Sample rack in-place structure, sample rack feeding module and analyzer

Abstract

The utility model belongs to the technical field of in-vitro diagnostic instruments, and discloses a sample rack in-place structure, a sample rack feeding module and an analyzer. The sample frame in-place mechanism comprises a sample frame and a door plate, a handle is arranged on one side of the sample frame, a first structure is arranged at the end, close to the door plate, of the handle, and correspondingly, a second structure in matched contact with the first structure is arranged on the door plate. According to the sample frame in-place mechanism, the linkage in-place mechanism is arranged on the sample frame and the door plate, so that under the condition that the sample frame is not placed in place, the door plate is in contact with the sample frame handle in the buckling / closing process, the sample frame is driven to slide in place through contact connection of the first structure and the second structure, and instrument faults are avoided. According to the analyzer sample rack, the process of placing the sample rack into the sample placing area is smoother and guaranteed, and the instrument runs more stably and safely.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of in-vitro diagnostic instruments, and particularly relates to a sample rack in-place structure, a sample rack feeding module and an analyzer. BACKGROUND

[0002] In an in-vitro diagnostic instrument, a sample placement area is generally provided, and a sample tube or a sample cup is generally placed in a sample rack, and then the sample rack is placed in the sample placement area. During the process of placing the sample rack in the sample placement area, the sample rack may not be placed in place, which may cause an instrument failure. CONTENT OF THE UTILITY MODEL

[0003] In view of the instrument failure caused by the sample rack not being placed in place in the prior art, the application provides a sample rack in-place structure, a sample rack feeding module and an analyzer.

[0004] The sample rack in-place structure provided by the application comprises a sample rack and a door plate, one side of the sample rack is provided with a handle, the handle is provided with a first structure at a door plate end, and correspondingly, the door plate is provided with a second structure matched with the first structure for contact. In the case that the sample rack is not placed in place, the door plate is in contact with the handle of the sample rack during buckling / closing, and the first structure and the second structure are in contact to drive the sample rack to slide into place.

[0005] As a technical solution, the first structure is a convex rib provided at a free end of the handle, and the second structure is a convex edge provided on the door plate and matched with the convex rib for buckling.

[0006] As a technical solution, when the convex rib and the convex edge are in contact, the convex edge is located above the convex rib.

[0007] The sample rack feeding module provided by the application comprises a mounting frame, a sample rack, a sample tray and a door plate. The mounting frame comprises a front support plate and a rear support plate, the front support plate is provided with a sample inlet, and the sample inlet is hingedly connected with a door plate which can be opened and closed. The sample tray is installed between the front support plate and the rear support plate, the sample tray is provided with sample rack placement grooves which are distributed side by side and pass through front and back, and the sample tray is slidingly arranged on a sliding rail and is close to or away from the sample inlet under the action of an external force. The sample rack is provided with a handle, the handle is provided with a first structure at a door plate end, and correspondingly, the door plate is provided with a second structure matched with the first structure for contact.

[0008] In the case that the sample rack is not placed in place, the door plate is in contact with the handle of the sample rack during buckling / closing, and the first structure and the second structure are in contact to drive the sample rack to slide into place.

[0009] As a technical scheme, the first structure is a convex rib arranged at the free end of the handle, and the second structure is a convex edge arranged on the door plate and matched with the convex rib for pressing. Further, when the convex rib and the convex edge are in contact, the convex edge is above the convex rib.

[0010] As a technical scheme, a locating mechanism is arranged between the sample holder and the sample tray. Specifically, a first magnet is arranged at the bottom of the sample holder, and a second magnet is arranged at a position corresponding to the first magnet on the sample holder placing groove. In the case that the sample holder is not placed in position, the sample holder is driven to slide into position due to the attraction between the first magnet and the second magnet.

[0011] As a technical scheme, a platform plate is further arranged between the sample tray and the door plate, and the height of the platform plate is slightly higher than the height of the sample holder placing groove of the sample tray. By setting the height difference to enlarge the distance interval between the two magnets, the splashing of liquid caused by the too fast movement of the sample holder due to the too large attraction of the two magnets is avoided. Preferably, the platform plate is 0-5 mm higher than the sample holder placing groove, for example, 1 mm, 2 mm, 3 mm, 4 mm or 5 mm.

[0012] As a technical scheme, a buffer plate is arranged on the rear support plate. When the sample holder is placed in the sample holder placing groove, if the sample holder slides too much backward and touches the buffer plate, the sample holder is gradually returned to the original position under the action of the buffer plate.

[0013] The analyzer described in the present application comprises the aforementioned sample holder locating mechanism or sample holder feeding module.

[0014] Beneficial effects: The sample holder locating mechanism and the sample holder feeding module in the present application are arranged on the sample holder and the door plate to form a linkage locating mechanism. In the case that the sample holder is not placed in position, the door plate contacts the handle of the sample holder during the process of being buckled / closed, and the sample holder is driven to slide into position by the contact between the first structure and the second structure, thereby avoiding the failure of the instrument. The process of placing the sample holder in the sample placing area of the analyzer in the present application is smoother and more secure, and the instrument runs more stably and safely. BRIEF DESCRIPTION OF DRAWINGS

[0015] Figure 1 is a schematic view of a sample holder locating mechanism;

[0016] Figure 2 is a partial enlarged view of Figure 1 ;

[0017] Figure 3 is a schematic view of a sample holder feeding module;

[0018] Figure 4 is an exploded view of Figure 3 ;

[0019] Figure 5 isFigure 1 Door plate closing operation state schematic diagram;

[0020] Figure 6 is Figure 5 Door plate closing operation state schematic diagram;

[0021] Figure 7 is a rack-in module schematic diagram without sample rack in place structure;

[0022] Figure 8 is Figure 7 Door plate closing operation state schematic diagram. DETAILED DESCRIPTION

[0023] The technical scheme of the present application will be described in detail below in combination with the drawings and specific embodiments.

[0024] Embodiment 1

[0025] As Figure 1 shown, a sample rack in place mechanism includes a sample rack 2 and a door plate 4, the sample rack 2 is provided with a handle 21 on one side, the handle 21 is provided with a first structure 211 near the end of the door plate 4, and the door plate 4 is provided with a second structure 41 matched with the first structure 211. Figure 2 , the first structure 211 is a protruding rib provided at the free end of the handle 21, the second structure 41 is a protruding edge provided on the door plate 4 matched with the protruding rib, and the protruding edge is above the protruding rib.

[0026] Embodiment 2

[0027] As Figure 1 and Figure 3 shown, a sample rack-in module includes a mounting frame 1, a sample rack 2, a sample tray 3 and a door plate 4; the mounting frame 1 includes a front support plate 11 and a rear support plate 12, the front support plate 11 is provided with a sample inlet, and the door plate 4 is hingedly connected at the sample inlet.

[0028] In combination Figure 4 , the sample tray 3 is installed between the front support plate 11 and the rear support plate 12, and the sample tray 3 is provided with sample rack placing grooves 31 distributed side by side and penetrating front and back; the sample tray 3 is slidingly arranged on the slide rail 5 and is close to or away from the sample inlet under the action of external force. The sample rack 2 is provided with a handle 21, the handle 21 is provided with a first structure 211 near the end of the door plate 4, and the door plate 4 is provided with a second structure 41 matched with the first structure 211. As Figure 2 shown, the first structure 211 is a protruding rib provided at the free end of the handle 21, the second structure 41 is a protruding edge provided on the door plate 4 matched with the protruding rib, and the protruding edge is above the protruding rib.

[0029] As Figure 1As shown, the bottom of the sample holder 2 is provided with a first magnet 6, and the sample holder placing groove 31 is provided with a second magnet 7 corresponding to the position of the first magnet 6. When the sample holder 2 is not placed in place, the first magnet 6 and the second magnet 7 are attracted to each other, driving the sample holder 2 to slide into place. A platform plate 8 is further provided between the sample tray 3 and the door plate 4, and the height of the platform plate 8 is slightly higher than the height of the sample tray sample holder placing groove 31. In this embodiment, the platform plate 8 is 2mm higher than the sample holder placing groove 31.

[0030] In some embodiments, a buffer plate 9 is mounted on the rear support plate 12. When the sample holder 2 is placed in the sample holder placing groove 31, if the sample holder 2 slides too far backward and touches the buffer plate 9, the sample holder 2 will gradually return to its original position under the action of the buffer plate 9.

[0031] Operation process: Figure 7 And Figure 8 For the sample holder placing module without a sample holder to place structure, when the sample holder is placed in the sample holder placing groove but not in place, and the door plate is closed, if the friction between the sample holder and the door plate is too small, the sample holder handle may be raised. At this time, if the sample tray runs along the slide rail, the sample holder may be stuck to the door plate, causing operation failure. The sample holder placing module of the present embodiment can avoid the above situation, as shown in Figure 1 And Figure 5 As shown, during the closing process of the door plate, due to the design of the convex edge on the door plate and the convex rib on the handle, when the convex edge contacts the convex rib, a downward force is applied to push the sample holder into the sample holder placing groove. In the case where a first magnet and a second magnet are provided, as shown in Figure 6 Under the action of the magnetic force, the sample holder quickly returns to its original position. If the sample holder is placed with too much force and runs too far backward, the sample holder will collide with the buffer plate and then return to its original position stably.

[0032] Embodiment 3

[0033] An analyzer comprising the sample holder to place mechanism of embodiment 1 or the sample holder placing module of embodiment 2, which ensures smooth and reliable sample feeding operation.

Claims

1. A sample holder in place mechanism characterized by, The sample rack (2) is provided with a handle (21) on one side, and the handle (21) is provided with a first structure (211) near the door plate end, and correspondingly, the door plate (4) is provided with a second structure (41) matched with the first structure (211).

2. The sample holder indexing mechanism of claim 1, wherein, The first structure (211) is a convex rib provided at the free end of the handle (21), and the second structure (41) is a convex edge provided on the door plate (4) and matched with the convex rib.

3. The sample holder indexing mechanism of claim 2, wherein, When the convex rib and the convex edge are in contact, the convex edge is above the convex rib.

4. A sample rack in-rack module, comprising: The installation rack (1), the sample rack (2), the sample tray (3) and the door plate (4) are included. The installation rack (1) includes a front support plate (11) and a rear support plate (12), and the front support plate (11) is provided with a sample inlet, and the sample inlet is hingedly connected with a door plate (4) which can be opened and closed. The sample tray (3) is installed between the front support plate (11) and the rear support plate (12), and the sample tray (3) is provided with sample rack placing grooves (31) which are distributed side by side and pass through front and back, and the sample tray (3) is slidingly arranged on the slide rail (5) and is close to or away from the sample inlet under the action of external force. The sample rack (2) is provided with a handle (21) on one side, and the handle (21) is provided with a first structure (211) near the door plate end, and correspondingly, the door plate (4) is provided with a second structure (41) matched with the first structure (211).

5. The sample rack in-rack module of claim 4, wherein, The first structure (211) is a convex rib provided at the free end of the handle (21), and the second structure (41) is a convex edge provided on the door plate (4) and matched with the convex rib.

6. The sample rack in-rack module of claim 5, wherein, When the convex rib and the convex edge are in contact, the convex edge is above the convex rib.

7. The sample rack in-rack module of claim 4, wherein, The sample rack (2) is provided with a first magnet (6) at the bottom, and the sample rack placing groove (31) is provided with a second magnet (7) corresponding to the position of the first magnet (6).

8. The sample rack in-rack module of claim 4, wherein, The sample tray (3) and the door plate (4) are further provided with a platform plate (8), and the height of the platform plate (8) is higher than the height of the sample rack placing groove (31) of the sample tray.

9. The sample rack in-rack module of claim 4, wherein, The rear support plate (12) is provided with a buffer plate (9).

10. An analyzer characterized by, The sample rack to position mechanism of any one of claims 1-3, or the sample rack into rack module of any one of claims 4-9 is included.

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