the accommodation groove 11. In this way, the embodiment of the present disclosure can realize automatic clamping of the sample to be tested 40 through the compression and rebound characteristics of the elastic structure 31. Thus, the embodiment of the present disclosure can adapt to samples to be tested 40 of different thicknesses, improving the versatility and testing efficiency of the test seat. At the same time, it ensures that the sample to be tested 40 does not displace or loosen during the test. In addition, the flexible clamping method of the elastic structure 31 reduces the mechanical stress on the sample to be tested 40, reducing the risk of damage to the sample to be tested 40.
[0047] Figure 5 and Figure 6 are structural schematic diagrams of an optional base 10 provided by an embodiment of the present disclosure.
[0048] In some embodiments of the present disclosure, referring to Figure 1 , the base 10 includes a support frame and a plurality of needle group modules.
[0049] In an embodiment of the present disclosure, in combination with Figure 5 and Figure 6 , any one of the plurality of needle group modules is connected to the support frame 12 through a plurality of first connecting structures 14. For example, Figure 6 the needle group module 13b in is connected to the support frame 12 through the first connecting structure 14. The first connecting structure 14 can be a mortise and tenon joint and a fastening screw, etc. For example, in the case where the first connecting structure 14 is a fastening screw, Figure 5 and Figure 6 the first connecting structure 14 on the support frame 12 and the needle group modules 13a and 13b shown in are screw holes of a fastening screw.
[0050] In the embodiments of the present disclosure, the frame structure of the support frame 12 is combined with the surface of any one of the plurality of needle group modules to form the accommodation groove 11. For example, Figure 5 The support frame 12 in FIG. 13a is combined with the needle group module 13b to form the accommodation groove 11. Figure 6 Figure 6 In the embodiments of the present disclosure, the needle group types of the plurality of needle group modules are different. For example, the needle group module 13a shown in FIG. 13a and the needle group module 13b shown in FIG. 13b can both be probe plates. The contact probes 131 of the needle group module 13a contact the pins of the sample to be tested 40 to transmit electrical signals. That is, the embodiments of the present disclosure can be that the needle group module is a replaceable component. For example, the needle group module 13a shown in FIG. 13a and the needle group module 13b shown in FIG. 13b differ in one or more of needle type, needle pitch, number of needles, material, function, size, guiding structure, and heat dissipation structure.
[0051] Further, the plurality of needle group modules are detachably connected to the support frame 12. For example, Figure 5 The needle group module 13a in FIG. 13a and the needle group module 13b in FIG. 13b are detachably connected to the support frame 12. That is, the embodiments of the present disclosure can replace the needle group module according to different test requirements, component types, and environmental conditions. In this way, the needle group module on the base 10 can be customized and replaced according to actual test requirements, thereby improving the versatility and flexibility of the test base. Figure 6 Figure 5 Figure 6
[0052] Further, the plurality of needle group modules are detachably connected to the support frame 12. For example, Figure 5 The needle group module 13a in FIG. 13a and the needle group module 13b in FIG. 13b are detachably connected to the support frame 12. That is, the embodiments of the present disclosure can replace the needle group module according to different test requirements, component types, and environmental conditions. In this way, the needle group module on the base 10 can be customized and replaced according to actual test requirements, thereby improving the versatility and flexibility of the test base. Figure 6
[0053] is a structural schematic diagram of an optional test equipment 200 provided by the embodiments of the present disclosure, referring to Figure 7 The test equipment 200 includes one or more test bases 100 of any of the above embodiments. Figure 7 The above description of the test base is similar to the description of the above test base embodiments, and has similar beneficial effects as the test base embodiments. For technical details not disclosed in the test base embodiments of the present disclosure, please refer to the description of the test base embodiments of the present disclosure for understanding.
[0054]
[0055] It should be noted that in this disclosure, the terms "comprising", "containing" or any other variant thereof are intended to cover a non-exclusive inclusion, such that a process, test socket, article or apparatus that comprises a list of elements does not include only those elements, but can also include other elements not expressly listed or inherent to such process, test socket, article or apparatus. Without more limitations, the element defined by the phrase "comprising a" does not exclude the presence of additional identical elements in the process, test socket, article or apparatus that includes the element.
[0056] The above-mentioned sequence numbers of the embodiments of the present disclosure are only for description, and do not represent the advantages and disadvantages of the embodiments. The test sockets disclosed in the several test socket embodiments provided by the present disclosure can be combined arbitrarily without conflict to obtain new test socket embodiments. The features disclosed in the several product embodiments provided by the present disclosure can be combined arbitrarily without conflict to obtain new product embodiments. The features disclosed in the several test socket or device embodiments provided by the present disclosure can be combined arbitrarily without conflict to obtain new test socket or device embodiments.
[0057] The above is only a specific implementation of the present disclosure, but the protection scope of the present disclosure is not limited thereto. Any person skilled in the art can easily think of changes or replacements within the technical scope disclosed by the present disclosure, which should be covered within the protection scope of the present disclosure.
Claims
1. A test socket, characterized by, The test seat comprises a base, an upper cover and a plurality of fixing modules; wherein a first surface of the base is provided with a containing groove for containing a sample to be tested; the upper cover is provided with a visual window; an inner wall of the upper cover is provided with a plurality of sliding grooves; and the plurality of fixing modules are connected to the inner wall of the upper cover; each of the fixing modules is connected to a corresponding sliding groove and can move along the extension direction of the sliding groove; in the case that the upper cover and the base are in contact with each other, the first ends of the plurality of fixing modules clamp the sample to be tested with the bottom of the containing groove, and the visual window exposes the test site of the sample to be tested. The direction of the force applied by the plurality of fixing modules to the sample to be tested is perpendicular to the sample to be tested.
2. The test socket of claim 1, wherein, The size of the visual window is greater than the size of the containing groove.
3. The test socket of claim 1, wherein, The first ends of the plurality of fixing modules are each provided with an elastic structure; wherein 4. The test socket of claim 1, wherein, the distance between the elastic structure and the bottom of the containing groove is less than the thickness of the sample to be tested; and in the case that the elastic structure is in a compressed state, the distance between the elastic structure and the bottom of the containing groove is greater than or equal to the thickness of the sample to be tested. In the case that the plurality of fixing structures clamp the sample to be tested with the bottom of the containing groove, the plurality of fixing structures are centrally symmetrical; wherein the center of symmetry of the plurality of fixing structures is the center of the sample to be tested.
5. The test socket of claim 1, wherein, The base comprises a support frame, a plurality of needle group modules and a plurality of first connecting structures; wherein 6. The test socket of claim 1, wherein, the needle groups of the plurality of needle group modules are of different types; any one of the plurality of needle group modules is detachably connected to the support frame through the plurality of first connecting structures. The frame structure of the support frame and the surface of any one of the plurality of needle group modules combine to form the containing groove.
7. The test socket of claim 6, wherein, Further comprising:
8. The test socket of claim 6, wherein, a plurality of positioning structures; wherein the first part and the second part of each of the positioning structures are respectively arranged on the upper cover and the base and correspond to each other in position; the upper cover and the base are aligned by the plurality of positioning structures. Further comprising:
9. The test socket of claim 1, wherein, a plurality of second connecting structures; wherein the first part and the second part of each of the second connecting structures are respectively arranged on the upper cover and the base and correspond to each other in position; the upper cover and the base are locked by the plurality of second connecting structures. The test seat comprises one or more of any one of claims 1 to 9.
10. A test apparatus, characterized by,