Combined probe card
By breaking down the probe card into multiple test units and combining them into one unit, the problem of testing plants being unable to efficiently test multiple products is solved, achieving higher production efficiency and cost control.
Patent Information
- Application Number
- CN202422510776.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-17
- Publication Date
- 2026-02-06
- Estimated Expiration
- 2034-10-17
AI Technical Summary
In the existing technology, in order to improve production efficiency, testing plants cannot use conventional cantilever probe cards to test multiple products, and vertical probe cards are too expensive, resulting in a problem of not being worth the cost.
The probe card is broken down into multiple identical test units, which are then combined into a single unit using a base plate and fixing screws to form a modular probe card, thereby increasing testing speed and reducing equipment movement.
This has resulted in increased testing speed, reduced frequent equipment movement, improved production efficiency, and lower production costs.
Smart Images

Figure CN223883630U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to probe card technical field, concretely relates to a combined probe card. BACKGROUND
[0002] Probe card is a connecting medium between detection equipment and integrated circuit chip, reaches the effect of detection through using probe main body to touch chip lead-out signal, and probe card is divided into blade type probe card, epoxy resin probe card and vertical probe card, and epoxy resin probe card is also called cantilever probe card, and it is the most commonly used probe card at present.
[0003] In order to improve production efficiency, test simultaneously measures multiple products, and according to conventional cantilever probe card manufacturing, it is impossible to realize, can also use vertical needle card to realize, but vertical needle card cost is too high, and it is not worth the loss.
[0004] Therefore, how to provide a combined probe card to solve the problems existing in the prior art, and it is of great significance to its application. UTILITY MODEL CONTENT
[0005] Therefore, the purpose of the present application is to provide a combined probe card to solve the problem that test simultaneously measures multiple products in order to improve production efficiency, and according to conventional cantilever probe card manufacturing, it is impossible to realize, can also use vertical needle card to realize, but vertical needle card cost is too high, and it is not worth the loss.
[0006] To achieve the above purpose, the utility model provides the following technical scheme:
[0007] A combined probe card, comprising a bottom plate, a probe unit, a positioning pin and a fixed screw, the bottom plate and the probe unit are positioned through the positioning pin, and the bottom plate and the probe unit are fixedly connected through four fixed screws;
[0008] The number of probe units is five, four corners of each probe unit are provided with a fixed hole, the middle part of the probe unit is provided with a probe fixed block, both ends of the probe fixed block are respectively provided with a probe, and four positioning holes are symmetrically arranged at both ends of the probe unit.
[0009] The surface of the bottom plate is provided with five groups of screw holes, five groups of positioning pin mounting holes and five rectangular holes.
[0010] Preferably, the middle part of the probe unit is provided with a rectangular groove, and the rectangular groove is matched with the rectangular hole.
[0011] Preferably, the fixed hole is matched with the screw hole, and the fixed hole and the screw hole are fixedly connected through the fixed screw.
[0012] Preferably, the positioning hole comprises an A1 hole site, a B1 hole site, a C1 hole site and a D1 hole site; the positioning pin mounting hole comprises an A2 hole site, a B2 hole site, a C2 hole site and a D2 hole site, the B2 hole site and the D2 hole site are both provided with a positioning pin, and the two positioning pins are connected with the B1 hole site and the D1 hole site respectively.
[0013] Compared with the prior art, the utility model has the advantages that:
[0014] The probe card is decomposed into several same test units, is respectively made, and is combined together through the bottom plate to realize the manufacturing of the probe card, the probe card in the utility model can improve the test speed, reduce the frequent movement of equipment, and improve the production efficiency.
[0015] The above description is only a summary of the technical scheme of the application, in order to more clearly understand the technical means of the application, so as to be implemented according to the content of the specification, and in order to make the above and other purposes, characteristics and advantages of the application more obvious and easy to understand, the following will be described in detail with the preferred embodiment of the application and the accompanying drawings.
[0016] According to the detailed description of the specific embodiments of the application in the following accompanying drawings, those skilled in the art will more clearly understand the above and other purposes, advantages and characteristics of the application. BRIEF DESCRIPTION OF DRAWINGS
[0017] In order to more clearly illustrate the technical scheme in the embodiments of the application or the prior art, the following will briefly introduce the drawings needed to be used in the embodiment or the prior art description, obviously, the drawings in the following description are some embodiments of the application, and those skilled in the art can also obtain other drawings according to these drawings without creating labor. In all the drawings, similar elements or parts are generally identified by similar reference numerals. In the drawings, each element or part is not necessarily drawn according to the actual proportion.
[0018] Fig. 1 It is a structural schematic view of the utility model;
[0019] Fig. 2 It is a structural schematic view of the bottom plate in the utility model;
[0020] Fig. 3 It is a structural schematic view of the probe unit in the utility model.
[0021] In the drawing: 1, bottom plate; 2, probe unit; 3, positioning pin; 4, fixed screw; 5, positioning hole; 6, rectangular hole; 7, screw hole; 8, positioning pin mounting hole; 9, probe; 10, fixed hole; 11, probe fixing block. DETAILED DESCRIPTION
[0022] In order to make the purposes, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be described clearly and completely below in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only some but not all of the embodiments of the present application. In the following description, specific details such as specific configurations and components are provided only in order to help the overall understanding of the embodiments of the present application. Therefore, those skilled in the art should clearly understand that various changes and modifications can be made to the embodiments described herein without departing from the scope and spirit of the present application. In addition, in order to be clear and concise, the description of known functions and structures is omitted in the embodiments.
[0023] In addition, reference numerals and / or letters can be repeated in different examples in the present application. Such repetition is for the purpose of simplification and clarity, and does not in itself indicate a relationship between the various embodiments and / or arrangements discussed.
[0024] The term "and / or" herein is only a description of the association relationship of the associated objects, which means that there can be three relationships, for example, A and / or B can mean that A exists alone, B exists alone, and A and B exist together. The term "and" herein is a description of another association relationship of the associated objects, which means that there can be two relationships, for example, A and B can mean that A exists alone and A and B exist together. In addition, the character " / " herein generally means that the associated objects before and after it are in an "or" relationship.
[0025] It should also be noted that the relationship terms such as first and second in the present application are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between the entities or operations. Moreover, the terms "include", "contain" or any other variants thereof are intended to cover non-exclusive inclusion.
[0026] Please refer to Figs. 1-3 The present application provides a technical scheme of a combined probe card: comprising a bottom plate 1, a probe unit 2, a positioning pin 3 and a fixing screw 4, the bottom plate 1 and the probe unit 2 are positioned by the positioning pin 3, and the bottom plate 1 and the probe unit 2 are fixedly connected by four fixing screws 4;
[0027] The number of the probe units 2 is five, four corners of each probe unit 2 are provided with fixing holes 10, the middle part of the probe unit 2 is provided with a probe fixing block 11, both ends of the probe fixing block 11 are respectively provided with probes 9, and four positioning holes 5 are symmetrically provided at both ends of the probe unit 2;
[0028] The surface of the bottom plate 1 is provided with five groups of screw holes 7, five groups of positioning pin mounting holes 8 and five rectangular holes 6.
[0029] The middle part of the probe unit 2 is provided with a rectangular slot, which is matched with the rectangular hole 6.
[0030] The fixing hole 10 is matched with the screw hole 7, and the fixing hole 10 and the screw hole 7 are fixedly connected through the fixing screw 4.
[0031] The positioning hole 5 includes A1 hole position, B1 hole position, C1 hole position and D1 hole position; the positioning pin mounting hole 8 includes A2 hole position, B2 hole position, C2 hole position and D2 hole position, the B2 hole position and the D2 hole position are both mounted with the positioning pin 3, and the two positioning pins 3 are respectively connected with the B1 hole position and the D1 hole position.
[0032] In specific use, five probe units 2 are sequentially manufactured, the fixing hole 10 and the positioning hole 5 are drilled on the surface of the probe unit 2, then the rectangular hole 6, the positioning pin mounting hole 8 and the screw hole 7 are manufactured on the bottom plate 1, the positioning pin 3 is mounted on the positioning pin mounting hole 8, then the positioning hole 5 of the probe unit 2 is fixed with the positioning pin 3, the limiting of the probe unit 2 is completed, then the probe unit 2 is fixed with the bottom plate 1 by using the fixing screw 4, and the manufacturing of the probe card is completed, and the probe card in the utility model can improve the test speed, reduce the frequent movement of equipment and improve the production efficiency.
[0033] The above only describes preferred embodiments of the utility model, and does not limit the protection scope of the utility model, and for those skilled in the art, the utility model can be changed and varied in various ways. Any change, modification, replacement, integration and parameter change of the embodiments within the spirit and principle of the utility model, which can realize the same function without departing from the principle and spirit of the utility model, falls within the protection scope of the utility model.
Claims
1. A modular probe card, characterized by: Including the bottom plate (1), probe unit (2), positioning pin (3) and fixed screw (4), the bottom plate (1) and probe unit (2) are positioned through positioning pin (3), the bottom plate (1) and probe unit (2) are fixedly connected through four fixed screws (4); The number of the probe unit (2) is five, the four corners of each probe unit (2) are provided with fixing holes (10), the middle part of the probe unit (2) is provided with probe fixing block (11), the both ends of the probe fixing block (11) are respectively provided with probe (9), and the both ends of the probe unit (2) are symmetrically provided with four positioning holes (5); The surface of the bottom plate (1) is provided with five groups of screw holes (7), five groups of positioning pin mounting holes (8) and five rectangular holes (6); The middle part of the probe unit (2) is provided with a rectangular groove, and the rectangular groove is matched with the rectangular hole (6); The fixing hole (10) is matched with the screw hole (7), and the fixing hole (10) and the screw hole (7) are fixedly connected through the fixed screw (4); The positioning hole (5) includes A1 hole, B1 hole, C1 hole, D1 hole; The positioning pin mounting hole (8) includes A2 hole, B2 hole, C2 hole, D2 hole, the B2 hole and the D2 hole are provided with the positioning pin (3), and the two positioning pins (3) are connected with the B1 hole and the D1 hole respectively.