Sample loading device for electron microscope

By setting two sets of positioning units and adjustment components on the sample base, the problem of difficult sample switching in electron microscopes is solved, enabling rapid switching and preventing slide collisions, thus improving observation efficiency.

CN223883838UActive Publication Date: 2026-02-06WUXI JUNJIE ELECTRONIC TECHNOLOGY CO LTD
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Patent Information

Application Number
CN202520561896.4
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-03-28
Publication Date
2026-02-06
Estimated Expiration
2035-03-28

AI Technical Summary

Technical Problem

Existing electron microscope positioning units cannot quickly switch between multiple sets of samples for comparative observation, resulting in time-consuming and labor-intensive operation.

Method used

Two positioning units are set on the sample base, consisting of a first limiting plate and a second limiting plate, and equipped with an adjustment component and a telescopic component. The adjustment component adjusts the position by driving a threaded rod with a motor, and the telescopic component prevents the glass slide from being bumped by a telescopic rod.

Benefits of technology

It enables rapid sample switching and comparative observation, prevents the slide from bumping into the objective lens, and improves operational efficiency.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a sample loading device for an electron microscope, and relates to the technical field of electron microscopes. The sample loading device for the electron microscope comprises a first base, a sample base is arranged on the first base, a first limiting plate is arranged on the sample base, a second limiting plate is fixedly connected to the first limiting plate, and an adjusting assembly is arranged between the second limiting plate and the sample base. According to the sample loading device for the electron microscope, a structure that two groups of positioning units are arranged on a sample base is adopted, each positioning unit is internally composed of a first limiting plate and a second limiting plate, the first limiting plate and the second limiting plate are convenient for clamping a glass slide, and an adjusting assembly is arranged between the sample base and the second limiting plate; meanwhile, the telescopic assembly is arranged between the first base and the sample base, so that the glass slide is effectively prevented from colliding with the periphery of the objective lens.
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Description

TECHNICAL FIELD

[0001] The utility model relates to electron microscope technical field, concretely is the sample piece device for electron microscope. BACKGROUND

[0002] With the development of science and technology, the precision requirement of microcosmic world observation in various fields is continuously improved, in the biomedical field, the research to the intracellular structure, microorganism and the observation to nanometer material, crystal structure etc.

[0003] Simple electron microscope, through the positioning unit, the sample organization at the bottom of objective lens is observed through the ocular lens, the positioning unit of existing electron microscope mostly can only position single slide, when two groups of sample organizations need to be compared and observed, the existing positioning unit is inconvenient to quickly switch and compare the sample observation, and it is time-consuming and laborious to switch the slide back and forth, in view of the deficiency of prior art, the utility model provides the sample piece device for electron microscope to solve the above problems. UTILITY MODEL CONTENT

[0004] In view of the deficiency of prior art, the utility model provides the sample piece device for electron microscope, and the problem that the positioning unit is inconvenient to quickly switch and compare the sample observation is solved.

[0005] In order to realize the above object, the utility model is realized through the following technical scheme: the sample piece device for electron microscope, including first base, be provided with sample base on the first base, be provided with telescopic component between the first base and sample base, be provided with first limit board on the sample base, be fixedly connected with second limit board on the first limit board, be provided with adjusting assembly between the second limit board and sample base, the adjusting assembly is used for adjusting the position of second limit board;

[0006] The adjusting assembly includes:

[0007] Motor, it is set up in sample base;

[0008] Threaded rod, one end is fixedly connected on the motor output;

[0009] Adjusting block, it is fixedly connected on the second limit board, the threaded rod is connected in the adjusting block.

[0010] Preferably, the telescopic component is used for controlling the telescopic of sample base;

[0011] The telescopic component includes:

[0012] Telescopic rod, one end is fixedly connected in the first base inner side;

[0013] L-shaped connecting block is fixedly connected to the bottom of the sample base, the other end of the telescopic rod is fixedly connected to the L-shaped connecting block, and the L-shaped connecting block is abutted with the first base.

[0014] Preferably, the sample base is provided with a second light transmission hole, and the sample base is provided with a track body.

[0015] Preferably, the second limiting plate is fixedly connected with a track block at the bottom, and the track block is slidingly connected in the track body.

[0016] Preferably, the first base is provided with a first light transmission hole, and the first base is fixedly connected with a partition plate.

[0017] Preferably, the sample base is fixedly connected with a fixed plate, and the end of the threaded rod away from the motor is rotatably connected in the fixed plate.

[0018] The utility model discloses a sample mounting device for electron microscope, it has the beneficial effect as follows: the sample mounting device for electron microscope adopts the structure of setting two groups of positioning units in sample base, and the positioning unit is composed of first limiting plate and second limiting plate, and the first limiting plate and the second limiting plate are convenient for clamping the slide glass, and the adjusting assembly is arranged between the sample base and the second limiting plate, and the adjusting assembly is convenient for quickly adjusting the position of the positioning unit, and it is convenient for quickly switching and comparing observation of two groups of samples, and the telescopic assembly is arranged between the first base and the sample base, and the sample base is convenient for stretching out when placing the slide glass, and effectively prevents the slide glass from knocking the objective lens. ACCURACY OF DRAWINGS

[0019] In order to more clearly illustrate the technical scheme in the embodiment of the utility model or prior art, the following will briefly introduce the drawing needed to be used in the embodiment or prior art description, and obviously, the drawing in the following description is only some embodiments of the utility model, and for ordinary skilled in the art, other drawings can also be obtained according to these drawings without paying creative labor.

[0020] Figure 1 It is the whole structure schematic diagram of the utility model;

[0021] Figure 2 It is the adjusting assembly structure schematic diagram of the utility model;

[0022] Figure 3 It is the telescopic assembly structure schematic diagram of the utility model;

[0023] Figure 4 It is the first limiting plate structure schematic diagram of the utility model.

[0024] As shown in the figure: 1, the first base; 11, the first light transmission hole; 12, the partition; 2, the sample base; 21, the fixed plate; 22, the second light transmission hole; 23, the track body; 3, the first limiting plate; 31, the second limiting plate; 311, the track block; 4, the adjusting assembly; 41, the motor; 42, the threaded rod; 43, the adjusting block; 5, the telescopic assembly; 51, the telescopic rod; 52, the L-shaped connecting block. DETAILED DESCRIPTION

[0025] In order to make the purpose, technical scheme and advantages of the embodiments of the present application more clear, the technical scheme in the embodiments of the present application is described clearly and completely. Obviously, the described embodiments are part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the present application.

[0026] The sample slide device for an electron microscope provided in the embodiments of the present application solves the problem that the positioning unit is inconvenient for quick switching and contrast observation of samples, realizes the structure of two sets of positioning units arranged on the sample base, the positioning unit is composed of the first limiting plate and the second limiting plate, the first limiting plate and the second limiting plate are convenient for clamping the slide, the adjusting assembly is arranged between the sample base and the second limiting plate, the adjusting assembly is convenient for quickly adjusting the position of the positioning unit, is convenient for quickly switching and contrast observation of two sets of samples, and the telescopic assembly is arranged between the first base and the sample base, so that the sample base is stretched out when the slide is placed, and the slide is effectively prevented from colliding with the periphery of the objective lens.

[0027] In order to better understand the above technical scheme, the above technical scheme will be described in detail in combination with the drawings of the specification and specific embodiments.

[0028] Embodiment 1;

[0029] The embodiments of the present application disclose a sample slide device for an electron microscope, according to the drawings Figures 1-4 As shown in the figure, the device comprises a first base 1, characterized in that a sample base 2 is arranged on the first base 1, a telescopic assembly 5 is arranged between the first base 1 and the sample base 2, a first limiting plate 3 is arranged on the sample base 2, a second limiting plate 31 is fixedly connected to the first limiting plate 3, an adjusting assembly 4 is arranged between the second limiting plate 31 and the sample base 2, and the adjusting assembly 4 is used for adjusting the position of the second limiting plate 31.

[0030] The adjusting assembly 4 comprises:

[0031] A motor 41 is arranged on the sample base 2.

[0032] A threaded rod 42 is fixedly connected to the output end of the motor 41.

[0033] The adjusting block 43 is fixedly connected to the second limiting plate 31, and the threaded rod 42 is threadedly connected in the adjusting block 43.

[0034] The sample base 2 is provided with a second light transmission hole 22, and the sample base 2 is provided with a track main body 23.

[0035] The track block 311 is fixedly connected to the bottom of the second limiting plate 31 and is slidingly connected in the track main body 23.

[0036] The first base 1 is provided with a first light transmission hole 11, and the first base 1 is fixedly connected with a partition plate 12.

[0037] The fixed plate 21 is fixedly connected to the sample base 2, and the end, away from the motor 41, of the threaded rod 42 is rotatably connected in the fixed plate 21.

[0038] When the first limiting plate 3 and the second limiting plate 31 clamp the slide glass, the adjusting assembly 4 is used for quickly adjusting the positions of the first limiting plate 3 and the second limiting plate 31 to the second light transmission hole 22, first, the motor 41 drives the threaded rod 42 to rotate, the threaded rod 42 is threadedly connected between the motor 41 and the adjusting block 43, then the adjusting block 43 is driven to move, the adjusting block 43 is fixedly connected to the second limiting plate 31, the second limiting plate 31 is driven to move, the second limiting plate 31 is fixedly connected to the first limiting plate 3, the first limiting plate 3 slides on the sample base 2, and the track block 311 slides in the track main body 23, so that the purpose of quickly switching the observation sample is achieved.

[0039] Embodiment 2;

[0040] The utility model discloses an embodiment for the sample of electron microscope device, according to the attached Figures 1-4 As shown in the figure, including first base 1, its characterized in that, first base 1 is provided with sample base 2, and first base 1 is provided with telescopic assembly 5 between sample base 2, sample base 2 is provided with first limiting plate 3, and first limiting plate 3 is fixedly connected with second limiting plate 31, and second limiting plate 31 is provided with adjusting assembly 4 between sample base 2, and adjusting assembly 4 is used for adjusting the position of second limiting plate 31;

[0041] The adjusting assembly 4 comprises:

[0042] The motor 41 is arranged on the sample base 2.

[0043] One end of the threaded rod 42 is fixedly connected to the output end of the motor 41.

[0044] The adjusting block 43 is fixedly connected to the second limiting plate 31, and the threaded rod 42 is threadedly connected in the adjusting block 43.

[0045] The telescopic assembly 5 is used for controlling the telescopic movement of the sample base 2.

[0046] The telescopic assembly 5 comprises:

[0047] A telescopic rod 51 is fixedly connected to the inner side of the first base 1;

[0048] An L-shaped connecting block 52 is fixedly connected to the bottom of the sample base 2, and the other end of the telescopic rod 51 is fixedly connected to the L-shaped connecting block 52, and the L-shaped connecting block 52 abuts against the first base 1.

[0049] The sample base 2 is provided with a second light-transmitting hole 22, and the sample base 2 is provided with a track main body 23.

[0050] The second limiting plate 31 is fixedly connected with a track block 311 at the bottom, and the track block 311 is slidingly connected in the track main body 23.

[0051] The first base 1 is provided with a first light-transmitting hole 11, and the first base 1 is fixedly connected with a partition plate 12.

[0052] The sample base 2 is fixedly connected with a fixed plate 21, and the end of the threaded rod 42 away from the motor 41 is rotatably connected in the fixed plate 21.

[0053] When it is needed to clamp the slide into the first limiting plate 3 and the second limiting plate 31, the telescopic assembly 5 starts to act, first, the telescopic rod 51 is elongated, and the L-shaped connecting block 52 is driven to move, the L-shaped connecting block 52 is fixedly connected with the sample base 2, and then the sample base 2 is stretched out, which provides sufficient space for installing the slide, and effectively prevents the slide from colliding with the objective lens when the slide is installed.

[0054] The basic principle and main features of the utility model and the advantages of the utility model are shown and described. It should be understood by the person skilled in the art that the utility model is not limited by the above-mentioned embodiments, and the above-mentioned embodiments and the description in the specification are only for illustrating the principle of the utility model, and the utility model can have various changes and improvements without departing from the spirit and scope of the utility model, and these changes and improvements all fall within the scope of the utility model claimed. The protection scope of the utility model is defined by the appended claims and their equivalents.

Claims

1. A sample tabbing device for an electron microscope comprising a first base (1), characterized in that, The first base (1) is provided with a sample base (2), and a telescopic assembly (5) is arranged between the first base (1) and the sample base (2); the sample base (2) is provided with a first limiting plate (3), the first limiting plate (3) is fixedly connected with a second limiting plate (31), and an adjusting assembly (4) is arranged between the second limiting plate (31) and the sample base (2); the adjusting assembly (4) is used for adjusting the position of the second limiting plate (31); The adjusting assembly (4) comprises: A motor (41) is arranged on the sample base (2); A threaded rod (42) is fixedly connected to the output end of the motor (41); An adjusting block (43) is fixedly connected to the second limiting plate (31), and the threaded rod (42) is threadedly connected in the adjusting block (43).

2. The sample tabbing device for an electron microscope of claim 1, wherein, The telescopic assembly (5) is used for controlling the telescopic movement of the sample base (2); The telescopic assembly (5) comprises: A telescopic rod (51) is fixedly connected to the inner side of the first base (1); An L-shaped connecting block (52) is fixedly connected to the bottom of the sample base (2), the other end of the telescopic rod (51) is fixedly connected to the L-shaped connecting block (52), and the L-shaped connecting block (52) abuts against the first base (1).

3. The sample tabbing device for an electron microscope of claim 1, wherein, The sample base (2) is provided with a second light-transmitting hole (22) and a track main body (23).

4. The sample tabbing device for an electron microscope of claim 3, wherein, The second limiting plate (31) is fixedly connected with a track block (311) at the bottom, and the track block (311) is slidably connected in the track main body (23).

5. The sample tabbing device for an electron microscope of claim 1, wherein, The first base (1) is provided with a first light-transmitting hole (11), and a partition plate (12) is fixedly connected to the first base (1).

6. The sample tabbing device for an electron microscope of claim 1, wherein, The sample base (2) is fixedly connected with a fixed plate (21), and the other end of the threaded rod (42) away from the motor (41) is rotatably connected in the fixed plate (21).