Testing device

Abstract

The utility model discloses a testing device, and relates to the technical field of memory bank detection, the testing device is used for being matched with a circuit board, the testing device comprises a testing seat, a terminal assembly and an inner plug rubber strip, the testing seat is provided with a containing groove and a slot which are communicated, and the slot is used for being connected with a memory bank in an inserted mode; the terminal assembly is arranged in the accommodating groove and is used for electrically connecting the memory bank and the circuit board; the inner plug rubber strip is fixedly arranged in the containing groove, and the terminal assembly is driven to be close to the memory bank and abut against the circuit board in the process that the inner plug rubber strip is arranged in the containing groove, so that the memory bank and the circuit board are clamped by the terminal assembly. According to the technical scheme provided by the utility model, the problem of unstable electric conduction between the terminal assembly and the memory bank and between the terminal assembly and the circuit board in the existing test socket is solved.

Description

Technical Field

[0001] This utility model relates to the field of memory module testing technology, and in particular to a testing device. Background Technology

[0002] In the electronics manufacturing industry, memory modules are one of the core components of computers and other electronic devices. They need to undergo a series of rigorous testing processes, such as soldering inspection, PCB appearance inspection, functional testing, and overall appearance inspection, to ensure that their performance meets the standards.

[0003] Traditionally, memory module testing involves inserting the memory module into a test socket. The test socket contains a terminal assembly that electrically connects the memory module to the circuit board, enabling various performance tests on the memory module.

[0004] However, existing terminal assemblies are usually set independently inside the test socket without additional clamping mechanisms to clamp them. The electrical connection between the memory module and the circuit board may be unstable or even have poor contact, which may lead to signal loss or interference during the test, thus affecting the accuracy of memory module performance testing. Utility Model Content

[0005] The main purpose of this invention is to provide a testing device that aims to solve the problem of unstable electrical conduction between the terminal components and memory modules and circuit boards in existing test sockets.

[0006] To achieve the above objectives, the present invention proposes a testing device for use with a circuit board, the testing device comprising:

[0007] The test socket has a connected receiving slot and a slot for inserting a memory module;

[0008] A terminal assembly is disposed within the receiving slot and is used for electrically connecting the memory module and the circuit board;

[0009] An inner rubber strip is fixed in the receiving groove. During the process of inserting the inner rubber strip into the receiving groove, it drives the terminal assembly to approach the memory module and the circuit board and press against each other, so that the terminal assembly clamps the memory module and the circuit board.

[0010] In one embodiment, the two sides of the inner plug strip abut against the groove wall of the receiving groove and the side of the terminal assembly, respectively, to force the terminal assembly to press the memory module, and the bottom surface of the inner plug strip abuts against the bottom surface of the terminal assembly, to force the terminal assembly to press the circuit board.

[0011] In one embodiment, the length of the inner plug strip is greater than the length of the terminal assembly, and the end of the inner plug strip protrudes from the end of the terminal assembly and abuts against the wall of the receiving groove.

[0012] In one embodiment, the receiving groove and the slot are arranged adjacent to each other, and the opening of the receiving groove is arranged opposite to the opening of the slot.

[0013] In one embodiment, the receiving slot and the slot have a common wall with a connecting hole. The slot and the receiving slot are connected through the connecting hole, and the contact point on the terminal assembly extends through the connecting hole into the slot and abuts against the memory module.

[0014] In one embodiment, the test base is further provided with a limiting groove communicating with the connecting hole, and the upper end of the terminal assembly is embedded in the limiting groove.

[0015] In one embodiment, the slot opening is provided with a guide slope, and the slot opening diameter gradually increases from the end closer to the terminal assembly to the end farther away from the terminal assembly.

[0016] In one embodiment, the testing apparatus further includes a push rod assembly rotatably disposed at the end of the testing seat.

[0017] The technical solution of this utility model involves fixing an inner rubber strip to the wall of the receiving groove. When the memory module is installed in the receiving groove, the inner rubber strip is compressed. Because the inner rubber strip is fitted against the terminal assembly, its elastic force drives the terminal assembly to move towards and clamp the memory module and the circuit board. This ensures good electrical conductivity between the memory module and the circuit board through the terminal assembly. The stable electrical connection ensures accurate transmission of test signals and improves the accuracy of memory module functional testing. The inner rubber strip can be made of wear-resistant, anti-aging rubber or elastic plastic. By pressing the inner rubber strip against the outer surface of the terminal assembly, it can better transfer its elastic force to the terminal assembly, allowing the terminal assembly to press the memory module and the circuit board firmly, thus improving the stability of the electrical connection. Attached Figure Description

[0018] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0019] Figure 1A schematic diagram of the structure of an embodiment of the testing device provided by this utility model;

[0020] Figure 2 Exploded view of an embodiment of the testing device provided by this utility model;

[0021] Figure 3 A side cross-sectional view of another embodiment of the testing device provided by this utility model;

[0022] Figure 4 A front structural cross-sectional view of another embodiment of the testing device provided by this utility model;

[0023] Figure 5 A partial structural schematic diagram of the test seat in another embodiment of the testing device provided by this utility model.

[0024] Explanation of icon numbers:

[0025] 100. Testing device; 1. Testing base; 10. Connecting hole; 11. Slot; 111. Guide slope; 12. Receiving groove; 13. Limiting groove; 2. Circuit board; 3. Terminal assembly; 4. Inner plug strip; 5. Push rod assembly; 6. Memory module; 7. Positioning block.

[0026] The realization of the purpose, functional features and advantages of this utility model will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0027] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present utility model.

[0028] It should be noted that if the embodiments of this utility model involve directional indicators (such as up, down, left, right, front, back, etc.), the directional indicators are only used to explain the relative positional relationship and movement of the components in a specific posture. If the specific posture changes, the directional indicators will also change accordingly.

[0029] Furthermore, if the embodiments of this utility model involve descriptions such as "first" or "second," these descriptions are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of those features. Additionally, the use of "and / or" or "and / or" throughout the text includes three parallel solutions. For example, "A and / or B" includes solution A, solution B, or a solution where both A and B are satisfied simultaneously. Furthermore, the technical solutions of the various embodiments can be combined with each other, but this must be based on the ability of those skilled in the art to implement them. When the combination of technical solutions is contradictory or impossible to implement, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection claimed by this utility model.

[0030] Existing terminal assemblies are usually set independently inside the test socket without additional clamping mechanisms to clamp them. The electrical connection between the memory module and the circuit board may be unstable or even have poor contact, which may lead to signal loss or interference during the test, thus affecting the accuracy of memory module performance testing.

[0031] This invention proposes a testing device for use with a circuit board.

[0032] Please see Figures 1 to 3 In one embodiment of this utility model, the testing device 100 includes:

[0033] Test socket 1 has a connected receiving slot 12 and a slot 11, the slot 11 being used to insert memory module 6;

[0034] Terminal assembly 3 is disposed in receiving slot 12 and is used for electrical connection between memory module 6 and circuit board 2;

[0035] The inner plug strip 4 is fixed in the receiving groove 12. During the process of inserting the inner plug strip 4 into the receiving groove 12, it drives the terminal assembly 3 to approach the memory module 6 and the circuit board 2 and press against each other, so that the terminal assembly 3 clamps the memory module 6 and the circuit board 2.

[0036] The technical solution of this utility model involves fixing an inner rubber strip 4 to the wall of the receiving groove 12. When the memory module 6 is installed in the receiving groove 12, the inner rubber strip 4 is compressed. Since the inner rubber strip 4 is attached to the terminal assembly 3, the elastic force of the inner rubber strip 4 drives the terminal assembly 3 to move and clamp towards the memory module 6 and the circuit board 2, ensuring good electrical conduction between the memory module 6 and the circuit board 2 through the terminal assembly 3. The stable electrical connection ensures accurate transmission of test signals and improves the accuracy of the functional test of the memory module 6. The inner rubber strip 4 can be made of wear-resistant and aging-resistant rubber or elastic plastic. The inner rubber strip 4 is pressed against the outer surface of the terminal assembly 3, which can better transmit its elastic force to the terminal assembly 3, so that the terminal assembly 3 can press the memory module 6 and the circuit board 2 tightly, improving the stability of the electrical connection.

[0037] Specifically, the inner plug strip 4 can be a single strip or multiple strips, depending on the electrical contact area between the terminal assembly 3 and the circuit board 2 and memory module 6. The connection method of the inner plug strip 4 is not specifically limited; for example, it can be fixed inside the receiving groove 12 by adhesive or riveting. The test socket 1 and the circuit board 2 can be connected by bolts, threads, or welding to ensure a stable connection during testing. The terminal assembly 3 is fixed inside the receiving groove 12 by the inner plug strip 4, thereby achieving stable contact with the potential points on the circuit board 2 and the memory module 6. It should be noted that positioning blocks 7 can also be provided at both ends of the test socket 1, positioned near the ends of the slot 11, to guide the insertion of the memory module 6 and improve the efficiency of the memory module 6 insertion test. Furthermore, the length and shape of the receiving groove 12 and the slot 11 are not specifically limited and can be designed according to actual application requirements.

[0038] In the embodiments of this utility model, please refer to Figure 3 The two sides of the inner rubber strip 4 abut against the wall of the receiving groove 12 and the side of the terminal assembly 3, respectively, to force the terminal assembly 3 to press the memory module 6. The bottom surface of the inner rubber strip 4 abuts against the bottom surface of the terminal assembly 3, to force the terminal assembly 3 to press the circuit board 2. One side of the inner rubber strip 4 abuts against the wall of the receiving groove 12, for example, it can be glued and fixed in the receiving groove 12; at this time, the other opposite side of the inner rubber strip 4 abuts against the side of the terminal assembly 3 to press the memory module 6; the bottom surface of the inner rubber strip 4 abuts against the bottom surface of the terminal assembly 3 to press the circuit board 2. The pressing force of the terminal assembly 3 on the memory module 6 and the circuit board 2 is achieved by the elastic deformation of the rubber strip, which not only eliminates the need for additional fasteners, but also ensures that the terminal assembly 3 is pressed evenly.

[0039] In the embodiments of this utility model, please refer to Figure 4The length of the inner rubber strip 4 is greater than the length of the terminal assembly 3. The end of the inner rubber strip 4 protrudes from the end of the terminal assembly 3 and abuts against the wall of the receiving groove 12. The greater length of the inner rubber strip 4 allows for greater clamping force when inserted into the receiving groove 12, ensuring that every segment of the terminal assembly 3 can make tight contact with the memory module 6 and the circuit board 2. The end of the inner rubber strip 4 protrudes from the end of the terminal assembly 3, meaning that the inner rubber strip 4 can clamp the terminal assembly 3 from one end to the other, preventing partial contact between the terminal assembly 3 and the inner rubber strip 4. Optionally, steps can be provided at both ends of the receiving groove 12, with the inner rubber strip 4 and the terminal assembly 3 contacting different surfaces of the steps.

[0040] In the embodiments of this utility model, please refer to Figure 5 The receiving slot 12 and the slot 11 are arranged adjacent to each other, with the opening of the receiving slot 12 facing away from the opening of the slot 11. This makes it easier to insert and remove the memory module 6. The receiving slot 12 is used to accommodate the terminal assembly 3 and the inner plug strip 4, while the slot 11 is used to insert the memory module 6. The adjacent receiving slot 12 and the slot 11 support each other structurally, enhancing the stability and durability of the overall testing device 100. Furthermore, the facing away of the slot openings helps improve the flow of heat dissipation airflow, especially during high-load testing, helping to keep the temperature of the memory module 6 and the testing device 100 within a reasonable range. Optionally, one receiving slot 12 is provided on each side of the slot 11, and two terminal assemblies 3 and two inner plug strips 4 are also provided accordingly, thereby pressing the two sides of the memory module 6 firmly.

[0041] In the embodiments of this utility model, please refer to Figure 5 The receiving slot 12 and the slot 11 share a common slot wall with a connecting hole 10. The slot 11 and the receiving slot 12 are connected through the connecting hole 10, and the contact points on the terminal assembly 3 extend through the connecting hole 10 into the slot 11 and abut against the memory module 6. The common slot wall can be a vertical partition separating the receiving slot 12 and the slot 11 on both sides. The design of the shared slot wall and connecting hole 10 not only reduces the need for separate manufacturing and assembly of the receiving slot 12 and the slot 11, simplifying the manufacturing process, but also reduces the required materials and space, making the test device 100 more compact. The contact points of the terminal assembly 3 extend directly through the connecting hole 10 into the slot 11 and abut against the memory module 6, providing a direct and reliable electrical connection. The number and shape of the connecting holes 10 need to be designed according to the contact points on the terminal assembly 3; for example, they can be circular or rectangular holes passing through the common slot wall. The memory module 6 establishes an electrical connection with the terminal assembly 3 simultaneously with insertion into the slot 11, without additional operations, improving testing efficiency.

[0042] In the embodiments of this utility model, please refer to Figure 3 The test socket 1 is also provided with a limiting groove 13 that communicates with the connecting hole 10, and the upper end of the terminal assembly 3 is embedded in the limiting groove 13. The limiting groove 13 can be a narrow and long groove, the length and width of which are slightly larger than the size of the upper end of the terminal assembly 3, so that the terminal assembly 3 can be smoothly inserted. The depth of the limiting groove 13 can be set according to the height of the terminal assembly 3 to ensure that the terminal assembly 3 can be firmly fixed in place after being inserted. By setting the limiting groove 13, the upper end of the terminal assembly 3 is accurately positioned, providing an additional fixing point for the terminal assembly 3, and providing stable support when the memory module 6 is inserted and removed, thereby enhancing the structural stability of the entire test socket 1 and reducing displacement or deformation caused by external forces.

[0043] In the embodiments of this utility model, please refer to Figure 5 The slot 11 has a guide ramp 111 at its opening, and the diameter of the slot 11 gradually increases from the end near the terminal assembly 3 to the end away from the terminal assembly 3. The guide ramp 111 is a ramp provided at the opening of the slot 11 to guide the memory module 6 smoothly into the slot 11. This ramp is usually located at the entrance of the slot 11, and its inclination angle and length are designed according to the shape and size of the memory module 6 to ensure that the memory module 6 can slide smoothly into the slot. For example, the guide ramp 111 can be set as a 45-degree slope, and its length is sufficient to cover the initial stage when the memory module 6 is inserted. This design allows the memory module 6 to first contact the guide ramp 111 when inserted, and then smoothly slide into the slot 11 until its gold fingers are aligned with the contact points of the terminal assembly 3.

[0044] In the embodiments of this utility model, please refer to Figure 1 and Figure 2 The testing device 100 also includes a push rod assembly 5, which is rotatably mounted at the end of the testing base 1. The push rod assembly 5 can be designed as an L-shaped or T-shaped metal arm, with one end fixed to the end of the testing base 1 and the other end forming the end of the slot 11. The rotation of the push rod assembly 5 can be achieved by manual operation or automatic control. For example, the push rod assembly 5 includes components such as a push rod, a positioning pin, and a bearing. The proximal end of the push rod near the memory module 6 extends into the receiving slot 12 and abuts against the bottom surface of the memory module 6. The bearing is installed at the distal end of the push rod away from the memory module 6. After the test, the pressure head on the external device rolls and rubs against the bearing, thereby pressing down on the distal end of the push rod while the proximal end of the push rod moves upward to eject the memory module 6. The positioning pin passes through the end of the testing base 1 and rotates synchronously with the positioning pin when the push rod is subjected to downward pressure. Optionally, the push rod assembly 5 also includes a spring, which is installed on the side of the push rod facing the memory module 6 to reset after the memory module 6 is ejected.

[0045] The above description is merely an exemplary embodiment of the present utility model and does not limit the patent scope of the present utility model. Any equivalent structural transformations made based on the technical concept of the present utility model and the contents of the present utility model specification and drawings, or direct / indirect applications in other related technical fields, are included within the patent protection scope of the present utility model.

Claims

1. A testing device for use with a circuit board, characterized in that, The testing apparatus includes: The test socket has a connected receiving slot and a slot for inserting a memory module; A terminal assembly is disposed within the receiving slot and is used for electrically connecting the memory module and the circuit board; An inner rubber strip is fixed in the receiving groove. During the process of inserting the inner rubber strip into the receiving groove, it drives the terminal assembly to approach the memory module and the circuit board and press against each other, so that the terminal assembly clamps the memory module and the circuit board.

2. The testing apparatus as described in claim 1, characterized in that, The two sides of the inner plug strip abut against the groove wall of the receiving groove and the side of the terminal assembly, respectively, to force the terminal assembly to press the memory module. The bottom surface of the inner plug strip abuts against the bottom surface of the terminal assembly, to force the terminal assembly to press the circuit board.

3. The testing apparatus as described in claim 2, characterized in that, The length of the inner plug strip is greater than the length of the terminal assembly, and the end of the inner plug strip protrudes from the end of the terminal assembly and abuts against the wall of the receiving groove.

4. The testing apparatus as described in claim 1, characterized in that, The receiving groove and the slot are arranged adjacent to each other, and the opening of the receiving groove is arranged in a direction opposite to that of the opening of the slot.

5. The testing apparatus as described in claim 4, characterized in that, The receiving slot and the slot have a common slot wall with a connecting hole. The slot and the receiving slot are connected through the connecting hole, and the contact point on the terminal assembly extends through the connecting hole into the slot and abuts against the memory module.

6. The testing apparatus as described in claim 5, characterized in that, The test base is also provided with a limiting groove that communicates with the connecting hole, and the upper end of the terminal assembly is embedded in the limiting groove.

7. The testing apparatus as described in any one of claims 1 to 6, characterized in that, The slot has a guide slope at the opening, and the diameter of the slot opening gradually increases from the end closer to the terminal assembly to the end farther away from the terminal assembly.

8. The testing apparatus as described in any one of claims 1 to 6, characterized in that, The testing device also includes a push rod assembly, which is rotatably mounted at the end of the testing seat.

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