Detection device

Abstract

The utility model provides a detection device, and relates to the technical field of optical module testing. The detection device comprises a base, a cover plate, a test fixture, a temperature measurement mechanism and a switch sensor, the cover plate and the base can cover each other to form a feeding inner cavity, and the cover plate can be opened relative to the base to open the feeding inner cavity; the switch sensor is arranged on the base and / or the cover plate and used for monitoring whether the cover plate is in a covering state or an opening state relative to the base; the testing jig is provided with a testing cavity and a feeding opening, the feeding opening is located in the feeding inner cavity and communicated with the feeding inner cavity and the testing cavity, and the feeding opening is used for placing a to-be-detected piece into the testing cavity; the temperature measuring mechanism comprises a driving part and a temperature measuring probe, the temperature measuring probe is located on one side of the testing cavity, and the driving part is connected with the temperature measuring probe and is in communication connection with the switch sensor. The detection device can sense the state of the cover plate through the switch sensor, and automatically switch the state of the temperature measurement probe according to the state of the cover plate, so as to prevent the to-be-detected piece from being damaged when the to-be-detected piece is inserted and pulled.

Description

Technical Field

[0001] This application relates to the field of optical module testing technology, and more specifically, to a testing device. Background Technology

[0002] Currently, in optical module testing devices, temperature measurement commonly uses contact-type temperature measurement methods such as thermocouples or platinum resistance thermometers. A temperature probe is typically placed against the side of the optical module to directly measure its temperature. The temperature probe usually has two states: one is the raised state, where the probe is detached from the optical module for easy insertion or removal from the testing device; the other is the pressed state, where the probe is pressed against the side of the optical module for convenient temperature measurement.

[0003] Currently, the actions of pressing down and lifting the temperature probe are usually performed manually by the operator, which is quite troublesome. Moreover, the operator may forget to lift the temperature probe after measuring the temperature of the optical module. The temperature probe remains pressed against the optical module in the pressed state. If the optical module is inserted or removed at this time, it will be damaged, resulting in product defects. Utility Model Content

[0004] The purpose of this application includes, for example, providing a detection device that can automatically switch the state of a temperature probe to avoid damaging the optical module when plugging or unplugging it.

[0005] The embodiments of this application can be implemented as follows:

[0006] An embodiment of this application provides a detection device, which includes a base, a cover plate, a test fixture, a temperature measuring mechanism, and a switch sensor;

[0007] The cover plate and the base can be closed to each other to form a feeding cavity, and the cover plate can be opened relative to the base to open the feeding cavity;

[0008] The switch sensor is disposed on the base and / or the cover plate, and is used to monitor whether the cover plate is in a closed or open state relative to the base.

[0009] The test fixture is provided with a test cavity and a loading opening. The loading opening is located inside the loading cavity and connects the loading cavity and the test cavity. The loading opening is used to place the part to be tested into the test cavity.

[0010] The temperature measuring mechanism includes a driving component and a temperature measuring probe. The temperature measuring probe is located on one side of the test chamber. The driving component is connected to the temperature measuring probe and is communicatively connected to the switch sensor.

[0011] The driving component is configured such that when the switch sensor detects the closed state, it drives the temperature probe to extend into the test chamber and move toward the object to be tested; when the switch sensor detects the open state, it drives the temperature probe to move away from the object to be tested.

[0012] Optionally, the temperature probe extends into the test chamber and abuts against the test piece placed inside the test chamber to monitor the temperature of the test piece.

[0013] Optionally, the testing device further includes a circuit board assembly, which is fixedly connected to the base, and the test fixture is electrically connected to the circuit board assembly to test the workpiece to be tested.

[0014] Optionally, the circuit board assembly includes a circuit board and a controller. The controller is electrically connected to the circuit board and communicatively connected to the switch sensor and the drive unit, respectively. The controller is configured to receive a status signal monitored by the switch sensor and control the drive unit to drive the temperature probe to extend into or out of the test chamber according to the status signal.

[0015] Optionally, the switch sensor includes a sensor and a sensing element. One of the cover plate and the base is provided with the sensor, and the other of the cover plate and the base is provided with the sensing element. The sensor is used to sense the sensing element. When the sensor senses the sensing element, the cover plate is in a closed state or an open state relative to the base.

[0016] Optionally, the photoelectric switch is provided with a sensing notch, and the sensing pin includes a connecting part and a sensing part connected together. The connecting part is connected to the cover plate or the base. During the movement of the cover plate relative to the base, the sensing part can extend into the sensing notch or disengage from the sensing notch.

[0017] Optionally, the base includes a first base and a second base connected to each other, and the cover plate covers the first base to form the feeding cavity;

[0018] The first base is provided with a first through hole communicating with the inner cavity of the feeding device, the test fixture is provided on the second base, and the feeding opening communicates with the inner cavity of the feeding device through the first through hole.

[0019] Optionally, it also includes a circuit board assembly, which is disposed on the second base, and the test fixture is disposed on the circuit board assembly.

[0020] Optionally, the driving component is disposed on the second base, and the test fixture has a second through hole communicating with the test cavity. The second through hole is configured as a channel for the temperature probe to extend into or exit the test cavity.

[0021] Optionally, the test chamber is provided with a socket for plugging and electrically connecting with the device under test.

[0022] Optionally, a sealing gasket is provided on the first base to cooperate with the cover plate to seal the feeding cavity in the closed state.

[0023] Optionally, the temperature probe is elastically connected to the drive component.

[0024] The beneficial effects of the detection device provided in this application include: using a switch sensor to detect whether the cover plate and the base are closed or open, and automatically driving the temperature probe to come into contact with or detach from the workpiece to be tested according to the different states of the cover plate and the base being closed or open, so as to ensure that when the cover plate is opened and the inner cavity for loading or unloading is opened, the temperature probe is automatically driven to detach from the workpiece to be tested, thus avoiding damage to the workpiece to be tested when picking it up or putting it down. Attached Figure Description

[0025] To more clearly illustrate the technical solutions of the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this application and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0026] Figure 1 This is a schematic diagram of the detection device from a first-view perspective in an embodiment of this application;

[0027] Figure 2 This is a cross-sectional view of the detection device in an embodiment of this application;

[0028] Figure 3 This is a schematic diagram illustrating the communication relationship between the controller, the driver, and the switch sensor in an embodiment of this application;

[0029] Figure 4 This is a schematic diagram of the photoelectric switch and the sensing pin in the embodiments of this application;

[0030] Figure 5 This is a partial structural diagram of the detection device in this embodiment, omitting the cover plate;

[0031] Figure 6 This is a schematic diagram of the detection device from a second perspective in an embodiment of this application;

[0032] Figure 7 for Figure 6 Enlarged view of part A in the middle.

[0033] Icons: 100-Base; 110-First Base; 111-First Through Hole; 112-Sealing Gasket; 113-Base Plate; 114-Side Plate; 120-Second Base; 130-Feeding Cavity; 200-Cover Plate; 300-Test Fixture; 310-Test Chamber; 320-Feeding Opening; 330-Second Through Hole; 400-Temperature Measuring Mechanism; 410-Driver; 420-Temperature Probe; 500-Switch Sensor; 510-Photoelectric Switch; 511-Sensing Notch; 520-Sensing Pin; 521-Connecting Part; 522-Sensing Part; 600-Item to be Tested; 700-Circuit Board Assembly; 710-Circuit Board; 720-Controller. Detailed Implementation

[0034] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. The components of the embodiments of this application described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0035] Therefore, the following detailed description of the embodiments of this application provided in the accompanying drawings is not intended to limit the scope of the claimed application, but merely to illustrate selected embodiments of the application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without inventive effort are within the scope of protection of this application.

[0036] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0037] In the description of this application, it should be noted that if terms such as "upper," "lower," "inner," or "outer" are used to indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship that the utility model product is usually placed in during use, they are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.

[0038] Furthermore, the terms "first" and "second" are used only to distinguish descriptions and should not be interpreted as indicating or implying relative importance.

[0039] It should be noted that, where there is no conflict, the features in the embodiments of this application can be combined with each other.

[0040] The inventors of this application have discovered that the current actions of pressing down and lifting the temperature probe are usually performed manually by the operator, which is cumbersome. Furthermore, the operator often forgets to lift the temperature probe after measuring the temperature of the optical module. Since the temperature probe remains pressed against the optical module, inserting or removing the optical module under these conditions can damage it. Embodiments of this application provide a detection device that at least addresses the aforementioned technical problems.

[0041] Please refer to Figures 1-7 The detection device provided in the embodiments of this application includes a base 100, a cover plate 200, a test fixture 300, a temperature measuring mechanism 400, and a switch sensor 500. The cover plate 200 and the base 100 can be closed to form a loading cavity 130, and the cover plate 200 can be opened relative to the base 100 to open the loading cavity 130. The switch sensor 500 is disposed on the base 100 and / or the cover plate 200 and is used to monitor whether the cover plate 200 is in a closed or open state relative to the base 100. The test fixture 300 is provided with a test cavity 310 and a loading opening 320. The loading opening 320 is located inside the loading cavity 130 and communicates with the loading cavity 130. The test chamber 310 and the loading opening 320 are used to place the test piece 600 into the test chamber 310. The temperature measuring mechanism 400 includes a drive unit 410 and a temperature measuring probe 420. The temperature measuring probe 420 is located on one side of the test chamber 310. The drive unit 410 is connected to the temperature measuring probe 420 and is communicatively connected to the switch sensor 500. The drive unit 410 is configured such that when the switch sensor 500 detects a closed state, it drives the temperature measuring probe 420 to extend into the test chamber 310 and move toward the test piece 600. When the switch sensor 500 detects an open state, it drives the temperature measuring probe 420 to move away from the test piece 600.

[0042] When testing products, such as testing the performance of an optical module under different temperature environments, the cover 200 needs to be opened to open the loading cavity 130 so that the optical module can be placed or removed. After loading is completed, the cover 200 needs to be closed to seal the loading cavity 130, and the temperature of the optical module needs to be monitored during testing. Therefore, when the switch sensor 500 detects that the cover 200 and the base 100 have switched to the closed state, it sends a first state signal. After receiving the first state signal, the drive unit 410 drives the temperature probe 420 to extend into the test cavity 310 and move towards the test object 600. When the switch sensor 500 detects that the cover and the base have switched to the open state, it sends a second state signal. After receiving the second state signal, the drive unit 410 drives the temperature probe 420 to move away from the test object 600. The switch sensor 500 and the drive unit 410 can transmit the above state signals wirelessly or via wired connection.

[0043] To more accurately monitor the temperature of the test piece 600, the drive unit 410 drives the temperature probe 420 to extend into the test chamber 310 until it abuts against the test piece 600 placed inside the test chamber 310 to monitor the temperature of the test piece 600. This ensures that the temperature probe 420 makes contact with the test piece 600, allowing for faster and more accurate temperature measurement. When the switch sensor 500 detects an on state, the drive unit 410 drives the temperature probe 420 to move away from the test piece 600, causing the temperature probe 420 to detach from the test piece 600. At this point, removing the test piece 600 or inserting a new test piece 600 will not damage the test piece 600.

[0044] A switch sensor 500 is used to detect whether the cover plate 200 is in a closed or open state. Based on whether the cover plate 200 is in a closed or open state, the temperature probe 420 is automatically driven to come into contact with or detach from the workpiece 600 to be tested. When the cover plate 200 is opened and the loading cavity 130 is opened to prepare for loading or unloading, the drive unit 410 can automatically drive the temperature probe 420 to detach from the workpiece 600 to avoid damage to the workpiece 600 when picking it up or putting it down.

[0045] In some embodiments, the testing device further includes a circuit board assembly 700, which is fixedly connected to the base 100, and a test fixture 300 is electrically connected to the circuit board assembly 700 to test the test piece 600.

[0046] With the test fixture 300 electrically connected to the circuit board assembly 700, the test piece 600 is placed into the test chamber 310 through the loading opening 320, and the test fixture 300 supplies power to the test piece 600 and tests the test piece 600.

[0047] In some embodiments, the circuit board assembly 700 includes a circuit board 710 and a controller 720. The controller 720 may be disposed on the circuit board 710. The circuit board 710 and the drive unit 410 are both disposed on the base 100. The controller 720 is electrically connected to the circuit board 710 and is communicatively connected to the switch sensor 500 and the drive unit 410, respectively. The controller 720 is configured to receive the status signal monitored by the switch sensor 500 and control the drive unit 410 to drive the temperature probe 420 to extend into or out of the test chamber 310 according to the status signal.

[0048] When the controller 720 receives a first status signal from the switch sensor 500, it controls the drive unit 410 to drive the temperature probe 420 into the test chamber 310 and towards the object under test 600. When the controller 720 receives a second status signal from the switch sensor 500, it controls the drive unit 410 to drive the temperature probe 420 away from the object under test 600. The signal between the switch sensor and the controller 720 can be transmitted wirelessly or via a wired connection, and the signal between the drive unit 410 and the controller 720 can also be transmitted wirelessly or via a wired connection.

[0049] In some embodiments, the circuit board 710 is provided with a test circuit for testing the electrical performance of the device under test 600, and the controller 720 can also be used to control the operation of the test circuit.

[0050] In some embodiments, the switch sensor 500 includes a sensor and a sensing element. One of the cover plate 200 and the base 100 is provided with a sensor, and the other of the cover plate 200 and the base 100 is provided with a sensing element. During the movement of the cover plate 200 relative to the base 100, the sensor is used to sense the sensing element. When the sensor senses the sensing element, the cover plate 200 is in a closed state or an open state relative to the base 100.

[0051] One of the cover plate 200 and the base 100 is provided with a sensor, and the other of the cover plate 200 and the base 100 is provided with a sensing element, including: the cover plate 200 is provided with a sensor and the base 100 is provided with a sensing element, or the cover plate 200 is provided with a sensing element and the base 100 is provided with a sensor, wherein the sensor is communicatively connected to the drive 410 or the controller.

[0052] The sensor has a sensing area. When the sensor enters the sensing area of ​​the sensor, it means that the cover 200 is in the closed state. When the sensor leaves the sensing area of ​​the sensor, it means that the cover 200 is in the open state.

[0053] When the sensor detects that the cover is closed, the drive unit 410 receives the first status signal sent by the sensor, thereby driving the temperature probe 420 to extend into the test chamber 310 and move toward the object to be tested 600. When the sensor detects that the cover is open, the drive unit 410 receives the second status signal sent by the sensor, thereby driving the temperature probe 420 to move away from the object to be tested 600.

[0054] In other embodiments, the switch sensor 500 may also be a single-piece structure, disposed only on the base 100 or the cover 200, for monitoring changes in the relative position between the base 100 and the cover 200. The switch sensor 500 has a sensing area. When the switch sensor 500 is disposed on the base 100 or the cover 200, and the relative position between the base 100 and the cover 200 changes, the switch sensor 500 can detect the cover 200 entering and exiting the sensing area. When the cover 200 is detected entering the sensing area, it indicates that the cover 200 is in a closed state; when the cover 200 is detected exiting the sensing area, it indicates that the cover 200 is in an open state.

[0055] Please refer to Figure 4 In an optional embodiment, the sensor is a photoelectric switch 510 and the sensing element is a sensing pin 520.

[0056] It should be noted that the photoelectric switch 510 is short for photoelectric proximity switch. It uses the blocking or reflection of light beam by the object being detected to connect the circuit through the synchronous circuit, thereby detecting the presence or absence of the object. The object is not limited to metal. All objects that can reflect light (or block light) can be detected. In this embodiment, the object being detected is the sensing pin 520.

[0057] Specifically, in this embodiment, the photoelectric switch 510 is provided with a sensing notch 511, and the sensing pin 520 includes a connecting part 521 and a sensing part 522 connected together. The connecting part 521 is connected to the cover plate 200 or the base 100. During the process of the cover plate 200 closing or opening relative to the base 100, the sensing part 522 extends into the sensing notch 511. At this time, the sensing part 522 enters the sensing area of ​​the photoelectric switch 510, or the sensing part 522 disengages from the sensing notch 511. At this time, the sensing part 522 exits the sensing area of ​​the photoelectric switch 510.

[0058] In other embodiments, the sensor may be a sensor other than the photoelectric switch 510. For example, the sensor may be a displacement sensor, which sends different signals to the drive unit 410 by detecting that the sensing element is in different positions.

[0059] In some embodiments, the test chamber 310 is provided with a socket for plugging and electrically connecting with the test piece 600.

[0060] The test piece 600 can be an optical module. The test fixture 300 has an optical cage with a socket inside. The optical module can be plugged into the optical cage and electrically connected to the circuit board 710 through the socket. The side wall of the optical cage also has a through hole. When the cover plate 200 is closed, the temperature probe 420 extends into the optical cage through the through hole and abuts against the side wall of the optical module. When the cover plate 200 is opened, the temperature probe 420 is removed from the optical cage and detached from the optical module.

[0061] When performing various performance tests on the optical module, it is necessary to monitor the temperature of the optical module. This testing device can automatically switch the state of the temperature probe 420. Specifically, during the testing process of the optical module, the cover plate 200 needs to be opened, and the optical module is inserted into or removed from the test chamber 310 through the loading cavity 130. At this time, the temperature probe 420 automatically detaches from the optical module, ensuring that the temperature probe 420 does not come into contact with the optical module when inserting or removing the optical module, thereby avoiding damage to the optical module. When the optical module is inserted into the test chamber 310 for testing, the cover plate 200 needs to be closed to provide a better testing environment. Therefore, when the cover plate 200 is closed, the temperature probe 420 automatically comes into contact with the optical module to directly measure the temperature of the optical module.

[0062] Please refer to Figures 5-7 In some embodiments, the base 100 includes a first base 110 and a second base 120 connected to each other. The cover plate 200 covers the first base 110 to form a feeding cavity 130. The first base 110 has a first through hole 111 that communicates with the feeding cavity 130. The test fixture 300 is disposed on the second base 120, and the feeding opening 320 communicates with the feeding cavity 130 through the first through hole 111.

[0063] Specifically, in this embodiment, the first base 110 includes a base plate 113 and a side plate 114 that separates the first base 110 from the second base 120. A first through hole 111 is located on the side plate 114 and penetrates through the side plate 114. The loading opening 320 extends into the loading cavity 130 through the first through hole 111 and the side plate 114, so that the workpiece 600 to be tested can be placed into the test chamber 310 from the loading cavity 130 through the loading opening 320.

[0064] During the testing of the test piece 600, the test piece 600 needs to be placed into the test chamber 310 through the loading opening 320, so that part of the test piece 600 is located in the test chamber 310. At this time, the temperature probe 420 can contact the part of the test piece 600 located in the test chamber 310 to measure the temperature.

[0065] When the testing device includes a circuit board assembly 700, the circuit board assembly 700 is disposed on the second base 120, and the test fixture 300 is disposed on the circuit board assembly 700. Specifically, the test fixture 300 is disposed on the circuit board 710 in the circuit board assembly 700.

[0066] In some embodiments, the drive member 410 is disposed on the second base 120, and the test fixture 300 is provided with a second through hole 330 communicating with the test cavity 310. The second through hole 330 is configured as a channel for the temperature probe 420 to extend into or exit the test cavity 310.

[0067] In this embodiment, the axial direction of the first through hole 111 is perpendicular to the axial direction of the second through hole 330, and the movement direction of the temperature probe 420 is consistent with the axial direction of the second through hole 330. In some embodiments, the axial direction of the second through hole 330 may not be perpendicular to the axial direction of the first through hole 111, and can be set according to actual needs.

[0068] When the photoelectric switch 510 senses that the cover plate 200 is in the closed state, the temperature probe 420 extends into the test channel through the second through hole 330 and the through hole in the side wall of the photocage in sequence, and abuts against the test piece 600; when the photoelectric switch 510 senses that the cover plate 200 is in the open state, the temperature probe 420 exits the test chamber 310 through the through hole in the side wall of the photocage and the second through hole 330 in sequence.

[0069] In an optional embodiment, the drive element 410 is one of a drive motor, a drive cylinder, or a drive electric cylinder, wherein the drive motor may be a linear motor.

[0070] In some embodiments, a sealing gasket 112 is provided on the first base 110. The sealing gasket 112 is disposed on the surface of the first base 110 facing the cover plate 200. When the cover plate 200 and the first base 110 are closed, it plays a role in sealing and protecting, and cooperates with the cover plate 200 to seal the feeding cavity 130 in the closed state.

[0071] In some embodiments, the temperature probe 420 is elastically connected to the drive member 410. When the temperature probe 420 moves toward the object to be tested 600 and abuts against the object to be tested 600, it can act as a buffer to prevent damage to the object to be tested 600. For example, a buffer member is provided between the temperature probe 420 and the drive member 410.

[0072] In this embodiment, the cover plate 200 and the base 100 are rotatably connected.

[0073] When the base 100 includes a first base 110 and a second base 120, the cover plate 200 is hinged to the first base 110, so that the cover plate 200 can rotate relative to the first base 110, and rotating the cover plate 200 causes the cover plate 200 to cover the first base 110.

[0074] In other embodiments, the cover plate 200 may also slide with the first base 110 or the second base 120. For example, one of the cover plate 200 and the base 100 is provided with a slider, and the other is provided with a groove, with the slider and the groove slidingly engaged.

[0075] In summary, the embodiments of this application provide a detection device. This detection device uses a switch sensor 500 to detect whether the cover plate 200 is in a closed or open state relative to the base 100. Based on the different states of the cover plate 200, the temperature probe 420 is automatically driven to abut or detach from the workpiece 600 to be tested. This ensures that when the cover plate 200 is opened and the loading cavity 130 is opened to prepare for loading or unloading, the temperature probe 420 is automatically driven to detach from the workpiece 600 to be tested, thus avoiding damage to the workpiece 600 when it is picked up or placed.

[0076] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A detection device, characterized in that, The detection device comprises a base, a cover plate, a test fixture, a temperature measuring mechanism and a switch sensor. The cover plate and the base can be mutually closed to form a feeding cavity, and the cover plate can be opened relative to the base to open the feeding cavity. The switch sensor is arranged on the base and / or the cover plate, and is used for monitoring whether the cover plate is in a closed state or an open state relative to the base. The test fixture is provided with a test cavity and a feeding opening, the feeding opening is located in the feeding cavity and communicates the feeding cavity with the test cavity, and the feeding opening is used for placing a to-be-detected piece into the test cavity. The temperature measuring mechanism comprises a driving member and a temperature measuring probe, the temperature measuring probe is located on one side of the test cavity, the driving member is connected with the temperature measuring probe and is communicatively connected with the switch sensor. The driving member is configured to drive the temperature measuring probe to extend into the test cavity and move towards the to-be-detected piece when the switch sensor monitors the closed state, and drive the temperature measuring probe to move away from the to-be-detected piece when the switch sensor monitors the open state.

2. The detection device of claim 1, wherein, The temperature measuring probe extends into the test cavity to abut against the to-be-detected piece placed in the test cavity to monitor the temperature of the to-be-detected piece.

3. The detection device of claim 1, wherein, The detection device further comprises a circuit board assembly, the circuit board assembly is fixedly connected with the base, and the test fixture is electrically connected with the circuit board assembly to test the to-be-detected piece.

4. The detection device of claim 3, wherein, The circuit board assembly comprises a circuit board and a controller, the controller is electrically connected with the circuit board and is communicatively connected with the switch sensor and the driving member, respectively; the controller is configured to receive a state signal monitored by the switch sensor and control the driving member to drive the temperature measuring probe to extend into or exit from the test cavity according to the state signal.

5. The detection device of claim 1, wherein, The switch sensor comprises an inductor and an inductive piece, one of the cover plate and the base is provided with the inductor, and the other of the cover plate and the base is provided with the inductive piece; the inductor is used for inducting the inductive piece, and when the inductor inducts the inductive piece, the cover plate is in the closed state or the open state relative to the base.

6. The detection device of claim 1, wherein, The base comprises a first base and a second base connected with each other, and the cover plate is closed with the first base to form the feeding cavity. The first base is provided with a first through hole communicating the feeding cavity, the test fixture is arranged on the second base, and the feeding opening communicates the feeding cavity through the first through hole.

7. The detection device of claim 6, wherein, The detection device further comprises a circuit board assembly, the circuit board assembly is arranged on the second base, and the test fixture is arranged on the circuit board assembly.

8. The detection device of claim 6, wherein, The driving member is arranged on the second base, and the test fixture is provided with a second through hole communicating the test cavity, the second through hole is configured as a channel for the temperature measuring probe to extend into or exit from the test cavity.

9. The detection device of claim 6, wherein, The first base is provided with a sealing gasket to seal the feeding cavity in the closed state of the cover plate.

10. The detection device of claim 1, wherein, The test cavity is provided with a socket for plugging and electrically connecting with the to-be-detected piece.

11. The detection device of claim 1, wherein, The temperature measuring probe is elastically connected with the driving member.

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