Insulation detection jig for MOS (Metal Oxide Semiconductor) tube

Abstract

The utility model discloses an MOS tube insulation detection tool, which relates to the technical field of MOS tube detection and comprises a substrate. A sliding groove is formed between the base plate and the fixing frame, a bearing plate is slidably connected to the inner side of the sliding groove, and a plurality of containing grooves are evenly formed in the inner side of the bearing plate. An electric telescopic rod is arranged at the top end of the L-shaped supporting plate, and the output end of the electric telescopic rod is fixedly connected with a fixing sleeve. According to the utility model, the bearing plate is arranged, the inner side of the bearing plate is provided with the plurality of placing grooves, and the inner sides of the placing grooves are provided with the clamping assemblies, so that a plurality of MOS tubes can be fixed and clamped at the same time, the bearing plate can slide at the inner sides of the sliding grooves, and the MOS tubes can be conveniently detected one by one; the position of the detection head can be adjusted, so that different pins on the MOS tube can be detected, problems can be quickly found out when the MOS tube goes wrong, and the detection effect is improved.

Description

Technical Field

[0001] This utility model relates to the field of MOSFET testing technology, and in particular to a MOSFET insulation testing fixture. Background Technology

[0002] Insulation testing of MOSFETs mainly focuses on the insulation performance between its gate and other electrodes, as well as whether there is leakage or breakdown inside the transistor.

[0003] Utility model patent No. 202221868481.4 discloses a MOS tube insulation testing fixture, including a support component, a lifting component, a testing component, and a fixing component. The lifting component, testing component, and fixing component are all disposed on the support component. The fixing component is provided with a mounting groove for mounting an aluminum strip that locks the MOS tube. The testing component includes an indicator light panel, a test platform, and a test probe. The indicator light panel is disposed on the support component. The test platform is mounted and connected to the lifting component. The test probe is mounted on the test platform, with the test end of the test probe aligned with the mounting groove. The indicator light panel is electrically connected to the test probe. The fixing component is electrically connected to the indicator light panel. The lifting component is used to drive the test probe to move up and down so that the test end of the test probe can abut against the MOS tube in the mounting groove.

[0004] However, the above-mentioned device still has some drawbacks in actual use. The most obvious one is that, although the MOSFET detection device can quickly detect multiple MOSFETs and identify the problematic MOSFETs, it cannot accurately locate the problematic pins because MOSFETs have many pins. It cannot accurately pinpoint the problem and cannot determine whether the MOSFET is leaking, short-circuited, internally open-circuited, or has amplification function based on the measurement results. This results in poor detection results and requires additional detection steps to re-detect it, increasing the detection cost.

[0005] Therefore, it is necessary to invent a MOS transistor insulation testing fixture to solve the above problems. Utility Model Content

[0006] The purpose of this utility model is to provide a MOSFET insulation testing fixture. By setting a carrier plate with multiple placement slots on its inner side, and clamping components on the inner side of each slot, multiple MOSFETs can be simultaneously clamped and fixed. The carrier plate can slide within a sliding groove, facilitating the individual testing of each MOSFET. A multimeter and a testing plate are also included, and the testing head can be adjusted to test different pins on the MOSFET. This allows for rapid identification of problems when MOSFETs malfunction, improving testing efficiency. This addresses the issue raised in the background art where existing MOSFET testing devices, while capable of quickly testing multiple MOSFETs and identifying problematic ones, often fail to accurately pinpoint the faulty pin due to the large number of pins on the MOSFET. This makes it impossible to determine whether the MOSFET is leaking, short-circuited, internally open-circuited, or has amplification capabilities based on measurement results, leading to poor testing results and requiring additional testing steps for retesting, increasing testing costs.

[0007] According to one aspect of this disclosure, the following technical solution is provided: a MOS transistor insulation testing fixture, including a substrate, an L-shaped support plate fixedly connected to the top of the substrate, a fixing frame provided on one side of the substrate, and legs fixedly connected to the bottom of both the substrate and the fixing frame, and a connecting rod fixedly connected between the two legs.

[0008] A sliding groove is provided between the substrate and the fixing frame, and a bearing plate is slidably connected to the inner side of the sliding groove. A plurality of placement slots are evenly provided on the inner side of the bearing plate.

[0009] An electric telescopic rod is provided at the top of the L-shaped support plate. A fixed sleeve is fixedly connected to the output end of the electric telescopic rod. A multimeter is provided inside the fixed sleeve. A test plate is provided at the bottom of the multimeter.

[0010] The inner side of the detection plate is evenly provided with a plurality of insertion holes, and a detection head can be provided inside the insertion holes.

[0011] According to at least one embodiment of the present disclosure, a MOS transistor insulation testing fixture is provided at the top of the L-shaped support plate, the operation panel is electrically connected to a multimeter via a wire, and the plug hole is electrically connected to the multimeter.

[0012] According to at least one embodiment of the present disclosure, a MOS transistor insulation testing fixture is provided, wherein a fixed pressure plate is fixedly connected to one end of the inner side of the placement groove, and a moving pressure plate is provided at the other end of the inner side of the placement groove. An insulating pad is provided on the corresponding side of the fixed pressure plate and the moving pressure plate. An adjusting bolt is threadedly connected to the inner side of the bearing plate, and the end of the adjusting bolt is rotatably disposed on the inner side of the moving pressure plate.

[0013] According to at least one embodiment of the present disclosure, a MOS transistor insulation testing fixture is provided with a groove on the side of the fixing frame near the substrate, and a limiting slide plate is fixedly connected to one side of the bottom end of the support plate, the limiting slide plate being slidably connected to the inner side of the fixing frame.

[0014] According to at least one embodiment of the present disclosure, a MOS transistor insulation testing fixture is provided with a positioning hole at the bottom end of the adjusting bolt, and a pin is provided on the outer side of the fixing frame, with the pin and the positioning hole corresponding to each other.

[0015] The technical effects and advantages of this utility model are as follows:

[0016] (1) This utility model sets up a carrier plate with multiple placement slots on the inner side of the carrier plate and clamping components on the inner side of the placement slots, which can simultaneously fix and clamp multiple MOS transistors. The carrier plate can slide on the inner side of the slide, which facilitates the testing of each MOS transistor. At the same time, a multimeter and a test board are set up, and the position of the test head can be adjusted to test different pins on the MOS transistor. This can quickly find the problem when the MOS transistor has a problem, thus improving the testing effect. Attached Figure Description

[0017] The accompanying drawings illustrate exemplary embodiments of the present disclosure and, together with the description thereof, serve to explain the principles of the present disclosure. These drawings are included to provide a further understanding of the present disclosure and are incorporated in and constitute a part of this specification.

[0018] Figure 1 This is a schematic diagram of the overall structure of a MOS transistor insulation testing fixture according to one embodiment of the present disclosure.

[0019] Figure 2 for Figure 1 A schematic diagram of the structure at point A in the middle.

[0020] Figure 3 This is a schematic diagram of the main structure of a multimeter in a MOS transistor insulation testing fixture according to one embodiment of the present disclosure.

[0021] Figure 4 This is a front view schematic diagram of the detection board in a MOS transistor insulation testing fixture according to one embodiment of the present disclosure.

[0022] The specific labels in the attached figures are as follows:

[0023] 1. Base plate; 11. L-shaped support plate; 12. Support leg; 13. Connecting rod; 14. Fixing frame; 15. Slide groove; 16. Groove;

[0024] 2. Bearing plate; 21. Placement slot; 22. Fixed pressure plate; 23. Dynamic pressure plate; 24. Insulating rubber pad; 25. Adjusting bolt; 26. Positioning hole; 27. Limiting slide plate;

[0025] 3. Electric telescopic pole;

[0026] 4. Control panel;

[0027] 5. Bolt;

[0028] 6. Multimeter; 61. Fixing sleeve;

[0029] 7. Detection plate; 71. Connecting hole; 72. Detection head. Detailed Implementation

[0030] like Figures 1-4 As shown, a MOS transistor insulation testing fixture disclosed herein may include a substrate 1, an L-shaped support plate 11 fixedly connected to the top of the substrate 1, a fixing frame 14 provided on one side of the substrate 1, and a support leg 12 fixedly connected to the bottom of both the substrate 1 and the fixing frame 14, and a connecting rod 13 fixedly connected between the two support legs 12.

[0031] A sliding groove 15 is provided between the substrate 1 and the fixing frame 14. A bearing plate 2 is slidably connected to the inner side of the sliding groove 15. A plurality of placement grooves 21 are evenly provided on the inner side of the bearing plate 2.

[0032] An electric telescopic rod 3 is provided at the top of the L-shaped support plate 11. A fixed sleeve 61 is fixedly connected to the output end of the electric telescopic rod 3. A multimeter 6 is provided inside the fixed sleeve 61. A test plate 7 is provided at the bottom of the multimeter 6.

[0033] Multiple insertion holes 71 are evenly arranged on the inner side of the detection plate 7, and a detection head 72 can be arranged on the inner side of the insertion hole 71.

[0034] Therefore, by setting up a carrier plate 2, with multiple placement slots 21 on the inner side of the carrier plate 2 and clamping components on the inner side of the placement slots 21, multiple MOSFETs can be fixed and clamped at the same time. The carrier plate 2 can slide inside the slide groove 15, which facilitates the testing of MOSFETs one by one. At the same time, a multimeter 6 and a test plate 7 are set up, and the position of the test head 72 can be adjusted to test different pins on the MOSFET. When a problem occurs in the MOSFET, the problem can be quickly found, thus improving the testing effect.

[0035] like Figure 1 and Figure 3 As shown, in a preferred embodiment, the top of the L-shaped support plate 11 is provided with an operation panel 4, which can be electrically connected to the multimeter 6 via wires, and the plug hole 71 can be electrically connected to the multimeter 6.

[0036] Therefore, by setting up the operation panel 4, which can be electrically connected to the multimeter 6 via wires, and the plug hole 71 can be electrically connected to the multimeter 6, the test results can be effectively displayed, and the MOSFET can be quickly tested.

[0037] like Figure 2 As shown in this disclosure, a fixed pressure plate 22 is fixedly connected to one end of the inner side of the placement groove 21, and a moving pressure plate 23 is provided at the other end of the inner side of the placement groove 21. An insulating rubber pad 24 is provided on the corresponding side of the fixed pressure plate 22 and the moving pressure plate 23. An adjusting bolt 25 is threadedly connected to the inner side of the bearing plate 2, and the end of the adjusting bolt 25 is rotatably disposed on the inner side of the moving pressure plate 23.

[0038] Therefore, by setting a fixed pressure plate 22 and a moving pressure plate 23, each of which is equipped with an insulating rubber pad 24, it is convenient to place the MOSFET inside the placement slot 21 and clamp and fix it by the fixed pressure plate 22 and the moving pressure plate 23. The setting of the insulating rubber pad 24 can effectively improve the insulation. By setting an adjusting bolt 25, the adjusting bolt 25 rotates on the inner thread of the bearing plate 2, thereby effectively driving the adjusting bolt 25 to move, and finally driving the moving pressure plate 23 to move to clamp the MOSFET.

[0039] like Figure 1 and Figure 2 As shown, in a preferred embodiment, the fixing frame 14 is provided with a groove 16 on the side near the base plate 1, and a limiting slide plate 27 is fixedly connected to one side of the bottom end of the bearing plate 2. The limiting slide plate 27 is slidably connected to the inner side of the fixing frame 14.

[0040] Therefore, by setting the fixed frame 14, the adjusting bolt 25 can slide on the top of the fixed frame 14, avoiding the restriction of the movement of the adjusting bolt 25. By setting the limiting slide plate 27, the inner side of the fixed frame 14 is provided with a groove corresponding to the limiting slide plate 27, so that the limiting slide plate 27 can slide in a limited manner on the inner side of the fixed frame 14, effectively improving the stability of the movement of the bearing plate 2.

[0041] like Figure 1 and Figure 2 As shown in this disclosure, the bottom end of the adjusting bolt 25 is provided with a positioning hole 26, and the outer side of the fixing bracket 14 is provided with a pin 5, which is provided in correspondence with the positioning hole 26.

[0042] Therefore, by setting positioning holes 26, which are located at the bottom of the middle of the placement groove 21, and by setting pins 5, which are inserted into the inner side of the positioning holes 26, the position of the support plate 2 can be effectively limited, facilitating subsequent testing. In specific use, the support plate 2 is pushed to slide inside the slide groove 15, so that the placement groove 21 reaches the bottom of the multimeter 6. Then, the pins 5 are inserted into the inner side of the positioning holes 26 to limit the position of the support plate 2, so that each placement groove 21 can reach the predetermined position and perform subsequent testing.

[0043] In practical use, the position of the detection head 72 is selected according to the different MOSFETs and the different pins that need to be detected, and it is inserted into the inside of the plug hole 71 for subsequent detection work.

[0044] Multiple MOSFETs are placed inside the placement slot 21 and fixed in place. Then, the carrier plate 2 is slid directly to the inside of the slide groove 15. After the placement slot 21 moves to the bottom of the multimeter 6, the position of the carrier plate 2 is effectively limited by setting the pin 5, which is inserted into the positioning hole 26. The electric telescopic rod 3 is activated to drive the multimeter 6 to descend and test the MOSFETs. The carrier plate 2 is continuously moved to test multiple MOSFETs, which effectively improves the testing efficiency.

[0045] Those skilled in the art should understand that the above embodiments are merely for illustrating the present disclosure and are not intended to limit the scope of the disclosure. Those skilled in the art can make other changes or modifications based on the above disclosure, and these changes or modifications still fall within the scope of the present disclosure.

Claims

1. A MOS transistor insulation testing fixture, comprising a substrate (1), an L-shaped support plate (11) fixedly connected to the top of the substrate (1), a fixing frame (14) provided on one side of the substrate (1), and a support leg (12) fixedly connected to the bottom of both the substrate (1) and the fixing frame (14), and a connecting rod (13) fixedly connected between the two support legs (12). Its features are, A sliding groove (15) is provided between the substrate (1) and the fixing frame (14). A bearing plate (2) is slidably connected to the inner side of the sliding groove (15). A plurality of placement grooves (21) are evenly provided on the inner side of the bearing plate (2). The top of the L-shaped support plate (11) is provided with an electric telescopic rod (3), the output end of the electric telescopic rod (3) is fixedly connected with a fixing sleeve (61), a multimeter (6) is provided on the inner side of the fixing sleeve (61), and a detection plate (7) is provided at the bottom of the multimeter (6). The inner side of the detection plate (7) is provided with a plurality of insertion holes (71), and a detection head (72) may be provided on the inner side of the insertion holes (71).

2. The MOS transistor insulation testing fixture according to claim 1, characterized in that: The top of the L-shaped support plate (11) is provided with an operation panel (4), which can be electrically connected to a multimeter (6) via a wire, and the plug hole (71) can be electrically connected to the multimeter (6).

3. The MOS transistor insulation testing fixture according to claim 2, characterized in that: A fixed pressure plate (22) is fixedly connected to one end of the inner side of the placement groove (21), and a moving pressure plate (23) is provided at the other end of the inner side of the placement groove (21). An insulating rubber pad (24) is provided on the corresponding side of the fixed pressure plate (22) and the moving pressure plate (23). An adjusting bolt (25) is threadedly connected to the inner side of the bearing plate (2), and the end of the adjusting bolt (25) is rotatably set on the inner side of the moving pressure plate (23).

4. The MOS transistor insulation testing fixture according to claim 3, characterized in that: The fixing frame (14) has a groove (16) on the side near the base plate (1), and a limiting slide plate (27) is fixedly connected to one side of the bottom end of the bearing plate (2), and the limiting slide plate (27) is slidably connected to the inner side of the fixing frame (14).

5. The MOS transistor insulation testing fixture according to claim 4, characterized in that: The bottom end of the adjusting bolt (25) is provided with a positioning hole (26), and the outside of the fixing frame (14) is provided with a pin (5), and the pin (5) and the positioning hole (26) are provided in correspondence.

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